******************************************************************** wafer #18 ******************************************************************** ---------- CHIP ID:401 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5105 b(slope) = 0.0085 chi2 = 0.4387 CAL_IN P-side : a = 2.5106 b(slope) = 0.0085 chi2 = 0.6484 VTN N-side : a = 0.0087 b(slope) = 0.0109 chi2 = 0.7825 VTN P-side : a = 0.0090 b(slope) = 0.0066 chi2 = 0.6320 VTP N-side = 0.7057 VTP p-side = 0.4342 CHI2 TEST = 1 CAL_BASE = 2.5124 V CAL_VREF = 3.0561 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:501 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 100 CAL_IN N-side : a = 2.5005 b(slope) = 0.0086 chi2 = 1.5149 CAL_IN P-side : a = 2.5015 b(slope) = 0.0087 chi2 = 13.7649 VTN N-side : a = 0.0094 b(slope) = 0.0108 chi2 = 1.6734 VTN P-side : a = 0.0092 b(slope) = 0.0065 chi2 = 0.8598 VTP N-side = 0.7027 VTP p-side = 0.4284 CHI2 TEST = 100 CAL_BASE = 2.5022 V CAL_VREF = 3.0559 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM15 2082 FUNCT@5.0V:ATOM17 5478 FUNCT@5.0V:ATOM18 5494 FUNCT@5.0V:ATOM18HF 4410 FUNCT@5.0V:ATOM19 5430 FUNCT@5.0V:ATOM20 2054 FUNCT@5.0V:ATOM21 2030 FUNCT@5.0V:ATOM25 2036 FUNCT@5.0V:ATOM25HF 2220 FUNCT@5.0V:ATOM26B 2824 FUNCT@5.0V:ATOM28 2152 FUNCT@5.0V:ATOM29 2152 FUNCT@5.0V:ATOM30 2152 FUNCT@5.0V:ATOM31A 1786 FUNCT@5.0V:ATOM31B 1975 FUNCT@5.0V:ATOM32 1786 FUNCT@5.0V:ATOM35 2286 FUNCT@5.0V:ATOM36 2042 FUNCT@5.0V:ATOM39 2063 FUNCT@5.0V:ATOM41 2589 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1408 TMIN TEST = 1 ---------- CHIP ID:601 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5047 b(slope) = 0.0085 chi2 = 1.2762 CAL_IN P-side : a = 2.5048 b(slope) = 0.0085 chi2 = 0.6404 VTN N-side : a = 0.0092 b(slope) = 0.0108 chi2 = 0.9838 VTN P-side : a = 0.0091 b(slope) = 0.0066 chi2 = 0.4521 VTP N-side = 0.7005 VTP p-side = 0.4306 CHI2 TEST = 1 CAL_BASE = 2.5068 V CAL_VREF = 3.0544 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM19F 7333 FUNCT@5.0V:ATOM19FHF 7333 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:602 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5118 b(slope) = 0.0084 chi2 = 0.6243 CAL_IN P-side : a = 2.5118 b(slope) = 0.0084 chi2 = 0.2671 VTN N-side : a = 0.0094 b(slope) = 0.0109 chi2 = 1.0364 VTN P-side : a = 0.0095 b(slope) = 0.0066 chi2 = 0.5000 VTP N-side = 0.7064 VTP p-side = 0.4338 CHI2 TEST = 1 CAL_BASE = 2.5147 V CAL_VREF = 3.0540 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:502 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4910 b(slope) = 0.0086 chi2 = 0.6730 CAL_IN P-side : a = 2.4909 b(slope) = 0.0086 chi2 = 0.7340 VTN N-side : a = 0.0101 b(slope) = 0.0108 chi2 = 2.0716 VTN P-side : a = 0.0099 b(slope) = 0.0066 chi2 = 1.0314 VTP N-side = 0.7038 VTP p-side = 0.4341 CHI2 TEST = 1 CAL_BASE = 2.4927 V CAL_VREF = 3.0447 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:402 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4733 b(slope) = 0.0087 chi2 = 1.2840 CAL_IN P-side : a = 2.4736 b(slope) = 0.0087 chi2 = 1.2822 VTN N-side : a = 0.0100 b(slope) = 0.0109 chi2 = 0.8631 VTN P-side : a = 0.0099 b(slope) = 0.0066 chi2 = 0.5146 VTP N-side = 0.7096 VTP p-side = 0.4347 CHI2 TEST = 1 CAL_BASE = 2.4741 V CAL_VREF = 3.0315 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:203 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4838 b(slope) = 0.0085 chi2 = 0.7850 CAL_IN P-side : a = 2.4837 b(slope) = 0.0085 chi2 = 0.9490 VTN N-side : a = 0.0103 b(slope) = 0.0106 chi2 = 0.7386 VTN P-side : a = 0.0102 b(slope) = 0.0064 chi2 = 0.6434 VTP N-side = 0.6862 VTP p-side = 0.4224 CHI2 TEST = 1 CAL_BASE = 2.4861 V CAL_VREF = 3.0271 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:303 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5025 b(slope) = 0.0083 chi2 = 0.7487 CAL_IN P-side : a = 2.5023 b(slope) = 0.0083 chi2 = 0.5611 VTN N-side : a = 0.0102 b(slope) = 0.0105 chi2 = 0.7986 VTN P-side : a = 0.0101 b(slope) = 0.0064 chi2 = 0.4001 VTP N-side = 0.6859 VTP p-side = 0.4220 CHI2 TEST = 1 CAL_BASE = 2.5024 V CAL_VREF = 3.0322 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:403 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4576 b(slope) = 0.0087 chi2 = 1.3993 CAL_IN P-side : a = 2.4577 b(slope) = 0.0087 chi2 = 1.2290 VTN N-side : a = 0.0108 b(slope) = 0.0107 chi2 = 0.7608 VTN P-side : a = 0.0106 b(slope) = 0.0065 chi2 = 0.3057 VTP N-side = 0.6965 VTP p-side = 0.4275 CHI2 TEST = 1 CAL_BASE = 2.4590 V CAL_VREF = 3.0149 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:503 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4988 b(slope) = 0.0085 chi2 = 0.5391 CAL_IN P-side : a = 2.4989 b(slope) = 0.0085 chi2 = 0.6175 VTN N-side : a = 0.0111 b(slope) = 0.0107 chi2 = 0.9978 VTN P-side : a = 0.0109 b(slope) = 0.0066 chi2 = 0.5304 VTP N-side = 0.6982 VTP p-side = 0.4323 CHI2 TEST = 1 CAL_BASE = 2.4985 V CAL_VREF = 3.0403 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:603 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4538 b(slope) = 0.0087 chi2 = 0.4869 CAL_IN P-side : a = 2.4540 b(slope) = 0.0087 chi2 = 0.8435 VTN N-side : a = 0.0107 b(slope) = 0.0107 chi2 = 0.5266 VTN P-side : a = 0.0108 b(slope) = 0.0066 chi2 = 0.2786 VTP N-side = 0.6977 VTP p-side = 0.4324 CHI2 TEST = 1 CAL_BASE = 2.4553 V CAL_VREF = 3.0117 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:703 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4638 b(slope) = 0.0086 chi2 = 0.6192 CAL_IN P-side : a = 2.4637 b(slope) = 0.0086 chi2 = 1.1172 VTN N-side : a = 0.0113 b(slope) = 0.0105 chi2 = 0.4709 VTN P-side : a = 0.0112 b(slope) = 0.0064 chi2 = 0.4484 VTP N-side = 0.6845 VTP p-side = 0.4211 CHI2 TEST = 1 CAL_BASE = 2.4673 V CAL_VREF = 3.0166 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:803 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4861 b(slope) = 0.0083 chi2 = 2.4740 CAL_IN P-side : a = 2.4860 b(slope) = 0.0083 chi2 = 1.4345 VTN N-side : a = 0.0109 b(slope) = 0.0107 chi2 = 0.6380 VTN P-side : a = 0.0107 b(slope) = 0.0066 chi2 = 0.6790 VTP N-side = 0.6959 VTP p-side = 0.4335 CHI2 TEST = 1 CAL_BASE = 2.4905 V CAL_VREF = 3.0222 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:804 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 0 error detected in test: Location: SUP_SHORT:VDD1 6.7282E-01 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A -1.0000E-38 IDDSB:VDD1A -1.0000E-38 IDDSB:VDD0B -1.0000E-38 IDDSB:VDD1B -1.0000E-38 IDDSB:VDD0C -1.0000E-38 IDDSB:VDD1C -1.0000E-38 IDDSB:VDD0D -1.0000E-38 IDDSB:VDD1D -1.0000E-38 V_AVDD2IPA:249/L9 -1.0000E-38 V_AVDD2IMA:277/L10 -1.0000E-38 AVDD_A:AVDDP-M -1.0000E-38 IAVDD2_A:AVDDP-M -1.0000E-38 V_V1RA:169/L5 -1.0000E-38 V_N310A:171/L6 -1.0000E-38 V_AVDD2IPB:249/L9 -1.0000E-38 V_AVDD2IMB:277/L10 -1.0000E-38 AVDD_B:AVDDP-M -1.0000E-38 IAVDD2_B:AVDDP-M -1.0000E-38 V_V1RB:169/L5 -1.0000E-38 V_N310B:171/L6 -1.0000E-38 V_AVDD2IPC:249/L9 -1.0000E-38 V_AVDD2IMC:277/L10 -1.0000E-38 AVDD_C:AVDDP-M -1.0000E-38 IAVDD2_C:AVDDP-M -1.0000E-38 V_V1RC:169/L5 -1.0000E-38 V_N310C:171/L6 -1.0000E-38 V_AVDD2IPD:249/L9 -1.0000E-38 V_AVDD2IMD:277/L10 -1.0000E-38 AVDD_D:AVDDP-M -1.0000E-38 IAVDD2_D:AVDDP-M -1.0000E-38 V_V1RD:169/L5 -1.0000E-38 V_N310D:171/L6 -1.0000E-38 IDDOP0:AVDD -1.0000E-38 IDDOP1:DVDD -1.0000E-38 DACs TEST = 0 CAL_IN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side = 0.0000 VTP p-side = 0.0000 CHI2 TEST = 0 CAL_BASE = 0.0000 V CAL_VREF = 0.0000 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 0 FUNCT@5.0V:ATOM1TO6B 0 FUNCT@5.0V:ATOM1TO6C 0 FUNCT@5.0V:ATOM1TO6D 0 FUNCT@5.0V:ATOM1TO6E 0 FUNCT@5.0V:ATOM7TO9A 0 FUNCT@5.0V:ATOM7TO9B 0 FUNCT@5.0V:ATOM7TO9C 0 FUNCT@5.0V:ATOM7TO9D 0 FUNCT@5.0V:ATOM7TO9E 0 FUNCT@5.0V:ATOM10TO12 0 FUNCT@5.0V:ATOM13A 0 FUNCT@5.0V:ATOM13B 0 FUNCT@5.0V:ATOM13C 0 FUNCT@5.0V:ATOM14 0 FUNCT@5.0V:ATOM15 0 FUNCT@5.0V:ATOM16 0 FUNCT@5.0V:ATOM17 0 FUNCT@5.0V:ATOM18 0 FUNCT@5.0V:ATOM18HF 0 FUNCT@5.0V:ATOM19 0 FUNCT@5.0V:ATOM19B 0 FUNCT@5.0V:ATOM19C 0 FUNCT@5.0V:ATOM19D 0 FUNCT@5.0V:ATOM19E 0 FUNCT@5.0V:ATOM19F 0 FUNCT@5.0V:ATOM19FHF 0 FUNCT@5.0V:ATOM20 0 FUNCT@5.0V:ATOM21 0 FUNCT@5.0V:ATOM22 0 FUNCT@5.0V:ATOM23 0 FUNCT@5.0V:ATOM24 0 FUNCT@5.0V:ATOM25 0 FUNCT@5.0V:ATOM25HF 0 FUNCT@5.0V:ATOM26A 0 FUNCT@5.0V:ATOM26B 0 FUNCT@5.0V:ATOM27 0 FUNCT@5.0V:ATOM28 0 FUNCT@5.0V:ATOM29 0 FUNCT@5.0V:ATOM30 0 FUNCT@5.0V:ATOM31A 0 FUNCT@5.0V:ATOM31B 0 FUNCT@5.0V:ATOM32 0 FUNCT@5.0V:ATOM33 0 FUNCT@5.0V:ATOM34 0 FUNCT@5.0V:ATOM35 0 FUNCT@5.0V:ATOM36 0 FUNCT@5.0V:ATOM38 0 FUNCT@5.0V:ATOM39 0 FUNCT@5.0V:ATOM40 0 FUNCT@5.0V:ATOM41 0 FUNCT@5.0V:ATOM41A 0 FUNCT@5.0V:ATOM42 0 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 0 FUNCT@5.0V:ATOM45C_40 0 FUNCT@5.0V:ATOM46C_40 0 FUNCT@5.0V:ATOM47C_40 0 FUNCT@5.0V:ATOM48C_40 0 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 0 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 0 FUNCT@5.0V:A10TO12HF 0 FUNCT@5.0V:ADAC37HF 0 CH.MASK TEST = 0 error detected at location:0 NOISE TEST = 0 error detected at location:0 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D -1.0000E-38 TMIN@4.8V:A7_9_60D -1.0000E-38 TMIN@4.8V:A10_12_50D -1.0000E-38 TMIN@4.8V:A10_12_60D -1.0000E-38 TMIN@4.8V:ADAC37_50D -1.0000E-38 TMIN@4.8V:ADAC37_60D -1.0000E-38 TMIN@5.0V:A7_9_50D -1.0000E-38 TMIN@5.0V:A7_9_60D -1.0000E-38 TMIN@5.0V:A10_12_50D -1.0000E-38 TMIN@5.0V:A10_12_60D -1.0000E-38 TMIN@5.0V:ADAC37_50D -1.0000E-38 TMIN@5.0V:ADAC37_60D -1.0000E-38 TMIN@5.2V:A7_9_50D -1.0000E-38 TMIN@5.2V:A7_9_60D -1.0000E-38 TMIN@5.2V:A10_12_50D -1.0000E-38 TMIN@5.2V:A10_12_60D -1.0000E-38 TMIN@5.2V:ADAC37_50D -1.0000E-38 TMIN@5.2V:ADAC37_60D -1.0000E-38 ---------- CHIP ID:704 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD1A 1.0059E-01 IDDSB:VDD1B 1.0720E-01 IDDSB:VDD1C 1.1325E-01 IDDSB:VDD1D 1.1852E-01 IDDOP1:DVDD 1.4004E-01 DACs TEST = 1 CAL_IN N-side : a = 2.4769 b(slope) = 0.0085 chi2 = 3.6834 CAL_IN P-side : a = 2.4797 b(slope) = 0.0085 chi2 = 2.5759 VTN N-side : a = 0.0101 b(slope) = 0.0106 chi2 = 0.7757 VTN P-side : a = 0.0104 b(slope) = 0.0065 chi2 = 0.9618 VTP N-side = 0.6896 VTP p-side = 0.4266 CHI2 TEST = 1 CAL_BASE = 2.4792 V CAL_VREF = 3.0188 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5597 FUNCT@5.0V:ATOM45C_40 5597 FUNCT@5.0V:ATOM46C_40 4277 FUNCT@5.0V:ATOM47C_40 4279 FUNCT@5.0V:ATOM48C_40 5597 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5597 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1401 TMIN TEST = 1 ---------- CHIP ID:604 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4653 b(slope) = 0.0086 chi2 = 0.7047 CAL_IN P-side : a = 2.4653 b(slope) = 0.0086 chi2 = 0.3800 VTN N-side : a = 0.0110 b(slope) = 0.0107 chi2 = 2.1971 VTN P-side : a = 0.0108 b(slope) = 0.0065 chi2 = 1.4263 VTP N-side = 0.6932 VTP p-side = 0.4292 CHI2 TEST = 1 CAL_BASE = 2.4673 V CAL_VREF = 3.0178 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:504 ------------------ CLASS = B && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 100 CAL_IN N-side : a = 2.4743 b(slope) = 0.0086 chi2 = 1.3811 CAL_IN P-side : a = 2.4731 b(slope) = 0.0086 chi2 = 23.2202 VTN N-side : a = 0.0110 b(slope) = 0.0108 chi2 = 1.2845 VTN P-side : a = 0.0109 b(slope) = 0.0066 chi2 = 0.4837 VTP N-side = 0.7002 VTP p-side = 0.4317 CHI2 TEST = 100 CAL_BASE = 2.4753 V CAL_VREF = 3.0261 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:404 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4537 b(slope) = 0.0087 chi2 = 1.2752 CAL_IN P-side : a = 2.4537 b(slope) = 0.0087 chi2 = 2.1859 VTN N-side : a = 0.0107 b(slope) = 0.0107 chi2 = 0.5867 VTN P-side : a = 0.0109 b(slope) = 0.0065 chi2 = 0.3191 VTP N-side = 0.6959 VTP p-side = 0.4299 CHI2 TEST = 1 CAL_BASE = 2.4553 V CAL_VREF = 3.0132 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:304 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.4409 b(slope) = 0.0097 chi2 = 99.0000 CAL_IN P-side : a = 2.4526 b(slope) = 0.0098 chi2 = 99.0000 VTN N-side : a = 0.0112 b(slope) = 0.0108 chi2 = 0.7078 VTN P-side : a = 0.0108 b(slope) = 0.0065 chi2 = 0.4581 VTP N-side = 0.7002 VTP p-side = 0.4305 CHI2 TEST = 0 CAL_BASE = 2.4590 V CAL_VREF = 3.0120 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:204 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4769 b(slope) = 0.0084 chi2 = 1.2173 CAL_IN P-side : a = 2.4771 b(slope) = 0.0084 chi2 = 0.6628 VTN N-side : a = 0.0107 b(slope) = 0.0107 chi2 = 0.8638 VTN P-side : a = 0.0110 b(slope) = 0.0064 chi2 = 0.5204 VTP N-side = 0.6944 VTP p-side = 0.4241 CHI2 TEST = 1 CAL_BASE = 2.4785 V CAL_VREF = 3.0178 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:205 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4747 b(slope) = 0.0083 chi2 = 0.9097 CAL_IN P-side : a = 2.4744 b(slope) = 0.0083 chi2 = 0.9058 VTN N-side : a = 0.0115 b(slope) = 0.0106 chi2 = 0.6168 VTN P-side : a = 0.0114 b(slope) = 0.0065 chi2 = 0.7559 VTP N-side = 0.6931 VTP p-side = 0.4274 CHI2 TEST = 1 CAL_BASE = 2.4771 V CAL_VREF = 3.0107 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:305 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4392 b(slope) = 0.0086 chi2 = 1.1536 CAL_IN P-side : a = 2.4393 b(slope) = 0.0086 chi2 = 1.7209 VTN N-side : a = 0.0125 b(slope) = 0.0105 chi2 = 1.4720 VTN P-side : a = 0.0122 b(slope) = 0.0064 chi2 = 0.6041 VTP N-side = 0.6870 VTP p-side = 0.4228 CHI2 TEST = 1 CAL_BASE = 2.4429 V CAL_VREF = 2.9956 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:405 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4487 b(slope) = 0.0086 chi2 = 1.1664 CAL_IN P-side : a = 2.4489 b(slope) = 0.0086 chi2 = 0.5203 VTN N-side : a = 0.0118 b(slope) = 0.0107 chi2 = 2.5097 VTN P-side : a = 0.0118 b(slope) = 0.0065 chi2 = 1.0107 VTP N-side = 0.6953 VTP p-side = 0.4280 CHI2 TEST = 1 CAL_BASE = 2.4495 V CAL_VREF = 3.0017 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:505 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4472 b(slope) = 0.0086 chi2 = 0.8314 CAL_IN P-side : a = 2.4471 b(slope) = 0.0086 chi2 = 0.9264 VTN N-side : a = 0.0112 b(slope) = 0.0107 chi2 = 0.7696 VTN P-side : a = 0.0113 b(slope) = 0.0066 chi2 = 0.5469 VTP N-side = 0.6968 VTP p-side = 0.4329 CHI2 TEST = 1 CAL_BASE = 2.4509 V CAL_VREF = 3.0051 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:605 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4706 b(slope) = 0.0085 chi2 = 0.6627 CAL_IN P-side : a = 2.4704 b(slope) = 0.0085 chi2 = 0.5130 VTN N-side : a = 0.0098 b(slope) = 0.0107 chi2 = 0.9006 VTN P-side : a = 0.0101 b(slope) = 0.0066 chi2 = 0.2253 VTP N-side = 0.6972 VTP p-side = 0.4310 CHI2 TEST = 1 CAL_BASE = 2.4727 V CAL_VREF = 3.0181 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:705 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4889 b(slope) = 0.0081 chi2 = 0.9054 CAL_IN P-side : a = 2.4886 b(slope) = 0.0082 chi2 = 0.6281 VTN N-side : a = 0.0102 b(slope) = 0.0105 chi2 = 0.6199 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 1.1382 VTP N-side = 0.6818 VTP p-side = 0.4242 CHI2 TEST = 1 CAL_BASE = 2.4890 V CAL_VREF = 3.0122 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:805 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4762 b(slope) = 0.0082 chi2 = 1.1894 CAL_IN P-side : a = 2.4766 b(slope) = 0.0082 chi2 = 1.0091 VTN N-side : a = 0.0100 b(slope) = 0.0104 chi2 = 1.6577 VTN P-side : a = 0.0096 b(slope) = 0.0063 chi2 = 0.6224 VTP N-side = 0.6761 VTP p-side = 0.4152 CHI2 TEST = 1 CAL_BASE = 2.4780 V CAL_VREF = 3.0056 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:806 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4710 b(slope) = 0.0083 chi2 = 1.2015 CAL_IN P-side : a = 2.4709 b(slope) = 0.0083 chi2 = 0.9008 VTN N-side : a = 0.0094 b(slope) = 0.0106 chi2 = 1.1735 VTN P-side : a = 0.0092 b(slope) = 0.0065 chi2 = 0.7218 VTP N-side = 0.6864 VTP p-side = 0.4281 CHI2 TEST = 1 CAL_BASE = 2.4709 V CAL_VREF = 3.0041 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1425 FUNCT@5.0V:ATOM15 1469 FUNCT@5.0V:ATOM17 3781 FUNCT@5.0V:ATOM18 3797 FUNCT@5.0V:ATOM18HF 3797 FUNCT@5.0V:ATOM19 3733 FUNCT@5.0V:ATOM19D 3748 FUNCT@5.0V:ATOM19E 2975 FUNCT@5.0V:ATOM19F 6848 FUNCT@5.0V:ATOM19FHF 6848 FUNCT@5.0V:ATOM20 1441 FUNCT@5.0V:ATOM21 1417 FUNCT@5.0V:ATOM22 1405 FUNCT@5.0V:ATOM25 1423 FUNCT@5.0V:ATOM25HF 1423 FUNCT@5.0V:ATOM26B 2211 FUNCT@5.0V:ATOM28 1539 FUNCT@5.0V:ATOM29 1539 FUNCT@5.0V:ATOM30 1539 FUNCT@5.0V:ATOM31A 1173 FUNCT@5.0V:ATOM31B 1362 FUNCT@5.0V:ATOM32 1173 FUNCT@5.0V:ATOM33 1539 FUNCT@5.0V:ATOM35 1673 FUNCT@5.0V:ATOM36 1429 FUNCT@5.0V:ATOM39 1450 FUNCT@5.0V:ATOM41 1976 FUNCT@5.0V:ATOM41A 1976 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:706 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4765 b(slope) = 0.0083 chi2 = 0.9208 CAL_IN P-side : a = 2.4765 b(slope) = 0.0083 chi2 = 1.3909 VTN N-side : a = 0.0096 b(slope) = 0.0106 chi2 = 0.5955 VTN P-side : a = 0.0098 b(slope) = 0.0064 chi2 = 0.3693 VTP N-side = 0.6858 VTP p-side = 0.4228 CHI2 TEST = 1 CAL_BASE = 2.4805 V CAL_VREF = 3.0137 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:606 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4641 b(slope) = 0.0085 chi2 = 2.0872 CAL_IN P-side : a = 2.4646 b(slope) = 0.0085 chi2 = 1.7888 VTN N-side : a = 0.0095 b(slope) = 0.0108 chi2 = 0.8219 VTN P-side : a = 0.0095 b(slope) = 0.0066 chi2 = 0.2879 VTP N-side = 0.6994 VTP p-side = 0.4346 CHI2 TEST = 1 CAL_BASE = 2.4658 V CAL_VREF = 3.0124 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:506 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4897 b(slope) = 0.0084 chi2 = 0.9786 CAL_IN P-side : a = 2.4898 b(slope) = 0.0084 chi2 = 0.7240 VTN N-side : a = 0.0098 b(slope) = 0.0105 chi2 = 0.5286 VTN P-side : a = 0.0098 b(slope) = 0.0064 chi2 = 0.6813 VTP N-side = 0.6835 VTP p-side = 0.4223 CHI2 TEST = 1 CAL_BASE = 2.4912 V CAL_VREF = 3.0261 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:406 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4223 b(slope) = 0.0088 chi2 = 1.9357 CAL_IN P-side : a = 2.4228 b(slope) = 0.0088 chi2 = 1.3536 VTN N-side : a = 0.0098 b(slope) = 0.0107 chi2 = 1.2935 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.6834 VTP N-side = 0.6938 VTP p-side = 0.4283 CHI2 TEST = 1 CAL_BASE = 2.4263 V CAL_VREF = 2.9907 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13B 1359 FUNCT@5.0V:ATOM13C 1359 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5003 FUNCT@5.0V:ATOM45C_40 5003 FUNCT@5.0V:ATOM46C_40 4890 FUNCT@5.0V:ATOM47C_40 4890 FUNCT@5.0V:ATOM48C_40 5003 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5003 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:306 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4507 b(slope) = 0.0086 chi2 = 1.0694 CAL_IN P-side : a = 2.4509 b(slope) = 0.0086 chi2 = 1.3386 VTN N-side : a = 0.0107 b(slope) = 0.0107 chi2 = 0.9283 VTN P-side : a = 0.0106 b(slope) = 0.0065 chi2 = 0.1865 VTP N-side = 0.6951 VTP p-side = 0.4305 CHI2 TEST = 1 CAL_BASE = 2.4534 V CAL_VREF = 3.0049 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:206 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4446 b(slope) = 0.0086 chi2 = 0.7871 CAL_IN P-side : a = 2.4444 b(slope) = 0.0086 chi2 = 0.7976 VTN N-side : a = 0.0117 b(slope) = 0.0105 chi2 = 0.6220 VTN P-side : a = 0.0116 b(slope) = 0.0064 chi2 = 0.4117 VTP N-side = 0.6868 VTP p-side = 0.4239 CHI2 TEST = 1 CAL_BASE = 2.4456 V CAL_VREF = 2.9949 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:107 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4945 b(slope) = 0.0082 chi2 = 0.8187 CAL_IN P-side : a = 2.4947 b(slope) = 0.0082 chi2 = 0.9964 VTN N-side : a = 0.0121 b(slope) = 0.0106 chi2 = 0.9117 VTN P-side : a = 0.0116 b(slope) = 0.0065 chi2 = 1.0871 VTP N-side = 0.6897 VTP p-side = 0.4276 CHI2 TEST = 1 CAL_BASE = 2.4978 V CAL_VREF = 3.0217 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:207 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4636 b(slope) = 0.0085 chi2 = 1.6082 CAL_IN P-side : a = 2.4632 b(slope) = 0.0085 chi2 = 1.3348 VTN N-side : a = 0.0098 b(slope) = 0.0105 chi2 = 0.6075 VTN P-side : a = 0.0098 b(slope) = 0.0064 chi2 = 0.8155 VTP N-side = 0.6839 VTP p-side = 0.4217 CHI2 TEST = 1 CAL_BASE = 2.4653 V CAL_VREF = 3.0093 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM25 3242 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:307 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4520 b(slope) = 0.0086 chi2 = 0.9797 CAL_IN P-side : a = 2.4523 b(slope) = 0.0086 chi2 = 0.7776 VTN N-side : a = 0.0102 b(slope) = 0.0106 chi2 = 1.2346 VTN P-side : a = 0.0100 b(slope) = 0.0064 chi2 = 0.9455 VTP N-side = 0.6877 VTP p-side = 0.4207 CHI2 TEST = 1 CAL_BASE = 2.4522 V CAL_VREF = 3.0010 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM41 1738 FUNCT@5.0V:ATOM41A 1613 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3732 FUNCT@5.0V:ATOM46C_40 5504 FUNCT@5.0V:ATOM47C_40 4892 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1409 TMIN TEST = 1 ---------- CHIP ID:407 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4672 b(slope) = 0.0083 chi2 = 1.1071 CAL_IN P-side : a = 2.4672 b(slope) = 0.0083 chi2 = 1.2670 VTN N-side : a = 0.0102 b(slope) = 0.0105 chi2 = 2.6242 VTN P-side : a = 0.0098 b(slope) = 0.0064 chi2 = 0.8095 VTP N-side = 0.6820 VTP p-side = 0.4196 CHI2 TEST = 1 CAL_BASE = 2.4709 V CAL_VREF = 3.0056 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM17 6620 FUNCT@5.0V:ATOM18 10749 FUNCT@5.0V:ATOM19 5488 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM36 4017 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:507 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4598 b(slope) = 0.0086 chi2 = 0.7841 CAL_IN P-side : a = 2.4598 b(slope) = 0.0086 chi2 = 0.5425 VTN N-side : a = 0.0095 b(slope) = 0.0106 chi2 = 1.0944 VTN P-side : a = 0.0098 b(slope) = 0.0065 chi2 = 0.4478 VTP N-side = 0.6921 VTP p-side = 0.4259 CHI2 TEST = 1 CAL_BASE = 2.4622 V CAL_VREF = 3.0134 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:607 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4691 b(slope) = 0.0084 chi2 = 1.0978 CAL_IN P-side : a = 2.4691 b(slope) = 0.0084 chi2 = 0.7901 VTN N-side : a = 0.0095 b(slope) = 0.0105 chi2 = 0.8214 VTN P-side : a = 0.0094 b(slope) = 0.0065 chi2 = 0.6245 VTP N-side = 0.6841 VTP p-side = 0.4233 CHI2 TEST = 1 CAL_BASE = 2.4717 V CAL_VREF = 3.0076 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:707 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4544 b(slope) = 0.0084 chi2 = 0.8467 CAL_IN P-side : a = 2.4542 b(slope) = 0.0084 chi2 = 1.4062 VTN N-side : a = 0.0093 b(slope) = 0.0104 chi2 = 0.9568 VTN P-side : a = 0.0094 b(slope) = 0.0064 chi2 = 0.7167 VTP N-side = 0.6731 VTP p-side = 0.4185 CHI2 TEST = 1 CAL_BASE = 2.4578 V CAL_VREF = 2.9959 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1271 FUNCT@5.0V:ATOM13B 1326 FUNCT@5.0V:ATOM13C 1326 FUNCT@5.0V:ATOM15 1315 FUNCT@5.0V:ATOM17 3627 FUNCT@5.0V:ATOM18 3643 FUNCT@5.0V:ATOM18HF 3643 FUNCT@5.0V:ATOM19 3579 FUNCT@5.0V:ATOM19D 3594 FUNCT@5.0V:ATOM19E 2821 FUNCT@5.0V:ATOM19F 6694 FUNCT@5.0V:ATOM19FHF 6694 FUNCT@5.0V:ATOM20 1287 FUNCT@5.0V:ATOM21 1263 FUNCT@5.0V:ATOM22 1251 FUNCT@5.0V:ATOM23 974 FUNCT@5.0V:ATOM24 1074 FUNCT@5.0V:ATOM25 1269 FUNCT@5.0V:ATOM25HF 1269 FUNCT@5.0V:ATOM26A 1248 FUNCT@5.0V:ATOM26B 2057 FUNCT@5.0V:ATOM28 1385 FUNCT@5.0V:ATOM29 1385 FUNCT@5.0V:ATOM30 1385 FUNCT@5.0V:ATOM31A 1019 FUNCT@5.0V:ATOM31B 1208 FUNCT@5.0V:ATOM32 1019 FUNCT@5.0V:ATOM33 1385 FUNCT@5.0V:ATOM35 1519 FUNCT@5.0V:ATOM36 1275 FUNCT@5.0V:ATOM39 1296 FUNCT@5.0V:ATOM41 1822 FUNCT@5.0V:ATOM41A 1822 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3777 FUNCT@5.0V:ATOM45C_40 3777 FUNCT@5.0V:ATOM46C_40 3777 FUNCT@5.0V:ATOM47C_40 3777 FUNCT@5.0V:ATOM48C_40 3777 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3777 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1243 NOISE TEST = 0 error detected at location:1401 TMIN TEST = 1 ---------- CHIP ID:807 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4410 b(slope) = 0.0085 chi2 = 0.6538 CAL_IN P-side : a = 2.4410 b(slope) = 0.0085 chi2 = 0.5350 VTN N-side : a = 0.0100 b(slope) = 0.0107 chi2 = 1.8395 VTN P-side : a = 0.0096 b(slope) = 0.0066 chi2 = 0.9981 VTP N-side = 0.6937 VTP p-side = 0.4339 CHI2 TEST = 1 CAL_BASE = 2.4443 V CAL_VREF = 2.9910 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:907 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4940 b(slope) = 0.0081 chi2 = 0.7381 CAL_IN P-side : a = 2.4941 b(slope) = 0.0081 chi2 = 0.4665 VTN N-side : a = 0.0101 b(slope) = 0.0107 chi2 = 1.9898 VTN P-side : a = 0.0097 b(slope) = 0.0067 chi2 = 0.9148 VTP N-side = 0.6978 VTP p-side = 0.4375 CHI2 TEST = 1 CAL_BASE = 2.4959 V CAL_VREF = 3.0164 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:908 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4570 b(slope) = 0.0084 chi2 = 1.2099 CAL_IN P-side : a = 2.4571 b(slope) = 0.0084 chi2 = 1.0614 VTN N-side : a = 0.0102 b(slope) = 0.0108 chi2 = 1.1395 VTN P-side : a = 0.0101 b(slope) = 0.0067 chi2 = 0.3275 VTP N-side = 0.7009 VTP p-side = 0.4389 CHI2 TEST = 1 CAL_BASE = 2.4607 V CAL_VREF = 3.0005 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM19F 10712 FUNCT@5.0V:ATOM19FHF 10712 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4535 FUNCT@5.0V:ATOM45C_40 4277 FUNCT@5.0V:ATOM46C_40 4277 FUNCT@5.0V:ATOM47C_40 3667 FUNCT@5.0V:ATOM48C_40 4535 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4535 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:808 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4833 b(slope) = 0.0082 chi2 = 1.3871 CAL_IN P-side : a = 2.4835 b(slope) = 0.0082 chi2 = 1.5704 VTN N-side : a = 0.0097 b(slope) = 0.0107 chi2 = 0.6001 VTN P-side : a = 0.0098 b(slope) = 0.0066 chi2 = 0.3316 VTP N-side = 0.6932 VTP p-side = 0.4303 CHI2 TEST = 1 CAL_BASE = 2.4893 V CAL_VREF = 3.0166 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13B 1343 FUNCT@5.0V:ATOM13C 1343 FUNCT@5.0V:ATOM19F 8409 FUNCT@5.0V:ATOM19FHF 8409 FUNCT@5.0V:ATOM23 974 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3779 FUNCT@5.0V:ATOM45C_40 3779 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 3779 FUNCT@5.0V:ATOM48C_40 3779 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3779 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:708 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4860 b(slope) = 0.0082 chi2 = 1.8256 CAL_IN P-side : a = 2.4865 b(slope) = 0.0082 chi2 = 3.0148 VTN N-side : a = 0.0100 b(slope) = 0.0105 chi2 = 1.0404 VTN P-side : a = 0.0097 b(slope) = 0.0065 chi2 = 0.4386 VTP N-side = 0.6844 VTP p-side = 0.4245 CHI2 TEST = 1 CAL_BASE = 2.4900 V CAL_VREF = 3.0176 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 2007 FUNCT@5.0V:ATOM15 2051 FUNCT@5.0V:ATOM17 4363 FUNCT@5.0V:ATOM18 4379 FUNCT@5.0V:ATOM18HF 4379 FUNCT@5.0V:ATOM19 4315 FUNCT@5.0V:ATOM19D 4330 FUNCT@5.0V:ATOM19E 3557 FUNCT@5.0V:ATOM19F 7430 FUNCT@5.0V:ATOM19FHF 7430 FUNCT@5.0V:ATOM20 2023 FUNCT@5.0V:ATOM21 1999 FUNCT@5.0V:ATOM22 1987 FUNCT@5.0V:ATOM25 2005 FUNCT@5.0V:ATOM25HF 2005 FUNCT@5.0V:ATOM26A 1984 FUNCT@5.0V:ATOM26B 2793 FUNCT@5.0V:ATOM28 2121 FUNCT@5.0V:ATOM29 2121 FUNCT@5.0V:ATOM30 2121 FUNCT@5.0V:ATOM31A 1755 FUNCT@5.0V:ATOM31B 1944 FUNCT@5.0V:ATOM32 1755 FUNCT@5.0V:ATOM33 2121 FUNCT@5.0V:ATOM35 2255 FUNCT@5.0V:ATOM36 2011 FUNCT@5.0V:ATOM39 2032 FUNCT@5.0V:ATOM41 2558 FUNCT@5.0V:ATOM41A 2558 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5967 FUNCT@5.0V:ATOM45C_40 5967 FUNCT@5.0V:ATOM46C_40 5967 FUNCT@5.0V:ATOM47C_40 5967 FUNCT@5.0V:ATOM48C_40 5967 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5967 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:608 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4592 b(slope) = 0.0085 chi2 = 0.6407 CAL_IN P-side : a = 2.4593 b(slope) = 0.0085 chi2 = 0.7430 VTN N-side : a = 0.0101 b(slope) = 0.0106 chi2 = 0.5249 VTN P-side : a = 0.0101 b(slope) = 0.0065 chi2 = 0.6880 VTP N-side = 0.6888 VTP p-side = 0.4263 CHI2 TEST = 1 CAL_BASE = 2.4629 V CAL_VREF = 3.0054 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:508 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5238 b(slope) = 0.0081 chi2 = 1.4726 CAL_IN P-side : a = 2.5239 b(slope) = 0.0081 chi2 = 0.9121 VTN N-side : a = 0.0103 b(slope) = 0.0106 chi2 = 1.0664 VTN P-side : a = 0.0103 b(slope) = 0.0065 chi2 = 0.6922 VTP N-side = 0.6888 VTP p-side = 0.4261 CHI2 TEST = 1 CAL_BASE = 2.5288 V CAL_VREF = 3.0444 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM25 3242 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1401 TMIN TEST = 1 ---------- CHIP ID:408 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4884 b(slope) = 0.0083 chi2 = 0.8581 CAL_IN P-side : a = 2.4885 b(slope) = 0.0083 chi2 = 1.3979 VTN N-side : a = 0.0107 b(slope) = 0.0106 chi2 = 1.8063 VTN P-side : a = 0.0108 b(slope) = 0.0065 chi2 = 1.0330 VTP N-side = 0.6865 VTP p-side = 0.4248 CHI2 TEST = 1 CAL_BASE = 2.4893 V CAL_VREF = 3.0225 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM17 7704 FUNCT@5.0V:ATOM18 6636 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM31B 2033 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:308 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4655 b(slope) = 0.0085 chi2 = 1.9024 CAL_IN P-side : a = 2.4657 b(slope) = 0.0085 chi2 = 1.5361 VTN N-side : a = 0.0116 b(slope) = 0.0106 chi2 = 1.7887 VTN P-side : a = 0.0119 b(slope) = 0.0065 chi2 = 1.0736 VTP N-side = 0.6935 VTP p-side = 0.4278 CHI2 TEST = 1 CAL_BASE = 2.4658 V CAL_VREF = 3.0105 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:208 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4457 b(slope) = 0.0085 chi2 = 0.9656 CAL_IN P-side : a = 2.4460 b(slope) = 0.0085 chi2 = 0.9790 VTN N-side : a = 0.0118 b(slope) = 0.0106 chi2 = 0.3628 VTN P-side : a = 0.0117 b(slope) = 0.0065 chi2 = 0.2137 VTP N-side = 0.6919 VTP p-side = 0.4306 CHI2 TEST = 1 CAL_BASE = 2.4504 V CAL_VREF = 2.9976 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:108 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4749 b(slope) = 0.0084 chi2 = 0.7613 CAL_IN P-side : a = 2.4750 b(slope) = 0.0083 chi2 = 1.1970 VTN N-side : a = 0.0114 b(slope) = 0.0105 chi2 = 1.3568 VTN P-side : a = 0.0113 b(slope) = 0.0065 chi2 = 1.0462 VTP N-side = 0.6871 VTP p-side = 0.4287 CHI2 TEST = 1 CAL_BASE = 2.4766 V CAL_VREF = 3.0122 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:209 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4698 b(slope) = 0.0084 chi2 = 0.4940 CAL_IN P-side : a = 2.4703 b(slope) = 0.0084 chi2 = 0.8713 VTN N-side : a = 0.0107 b(slope) = 0.0105 chi2 = 0.6402 VTN P-side : a = 0.0106 b(slope) = 0.0064 chi2 = 0.3572 VTP N-side = 0.6858 VTP p-side = 0.4226 CHI2 TEST = 1 CAL_BASE = 2.4748 V CAL_VREF = 3.0149 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1623 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM15 1667 FUNCT@5.0V:ATOM17 3979 FUNCT@5.0V:ATOM18 3995 FUNCT@5.0V:ATOM18HF 3995 FUNCT@5.0V:ATOM19 3931 FUNCT@5.0V:ATOM19D 3946 FUNCT@5.0V:ATOM19E 3173 FUNCT@5.0V:ATOM19F 7046 FUNCT@5.0V:ATOM19FHF 7046 FUNCT@5.0V:ATOM20 1639 FUNCT@5.0V:ATOM21 1615 FUNCT@5.0V:ATOM22 1603 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 1621 FUNCT@5.0V:ATOM25HF 1621 FUNCT@5.0V:ATOM26A 1600 FUNCT@5.0V:ATOM26B 2409 FUNCT@5.0V:ATOM28 1737 FUNCT@5.0V:ATOM29 1737 FUNCT@5.0V:ATOM30 1737 FUNCT@5.0V:ATOM31A 1371 FUNCT@5.0V:ATOM31B 1560 FUNCT@5.0V:ATOM32 1371 FUNCT@5.0V:ATOM33 1737 FUNCT@5.0V:ATOM35 1871 FUNCT@5.0V:ATOM36 1627 FUNCT@5.0V:ATOM39 1648 FUNCT@5.0V:ATOM41 2174 FUNCT@5.0V:ATOM41A 2174 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5775 FUNCT@5.0V:ATOM45C_40 5775 FUNCT@5.0V:ATOM46C_40 4277 FUNCT@5.0V:ATOM47C_40 3667 FUNCT@5.0V:ATOM48C_40 5775 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5775 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:309 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4561 b(slope) = 0.0085 chi2 = 0.7642 CAL_IN P-side : a = 2.4560 b(slope) = 0.0085 chi2 = 1.3095 VTN N-side : a = 0.0110 b(slope) = 0.0105 chi2 = 0.6570 VTN P-side : a = 0.0109 b(slope) = 0.0064 chi2 = 0.8387 VTP N-side = 0.6832 VTP p-side = 0.4223 CHI2 TEST = 1 CAL_BASE = 2.4583 V CAL_VREF = 3.0046 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:409 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4402 b(slope) = 0.0087 chi2 = 1.2662 CAL_IN P-side : a = 2.4404 b(slope) = 0.0087 chi2 = 0.5237 VTN N-side : a = 0.0102 b(slope) = 0.0107 chi2 = 1.5049 VTN P-side : a = 0.0101 b(slope) = 0.0065 chi2 = 0.8473 VTP N-side = 0.6947 VTP p-side = 0.4283 CHI2 TEST = 1 CAL_BASE = 2.4453 V CAL_VREF = 2.9995 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:509 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4658 b(slope) = 0.0086 chi2 = 1.2996 CAL_IN P-side : a = 2.4662 b(slope) = 0.0086 chi2 = 1.2835 VTN N-side : a = 0.0107 b(slope) = 0.0107 chi2 = 2.7016 VTN P-side : a = 0.0105 b(slope) = 0.0066 chi2 = 1.0370 VTP N-side = 0.6991 VTP p-side = 0.4321 CHI2 TEST = 1 CAL_BASE = 2.4683 V CAL_VREF = 3.0176 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:609 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4561 b(slope) = 0.0086 chi2 = 1.1906 CAL_IN P-side : a = 2.4564 b(slope) = 0.0086 chi2 = 0.8743 VTN N-side : a = 0.0107 b(slope) = 0.0107 chi2 = 1.1374 VTN P-side : a = 0.0102 b(slope) = 0.0065 chi2 = 0.5978 VTP N-side = 0.6943 VTP p-side = 0.4303 CHI2 TEST = 1 CAL_BASE = 2.4602 V CAL_VREF = 3.0081 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:709 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4840 b(slope) = 0.0082 chi2 = 0.8147 CAL_IN P-side : a = 2.4836 b(slope) = 0.0082 chi2 = 7.3822 VTN N-side : a = 0.0103 b(slope) = 0.0105 chi2 = 1.3275 VTN P-side : a = 0.0100 b(slope) = 0.0066 chi2 = 0.4414 VTP N-side = 0.6851 VTP p-side = 0.4307 CHI2 TEST = 1 CAL_BASE = 2.4885 V CAL_VREF = 3.0129 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:809 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4794 b(slope) = 0.0082 chi2 = 0.5361 CAL_IN P-side : a = 2.4793 b(slope) = 0.0082 chi2 = 0.3730 VTN N-side : a = 0.0098 b(slope) = 0.0106 chi2 = 0.8626 VTN P-side : a = 0.0097 b(slope) = 0.0065 chi2 = 0.4378 VTP N-side = 0.6898 VTP p-side = 0.4299 CHI2 TEST = 1 CAL_BASE = 2.4824 V CAL_VREF = 3.0078 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:810 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4658 b(slope) = 0.0083 chi2 = 0.7815 CAL_IN P-side : a = 2.4656 b(slope) = 0.0083 chi2 = 4.2965 VTN N-side : a = 0.0101 b(slope) = 0.0108 chi2 = 0.5619 VTN P-side : a = 0.0100 b(slope) = 0.0067 chi2 = 0.2823 VTP N-side = 0.7047 VTP p-side = 0.4377 CHI2 TEST = 1 CAL_BASE = 2.4702 V CAL_VREF = 3.0049 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1404 TMIN TEST = 1 ---------- CHIP ID:710 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDOP1:DVDD 1.0097E-01 DACs TEST = 1 CAL_IN N-side : a = 2.5200 b(slope) = 0.0081 chi2 = 1.1414 CAL_IN P-side : a = 2.5199 b(slope) = 0.0081 chi2 = 0.8097 VTN N-side : a = 0.0102 b(slope) = 0.0108 chi2 = 0.4598 VTN P-side : a = 0.0100 b(slope) = 0.0066 chi2 = 0.3514 VTP N-side = 0.7014 VTP p-side = 0.4343 CHI2 TEST = 1 CAL_BASE = 2.5234 V CAL_VREF = 3.0444 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13B 1935 FUNCT@5.0V:ATOM13C 1935 FUNCT@5.0V:ATOM19F 10547 FUNCT@5.0V:ATOM19FHF 10547 FUNCT@5.0V:ATOM23 974 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5291 FUNCT@5.0V:ATOM45C_40 5291 FUNCT@5.0V:ATOM46C_40 5291 FUNCT@5.0V:ATOM47C_40 4277 FUNCT@5.0V:ATOM48C_40 5291 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5291 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:610 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD1A 1.5188E-01 IDDSB:VDD1B 1.5805E-01 IDDSB:VDD1C 1.6386E-01 IDDSB:VDD1D 1.6934E-01 IDDOP1:DVDD 1.9753E-01 DACs TEST = 1 CAL_IN N-side : a = 2.4834 b(slope) = 0.0084 chi2 = 0.8220 CAL_IN P-side : a = 2.4832 b(slope) = 0.0084 chi2 = 0.6881 VTN N-side : a = 0.0206 b(slope) = 0.0107 chi2 = 1.1121 VTN P-side : a = 0.0203 b(slope) = 0.0066 chi2 = 0.9155 VTP N-side = 0.7068 VTP p-side = 0.4417 CHI2 TEST = 1 CAL_BASE = 2.4866 V CAL_VREF = 3.0273 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1063 FUNCT@5.0V:ATOM13B 1128 FUNCT@5.0V:ATOM13C 1128 FUNCT@5.0V:ATOM15 1107 FUNCT@5.0V:ATOM17 3419 FUNCT@5.0V:ATOM18 3435 FUNCT@5.0V:ATOM18HF 3435 FUNCT@5.0V:ATOM19 3371 FUNCT@5.0V:ATOM19D 3386 FUNCT@5.0V:ATOM19E 2613 FUNCT@5.0V:ATOM19F 6486 FUNCT@5.0V:ATOM19FHF 6486 FUNCT@5.0V:ATOM20 1079 FUNCT@5.0V:ATOM21 1055 FUNCT@5.0V:ATOM22 1043 FUNCT@5.0V:ATOM25 1061 FUNCT@5.0V:ATOM25HF 1061 FUNCT@5.0V:ATOM26A 1040 FUNCT@5.0V:ATOM26B 1849 FUNCT@5.0V:ATOM28 1177 FUNCT@5.0V:ATOM29 1177 FUNCT@5.0V:ATOM30 1177 FUNCT@5.0V:ATOM31A 811 FUNCT@5.0V:ATOM31B 1000 FUNCT@5.0V:ATOM32 811 FUNCT@5.0V:ATOM33 1177 FUNCT@5.0V:ATOM35 1311 FUNCT@5.0V:ATOM36 1067 FUNCT@5.0V:ATOM39 1088 FUNCT@5.0V:ATOM41 1614 FUNCT@5.0V:ATOM41A 1614 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3665 FUNCT@5.0V:ATOM45C_40 3665 FUNCT@5.0V:ATOM46C_40 3665 FUNCT@5.0V:ATOM47C_40 3665 FUNCT@5.0V:ATOM48C_40 3665 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3665 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1243 NOISE TEST = 0 error detected at location:1401 TMIN TEST = 1 ---------- CHIP ID:510 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4708 b(slope) = 0.0085 chi2 = 0.5156 CAL_IN P-side : a = 2.4711 b(slope) = 0.0085 chi2 = 0.4770 VTN N-side : a = 0.0101 b(slope) = 0.0107 chi2 = 0.8573 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.5263 VTP N-side = 0.6966 VTP p-side = 0.4272 CHI2 TEST = 1 CAL_BASE = 2.4753 V CAL_VREF = 3.0220 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:410 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4891 b(slope) = 0.0084 chi2 = 1.0534 CAL_IN P-side : a = 2.4891 b(slope) = 0.0084 chi2 = 0.6616 VTN N-side : a = 0.0100 b(slope) = 0.0107 chi2 = 2.0913 VTN P-side : a = 0.0099 b(slope) = 0.0066 chi2 = 0.4543 VTP N-side = 0.6940 VTP p-side = 0.4307 CHI2 TEST = 1 CAL_BASE = 2.4897 V CAL_VREF = 3.0283 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:310 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4628 b(slope) = 0.0086 chi2 = 1.3546 CAL_IN P-side : a = 2.4630 b(slope) = 0.0085 chi2 = 1.0382 VTN N-side : a = 0.0107 b(slope) = 0.0108 chi2 = 1.0814 VTN P-side : a = 0.0104 b(slope) = 0.0066 chi2 = 0.5919 VTP N-side = 0.7026 VTP p-side = 0.4335 CHI2 TEST = 1 CAL_BASE = 2.4646 V CAL_VREF = 3.0115 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:210 ------------------ CLASS = C && 0---------- CONTACTS TEST = 0 error detected in test: Location: CONTACT:10/T4 -1.2207E-03 CONTACT:14/T5 -1.4648E-03 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A -1.0000E-38 IDDSB:VDD1A -1.0000E-38 IDDSB:VDD0B -1.0000E-38 IDDSB:VDD1B -1.0000E-38 IDDSB:VDD0C -1.0000E-38 IDDSB:VDD1C -1.0000E-38 IDDSB:VDD0D -1.0000E-38 IDDSB:VDD1D -1.0000E-38 V_AVDD2IPA:249/L9 -1.0000E-38 V_AVDD2IMA:277/L10 -1.0000E-38 AVDD_A:AVDDP-M -1.0000E-38 IAVDD2_A:AVDDP-M -1.0000E-38 V_V1RA:169/L5 -1.0000E-38 V_N310A:171/L6 -1.0000E-38 V_AVDD2IPB:249/L9 -1.0000E-38 V_AVDD2IMB:277/L10 -1.0000E-38 AVDD_B:AVDDP-M -1.0000E-38 IAVDD2_B:AVDDP-M -1.0000E-38 V_V1RB:169/L5 -1.0000E-38 V_N310B:171/L6 -1.0000E-38 V_AVDD2IPC:249/L9 -1.0000E-38 V_AVDD2IMC:277/L10 -1.0000E-38 AVDD_C:AVDDP-M -1.0000E-38 IAVDD2_C:AVDDP-M -1.0000E-38 V_V1RC:169/L5 -1.0000E-38 V_N310C:171/L6 -1.0000E-38 V_AVDD2IPD:249/L9 -1.0000E-38 V_AVDD2IMD:277/L10 -1.0000E-38 AVDD_D:AVDDP-M -1.0000E-38 IAVDD2_D:AVDDP-M -1.0000E-38 V_V1RD:169/L5 -1.0000E-38 V_N310D:171/L6 -1.0000E-38 IDDOP0:AVDD -1.0000E-38 IDDOP1:DVDD -1.0000E-38 DACs TEST = 0 CAL_IN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side = 0.0000 VTP p-side = 0.0000 CHI2 TEST = 0 CAL_BASE = 0.0000 V CAL_VREF = 0.0000 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 0 FUNCT@5.0V:ATOM1TO6B 0 FUNCT@5.0V:ATOM1TO6C 0 FUNCT@5.0V:ATOM1TO6D 0 FUNCT@5.0V:ATOM1TO6E 0 FUNCT@5.0V:ATOM7TO9A 0 FUNCT@5.0V:ATOM7TO9B 0 FUNCT@5.0V:ATOM7TO9C 0 FUNCT@5.0V:ATOM7TO9D 0 FUNCT@5.0V:ATOM7TO9E 0 FUNCT@5.0V:ATOM10TO12 0 FUNCT@5.0V:ATOM13A 0 FUNCT@5.0V:ATOM13B 0 FUNCT@5.0V:ATOM13C 0 FUNCT@5.0V:ATOM14 0 FUNCT@5.0V:ATOM15 0 FUNCT@5.0V:ATOM16 0 FUNCT@5.0V:ATOM17 0 FUNCT@5.0V:ATOM18 0 FUNCT@5.0V:ATOM18HF 0 FUNCT@5.0V:ATOM19 0 FUNCT@5.0V:ATOM19B 0 FUNCT@5.0V:ATOM19C 0 FUNCT@5.0V:ATOM19D 0 FUNCT@5.0V:ATOM19E 0 FUNCT@5.0V:ATOM19F 0 FUNCT@5.0V:ATOM19FHF 0 FUNCT@5.0V:ATOM20 0 FUNCT@5.0V:ATOM21 0 FUNCT@5.0V:ATOM22 0 FUNCT@5.0V:ATOM23 0 FUNCT@5.0V:ATOM24 0 FUNCT@5.0V:ATOM25 0 FUNCT@5.0V:ATOM25HF 0 FUNCT@5.0V:ATOM26A 0 FUNCT@5.0V:ATOM26B 0 FUNCT@5.0V:ATOM27 0 FUNCT@5.0V:ATOM28 0 FUNCT@5.0V:ATOM29 0 FUNCT@5.0V:ATOM30 0 FUNCT@5.0V:ATOM31A 0 FUNCT@5.0V:ATOM31B 0 FUNCT@5.0V:ATOM32 0 FUNCT@5.0V:ATOM33 0 FUNCT@5.0V:ATOM34 0 FUNCT@5.0V:ATOM35 0 FUNCT@5.0V:ATOM36 0 FUNCT@5.0V:ATOM38 0 FUNCT@5.0V:ATOM39 0 FUNCT@5.0V:ATOM40 0 FUNCT@5.0V:ATOM41 0 FUNCT@5.0V:ATOM41A 0 FUNCT@5.0V:ATOM42 0 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 0 FUNCT@5.0V:ATOM45C_40 0 FUNCT@5.0V:ATOM46C_40 0 FUNCT@5.0V:ATOM47C_40 0 FUNCT@5.0V:ATOM48C_40 0 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 0 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 0 FUNCT@5.0V:A10TO12HF 0 FUNCT@5.0V:ADAC37HF 0 CH.MASK TEST = 0 error detected at location:0 NOISE TEST = 0 error detected at location:0 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D -1.0000E-38 TMIN@4.8V:A7_9_60D -1.0000E-38 TMIN@4.8V:A10_12_50D -1.0000E-38 TMIN@4.8V:A10_12_60D -1.0000E-38 TMIN@4.8V:ADAC37_50D -1.0000E-38 TMIN@4.8V:ADAC37_60D -1.0000E-38 TMIN@5.0V:A7_9_50D -1.0000E-38 TMIN@5.0V:A7_9_60D -1.0000E-38 TMIN@5.0V:A10_12_50D -1.0000E-38 TMIN@5.0V:A10_12_60D -1.0000E-38 TMIN@5.0V:ADAC37_50D -1.0000E-38 TMIN@5.0V:ADAC37_60D -1.0000E-38 TMIN@5.2V:A7_9_50D -1.0000E-38 TMIN@5.2V:A7_9_60D -1.0000E-38 TMIN@5.2V:A10_12_50D -1.0000E-38 TMIN@5.2V:A10_12_60D -1.0000E-38 TMIN@5.2V:ADAC37_50D -1.0000E-38 TMIN@5.2V:ADAC37_60D -1.0000E-38 ---------- CHIP ID:211 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4852 b(slope) = 0.0084 chi2 = 1.1439 CAL_IN P-side : a = 2.4856 b(slope) = 0.0084 chi2 = 2.2360 VTN N-side : a = 0.0102 b(slope) = 0.0105 chi2 = 0.7125 VTN P-side : a = 0.0102 b(slope) = 0.0064 chi2 = 0.5108 VTP N-side = 0.6853 VTP p-side = 0.4201 CHI2 TEST = 1 CAL_BASE = 2.4912 V CAL_VREF = 3.0273 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:311 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.4584 b(slope) = 0.0088 chi2 = 31.5390 CAL_IN P-side : a = 2.4618 b(slope) = 0.0088 chi2 = 14.5711 VTN N-side : a = 0.0104 b(slope) = 0.0106 chi2 = 0.4705 VTN P-side : a = 0.0103 b(slope) = 0.0065 chi2 = 0.3392 VTP N-side = 0.6900 VTP p-side = 0.4253 CHI2 TEST = 0 CAL_BASE = 2.4648 V CAL_VREF = 3.0181 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1404 TMIN TEST = 1 ---------- CHIP ID:411 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4763 b(slope) = 0.0085 chi2 = 0.6795 CAL_IN P-side : a = 2.4762 b(slope) = 0.0085 chi2 = 0.5267 VTN N-side : a = 0.0097 b(slope) = 0.0107 chi2 = 1.0527 VTN P-side : a = 0.0097 b(slope) = 0.0066 chi2 = 0.4058 VTP N-side = 0.6966 VTP p-side = 0.4311 CHI2 TEST = 1 CAL_BASE = 2.4802 V CAL_VREF = 3.0222 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:511 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4874 b(slope) = 0.0083 chi2 = 0.8504 CAL_IN P-side : a = 2.4876 b(slope) = 0.0083 chi2 = 0.8004 VTN N-side : a = 0.0095 b(slope) = 0.0106 chi2 = 1.0809 VTN P-side : a = 0.0096 b(slope) = 0.0065 chi2 = 0.2633 VTP N-side = 0.6925 VTP p-side = 0.4275 CHI2 TEST = 1 CAL_BASE = 2.4902 V CAL_VREF = 3.0229 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1974 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM15 2018 FUNCT@5.0V:ATOM17 4330 FUNCT@5.0V:ATOM18 4346 FUNCT@5.0V:ATOM18HF 4346 FUNCT@5.0V:ATOM19 4282 FUNCT@5.0V:ATOM19D 4297 FUNCT@5.0V:ATOM19E 3524 FUNCT@5.0V:ATOM19F 7397 FUNCT@5.0V:ATOM19FHF 7397 FUNCT@5.0V:ATOM20 1990 FUNCT@5.0V:ATOM21 1966 FUNCT@5.0V:ATOM22 1954 FUNCT@5.0V:ATOM23 975 FUNCT@5.0V:ATOM24 1075 FUNCT@5.0V:ATOM25 1972 FUNCT@5.0V:ATOM25HF 1972 FUNCT@5.0V:ATOM26A 1951 FUNCT@5.0V:ATOM26B 2760 FUNCT@5.0V:ATOM28 2088 FUNCT@5.0V:ATOM29 2088 FUNCT@5.0V:ATOM30 2088 FUNCT@5.0V:ATOM31A 1722 FUNCT@5.0V:ATOM31B 1911 FUNCT@5.0V:ATOM32 1722 FUNCT@5.0V:ATOM33 2088 FUNCT@5.0V:ATOM35 2222 FUNCT@5.0V:ATOM36 1978 FUNCT@5.0V:ATOM39 1999 FUNCT@5.0V:ATOM41 2525 FUNCT@5.0V:ATOM41A 2525 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4130 FUNCT@5.0V:ATOM45C_40 4130 FUNCT@5.0V:ATOM46C_40 4130 FUNCT@5.0V:ATOM47C_40 3669 FUNCT@5.0V:ATOM48C_40 4130 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4130 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1244 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:611 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4749 b(slope) = 0.0084 chi2 = 1.1881 CAL_IN P-side : a = 2.4750 b(slope) = 0.0084 chi2 = 0.5010 VTN N-side : a = 0.0107 b(slope) = 0.0109 chi2 = 2.4530 VTN P-side : a = 0.0101 b(slope) = 0.0067 chi2 = 0.3858 VTP N-side = 0.7071 VTP p-side = 0.4392 CHI2 TEST = 1 CAL_BASE = 2.4785 V CAL_VREF = 3.0198 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:711 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4544 b(slope) = 0.0086 chi2 = 7.8487 CAL_IN P-side : a = 2.4569 b(slope) = 0.0087 chi2 = 3.5140 VTN N-side : a = 0.0101 b(slope) = 0.0107 chi2 = 0.9137 VTN P-side : a = 0.0099 b(slope) = 0.0066 chi2 = 0.8529 VTP N-side = 0.6980 VTP p-side = 0.4354 CHI2 TEST = 1 CAL_BASE = 2.4619 V CAL_VREF = 3.0105 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:811 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5078 b(slope) = 0.0080 chi2 = 1.8646 CAL_IN P-side : a = 2.5083 b(slope) = 0.0080 chi2 = 1.4217 VTN N-side : a = 0.0104 b(slope) = 0.0106 chi2 = 1.7673 VTN P-side : a = 0.0102 b(slope) = 0.0066 chi2 = 1.5977 VTP N-side = 0.6918 VTP p-side = 0.4314 CHI2 TEST = 1 CAL_BASE = 2.5110 V CAL_VREF = 3.0249 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:812 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4831 b(slope) = 0.0083 chi2 = 0.6128 CAL_IN P-side : a = 2.4830 b(slope) = 0.0083 chi2 = 1.0045 VTN N-side : a = 0.0105 b(slope) = 0.0107 chi2 = 0.6248 VTN P-side : a = 0.0103 b(slope) = 0.0067 chi2 = 0.4153 VTP N-side = 0.6997 VTP p-side = 0.4387 CHI2 TEST = 1 CAL_BASE = 2.4873 V CAL_VREF = 3.0181 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:712 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4958 b(slope) = 0.0082 chi2 = 1.1038 CAL_IN P-side : a = 2.4959 b(slope) = 0.0082 chi2 = 0.7927 VTN N-side : a = 0.0105 b(slope) = 0.0107 chi2 = 1.3715 VTN P-side : a = 0.0104 b(slope) = 0.0066 chi2 = 0.8014 VTP N-side = 0.6967 VTP p-side = 0.4331 CHI2 TEST = 1 CAL_BASE = 2.5015 V CAL_VREF = 3.0303 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:612 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4941 b(slope) = 0.0084 chi2 = 1.3760 CAL_IN P-side : a = 2.4947 b(slope) = 0.0084 chi2 = 1.0730 VTN N-side : a = 0.0102 b(slope) = 0.0107 chi2 = 1.0236 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.6626 VTP N-side = 0.6941 VTP p-side = 0.4293 CHI2 TEST = 1 CAL_BASE = 2.4980 V CAL_VREF = 3.0342 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:512 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5055 b(slope) = 0.0083 chi2 = 1.4328 CAL_IN P-side : a = 2.5058 b(slope) = 0.0083 chi2 = 0.7314 VTN N-side : a = 0.0097 b(slope) = 0.0108 chi2 = 1.0961 VTN P-side : a = 0.0099 b(slope) = 0.0066 chi2 = 0.6808 VTP N-side = 0.7016 VTP p-side = 0.4327 CHI2 TEST = 1 CAL_BASE = 2.5093 V CAL_VREF = 3.0415 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:412 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4839 b(slope) = 0.0084 chi2 = 2.9703 CAL_IN P-side : a = 2.4843 b(slope) = 0.0084 chi2 = 3.0487 VTN N-side : a = 0.0103 b(slope) = 0.0107 chi2 = 0.8282 VTN P-side : a = 0.0103 b(slope) = 0.0066 chi2 = 0.8192 VTP N-side = 0.6934 VTP p-side = 0.4306 CHI2 TEST = 1 CAL_BASE = 2.4902 V CAL_VREF = 3.0295 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:312 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4780 b(slope) = 0.0085 chi2 = 1.4274 CAL_IN P-side : a = 2.4782 b(slope) = 0.0085 chi2 = 1.3459 VTN N-side : a = 0.0109 b(slope) = 0.0105 chi2 = 0.6840 VTN P-side : a = 0.0108 b(slope) = 0.0064 chi2 = 0.5227 VTP N-side = 0.6868 VTP p-side = 0.4226 CHI2 TEST = 1 CAL_BASE = 2.4819 V CAL_VREF = 3.0286 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1053 FUNCT@5.0V:ATOM13B 1109 FUNCT@5.0V:ATOM13C 1109 FUNCT@5.0V:ATOM15 1097 FUNCT@5.0V:ATOM17 3409 FUNCT@5.0V:ATOM18 3425 FUNCT@5.0V:ATOM18HF 3425 FUNCT@5.0V:ATOM19 3361 FUNCT@5.0V:ATOM19D 3376 FUNCT@5.0V:ATOM19E 2603 FUNCT@5.0V:ATOM19F 6476 FUNCT@5.0V:ATOM19FHF 6476 FUNCT@5.0V:ATOM20 1069 FUNCT@5.0V:ATOM21 1045 FUNCT@5.0V:ATOM22 1033 FUNCT@5.0V:ATOM23 965 FUNCT@5.0V:ATOM24 1065 FUNCT@5.0V:ATOM25 1051 FUNCT@5.0V:ATOM25HF 1051 FUNCT@5.0V:ATOM26A 1030 FUNCT@5.0V:ATOM26B 1839 FUNCT@5.0V:ATOM28 1167 FUNCT@5.0V:ATOM29 1167 FUNCT@5.0V:ATOM30 1167 FUNCT@5.0V:ATOM31A 801 FUNCT@5.0V:ATOM31B 990 FUNCT@5.0V:ATOM32 801 FUNCT@5.0V:ATOM33 1167 FUNCT@5.0V:ATOM35 1301 FUNCT@5.0V:ATOM36 1057 FUNCT@5.0V:ATOM39 1078 FUNCT@5.0V:ATOM41 1604 FUNCT@5.0V:ATOM41A 1604 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4268 FUNCT@5.0V:ATOM45C_40 4268 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 4268 FUNCT@5.0V:ATOM48C_40 4268 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4268 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1392 TMIN TEST = 1 ---------- CHIP ID:212 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4900 b(slope) = 0.0085 chi2 = 1.0451 CAL_IN P-side : a = 2.4895 b(slope) = 0.0085 chi2 = 3.6696 VTN N-side : a = 0.0111 b(slope) = 0.0106 chi2 = 1.3101 VTN P-side : a = 0.0110 b(slope) = 0.0065 chi2 = 1.0695 VTP N-side = 0.6914 VTP p-side = 0.4248 CHI2 TEST = 1 CAL_BASE = 2.4936 V CAL_VREF = 3.0357 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:413 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4691 b(slope) = 0.0085 chi2 = 2.9479 CAL_IN P-side : a = 2.4697 b(slope) = 0.0085 chi2 = 3.3734 VTN N-side : a = 0.0111 b(slope) = 0.0107 chi2 = 1.3928 VTN P-side : a = 0.0107 b(slope) = 0.0065 chi2 = 0.7771 VTP N-side = 0.6959 VTP p-side = 0.4297 CHI2 TEST = 1 CAL_BASE = 2.4734 V CAL_VREF = 3.0203 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:513 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4560 b(slope) = 0.0086 chi2 = 1.2584 CAL_IN P-side : a = 2.4561 b(slope) = 0.0086 chi2 = 0.8751 VTN N-side : a = 0.0101 b(slope) = 0.0106 chi2 = 0.9945 VTN P-side : a = 0.0100 b(slope) = 0.0064 chi2 = 0.5917 VTP N-side = 0.6882 VTP p-side = 0.4233 CHI2 TEST = 1 CAL_BASE = 2.4648 V CAL_VREF = 3.0144 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:613 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4735 b(slope) = 0.0085 chi2 = 0.9814 CAL_IN P-side : a = 2.4736 b(slope) = 0.0085 chi2 = 1.6052 VTN N-side : a = 0.0098 b(slope) = 0.0110 chi2 = 0.6424 VTN P-side : a = 0.0100 b(slope) = 0.0067 chi2 = 0.3916 VTP N-side = 0.7127 VTP p-side = 0.4393 CHI2 TEST = 1 CAL_BASE = 2.4807 V CAL_VREF = 3.0247 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:614 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4896 b(slope) = 0.0085 chi2 = 0.9990 CAL_IN P-side : a = 2.4899 b(slope) = 0.0085 chi2 = 0.6333 VTN N-side : a = 0.0096 b(slope) = 0.0109 chi2 = 1.3261 VTN P-side : a = 0.0094 b(slope) = 0.0067 chi2 = 0.5003 VTP N-side = 0.7098 VTP p-side = 0.4370 CHI2 TEST = 1 CAL_BASE = 2.4907 V CAL_VREF = 3.0342 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:514 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4929 b(slope) = 0.0085 chi2 = 1.4186 CAL_IN P-side : a = 2.4929 b(slope) = 0.0085 chi2 = 1.1788 VTN N-side : a = 0.0094 b(slope) = 0.0109 chi2 = 1.5749 VTN P-side : a = 0.0093 b(slope) = 0.0067 chi2 = 0.7920 VTP N-side = 0.7080 VTP p-side = 0.4388 CHI2 TEST = 1 CAL_BASE = 2.4968 V CAL_VREF = 3.0405 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:414 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5120 b(slope) = 0.0084 chi2 = 2.6146 CAL_IN P-side : a = 2.5126 b(slope) = 0.0084 chi2 = 1.9202 VTN N-side : a = 0.0094 b(slope) = 0.0108 chi2 = 1.0794 VTN P-side : a = 0.0093 b(slope) = 0.0066 chi2 = 0.4964 VTP N-side = 0.6988 VTP p-side = 0.4310 CHI2 TEST = 1 CAL_BASE = 2.5159 V CAL_VREF = 3.0527 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 +++++++++ SUMMARY OF RESULTS ++++++++++++++++++++++++() ++++++++++++++++ A A< B B< C --------------------------------------------------------------- 401 0 0 0 0 0 0 0 0 501 0 0 0 0 601 602 0 0 0 0 502 0 0 0 0 402 0 0 0 0 203 0 0 0 0 303 0 0 0 0 403 0 0 0 0 503 0 0 0 0 603 0 0 0 0 703 0 0 0 0 803 0 0 0 0 0 0 0 0 804 0 0 0 0 704 604 0 0 0 0 0 0 504 0 0 404 0 0 0 0 0 0 0 0 304 204 0 0 0 0 205 0 0 0 0 305 0 0 0 0 405 0 0 0 0 505 0 0 0 0 605 0 0 0 0 705 0 0 0 0 805 0 0 0 0 0 0 0 0 806 706 0 0 0 0 606 0 0 0 0 506 0 0 0 0 0 0 0 0 406 306 0 0 0 0 206 0 0 0 0 107 0 0 0 0 0 207 0 0 0 0 0 0 0 307 0 407 0 0 0 507 0 0 0 0 607 0 0 0 0 0 0 0 0 707 807 0 0 0 0 907 0 0 0 0 0 0 0 0 908 0 0 0 0 808 0 0 0 0 708 608 0 0 0 0 0 0 0 0 508 0 408 0 0 0 308 0 0 0 0 208 0 0 0 0 108 0 0 0 0 0 0 0 0 209 0 309 0 0 0 409 0 0 0 0 0 509 0 0 0 609 0 0 0 0 709 0 0 0 0 809 0 0 0 0 0 0 0 0 810 0 0 0 0 710 0 0 0 0 610 0 510 0 0 0 0 0 0 0 410 0 310 0 0 0 0 0 0 0 210 0 211 0 0 0 0 0 0 0 311 0 411 0 0 0 0 0 0 0 511 0 611 0 0 0 0 711 0 0 0 0 811 0 0 0 0 812 0 0 0 0 712 0 0 0 0 612 0 0 0 0 512 0 0 0 0 412 0 0 0 0 0 0 0 312 0 212 0 0 0 0 413 0 0 0 0 513 0 0 0 0 613 0 0 0 0 614 0 0 0 0 514 0 0 0 0 414 0 0 0 ---------------------------------------------------------------- 39 22 24 1 0 NUMBER OF CHIPS TESTED = 86 NUMBER OF A CHIPS = 39 NUMBER OF A< CHIPS = 24 NUMBER OF B CHIPS = 1 NUMBER OF B< CHIPS = 0 NUMBER OF C CHIPS = 22 YIELD = 45.35 % (YIELD WITH LT CHIPS= 73.26 %)