******************************************************************** wafer #16 ******************************************************************** ---------- CHIP ID:401 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4696 b(slope) = 0.0087 chi2 = 0.8051 CAL_IN P-side : a = 2.4697 b(slope) = 0.0087 chi2 = 0.9881 VTN N-side : a = 0.0086 b(slope) = 0.0109 chi2 = 0.9804 VTN P-side : a = 0.0088 b(slope) = 0.0066 chi2 = 0.5309 VTP N-side = 0.7067 VTP p-side = 0.4353 CHI2 TEST = 1 CAL_BASE = 2.4705 V CAL_VREF = 3.0261 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:501 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5102 b(slope) = 0.0084 chi2 = 0.4682 CAL_IN P-side : a = 2.5100 b(slope) = 0.0084 chi2 = 0.7314 VTN N-side : a = 0.0090 b(slope) = 0.0108 chi2 = 0.4049 VTN P-side : a = 0.0088 b(slope) = 0.0066 chi2 = 0.3114 VTP N-side = 0.6995 VTP p-side = 0.4308 CHI2 TEST = 1 CAL_BASE = 2.5090 V CAL_VREF = 3.0457 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:601 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4716 b(slope) = 0.0086 chi2 = 0.7263 CAL_IN P-side : a = 2.4718 b(slope) = 0.0086 chi2 = 0.6548 VTN N-side : a = 0.0089 b(slope) = 0.0108 chi2 = 2.0290 VTN P-side : a = 0.0087 b(slope) = 0.0066 chi2 = 1.0736 VTP N-side = 0.6975 VTP p-side = 0.4305 CHI2 TEST = 1 CAL_BASE = 2.4700 V CAL_VREF = 3.0227 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 227 FUNCT@5.0V:ATOM1TO6B 227 FUNCT@5.0V:ATOM1TO6C 227 FUNCT@5.0V:ATOM1TO6D 227 FUNCT@5.0V:ATOM1TO6E 227 FUNCT@5.0V:ATOM7TO9A 271 FUNCT@5.0V:ATOM7TO9B 271 FUNCT@5.0V:ATOM7TO9C 271 FUNCT@5.0V:ATOM7TO9D 271 FUNCT@5.0V:ATOM7TO9E 271 FUNCT@5.0V:ATOM10TO12 495 FUNCT@5.0V:ATOM13A 1063 FUNCT@5.0V:ATOM13B 1118 FUNCT@5.0V:ATOM13C 1118 FUNCT@5.0V:ATOM15 1107 FUNCT@5.0V:ATOM17 3419 FUNCT@5.0V:ATOM18 3435 FUNCT@5.0V:ATOM18HF 3435 FUNCT@5.0V:ATOM19 3371 FUNCT@5.0V:ATOM19D 3386 FUNCT@5.0V:ATOM19E 2613 FUNCT@5.0V:ATOM19F 6486 FUNCT@5.0V:ATOM19FHF 6486 FUNCT@5.0V:ATOM20 1079 FUNCT@5.0V:ATOM21 1055 FUNCT@5.0V:ATOM22 1043 FUNCT@5.0V:ATOM25 1061 FUNCT@5.0V:ATOM25HF 1061 FUNCT@5.0V:ATOM26A 1040 FUNCT@5.0V:ATOM26B 1849 FUNCT@5.0V:ATOM28 1177 FUNCT@5.0V:ATOM29 1177 FUNCT@5.0V:ATOM30 1177 FUNCT@5.0V:ATOM31A 811 FUNCT@5.0V:ATOM31B 1000 FUNCT@5.0V:ATOM32 811 FUNCT@5.0V:ATOM33 1177 FUNCT@5.0V:ATOM35 1311 FUNCT@5.0V:ATOM36 1067 FUNCT@5.0V:ATOM39 1088 FUNCT@5.0V:ATOM41 1614 FUNCT@5.0V:ATOM41A 1614 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3665 FUNCT@5.0V:ATOM45C_40 3665 FUNCT@5.0V:ATOM46C_40 3665 FUNCT@5.0V:ATOM47C_40 3665 FUNCT@5.0V:ATOM48C_40 3665 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3665 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 271 FUNCT@5.0V:A10TO12HF 495 FUNCT@5.0V:ADAC37HF 271 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D 9.0000E-08 TMIN@4.8V:A7_9_60D 9.0000E-08 TMIN@4.8V:A10_12_50D 9.0000E-08 TMIN@4.8V:A10_12_60D 9.0000E-08 TMIN@4.8V:ADAC37_50D 9.0000E-08 TMIN@4.8V:ADAC37_60D 9.0000E-08 TMIN@5.0V:A7_9_50D 9.0000E-08 TMIN@5.0V:A7_9_60D 9.0000E-08 TMIN@5.0V:A10_12_50D 9.0000E-08 TMIN@5.0V:A10_12_60D 9.0000E-08 TMIN@5.0V:ADAC37_50D 9.0000E-08 TMIN@5.0V:ADAC37_60D 9.0000E-08 TMIN@5.2V:A7_9_50D 9.0000E-08 TMIN@5.2V:A7_9_60D 9.0000E-08 TMIN@5.2V:A10_12_50D 9.0000E-08 TMIN@5.2V:A10_12_60D 9.0000E-08 TMIN@5.2V:ADAC37_50D 9.0000E-08 TMIN@5.2V:ADAC37_60D 9.0000E-08 ---------- CHIP ID:602 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5003 b(slope) = 0.0084 chi2 = 0.9728 CAL_IN P-side : a = 2.5004 b(slope) = 0.0084 chi2 = 0.8276 VTN N-side : a = 0.0090 b(slope) = 0.0108 chi2 = 0.8394 VTN P-side : a = 0.0090 b(slope) = 0.0066 chi2 = 0.5594 VTP N-side = 0.6980 VTP p-side = 0.4296 CHI2 TEST = 1 CAL_BASE = 2.5017 V CAL_VREF = 3.0405 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM41 1597 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:502 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4841 b(slope) = 0.0086 chi2 = 1.0949 CAL_IN P-side : a = 2.4844 b(slope) = 0.0086 chi2 = 0.8889 VTN N-side : a = 0.0087 b(slope) = 0.0108 chi2 = 0.6134 VTN P-side : a = 0.0090 b(slope) = 0.0066 chi2 = 0.5207 VTP N-side = 0.7013 VTP p-side = 0.4323 CHI2 TEST = 1 CAL_BASE = 2.4873 V CAL_VREF = 3.0352 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:402 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4758 b(slope) = 0.0086 chi2 = 0.7478 CAL_IN P-side : a = 2.4759 b(slope) = 0.0086 chi2 = 1.5759 VTN N-side : a = 0.0089 b(slope) = 0.0108 chi2 = 1.2820 VTN P-side : a = 0.0090 b(slope) = 0.0066 chi2 = 0.9520 VTP N-side = 0.6989 VTP p-side = 0.4299 CHI2 TEST = 1 CAL_BASE = 2.4775 V CAL_VREF = 3.0273 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:203 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4831 b(slope) = 0.0084 chi2 = 1.0079 CAL_IN P-side : a = 2.4833 b(slope) = 0.0084 chi2 = 1.0565 VTN N-side : a = 0.0093 b(slope) = 0.0106 chi2 = 0.6864 VTN P-side : a = 0.0092 b(slope) = 0.0064 chi2 = 0.5557 VTP N-side = 0.6858 VTP p-side = 0.4197 CHI2 TEST = 1 CAL_BASE = 2.4880 V CAL_VREF = 3.0252 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:303 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4420 b(slope) = 0.0088 chi2 = 1.1355 CAL_IN P-side : a = 2.4421 b(slope) = 0.0088 chi2 = 0.9988 VTN N-side : a = 0.0094 b(slope) = 0.0107 chi2 = 0.3758 VTN P-side : a = 0.0094 b(slope) = 0.0065 chi2 = 0.5732 VTP N-side = 0.6956 VTP p-side = 0.4276 CHI2 TEST = 1 CAL_BASE = 2.4421 V CAL_VREF = 3.0044 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM10TO12 547 FUNCT@5.0V:ATOM13B 1279 FUNCT@5.0V:ATOM13C 1279 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3747 FUNCT@5.0V:ATOM45C_40 3747 FUNCT@5.0V:ATOM46C_40 3747 FUNCT@5.0V:ATOM47C_40 3747 FUNCT@5.0V:ATOM48C_40 3747 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3747 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A10TO12HF 547 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A10_12_50D 9.0000E-08 TMIN@4.8V:A10_12_60D 9.0000E-08 TMIN@5.0V:A10_12_50D 9.0000E-08 TMIN@5.0V:A10_12_60D 9.0000E-08 TMIN@5.2V:A10_12_50D 9.0000E-08 TMIN@5.2V:A10_12_60D 9.0000E-08 ---------- CHIP ID:403 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4699 b(slope) = 0.0086 chi2 = 0.6541 CAL_IN P-side : a = 2.4701 b(slope) = 0.0086 chi2 = 0.5141 VTN N-side : a = 0.0094 b(slope) = 0.0108 chi2 = 1.0583 VTN P-side : a = 0.0096 b(slope) = 0.0066 chi2 = 0.5139 VTP N-side = 0.7015 VTP p-side = 0.4334 CHI2 TEST = 1 CAL_BASE = 2.4695 V CAL_VREF = 3.0225 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:503 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD1C 1.0081E-01 IDDSB:VDD1D 1.0606E-01 IDDOP1:DVDD 1.3196E-01 DACs TEST = 0 CAL_IN N-side : a = 2.4894 b(slope) = 0.0076 chi2 = 99.0000 CAL_IN P-side : a = 2.4685 b(slope) = 0.0087 chi2 = 0.5071 VTN N-side : a = 0.0371 b(slope) = 0.0093 chi2 = 99.0000 VTN P-side : a = 0.0096 b(slope) = 0.0066 chi2 = 0.6691 VTP N-side = 0.6963 VTP p-side = 0.4305 CHI2 TEST = 0 CAL_BASE = 2.4675 V CAL_VREF = 3.0242 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1351 FUNCT@5.0V:ATOM13B 1407 FUNCT@5.0V:ATOM13C 1407 FUNCT@5.0V:ATOM15 1395 FUNCT@5.0V:ATOM17 3707 FUNCT@5.0V:ATOM18 3723 FUNCT@5.0V:ATOM18HF 3723 FUNCT@5.0V:ATOM19 3659 FUNCT@5.0V:ATOM19D 3674 FUNCT@5.0V:ATOM19E 2901 FUNCT@5.0V:ATOM19F 6774 FUNCT@5.0V:ATOM19FHF 6774 FUNCT@5.0V:ATOM20 1367 FUNCT@5.0V:ATOM21 1062 FUNCT@5.0V:ATOM22 1331 FUNCT@5.0V:ATOM25 1349 FUNCT@5.0V:ATOM25HF 1349 FUNCT@5.0V:ATOM26A 1328 FUNCT@5.0V:ATOM26B 2137 FUNCT@5.0V:ATOM28 1465 FUNCT@5.0V:ATOM29 1465 FUNCT@5.0V:ATOM30 1465 FUNCT@5.0V:ATOM31A 1099 FUNCT@5.0V:ATOM31B 1288 FUNCT@5.0V:ATOM32 1099 FUNCT@5.0V:ATOM33 1465 FUNCT@5.0V:ATOM35 1599 FUNCT@5.0V:ATOM36 1355 FUNCT@5.0V:ATOM39 1376 FUNCT@5.0V:ATOM41 1902 FUNCT@5.0V:ATOM41A 1902 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3811 FUNCT@5.0V:ATOM45C_40 3811 FUNCT@5.0V:ATOM46C_40 3667 FUNCT@5.0V:ATOM47C_40 3811 FUNCT@5.0V:ATOM48C_40 3811 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3811 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1235 NOISE TEST = 0 error detected at location:1403 TMIN TEST = 1 ---------- CHIP ID:603 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4601 b(slope) = 0.0086 chi2 = 0.4668 CAL_IN P-side : a = 2.4603 b(slope) = 0.0086 chi2 = 0.5398 VTN N-side : a = 0.0094 b(slope) = 0.0109 chi2 = 0.9300 VTN P-side : a = 0.0098 b(slope) = 0.0066 chi2 = 0.7339 VTP N-side = 0.7052 VTP p-side = 0.4337 CHI2 TEST = 1 CAL_BASE = 2.4636 V CAL_VREF = 3.0164 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1401 TMIN TEST = 1 ---------- CHIP ID:703 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4676 b(slope) = 0.0085 chi2 = 0.8114 CAL_IN P-side : a = 2.4676 b(slope) = 0.0085 chi2 = 0.5173 VTN N-side : a = 0.0102 b(slope) = 0.0105 chi2 = 0.5081 VTN P-side : a = 0.0100 b(slope) = 0.0064 chi2 = 0.9310 VTP N-side = 0.6852 VTP p-side = 0.4237 CHI2 TEST = 1 CAL_BASE = 2.4705 V CAL_VREF = 3.0124 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4599 FUNCT@5.0V:ATOM45C_40 4599 FUNCT@5.0V:ATOM46C_40 4599 FUNCT@5.0V:ATOM47C_40 3683 FUNCT@5.0V:ATOM48C_40 4599 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4599 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:803 ------------------ CLASS = C && 0---------- CONTACTS TEST = 0 error detected in test: Location: CONTACT:297/B5 -2.1729E-02 CONTACT:138/T6 -1.0000E-38 CONTACT:142/T7 -1.0000E-38 CONTACT:293/B12 -1.0000E-38 CONTACT:49/B13 -1.0000E-38 CONTACT:45/B6 -1.0000E-38 CONTACT:33/B7 -1.0000E-38 CONTACT:10/T4 -1.0000E-38 CONTACT:14/T5 -1.0000E-38 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A -1.0000E-38 IDDSB:VDD1A -1.0000E-38 IDDSB:VDD0B -1.0000E-38 IDDSB:VDD1B -1.0000E-38 IDDSB:VDD0C -1.0000E-38 IDDSB:VDD1C -1.0000E-38 IDDSB:VDD0D -1.0000E-38 IDDSB:VDD1D -1.0000E-38 V_AVDD2IPA:249/L9 -1.0000E-38 V_AVDD2IMA:277/L10 -1.0000E-38 AVDD_A:AVDDP-M -1.0000E-38 IAVDD2_A:AVDDP-M -1.0000E-38 V_V1RA:169/L5 -1.0000E-38 V_N310A:171/L6 -1.0000E-38 V_AVDD2IPB:249/L9 -1.0000E-38 V_AVDD2IMB:277/L10 -1.0000E-38 AVDD_B:AVDDP-M -1.0000E-38 IAVDD2_B:AVDDP-M -1.0000E-38 V_V1RB:169/L5 -1.0000E-38 V_N310B:171/L6 -1.0000E-38 V_AVDD2IPC:249/L9 -1.0000E-38 V_AVDD2IMC:277/L10 -1.0000E-38 AVDD_C:AVDDP-M -1.0000E-38 IAVDD2_C:AVDDP-M -1.0000E-38 V_V1RC:169/L5 -1.0000E-38 V_N310C:171/L6 -1.0000E-38 V_AVDD2IPD:249/L9 -1.0000E-38 V_AVDD2IMD:277/L10 -1.0000E-38 AVDD_D:AVDDP-M -1.0000E-38 IAVDD2_D:AVDDP-M -1.0000E-38 V_V1RD:169/L5 -1.0000E-38 V_N310D:171/L6 -1.0000E-38 IDDOP0:AVDD -1.0000E-38 IDDOP1:DVDD -1.0000E-38 DACs TEST = 0 CAL_IN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side = 0.0000 VTP p-side = 0.0000 CHI2 TEST = 0 CAL_BASE = 0.0000 V CAL_VREF = 0.0000 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 0 FUNCT@5.0V:ATOM1TO6B 0 FUNCT@5.0V:ATOM1TO6C 0 FUNCT@5.0V:ATOM1TO6D 0 FUNCT@5.0V:ATOM1TO6E 0 FUNCT@5.0V:ATOM7TO9A 0 FUNCT@5.0V:ATOM7TO9B 0 FUNCT@5.0V:ATOM7TO9C 0 FUNCT@5.0V:ATOM7TO9D 0 FUNCT@5.0V:ATOM7TO9E 0 FUNCT@5.0V:ATOM10TO12 0 FUNCT@5.0V:ATOM13A 0 FUNCT@5.0V:ATOM13B 0 FUNCT@5.0V:ATOM13C 0 FUNCT@5.0V:ATOM14 0 FUNCT@5.0V:ATOM15 0 FUNCT@5.0V:ATOM16 0 FUNCT@5.0V:ATOM17 0 FUNCT@5.0V:ATOM18 0 FUNCT@5.0V:ATOM18HF 0 FUNCT@5.0V:ATOM19 0 FUNCT@5.0V:ATOM19B 0 FUNCT@5.0V:ATOM19C 0 FUNCT@5.0V:ATOM19D 0 FUNCT@5.0V:ATOM19E 0 FUNCT@5.0V:ATOM19F 0 FUNCT@5.0V:ATOM19FHF 0 FUNCT@5.0V:ATOM20 0 FUNCT@5.0V:ATOM21 0 FUNCT@5.0V:ATOM22 0 FUNCT@5.0V:ATOM23 0 FUNCT@5.0V:ATOM24 0 FUNCT@5.0V:ATOM25 0 FUNCT@5.0V:ATOM25HF 0 FUNCT@5.0V:ATOM26A 0 FUNCT@5.0V:ATOM26B 0 FUNCT@5.0V:ATOM27 0 FUNCT@5.0V:ATOM28 0 FUNCT@5.0V:ATOM29 0 FUNCT@5.0V:ATOM30 0 FUNCT@5.0V:ATOM31A 0 FUNCT@5.0V:ATOM31B 0 FUNCT@5.0V:ATOM32 0 FUNCT@5.0V:ATOM33 0 FUNCT@5.0V:ATOM34 0 FUNCT@5.0V:ATOM35 0 FUNCT@5.0V:ATOM36 0 FUNCT@5.0V:ATOM38 0 FUNCT@5.0V:ATOM39 0 FUNCT@5.0V:ATOM40 0 FUNCT@5.0V:ATOM41 0 FUNCT@5.0V:ATOM41A 0 FUNCT@5.0V:ATOM42 0 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 0 FUNCT@5.0V:ATOM45C_40 0 FUNCT@5.0V:ATOM46C_40 0 FUNCT@5.0V:ATOM47C_40 0 FUNCT@5.0V:ATOM48C_40 0 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 0 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 0 FUNCT@5.0V:A10TO12HF 0 FUNCT@5.0V:ADAC37HF 0 CH.MASK TEST = 0 error detected at location:0 NOISE TEST = 0 error detected at location:0 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D -1.0000E-38 TMIN@4.8V:A7_9_60D -1.0000E-38 TMIN@4.8V:A10_12_50D -1.0000E-38 TMIN@4.8V:A10_12_60D -1.0000E-38 TMIN@4.8V:ADAC37_50D -1.0000E-38 TMIN@4.8V:ADAC37_60D -1.0000E-38 TMIN@5.0V:A7_9_50D -1.0000E-38 TMIN@5.0V:A7_9_60D -1.0000E-38 TMIN@5.0V:A10_12_50D -1.0000E-38 TMIN@5.0V:A10_12_60D -1.0000E-38 TMIN@5.0V:ADAC37_50D -1.0000E-38 TMIN@5.0V:ADAC37_60D -1.0000E-38 TMIN@5.2V:A7_9_50D -1.0000E-38 TMIN@5.2V:A7_9_60D -1.0000E-38 TMIN@5.2V:A10_12_50D -1.0000E-38 TMIN@5.2V:A10_12_60D -1.0000E-38 TMIN@5.2V:ADAC37_50D -1.0000E-38 TMIN@5.2V:ADAC37_60D -1.0000E-38 ---------- CHIP ID:804 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 0 error detected in test: Location: SUP_SHORT:VDD0 9.9689E-01 SUP_SHORT:VDD1 6.0971E-01 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A -1.0000E-38 IDDSB:VDD1A -1.0000E-38 IDDSB:VDD0B -1.0000E-38 IDDSB:VDD1B -1.0000E-38 IDDSB:VDD0C -1.0000E-38 IDDSB:VDD1C -1.0000E-38 IDDSB:VDD0D -1.0000E-38 IDDSB:VDD1D -1.0000E-38 V_AVDD2IPA:249/L9 -1.0000E-38 V_AVDD2IMA:277/L10 -1.0000E-38 AVDD_A:AVDDP-M -1.0000E-38 IAVDD2_A:AVDDP-M -1.0000E-38 V_V1RA:169/L5 -1.0000E-38 V_N310A:171/L6 -1.0000E-38 V_AVDD2IPB:249/L9 -1.0000E-38 V_AVDD2IMB:277/L10 -1.0000E-38 AVDD_B:AVDDP-M -1.0000E-38 IAVDD2_B:AVDDP-M -1.0000E-38 V_V1RB:169/L5 -1.0000E-38 V_N310B:171/L6 -1.0000E-38 V_AVDD2IPC:249/L9 -1.0000E-38 V_AVDD2IMC:277/L10 -1.0000E-38 AVDD_C:AVDDP-M -1.0000E-38 IAVDD2_C:AVDDP-M -1.0000E-38 V_V1RC:169/L5 -1.0000E-38 V_N310C:171/L6 -1.0000E-38 V_AVDD2IPD:249/L9 -1.0000E-38 V_AVDD2IMD:277/L10 -1.0000E-38 AVDD_D:AVDDP-M -1.0000E-38 IAVDD2_D:AVDDP-M -1.0000E-38 V_V1RD:169/L5 -1.0000E-38 V_N310D:171/L6 -1.0000E-38 IDDOP0:AVDD -1.0000E-38 IDDOP1:DVDD -1.0000E-38 DACs TEST = 0 CAL_IN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side = 0.0000 VTP p-side = 0.0000 CHI2 TEST = 0 CAL_BASE = 0.0000 V CAL_VREF = 0.0000 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 0 FUNCT@5.0V:ATOM1TO6B 0 FUNCT@5.0V:ATOM1TO6C 0 FUNCT@5.0V:ATOM1TO6D 0 FUNCT@5.0V:ATOM1TO6E 0 FUNCT@5.0V:ATOM7TO9A 0 FUNCT@5.0V:ATOM7TO9B 0 FUNCT@5.0V:ATOM7TO9C 0 FUNCT@5.0V:ATOM7TO9D 0 FUNCT@5.0V:ATOM7TO9E 0 FUNCT@5.0V:ATOM10TO12 0 FUNCT@5.0V:ATOM13A 0 FUNCT@5.0V:ATOM13B 0 FUNCT@5.0V:ATOM13C 0 FUNCT@5.0V:ATOM14 0 FUNCT@5.0V:ATOM15 0 FUNCT@5.0V:ATOM16 0 FUNCT@5.0V:ATOM17 0 FUNCT@5.0V:ATOM18 0 FUNCT@5.0V:ATOM18HF 0 FUNCT@5.0V:ATOM19 0 FUNCT@5.0V:ATOM19B 0 FUNCT@5.0V:ATOM19C 0 FUNCT@5.0V:ATOM19D 0 FUNCT@5.0V:ATOM19E 0 FUNCT@5.0V:ATOM19F 0 FUNCT@5.0V:ATOM19FHF 0 FUNCT@5.0V:ATOM20 0 FUNCT@5.0V:ATOM21 0 FUNCT@5.0V:ATOM22 0 FUNCT@5.0V:ATOM23 0 FUNCT@5.0V:ATOM24 0 FUNCT@5.0V:ATOM25 0 FUNCT@5.0V:ATOM25HF 0 FUNCT@5.0V:ATOM26A 0 FUNCT@5.0V:ATOM26B 0 FUNCT@5.0V:ATOM27 0 FUNCT@5.0V:ATOM28 0 FUNCT@5.0V:ATOM29 0 FUNCT@5.0V:ATOM30 0 FUNCT@5.0V:ATOM31A 0 FUNCT@5.0V:ATOM31B 0 FUNCT@5.0V:ATOM32 0 FUNCT@5.0V:ATOM33 0 FUNCT@5.0V:ATOM34 0 FUNCT@5.0V:ATOM35 0 FUNCT@5.0V:ATOM36 0 FUNCT@5.0V:ATOM38 0 FUNCT@5.0V:ATOM39 0 FUNCT@5.0V:ATOM40 0 FUNCT@5.0V:ATOM41 0 FUNCT@5.0V:ATOM41A 0 FUNCT@5.0V:ATOM42 0 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 0 FUNCT@5.0V:ATOM45C_40 0 FUNCT@5.0V:ATOM46C_40 0 FUNCT@5.0V:ATOM47C_40 0 FUNCT@5.0V:ATOM48C_40 0 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 0 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 0 FUNCT@5.0V:A10TO12HF 0 FUNCT@5.0V:ADAC37HF 0 CH.MASK TEST = 0 error detected at location:0 NOISE TEST = 0 error detected at location:0 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D -1.0000E-38 TMIN@4.8V:A7_9_60D -1.0000E-38 TMIN@4.8V:A10_12_50D -1.0000E-38 TMIN@4.8V:A10_12_60D -1.0000E-38 TMIN@4.8V:ADAC37_50D -1.0000E-38 TMIN@4.8V:ADAC37_60D -1.0000E-38 TMIN@5.0V:A7_9_50D -1.0000E-38 TMIN@5.0V:A7_9_60D -1.0000E-38 TMIN@5.0V:A10_12_50D -1.0000E-38 TMIN@5.0V:A10_12_60D -1.0000E-38 TMIN@5.0V:ADAC37_50D -1.0000E-38 TMIN@5.0V:ADAC37_60D -1.0000E-38 TMIN@5.2V:A7_9_50D -1.0000E-38 TMIN@5.2V:A7_9_60D -1.0000E-38 TMIN@5.2V:A10_12_50D -1.0000E-38 TMIN@5.2V:A10_12_60D -1.0000E-38 TMIN@5.2V:ADAC37_50D -1.0000E-38 TMIN@5.2V:ADAC37_60D -1.0000E-38 ---------- CHIP ID:704 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4556 b(slope) = 0.0086 chi2 = 0.8487 CAL_IN P-side : a = 2.4556 b(slope) = 0.0086 chi2 = 0.8400 VTN N-side : a = 0.0091 b(slope) = 0.0105 chi2 = 0.7449 VTN P-side : a = 0.0093 b(slope) = 0.0064 chi2 = 0.4739 VTP N-side = 0.6823 VTP p-side = 0.4209 CHI2 TEST = 1 CAL_BASE = 2.4587 V CAL_VREF = 3.0100 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:604 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.4700 b(slope) = 0.0086 chi2 = 99.0000 CAL_IN P-side : a = 2.4690 b(slope) = 0.0085 chi2 = 85.3935 VTN N-side : a = 0.0128 b(slope) = 0.0107 chi2 = 6.3848 VTN P-side : a = 0.0133 b(slope) = 0.0065 chi2 = 3.7045 VTP N-side = 0.6987 VTP p-side = 0.4330 CHI2 TEST = 0 CAL_BASE = 2.4680 V CAL_VREF = 3.0147 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:504 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5066 b(slope) = 0.0084 chi2 = 0.9637 CAL_IN P-side : a = 2.5070 b(slope) = 0.0084 chi2 = 0.4386 VTN N-side : a = 0.0097 b(slope) = 0.0107 chi2 = 0.8041 VTN P-side : a = 0.0097 b(slope) = 0.0065 chi2 = 0.3704 VTP N-side = 0.6961 VTP p-side = 0.4285 CHI2 TEST = 1 CAL_BASE = 2.5105 V CAL_VREF = 3.0476 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1401 TMIN TEST = 1 ---------- CHIP ID:404 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4910 b(slope) = 0.0085 chi2 = 1.2300 CAL_IN P-side : a = 2.4915 b(slope) = 0.0085 chi2 = 1.2939 VTN N-side : a = 0.0107 b(slope) = 0.0109 chi2 = 0.5391 VTN P-side : a = 0.0105 b(slope) = 0.0066 chi2 = 0.3338 VTP N-side = 0.7068 VTP p-side = 0.4369 CHI2 TEST = 1 CAL_BASE = 2.4917 V CAL_VREF = 3.0334 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 228 FUNCT@5.0V:ATOM1TO6B 228 FUNCT@5.0V:ATOM1TO6C 228 FUNCT@5.0V:ATOM1TO6D 228 FUNCT@5.0V:ATOM1TO6E 228 FUNCT@5.0V:ATOM7TO9A 1706 FUNCT@5.0V:ATOM7TO9B 1706 FUNCT@5.0V:ATOM7TO9C 1706 FUNCT@5.0V:ATOM7TO9D 1706 FUNCT@5.0V:ATOM7TO9E 1706 FUNCT@5.0V:ATOM10TO12 496 FUNCT@5.0V:ATOM13A 1046 FUNCT@5.0V:ATOM13B 1102 FUNCT@5.0V:ATOM13C 1102 FUNCT@5.0V:ATOM15 2140 FUNCT@5.0V:ATOM17 3402 FUNCT@5.0V:ATOM18 3418 FUNCT@5.0V:ATOM19 3354 FUNCT@5.0V:ATOM19D 3369 FUNCT@5.0V:ATOM19E 2596 FUNCT@5.0V:ATOM19F 6469 FUNCT@5.0V:ATOM20 1062 FUNCT@5.0V:ATOM21 1038 FUNCT@5.0V:ATOM22 1026 FUNCT@5.0V:ATOM23 958 FUNCT@5.0V:ATOM24 1058 FUNCT@5.0V:ATOM25 1044 FUNCT@5.0V:ATOM26A 1023 FUNCT@5.0V:ATOM26B 1832 FUNCT@5.0V:ATOM28 1160 FUNCT@5.0V:ATOM29 1160 FUNCT@5.0V:ATOM30 1160 FUNCT@5.0V:ATOM31A 794 FUNCT@5.0V:ATOM31B 983 FUNCT@5.0V:ATOM32 794 FUNCT@5.0V:ATOM33 1160 FUNCT@5.0V:ATOM34 268 FUNCT@5.0V:ATOM35 1294 FUNCT@5.0V:ATOM36 1050 FUNCT@5.0V:ATOM39 1071 FUNCT@5.0V:ATOM41 1597 FUNCT@5.0V:ATOM41A 2647 FUNCT@5.0V:ATOM42 214 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1385 TMIN TEST = 1 ---------- CHIP ID:304 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4652 b(slope) = 0.0085 chi2 = 0.5273 CAL_IN P-side : a = 2.4644 b(slope) = 0.0085 chi2 = 6.6861 VTN N-side : a = 0.0103 b(slope) = 0.0107 chi2 = 1.4580 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.7741 VTP N-side = 0.6972 VTP p-side = 0.4270 CHI2 TEST = 1 CAL_BASE = 2.4670 V CAL_VREF = 3.0103 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1053 FUNCT@5.0V:ATOM13B 1109 FUNCT@5.0V:ATOM13C 1109 FUNCT@5.0V:ATOM15 1097 FUNCT@5.0V:ATOM17 3409 FUNCT@5.0V:ATOM18 3425 FUNCT@5.0V:ATOM18HF 3425 FUNCT@5.0V:ATOM19 3361 FUNCT@5.0V:ATOM19D 3376 FUNCT@5.0V:ATOM19E 2603 FUNCT@5.0V:ATOM19F 6476 FUNCT@5.0V:ATOM19FHF 6476 FUNCT@5.0V:ATOM20 1069 FUNCT@5.0V:ATOM21 1045 FUNCT@5.0V:ATOM22 1033 FUNCT@5.0V:ATOM23 965 FUNCT@5.0V:ATOM24 1065 FUNCT@5.0V:ATOM25 1051 FUNCT@5.0V:ATOM25HF 1051 FUNCT@5.0V:ATOM26A 1030 FUNCT@5.0V:ATOM26B 1839 FUNCT@5.0V:ATOM28 1167 FUNCT@5.0V:ATOM29 1167 FUNCT@5.0V:ATOM30 1167 FUNCT@5.0V:ATOM31A 801 FUNCT@5.0V:ATOM31B 990 FUNCT@5.0V:ATOM32 801 FUNCT@5.0V:ATOM33 1167 FUNCT@5.0V:ATOM35 1301 FUNCT@5.0V:ATOM36 1057 FUNCT@5.0V:ATOM39 1078 FUNCT@5.0V:ATOM41 1604 FUNCT@5.0V:ATOM41A 1604 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4261 FUNCT@5.0V:ATOM45C_40 3683 FUNCT@5.0V:ATOM46C_40 4261 FUNCT@5.0V:ATOM47C_40 4261 FUNCT@5.0V:ATOM48C_40 4261 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4261 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1233 NOISE TEST = 0 error detected at location:1392 TMIN TEST = 1 ---------- CHIP ID:204 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4881 b(slope) = 0.0084 chi2 = 1.0285 CAL_IN P-side : a = 2.4881 b(slope) = 0.0084 chi2 = 0.6568 VTN N-side : a = 0.0096 b(slope) = 0.0107 chi2 = 0.5849 VTN P-side : a = 0.0096 b(slope) = 0.0066 chi2 = 0.2411 VTP N-side = 0.6951 VTP p-side = 0.4324 CHI2 TEST = 1 CAL_BASE = 2.4929 V CAL_VREF = 3.0295 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:205 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4653 b(slope) = 0.0086 chi2 = 0.5022 CAL_IN P-side : a = 2.4656 b(slope) = 0.0086 chi2 = 0.5761 VTN N-side : a = 0.0097 b(slope) = 0.0107 chi2 = 0.9038 VTN P-side : a = 0.0096 b(slope) = 0.0065 chi2 = 0.5736 VTP N-side = 0.6941 VTP p-side = 0.4284 CHI2 TEST = 1 CAL_BASE = 2.4658 V CAL_VREF = 3.0188 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:305 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4662 b(slope) = 0.0086 chi2 = 1.4981 CAL_IN P-side : a = 2.4665 b(slope) = 0.0086 chi2 = 1.1654 VTN N-side : a = 0.0100 b(slope) = 0.0106 chi2 = 0.3888 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.5162 VTP N-side = 0.6918 VTP p-side = 0.4257 CHI2 TEST = 1 CAL_BASE = 2.4670 V CAL_VREF = 3.0178 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:405 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4384 b(slope) = 0.0088 chi2 = 1.0412 CAL_IN P-side : a = 2.4386 b(slope) = 0.0088 chi2 = 0.8257 VTN N-side : a = 0.0097 b(slope) = 0.0109 chi2 = 0.9017 VTN P-side : a = 0.0101 b(slope) = 0.0066 chi2 = 0.8053 VTP N-side = 0.7047 VTP p-side = 0.4352 CHI2 TEST = 1 CAL_BASE = 2.4416 V CAL_VREF = 3.0081 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:505 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4862 b(slope) = 0.0085 chi2 = 0.7077 CAL_IN P-side : a = 2.4865 b(slope) = 0.0085 chi2 = 0.5706 VTN N-side : a = 0.0099 b(slope) = 0.0107 chi2 = 0.6069 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.5542 VTP N-side = 0.6938 VTP p-side = 0.4270 CHI2 TEST = 1 CAL_BASE = 2.4871 V CAL_VREF = 3.0315 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13B 1807 FUNCT@5.0V:ATOM13C 1807 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5227 FUNCT@5.0V:ATOM45C_40 5227 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 5227 FUNCT@5.0V:ATOM48C_40 5227 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5227 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:605 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4870 b(slope) = 0.0084 chi2 = 1.2646 CAL_IN P-side : a = 2.4871 b(slope) = 0.0084 chi2 = 1.0132 VTN N-side : a = 0.0101 b(slope) = 0.0106 chi2 = 1.3884 VTN P-side : a = 0.0102 b(slope) = 0.0065 chi2 = 0.4588 VTP N-side = 0.6915 VTP p-side = 0.4279 CHI2 TEST = 1 CAL_BASE = 2.4866 V CAL_VREF = 3.0259 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:705 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5249 b(slope) = 0.0081 chi2 = 1.8312 CAL_IN P-side : a = 2.5251 b(slope) = 0.0081 chi2 = 1.7884 VTN N-side : a = 0.0104 b(slope) = 0.0106 chi2 = 0.4336 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.6609 VTP N-side = 0.6918 VTP p-side = 0.4293 CHI2 TEST = 1 CAL_BASE = 2.5254 V CAL_VREF = 3.0474 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:805 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 0 error detected in test: Location: SUP_SHORT:VDD0 9.9689E-01 SUP_SHORT:VDD1 3.0112E-01 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A -1.0000E-38 IDDSB:VDD1A -1.0000E-38 IDDSB:VDD0B -1.0000E-38 IDDSB:VDD1B -1.0000E-38 IDDSB:VDD0C -1.0000E-38 IDDSB:VDD1C -1.0000E-38 IDDSB:VDD0D -1.0000E-38 IDDSB:VDD1D -1.0000E-38 V_AVDD2IPA:249/L9 -1.0000E-38 V_AVDD2IMA:277/L10 -1.0000E-38 AVDD_A:AVDDP-M -1.0000E-38 IAVDD2_A:AVDDP-M -1.0000E-38 V_V1RA:169/L5 -1.0000E-38 V_N310A:171/L6 -1.0000E-38 V_AVDD2IPB:249/L9 -1.0000E-38 V_AVDD2IMB:277/L10 -1.0000E-38 AVDD_B:AVDDP-M -1.0000E-38 IAVDD2_B:AVDDP-M -1.0000E-38 V_V1RB:169/L5 -1.0000E-38 V_N310B:171/L6 -1.0000E-38 V_AVDD2IPC:249/L9 -1.0000E-38 V_AVDD2IMC:277/L10 -1.0000E-38 AVDD_C:AVDDP-M -1.0000E-38 IAVDD2_C:AVDDP-M -1.0000E-38 V_V1RC:169/L5 -1.0000E-38 V_N310C:171/L6 -1.0000E-38 V_AVDD2IPD:249/L9 -1.0000E-38 V_AVDD2IMD:277/L10 -1.0000E-38 AVDD_D:AVDDP-M -1.0000E-38 IAVDD2_D:AVDDP-M -1.0000E-38 V_V1RD:169/L5 -1.0000E-38 V_N310D:171/L6 -1.0000E-38 IDDOP0:AVDD -1.0000E-38 IDDOP1:DVDD -1.0000E-38 DACs TEST = 0 CAL_IN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side = 0.0000 VTP p-side = 0.0000 CHI2 TEST = 0 CAL_BASE = 0.0000 V CAL_VREF = 0.0000 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 0 FUNCT@5.0V:ATOM1TO6B 0 FUNCT@5.0V:ATOM1TO6C 0 FUNCT@5.0V:ATOM1TO6D 0 FUNCT@5.0V:ATOM1TO6E 0 FUNCT@5.0V:ATOM7TO9A 0 FUNCT@5.0V:ATOM7TO9B 0 FUNCT@5.0V:ATOM7TO9C 0 FUNCT@5.0V:ATOM7TO9D 0 FUNCT@5.0V:ATOM7TO9E 0 FUNCT@5.0V:ATOM10TO12 0 FUNCT@5.0V:ATOM13A 0 FUNCT@5.0V:ATOM13B 0 FUNCT@5.0V:ATOM13C 0 FUNCT@5.0V:ATOM14 0 FUNCT@5.0V:ATOM15 0 FUNCT@5.0V:ATOM16 0 FUNCT@5.0V:ATOM17 0 FUNCT@5.0V:ATOM18 0 FUNCT@5.0V:ATOM18HF 0 FUNCT@5.0V:ATOM19 0 FUNCT@5.0V:ATOM19B 0 FUNCT@5.0V:ATOM19C 0 FUNCT@5.0V:ATOM19D 0 FUNCT@5.0V:ATOM19E 0 FUNCT@5.0V:ATOM19F 0 FUNCT@5.0V:ATOM19FHF 0 FUNCT@5.0V:ATOM20 0 FUNCT@5.0V:ATOM21 0 FUNCT@5.0V:ATOM22 0 FUNCT@5.0V:ATOM23 0 FUNCT@5.0V:ATOM24 0 FUNCT@5.0V:ATOM25 0 FUNCT@5.0V:ATOM25HF 0 FUNCT@5.0V:ATOM26A 0 FUNCT@5.0V:ATOM26B 0 FUNCT@5.0V:ATOM27 0 FUNCT@5.0V:ATOM28 0 FUNCT@5.0V:ATOM29 0 FUNCT@5.0V:ATOM30 0 FUNCT@5.0V:ATOM31A 0 FUNCT@5.0V:ATOM31B 0 FUNCT@5.0V:ATOM32 0 FUNCT@5.0V:ATOM33 0 FUNCT@5.0V:ATOM34 0 FUNCT@5.0V:ATOM35 0 FUNCT@5.0V:ATOM36 0 FUNCT@5.0V:ATOM38 0 FUNCT@5.0V:ATOM39 0 FUNCT@5.0V:ATOM40 0 FUNCT@5.0V:ATOM41 0 FUNCT@5.0V:ATOM41A 0 FUNCT@5.0V:ATOM42 0 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 0 FUNCT@5.0V:ATOM45C_40 0 FUNCT@5.0V:ATOM46C_40 0 FUNCT@5.0V:ATOM47C_40 0 FUNCT@5.0V:ATOM48C_40 0 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 0 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 0 FUNCT@5.0V:A10TO12HF 0 FUNCT@5.0V:ADAC37HF 0 CH.MASK TEST = 0 error detected at location:0 NOISE TEST = 0 error detected at location:0 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D -1.0000E-38 TMIN@4.8V:A7_9_60D -1.0000E-38 TMIN@4.8V:A10_12_50D -1.0000E-38 TMIN@4.8V:A10_12_60D -1.0000E-38 TMIN@4.8V:ADAC37_50D -1.0000E-38 TMIN@4.8V:ADAC37_60D -1.0000E-38 TMIN@5.0V:A7_9_50D -1.0000E-38 TMIN@5.0V:A7_9_60D -1.0000E-38 TMIN@5.0V:A10_12_50D -1.0000E-38 TMIN@5.0V:A10_12_60D -1.0000E-38 TMIN@5.0V:ADAC37_50D -1.0000E-38 TMIN@5.0V:ADAC37_60D -1.0000E-38 TMIN@5.2V:A7_9_50D -1.0000E-38 TMIN@5.2V:A7_9_60D -1.0000E-38 TMIN@5.2V:A10_12_50D -1.0000E-38 TMIN@5.2V:A10_12_60D -1.0000E-38 TMIN@5.2V:ADAC37_50D -1.0000E-38 TMIN@5.2V:ADAC37_60D -1.0000E-38 ---------- CHIP ID:806 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5052 b(slope) = 0.0082 chi2 = 0.5047 CAL_IN P-side : a = 2.5052 b(slope) = 0.0082 chi2 = 0.3833 VTN N-side : a = 0.0094 b(slope) = 0.0105 chi2 = 1.2118 VTN P-side : a = 0.0090 b(slope) = 0.0065 chi2 = 0.8318 VTP N-side = 0.6842 VTP p-side = 0.4276 CHI2 TEST = 1 CAL_BASE = 2.5068 V CAL_VREF = 3.0310 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:706 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4956 b(slope) = 0.0083 chi2 = 1.4005 CAL_IN P-side : a = 2.4958 b(slope) = 0.0083 chi2 = 0.4451 VTN N-side : a = 0.0094 b(slope) = 0.0107 chi2 = 2.2075 VTN P-side : a = 0.0094 b(slope) = 0.0065 chi2 = 0.7988 VTP N-side = 0.6930 VTP p-side = 0.4283 CHI2 TEST = 1 CAL_BASE = 2.4998 V CAL_VREF = 3.0344 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:606 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5178 b(slope) = 0.0082 chi2 = 0.3241 CAL_IN P-side : a = 2.5179 b(slope) = 0.0082 chi2 = 0.5455 VTN N-side : a = 0.0092 b(slope) = 0.0106 chi2 = 1.0147 VTN P-side : a = 0.0091 b(slope) = 0.0065 chi2 = 0.3762 VTP N-side = 0.6879 VTP p-side = 0.4266 CHI2 TEST = 1 CAL_BASE = 2.5195 V CAL_VREF = 3.0437 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:506 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.4706 b(slope) = 0.0093 chi2 = 99.0000 CAL_IN P-side : a = 2.4776 b(slope) = 0.0096 chi2 = 99.0000 VTN N-side : a = 0.0094 b(slope) = 0.0107 chi2 = 1.0882 VTN P-side : a = 0.0095 b(slope) = 0.0066 chi2 = 0.8718 VTP N-side = 0.6972 VTP p-side = 0.4297 CHI2 TEST = 0 CAL_BASE = 2.4827 V CAL_VREF = 3.0354 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:406 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4635 b(slope) = 0.0087 chi2 = 1.3519 CAL_IN P-side : a = 2.4636 b(slope) = 0.0087 chi2 = 0.9708 VTN N-side : a = 0.0095 b(slope) = 0.0108 chi2 = 0.9908 VTN P-side : a = 0.0095 b(slope) = 0.0066 chi2 = 1.0542 VTP N-side = 0.7038 VTP p-side = 0.4310 CHI2 TEST = 1 CAL_BASE = 2.4675 V CAL_VREF = 3.0237 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1126 FUNCT@5.0V:ATOM13B 1192 FUNCT@5.0V:ATOM13C 1192 FUNCT@5.0V:ATOM15 1170 FUNCT@5.0V:ATOM17 3482 FUNCT@5.0V:ATOM18 3498 FUNCT@5.0V:ATOM18HF 3498 FUNCT@5.0V:ATOM19 3434 FUNCT@5.0V:ATOM19D 3449 FUNCT@5.0V:ATOM19E 2676 FUNCT@5.0V:ATOM19F 6549 FUNCT@5.0V:ATOM19FHF 6549 FUNCT@5.0V:ATOM20 1142 FUNCT@5.0V:ATOM21 1118 FUNCT@5.0V:ATOM22 1106 FUNCT@5.0V:ATOM23 977 FUNCT@5.0V:ATOM24 1077 FUNCT@5.0V:ATOM25 1124 FUNCT@5.0V:ATOM25HF 1124 FUNCT@5.0V:ATOM26A 1103 FUNCT@5.0V:ATOM26B 1912 FUNCT@5.0V:ATOM28 1240 FUNCT@5.0V:ATOM29 1240 FUNCT@5.0V:ATOM30 1240 FUNCT@5.0V:ATOM31A 874 FUNCT@5.0V:ATOM31B 1063 FUNCT@5.0V:ATOM32 874 FUNCT@5.0V:ATOM33 1240 FUNCT@5.0V:ATOM35 1374 FUNCT@5.0V:ATOM36 1130 FUNCT@5.0V:ATOM39 1151 FUNCT@5.0V:ATOM41 1677 FUNCT@5.0V:ATOM41A 1677 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4309 FUNCT@5.0V:ATOM45C_40 4309 FUNCT@5.0V:ATOM46C_40 4277 FUNCT@5.0V:ATOM47C_40 3668 FUNCT@5.0V:ATOM48C_40 4309 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4309 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1246 NOISE TEST = 0 error detected at location:1404 TMIN TEST = 1 ---------- CHIP ID:306 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.4915 b(slope) = 0.0086 chi2 = 33.9858 CAL_IN P-side : a = 2.4957 b(slope) = 0.0086 chi2 = 17.8646 VTN N-side : a = 0.0096 b(slope) = 0.0107 chi2 = 1.0487 VTN P-side : a = 0.0097 b(slope) = 0.0065 chi2 = 0.7278 VTP N-side = 0.6940 VTP p-side = 0.4271 CHI2 TEST = 0 CAL_BASE = 2.4924 V CAL_VREF = 3.0347 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:206 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5032 b(slope) = 0.0084 chi2 = 0.7318 CAL_IN P-side : a = 2.5033 b(slope) = 0.0084 chi2 = 1.3337 VTN N-side : a = 0.0101 b(slope) = 0.0107 chi2 = 2.1939 VTN P-side : a = 0.0102 b(slope) = 0.0065 chi2 = 0.8288 VTP N-side = 0.6959 VTP p-side = 0.4282 CHI2 TEST = 1 CAL_BASE = 2.5017 V CAL_VREF = 3.0366 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13B 1199 FUNCT@5.0V:ATOM13C 1199 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4923 FUNCT@5.0V:ATOM45C_40 4923 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 3683 FUNCT@5.0V:ATOM48C_40 4923 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4923 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:107 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4565 b(slope) = 0.0085 chi2 = 0.6855 CAL_IN P-side : a = 2.4568 b(slope) = 0.0085 chi2 = 1.6677 VTN N-side : a = 0.0105 b(slope) = 0.0107 chi2 = 1.4713 VTN P-side : a = 0.0103 b(slope) = 0.0065 chi2 = 0.7484 VTP N-side = 0.6964 VTP p-side = 0.4289 CHI2 TEST = 1 CAL_BASE = 2.4627 V CAL_VREF = 3.0068 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:207 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4786 b(slope) = 0.0086 chi2 = 1.3526 CAL_IN P-side : a = 2.4784 b(slope) = 0.0086 chi2 = 0.8259 VTN N-side : a = 0.0104 b(slope) = 0.0107 chi2 = 0.5049 VTN P-side : a = 0.0104 b(slope) = 0.0065 chi2 = 0.3009 VTP N-side = 0.6945 VTP p-side = 0.4288 CHI2 TEST = 1 CAL_BASE = 2.4807 V CAL_VREF = 3.0303 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:307 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4744 b(slope) = 0.0086 chi2 = 0.8044 CAL_IN P-side : a = 2.4744 b(slope) = 0.0086 chi2 = 0.3846 VTN N-side : a = 0.0104 b(slope) = 0.0106 chi2 = 0.6385 VTN P-side : a = 0.0104 b(slope) = 0.0065 chi2 = 0.4126 VTP N-side = 0.6922 VTP p-side = 0.4263 CHI2 TEST = 1 CAL_BASE = 2.4748 V CAL_VREF = 3.0264 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:407 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4904 b(slope) = 0.0084 chi2 = 1.0507 CAL_IN P-side : a = 2.4907 b(slope) = 0.0084 chi2 = 0.9431 VTN N-side : a = 0.0101 b(slope) = 0.0106 chi2 = 1.3282 VTN P-side : a = 0.0102 b(slope) = 0.0064 chi2 = 0.6618 VTP N-side = 0.6896 VTP p-side = 0.4237 CHI2 TEST = 1 CAL_BASE = 2.4936 V CAL_VREF = 3.0337 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:507 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4878 b(slope) = 0.0086 chi2 = 0.9847 CAL_IN P-side : a = 2.4879 b(slope) = 0.0086 chi2 = 1.3857 VTN N-side : a = 0.0123 b(slope) = 0.0107 chi2 = 1.3819 VTN P-side : a = 0.0122 b(slope) = 0.0066 chi2 = 0.5252 VTP N-side = 0.6994 VTP p-side = 0.4329 CHI2 TEST = 1 CAL_BASE = 2.4873 V CAL_VREF = 3.0364 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:607 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD1A 1.0940E-01 IDDSB:VDD1B 1.1539E-01 IDDSB:VDD1C 1.2100E-01 IDDSB:VDD1D 1.2642E-01 IDDOP1:DVDD 1.5135E-01 DACs TEST = 1 CAL_IN N-side : a = 2.4796 b(slope) = 0.0085 chi2 = 0.9232 CAL_IN P-side : a = 2.4798 b(slope) = 0.0085 chi2 = 0.8569 VTN N-side : a = 0.0109 b(slope) = 0.0106 chi2 = 0.6935 VTN P-side : a = 0.0108 b(slope) = 0.0065 chi2 = 0.2601 VTP N-side = 0.6903 VTP p-side = 0.4272 CHI2 TEST = 1 CAL_BASE = 2.4819 V CAL_VREF = 3.0276 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1623 FUNCT@5.0V:ATOM15 1667 FUNCT@5.0V:ATOM17 3979 FUNCT@5.0V:ATOM18 3995 FUNCT@5.0V:ATOM18HF 3995 FUNCT@5.0V:ATOM19 3931 FUNCT@5.0V:ATOM19D 3946 FUNCT@5.0V:ATOM19E 3173 FUNCT@5.0V:ATOM19F 7046 FUNCT@5.0V:ATOM19FHF 7046 FUNCT@5.0V:ATOM20 1639 FUNCT@5.0V:ATOM21 1615 FUNCT@5.0V:ATOM22 1603 FUNCT@5.0V:ATOM25 1621 FUNCT@5.0V:ATOM25HF 1621 FUNCT@5.0V:ATOM26A 1600 FUNCT@5.0V:ATOM26B 2409 FUNCT@5.0V:ATOM28 1737 FUNCT@5.0V:ATOM29 1737 FUNCT@5.0V:ATOM30 1737 FUNCT@5.0V:ATOM31A 1371 FUNCT@5.0V:ATOM31B 1560 FUNCT@5.0V:ATOM32 1371 FUNCT@5.0V:ATOM33 1737 FUNCT@5.0V:ATOM35 1310 FUNCT@5.0V:ATOM36 1627 FUNCT@5.0V:ATOM39 1648 FUNCT@5.0V:ATOM41 2174 FUNCT@5.0V:ATOM41A 2174 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3810 FUNCT@5.0V:ATOM45C_40 3810 FUNCT@5.0V:ATOM46C_40 3667 FUNCT@5.0V:ATOM47C_40 3810 FUNCT@5.0V:ATOM48C_40 3810 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3810 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1252 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:707 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5036 b(slope) = 0.0082 chi2 = 1.1548 CAL_IN P-side : a = 2.5037 b(slope) = 0.0082 chi2 = 0.9520 VTN N-side : a = 0.0113 b(slope) = 0.0105 chi2 = 0.3319 VTN P-side : a = 0.0113 b(slope) = 0.0065 chi2 = 0.5483 VTP N-side = 0.6829 VTP p-side = 0.4282 CHI2 TEST = 1 CAL_BASE = 2.5064 V CAL_VREF = 3.0347 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:807 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4777 b(slope) = 0.0084 chi2 = 0.8755 CAL_IN P-side : a = 2.4774 b(slope) = 0.0084 chi2 = 0.7956 VTN N-side : a = 0.0125 b(slope) = 0.0106 chi2 = 0.6593 VTN P-side : a = 0.0125 b(slope) = 0.0065 chi2 = 0.3685 VTP N-side = 0.6912 VTP p-side = 0.4322 CHI2 TEST = 1 CAL_BASE = 2.4815 V CAL_VREF = 3.0183 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:907 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5012 b(slope) = 0.0081 chi2 = 1.3563 CAL_IN P-side : a = 2.5014 b(slope) = 0.0081 chi2 = 1.1211 VTN N-side : a = 0.0126 b(slope) = 0.0107 chi2 = 0.9702 VTN P-side : a = 0.0123 b(slope) = 0.0066 chi2 = 0.6335 VTP N-side = 0.6985 VTP p-side = 0.4360 CHI2 TEST = 1 CAL_BASE = 2.5051 V CAL_VREF = 3.0259 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:908 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5131 b(slope) = 0.0081 chi2 = 2.1005 CAL_IN P-side : a = 2.5137 b(slope) = 0.0081 chi2 = 1.8578 VTN N-side : a = 0.0136 b(slope) = 0.0108 chi2 = 2.2257 VTN P-side : a = 0.0132 b(slope) = 0.0067 chi2 = 0.7991 VTP N-side = 0.7044 VTP p-side = 0.4413 CHI2 TEST = 1 CAL_BASE = 2.5171 V CAL_VREF = 3.0354 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1062 FUNCT@5.0V:ATOM13B 1118 FUNCT@5.0V:ATOM13C 1118 FUNCT@5.0V:ATOM15 1106 FUNCT@5.0V:ATOM17 3418 FUNCT@5.0V:ATOM18 3434 FUNCT@5.0V:ATOM18HF 3434 FUNCT@5.0V:ATOM19 3370 FUNCT@5.0V:ATOM19D 3385 FUNCT@5.0V:ATOM19E 2612 FUNCT@5.0V:ATOM19F 6485 FUNCT@5.0V:ATOM19FHF 6485 FUNCT@5.0V:ATOM20 1078 FUNCT@5.0V:ATOM21 1056 FUNCT@5.0V:ATOM22 1044 FUNCT@5.0V:ATOM24 1081 FUNCT@5.0V:ATOM25 1060 FUNCT@5.0V:ATOM25HF 1060 FUNCT@5.0V:ATOM26A 1041 FUNCT@5.0V:ATOM26B 1850 FUNCT@5.0V:ATOM28 1178 FUNCT@5.0V:ATOM29 1178 FUNCT@5.0V:ATOM30 1178 FUNCT@5.0V:ATOM31A 810 FUNCT@5.0V:ATOM31B 999 FUNCT@5.0V:ATOM32 810 FUNCT@5.0V:ATOM33 1176 FUNCT@5.0V:ATOM35 1310 FUNCT@5.0V:ATOM36 1066 FUNCT@5.0V:ATOM39 1087 FUNCT@5.0V:ATOM41 1613 FUNCT@5.0V:ATOM41A 1613 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3683 FUNCT@5.0V:ATOM45C_40 3683 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 3683 FUNCT@5.0V:ATOM48C_40 3683 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3683 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:808 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5112 b(slope) = 0.0082 chi2 = 1.6148 CAL_IN P-side : a = 2.5116 b(slope) = 0.0082 chi2 = 1.5898 VTN N-side : a = 0.0114 b(slope) = 0.0106 chi2 = 0.5641 VTN P-side : a = 0.0111 b(slope) = 0.0066 chi2 = 0.3867 VTP N-side = 0.6930 VTP p-side = 0.4349 CHI2 TEST = 1 CAL_BASE = 2.5164 V CAL_VREF = 3.0403 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:708 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A 1.7935E-01 IDDSB:VDD0B 1.7932E-01 IDDSB:VDD0C 1.7930E-01 IDDSB:VDD0D 1.7928E-01 IDDOP0:AVDD 1.5287E-01 DACs TEST = 1 CAL_IN N-side : a = 2.4190 b(slope) = 0.0080 chi2 = 0.9052 CAL_IN P-side : a = 2.4189 b(slope) = 0.0080 chi2 = 0.4724 VTN N-side : a = 0.0234 b(slope) = 0.0100 chi2 = 1.0544 VTN P-side : a = 0.0230 b(slope) = 0.0061 chi2 = 0.3738 VTP N-side = 0.6655 VTP p-side = 0.4176 CHI2 TEST = 1 CAL_BASE = 2.4236 V CAL_VREF = 2.9353 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13B 1134 FUNCT@5.0V:ATOM13C 1134 FUNCT@5.0V:ATOM17 6670 FUNCT@5.0V:ATOM18 4518 FUNCT@5.0V:ATOM18HF 3531 FUNCT@5.0V:ATOM19 3482 FUNCT@5.0V:ATOM19E 2612 FUNCT@5.0V:ATOM19F 6741 FUNCT@5.0V:ATOM22 1246 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM25HF 1060 FUNCT@5.0V:ATOM31B 999 FUNCT@5.0V:ATOM33 1224 FUNCT@5.0V:ATOM36 1514 FUNCT@5.0V:ATOM41 1613 FUNCT@5.0V:ATOM41A 1613 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3667 FUNCT@5.0V:ATOM45C_40 3670 FUNCT@5.0V:ATOM46C_40 4277 FUNCT@5.0V:ATOM47C_40 5067 FUNCT@5.0V:ATOM48C_40 4282 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5067 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:608 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4924 b(slope) = 0.0084 chi2 = 1.2808 CAL_IN P-side : a = 2.4925 b(slope) = 0.0084 chi2 = 1.6089 VTN N-side : a = 0.0100 b(slope) = 0.0106 chi2 = 0.8408 VTN P-side : a = 0.0098 b(slope) = 0.0065 chi2 = 0.5669 VTP N-side = 0.6907 VTP p-side = 0.4286 CHI2 TEST = 1 CAL_BASE = 2.4959 V CAL_VREF = 3.0332 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1074 FUNCT@5.0V:ATOM15 1118 FUNCT@5.0V:ATOM17 3430 FUNCT@5.0V:ATOM18 3446 FUNCT@5.0V:ATOM18HF 3446 FUNCT@5.0V:ATOM19 3382 FUNCT@5.0V:ATOM19D 3397 FUNCT@5.0V:ATOM19E 2626 FUNCT@5.0V:ATOM19F 6498 FUNCT@5.0V:ATOM19FHF 6498 FUNCT@5.0V:ATOM20 1091 FUNCT@5.0V:ATOM21 1069 FUNCT@5.0V:ATOM22 1055 FUNCT@5.0V:ATOM25 1073 FUNCT@5.0V:ATOM25HF 1073 FUNCT@5.0V:ATOM26A 1052 FUNCT@5.0V:ATOM26B 1861 FUNCT@5.0V:ATOM28 1191 FUNCT@5.0V:ATOM29 1189 FUNCT@5.0V:ATOM30 1188 FUNCT@5.0V:ATOM31A 825 FUNCT@5.0V:ATOM31B 1012 FUNCT@5.0V:ATOM32 822 FUNCT@5.0V:ATOM33 1188 FUNCT@5.0V:ATOM35 1324 FUNCT@5.0V:ATOM36 1078 FUNCT@5.0V:ATOM39 1099 FUNCT@5.0V:ATOM41 1625 FUNCT@5.0V:ATOM41A 1625 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:508 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5388 b(slope) = 0.0081 chi2 = 0.6512 CAL_IN P-side : a = 2.5390 b(slope) = 0.0081 chi2 = 0.4629 VTN N-side : a = 0.0091 b(slope) = 0.0107 chi2 = 0.9010 VTN P-side : a = 0.0093 b(slope) = 0.0065 chi2 = 0.5502 VTP N-side = 0.6968 VTP p-side = 0.4274 CHI2 TEST = 1 CAL_BASE = 2.5398 V CAL_VREF = 3.0618 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:408 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4664 b(slope) = 0.0087 chi2 = 0.8455 CAL_IN P-side : a = 2.4667 b(slope) = 0.0087 chi2 = 0.7071 VTN N-side : a = 0.0096 b(slope) = 0.0108 chi2 = 0.6267 VTN P-side : a = 0.0098 b(slope) = 0.0066 chi2 = 0.3176 VTP N-side = 0.7004 VTP p-side = 0.4326 CHI2 TEST = 1 CAL_BASE = 2.4697 V CAL_VREF = 3.0268 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:308 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4806 b(slope) = 0.0086 chi2 = 2.1697 CAL_IN P-side : a = 2.4811 b(slope) = 0.0086 chi2 = 1.4340 VTN N-side : a = 0.0099 b(slope) = 0.0108 chi2 = 1.1096 VTN P-side : a = 0.0098 b(slope) = 0.0066 chi2 = 0.4519 VTP N-side = 0.7016 VTP p-side = 0.4343 CHI2 TEST = 1 CAL_BASE = 2.4834 V CAL_VREF = 3.0344 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:208 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4975 b(slope) = 0.0084 chi2 = 1.0836 CAL_IN P-side : a = 2.4978 b(slope) = 0.0084 chi2 = 0.5077 VTN N-side : a = 0.0103 b(slope) = 0.0106 chi2 = 0.7932 VTN P-side : a = 0.0103 b(slope) = 0.0065 chi2 = 1.0047 VTP N-side = 0.6918 VTP p-side = 0.4266 CHI2 TEST = 1 CAL_BASE = 2.5012 V CAL_VREF = 3.0422 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:108 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4852 b(slope) = 0.0085 chi2 = 9.1657 CAL_IN P-side : a = 2.4894 b(slope) = 0.0085 chi2 = 3.3656 VTN N-side : a = 0.0104 b(slope) = 0.0107 chi2 = 1.0986 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.5688 VTP N-side = 0.6977 VTP p-side = 0.4296 CHI2 TEST = 1 CAL_BASE = 2.4885 V CAL_VREF = 3.0286 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:209 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4829 b(slope) = 0.0084 chi2 = 0.5864 CAL_IN P-side : a = 2.4830 b(slope) = 0.0084 chi2 = 0.2895 VTN N-side : a = 0.0101 b(slope) = 0.0106 chi2 = 0.5522 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.3456 VTP N-side = 0.6899 VTP p-side = 0.4249 CHI2 TEST = 1 CAL_BASE = 2.4861 V CAL_VREF = 3.0256 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:309 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4410 b(slope) = 0.0087 chi2 = 1.7612 CAL_IN P-side : a = 2.4409 b(slope) = 0.0087 chi2 = 0.9493 VTN N-side : a = 0.0099 b(slope) = 0.0107 chi2 = 1.1370 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.7241 VTP N-side = 0.6935 VTP p-side = 0.4272 CHI2 TEST = 1 CAL_BASE = 2.4448 V CAL_VREF = 3.0032 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1061 FUNCT@5.0V:ATOM13B 1116 FUNCT@5.0V:ATOM13C 1116 FUNCT@5.0V:ATOM15 1121 FUNCT@5.0V:ATOM17 3417 FUNCT@5.0V:ATOM18 3432 FUNCT@5.0V:ATOM18HF 3432 FUNCT@5.0V:ATOM19 3369 FUNCT@5.0V:ATOM19D 3384 FUNCT@5.0V:ATOM19E 2611 FUNCT@5.0V:ATOM19F 6483 FUNCT@5.0V:ATOM19FHF 6483 FUNCT@5.0V:ATOM20 1090 FUNCT@5.0V:ATOM21 1052 FUNCT@5.0V:ATOM22 1054 FUNCT@5.0V:ATOM23 972 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 1059 FUNCT@5.0V:ATOM25HF 1059 FUNCT@5.0V:ATOM26A 1037 FUNCT@5.0V:ATOM26B 1860 FUNCT@5.0V:ATOM28 1190 FUNCT@5.0V:ATOM29 1188 FUNCT@5.0V:ATOM30 1190 FUNCT@5.0V:ATOM31A 808 FUNCT@5.0V:ATOM31B 998 FUNCT@5.0V:ATOM32 808 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 1308 FUNCT@5.0V:ATOM36 1064 FUNCT@5.0V:ATOM39 1086 FUNCT@5.0V:ATOM41 1612 FUNCT@5.0V:ATOM41A 1612 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3663 FUNCT@5.0V:ATOM45C_40 3663 FUNCT@5.0V:ATOM46C_40 3663 FUNCT@5.0V:ATOM47C_40 3663 FUNCT@5.0V:ATOM48C_40 3663 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3663 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1241 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:409 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4679 b(slope) = 0.0086 chi2 = 1.2147 CAL_IN P-side : a = 2.4680 b(slope) = 0.0086 chi2 = 0.8108 VTN N-side : a = 0.0097 b(slope) = 0.0107 chi2 = 1.1767 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.5898 VTP N-side = 0.6960 VTP p-side = 0.4294 CHI2 TEST = 1 CAL_BASE = 2.4714 V CAL_VREF = 3.0200 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4279 FUNCT@5.0V:ATOM45C_40 4279 FUNCT@5.0V:ATOM46C_40 4279 FUNCT@5.0V:ATOM47C_40 4279 FUNCT@5.0V:ATOM48C_40 4279 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4279 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:509 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4785 b(slope) = 0.0086 chi2 = 1.5884 CAL_IN P-side : a = 2.4786 b(slope) = 0.0086 chi2 = 0.8457 VTN N-side : a = 0.0098 b(slope) = 0.0108 chi2 = 0.9206 VTN P-side : a = 0.0101 b(slope) = 0.0066 chi2 = 0.6258 VTP N-side = 0.7014 VTP p-side = 0.4321 CHI2 TEST = 1 CAL_BASE = 2.4819 V CAL_VREF = 3.0339 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:609 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4713 b(slope) = 0.0085 chi2 = 0.6826 CAL_IN P-side : a = 2.4713 b(slope) = 0.0085 chi2 = 0.3030 VTN N-side : a = 0.0104 b(slope) = 0.0107 chi2 = 0.7166 VTN P-side : a = 0.0101 b(slope) = 0.0066 chi2 = 0.1989 VTP N-side = 0.6933 VTP p-side = 0.4315 CHI2 TEST = 1 CAL_BASE = 2.4775 V CAL_VREF = 3.0212 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:709 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4887 b(slope) = 0.0083 chi2 = 2.4833 CAL_IN P-side : a = 2.4890 b(slope) = 0.0083 chi2 = 1.7483 VTN N-side : a = 0.0103 b(slope) = 0.0107 chi2 = 0.6108 VTN P-side : a = 0.0101 b(slope) = 0.0066 chi2 = 0.2487 VTP N-side = 0.6944 VTP p-side = 0.4341 CHI2 TEST = 1 CAL_BASE = 2.4924 V CAL_VREF = 3.0242 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:809 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDOP1:DVDD 1.1272E-01 DACs TEST = 1 CAL_IN N-side : a = 2.5042 b(slope) = 0.0081 chi2 = 0.5486 CAL_IN P-side : a = 2.5041 b(slope) = 0.0081 chi2 = 0.6577 VTN N-side : a = 0.0103 b(slope) = 0.0107 chi2 = 0.8692 VTN P-side : a = 0.0102 b(slope) = 0.0067 chi2 = 0.5880 VTP N-side = 0.6975 VTP p-side = 0.4393 CHI2 TEST = 1 CAL_BASE = 2.5066 V CAL_VREF = 3.0268 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1062 FUNCT@5.0V:ATOM13B 1128 FUNCT@5.0V:ATOM13C 1128 FUNCT@5.0V:ATOM15 1106 FUNCT@5.0V:ATOM17 3418 FUNCT@5.0V:ATOM18 3434 FUNCT@5.0V:ATOM18HF 3434 FUNCT@5.0V:ATOM19 3370 FUNCT@5.0V:ATOM19D 3385 FUNCT@5.0V:ATOM19E 2612 FUNCT@5.0V:ATOM19F 6485 FUNCT@5.0V:ATOM19FHF 6485 FUNCT@5.0V:ATOM20 1078 FUNCT@5.0V:ATOM21 1054 FUNCT@5.0V:ATOM22 1042 FUNCT@5.0V:ATOM25 1060 FUNCT@5.0V:ATOM25HF 1060 FUNCT@5.0V:ATOM26A 1039 FUNCT@5.0V:ATOM26B 1848 FUNCT@5.0V:ATOM28 1176 FUNCT@5.0V:ATOM29 1176 FUNCT@5.0V:ATOM30 1176 FUNCT@5.0V:ATOM31A 810 FUNCT@5.0V:ATOM31B 999 FUNCT@5.0V:ATOM32 810 FUNCT@5.0V:ATOM33 1176 FUNCT@5.0V:ATOM35 1310 FUNCT@5.0V:ATOM36 1066 FUNCT@5.0V:ATOM39 1087 FUNCT@5.0V:ATOM41 1613 FUNCT@5.0V:ATOM41A 1613 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3683 FUNCT@5.0V:ATOM45C_40 3683 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 3683 FUNCT@5.0V:ATOM48C_40 3683 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3683 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:810 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4919 b(slope) = 0.0083 chi2 = 0.6786 CAL_IN P-side : a = 2.4918 b(slope) = 0.0083 chi2 = 0.4878 VTN N-side : a = 0.0106 b(slope) = 0.0109 chi2 = 0.6468 VTN P-side : a = 0.0105 b(slope) = 0.0067 chi2 = 0.2714 VTP N-side = 0.7101 VTP p-side = 0.4428 CHI2 TEST = 1 CAL_BASE = 2.4954 V CAL_VREF = 3.0254 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1062 FUNCT@5.0V:ATOM17 3418 FUNCT@5.0V:ATOM18 3434 FUNCT@5.0V:ATOM18HF 3434 FUNCT@5.0V:ATOM19 3370 FUNCT@5.0V:ATOM19D 3385 FUNCT@5.0V:ATOM19E 2612 FUNCT@5.0V:ATOM19F 6814 FUNCT@5.0V:ATOM19FHF 6814 FUNCT@5.0V:ATOM20 1078 FUNCT@5.0V:ATOM21 1054 FUNCT@5.0V:ATOM22 1150 FUNCT@5.0V:ATOM24 1083 FUNCT@5.0V:ATOM25 1060 FUNCT@5.0V:ATOM25HF 1060 FUNCT@5.0V:ATOM26A 1039 FUNCT@5.0V:ATOM36 1066 FUNCT@5.0V:ATOM39 1087 FUNCT@5.0V:ATOM41 1942 FUNCT@5.0V:ATOM41A 1942 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:710 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4901 b(slope) = 0.0084 chi2 = 0.7812 CAL_IN P-side : a = 2.4903 b(slope) = 0.0084 chi2 = 1.0057 VTN N-side : a = 0.0115 b(slope) = 0.0108 chi2 = 3.7757 VTN P-side : a = 0.0110 b(slope) = 0.0066 chi2 = 1.3253 VTP N-side = 0.7033 VTP p-side = 0.4376 CHI2 TEST = 1 CAL_BASE = 2.4927 V CAL_VREF = 3.0283 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:610 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5147 b(slope) = 0.0082 chi2 = 1.0081 CAL_IN P-side : a = 2.5152 b(slope) = 0.0082 chi2 = 1.2027 VTN N-side : a = 0.0112 b(slope) = 0.0107 chi2 = 0.7852 VTN P-side : a = 0.0110 b(slope) = 0.0066 chi2 = 0.3500 VTP N-side = 0.6974 VTP p-side = 0.4338 CHI2 TEST = 1 CAL_BASE = 2.5178 V CAL_VREF = 3.0449 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:510 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD1A 1.1202E-01 IDDSB:VDD1B 1.1830E-01 IDDSB:VDD1C 1.2412E-01 IDDSB:VDD1D 1.2941E-01 IDDOP1:DVDD 1.4454E-01 DACs TEST = 0 CAL_IN N-side : a = 3.0213 b(slope) = 0.0000 chi2 = 0.3759 CAL_IN P-side : a = 3.0190 b(slope) = 0.0000 chi2 = 2.2732 VTN N-side : a = 0.6938 b(slope) = 0.0000 chi2 = 0.3745 VTN P-side : a = 0.4301 b(slope) = 0.0000 chi2 = 0.3296 VTP N-side = 0.7057 VTP p-side = 0.4380 CHI2 TEST = 1 CAL_BASE = 2.4851 V CAL_VREF = 3.0342 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 263 FUNCT@5.0V:ATOM1TO6B 263 FUNCT@5.0V:ATOM1TO6C 263 FUNCT@5.0V:ATOM1TO6D 263 FUNCT@5.0V:ATOM1TO6E 263 FUNCT@5.0V:ATOM7TO9A 290 FUNCT@5.0V:ATOM7TO9B 290 FUNCT@5.0V:ATOM7TO9C 290 FUNCT@5.0V:ATOM7TO9D 290 FUNCT@5.0V:ATOM7TO9E 290 FUNCT@5.0V:ATOM10TO12 531 FUNCT@5.0V:ATOM13A 1054 FUNCT@5.0V:ATOM13B 1110 FUNCT@5.0V:ATOM13C 1110 FUNCT@5.0V:ATOM15 1098 FUNCT@5.0V:ATOM17 3410 FUNCT@5.0V:ATOM18 3426 FUNCT@5.0V:ATOM18HF 3426 FUNCT@5.0V:ATOM19 3362 FUNCT@5.0V:ATOM19D 3377 FUNCT@5.0V:ATOM19E 2604 FUNCT@5.0V:ATOM19F 6477 FUNCT@5.0V:ATOM19FHF 6477 FUNCT@5.0V:ATOM20 1070 FUNCT@5.0V:ATOM21 1046 FUNCT@5.0V:ATOM22 1034 FUNCT@5.0V:ATOM23 966 FUNCT@5.0V:ATOM24 1066 FUNCT@5.0V:ATOM25 1052 FUNCT@5.0V:ATOM25HF 1052 FUNCT@5.0V:ATOM26A 1031 FUNCT@5.0V:ATOM26B 1840 FUNCT@5.0V:ATOM27 1023 FUNCT@5.0V:ATOM28 1168 FUNCT@5.0V:ATOM29 1168 FUNCT@5.0V:ATOM30 1168 FUNCT@5.0V:ATOM31A 802 FUNCT@5.0V:ATOM31B 991 FUNCT@5.0V:ATOM32 802 FUNCT@5.0V:ATOM33 1168 FUNCT@5.0V:ATOM35 1302 FUNCT@5.0V:ATOM36 1058 FUNCT@5.0V:ATOM39 1079 FUNCT@5.0V:ATOM41 1605 FUNCT@5.0V:ATOM41A 1605 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3656 FUNCT@5.0V:ATOM45C_40 3656 FUNCT@5.0V:ATOM46C_40 3656 FUNCT@5.0V:ATOM47C_40 3656 FUNCT@5.0V:ATOM48C_40 3656 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3656 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 290 FUNCT@5.0V:A10TO12HF 531 FUNCT@5.0V:ADAC37HF 289 CH.MASK TEST = 0 error detected at location:1234 NOISE TEST = 0 error detected at location:1395 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D 9.0000E-08 TMIN@4.8V:A7_9_60D 9.0000E-08 TMIN@4.8V:A10_12_50D 9.0000E-08 TMIN@4.8V:A10_12_60D 9.0000E-08 TMIN@4.8V:ADAC37_50D 9.0000E-08 TMIN@4.8V:ADAC37_60D 9.0000E-08 TMIN@5.0V:A7_9_50D 9.0000E-08 TMIN@5.0V:A7_9_60D 9.0000E-08 TMIN@5.0V:A10_12_50D 9.0000E-08 TMIN@5.0V:A10_12_60D 9.0000E-08 TMIN@5.0V:ADAC37_50D 9.0000E-08 TMIN@5.0V:ADAC37_60D 9.0000E-08 TMIN@5.2V:A7_9_50D 9.0000E-08 TMIN@5.2V:A7_9_60D 9.0000E-08 TMIN@5.2V:A10_12_50D 9.0000E-08 TMIN@5.2V:A10_12_60D 9.0000E-08 TMIN@5.2V:ADAC37_50D 9.0000E-08 TMIN@5.2V:ADAC37_60D 9.0000E-08 ---------- CHIP ID:410 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4752 b(slope) = 0.0086 chi2 = 0.9767 CAL_IN P-side : a = 2.4753 b(slope) = 0.0086 chi2 = 0.7537 VTN N-side : a = 0.0094 b(slope) = 0.0108 chi2 = 0.7727 VTN P-side : a = 0.0095 b(slope) = 0.0066 chi2 = 0.5870 VTP N-side = 0.7017 VTP p-side = 0.4332 CHI2 TEST = 1 CAL_BASE = 2.4768 V CAL_VREF = 3.0266 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:310 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4923 b(slope) = 0.0084 chi2 = 1.9059 CAL_IN P-side : a = 2.4921 b(slope) = 0.0084 chi2 = 4.9946 VTN N-side : a = 0.0103 b(slope) = 0.0107 chi2 = 0.9639 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.5625 VTP N-side = 0.6953 VTP p-side = 0.4290 CHI2 TEST = 1 CAL_BASE = 2.4976 V CAL_VREF = 3.0354 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:210 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5343 b(slope) = 0.0081 chi2 = 1.8628 CAL_IN P-side : a = 2.5346 b(slope) = 0.0081 chi2 = 1.4215 VTN N-side : a = 0.0099 b(slope) = 0.0106 chi2 = 1.5583 VTN P-side : a = 0.0097 b(slope) = 0.0064 chi2 = 1.4061 VTP N-side = 0.6882 VTP p-side = 0.4213 CHI2 TEST = 1 CAL_BASE = 2.5386 V CAL_VREF = 3.0574 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 6620 FUNCT@5.0V:ATOM18 6636 FUNCT@5.0V:ATOM19F 9687 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM36 4017 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:211 ------------------ CLASS = B && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 100 CAL_IN N-side : a = 2.4850 b(slope) = 0.0084 chi2 = 2.3480 CAL_IN P-side : a = 2.4843 b(slope) = 0.0085 chi2 = 11.7645 VTN N-side : a = 0.0106 b(slope) = 0.0105 chi2 = 1.7250 VTN P-side : a = 0.0101 b(slope) = 0.0064 chi2 = 0.8235 VTP N-side = 0.6855 VTP p-side = 0.4194 CHI2 TEST = 100 CAL_BASE = 2.4890 V CAL_VREF = 3.0281 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:311 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4813 b(slope) = 0.0085 chi2 = 2.2503 CAL_IN P-side : a = 2.4817 b(slope) = 0.0085 chi2 = 1.7760 VTN N-side : a = 0.0104 b(slope) = 0.0106 chi2 = 0.8305 VTN P-side : a = 0.0102 b(slope) = 0.0064 chi2 = 0.7787 VTP N-side = 0.6915 VTP p-side = 0.4240 CHI2 TEST = 1 CAL_BASE = 2.4834 V CAL_VREF = 3.0273 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:411 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4823 b(slope) = 0.0084 chi2 = 1.5444 CAL_IN P-side : a = 2.4827 b(slope) = 0.0084 chi2 = 1.3149 VTN N-side : a = 0.0101 b(slope) = 0.0106 chi2 = 1.1387 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.3961 VTP N-side = 0.6882 VTP p-side = 0.4247 CHI2 TEST = 1 CAL_BASE = 2.4863 V CAL_VREF = 3.0242 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:511 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDOP1:DVDD 2.0238E-01 DACs TEST = 1 CAL_IN N-side : a = 2.4863 b(slope) = 0.0083 chi2 = 1.5679 CAL_IN P-side : a = 2.4866 b(slope) = 0.0083 chi2 = 1.6116 VTN N-side : a = 0.0118 b(slope) = 0.0107 chi2 = 2.6984 VTN P-side : a = 0.0117 b(slope) = 0.0066 chi2 = 1.5197 VTP N-side = 0.6986 VTP p-side = 0.4337 CHI2 TEST = 1 CAL_BASE = 2.4912 V CAL_VREF = 3.0242 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1046 FUNCT@5.0V:ATOM13B 1102 FUNCT@5.0V:ATOM13C 1102 FUNCT@5.0V:ATOM15 1090 FUNCT@5.0V:ATOM17 3402 FUNCT@5.0V:ATOM18 3418 FUNCT@5.0V:ATOM18HF 3418 FUNCT@5.0V:ATOM19 3354 FUNCT@5.0V:ATOM19D 3369 FUNCT@5.0V:ATOM19E 2596 FUNCT@5.0V:ATOM19F 6469 FUNCT@5.0V:ATOM19FHF 6469 FUNCT@5.0V:ATOM20 1062 FUNCT@5.0V:ATOM21 1038 FUNCT@5.0V:ATOM22 1026 FUNCT@5.0V:ATOM23 958 FUNCT@5.0V:ATOM24 1058 FUNCT@5.0V:ATOM25 1044 FUNCT@5.0V:ATOM25HF 1044 FUNCT@5.0V:ATOM26A 1023 FUNCT@5.0V:ATOM26B 1832 FUNCT@5.0V:ATOM28 1160 FUNCT@5.0V:ATOM29 1160 FUNCT@5.0V:ATOM30 1160 FUNCT@5.0V:ATOM31A 794 FUNCT@5.0V:ATOM31B 983 FUNCT@5.0V:ATOM32 794 FUNCT@5.0V:ATOM33 1160 FUNCT@5.0V:ATOM35 1294 FUNCT@5.0V:ATOM36 1050 FUNCT@5.0V:ATOM39 1071 FUNCT@5.0V:ATOM41 1597 FUNCT@5.0V:ATOM41A 1597 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3649 FUNCT@5.0V:ATOM45C_40 3649 FUNCT@5.0V:ATOM46C_40 3649 FUNCT@5.0V:ATOM47C_40 3649 FUNCT@5.0V:ATOM48C_40 3649 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3649 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1227 NOISE TEST = 0 error detected at location:1385 TMIN TEST = 1 ---------- CHIP ID:611 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4759 b(slope) = 0.0084 chi2 = 1.1276 CAL_IN P-side : a = 2.4761 b(slope) = 0.0084 chi2 = 1.2738 VTN N-side : a = 0.0113 b(slope) = 0.0109 chi2 = 3.2451 VTN P-side : a = 0.0107 b(slope) = 0.0067 chi2 = 1.1862 VTP N-side = 0.7085 VTP p-side = 0.4404 CHI2 TEST = 1 CAL_BASE = 2.4783 V CAL_VREF = 3.0164 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:711 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4749 b(slope) = 0.0084 chi2 = 1.5453 CAL_IN P-side : a = 2.4751 b(slope) = 0.0084 chi2 = 0.8646 VTN N-side : a = 0.0117 b(slope) = 0.0108 chi2 = 4.2352 VTN P-side : a = 0.0111 b(slope) = 0.0067 chi2 = 1.9021 VTP N-side = 0.7064 VTP p-side = 0.4387 CHI2 TEST = 1 CAL_BASE = 2.4822 V CAL_VREF = 3.0220 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM19F 8073 FUNCT@5.0V:ATOM19FHF 8073 FUNCT@5.0V:ATOM21 1558 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:811 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4630 b(slope) = 0.0084 chi2 = 0.4867 CAL_IN P-side : a = 2.4632 b(slope) = 0.0084 chi2 = 0.6945 VTN N-side : a = 0.0102 b(slope) = 0.0108 chi2 = 0.5503 VTN P-side : a = 0.0099 b(slope) = 0.0067 chi2 = 0.4641 VTP N-side = 0.7039 VTP p-side = 0.4411 CHI2 TEST = 1 CAL_BASE = 2.4663 V CAL_VREF = 3.0020 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1055 FUNCT@5.0V:ATOM13B 1111 FUNCT@5.0V:ATOM13C 1111 FUNCT@5.0V:ATOM15 1099 FUNCT@5.0V:ATOM17 3411 FUNCT@5.0V:ATOM18 3425 FUNCT@5.0V:ATOM18HF 3425 FUNCT@5.0V:ATOM19 3363 FUNCT@5.0V:ATOM19D 3378 FUNCT@5.0V:ATOM19E 2605 FUNCT@5.0V:ATOM19F 6477 FUNCT@5.0V:ATOM19FHF 6477 FUNCT@5.0V:ATOM20 1069 FUNCT@5.0V:ATOM21 1045 FUNCT@5.0V:ATOM22 1038 FUNCT@5.0V:ATOM23 975 FUNCT@5.0V:ATOM24 1075 FUNCT@5.0V:ATOM25 1053 FUNCT@5.0V:ATOM25HF 1053 FUNCT@5.0V:ATOM26A 1030 FUNCT@5.0V:ATOM26B 1841 FUNCT@5.0V:ATOM28 1167 FUNCT@5.0V:ATOM29 1167 FUNCT@5.0V:ATOM30 1167 FUNCT@5.0V:ATOM31A 801 FUNCT@5.0V:ATOM31B 992 FUNCT@5.0V:ATOM32 801 FUNCT@5.0V:ATOM33 1167 FUNCT@5.0V:ATOM35 1301 FUNCT@5.0V:ATOM36 1057 FUNCT@5.0V:ATOM39 1080 FUNCT@5.0V:ATOM41 1605 FUNCT@5.0V:ATOM41A 1605 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3657 FUNCT@5.0V:ATOM45C_40 3657 FUNCT@5.0V:ATOM46C_40 3657 FUNCT@5.0V:ATOM47C_40 3657 FUNCT@5.0V:ATOM48C_40 3657 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3657 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1244 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:812 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4925 b(slope) = 0.0082 chi2 = 2.7610 CAL_IN P-side : a = 2.4929 b(slope) = 0.0082 chi2 = 2.1019 VTN N-side : a = 0.0098 b(slope) = 0.0108 chi2 = 0.5293 VTN P-side : a = 0.0097 b(slope) = 0.0067 chi2 = 0.4802 VTP N-side = 0.6991 VTP p-side = 0.4390 CHI2 TEST = 1 CAL_BASE = 2.4959 V CAL_VREF = 3.0217 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM18 13667 FUNCT@5.0V:ATOM18HF 13667 FUNCT@5.0V:ATOM19E 3313 FUNCT@5.0V:ATOM21 1755 FUNCT@5.0V:ATOM28 1877 FUNCT@5.0V:ATOM31A 1511 FUNCT@5.0V:ATOM35 2011 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:712 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4619 b(slope) = 0.0085 chi2 = 1.6083 CAL_IN P-side : a = 2.4622 b(slope) = 0.0085 chi2 = 1.8185 VTN N-side : a = 0.0102 b(slope) = 0.0108 chi2 = 0.8250 VTN P-side : a = 0.0100 b(slope) = 0.0067 chi2 = 0.4148 VTP N-side = 0.7039 VTP p-side = 0.4367 CHI2 TEST = 1 CAL_BASE = 2.4680 V CAL_VREF = 3.0151 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:612 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4904 b(slope) = 0.0083 chi2 = 2.6720 CAL_IN P-side : a = 2.4905 b(slope) = 0.0083 chi2 = 2.0554 VTN N-side : a = 0.0099 b(slope) = 0.0108 chi2 = 2.3768 VTN P-side : a = 0.0097 b(slope) = 0.0066 chi2 = 0.8419 VTP N-side = 0.7032 VTP p-side = 0.4356 CHI2 TEST = 1 CAL_BASE = 2.4959 V CAL_VREF = 3.0271 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:512 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4974 b(slope) = 0.0083 chi2 = 0.9602 CAL_IN P-side : a = 2.4977 b(slope) = 0.0083 chi2 = 0.9848 VTN N-side : a = 0.0104 b(slope) = 0.0109 chi2 = 1.8699 VTN P-side : a = 0.0102 b(slope) = 0.0066 chi2 = 1.2724 VTP N-side = 0.7063 VTP p-side = 0.4357 CHI2 TEST = 1 CAL_BASE = 2.5017 V CAL_VREF = 3.0349 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1055 FUNCT@5.0V:ATOM13B 1111 FUNCT@5.0V:ATOM13C 1111 FUNCT@5.0V:ATOM15 1099 FUNCT@5.0V:ATOM17 3411 FUNCT@5.0V:ATOM18 3427 FUNCT@5.0V:ATOM18HF 3427 FUNCT@5.0V:ATOM19 3363 FUNCT@5.0V:ATOM19D 3378 FUNCT@5.0V:ATOM19E 2605 FUNCT@5.0V:ATOM19F 6478 FUNCT@5.0V:ATOM19FHF 6477 FUNCT@5.0V:ATOM20 1071 FUNCT@5.0V:ATOM21 1047 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 967 FUNCT@5.0V:ATOM24 1067 FUNCT@5.0V:ATOM25 1053 FUNCT@5.0V:ATOM25HF 1053 FUNCT@5.0V:ATOM26A 1033 FUNCT@5.0V:ATOM26B 1841 FUNCT@5.0V:ATOM28 1169 FUNCT@5.0V:ATOM29 1169 FUNCT@5.0V:ATOM30 1169 FUNCT@5.0V:ATOM31A 803 FUNCT@5.0V:ATOM31B 992 FUNCT@5.0V:ATOM32 803 FUNCT@5.0V:ATOM33 1169 FUNCT@5.0V:ATOM35 1303 FUNCT@5.0V:ATOM36 1059 FUNCT@5.0V:ATOM39 1080 FUNCT@5.0V:ATOM41 1606 FUNCT@5.0V:ATOM41A 1605 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3656 FUNCT@5.0V:ATOM45C_40 3656 FUNCT@5.0V:ATOM46C_40 3656 FUNCT@5.0V:ATOM47C_40 3656 FUNCT@5.0V:ATOM48C_40 3656 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3656 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1234 NOISE TEST = 0 error detected at location:1393 TMIN TEST = 1 ---------- CHIP ID:412 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4642 b(slope) = 0.0085 chi2 = 0.8807 CAL_IN P-side : a = 2.4645 b(slope) = 0.0085 chi2 = 0.7460 VTN N-side : a = 0.0102 b(slope) = 0.0107 chi2 = 0.5631 VTN P-side : a = 0.0101 b(slope) = 0.0065 chi2 = 0.2387 VTP N-side = 0.6955 VTP p-side = 0.4287 CHI2 TEST = 1 CAL_BASE = 2.4705 V CAL_VREF = 3.0171 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:312 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4943 b(slope) = 0.0084 chi2 = 3.6180 CAL_IN P-side : a = 2.4946 b(slope) = 0.0083 chi2 = 4.1027 VTN N-side : a = 0.0109 b(slope) = 0.0106 chi2 = 2.2036 VTN P-side : a = 0.0108 b(slope) = 0.0065 chi2 = 0.7687 VTP N-side = 0.6922 VTP p-side = 0.4268 CHI2 TEST = 1 CAL_BASE = 2.4983 V CAL_VREF = 3.0334 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:212 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4975 b(slope) = 0.0084 chi2 = 0.9458 CAL_IN P-side : a = 2.4977 b(slope) = 0.0084 chi2 = 0.9864 VTN N-side : a = 0.0105 b(slope) = 0.0106 chi2 = 1.9003 VTN P-side : a = 0.0105 b(slope) = 0.0065 chi2 = 1.5786 VTP N-side = 0.6924 VTP p-side = 0.4246 CHI2 TEST = 1 CAL_BASE = 2.5032 V CAL_VREF = 3.0396 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM19FHF 10040 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:413 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4750 b(slope) = 0.0084 chi2 = 0.6831 CAL_IN P-side : a = 2.4748 b(slope) = 0.0084 chi2 = 0.4652 VTN N-side : a = 0.0107 b(slope) = 0.0106 chi2 = 1.0962 VTN P-side : a = 0.0106 b(slope) = 0.0064 chi2 = 0.8063 VTP N-side = 0.6910 VTP p-side = 0.4244 CHI2 TEST = 1 CAL_BASE = 2.4795 V CAL_VREF = 3.0173 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1315 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM15 1359 FUNCT@5.0V:ATOM17 3671 FUNCT@5.0V:ATOM18 3687 FUNCT@5.0V:ATOM18HF 3687 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 2864 FUNCT@5.0V:ATOM19F 6737 FUNCT@5.0V:ATOM19FHF 6737 FUNCT@5.0V:ATOM20 1330 FUNCT@5.0V:ATOM21 1306 FUNCT@5.0V:ATOM22 1294 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 1312 FUNCT@5.0V:ATOM25HF 1312 FUNCT@5.0V:ATOM26A 1291 FUNCT@5.0V:ATOM26B 2100 FUNCT@5.0V:ATOM28 1428 FUNCT@5.0V:ATOM29 1428 FUNCT@5.0V:ATOM30 1430 FUNCT@5.0V:ATOM31A 1062 FUNCT@5.0V:ATOM31B 1251 FUNCT@5.0V:ATOM32 1064 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 1562 FUNCT@5.0V:ATOM36 1319 FUNCT@5.0V:ATOM39 1341 FUNCT@5.0V:ATOM41 1866 FUNCT@5.0V:ATOM41A 1866 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:513 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4629 b(slope) = 0.0085 chi2 = 0.8915 CAL_IN P-side : a = 2.4627 b(slope) = 0.0085 chi2 = 0.6018 VTN N-side : a = 0.0106 b(slope) = 0.0106 chi2 = 1.2995 VTN P-side : a = 0.0104 b(slope) = 0.0065 chi2 = 0.6178 VTP N-side = 0.6908 VTP p-side = 0.4260 CHI2 TEST = 1 CAL_BASE = 2.4653 V CAL_VREF = 3.0073 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:613 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 0 error detected in test: Location: SUP_SHORT:VDD1 2.5110E-01 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A -1.0000E-38 IDDSB:VDD1A -1.0000E-38 IDDSB:VDD0B -1.0000E-38 IDDSB:VDD1B -1.0000E-38 IDDSB:VDD0C -1.0000E-38 IDDSB:VDD1C -1.0000E-38 IDDSB:VDD0D -1.0000E-38 IDDSB:VDD1D -1.0000E-38 V_AVDD2IPA:249/L9 -1.0000E-38 V_AVDD2IMA:277/L10 -1.0000E-38 AVDD_A:AVDDP-M -1.0000E-38 IAVDD2_A:AVDDP-M -1.0000E-38 V_V1RA:169/L5 -1.0000E-38 V_N310A:171/L6 -1.0000E-38 V_AVDD2IPB:249/L9 -1.0000E-38 V_AVDD2IMB:277/L10 -1.0000E-38 AVDD_B:AVDDP-M -1.0000E-38 IAVDD2_B:AVDDP-M -1.0000E-38 V_V1RB:169/L5 -1.0000E-38 V_N310B:171/L6 -1.0000E-38 V_AVDD2IPC:249/L9 -1.0000E-38 V_AVDD2IMC:277/L10 -1.0000E-38 AVDD_C:AVDDP-M -1.0000E-38 IAVDD2_C:AVDDP-M -1.0000E-38 V_V1RC:169/L5 -1.0000E-38 V_N310C:171/L6 -1.0000E-38 V_AVDD2IPD:249/L9 -1.0000E-38 V_AVDD2IMD:277/L10 -1.0000E-38 AVDD_D:AVDDP-M -1.0000E-38 IAVDD2_D:AVDDP-M -1.0000E-38 V_V1RD:169/L5 -1.0000E-38 V_N310D:171/L6 -1.0000E-38 IDDOP0:AVDD -1.0000E-38 IDDOP1:DVDD -1.0000E-38 DACs TEST = 0 CAL_IN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side = 0.0000 VTP p-side = 0.0000 CHI2 TEST = 0 CAL_BASE = 0.0000 V CAL_VREF = 0.0000 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 0 FUNCT@5.0V:ATOM1TO6B 0 FUNCT@5.0V:ATOM1TO6C 0 FUNCT@5.0V:ATOM1TO6D 0 FUNCT@5.0V:ATOM1TO6E 0 FUNCT@5.0V:ATOM7TO9A 0 FUNCT@5.0V:ATOM7TO9B 0 FUNCT@5.0V:ATOM7TO9C 0 FUNCT@5.0V:ATOM7TO9D 0 FUNCT@5.0V:ATOM7TO9E 0 FUNCT@5.0V:ATOM10TO12 0 FUNCT@5.0V:ATOM13A 0 FUNCT@5.0V:ATOM13B 0 FUNCT@5.0V:ATOM13C 0 FUNCT@5.0V:ATOM14 0 FUNCT@5.0V:ATOM15 0 FUNCT@5.0V:ATOM16 0 FUNCT@5.0V:ATOM17 0 FUNCT@5.0V:ATOM18 0 FUNCT@5.0V:ATOM18HF 0 FUNCT@5.0V:ATOM19 0 FUNCT@5.0V:ATOM19B 0 FUNCT@5.0V:ATOM19C 0 FUNCT@5.0V:ATOM19D 0 FUNCT@5.0V:ATOM19E 0 FUNCT@5.0V:ATOM19F 0 FUNCT@5.0V:ATOM19FHF 0 FUNCT@5.0V:ATOM20 0 FUNCT@5.0V:ATOM21 0 FUNCT@5.0V:ATOM22 0 FUNCT@5.0V:ATOM23 0 FUNCT@5.0V:ATOM24 0 FUNCT@5.0V:ATOM25 0 FUNCT@5.0V:ATOM25HF 0 FUNCT@5.0V:ATOM26A 0 FUNCT@5.0V:ATOM26B 0 FUNCT@5.0V:ATOM27 0 FUNCT@5.0V:ATOM28 0 FUNCT@5.0V:ATOM29 0 FUNCT@5.0V:ATOM30 0 FUNCT@5.0V:ATOM31A 0 FUNCT@5.0V:ATOM31B 0 FUNCT@5.0V:ATOM32 0 FUNCT@5.0V:ATOM33 0 FUNCT@5.0V:ATOM34 0 FUNCT@5.0V:ATOM35 0 FUNCT@5.0V:ATOM36 0 FUNCT@5.0V:ATOM38 0 FUNCT@5.0V:ATOM39 0 FUNCT@5.0V:ATOM40 0 FUNCT@5.0V:ATOM41 0 FUNCT@5.0V:ATOM41A 0 FUNCT@5.0V:ATOM42 0 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 0 FUNCT@5.0V:ATOM45C_40 0 FUNCT@5.0V:ATOM46C_40 0 FUNCT@5.0V:ATOM47C_40 0 FUNCT@5.0V:ATOM48C_40 0 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 0 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 0 FUNCT@5.0V:A10TO12HF 0 FUNCT@5.0V:ADAC37HF 0 CH.MASK TEST = 0 error detected at location:0 NOISE TEST = 0 error detected at location:0 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D -1.0000E-38 TMIN@4.8V:A7_9_60D -1.0000E-38 TMIN@4.8V:A10_12_50D -1.0000E-38 TMIN@4.8V:A10_12_60D -1.0000E-38 TMIN@4.8V:ADAC37_50D -1.0000E-38 TMIN@4.8V:ADAC37_60D -1.0000E-38 TMIN@5.0V:A7_9_50D -1.0000E-38 TMIN@5.0V:A7_9_60D -1.0000E-38 TMIN@5.0V:A10_12_50D -1.0000E-38 TMIN@5.0V:A10_12_60D -1.0000E-38 TMIN@5.0V:ADAC37_50D -1.0000E-38 TMIN@5.0V:ADAC37_60D -1.0000E-38 TMIN@5.2V:A7_9_50D -1.0000E-38 TMIN@5.2V:A7_9_60D -1.0000E-38 TMIN@5.2V:A10_12_50D -1.0000E-38 TMIN@5.2V:A10_12_60D -1.0000E-38 TMIN@5.2V:ADAC37_50D -1.0000E-38 TMIN@5.2V:ADAC37_60D -1.0000E-38 ---------- CHIP ID:614 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5159 b(slope) = 0.0080 chi2 = 0.4992 CAL_IN P-side : a = 2.5156 b(slope) = 0.0080 chi2 = 0.5009 VTN N-side : a = 0.0107 b(slope) = 0.0108 chi2 = 1.5093 VTN P-side : a = 0.0106 b(slope) = 0.0066 chi2 = 1.0146 VTP N-side = 0.6997 VTP p-side = 0.4364 CHI2 TEST = 1 CAL_BASE = 2.5212 V CAL_VREF = 3.0320 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:514 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4637 b(slope) = 0.0085 chi2 = 1.7220 CAL_IN P-side : a = 2.4640 b(slope) = 0.0085 chi2 = 1.4086 VTN N-side : a = 0.0095 b(slope) = 0.0106 chi2 = 1.0064 VTN P-side : a = 0.0095 b(slope) = 0.0065 chi2 = 0.4012 VTP N-side = 0.6906 VTP p-side = 0.4296 CHI2 TEST = 1 CAL_BASE = 2.4670 V CAL_VREF = 3.0095 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4599 FUNCT@5.0V:ATOM45C_40 4599 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 4277 FUNCT@5.0V:ATOM48C_40 4599 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4599 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:414 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5092 b(slope) = 0.0081 chi2 = 0.4941 CAL_IN P-side : a = 2.5095 b(slope) = 0.0081 chi2 = 0.9954 VTN N-side : a = 0.0098 b(slope) = 0.0108 chi2 = 0.6149 VTN P-side : a = 0.0097 b(slope) = 0.0066 chi2 = 0.3111 VTP N-side = 0.7008 VTP p-side = 0.4318 CHI2 TEST = 1 CAL_BASE = 2.5137 V CAL_VREF = 3.0354 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 +++++++++ SUMMARY OF RESULTS ++++++++++++++++++++++++() ++++++++++++++++ A A< B B< C --------------------------------------------------------------- 401 0 0 0 0 501 0 0 0 0 0 0 0 0 601 0 0 0 0 602 502 0 0 0 0 402 0 0 0 0 203 0 0 0 0 0 0 0 0 303 403 0 0 0 0 0 0 0 0 503 0 0 0 0 603 0 0 0 0 703 0 0 0 0 803 0 0 0 0 804 704 0 0 0 0 0 0 0 0 604 0 0 0 0 504 0 0 0 0 404 0 0 0 0 304 204 0 0 0 0 205 0 0 0 0 305 0 0 0 0 405 0 0 0 0 0 0 0 0 505 605 0 0 0 0 705 0 0 0 0 0 0 0 0 805 806 0 0 0 0 706 0 0 0 0 606 0 0 0 0 0 0 0 0 506 0 0 0 0 406 0 0 0 0 306 0 0 0 0 206 107 0 0 0 0 0 207 0 0 0 0 307 0 0 0 0 407 0 0 0 507 0 0 0 0 0 0 0 0 607 707 0 0 0 0 807 0 0 0 0 907 0 0 0 0 0 0 0 0 908 808 0 0 0 0 0 0 0 0 708 0 0 0 0 608 508 0 0 0 0 0 408 0 0 0 308 0 0 0 0 0 208 0 0 0 108 0 0 0 0 0 209 0 0 0 0 0 0 0 309 0 0 0 0 409 0 0 0 0 509 0 609 0 0 0 709 0 0 0 0 0 0 0 0 809 0 0 0 0 810 0 710 0 0 0 0 610 0 0 0 0 0 0 0 510 0 410 0 0 0 0 310 0 0 0 0 210 0 0 0 0 0 0 211 0 0 311 0 0 0 0 411 0 0 0 0 0 0 0 511 0 611 0 0 0 0 0 0 0 711 0 0 0 0 811 0 0 0 0 812 0 712 0 0 0 0 612 0 0 0 0 0 0 0 512 0 412 0 0 0 0 312 0 0 0 0 0 0 0 212 0 0 0 0 413 0 513 0 0 0 0 0 0 0 613 0 614 0 0 0 0 0 0 0 514 0 414 0 0 0 ---------------------------------------------------------------- 26 37 22 0 1 NUMBER OF CHIPS TESTED = 86 NUMBER OF A CHIPS = 26 NUMBER OF A< CHIPS = 22 NUMBER OF B CHIPS = 0 NUMBER OF B< CHIPS = 1 NUMBER OF C CHIPS = 37 YIELD = 30.23 % (YIELD WITH LT CHIPS= 55.81 %)