******************************************************************** wafer #15 ******************************************************************** ---------- CHIP ID:401 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDOP1:DVDD 1.0637E-01 DACs TEST = 0 CAL_IN N-side : a = 2.5355 b(slope) = 0.0078 chi2 = 99.0000 CAL_IN P-side : a = 2.5227 b(slope) = 0.0084 chi2 = 45.4277 VTN N-side : a = 0.0330 b(slope) = 0.0097 chi2 = 99.0000 VTN P-side : a = 0.0098 b(slope) = 0.0066 chi2 = 0.4296 VTP N-side = 0.7040 VTP p-side = 0.4319 CHI2 TEST = 0 CAL_BASE = 2.5229 V CAL_VREF = 3.0625 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 1915 FUNCT@5.0V:ATOM13A 1062 FUNCT@5.0V:ATOM13B 1128 FUNCT@5.0V:ATOM13C 1128 FUNCT@5.0V:ATOM15 1106 FUNCT@5.0V:ATOM17 3418 FUNCT@5.0V:ATOM18 3434 FUNCT@5.0V:ATOM18HF 3434 FUNCT@5.0V:ATOM19 3370 FUNCT@5.0V:ATOM19D 3385 FUNCT@5.0V:ATOM19E 2612 FUNCT@5.0V:ATOM19F 6485 FUNCT@5.0V:ATOM19FHF 6485 FUNCT@5.0V:ATOM20 1078 FUNCT@5.0V:ATOM21 1054 FUNCT@5.0V:ATOM22 1042 FUNCT@5.0V:ATOM25 1060 FUNCT@5.0V:ATOM25HF 1060 FUNCT@5.0V:ATOM26A 1039 FUNCT@5.0V:ATOM26B 1848 FUNCT@5.0V:ATOM28 1176 FUNCT@5.0V:ATOM29 1176 FUNCT@5.0V:ATOM30 1176 FUNCT@5.0V:ATOM31A 810 FUNCT@5.0V:ATOM31B 999 FUNCT@5.0V:ATOM32 810 FUNCT@5.0V:ATOM33 1176 FUNCT@5.0V:ATOM35 1310 FUNCT@5.0V:ATOM36 1066 FUNCT@5.0V:ATOM39 1087 FUNCT@5.0V:ATOM41 1613 FUNCT@5.0V:ATOM41A 1613 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3683 FUNCT@5.0V:ATOM45C_40 3683 FUNCT@5.0V:ATOM46C_40 3665 FUNCT@5.0V:ATOM47C_40 212 FUNCT@5.0V:ATOM48C_40 3683 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3683 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:501 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A 1.0575E-01 IDDSB:VDD0B 1.0575E-01 IDDSB:VDD0C 1.0574E-01 IDDSB:VDD0D 1.0574E-01 AVDD_A:AVDDP-M 2.6904E-01 IAVDD2_A:AVDDP-M 2.6904E-02 AVDD_B:AVDDP-M 2.6855E-01 IAVDD2_B:AVDDP-M 2.6856E-02 AVDD_C:AVDDP-M 2.6904E-01 IAVDD2_C:AVDDP-M 2.6904E-02 AVDD_D:AVDDP-M 2.6880E-01 IAVDD2_D:AVDDP-M 2.6880E-02 DACs TEST = 1 CAL_IN N-side : a = 2.4960 b(slope) = 0.0084 chi2 = 0.6656 CAL_IN P-side : a = 2.4959 b(slope) = 0.0084 chi2 = 0.9624 VTN N-side : a = 0.0116 b(slope) = 0.0108 chi2 = 2.5665 VTN P-side : a = 0.0126 b(slope) = 0.0066 chi2 = 0.5758 VTP N-side = 0.7024 VTP p-side = 0.4341 CHI2 TEST = 1 CAL_BASE = 2.5002 V CAL_VREF = 3.0405 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3683 FUNCT@5.0V:ATOM45C_40 3683 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 3683 FUNCT@5.0V:ATOM48C_40 3667 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3683 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:601 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5095 b(slope) = 0.0085 chi2 = 0.9509 CAL_IN P-side : a = 2.5096 b(slope) = 0.0085 chi2 = 0.7014 VTN N-side : a = 0.0097 b(slope) = 0.0108 chi2 = 1.3679 VTN P-side : a = 0.0092 b(slope) = 0.0065 chi2 = 0.9111 VTP N-side = 0.7019 VTP p-side = 0.4282 CHI2 TEST = 1 CAL_BASE = 2.5137 V CAL_VREF = 3.0571 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:602 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5097 b(slope) = 0.0085 chi2 = 1.1743 CAL_IN P-side : a = 2.5101 b(slope) = 0.0085 chi2 = 1.1050 VTN N-side : a = 0.0100 b(slope) = 0.0108 chi2 = 1.1713 VTN P-side : a = 0.0096 b(slope) = 0.0066 chi2 = 0.8161 VTP N-side = 0.6995 VTP p-side = 0.4298 CHI2 TEST = 1 CAL_BASE = 2.5142 V CAL_VREF = 3.0598 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:502 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4941 b(slope) = 0.0087 chi2 = 1.6818 CAL_IN P-side : a = 2.4940 b(slope) = 0.0087 chi2 = 0.8765 VTN N-side : a = 0.0091 b(slope) = 0.0109 chi2 = 0.9013 VTN P-side : a = 0.0091 b(slope) = 0.0067 chi2 = 0.7605 VTP N-side = 0.7100 VTP p-side = 0.4376 CHI2 TEST = 1 CAL_BASE = 2.4968 V CAL_VREF = 3.0530 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1058 FUNCT@5.0V:ATOM13B 1114 FUNCT@5.0V:ATOM13C 1114 FUNCT@5.0V:ATOM15 1101 FUNCT@5.0V:ATOM17 3414 FUNCT@5.0V:ATOM18 3429 FUNCT@5.0V:ATOM18HF 3429 FUNCT@5.0V:ATOM19 3366 FUNCT@5.0V:ATOM19D 3381 FUNCT@5.0V:ATOM19E 2608 FUNCT@5.0V:ATOM19F 6481 FUNCT@5.0V:ATOM19FHF 6481 FUNCT@5.0V:ATOM20 1074 FUNCT@5.0V:ATOM21 1050 FUNCT@5.0V:ATOM22 1037 FUNCT@5.0V:ATOM23 969 FUNCT@5.0V:ATOM24 1069 FUNCT@5.0V:ATOM25 1056 FUNCT@5.0V:ATOM25HF 1056 FUNCT@5.0V:ATOM26A 1035 FUNCT@5.0V:ATOM26B 1843 FUNCT@5.0V:ATOM28 1172 FUNCT@5.0V:ATOM29 1172 FUNCT@5.0V:ATOM30 1172 FUNCT@5.0V:ATOM31A 807 FUNCT@5.0V:ATOM31B 994 FUNCT@5.0V:ATOM32 807 FUNCT@5.0V:ATOM33 1172 FUNCT@5.0V:ATOM35 1306 FUNCT@5.0V:ATOM36 1061 FUNCT@5.0V:ATOM39 1083 FUNCT@5.0V:ATOM41 1609 FUNCT@5.0V:ATOM41A 1609 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3662 FUNCT@5.0V:ATOM45C_40 3662 FUNCT@5.0V:ATOM46C_40 3662 FUNCT@5.0V:ATOM47C_40 3662 FUNCT@5.0V:ATOM48C_40 3662 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3662 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1240 NOISE TEST = 0 error detected at location:1397 TMIN TEST = 1 ---------- CHIP ID:402 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5021 b(slope) = 0.0086 chi2 = 1.0512 CAL_IN P-side : a = 2.5023 b(slope) = 0.0086 chi2 = 1.3273 VTN N-side : a = 0.0093 b(slope) = 0.0109 chi2 = 1.3802 VTN P-side : a = 0.0093 b(slope) = 0.0067 chi2 = 0.5363 VTP N-side = 0.7073 VTP p-side = 0.4370 CHI2 TEST = 1 CAL_BASE = 2.5037 V CAL_VREF = 3.0535 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:203 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5084 b(slope) = 0.0083 chi2 = 1.0494 CAL_IN P-side : a = 2.5083 b(slope) = 0.0083 chi2 = 1.1577 VTN N-side : a = 0.0091 b(slope) = 0.0105 chi2 = 0.7233 VTN P-side : a = 0.0092 b(slope) = 0.0063 chi2 = 0.5002 VTP N-side = 0.6791 VTP p-side = 0.4157 CHI2 TEST = 1 CAL_BASE = 2.5142 V CAL_VREF = 3.0454 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:303 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5157 b(slope) = 0.0082 chi2 = 0.6899 CAL_IN P-side : a = 2.5154 b(slope) = 0.0082 chi2 = 0.7355 VTN N-side : a = 0.0094 b(slope) = 0.0104 chi2 = 0.5123 VTN P-side : a = 0.0093 b(slope) = 0.0062 chi2 = 0.4642 VTP N-side = 0.6741 VTP p-side = 0.4088 CHI2 TEST = 1 CAL_BASE = 2.5181 V CAL_VREF = 3.0422 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1062 FUNCT@5.0V:ATOM13B 1120 FUNCT@5.0V:ATOM13C 1120 FUNCT@5.0V:ATOM15 1106 FUNCT@5.0V:ATOM17 3418 FUNCT@5.0V:ATOM18 3434 FUNCT@5.0V:ATOM18HF 3434 FUNCT@5.0V:ATOM19 3370 FUNCT@5.0V:ATOM19D 3385 FUNCT@5.0V:ATOM19E 2612 FUNCT@5.0V:ATOM19F 6485 FUNCT@5.0V:ATOM19FHF 6485 FUNCT@5.0V:ATOM20 1078 FUNCT@5.0V:ATOM21 1054 FUNCT@5.0V:ATOM22 1042 FUNCT@5.0V:ATOM23 976 FUNCT@5.0V:ATOM24 1076 FUNCT@5.0V:ATOM25 1060 FUNCT@5.0V:ATOM25HF 1060 FUNCT@5.0V:ATOM26A 1039 FUNCT@5.0V:ATOM26B 1848 FUNCT@5.0V:ATOM28 1176 FUNCT@5.0V:ATOM29 1176 FUNCT@5.0V:ATOM30 1176 FUNCT@5.0V:ATOM31A 810 FUNCT@5.0V:ATOM31B 999 FUNCT@5.0V:ATOM32 810 FUNCT@5.0V:ATOM33 1176 FUNCT@5.0V:ATOM35 1310 FUNCT@5.0V:ATOM36 1066 FUNCT@5.0V:ATOM39 1087 FUNCT@5.0V:ATOM41 1613 FUNCT@5.0V:ATOM41A 1613 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3667 FUNCT@5.0V:ATOM45C_40 3667 FUNCT@5.0V:ATOM46C_40 3667 FUNCT@5.0V:ATOM47C_40 3667 FUNCT@5.0V:ATOM48C_40 3667 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3667 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1245 NOISE TEST = 0 error detected at location:1403 TMIN TEST = 1 ---------- CHIP ID:403 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4661 b(slope) = 0.0088 chi2 = 0.8361 CAL_IN P-side : a = 2.4663 b(slope) = 0.0088 chi2 = 0.5225 VTN N-side : a = 0.0099 b(slope) = 0.0106 chi2 = 1.1760 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.3763 VTP N-side = 0.6921 VTP p-side = 0.4255 CHI2 TEST = 1 CAL_BASE = 2.4658 V CAL_VREF = 3.0308 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:503 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5083 b(slope) = 0.0086 chi2 = 0.8857 CAL_IN P-side : a = 2.5086 b(slope) = 0.0086 chi2 = 1.4664 VTN N-side : a = 0.0100 b(slope) = 0.0109 chi2 = 0.7276 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.1811 VTP N-side = 0.7073 VTP p-side = 0.4301 CHI2 TEST = 1 CAL_BASE = 2.5100 V CAL_VREF = 3.0588 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1430 FUNCT@5.0V:ATOM13B 1495 FUNCT@5.0V:ATOM13C 1495 FUNCT@5.0V:ATOM15 1474 FUNCT@5.0V:ATOM17 3786 FUNCT@5.0V:ATOM18 3802 FUNCT@5.0V:ATOM18HF 3802 FUNCT@5.0V:ATOM19 3738 FUNCT@5.0V:ATOM19D 3753 FUNCT@5.0V:ATOM19E 2980 FUNCT@5.0V:ATOM19F 6853 FUNCT@5.0V:ATOM19FHF 6853 FUNCT@5.0V:ATOM20 1446 FUNCT@5.0V:ATOM21 1422 FUNCT@5.0V:ATOM22 1410 FUNCT@5.0V:ATOM23 975 FUNCT@5.0V:ATOM24 1075 FUNCT@5.0V:ATOM25 1428 FUNCT@5.0V:ATOM25HF 1428 FUNCT@5.0V:ATOM26A 1407 FUNCT@5.0V:ATOM26B 2216 FUNCT@5.0V:ATOM28 1544 FUNCT@5.0V:ATOM29 1544 FUNCT@5.0V:ATOM30 1544 FUNCT@5.0V:ATOM31A 1178 FUNCT@5.0V:ATOM31B 1367 FUNCT@5.0V:ATOM32 1178 FUNCT@5.0V:ATOM33 1544 FUNCT@5.0V:ATOM35 1678 FUNCT@5.0V:ATOM36 1434 FUNCT@5.0V:ATOM39 1455 FUNCT@5.0V:ATOM41 1981 FUNCT@5.0V:ATOM41A 1981 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3858 FUNCT@5.0V:ATOM45C_40 3858 FUNCT@5.0V:ATOM46C_40 3667 FUNCT@5.0V:ATOM47C_40 3666 FUNCT@5.0V:ATOM48C_40 3858 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3858 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1244 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:603 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4850 b(slope) = 0.0086 chi2 = 0.7399 CAL_IN P-side : a = 2.4848 b(slope) = 0.0086 chi2 = 0.7403 VTN N-side : a = 0.0102 b(slope) = 0.0109 chi2 = 0.4972 VTN P-side : a = 0.0101 b(slope) = 0.0066 chi2 = 0.5191 VTP N-side = 0.7070 VTP p-side = 0.4322 CHI2 TEST = 1 CAL_BASE = 2.4890 V CAL_VREF = 3.0425 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:703 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5021 b(slope) = 0.0085 chi2 = 1.5167 CAL_IN P-side : a = 2.5018 b(slope) = 0.0085 chi2 = 0.4972 VTN N-side : a = 0.0103 b(slope) = 0.0108 chi2 = 0.8463 VTN P-side : a = 0.0099 b(slope) = 0.0066 chi2 = 0.5736 VTP N-side = 0.7041 VTP p-side = 0.4353 CHI2 TEST = 1 CAL_BASE = 2.5029 V CAL_VREF = 3.0471 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:803 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A 1.2775E-01 IDDSB:VDD0B 1.2773E-01 IDDSB:VDD0C 1.2773E-01 IDDSB:VDD0D 1.2771E-01 AVDD_A:AVDDP-M 2.9077E-01 IAVDD2_A:AVDDP-M 2.9077E-02 AVDD_B:AVDDP-M 2.9077E-01 IAVDD2_B:AVDDP-M 2.9077E-02 AVDD_C:AVDDP-M 2.9102E-01 IAVDD2_C:AVDDP-M 2.9102E-02 AVDD_D:AVDDP-M 2.9053E-01 IAVDD2_D:AVDDP-M 2.9053E-02 IDDOP0:AVDD 1.0935E-01 DACs TEST = 0 CAL_IN N-side : a = 2.7157 b(slope) = 0.0000 chi2 = 99.0000 CAL_IN P-side : a = 2.7154 b(slope) = 0.0000 chi2 = 2.6848 VTN N-side : a = 0.0207 b(slope) = 0.0105 chi2 = 1.1084 VTN P-side : a = 0.0193 b(slope) = 0.0065 chi2 = 0.7153 VTP N-side = 0.6928 VTP p-side = 0.4346 CHI2 TEST = 0 CAL_BASE = 2.5591 V CAL_VREF = 3.0730 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1703 FUNCT@5.0V:ATOM13B 1774 FUNCT@5.0V:ATOM13C 1774 FUNCT@5.0V:ATOM15 1747 FUNCT@5.0V:ATOM17 4059 FUNCT@5.0V:ATOM18 4075 FUNCT@5.0V:ATOM18HF 4075 FUNCT@5.0V:ATOM19 4011 FUNCT@5.0V:ATOM19D 4026 FUNCT@5.0V:ATOM19E 3253 FUNCT@5.0V:ATOM19F 7126 FUNCT@5.0V:ATOM19FHF 7126 FUNCT@5.0V:ATOM20 1719 FUNCT@5.0V:ATOM21 1695 FUNCT@5.0V:ATOM22 1683 FUNCT@5.0V:ATOM23 975 FUNCT@5.0V:ATOM24 1075 FUNCT@5.0V:ATOM25 1701 FUNCT@5.0V:ATOM25HF 1701 FUNCT@5.0V:ATOM26A 1680 FUNCT@5.0V:ATOM26B 2489 FUNCT@5.0V:ATOM28 1817 FUNCT@5.0V:ATOM29 1817 FUNCT@5.0V:ATOM30 1817 FUNCT@5.0V:ATOM31A 1451 FUNCT@5.0V:ATOM31B 1640 FUNCT@5.0V:ATOM32 1451 FUNCT@5.0V:ATOM33 1817 FUNCT@5.0V:ATOM35 1951 FUNCT@5.0V:ATOM36 1707 FUNCT@5.0V:ATOM39 1728 FUNCT@5.0V:ATOM41 2254 FUNCT@5.0V:ATOM41A 2254 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3666 FUNCT@5.0V:ATOM45C_40 3666 FUNCT@5.0V:ATOM46C_40 3666 FUNCT@5.0V:ATOM47C_40 3683 FUNCT@5.0V:ATOM48C_40 3666 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3666 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1244 NOISE TEST = 0 error detected at location:1408 TMIN TEST = 1 ---------- CHIP ID:804 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5174 b(slope) = 0.0084 chi2 = 0.7163 CAL_IN P-side : a = 2.5176 b(slope) = 0.0084 chi2 = 0.4641 VTN N-side : a = 0.0117 b(slope) = 0.0109 chi2 = 4.0984 VTN P-side : a = 0.0114 b(slope) = 0.0067 chi2 = 1.4777 VTP N-side = 0.7083 VTP p-side = 0.4412 CHI2 TEST = 1 CAL_BASE = 2.5171 V CAL_VREF = 3.0530 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:704 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4980 b(slope) = 0.0086 chi2 = 0.6510 CAL_IN P-side : a = 2.4980 b(slope) = 0.0086 chi2 = 0.7723 VTN N-side : a = 0.0097 b(slope) = 0.0109 chi2 = 0.5161 VTN P-side : a = 0.0098 b(slope) = 0.0067 chi2 = 0.2288 VTP N-side = 0.7087 VTP p-side = 0.4373 CHI2 TEST = 1 CAL_BASE = 2.5039 V CAL_VREF = 3.0522 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:604 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5210 b(slope) = 0.0084 chi2 = 2.1852 CAL_IN P-side : a = 2.5213 b(slope) = 0.0084 chi2 = 2.5749 VTN N-side : a = 0.0099 b(slope) = 0.0108 chi2 = 1.4874 VTN P-side : a = 0.0102 b(slope) = 0.0066 chi2 = 0.7833 VTP N-side = 0.7048 VTP p-side = 0.4353 CHI2 TEST = 1 CAL_BASE = 2.5234 V CAL_VREF = 3.0637 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:504 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5251 b(slope) = 0.0085 chi2 = 1.4045 CAL_IN P-side : a = 2.5251 b(slope) = 0.0085 chi2 = 1.1358 VTN N-side : a = 0.0101 b(slope) = 0.0109 chi2 = 0.7911 VTN P-side : a = 0.0103 b(slope) = 0.0067 chi2 = 0.5223 VTP N-side = 0.7063 VTP p-side = 0.4368 CHI2 TEST = 1 CAL_BASE = 2.5271 V CAL_VREF = 3.0703 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:404 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4896 b(slope) = 0.0087 chi2 = 2.4053 CAL_IN P-side : a = 2.4922 b(slope) = 0.0088 chi2 = 1.3540 VTN N-side : a = 0.0107 b(slope) = 0.0109 chi2 = 1.1070 VTN P-side : a = 0.0106 b(slope) = 0.0067 chi2 = 0.5290 VTP N-side = 0.7097 VTP p-side = 0.4386 CHI2 TEST = 1 CAL_BASE = 2.4915 V CAL_VREF = 3.0469 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:304 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.4489 b(slope) = 0.0103 chi2 = 99.0000 CAL_IN P-side : a = 2.4659 b(slope) = 0.0102 chi2 = 99.0000 VTN N-side : a = 0.0093 b(slope) = 0.0107 chi2 = 0.9604 VTN P-side : a = 0.0093 b(slope) = 0.0065 chi2 = 0.5638 VTP N-side = 0.6952 VTP p-side = 0.4238 CHI2 TEST = 0 CAL_BASE = 2.4766 V CAL_VREF = 3.0278 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:204 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4934 b(slope) = 0.0084 chi2 = 1.6102 CAL_IN P-side : a = 2.4936 b(slope) = 0.0084 chi2 = 0.5099 VTN N-side : a = 0.0103 b(slope) = 0.0106 chi2 = 1.1307 VTN P-side : a = 0.0100 b(slope) = 0.0064 chi2 = 0.4542 VTP N-side = 0.6883 VTP p-side = 0.4225 CHI2 TEST = 1 CAL_BASE = 2.4976 V CAL_VREF = 3.0376 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:205 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4957 b(slope) = 0.0085 chi2 = 0.8584 CAL_IN P-side : a = 2.4970 b(slope) = 0.0085 chi2 = 3.1117 VTN N-side : a = 0.0096 b(slope) = 0.0106 chi2 = 0.9857 VTN P-side : a = 0.0096 b(slope) = 0.0064 chi2 = 0.3449 VTP N-side = 0.6891 VTP p-side = 0.4221 CHI2 TEST = 1 CAL_BASE = 2.4949 V CAL_VREF = 3.0376 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:305 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.5101 b(slope) = 0.0004 chi2 = 99.0000 CAL_IN P-side : a = 2.4985 b(slope) = 0.0005 chi2 = 99.0000 VTN N-side : a = 0.0099 b(slope) = 0.0106 chi2 = 1.1727 VTN P-side : a = 0.0098 b(slope) = 0.0065 chi2 = 0.6851 VTP N-side = 0.6866 VTP p-side = 0.4238 CHI2 TEST = 0 CAL_BASE = 2.4939 V CAL_VREF = 3.0398 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4987 FUNCT@5.0V:ATOM45C_40 3715 FUNCT@5.0V:ATOM46C_40 4277 FUNCT@5.0V:ATOM47C_40 4890 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3683 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:405 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4918 b(slope) = 0.0086 chi2 = 0.3839 CAL_IN P-side : a = 2.4918 b(slope) = 0.0086 chi2 = 0.6163 VTN N-side : a = 0.0098 b(slope) = 0.0107 chi2 = 0.5156 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.2580 VTP N-side = 0.6953 VTP p-side = 0.4276 CHI2 TEST = 1 CAL_BASE = 2.4936 V CAL_VREF = 3.0440 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:505 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4934 b(slope) = 0.0087 chi2 = 0.7929 CAL_IN P-side : a = 2.4938 b(slope) = 0.0087 chi2 = 0.3774 VTN N-side : a = 0.0099 b(slope) = 0.0108 chi2 = 1.2392 VTN P-side : a = 0.0101 b(slope) = 0.0066 chi2 = 0.3964 VTP N-side = 0.7052 VTP p-side = 0.4356 CHI2 TEST = 1 CAL_BASE = 2.4946 V CAL_VREF = 3.0532 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:605 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4813 b(slope) = 0.0088 chi2 = 1.7608 CAL_IN P-side : a = 2.4812 b(slope) = 0.0088 chi2 = 4.7441 VTN N-side : a = 0.0101 b(slope) = 0.0108 chi2 = 0.9974 VTN P-side : a = 0.0101 b(slope) = 0.0066 chi2 = 0.5825 VTP N-side = 0.7021 VTP p-side = 0.4326 CHI2 TEST = 1 CAL_BASE = 2.4836 V CAL_VREF = 3.0447 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:705 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4852 b(slope) = 0.0086 chi2 = 0.9416 CAL_IN P-side : a = 2.4850 b(slope) = 0.0086 chi2 = 0.8636 VTN N-side : a = 0.0106 b(slope) = 0.0108 chi2 = 1.1617 VTN P-side : a = 0.0105 b(slope) = 0.0067 chi2 = 0.4685 VTP N-side = 0.7023 VTP p-side = 0.4387 CHI2 TEST = 1 CAL_BASE = 2.4876 V CAL_VREF = 3.0396 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:805 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5222 b(slope) = 0.0083 chi2 = 0.7246 CAL_IN P-side : a = 2.5224 b(slope) = 0.0083 chi2 = 0.8475 VTN N-side : a = 0.0099 b(slope) = 0.0107 chi2 = 0.6797 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.4072 VTP N-side = 0.6940 VTP p-side = 0.4283 CHI2 TEST = 1 CAL_BASE = 2.5254 V CAL_VREF = 3.0557 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:806 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 3.0951 b(slope) = 0.0000 chi2 = 3.1730 CAL_IN P-side : a = 3.0948 b(slope) = 0.0000 chi2 = 1.6434 VTN N-side : a = 0.0110 b(slope) = 0.0107 chi2 = 0.8157 VTN P-side : a = 0.0113 b(slope) = 0.0066 chi2 = 0.2050 VTP N-side = 0.6987 VTP p-side = 0.4379 CHI2 TEST = 1 CAL_BASE = 2.5002 V CAL_VREF = 3.0454 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3683 FUNCT@5.0V:ATOM45C_40 3667 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 3667 FUNCT@5.0V:ATOM48C_40 3683 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3683 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:706 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4817 b(slope) = 0.0088 chi2 = 0.6908 CAL_IN P-side : a = 2.4817 b(slope) = 0.0088 chi2 = 0.5047 VTN N-side : a = 0.0094 b(slope) = 0.0109 chi2 = 1.1460 VTN P-side : a = 0.0093 b(slope) = 0.0066 chi2 = 0.5037 VTP N-side = 0.7052 VTP p-side = 0.4346 CHI2 TEST = 1 CAL_BASE = 2.4827 V CAL_VREF = 3.0469 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:606 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4922 b(slope) = 0.0087 chi2 = 0.7309 CAL_IN P-side : a = 2.4922 b(slope) = 0.0087 chi2 = 0.3272 VTN N-side : a = 0.0092 b(slope) = 0.0109 chi2 = 1.3451 VTN P-side : a = 0.0093 b(slope) = 0.0066 chi2 = 1.0168 VTP N-side = 0.7055 VTP p-side = 0.4346 CHI2 TEST = 1 CAL_BASE = 2.4915 V CAL_VREF = 3.0501 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:506 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5040 b(slope) = 0.0086 chi2 = 1.6873 CAL_IN P-side : a = 2.5040 b(slope) = 0.0086 chi2 = 0.9330 VTN N-side : a = 0.0098 b(slope) = 0.0107 chi2 = 0.7875 VTN P-side : a = 0.0097 b(slope) = 0.0065 chi2 = 0.5975 VTP N-side = 0.6958 VTP p-side = 0.4280 CHI2 TEST = 1 CAL_BASE = 2.5076 V CAL_VREF = 3.0605 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:406 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4637 b(slope) = 0.0088 chi2 = 1.0241 CAL_IN P-side : a = 2.4640 b(slope) = 0.0088 chi2 = 4.1966 VTN N-side : a = 0.0102 b(slope) = 0.0107 chi2 = 1.2572 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.5723 VTP N-side = 0.6956 VTP p-side = 0.4272 CHI2 TEST = 1 CAL_BASE = 2.4646 V CAL_VREF = 3.0283 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM19F 7204 FUNCT@5.0V:ATOM19FHF 7204 FUNCT@5.0V:ATOM20 1797 FUNCT@5.0V:ATOM21 1772 FUNCT@5.0V:ATOM22 1760 FUNCT@5.0V:ATOM25 1779 FUNCT@5.0V:ATOM25HF 1779 FUNCT@5.0V:ATOM26A 1758 FUNCT@5.0V:ATOM26B 2567 FUNCT@5.0V:ATOM28 1894 FUNCT@5.0V:ATOM29 1895 FUNCT@5.0V:ATOM31A 1528 FUNCT@5.0V:ATOM31B 1718 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:306 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: AVDD_A:AVDDP-M 2.6929E-01 IAVDD2_A:AVDDP-M 2.6929E-02 AVDD_B:AVDDP-M 2.6953E-01 IAVDD2_B:AVDDP-M 2.6953E-02 AVDD_C:AVDDP-M 2.6880E-01 IAVDD2_C:AVDDP-M 2.6880E-02 AVDD_D:AVDDP-M 2.6855E-01 IAVDD2_D:AVDDP-M 2.6856E-02 DACs TEST = 1 CAL_IN N-side : a = 2.4930 b(slope) = 0.0086 chi2 = 0.9618 CAL_IN P-side : a = 2.4933 b(slope) = 0.0086 chi2 = 0.7766 VTN N-side : a = 0.0099 b(slope) = 0.0107 chi2 = 0.9885 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.7928 VTP N-side = 0.6966 VTP p-side = 0.4290 CHI2 TEST = 1 CAL_BASE = 2.4961 V CAL_VREF = 3.0457 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3683 FUNCT@5.0V:ATOM45C_40 3683 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 3683 FUNCT@5.0V:ATOM48C_40 3683 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3683 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:206 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5115 b(slope) = 0.0083 chi2 = 0.7979 CAL_IN P-side : a = 2.5117 b(slope) = 0.0083 chi2 = 0.4496 VTN N-side : a = 0.0096 b(slope) = 0.0105 chi2 = 2.4380 VTN P-side : a = 0.0094 b(slope) = 0.0064 chi2 = 1.0841 VTP N-side = 0.6789 VTP p-side = 0.4196 CHI2 TEST = 1 CAL_BASE = 2.5112 V CAL_VREF = 3.0435 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1408 TMIN TEST = 1 ---------- CHIP ID:107 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4995 b(slope) = 0.0082 chi2 = 0.7123 CAL_IN P-side : a = 2.4994 b(slope) = 0.0082 chi2 = 0.6446 VTN N-side : a = 0.0097 b(slope) = 0.0102 chi2 = 0.7923 VTN P-side : a = 0.0096 b(slope) = 0.0062 chi2 = 0.2805 VTP N-side = 0.6666 VTP p-side = 0.4103 CHI2 TEST = 1 CAL_BASE = 2.5039 V CAL_VREF = 3.0320 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:207 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5134 b(slope) = 0.0083 chi2 = 0.9533 CAL_IN P-side : a = 2.5136 b(slope) = 0.0083 chi2 = 0.7485 VTN N-side : a = 0.0099 b(slope) = 0.0104 chi2 = 0.8090 VTN P-side : a = 0.0097 b(slope) = 0.0064 chi2 = 0.6677 VTP N-side = 0.6800 VTP p-side = 0.4187 CHI2 TEST = 1 CAL_BASE = 2.5151 V CAL_VREF = 3.0488 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13B 2091 FUNCT@5.0V:ATOM13C 2091 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:307 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4785 b(slope) = 0.0086 chi2 = 0.5452 CAL_IN P-side : a = 2.4783 b(slope) = 0.0086 chi2 = 0.4486 VTN N-side : a = 0.0099 b(slope) = 0.0105 chi2 = 0.8887 VTN P-side : a = 0.0100 b(slope) = 0.0064 chi2 = 0.4250 VTP N-side = 0.6809 VTP p-side = 0.4197 CHI2 TEST = 1 CAL_BASE = 2.4815 V CAL_VREF = 3.0357 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:407 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4817 b(slope) = 0.0086 chi2 = 0.6959 CAL_IN P-side : a = 2.4815 b(slope) = 0.0086 chi2 = 1.0552 VTN N-side : a = 0.0100 b(slope) = 0.0106 chi2 = 0.7308 VTN P-side : a = 0.0099 b(slope) = 0.0064 chi2 = 0.2586 VTP N-side = 0.6894 VTP p-side = 0.4227 CHI2 TEST = 1 CAL_BASE = 2.4827 V CAL_VREF = 3.0347 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:507 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5023 b(slope) = 0.0086 chi2 = 0.5195 CAL_IN P-side : a = 2.5022 b(slope) = 0.0086 chi2 = 0.6800 VTN N-side : a = 0.0095 b(slope) = 0.0109 chi2 = 0.6322 VTN P-side : a = 0.0096 b(slope) = 0.0066 chi2 = 0.3987 VTP N-side = 0.7053 VTP p-side = 0.4301 CHI2 TEST = 1 CAL_BASE = 2.5056 V CAL_VREF = 3.0593 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM36 3781 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:607 ------------------ CLASS = B && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 100 CAL_IN N-side : a = 2.4863 b(slope) = 0.0088 chi2 = 0.8560 CAL_IN P-side : a = 2.4861 b(slope) = 0.0087 chi2 = 16.9429 VTN N-side : a = 0.0097 b(slope) = 0.0106 chi2 = 0.4148 VTN P-side : a = 0.0097 b(slope) = 0.0065 chi2 = 0.2674 VTP N-side = 0.6910 VTP p-side = 0.4252 CHI2 TEST = 100 CAL_BASE = 2.4878 V CAL_VREF = 3.0498 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:707 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4857 b(slope) = 0.0086 chi2 = 1.2074 CAL_IN P-side : a = 2.4861 b(slope) = 0.0086 chi2 = 0.8543 VTN N-side : a = 0.0098 b(slope) = 0.0106 chi2 = 0.8925 VTN P-side : a = 0.0098 b(slope) = 0.0065 chi2 = 0.2284 VTP N-side = 0.6898 VTP p-side = 0.4261 CHI2 TEST = 1 CAL_BASE = 2.4905 V CAL_VREF = 3.0437 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1927 FUNCT@5.0V:ATOM15 1971 FUNCT@5.0V:ATOM17 4283 FUNCT@5.0V:ATOM18 4299 FUNCT@5.0V:ATOM18HF 4299 FUNCT@5.0V:ATOM19 4235 FUNCT@5.0V:ATOM19D 4250 FUNCT@5.0V:ATOM19E 3477 FUNCT@5.0V:ATOM19F 7350 FUNCT@5.0V:ATOM19FHF 7350 FUNCT@5.0V:ATOM20 1943 FUNCT@5.0V:ATOM21 1919 FUNCT@5.0V:ATOM22 1907 FUNCT@5.0V:ATOM25 1925 FUNCT@5.0V:ATOM25HF 1925 FUNCT@5.0V:ATOM26A 1904 FUNCT@5.0V:ATOM26B 2713 FUNCT@5.0V:ATOM28 2041 FUNCT@5.0V:ATOM29 2041 FUNCT@5.0V:ATOM30 2041 FUNCT@5.0V:ATOM31A 1675 FUNCT@5.0V:ATOM31B 1864 FUNCT@5.0V:ATOM32 1675 FUNCT@5.0V:ATOM33 2041 FUNCT@5.0V:ATOM35 2175 FUNCT@5.0V:ATOM36 1931 FUNCT@5.0V:ATOM39 1952 FUNCT@5.0V:ATOM41 2478 FUNCT@5.0V:ATOM41A 2478 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4277 FUNCT@5.0V:ATOM45C_40 4277 FUNCT@5.0V:ATOM46C_40 4277 FUNCT@5.0V:ATOM47C_40 4277 FUNCT@5.0V:ATOM48C_40 4277 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4277 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:807 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5147 b(slope) = 0.0083 chi2 = 2.3643 CAL_IN P-side : a = 2.5146 b(slope) = 0.0083 chi2 = 1.1607 VTN N-side : a = 0.0097 b(slope) = 0.0108 chi2 = 1.6040 VTN P-side : a = 0.0098 b(slope) = 0.0066 chi2 = 0.5878 VTP N-side = 0.7032 VTP p-side = 0.4347 CHI2 TEST = 1 CAL_BASE = 2.5183 V CAL_VREF = 3.0515 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1155 FUNCT@5.0V:ATOM13B 1227 FUNCT@5.0V:ATOM13C 1227 FUNCT@5.0V:ATOM15 1199 FUNCT@5.0V:ATOM17 3511 FUNCT@5.0V:ATOM18 3527 FUNCT@5.0V:ATOM18HF 3527 FUNCT@5.0V:ATOM19 4547 FUNCT@5.0V:ATOM19E 2704 FUNCT@5.0V:ATOM19F 6577 FUNCT@5.0V:ATOM19FHF 6577 FUNCT@5.0V:ATOM20 1170 FUNCT@5.0V:ATOM21 1146 FUNCT@5.0V:ATOM22 1134 FUNCT@5.0V:ATOM25 1152 FUNCT@5.0V:ATOM25HF 1152 FUNCT@5.0V:ATOM26A 1131 FUNCT@5.0V:ATOM26B 1940 FUNCT@5.0V:ATOM28 1268 FUNCT@5.0V:ATOM29 1268 FUNCT@5.0V:ATOM30 1270 FUNCT@5.0V:ATOM31A 902 FUNCT@5.0V:ATOM31B 1091 FUNCT@5.0V:ATOM32 904 FUNCT@5.0V:ATOM35 1402 FUNCT@5.0V:ATOM36 1159 FUNCT@5.0V:ATOM39 1181 FUNCT@5.0V:ATOM41 1706 FUNCT@5.0V:ATOM41A 1706 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:907 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4915 b(slope) = 0.0085 chi2 = 2.7220 CAL_IN P-side : a = 2.4926 b(slope) = 0.0086 chi2 = 2.8901 VTN N-side : a = 0.0102 b(slope) = 0.0109 chi2 = 0.5567 VTN P-side : a = 0.0102 b(slope) = 0.0067 chi2 = 0.6502 VTP N-side = 0.7056 VTP p-side = 0.4391 CHI2 TEST = 1 CAL_BASE = 2.4936 V CAL_VREF = 3.0403 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5583 FUNCT@5.0V:ATOM45C_40 4343 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 5501 FUNCT@5.0V:ATOM48C_40 5583 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5583 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:908 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5058 b(slope) = 0.0086 chi2 = 3.5324 CAL_IN P-side : a = 2.5081 b(slope) = 0.0086 chi2 = 1.8518 VTN N-side : a = 0.0106 b(slope) = 0.0111 chi2 = 0.6603 VTN P-side : a = 0.0107 b(slope) = 0.0068 chi2 = 0.6743 VTP N-side = 0.7213 VTP p-side = 0.4465 CHI2 TEST = 1 CAL_BASE = 2.5059 V CAL_VREF = 3.0501 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:808 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5091 b(slope) = 0.0085 chi2 = 2.1519 CAL_IN P-side : a = 2.5095 b(slope) = 0.0085 chi2 = 1.1978 VTN N-side : a = 0.0101 b(slope) = 0.0110 chi2 = 1.2530 VTN P-side : a = 0.0104 b(slope) = 0.0067 chi2 = 0.2533 VTP N-side = 0.7130 VTP p-side = 0.4422 CHI2 TEST = 1 CAL_BASE = 2.5120 V CAL_VREF = 3.0540 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:708 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5002 b(slope) = 0.0086 chi2 = 1.6861 CAL_IN P-side : a = 2.5003 b(slope) = 0.0086 chi2 = 1.9294 VTN N-side : a = 0.0105 b(slope) = 0.0108 chi2 = 0.5744 VTN P-side : a = 0.0106 b(slope) = 0.0066 chi2 = 0.4390 VTP N-side = 0.7031 VTP p-side = 0.4329 CHI2 TEST = 1 CAL_BASE = 2.5020 V CAL_VREF = 3.0513 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:608 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5105 b(slope) = 0.0087 chi2 = 3.3255 CAL_IN P-side : a = 2.5132 b(slope) = 0.0087 chi2 = 1.4017 VTN N-side : a = 0.0118 b(slope) = 0.0106 chi2 = 0.6076 VTN P-side : a = 0.0120 b(slope) = 0.0065 chi2 = 0.4639 VTP N-side = 0.6922 VTP p-side = 0.4287 CHI2 TEST = 1 CAL_BASE = 2.5110 V CAL_VREF = 3.0591 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1651 FUNCT@5.0V:ATOM13B 1615 FUNCT@5.0V:ATOM13C 1615 FUNCT@5.0V:ATOM15 1695 FUNCT@5.0V:ATOM17 4007 FUNCT@5.0V:ATOM18 4023 FUNCT@5.0V:ATOM18HF 4023 FUNCT@5.0V:ATOM19 5043 FUNCT@5.0V:ATOM19E 3200 FUNCT@5.0V:ATOM19F 7073 FUNCT@5.0V:ATOM19FHF 7073 FUNCT@5.0V:ATOM20 1666 FUNCT@5.0V:ATOM21 1642 FUNCT@5.0V:ATOM22 1630 FUNCT@5.0V:ATOM25 1648 FUNCT@5.0V:ATOM25HF 1648 FUNCT@5.0V:ATOM26A 1627 FUNCT@5.0V:ATOM26B 2436 FUNCT@5.0V:ATOM28 1764 FUNCT@5.0V:ATOM29 1764 FUNCT@5.0V:ATOM30 1766 FUNCT@5.0V:ATOM31A 1398 FUNCT@5.0V:ATOM31B 1587 FUNCT@5.0V:ATOM32 1400 FUNCT@5.0V:ATOM35 1898 FUNCT@5.0V:ATOM36 1655 FUNCT@5.0V:ATOM39 1677 FUNCT@5.0V:ATOM41 2202 FUNCT@5.0V:ATOM41A 2202 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5131 FUNCT@5.0V:ATOM45C_40 4631 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 4890 FUNCT@5.0V:ATOM48C_40 5131 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5131 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:508 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDOP1:DVDD 1.0073E-01 DACs TEST = 100 CAL_IN N-side : a = 2.5544 b(slope) = 0.0083 chi2 = 12.3583 CAL_IN P-side : a = 2.5585 b(slope) = 0.0083 chi2 = 5.2221 VTN N-side : a = 0.0130 b(slope) = 0.0107 chi2 = 0.5631 VTN P-side : a = 0.0128 b(slope) = 0.0066 chi2 = 0.1860 VTP N-side = 0.7017 VTP p-side = 0.4336 CHI2 TEST = 100 CAL_BASE = 2.5569 V CAL_VREF = 3.0796 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM10TO12 544 FUNCT@5.0V:ATOM13A 1063 FUNCT@5.0V:ATOM13B 1119 FUNCT@5.0V:ATOM13C 1119 FUNCT@5.0V:ATOM15 1107 FUNCT@5.0V:ATOM17 3419 FUNCT@5.0V:ATOM18 3435 FUNCT@5.0V:ATOM18HF 3435 FUNCT@5.0V:ATOM19 3371 FUNCT@5.0V:ATOM19D 3386 FUNCT@5.0V:ATOM19E 2613 FUNCT@5.0V:ATOM19F 6486 FUNCT@5.0V:ATOM19FHF 6486 FUNCT@5.0V:ATOM20 1079 FUNCT@5.0V:ATOM21 1055 FUNCT@5.0V:ATOM22 1043 FUNCT@5.0V:ATOM23 974 FUNCT@5.0V:ATOM24 1074 FUNCT@5.0V:ATOM25 1061 FUNCT@5.0V:ATOM25HF 1061 FUNCT@5.0V:ATOM26A 1040 FUNCT@5.0V:ATOM26B 1849 FUNCT@5.0V:ATOM28 1177 FUNCT@5.0V:ATOM29 1177 FUNCT@5.0V:ATOM30 1177 FUNCT@5.0V:ATOM31A 811 FUNCT@5.0V:ATOM31B 1000 FUNCT@5.0V:ATOM32 811 FUNCT@5.0V:ATOM33 1177 FUNCT@5.0V:ATOM35 1311 FUNCT@5.0V:ATOM36 1067 FUNCT@5.0V:ATOM39 1088 FUNCT@5.0V:ATOM41 1614 FUNCT@5.0V:ATOM41A 1614 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3668 FUNCT@5.0V:ATOM45C_40 3668 FUNCT@5.0V:ATOM46C_40 3670 FUNCT@5.0V:ATOM47C_40 3668 FUNCT@5.0V:ATOM48C_40 3668 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3668 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A10TO12HF 544 CH.MASK TEST = 0 error detected at location:1243 NOISE TEST = 0 error detected at location:1401 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A10_12_50D 9.0000E-08 TMIN@4.8V:A10_12_60D 9.0000E-08 TMIN@5.0V:A10_12_50D 9.0000E-08 TMIN@5.0V:A10_12_60D 9.0000E-08 TMIN@5.2V:A10_12_50D 9.0000E-08 TMIN@5.2V:A10_12_60D 9.0000E-08 ---------- CHIP ID:408 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4901 b(slope) = 0.0086 chi2 = 0.9769 CAL_IN P-side : a = 2.4905 b(slope) = 0.0086 chi2 = 1.4560 VTN N-side : a = 0.0106 b(slope) = 0.0107 chi2 = 0.5217 VTN P-side : a = 0.0104 b(slope) = 0.0065 chi2 = 0.4917 VTP N-side = 0.6945 VTP p-side = 0.4279 CHI2 TEST = 1 CAL_BASE = 2.4927 V CAL_VREF = 3.0432 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM18 10831 FUNCT@5.0V:ATOM18HF 10831 FUNCT@5.0V:ATOM35 1324 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3681 FUNCT@5.0V:ATOM45C_40 3681 FUNCT@5.0V:ATOM46C_40 3681 FUNCT@5.0V:ATOM47C_40 3681 FUNCT@5.0V:ATOM48C_40 3681 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3681 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1243 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:308 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4717 b(slope) = 0.0088 chi2 = 0.6857 CAL_IN P-side : a = 2.4720 b(slope) = 0.0088 chi2 = 0.7345 VTN N-side : a = 0.0113 b(slope) = 0.0107 chi2 = 1.5309 VTN P-side : a = 0.0113 b(slope) = 0.0065 chi2 = 0.5856 VTP N-side = 0.6995 VTP p-side = 0.4313 CHI2 TEST = 1 CAL_BASE = 2.4758 V CAL_VREF = 3.0369 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:208 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4912 b(slope) = 0.0085 chi2 = 0.7117 CAL_IN P-side : a = 2.4911 b(slope) = 0.0085 chi2 = 0.7617 VTN N-side : a = 0.0114 b(slope) = 0.0105 chi2 = 1.0376 VTN P-side : a = 0.0111 b(slope) = 0.0064 chi2 = 0.7298 VTP N-side = 0.6858 VTP p-side = 0.4243 CHI2 TEST = 1 CAL_BASE = 2.4915 V CAL_VREF = 3.0361 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:108 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4905 b(slope) = 0.0084 chi2 = 2.3052 CAL_IN P-side : a = 2.4909 b(slope) = 0.0084 chi2 = 2.0839 VTN N-side : a = 0.0116 b(slope) = 0.0104 chi2 = 1.2180 VTN P-side : a = 0.0115 b(slope) = 0.0063 chi2 = 0.8632 VTP N-side = 0.6783 VTP p-side = 0.4176 CHI2 TEST = 1 CAL_BASE = 2.4946 V CAL_VREF = 3.0295 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:209 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4936 b(slope) = 0.0083 chi2 = 1.5253 CAL_IN P-side : a = 2.4936 b(slope) = 0.0083 chi2 = 0.6352 VTN N-side : a = 0.0103 b(slope) = 0.0103 chi2 = 0.5502 VTN P-side : a = 0.0104 b(slope) = 0.0063 chi2 = 0.1458 VTP N-side = 0.6699 VTP p-side = 0.4116 CHI2 TEST = 1 CAL_BASE = 2.4963 V CAL_VREF = 3.0300 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:309 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4657 b(slope) = 0.0087 chi2 = 0.9207 CAL_IN P-side : a = 2.4657 b(slope) = 0.0087 chi2 = 0.6786 VTN N-side : a = 0.0117 b(slope) = 0.0105 chi2 = 0.7869 VTN P-side : a = 0.0118 b(slope) = 0.0064 chi2 = 1.2790 VTP N-side = 0.6823 VTP p-side = 0.4222 CHI2 TEST = 1 CAL_BASE = 2.4697 V CAL_VREF = 3.0252 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:409 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5193 b(slope) = 0.0084 chi2 = 1.6804 CAL_IN P-side : a = 2.5201 b(slope) = 0.0083 chi2 = 1.2015 VTN N-side : a = 0.0118 b(slope) = 0.0108 chi2 = 1.1925 VTN P-side : a = 0.0113 b(slope) = 0.0066 chi2 = 0.4063 VTP N-side = 0.7041 VTP p-side = 0.4342 CHI2 TEST = 1 CAL_BASE = 2.5227 V CAL_VREF = 3.0579 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM18 9727 FUNCT@5.0V:ATOM18HF 9727 FUNCT@5.0V:ATOM28 1189 FUNCT@5.0V:ATOM29 1189 FUNCT@5.0V:ATOM30 1188 FUNCT@5.0V:ATOM31A 822 FUNCT@5.0V:ATOM32 823 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:509 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5231 b(slope) = 0.0084 chi2 = 0.6844 CAL_IN P-side : a = 2.5232 b(slope) = 0.0084 chi2 = 0.7101 VTN N-side : a = 0.0124 b(slope) = 0.0107 chi2 = 1.3584 VTN P-side : a = 0.0122 b(slope) = 0.0066 chi2 = 0.6741 VTP N-side = 0.7004 VTP p-side = 0.4332 CHI2 TEST = 1 CAL_BASE = 2.5261 V CAL_VREF = 3.0659 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:609 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5101 b(slope) = 0.0085 chi2 = 1.1434 CAL_IN P-side : a = 2.5102 b(slope) = 0.0085 chi2 = 0.5058 VTN N-side : a = 0.0128 b(slope) = 0.0107 chi2 = 1.1241 VTN P-side : a = 0.0125 b(slope) = 0.0066 chi2 = 0.7944 VTP N-side = 0.7003 VTP p-side = 0.4328 CHI2 TEST = 1 CAL_BASE = 2.5134 V CAL_VREF = 3.0559 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13B 1998 FUNCT@5.0V:ATOM13C 1998 FUNCT@5.0V:ATOM18 10592 FUNCT@5.0V:ATOM18HF 10592 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:709 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4756 b(slope) = 0.0087 chi2 = 1.9339 CAL_IN P-side : a = 2.4758 b(slope) = 0.0087 chi2 = 2.8827 VTN N-side : a = 0.0118 b(slope) = 0.0108 chi2 = 0.8500 VTN P-side : a = 0.0113 b(slope) = 0.0066 chi2 = 0.5485 VTP N-side = 0.7024 VTP p-side = 0.4340 CHI2 TEST = 1 CAL_BASE = 2.4815 V CAL_VREF = 3.0373 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:809 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5065 b(slope) = 0.0083 chi2 = 2.1733 CAL_IN P-side : a = 2.5068 b(slope) = 0.0083 chi2 = 1.5806 VTN N-side : a = 0.0122 b(slope) = 0.0108 chi2 = 0.5836 VTN P-side : a = 0.0118 b(slope) = 0.0067 chi2 = 0.3093 VTP N-side = 0.7070 VTP p-side = 0.4427 CHI2 TEST = 1 CAL_BASE = 2.5112 V CAL_VREF = 3.0435 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1215 FUNCT@5.0V:ATOM13B 1278 FUNCT@5.0V:ATOM13C 1278 FUNCT@5.0V:ATOM15 1259 FUNCT@5.0V:ATOM17 3571 FUNCT@5.0V:ATOM18 3586 FUNCT@5.0V:ATOM18HF 3586 FUNCT@5.0V:ATOM19 3523 FUNCT@5.0V:ATOM19D 3538 FUNCT@5.0V:ATOM19E 2765 FUNCT@5.0V:ATOM19F 6638 FUNCT@5.0V:ATOM19FHF 6638 FUNCT@5.0V:ATOM20 1230 FUNCT@5.0V:ATOM21 1208 FUNCT@5.0V:ATOM22 1196 FUNCT@5.0V:ATOM23 974 FUNCT@5.0V:ATOM24 1074 FUNCT@5.0V:ATOM25 1213 FUNCT@5.0V:ATOM25HF 1213 FUNCT@5.0V:ATOM26A 1191 FUNCT@5.0V:ATOM26B 2001 FUNCT@5.0V:ATOM28 1328 FUNCT@5.0V:ATOM29 1328 FUNCT@5.0V:ATOM30 1328 FUNCT@5.0V:ATOM31A 962 FUNCT@5.0V:ATOM31B 1152 FUNCT@5.0V:ATOM32 962 FUNCT@5.0V:ATOM33 1328 FUNCT@5.0V:ATOM35 1462 FUNCT@5.0V:ATOM36 1218 FUNCT@5.0V:ATOM39 1240 FUNCT@5.0V:ATOM41 1766 FUNCT@5.0V:ATOM41A 1766 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3745 FUNCT@5.0V:ATOM45C_40 3745 FUNCT@5.0V:ATOM46C_40 3665 FUNCT@5.0V:ATOM47C_40 3665 FUNCT@5.0V:ATOM48C_40 3745 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3745 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1243 NOISE TEST = 0 error detected at location:1401 TMIN TEST = 1 ---------- CHIP ID:810 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5363 b(slope) = 0.0081 chi2 = 0.9261 CAL_IN P-side : a = 2.5363 b(slope) = 0.0081 chi2 = 0.7140 VTN N-side : a = 0.0113 b(slope) = 0.0109 chi2 = 0.5754 VTN P-side : a = 0.0111 b(slope) = 0.0068 chi2 = 1.0577 VTP N-side = 0.7108 VTP p-side = 0.4454 CHI2 TEST = 1 CAL_BASE = 2.5396 V CAL_VREF = 3.0598 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:710 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5203 b(slope) = 0.0084 chi2 = 0.7688 CAL_IN P-side : a = 2.5204 b(slope) = 0.0084 chi2 = 0.4172 VTN N-side : a = 0.0120 b(slope) = 0.0109 chi2 = 0.9268 VTN P-side : a = 0.0119 b(slope) = 0.0067 chi2 = 0.5917 VTP N-side = 0.7090 VTP p-side = 0.4425 CHI2 TEST = 1 CAL_BASE = 2.5249 V CAL_VREF = 3.0630 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:610 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4949 b(slope) = 0.0087 chi2 = 2.0934 CAL_IN P-side : a = 2.4976 b(slope) = 0.0088 chi2 = 1.6725 VTN N-side : a = 0.0109 b(slope) = 0.0109 chi2 = 0.9313 VTN P-side : a = 0.0112 b(slope) = 0.0067 chi2 = 0.5302 VTP N-side = 0.7100 VTP p-side = 0.4425 CHI2 TEST = 1 CAL_BASE = 2.4961 V CAL_VREF = 3.0527 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:510 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5110 b(slope) = 0.0086 chi2 = 0.7075 CAL_IN P-side : a = 2.5114 b(slope) = 0.0086 chi2 = 0.8604 VTN N-side : a = 0.0116 b(slope) = 0.0108 chi2 = 0.6632 VTN P-side : a = 0.0115 b(slope) = 0.0066 chi2 = 0.6400 VTP N-side = 0.7054 VTP p-side = 0.4374 CHI2 TEST = 1 CAL_BASE = 2.5137 V CAL_VREF = 3.0669 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:410 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5196 b(slope) = 0.0084 chi2 = 0.8979 CAL_IN P-side : a = 2.5194 b(slope) = 0.0083 chi2 = 1.0039 VTN N-side : a = 0.0129 b(slope) = 0.0108 chi2 = 1.4253 VTN P-side : a = 0.0126 b(slope) = 0.0066 chi2 = 0.5387 VTP N-side = 0.7023 VTP p-side = 0.4351 CHI2 TEST = 1 CAL_BASE = 2.5210 V CAL_VREF = 3.0554 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:310 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4960 b(slope) = 0.0084 chi2 = 0.5213 CAL_IN P-side : a = 2.4961 b(slope) = 0.0084 chi2 = 0.7199 VTN N-side : a = 0.0112 b(slope) = 0.0106 chi2 = 0.7256 VTN P-side : a = 0.0113 b(slope) = 0.0065 chi2 = 0.4100 VTP N-side = 0.6919 VTP p-side = 0.4261 CHI2 TEST = 1 CAL_BASE = 2.4976 V CAL_VREF = 3.0396 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:210 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5194 b(slope) = 0.0082 chi2 = 1.8242 CAL_IN P-side : a = 2.5193 b(slope) = 0.0082 chi2 = 2.3250 VTN N-side : a = 0.0108 b(slope) = 0.0106 chi2 = 0.7762 VTN P-side : a = 0.0108 b(slope) = 0.0064 chi2 = 0.4359 VTP N-side = 0.6898 VTP p-side = 0.4242 CHI2 TEST = 1 CAL_BASE = 2.5227 V CAL_VREF = 3.0486 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:211 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5095 b(slope) = 0.0082 chi2 = 1.2495 CAL_IN P-side : a = 2.5098 b(slope) = 0.0081 chi2 = 2.4050 VTN N-side : a = 0.0120 b(slope) = 0.0103 chi2 = 0.6888 VTN P-side : a = 0.0119 b(slope) = 0.0063 chi2 = 1.2340 VTP N-side = 0.6737 VTP p-side = 0.4157 CHI2 TEST = 1 CAL_BASE = 2.5137 V CAL_VREF = 3.0349 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:311 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4732 b(slope) = 0.0086 chi2 = 0.5815 CAL_IN P-side : a = 2.4734 b(slope) = 0.0086 chi2 = 0.4395 VTN N-side : a = 0.0118 b(slope) = 0.0105 chi2 = 1.6832 VTN P-side : a = 0.0114 b(slope) = 0.0064 chi2 = 1.8093 VTP N-side = 0.6823 VTP p-side = 0.4200 CHI2 TEST = 1 CAL_BASE = 2.4783 V CAL_VREF = 3.0271 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:411 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5198 b(slope) = 0.0083 chi2 = 0.7251 CAL_IN P-side : a = 2.5198 b(slope) = 0.0083 chi2 = 1.5972 VTN N-side : a = 0.0123 b(slope) = 0.0106 chi2 = 0.6196 VTN P-side : a = 0.0121 b(slope) = 0.0064 chi2 = 0.3807 VTP N-side = 0.6916 VTP p-side = 0.4257 CHI2 TEST = 1 CAL_BASE = 2.5220 V CAL_VREF = 3.0535 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:511 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.7556 b(slope) = 0.0076 chi2 = 99.0000 CAL_IN P-side : a = 2.5874 b(slope) = 0.0094 chi2 = 99.0000 VTN N-side : a = 0.0123 b(slope) = 0.0106 chi2 = 1.0257 VTN P-side : a = 0.0121 b(slope) = 0.0065 chi2 = 0.4386 VTP N-side = 0.6912 VTP p-side = 0.4261 CHI2 TEST = 0 CAL_BASE = 2.4849 V CAL_VREF = 3.0366 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM17 5536 FUNCT@5.0V:ATOM18 5552 FUNCT@5.0V:ATOM19 5488 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM25 3242 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM36 4017 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:611 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5020 b(slope) = 0.0083 chi2 = 0.4984 CAL_IN P-side : a = 2.5019 b(slope) = 0.0083 chi2 = 1.0143 VTN N-side : a = 0.0118 b(slope) = 0.0108 chi2 = 1.3319 VTN P-side : a = 0.0120 b(slope) = 0.0066 chi2 = 0.5605 VTP N-side = 0.7041 VTP p-side = 0.4377 CHI2 TEST = 1 CAL_BASE = 2.5093 V CAL_VREF = 3.0442 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:711 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4914 b(slope) = 0.0085 chi2 = 1.6273 CAL_IN P-side : a = 2.4916 b(slope) = 0.0085 chi2 = 1.1365 VTN N-side : a = 0.0109 b(slope) = 0.0108 chi2 = 1.1954 VTN P-side : a = 0.0110 b(slope) = 0.0067 chi2 = 0.6675 VTP N-side = 0.7037 VTP p-side = 0.4397 CHI2 TEST = 1 CAL_BASE = 2.4971 V CAL_VREF = 3.0415 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2090 FUNCT@5.0V:ATOM13C 2090 FUNCT@5.0V:ATOM15 2066 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM18HF 5478 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2038 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1077 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 1999 FUNCT@5.0V:ATOM26B 2808 FUNCT@5.0V:ATOM28 2136 FUNCT@5.0V:ATOM29 2136 FUNCT@5.0V:ATOM30 2136 FUNCT@5.0V:ATOM31A 1770 FUNCT@5.0V:ATOM31B 1959 FUNCT@5.0V:ATOM32 1770 FUNCT@5.0V:ATOM33 2136 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2573 FUNCT@5.0V:ATOM41A 2573 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:811 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5007 b(slope) = 0.0084 chi2 = 3.7452 CAL_IN P-side : a = 2.5026 b(slope) = 0.0084 chi2 = 2.6304 VTN N-side : a = 0.0124 b(slope) = 0.0109 chi2 = 1.8262 VTN P-side : a = 0.0121 b(slope) = 0.0068 chi2 = 1.4522 VTP N-side = 0.7113 VTP p-side = 0.4454 CHI2 TEST = 1 CAL_BASE = 2.5046 V CAL_VREF = 3.0422 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:812 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5137 b(slope) = 0.0082 chi2 = 1.7264 CAL_IN P-side : a = 2.5142 b(slope) = 0.0082 chi2 = 1.4731 VTN N-side : a = 0.0115 b(slope) = 0.0108 chi2 = 0.8782 VTN P-side : a = 0.0114 b(slope) = 0.0067 chi2 = 0.6040 VTP N-side = 0.7053 VTP p-side = 0.4382 CHI2 TEST = 1 CAL_BASE = 2.5137 V CAL_VREF = 3.0405 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:712 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4953 b(slope) = 0.0084 chi2 = 2.2252 CAL_IN P-side : a = 2.4954 b(slope) = 0.0084 chi2 = 1.2174 VTN N-side : a = 0.0121 b(slope) = 0.0109 chi2 = 1.1703 VTN P-side : a = 0.0118 b(slope) = 0.0067 chi2 = 0.7531 VTP N-side = 0.7086 VTP p-side = 0.4391 CHI2 TEST = 1 CAL_BASE = 2.4985 V CAL_VREF = 3.0376 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:612 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5047 b(slope) = 0.0084 chi2 = 0.4113 CAL_IN P-side : a = 2.5046 b(slope) = 0.0084 chi2 = 0.7126 VTN N-side : a = 0.0121 b(slope) = 0.0108 chi2 = 2.1625 VTN P-side : a = 0.0121 b(slope) = 0.0066 chi2 = 0.6984 VTP N-side = 0.7043 VTP p-side = 0.4372 CHI2 TEST = 1 CAL_BASE = 2.5078 V CAL_VREF = 3.0483 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:512 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.4864 b(slope) = 0.0095 chi2 = 99.0000 CAL_IN P-side : a = 2.4987 b(slope) = 0.0095 chi2 = 99.0000 VTN N-side : a = 0.0125 b(slope) = 0.0109 chi2 = 1.2838 VTN P-side : a = 0.0121 b(slope) = 0.0067 chi2 = 0.9480 VTP N-side = 0.7107 VTP p-side = 0.4407 CHI2 TEST = 0 CAL_BASE = 2.5037 V CAL_VREF = 3.0444 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:412 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5115 b(slope) = 0.0083 chi2 = 1.0052 CAL_IN P-side : a = 2.5117 b(slope) = 0.0082 chi2 = 0.7842 VTN N-side : a = 0.0117 b(slope) = 0.0107 chi2 = 1.2497 VTN P-side : a = 0.0120 b(slope) = 0.0066 chi2 = 1.0194 VTP N-side = 0.6984 VTP p-side = 0.4331 CHI2 TEST = 1 CAL_BASE = 2.5144 V CAL_VREF = 3.0437 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:312 ------------------ CLASS = B && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 100 CAL_IN N-side : a = 2.5129 b(slope) = 0.0083 chi2 = 0.9922 CAL_IN P-side : a = 2.5142 b(slope) = 0.0083 chi2 = 13.1279 VTN N-side : a = 0.0134 b(slope) = 0.0106 chi2 = 1.0496 VTN P-side : a = 0.0132 b(slope) = 0.0065 chi2 = 0.3916 VTP N-side = 0.6955 VTP p-side = 0.4294 CHI2 TEST = 100 CAL_BASE = 2.5183 V CAL_VREF = 3.0481 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:212 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDOP1:DVDD 1.1014E-01 DACs TEST = 1 CAL_IN N-side : a = 2.5046 b(slope) = 0.0083 chi2 = 0.4571 CAL_IN P-side : a = 2.5045 b(slope) = 0.0083 chi2 = 0.4929 VTN N-side : a = 0.0130 b(slope) = 0.0105 chi2 = 0.8940 VTN P-side : a = 0.0128 b(slope) = 0.0064 chi2 = 0.6485 VTP N-side = 0.6857 VTP p-side = 0.4249 CHI2 TEST = 1 CAL_BASE = 2.5071 V CAL_VREF = 3.0408 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1607 FUNCT@5.0V:ATOM15 1651 FUNCT@5.0V:ATOM17 3963 FUNCT@5.0V:ATOM18 3979 FUNCT@5.0V:ATOM18HF 3979 FUNCT@5.0V:ATOM19 3915 FUNCT@5.0V:ATOM19D 3930 FUNCT@5.0V:ATOM19E 3157 FUNCT@5.0V:ATOM19F 7030 FUNCT@5.0V:ATOM19FHF 7030 FUNCT@5.0V:ATOM20 1623 FUNCT@5.0V:ATOM21 1599 FUNCT@5.0V:ATOM22 1587 FUNCT@5.0V:ATOM25 1605 FUNCT@5.0V:ATOM25HF 1605 FUNCT@5.0V:ATOM26A 1584 FUNCT@5.0V:ATOM26B 2393 FUNCT@5.0V:ATOM28 1721 FUNCT@5.0V:ATOM29 1721 FUNCT@5.0V:ATOM30 1721 FUNCT@5.0V:ATOM31A 1355 FUNCT@5.0V:ATOM31B 1544 FUNCT@5.0V:ATOM32 1355 FUNCT@5.0V:ATOM33 1721 FUNCT@5.0V:ATOM35 1422 FUNCT@5.0V:ATOM36 1611 FUNCT@5.0V:ATOM39 1632 FUNCT@5.0V:ATOM41 2158 FUNCT@5.0V:ATOM41A 2158 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4551 FUNCT@5.0V:ATOM45C_40 3683 FUNCT@5.0V:ATOM46C_40 4503 FUNCT@5.0V:ATOM47C_40 4551 FUNCT@5.0V:ATOM48C_40 4551 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4551 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:413 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5014 b(slope) = 0.0083 chi2 = 1.3551 CAL_IN P-side : a = 2.5016 b(slope) = 0.0083 chi2 = 0.8545 VTN N-side : a = 0.0125 b(slope) = 0.0105 chi2 = 0.7843 VTN P-side : a = 0.0123 b(slope) = 0.0064 chi2 = 0.7199 VTP N-side = 0.6861 VTP p-side = 0.4218 CHI2 TEST = 1 CAL_BASE = 2.5017 V CAL_VREF = 3.0327 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM18 11833 FUNCT@5.0V:ATOM19F 8603 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5386 FUNCT@5.0V:ATOM45C_40 5386 FUNCT@5.0V:ATOM46C_40 4583 FUNCT@5.0V:ATOM47C_40 3667 FUNCT@5.0V:ATOM48C_40 5386 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5386 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:513 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4914 b(slope) = 0.0084 chi2 = 0.9420 CAL_IN P-side : a = 2.4917 b(slope) = 0.0084 chi2 = 1.3388 VTN N-side : a = 0.0121 b(slope) = 0.0106 chi2 = 0.5429 VTN P-side : a = 0.0122 b(slope) = 0.0065 chi2 = 0.3245 VTP N-side = 0.6929 VTP p-side = 0.4268 CHI2 TEST = 1 CAL_BASE = 2.4939 V CAL_VREF = 3.0332 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:613 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4889 b(slope) = 0.0084 chi2 = 0.8095 CAL_IN P-side : a = 2.4892 b(slope) = 0.0084 chi2 = 0.6280 VTN N-side : a = 0.0163 b(slope) = 0.0107 chi2 = 0.5526 VTN P-side : a = 0.0161 b(slope) = 0.0066 chi2 = 0.3466 VTP N-side = 0.6999 VTP p-side = 0.4365 CHI2 TEST = 1 CAL_BASE = 2.4895 V CAL_VREF = 3.0281 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 228 FUNCT@5.0V:ATOM1TO6B 228 FUNCT@5.0V:ATOM1TO6C 228 FUNCT@5.0V:ATOM1TO6D 228 FUNCT@5.0V:ATOM1TO6E 228 FUNCT@5.0V:ATOM7TO9A 272 FUNCT@5.0V:ATOM7TO9B 272 FUNCT@5.0V:ATOM7TO9C 272 FUNCT@5.0V:ATOM7TO9D 272 FUNCT@5.0V:ATOM7TO9E 272 FUNCT@5.0V:ATOM10TO12 496 FUNCT@5.0V:ATOM13A 1046 FUNCT@5.0V:ATOM13B 1102 FUNCT@5.0V:ATOM13C 1102 FUNCT@5.0V:ATOM15 1090 FUNCT@5.0V:ATOM17 3402 FUNCT@5.0V:ATOM18 3418 FUNCT@5.0V:ATOM18HF 3418 FUNCT@5.0V:ATOM19 3354 FUNCT@5.0V:ATOM19D 3369 FUNCT@5.0V:ATOM19E 2596 FUNCT@5.0V:ATOM19F 6469 FUNCT@5.0V:ATOM19FHF 6469 FUNCT@5.0V:ATOM20 1062 FUNCT@5.0V:ATOM21 1038 FUNCT@5.0V:ATOM22 1026 FUNCT@5.0V:ATOM23 958 FUNCT@5.0V:ATOM24 1058 FUNCT@5.0V:ATOM25 1044 FUNCT@5.0V:ATOM25HF 1044 FUNCT@5.0V:ATOM26A 1023 FUNCT@5.0V:ATOM26B 1832 FUNCT@5.0V:ATOM28 1160 FUNCT@5.0V:ATOM29 1160 FUNCT@5.0V:ATOM30 1160 FUNCT@5.0V:ATOM31A 794 FUNCT@5.0V:ATOM31B 983 FUNCT@5.0V:ATOM32 794 FUNCT@5.0V:ATOM33 1160 FUNCT@5.0V:ATOM34 268 FUNCT@5.0V:ATOM35 1294 FUNCT@5.0V:ATOM36 1050 FUNCT@5.0V:ATOM39 1071 FUNCT@5.0V:ATOM41 1597 FUNCT@5.0V:ATOM41A 1597 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3649 FUNCT@5.0V:ATOM45C_40 3649 FUNCT@5.0V:ATOM46C_40 3649 FUNCT@5.0V:ATOM47C_40 3649 FUNCT@5.0V:ATOM48C_40 3649 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3649 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 272 FUNCT@5.0V:A10TO12HF 496 FUNCT@5.0V:ADAC37HF 272 CH.MASK TEST = 0 error detected at location:1227 NOISE TEST = 0 error detected at location:1385 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D 9.0000E-08 TMIN@4.8V:A7_9_60D 9.0000E-08 TMIN@4.8V:A10_12_50D 9.0000E-08 TMIN@4.8V:A10_12_60D 9.0000E-08 TMIN@4.8V:ADAC37_50D 9.0000E-08 TMIN@4.8V:ADAC37_60D 9.0000E-08 TMIN@5.0V:A7_9_50D 9.0000E-08 TMIN@5.0V:A7_9_60D 9.0000E-08 TMIN@5.0V:A10_12_50D 9.0000E-08 TMIN@5.0V:A10_12_60D 9.0000E-08 TMIN@5.0V:ADAC37_50D 9.0000E-08 TMIN@5.0V:ADAC37_60D 9.0000E-08 TMIN@5.2V:A7_9_50D 9.0000E-08 TMIN@5.2V:A7_9_60D 9.0000E-08 TMIN@5.2V:A10_12_50D 9.0000E-08 TMIN@5.2V:A10_12_60D 9.0000E-08 TMIN@5.2V:ADAC37_50D 9.0000E-08 TMIN@5.2V:ADAC37_60D 9.0000E-08 ---------- CHIP ID:614 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4927 b(slope) = 0.0084 chi2 = 1.3935 CAL_IN P-side : a = 2.4931 b(slope) = 0.0083 chi2 = 1.1994 VTN N-side : a = 0.0127 b(slope) = 0.0106 chi2 = 0.8792 VTN P-side : a = 0.0127 b(slope) = 0.0064 chi2 = 0.7705 VTP N-side = 0.6925 VTP p-side = 0.4262 CHI2 TEST = 1 CAL_BASE = 2.4949 V CAL_VREF = 3.0298 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:514 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4911 b(slope) = 0.0084 chi2 = 0.6227 CAL_IN P-side : a = 2.4911 b(slope) = 0.0084 chi2 = 0.6709 VTN N-side : a = 0.0124 b(slope) = 0.0106 chi2 = 1.1618 VTN P-side : a = 0.0123 b(slope) = 0.0065 chi2 = 0.8461 VTP N-side = 0.6923 VTP p-side = 0.4279 CHI2 TEST = 1 CAL_BASE = 2.4912 V CAL_VREF = 3.0305 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM18 10749 FUNCT@5.0V:ATOM19F 8603 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:414 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4832 b(slope) = 0.0084 chi2 = 1.8118 CAL_IN P-side : a = 2.4835 b(slope) = 0.0084 chi2 = 1.1808 VTN N-side : a = 0.0122 b(slope) = 0.0105 chi2 = 0.8535 VTN P-side : a = 0.0123 b(slope) = 0.0064 chi2 = 0.4386 VTP N-side = 0.6847 VTP p-side = 0.4203 CHI2 TEST = 1 CAL_BASE = 2.4897 V CAL_VREF = 3.0278 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 +++++++++ SUMMARY OF RESULTS ++++++++++++++++++++++++() ++++++++++++++++ A A< B B< C --------------------------------------------------------------- 0 0 0 0 401 0 0 0 0 501 601 0 0 0 0 602 0 0 0 0 0 0 0 0 502 402 0 0 0 0 203 0 0 0 0 0 0 0 0 303 403 0 0 0 0 0 0 0 0 503 603 0 0 0 0 703 0 0 0 0 0 0 0 0 803 804 0 0 0 0 704 0 0 0 0 604 0 0 0 0 504 0 0 0 0 404 0 0 0 0 0 0 0 0 304 204 0 0 0 0 205 0 0 0 0 0 0 0 0 305 405 0 0 0 0 505 0 0 0 0 605 0 0 0 0 705 0 0 0 0 805 0 0 0 0 0 0 0 0 806 706 0 0 0 0 606 0 0 0 0 506 0 0 0 0 0 0 0 0 406 0 0 0 0 306 0 0 0 0 206 107 0 0 0 0 0 0 0 0 207 307 0 0 0 0 407 0 0 0 0 0 0 0 0 507 0 0 607 0 0 0 0 0 0 707 0 0 0 0 807 0 0 0 0 907 908 0 0 0 0 808 0 0 0 0 708 0 0 0 0 0 0 0 0 608 0 0 0 0 508 0 0 0 0 408 308 0 0 0 0 208 0 0 0 0 108 0 0 0 0 209 0 0 0 0 309 0 0 0 0 0 0 0 0 409 0 509 0 0 0 0 0 0 0 609 709 0 0 0 0 0 0 0 0 809 810 0 0 0 0 710 0 0 0 0 610 0 0 0 0 0 510 0 0 0 410 0 0 0 0 310 0 0 0 0 210 0 0 0 0 211 0 0 0 0 311 0 0 0 0 411 0 0 0 0 0 0 0 0 511 0 611 0 0 0 0 0 0 0 711 811 0 0 0 0 812 0 0 0 0 712 0 0 0 0 0 612 0 0 0 0 0 0 0 512 412 0 0 0 0 0 0 312 0 0 0 0 0 0 212 0 0 0 0 413 0 513 0 0 0 0 0 0 0 613 614 0 0 0 0 0 514 0 0 0 414 0 0 0 0 ---------------------------------------------------------------- 49 29 6 2 0 NUMBER OF CHIPS TESTED = 86 NUMBER OF A CHIPS = 49 NUMBER OF A< CHIPS = 6 NUMBER OF B CHIPS = 2 NUMBER OF B< CHIPS = 0 NUMBER OF C CHIPS = 29 YIELD = 56.98 % (YIELD WITH LT CHIPS= 63.95 %)