******************************************************************** wafer #12 ******************************************************************** ---------- CHIP ID:401 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4361 b(slope) = 0.0089 chi2 = 1.4085 CAL_IN P-side : a = 2.4373 b(slope) = 0.0090 chi2 = 1.2494 VTN N-side : a = 0.0136 b(slope) = 0.0105 chi2 = 1.8842 VTN P-side : a = 0.0141 b(slope) = 0.0064 chi2 = 0.7256 VTP N-side = 0.6840 VTP p-side = 0.4217 CHI2 TEST = 1 CAL_BASE = 2.4421 V CAL_VREF = 3.0142 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1403 TMIN TEST = 1 ---------- CHIP ID:501 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDOP1:DVDD 1.4676E-01 DACs TEST = 0 CAL_IN N-side : a = 2.6442 b(slope) = 0.0098 chi2 = 99.0000 CAL_IN P-side : a = 2.5402 b(slope) = 0.0102 chi2 = 99.0000 VTN N-side : a = 0.0100 b(slope) = 0.0108 chi2 = 0.9973 VTN P-side : a = 0.0096 b(slope) = 0.0066 chi2 = 0.6746 VTP N-side = 0.7034 VTP p-side = 0.4323 CHI2 TEST = 0 CAL_BASE = 2.4802 V CAL_VREF = 3.0310 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:601 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.4962 b(slope) = 0.0084 chi2 = 99.0000 CAL_IN P-side : a = 2.4961 b(slope) = 0.0084 chi2 = 99.0000 VTN N-side : a = 0.0428 b(slope) = 0.0105 chi2 = 99.0000 VTN P-side : a = 0.0333 b(slope) = 0.0062 chi2 = 99.0000 VTP N-side = 0.6846 VTP p-side = 0.4201 CHI2 TEST = 0 CAL_BASE = 2.5017 V CAL_VREF = 3.0391 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13B 1416 FUNCT@5.0V:ATOM13C 1416 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:602 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5113 b(slope) = 0.0084 chi2 = 1.0082 CAL_IN P-side : a = 2.5120 b(slope) = 0.0084 chi2 = 3.7981 VTN N-side : a = 0.0083 b(slope) = 0.0106 chi2 = 1.2259 VTN P-side : a = 0.0086 b(slope) = 0.0064 chi2 = 0.7892 VTP N-side = 0.6881 VTP p-side = 0.4207 CHI2 TEST = 1 CAL_BASE = 2.5156 V CAL_VREF = 3.0518 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:502 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 3.0949 b(slope) = 0.0000 chi2 = 1.9180 CAL_IN P-side : a = 3.0950 b(slope) = 0.0000 chi2 = 2.5401 VTN N-side : a = 0.0085 b(slope) = 0.0107 chi2 = 1.2934 VTN P-side : a = 0.0087 b(slope) = 0.0065 chi2 = 0.5427 VTP N-side = 0.6922 VTP p-side = 0.4246 CHI2 TEST = 1 CAL_BASE = 2.4744 V CAL_VREF = 3.0334 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1671 FUNCT@5.0V:ATOM15 1715 FUNCT@5.0V:ATOM17 4027 FUNCT@5.0V:ATOM18 4043 FUNCT@5.0V:ATOM18HF 4043 FUNCT@5.0V:ATOM19 3979 FUNCT@5.0V:ATOM19D 3994 FUNCT@5.0V:ATOM19E 3221 FUNCT@5.0V:ATOM19F 7094 FUNCT@5.0V:ATOM19FHF 7094 FUNCT@5.0V:ATOM20 1687 FUNCT@5.0V:ATOM21 1663 FUNCT@5.0V:ATOM22 1651 FUNCT@5.0V:ATOM25 1669 FUNCT@5.0V:ATOM25HF 1669 FUNCT@5.0V:ATOM26A 1648 FUNCT@5.0V:ATOM26B 2457 FUNCT@5.0V:ATOM28 1785 FUNCT@5.0V:ATOM29 1785 FUNCT@5.0V:ATOM30 1785 FUNCT@5.0V:ATOM31A 1419 FUNCT@5.0V:ATOM31B 1608 FUNCT@5.0V:ATOM32 1419 FUNCT@5.0V:ATOM33 1785 FUNCT@5.0V:ATOM35 1919 FUNCT@5.0V:ATOM36 1675 FUNCT@5.0V:ATOM39 1696 FUNCT@5.0V:ATOM41 2222 FUNCT@5.0V:ATOM41A 2222 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3668 FUNCT@5.0V:ATOM45C_40 4311 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 3683 FUNCT@5.0V:ATOM48C_40 3683 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3683 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:402 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4779 b(slope) = 0.0087 chi2 = 1.1858 CAL_IN P-side : a = 2.4783 b(slope) = 0.0087 chi2 = 0.9111 VTN N-side : a = 0.0094 b(slope) = 0.0106 chi2 = 1.5004 VTN P-side : a = 0.0090 b(slope) = 0.0064 chi2 = 0.8743 VTP N-side = 0.6913 VTP p-side = 0.4223 CHI2 TEST = 1 CAL_BASE = 2.4792 V CAL_VREF = 3.0344 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:203 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4978 b(slope) = 0.0086 chi2 = 1.0293 CAL_IN P-side : a = 2.4977 b(slope) = 0.0086 chi2 = 0.5588 VTN N-side : a = 0.0095 b(slope) = 0.0107 chi2 = 1.1454 VTN P-side : a = 0.0090 b(slope) = 0.0065 chi2 = 0.4158 VTP N-side = 0.6937 VTP p-side = 0.4280 CHI2 TEST = 1 CAL_BASE = 2.5029 V CAL_VREF = 3.0566 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:303 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5418 b(slope) = 0.0082 chi2 = 1.3405 CAL_IN P-side : a = 2.5416 b(slope) = 0.0082 chi2 = 1.6453 VTN N-side : a = 0.0094 b(slope) = 0.0106 chi2 = 2.3707 VTN P-side : a = 0.0090 b(slope) = 0.0064 chi2 = 0.8782 VTP N-side = 0.6877 VTP p-side = 0.4208 CHI2 TEST = 1 CAL_BASE = 2.5464 V CAL_VREF = 3.0735 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:403 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4713 b(slope) = 0.0088 chi2 = 2.0829 CAL_IN P-side : a = 2.4738 b(slope) = 0.0088 chi2 = 1.0932 VTN N-side : a = 0.0083 b(slope) = 0.0107 chi2 = 1.0700 VTN P-side : a = 0.0084 b(slope) = 0.0065 chi2 = 0.6661 VTP N-side = 0.6913 VTP p-side = 0.4232 CHI2 TEST = 1 CAL_BASE = 2.4739 V CAL_VREF = 3.0347 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4941 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:503 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4910 b(slope) = 0.0086 chi2 = 1.0821 CAL_IN P-side : a = 2.4917 b(slope) = 0.0085 chi2 = 1.0883 VTN N-side : a = 0.0089 b(slope) = 0.0108 chi2 = 0.8279 VTN P-side : a = 0.0087 b(slope) = 0.0065 chi2 = 0.4879 VTP N-side = 0.6982 VTP p-side = 0.4257 CHI2 TEST = 1 CAL_BASE = 2.4929 V CAL_VREF = 3.0415 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:603 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD1A 1.5771E-01 IDDSB:VDD1B 1.6755E-01 IDDSB:VDD1C 1.7563E-01 IDDSB:VDD1D 1.8304E-01 IDDOP1:DVDD 1.7903E-01 DACs TEST = 1 CAL_IN N-side : a = 2.4860 b(slope) = 0.0087 chi2 = 1.1442 CAL_IN P-side : a = 2.4859 b(slope) = 0.0087 chi2 = 0.6571 VTN N-side : a = 0.0079 b(slope) = 0.0107 chi2 = 1.7424 VTN P-side : a = 0.0084 b(slope) = 0.0065 chi2 = 0.9826 VTP N-side = 0.6925 VTP p-side = 0.4238 CHI2 TEST = 1 CAL_BASE = 2.4878 V CAL_VREF = 3.0425 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13B 1887 FUNCT@5.0V:ATOM13C 1887 FUNCT@5.0V:ATOM17 6878 FUNCT@5.0V:ATOM18 5810 FUNCT@5.0V:ATOM18HF 5810 FUNCT@5.0V:ATOM25 2416 FUNCT@5.0V:ATOM25HF 2416 FUNCT@5.0V:ATOM28 1189 FUNCT@5.0V:ATOM29 1188 FUNCT@5.0V:ATOM30 1188 FUNCT@5.0V:ATOM31A 1018 FUNCT@5.0V:ATOM31B 1207 FUNCT@5.0V:ATOM32 1018 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4051 FUNCT@5.0V:ATOM45C_40 4051 FUNCT@5.0V:ATOM46C_40 4051 FUNCT@5.0V:ATOM47C_40 3683 FUNCT@5.0V:ATOM48C_40 4051 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4051 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:703 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4931 b(slope) = 0.0085 chi2 = 0.8950 CAL_IN P-side : a = 2.4933 b(slope) = 0.0085 chi2 = 5.7030 VTN N-side : a = 0.0085 b(slope) = 0.0105 chi2 = 0.8396 VTN P-side : a = 0.0088 b(slope) = 0.0064 chi2 = 0.3253 VTP N-side = 0.6818 VTP p-side = 0.4187 CHI2 TEST = 1 CAL_BASE = 2.4966 V CAL_VREF = 3.0437 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:803 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDOP1:DVDD 1.3253E-01 DACs TEST = 1 CAL_IN N-side : a = 2.4973 b(slope) = 0.0084 chi2 = 2.3823 CAL_IN P-side : a = 2.4977 b(slope) = 0.0084 chi2 = 1.4567 VTN N-side : a = 0.0082 b(slope) = 0.0109 chi2 = 1.1002 VTN P-side : a = 0.0084 b(slope) = 0.0067 chi2 = 0.9338 VTP N-side = 0.7038 VTP p-side = 0.4364 CHI2 TEST = 1 CAL_BASE = 2.4988 V CAL_VREF = 3.0386 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:804 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5150 b(slope) = 0.0083 chi2 = 1.7946 CAL_IN P-side : a = 2.5150 b(slope) = 0.0083 chi2 = 1.3680 VTN N-side : a = 0.0088 b(slope) = 0.0108 chi2 = 1.4633 VTN P-side : a = 0.0086 b(slope) = 0.0066 chi2 = 1.1005 VTP N-side = 0.6977 VTP p-side = 0.4338 CHI2 TEST = 1 CAL_BASE = 2.5154 V CAL_VREF = 3.0469 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:704 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5060 b(slope) = 0.0084 chi2 = 0.6035 CAL_IN P-side : a = 2.5060 b(slope) = 0.0084 chi2 = 2.1386 VTN N-side : a = 0.0087 b(slope) = 0.0107 chi2 = 0.8614 VTN P-side : a = 0.0087 b(slope) = 0.0065 chi2 = 0.5375 VTP N-side = 0.6917 VTP p-side = 0.4245 CHI2 TEST = 1 CAL_BASE = 2.5095 V CAL_VREF = 3.0496 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM18 11135 FUNCT@5.0V:ATOM18HF 11135 FUNCT@5.0V:ATOM19F 7217 FUNCT@5.0V:ATOM19FHF 7217 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5535 FUNCT@5.0V:ATOM45C_40 5535 FUNCT@5.0V:ATOM46C_40 4277 FUNCT@5.0V:ATOM47C_40 5535 FUNCT@5.0V:ATOM48C_40 5535 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5535 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:604 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4895 b(slope) = 0.0086 chi2 = 0.6613 CAL_IN P-side : a = 2.4890 b(slope) = 0.0086 chi2 = 0.7652 VTN N-side : a = 0.0087 b(slope) = 0.0107 chi2 = 0.8090 VTN P-side : a = 0.0086 b(slope) = 0.0065 chi2 = 0.6990 VTP N-side = 0.6939 VTP p-side = 0.4269 CHI2 TEST = 1 CAL_BASE = 2.4936 V CAL_VREF = 3.0447 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1404 TMIN TEST = 1 ---------- CHIP ID:504 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4932 b(slope) = 0.0086 chi2 = 0.7277 CAL_IN P-side : a = 2.4933 b(slope) = 0.0086 chi2 = 0.6331 VTN N-side : a = 0.0091 b(slope) = 0.0108 chi2 = 1.4462 VTN P-side : a = 0.0089 b(slope) = 0.0066 chi2 = 0.9268 VTP N-side = 0.7024 VTP p-side = 0.4312 CHI2 TEST = 1 CAL_BASE = 2.4949 V CAL_VREF = 3.0474 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:404 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4758 b(slope) = 0.0087 chi2 = 1.7792 CAL_IN P-side : a = 2.4745 b(slope) = 0.0087 chi2 = 5.9983 VTN N-side : a = 0.0098 b(slope) = 0.0106 chi2 = 1.4173 VTN P-side : a = 0.0092 b(slope) = 0.0064 chi2 = 0.7653 VTP N-side = 0.6908 VTP p-side = 0.4220 CHI2 TEST = 1 CAL_BASE = 2.4773 V CAL_VREF = 3.0342 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:304 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5174 b(slope) = 0.0086 chi2 = 9.3824 CAL_IN P-side : a = 2.5208 b(slope) = 0.0086 chi2 = 3.0570 VTN N-side : a = 0.0094 b(slope) = 0.0108 chi2 = 0.9094 VTN P-side : a = 0.0093 b(slope) = 0.0066 chi2 = 0.7691 VTP N-side = 0.6999 VTP p-side = 0.4307 CHI2 TEST = 1 CAL_BASE = 2.5168 V CAL_VREF = 3.0603 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:204 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5214 b(slope) = 0.0086 chi2 = 2.8987 CAL_IN P-side : a = 2.5233 b(slope) = 0.0086 chi2 = 2.4590 VTN N-side : a = 0.0098 b(slope) = 0.0109 chi2 = 0.6441 VTN P-side : a = 0.0095 b(slope) = 0.0066 chi2 = 0.5857 VTP N-side = 0.7061 VTP p-side = 0.4334 CHI2 TEST = 1 CAL_BASE = 2.5247 V CAL_VREF = 3.0728 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:205 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5044 b(slope) = 0.0087 chi2 = 0.4935 CAL_IN P-side : a = 2.5045 b(slope) = 0.0087 chi2 = 0.5423 VTN N-side : a = 0.0094 b(slope) = 0.0109 chi2 = 0.5219 VTN P-side : a = 0.0095 b(slope) = 0.0066 chi2 = 0.5110 VTP N-side = 0.7072 VTP p-side = 0.4338 CHI2 TEST = 1 CAL_BASE = 2.5068 V CAL_VREF = 3.0620 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:305 ------------------ CLASS = B && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 100 CAL_IN N-side : a = 2.4688 b(slope) = 0.0089 chi2 = 1.0085 CAL_IN P-side : a = 2.4684 b(slope) = 0.0089 chi2 = 25.0598 VTN N-side : a = 0.0092 b(slope) = 0.0107 chi2 = 1.0238 VTN P-side : a = 0.0093 b(slope) = 0.0065 chi2 = 0.4240 VTP N-side = 0.6927 VTP p-side = 0.4257 CHI2 TEST = 100 CAL_BASE = 2.4680 V CAL_VREF = 3.0364 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:405 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4843 b(slope) = 0.0087 chi2 = 0.8102 CAL_IN P-side : a = 2.4844 b(slope) = 0.0087 chi2 = 0.7514 VTN N-side : a = 0.0094 b(slope) = 0.0107 chi2 = 0.9025 VTN P-side : a = 0.0093 b(slope) = 0.0065 chi2 = 0.4002 VTP N-side = 0.6952 VTP p-side = 0.4282 CHI2 TEST = 1 CAL_BASE = 2.4871 V CAL_VREF = 3.0471 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:505 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4587 b(slope) = 0.0089 chi2 = 0.9516 CAL_IN P-side : a = 2.4593 b(slope) = 0.0089 chi2 = 1.4503 VTN N-side : a = 0.0085 b(slope) = 0.0109 chi2 = 1.1604 VTN P-side : a = 0.0087 b(slope) = 0.0066 chi2 = 0.5978 VTP N-side = 0.7039 VTP p-side = 0.4319 CHI2 TEST = 1 CAL_BASE = 2.4631 V CAL_VREF = 3.0315 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1062 FUNCT@5.0V:ATOM13B 1128 FUNCT@5.0V:ATOM13C 1128 FUNCT@5.0V:ATOM15 1106 FUNCT@5.0V:ATOM17 3418 FUNCT@5.0V:ATOM18 3434 FUNCT@5.0V:ATOM18HF 3434 FUNCT@5.0V:ATOM19 3370 FUNCT@5.0V:ATOM19D 3385 FUNCT@5.0V:ATOM19E 2612 FUNCT@5.0V:ATOM19F 6485 FUNCT@5.0V:ATOM19FHF 6485 FUNCT@5.0V:ATOM20 1078 FUNCT@5.0V:ATOM21 1054 FUNCT@5.0V:ATOM22 1042 FUNCT@5.0V:ATOM25 1060 FUNCT@5.0V:ATOM25HF 1060 FUNCT@5.0V:ATOM26A 1039 FUNCT@5.0V:ATOM26B 1848 FUNCT@5.0V:ATOM28 1176 FUNCT@5.0V:ATOM29 1176 FUNCT@5.0V:ATOM30 1176 FUNCT@5.0V:ATOM31A 810 FUNCT@5.0V:ATOM31B 999 FUNCT@5.0V:ATOM32 810 FUNCT@5.0V:ATOM33 1176 FUNCT@5.0V:ATOM35 1310 FUNCT@5.0V:ATOM36 1066 FUNCT@5.0V:ATOM39 1087 FUNCT@5.0V:ATOM41 1613 FUNCT@5.0V:ATOM41A 1613 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3683 FUNCT@5.0V:ATOM45C_40 3683 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 3683 FUNCT@5.0V:ATOM48C_40 3683 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3683 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:605 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4792 b(slope) = 0.0087 chi2 = 1.3460 CAL_IN P-side : a = 2.4792 b(slope) = 0.0087 chi2 = 1.0607 VTN N-side : a = 0.0095 b(slope) = 0.0108 chi2 = 1.3301 VTN P-side : a = 0.0091 b(slope) = 0.0066 chi2 = 0.6050 VTP N-side = 0.7025 VTP p-side = 0.4314 CHI2 TEST = 1 CAL_BASE = 2.4795 V CAL_VREF = 3.0366 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:705 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 0 error detected in test: Location: SUP_SHORT:VDD1 2.2107E-01 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A -1.0000E-38 IDDSB:VDD1A -1.0000E-38 IDDSB:VDD0B -1.0000E-38 IDDSB:VDD1B -1.0000E-38 IDDSB:VDD0C -1.0000E-38 IDDSB:VDD1C -1.0000E-38 IDDSB:VDD0D -1.0000E-38 IDDSB:VDD1D -1.0000E-38 V_AVDD2IPA:249/L9 -1.0000E-38 V_AVDD2IMA:277/L10 -1.0000E-38 AVDD_A:AVDDP-M -1.0000E-38 IAVDD2_A:AVDDP-M -1.0000E-38 V_V1RA:169/L5 -1.0000E-38 V_N310A:171/L6 -1.0000E-38 V_AVDD2IPB:249/L9 -1.0000E-38 V_AVDD2IMB:277/L10 -1.0000E-38 AVDD_B:AVDDP-M -1.0000E-38 IAVDD2_B:AVDDP-M -1.0000E-38 V_V1RB:169/L5 -1.0000E-38 V_N310B:171/L6 -1.0000E-38 V_AVDD2IPC:249/L9 -1.0000E-38 V_AVDD2IMC:277/L10 -1.0000E-38 AVDD_C:AVDDP-M -1.0000E-38 IAVDD2_C:AVDDP-M -1.0000E-38 V_V1RC:169/L5 -1.0000E-38 V_N310C:171/L6 -1.0000E-38 V_AVDD2IPD:249/L9 -1.0000E-38 V_AVDD2IMD:277/L10 -1.0000E-38 AVDD_D:AVDDP-M -1.0000E-38 IAVDD2_D:AVDDP-M -1.0000E-38 V_V1RD:169/L5 -1.0000E-38 V_N310D:171/L6 -1.0000E-38 IDDOP0:AVDD -1.0000E-38 IDDOP1:DVDD -1.0000E-38 DACs TEST = 0 CAL_IN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side = 0.0000 VTP p-side = 0.0000 CHI2 TEST = 0 CAL_BASE = 0.0000 V CAL_VREF = 0.0000 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 0 FUNCT@5.0V:ATOM1TO6B 0 FUNCT@5.0V:ATOM1TO6C 0 FUNCT@5.0V:ATOM1TO6D 0 FUNCT@5.0V:ATOM1TO6E 0 FUNCT@5.0V:ATOM7TO9A 0 FUNCT@5.0V:ATOM7TO9B 0 FUNCT@5.0V:ATOM7TO9C 0 FUNCT@5.0V:ATOM7TO9D 0 FUNCT@5.0V:ATOM7TO9E 0 FUNCT@5.0V:ATOM10TO12 0 FUNCT@5.0V:ATOM13A 0 FUNCT@5.0V:ATOM13B 0 FUNCT@5.0V:ATOM13C 0 FUNCT@5.0V:ATOM14 0 FUNCT@5.0V:ATOM15 0 FUNCT@5.0V:ATOM16 0 FUNCT@5.0V:ATOM17 0 FUNCT@5.0V:ATOM18 0 FUNCT@5.0V:ATOM18HF 0 FUNCT@5.0V:ATOM19 0 FUNCT@5.0V:ATOM19B 0 FUNCT@5.0V:ATOM19C 0 FUNCT@5.0V:ATOM19D 0 FUNCT@5.0V:ATOM19E 0 FUNCT@5.0V:ATOM19F 0 FUNCT@5.0V:ATOM19FHF 0 FUNCT@5.0V:ATOM20 0 FUNCT@5.0V:ATOM21 0 FUNCT@5.0V:ATOM22 0 FUNCT@5.0V:ATOM23 0 FUNCT@5.0V:ATOM24 0 FUNCT@5.0V:ATOM25 0 FUNCT@5.0V:ATOM25HF 0 FUNCT@5.0V:ATOM26A 0 FUNCT@5.0V:ATOM26B 0 FUNCT@5.0V:ATOM27 0 FUNCT@5.0V:ATOM28 0 FUNCT@5.0V:ATOM29 0 FUNCT@5.0V:ATOM30 0 FUNCT@5.0V:ATOM31A 0 FUNCT@5.0V:ATOM31B 0 FUNCT@5.0V:ATOM32 0 FUNCT@5.0V:ATOM33 0 FUNCT@5.0V:ATOM34 0 FUNCT@5.0V:ATOM35 0 FUNCT@5.0V:ATOM36 0 FUNCT@5.0V:ATOM38 0 FUNCT@5.0V:ATOM39 0 FUNCT@5.0V:ATOM40 0 FUNCT@5.0V:ATOM41 0 FUNCT@5.0V:ATOM41A 0 FUNCT@5.0V:ATOM42 0 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 0 FUNCT@5.0V:ATOM45C_40 0 FUNCT@5.0V:ATOM46C_40 0 FUNCT@5.0V:ATOM47C_40 0 FUNCT@5.0V:ATOM48C_40 0 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 0 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 0 FUNCT@5.0V:A10TO12HF 0 FUNCT@5.0V:ADAC37HF 0 CH.MASK TEST = 0 error detected at location:0 NOISE TEST = 0 error detected at location:0 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D -1.0000E-38 TMIN@4.8V:A7_9_60D -1.0000E-38 TMIN@4.8V:A10_12_50D -1.0000E-38 TMIN@4.8V:A10_12_60D -1.0000E-38 TMIN@4.8V:ADAC37_50D -1.0000E-38 TMIN@4.8V:ADAC37_60D -1.0000E-38 TMIN@5.0V:A7_9_50D -1.0000E-38 TMIN@5.0V:A7_9_60D -1.0000E-38 TMIN@5.0V:A10_12_50D -1.0000E-38 TMIN@5.0V:A10_12_60D -1.0000E-38 TMIN@5.0V:ADAC37_50D -1.0000E-38 TMIN@5.0V:ADAC37_60D -1.0000E-38 TMIN@5.2V:A7_9_50D -1.0000E-38 TMIN@5.2V:A7_9_60D -1.0000E-38 TMIN@5.2V:A10_12_50D -1.0000E-38 TMIN@5.2V:A10_12_60D -1.0000E-38 TMIN@5.2V:ADAC37_50D -1.0000E-38 TMIN@5.2V:ADAC37_60D -1.0000E-38 ---------- CHIP ID:805 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5036 b(slope) = 0.0083 chi2 = 1.1727 CAL_IN P-side : a = 2.5035 b(slope) = 0.0083 chi2 = 0.9436 VTN N-side : a = 0.0086 b(slope) = 0.0105 chi2 = 0.5363 VTN P-side : a = 0.0086 b(slope) = 0.0064 chi2 = 0.4251 VTP N-side = 0.6823 VTP p-side = 0.4195 CHI2 TEST = 1 CAL_BASE = 2.5068 V CAL_VREF = 3.0388 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:806 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 3.0949 b(slope) = 0.0000 chi2 = 2.9615 CAL_IN P-side : a = 3.0951 b(slope) = 0.0000 chi2 = 1.8935 VTN N-side : a = 0.0091 b(slope) = 0.0108 chi2 = 1.6732 VTN P-side : a = 0.0089 b(slope) = 0.0066 chi2 = 0.8620 VTP N-side = 0.6981 VTP p-side = 0.4334 CHI2 TEST = 1 CAL_BASE = 2.4941 V CAL_VREF = 3.0320 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3683 FUNCT@5.0V:ATOM45C_40 5503 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 3667 FUNCT@5.0V:ATOM48C_40 3683 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3683 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:706 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5149 b(slope) = 0.0085 chi2 = 0.8357 CAL_IN P-side : a = 2.5149 b(slope) = 0.0085 chi2 = 0.4601 VTN N-side : a = 0.0088 b(slope) = 0.0109 chi2 = 0.9566 VTN P-side : a = 0.0090 b(slope) = 0.0066 chi2 = 0.3786 VTP N-side = 0.7055 VTP p-side = 0.4326 CHI2 TEST = 1 CAL_BASE = 2.5193 V CAL_VREF = 3.0615 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13B 1771 FUNCT@5.0V:ATOM13C 1771 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:606 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: AVDD_A:AVDDP-M 2.7954E-01 IAVDD2_A:AVDDP-M 2.7954E-02 AVDD_B:AVDDP-M 2.7954E-01 IAVDD2_B:AVDDP-M 2.7954E-02 AVDD_C:AVDDP-M 2.8003E-01 IAVDD2_C:AVDDP-M 2.8003E-02 AVDD_D:AVDDP-M 2.7881E-01 IAVDD2_D:AVDDP-M 2.7881E-02 DACs TEST = 1 CAL_IN N-side : a = 2.5017 b(slope) = 0.0087 chi2 = 1.6547 CAL_IN P-side : a = 2.5020 b(slope) = 0.0086 chi2 = 1.9654 VTN N-side : a = 0.0087 b(slope) = 0.0108 chi2 = 1.4454 VTN P-side : a = 0.0092 b(slope) = 0.0065 chi2 = 1.3009 VTP N-side = 0.6981 VTP p-side = 0.4276 CHI2 TEST = 1 CAL_BASE = 2.5005 V CAL_VREF = 3.0542 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3683 FUNCT@5.0V:ATOM45C_40 3683 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 3683 FUNCT@5.0V:ATOM48C_40 3683 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3683 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:506 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4980 b(slope) = 0.0086 chi2 = 0.7380 CAL_IN P-side : a = 2.4983 b(slope) = 0.0086 chi2 = 1.1042 VTN N-side : a = 0.0094 b(slope) = 0.0108 chi2 = 1.5760 VTN P-side : a = 0.0092 b(slope) = 0.0066 chi2 = 0.7775 VTP N-side = 0.7034 VTP p-side = 0.4294 CHI2 TEST = 1 CAL_BASE = 2.4993 V CAL_VREF = 3.0496 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:406 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5120 b(slope) = 0.0086 chi2 = 0.9458 CAL_IN P-side : a = 2.5122 b(slope) = 0.0086 chi2 = 1.0916 VTN N-side : a = 0.0091 b(slope) = 0.0108 chi2 = 1.3443 VTN P-side : a = 0.0091 b(slope) = 0.0066 chi2 = 0.4174 VTP N-side = 0.7029 VTP p-side = 0.4330 CHI2 TEST = 1 CAL_BASE = 2.5149 V CAL_VREF = 3.0635 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:306 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4930 b(slope) = 0.0087 chi2 = 1.1782 CAL_IN P-side : a = 2.4932 b(slope) = 0.0087 chi2 = 0.9908 VTN N-side : a = 0.0099 b(slope) = 0.0109 chi2 = 1.5574 VTN P-side : a = 0.0096 b(slope) = 0.0067 chi2 = 0.6652 VTP N-side = 0.7068 VTP p-side = 0.4390 CHI2 TEST = 1 CAL_BASE = 2.4993 V CAL_VREF = 3.0586 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:206 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.5091 b(slope) = 0.0088 chi2 = 65.2859 CAL_IN P-side : a = 2.5139 b(slope) = 0.0088 chi2 = 33.0708 VTN N-side : a = 0.0097 b(slope) = 0.0108 chi2 = 1.6691 VTN P-side : a = 0.0096 b(slope) = 0.0066 chi2 = 0.6340 VTP N-side = 0.7028 VTP p-side = 0.4312 CHI2 TEST = 0 CAL_BASE = 2.5103 V CAL_VREF = 3.0620 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:107 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5119 b(slope) = 0.0086 chi2 = 1.4812 CAL_IN P-side : a = 2.5124 b(slope) = 0.0086 chi2 = 1.0786 VTN N-side : a = 0.0104 b(slope) = 0.0109 chi2 = 1.7507 VTN P-side : a = 0.0100 b(slope) = 0.0067 chi2 = 0.6134 VTP N-side = 0.7069 VTP p-side = 0.4403 CHI2 TEST = 1 CAL_BASE = 2.5166 V CAL_VREF = 3.0681 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:207 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5096 b(slope) = 0.0086 chi2 = 1.2324 CAL_IN P-side : a = 2.5096 b(slope) = 0.0086 chi2 = 1.3803 VTN N-side : a = 0.0091 b(slope) = 0.0108 chi2 = 2.0177 VTN P-side : a = 0.0095 b(slope) = 0.0066 chi2 = 0.6607 VTP N-side = 0.7036 VTP p-side = 0.4356 CHI2 TEST = 1 CAL_BASE = 2.5105 V CAL_VREF = 3.0632 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:307 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5153 b(slope) = 0.0086 chi2 = 1.2112 CAL_IN P-side : a = 2.5153 b(slope) = 0.0086 chi2 = 0.8244 VTN N-side : a = 0.0094 b(slope) = 0.0108 chi2 = 0.9280 VTN P-side : a = 0.0094 b(slope) = 0.0066 chi2 = 0.5868 VTP N-side = 0.7018 VTP p-side = 0.4299 CHI2 TEST = 1 CAL_BASE = 2.5176 V CAL_VREF = 3.0652 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:407 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4864 b(slope) = 0.0087 chi2 = 1.2002 CAL_IN P-side : a = 2.4864 b(slope) = 0.0087 chi2 = 0.5294 VTN N-side : a = 0.0096 b(slope) = 0.0106 chi2 = 1.3607 VTN P-side : a = 0.0094 b(slope) = 0.0064 chi2 = 0.5647 VTP N-side = 0.6865 VTP p-side = 0.4209 CHI2 TEST = 1 CAL_BASE = 2.4866 V CAL_VREF = 3.0437 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:507 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5239 b(slope) = 0.0084 chi2 = 1.8466 CAL_IN P-side : a = 2.5245 b(slope) = 0.0084 chi2 = 1.8400 VTN N-side : a = 0.0088 b(slope) = 0.0106 chi2 = 0.7208 VTN P-side : a = 0.0089 b(slope) = 0.0064 chi2 = 0.2269 VTP N-side = 0.6909 VTP p-side = 0.4222 CHI2 TEST = 1 CAL_BASE = 2.5256 V CAL_VREF = 3.0637 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4294 FUNCT@5.0V:ATOM45C_40 4294 FUNCT@5.0V:ATOM46C_40 3667 FUNCT@5.0V:ATOM47C_40 4294 FUNCT@5.0V:ATOM48C_40 4294 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4294 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:607 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4946 b(slope) = 0.0086 chi2 = 1.5772 CAL_IN P-side : a = 2.4946 b(slope) = 0.0086 chi2 = 0.9828 VTN N-side : a = 0.0088 b(slope) = 0.0106 chi2 = 0.6819 VTN P-side : a = 0.0089 b(slope) = 0.0065 chi2 = 0.5214 VTP N-side = 0.6903 VTP p-side = 0.4235 CHI2 TEST = 1 CAL_BASE = 2.4966 V CAL_VREF = 3.0452 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM35 1342 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:707 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5037 b(slope) = 0.0085 chi2 = 0.8198 CAL_IN P-side : a = 2.5035 b(slope) = 0.0085 chi2 = 1.0981 VTN N-side : a = 0.0097 b(slope) = 0.0108 chi2 = 1.4834 VTN P-side : a = 0.0094 b(slope) = 0.0066 chi2 = 0.6341 VTP N-side = 0.6992 VTP p-side = 0.4340 CHI2 TEST = 1 CAL_BASE = 2.5039 V CAL_VREF = 3.0471 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:807 ------------------ CLASS = B && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 100 CAL_IN N-side : a = 2.5099 b(slope) = 0.0082 chi2 = 1.0007 CAL_IN P-side : a = 2.5101 b(slope) = 0.0082 chi2 = 17.3055 VTN N-side : a = 0.0093 b(slope) = 0.0106 chi2 = 2.1774 VTN P-side : a = 0.0091 b(slope) = 0.0065 chi2 = 0.6443 VTP N-side = 0.6888 VTP p-side = 0.4253 CHI2 TEST = 100 CAL_BASE = 2.5142 V CAL_VREF = 3.0396 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:907 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5107 b(slope) = 0.0084 chi2 = 0.7101 CAL_IN P-side : a = 2.5111 b(slope) = 0.0084 chi2 = 0.4278 VTN N-side : a = 0.0090 b(slope) = 0.0108 chi2 = 1.0586 VTN P-side : a = 0.0092 b(slope) = 0.0067 chi2 = 0.5794 VTP N-side = 0.7025 VTP p-side = 0.4384 CHI2 TEST = 1 CAL_BASE = 2.5134 V CAL_VREF = 3.0486 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:908 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4992 b(slope) = 0.0086 chi2 = 1.6878 CAL_IN P-side : a = 2.4992 b(slope) = 0.0086 chi2 = 1.2032 VTN N-side : a = 0.0102 b(slope) = 0.0110 chi2 = 0.8088 VTN P-side : a = 0.0100 b(slope) = 0.0068 chi2 = 0.5768 VTP N-side = 0.7131 VTP p-side = 0.4453 CHI2 TEST = 1 CAL_BASE = 2.5007 V CAL_VREF = 3.0501 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:808 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.7446 b(slope) = 0.0078 chi2 = 99.0000 CAL_IN P-side : a = 2.5918 b(slope) = 0.0093 chi2 = 99.0000 VTN N-side : a = 0.0097 b(slope) = 0.0109 chi2 = 0.9203 VTN P-side : a = 0.0094 b(slope) = 0.0066 chi2 = 0.3403 VTP N-side = 0.7056 VTP p-side = 0.4342 CHI2 TEST = 0 CAL_BASE = 2.5095 V CAL_VREF = 3.0417 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1055 FUNCT@5.0V:ATOM13B 1111 FUNCT@5.0V:ATOM13C 1111 FUNCT@5.0V:ATOM15 1099 FUNCT@5.0V:ATOM17 3411 FUNCT@5.0V:ATOM18 3427 FUNCT@5.0V:ATOM18HF 3427 FUNCT@5.0V:ATOM19 3363 FUNCT@5.0V:ATOM19D 3378 FUNCT@5.0V:ATOM19E 2605 FUNCT@5.0V:ATOM19F 6477 FUNCT@5.0V:ATOM19FHF 6477 FUNCT@5.0V:ATOM20 1071 FUNCT@5.0V:ATOM21 1046 FUNCT@5.0V:ATOM22 1038 FUNCT@5.0V:ATOM23 967 FUNCT@5.0V:ATOM24 1067 FUNCT@5.0V:ATOM25 1053 FUNCT@5.0V:ATOM25HF 1053 FUNCT@5.0V:ATOM26A 1033 FUNCT@5.0V:ATOM26B 1841 FUNCT@5.0V:ATOM28 1169 FUNCT@5.0V:ATOM29 1169 FUNCT@5.0V:ATOM30 1169 FUNCT@5.0V:ATOM31A 803 FUNCT@5.0V:ATOM31B 992 FUNCT@5.0V:ATOM32 803 FUNCT@5.0V:ATOM33 1169 FUNCT@5.0V:ATOM35 1303 FUNCT@5.0V:ATOM36 1059 FUNCT@5.0V:ATOM39 1080 FUNCT@5.0V:ATOM41 1605 FUNCT@5.0V:ATOM41A 1605 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3659 FUNCT@5.0V:ATOM45C_40 3659 FUNCT@5.0V:ATOM46C_40 3659 FUNCT@5.0V:ATOM47C_40 3659 FUNCT@5.0V:ATOM48C_40 3659 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3659 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1235 NOISE TEST = 0 error detected at location:1393 TMIN TEST = 1 ---------- CHIP ID:708 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.5094 b(slope) = 0.0115 chi2 = 99.0000 CAL_IN P-side : a = 2.5156 b(slope) = 0.0102 chi2 = 99.0000 VTN N-side : a = 0.0100 b(slope) = 0.0107 chi2 = 1.4995 VTN P-side : a = 0.0094 b(slope) = 0.0066 chi2 = 0.4912 VTP N-side = 0.6985 VTP p-side = 0.4304 CHI2 TEST = 0 CAL_BASE = 2.5064 V CAL_VREF = 3.0508 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:608 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4962 b(slope) = 0.0086 chi2 = 0.5158 CAL_IN P-side : a = 2.4963 b(slope) = 0.0086 chi2 = 0.6560 VTN N-side : a = 0.0098 b(slope) = 0.0107 chi2 = 0.9149 VTN P-side : a = 0.0096 b(slope) = 0.0065 chi2 = 0.5766 VTP N-side = 0.6953 VTP p-side = 0.4296 CHI2 TEST = 1 CAL_BASE = 2.5005 V CAL_VREF = 3.0496 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:508 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 100 CAL_IN N-side : a = 2.5328 b(slope) = 0.0083 chi2 = 1.2046 CAL_IN P-side : a = 2.5328 b(slope) = 0.0082 chi2 = 13.1963 VTN N-side : a = 0.0094 b(slope) = 0.0108 chi2 = 0.6546 VTN P-side : a = 0.0094 b(slope) = 0.0066 chi2 = 0.5763 VTP N-side = 0.7044 VTP p-side = 0.4341 CHI2 TEST = 100 CAL_BASE = 2.5344 V CAL_VREF = 3.0632 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 2023 FUNCT@5.0V:ATOM13B 2079 FUNCT@5.0V:ATOM13C 2079 FUNCT@5.0V:ATOM15 2067 FUNCT@5.0V:ATOM17 4379 FUNCT@5.0V:ATOM18 4395 FUNCT@5.0V:ATOM18HF 4395 FUNCT@5.0V:ATOM19 4331 FUNCT@5.0V:ATOM19D 4346 FUNCT@5.0V:ATOM19E 3573 FUNCT@5.0V:ATOM19F 7446 FUNCT@5.0V:ATOM19FHF 7446 FUNCT@5.0V:ATOM20 2039 FUNCT@5.0V:ATOM21 2015 FUNCT@5.0V:ATOM22 2003 FUNCT@5.0V:ATOM25 2021 FUNCT@5.0V:ATOM25HF 2021 FUNCT@5.0V:ATOM26A 2000 FUNCT@5.0V:ATOM26B 2809 FUNCT@5.0V:ATOM28 2137 FUNCT@5.0V:ATOM29 2137 FUNCT@5.0V:ATOM30 2137 FUNCT@5.0V:ATOM31A 1771 FUNCT@5.0V:ATOM31B 1960 FUNCT@5.0V:ATOM32 1771 FUNCT@5.0V:ATOM33 2137 FUNCT@5.0V:ATOM35 2271 FUNCT@5.0V:ATOM36 2027 FUNCT@5.0V:ATOM39 2048 FUNCT@5.0V:ATOM41 2574 FUNCT@5.0V:ATOM41A 2574 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4147 FUNCT@5.0V:ATOM45C_40 4147 FUNCT@5.0V:ATOM46C_40 4147 FUNCT@5.0V:ATOM47C_40 4147 FUNCT@5.0V:ATOM48C_40 4147 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4147 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:408 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5305 b(slope) = 0.0084 chi2 = 1.4850 CAL_IN P-side : a = 2.5330 b(slope) = 0.0085 chi2 = 1.5886 VTN N-side : a = 0.0096 b(slope) = 0.0108 chi2 = 1.1043 VTN P-side : a = 0.0098 b(slope) = 0.0066 chi2 = 0.7009 VTP N-side = 0.7044 VTP p-side = 0.4356 CHI2 TEST = 1 CAL_BASE = 2.5320 V CAL_VREF = 3.0706 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1406 TMIN TEST = 1 ---------- CHIP ID:308 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.5275 b(slope) = 0.0086 chi2 = 1.2479 CAL_IN P-side : a = 2.5270 b(slope) = 0.0086 chi2 = 71.2526 VTN N-side : a = 0.0096 b(slope) = 0.0109 chi2 = 1.5306 VTN P-side : a = 0.0098 b(slope) = 0.0066 chi2 = 0.5457 VTP N-side = 0.7083 VTP p-side = 0.4344 CHI2 TEST = 0 CAL_BASE = 2.5293 V CAL_VREF = 3.0786 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:208 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5140 b(slope) = 0.0086 chi2 = 0.9609 CAL_IN P-side : a = 2.5140 b(slope) = 0.0086 chi2 = 0.9661 VTN N-side : a = 0.0099 b(slope) = 0.0108 chi2 = 1.4812 VTN P-side : a = 0.0100 b(slope) = 0.0066 chi2 = 0.4152 VTP N-side = 0.7044 VTP p-side = 0.4333 CHI2 TEST = 1 CAL_BASE = 2.5181 V CAL_VREF = 3.0706 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:108 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5195 b(slope) = 0.0085 chi2 = 1.2800 CAL_IN P-side : a = 2.5195 b(slope) = 0.0085 chi2 = 1.2084 VTN N-side : a = 0.0100 b(slope) = 0.0109 chi2 = 1.2210 VTN P-side : a = 0.0100 b(slope) = 0.0066 chi2 = 0.4928 VTP N-side = 0.7072 VTP p-side = 0.4364 CHI2 TEST = 1 CAL_BASE = 2.5232 V CAL_VREF = 3.0701 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:209 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4928 b(slope) = 0.0088 chi2 = 1.0377 CAL_IN P-side : a = 2.4928 b(slope) = 0.0088 chi2 = 0.8264 VTN N-side : a = 0.0104 b(slope) = 0.0109 chi2 = 1.4309 VTN P-side : a = 0.0103 b(slope) = 0.0066 chi2 = 1.4029 VTP N-side = 0.7057 VTP p-side = 0.4346 CHI2 TEST = 1 CAL_BASE = 2.4956 V CAL_VREF = 3.0564 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7461 FUNCT@5.0V:ATOM19FHF 7461 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5981 FUNCT@5.0V:ATOM45C_40 5981 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 5981 FUNCT@5.0V:ATOM48C_40 5981 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5981 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:309 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4965 b(slope) = 0.0087 chi2 = 1.2017 CAL_IN P-side : a = 2.4965 b(slope) = 0.0087 chi2 = 0.9043 VTN N-side : a = 0.0107 b(slope) = 0.0109 chi2 = 1.6418 VTN P-side : a = 0.0103 b(slope) = 0.0067 chi2 = 0.8683 VTP N-side = 0.7061 VTP p-side = 0.4368 CHI2 TEST = 1 CAL_BASE = 2.4983 V CAL_VREF = 3.0574 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1401 TMIN TEST = 1 ---------- CHIP ID:409 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.5776 b(slope) = 0.0107 chi2 = 99.0000 CAL_IN P-side : a = 2.5525 b(slope) = 0.0098 chi2 = 99.0000 VTN N-side : a = 0.0099 b(slope) = 0.0108 chi2 = 1.0629 VTN P-side : a = 0.0099 b(slope) = 0.0066 chi2 = 0.7497 VTP N-side = 0.7045 VTP p-side = 0.4328 CHI2 TEST = 0 CAL_BASE = 2.5212 V CAL_VREF = 3.0635 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:509 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5069 b(slope) = 0.0085 chi2 = 0.8391 CAL_IN P-side : a = 2.5070 b(slope) = 0.0085 chi2 = 0.2485 VTN N-side : a = 0.0102 b(slope) = 0.0107 chi2 = 2.2639 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.6705 VTP N-side = 0.6983 VTP p-side = 0.4272 CHI2 TEST = 1 CAL_BASE = 2.5076 V CAL_VREF = 3.0552 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:609 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5029 b(slope) = 0.0086 chi2 = 1.1720 CAL_IN P-side : a = 2.5031 b(slope) = 0.0085 chi2 = 1.0141 VTN N-side : a = 0.0105 b(slope) = 0.0107 chi2 = 2.1574 VTN P-side : a = 0.0099 b(slope) = 0.0066 chi2 = 0.8171 VTP N-side = 0.6985 VTP p-side = 0.4320 CHI2 TEST = 1 CAL_BASE = 2.5054 V CAL_VREF = 3.0537 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:709 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5213 b(slope) = 0.0083 chi2 = 0.6643 CAL_IN P-side : a = 2.5213 b(slope) = 0.0083 chi2 = 0.3637 VTN N-side : a = 0.0103 b(slope) = 0.0107 chi2 = 1.0813 VTN P-side : a = 0.0101 b(slope) = 0.0066 chi2 = 0.4413 VTP N-side = 0.6981 VTP p-side = 0.4331 CHI2 TEST = 1 CAL_BASE = 2.5261 V CAL_VREF = 3.0608 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1052 FUNCT@5.0V:ATOM13B 1108 FUNCT@5.0V:ATOM13C 1108 FUNCT@5.0V:ATOM15 1096 FUNCT@5.0V:ATOM17 3408 FUNCT@5.0V:ATOM18 3424 FUNCT@5.0V:ATOM18HF 3424 FUNCT@5.0V:ATOM19 3360 FUNCT@5.0V:ATOM19D 3375 FUNCT@5.0V:ATOM19E 2602 FUNCT@5.0V:ATOM19F 6475 FUNCT@5.0V:ATOM19FHF 6475 FUNCT@5.0V:ATOM20 1068 FUNCT@5.0V:ATOM21 1044 FUNCT@5.0V:ATOM22 1032 FUNCT@5.0V:ATOM23 964 FUNCT@5.0V:ATOM24 1064 FUNCT@5.0V:ATOM25 1050 FUNCT@5.0V:ATOM25HF 1050 FUNCT@5.0V:ATOM26A 1029 FUNCT@5.0V:ATOM26B 1838 FUNCT@5.0V:ATOM28 1166 FUNCT@5.0V:ATOM29 1166 FUNCT@5.0V:ATOM30 1166 FUNCT@5.0V:ATOM31A 800 FUNCT@5.0V:ATOM31B 989 FUNCT@5.0V:ATOM32 800 FUNCT@5.0V:ATOM33 1166 FUNCT@5.0V:ATOM35 1300 FUNCT@5.0V:ATOM36 1056 FUNCT@5.0V:ATOM39 1077 FUNCT@5.0V:ATOM41 1603 FUNCT@5.0V:ATOM41A 1603 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3655 FUNCT@5.0V:ATOM45C_40 3655 FUNCT@5.0V:ATOM46C_40 3655 FUNCT@5.0V:ATOM47C_40 3655 FUNCT@5.0V:ATOM48C_40 3655 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3655 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1253 NOISE TEST = 0 error detected at location:1391 TMIN TEST = 1 ---------- CHIP ID:809 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4850 b(slope) = 0.0085 chi2 = 1.1680 CAL_IN P-side : a = 2.4851 b(slope) = 0.0085 chi2 = 0.7595 VTN N-side : a = 0.0096 b(slope) = 0.0110 chi2 = 1.2035 VTN P-side : a = 0.0096 b(slope) = 0.0068 chi2 = 0.5714 VTP N-side = 0.7126 VTP p-side = 0.4430 CHI2 TEST = 1 CAL_BASE = 2.4873 V CAL_VREF = 3.0315 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4003 FUNCT@5.0V:ATOM45C_40 4003 FUNCT@5.0V:ATOM46C_40 4003 FUNCT@5.0V:ATOM47C_40 4003 FUNCT@5.0V:ATOM48C_40 4003 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4003 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1401 TMIN TEST = 1 ---------- CHIP ID:810 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5153 b(slope) = 0.0083 chi2 = 1.4599 CAL_IN P-side : a = 2.5155 b(slope) = 0.0083 chi2 = 1.0868 VTN N-side : a = 0.0101 b(slope) = 0.0108 chi2 = 1.4908 VTN P-side : a = 0.0101 b(slope) = 0.0067 chi2 = 0.7082 VTP N-side = 0.7018 VTP p-side = 0.4375 CHI2 TEST = 1 CAL_BASE = 2.5195 V CAL_VREF = 3.0478 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1263 FUNCT@5.0V:ATOM13B 1319 FUNCT@5.0V:ATOM13C 1319 FUNCT@5.0V:ATOM15 1307 FUNCT@5.0V:ATOM17 3619 FUNCT@5.0V:ATOM18 3634 FUNCT@5.0V:ATOM18HF 3634 FUNCT@5.0V:ATOM19 3571 FUNCT@5.0V:ATOM19D 3586 FUNCT@5.0V:ATOM19E 2813 FUNCT@5.0V:ATOM19F 6686 FUNCT@5.0V:ATOM19FHF 6686 FUNCT@5.0V:ATOM20 1278 FUNCT@5.0V:ATOM21 1256 FUNCT@5.0V:ATOM22 1244 FUNCT@5.0V:ATOM23 974 FUNCT@5.0V:ATOM24 1074 FUNCT@5.0V:ATOM25 1261 FUNCT@5.0V:ATOM25HF 1261 FUNCT@5.0V:ATOM26A 1239 FUNCT@5.0V:ATOM26B 2049 FUNCT@5.0V:ATOM28 1376 FUNCT@5.0V:ATOM29 1376 FUNCT@5.0V:ATOM30 1376 FUNCT@5.0V:ATOM31A 1010 FUNCT@5.0V:ATOM31B 1200 FUNCT@5.0V:ATOM32 1010 FUNCT@5.0V:ATOM33 1376 FUNCT@5.0V:ATOM35 1510 FUNCT@5.0V:ATOM36 1266 FUNCT@5.0V:ATOM39 1288 FUNCT@5.0V:ATOM41 1814 FUNCT@5.0V:ATOM41A 1814 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3777 FUNCT@5.0V:ATOM45C_40 3777 FUNCT@5.0V:ATOM46C_40 3777 FUNCT@5.0V:ATOM47C_40 3665 FUNCT@5.0V:ATOM48C_40 3777 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3777 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1243 NOISE TEST = 0 error detected at location:1401 TMIN TEST = 1 ---------- CHIP ID:710 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5440 b(slope) = 0.0083 chi2 = 1.3975 CAL_IN P-side : a = 2.5438 b(slope) = 0.0083 chi2 = 0.9500 VTN N-side : a = 0.0101 b(slope) = 0.0109 chi2 = 0.5911 VTN P-side : a = 0.0102 b(slope) = 0.0067 chi2 = 0.3504 VTP N-side = 0.7096 VTP p-side = 0.4410 CHI2 TEST = 1 CAL_BASE = 2.5471 V CAL_VREF = 3.0803 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:610 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5007 b(slope) = 0.0086 chi2 = 0.8598 CAL_IN P-side : a = 2.5007 b(slope) = 0.0086 chi2 = 0.3768 VTN N-side : a = 0.0099 b(slope) = 0.0109 chi2 = 0.8591 VTN P-side : a = 0.0100 b(slope) = 0.0067 chi2 = 0.3727 VTP N-side = 0.7056 VTP p-side = 0.4367 CHI2 TEST = 1 CAL_BASE = 2.5044 V CAL_VREF = 3.0554 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:510 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5158 b(slope) = 0.0085 chi2 = 0.7779 CAL_IN P-side : a = 2.5164 b(slope) = 0.0085 chi2 = 0.6504 VTN N-side : a = 0.0102 b(slope) = 0.0108 chi2 = 0.6380 VTN P-side : a = 0.0102 b(slope) = 0.0066 chi2 = 0.4040 VTP N-side = 0.7023 VTP p-side = 0.4322 CHI2 TEST = 1 CAL_BASE = 2.5195 V CAL_VREF = 3.0625 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:410 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 3.0949 b(slope) = 0.0000 chi2 = 2.1904 CAL_IN P-side : a = 3.0950 b(slope) = 0.0000 chi2 = 2.3546 VTN N-side : a = 0.0094 b(slope) = 0.0109 chi2 = 1.7967 VTN P-side : a = 0.0100 b(slope) = 0.0066 chi2 = 0.8587 VTP N-side = 0.7046 VTP p-side = 0.4314 CHI2 TEST = 1 CAL_BASE = 2.5183 V CAL_VREF = 3.0669 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4311 FUNCT@5.0V:ATOM45C_40 3683 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 3683 FUNCT@5.0V:ATOM48C_40 3683 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3683 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:310 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5071 b(slope) = 0.0087 chi2 = 4.4339 CAL_IN P-side : a = 2.5095 b(slope) = 0.0087 chi2 = 2.2279 VTN N-side : a = 0.0099 b(slope) = 0.0109 chi2 = 0.9961 VTN P-side : a = 0.0102 b(slope) = 0.0066 chi2 = 0.4705 VTP N-side = 0.7094 VTP p-side = 0.4366 CHI2 TEST = 1 CAL_BASE = 2.5098 V CAL_VREF = 3.0640 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:210 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.5553 b(slope) = 0.0110 chi2 = 99.0000 CAL_IN P-side : a = 2.5418 b(slope) = 0.0099 chi2 = 99.0000 VTN N-side : a = 0.0101 b(slope) = 0.0109 chi2 = 0.8364 VTN P-side : a = 0.0104 b(slope) = 0.0066 chi2 = 0.3016 VTP N-side = 0.7065 VTP p-side = 0.4359 CHI2 TEST = 0 CAL_BASE = 2.5142 V CAL_VREF = 3.0645 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:211 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5097 b(slope) = 0.0086 chi2 = 5.0139 CAL_IN P-side : a = 2.5115 b(slope) = 0.0086 chi2 = 2.8293 VTN N-side : a = 0.0106 b(slope) = 0.0108 chi2 = 1.1719 VTN P-side : a = 0.0105 b(slope) = 0.0065 chi2 = 0.5521 VTP N-side = 0.6998 VTP p-side = 0.4294 CHI2 TEST = 1 CAL_BASE = 2.5124 V CAL_VREF = 3.0608 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:311 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5192 b(slope) = 0.0085 chi2 = 2.6863 CAL_IN P-side : a = 2.5196 b(slope) = 0.0085 chi2 = 0.8981 VTN N-side : a = 0.0099 b(slope) = 0.0106 chi2 = 0.6923 VTN P-side : a = 0.0101 b(slope) = 0.0065 chi2 = 0.5416 VTP N-side = 0.6922 VTP p-side = 0.4258 CHI2 TEST = 1 CAL_BASE = 2.5244 V CAL_VREF = 3.0671 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:411 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4875 b(slope) = 0.0087 chi2 = 0.9575 CAL_IN P-side : a = 2.4873 b(slope) = 0.0087 chi2 = 0.7038 VTN N-side : a = 0.0097 b(slope) = 0.0107 chi2 = 0.8298 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.4195 VTP N-side = 0.6963 VTP p-side = 0.4284 CHI2 TEST = 1 CAL_BASE = 2.4876 V CAL_VREF = 3.0464 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:511 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5330 b(slope) = 0.0083 chi2 = 1.1593 CAL_IN P-side : a = 2.5328 b(slope) = 0.0083 chi2 = 1.0490 VTN N-side : a = 0.0097 b(slope) = 0.0107 chi2 = 0.8559 VTN P-side : a = 0.0098 b(slope) = 0.0066 chi2 = 0.5359 VTP N-side = 0.6969 VTP p-side = 0.4305 CHI2 TEST = 1 CAL_BASE = 2.5378 V CAL_VREF = 3.0703 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:611 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.5568 b(slope) = 0.0111 chi2 = 99.0000 CAL_IN P-side : a = 2.5389 b(slope) = 0.0100 chi2 = 99.0000 VTN N-side : a = 0.0104 b(slope) = 0.0107 chi2 = 0.9141 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.5104 VTP N-side = 0.6994 VTP p-side = 0.4302 CHI2 TEST = 0 CAL_BASE = 2.5110 V CAL_VREF = 3.0537 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1303 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM15 1347 FUNCT@5.0V:ATOM17 3659 FUNCT@5.0V:ATOM18 3675 FUNCT@5.0V:ATOM18HF 3675 FUNCT@5.0V:ATOM19 3611 FUNCT@5.0V:ATOM19D 3626 FUNCT@5.0V:ATOM19E 2853 FUNCT@5.0V:ATOM19F 6726 FUNCT@5.0V:ATOM19FHF 6726 FUNCT@5.0V:ATOM20 1319 FUNCT@5.0V:ATOM21 1295 FUNCT@5.0V:ATOM22 1283 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 1301 FUNCT@5.0V:ATOM25HF 1301 FUNCT@5.0V:ATOM26A 1280 FUNCT@5.0V:ATOM26B 2089 FUNCT@5.0V:ATOM28 1417 FUNCT@5.0V:ATOM29 1417 FUNCT@5.0V:ATOM30 1417 FUNCT@5.0V:ATOM31A 1051 FUNCT@5.0V:ATOM31B 1240 FUNCT@5.0V:ATOM32 1051 FUNCT@5.0V:ATOM33 1417 FUNCT@5.0V:ATOM35 1551 FUNCT@5.0V:ATOM36 1307 FUNCT@5.0V:ATOM39 1328 FUNCT@5.0V:ATOM41 1854 FUNCT@5.0V:ATOM41A 1854 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5615 FUNCT@5.0V:ATOM45C_40 5615 FUNCT@5.0V:ATOM46C_40 5504 FUNCT@5.0V:ATOM47C_40 5615 FUNCT@5.0V:ATOM48C_40 5615 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5615 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:711 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5044 b(slope) = 0.0085 chi2 = 0.9211 CAL_IN P-side : a = 2.5047 b(slope) = 0.0085 chi2 = 0.6488 VTN N-side : a = 0.0104 b(slope) = 0.0108 chi2 = 1.0066 VTN P-side : a = 0.0101 b(slope) = 0.0066 chi2 = 0.3906 VTP N-side = 0.7047 VTP p-side = 0.4355 CHI2 TEST = 1 CAL_BASE = 2.5085 V CAL_VREF = 3.0518 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:811 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4985 b(slope) = 0.0083 chi2 = 1.2368 CAL_IN P-side : a = 2.4988 b(slope) = 0.0083 chi2 = 1.0545 VTN N-side : a = 0.0096 b(slope) = 0.0109 chi2 = 1.5983 VTN P-side : a = 0.0102 b(slope) = 0.0067 chi2 = 0.6366 VTP N-side = 0.7047 VTP p-side = 0.4399 CHI2 TEST = 1 CAL_BASE = 2.5041 V CAL_VREF = 3.0364 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:812 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5175 b(slope) = 0.0084 chi2 = 0.8597 CAL_IN P-side : a = 2.5177 b(slope) = 0.0084 chi2 = 1.0335 VTN N-side : a = 0.0103 b(slope) = 0.0110 chi2 = 1.9175 VTN P-side : a = 0.0104 b(slope) = 0.0067 chi2 = 0.4977 VTP N-side = 0.7153 VTP p-side = 0.4424 CHI2 TEST = 1 CAL_BASE = 2.5190 V CAL_VREF = 3.0547 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:712 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4910 b(slope) = 0.0085 chi2 = 3.6613 CAL_IN P-side : a = 2.4914 b(slope) = 0.0085 chi2 = 2.6707 VTN N-side : a = 0.0110 b(slope) = 0.0108 chi2 = 2.6130 VTN P-side : a = 0.0105 b(slope) = 0.0066 chi2 = 1.3339 VTP N-side = 0.7017 VTP p-side = 0.4352 CHI2 TEST = 1 CAL_BASE = 2.4954 V CAL_VREF = 3.0413 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:612 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5168 b(slope) = 0.0084 chi2 = 0.9721 CAL_IN P-side : a = 2.5167 b(slope) = 0.0084 chi2 = 0.5235 VTN N-side : a = 0.0096 b(slope) = 0.0108 chi2 = 0.7285 VTN P-side : a = 0.0098 b(slope) = 0.0065 chi2 = 0.3639 VTP N-side = 0.6988 VTP p-side = 0.4268 CHI2 TEST = 1 CAL_BASE = 2.5166 V CAL_VREF = 3.0569 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:512 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5119 b(slope) = 0.0085 chi2 = 1.5437 CAL_IN P-side : a = 2.5124 b(slope) = 0.0085 chi2 = 1.2931 VTN N-side : a = 0.0101 b(slope) = 0.0108 chi2 = 1.2058 VTN P-side : a = 0.0101 b(slope) = 0.0066 chi2 = 0.6811 VTP N-side = 0.7040 VTP p-side = 0.4309 CHI2 TEST = 1 CAL_BASE = 2.5168 V CAL_VREF = 3.0618 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3731 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:412 ------------------ CLASS = B && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 100 CAL_IN N-side : a = 2.5078 b(slope) = 0.0085 chi2 = 1.5053 CAL_IN P-side : a = 2.5080 b(slope) = 0.0085 chi2 = 20.3643 VTN N-side : a = 0.0107 b(slope) = 0.0108 chi2 = 1.2442 VTN P-side : a = 0.0107 b(slope) = 0.0065 chi2 = 0.6436 VTP N-side = 0.7007 VTP p-side = 0.4303 CHI2 TEST = 100 CAL_BASE = 2.5115 V CAL_VREF = 3.0574 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:312 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5114 b(slope) = 0.0085 chi2 = 1.4749 CAL_IN P-side : a = 2.5115 b(slope) = 0.0085 chi2 = 1.1496 VTN N-side : a = 0.0108 b(slope) = 0.0109 chi2 = 2.6999 VTN P-side : a = 0.0109 b(slope) = 0.0067 chi2 = 0.8197 VTP N-side = 0.7086 VTP p-side = 0.4378 CHI2 TEST = 1 CAL_BASE = 2.5137 V CAL_VREF = 3.0596 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:212 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5309 b(slope) = 0.0084 chi2 = 0.7972 CAL_IN P-side : a = 2.5305 b(slope) = 0.0084 chi2 = 7.1205 VTN N-side : a = 0.0109 b(slope) = 0.0108 chi2 = 0.9442 VTN P-side : a = 0.0110 b(slope) = 0.0066 chi2 = 0.4897 VTP N-side = 0.7035 VTP p-side = 0.4325 CHI2 TEST = 1 CAL_BASE = 2.5334 V CAL_VREF = 3.0742 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:413 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5286 b(slope) = 0.0083 chi2 = 0.3735 CAL_IN P-side : a = 2.5285 b(slope) = 0.0083 chi2 = 0.5309 VTN N-side : a = 0.0106 b(slope) = 0.0109 chi2 = 1.3428 VTN P-side : a = 0.0108 b(slope) = 0.0066 chi2 = 0.5233 VTP N-side = 0.7067 VTP p-side = 0.4354 CHI2 TEST = 1 CAL_BASE = 2.5312 V CAL_VREF = 3.0618 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:513 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5238 b(slope) = 0.0083 chi2 = 2.0613 CAL_IN P-side : a = 2.5242 b(slope) = 0.0083 chi2 = 1.6760 VTN N-side : a = 0.0103 b(slope) = 0.0106 chi2 = 0.6085 VTN P-side : a = 0.0102 b(slope) = 0.0064 chi2 = 0.6714 VTP N-side = 0.6868 VTP p-side = 0.4235 CHI2 TEST = 1 CAL_BASE = 2.5305 V CAL_VREF = 3.0601 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13B 1135 FUNCT@5.0V:ATOM13C 1135 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5260 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:613 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5043 b(slope) = 0.0084 chi2 = 0.5530 CAL_IN P-side : a = 2.5045 b(slope) = 0.0084 chi2 = 0.5490 VTN N-side : a = 0.0101 b(slope) = 0.0107 chi2 = 1.8518 VTN P-side : a = 0.0099 b(slope) = 0.0066 chi2 = 0.6852 VTP N-side = 0.6952 VTP p-side = 0.4306 CHI2 TEST = 1 CAL_BASE = 2.5078 V CAL_VREF = 3.0454 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:614 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD1D 1.0138E-01 IDDOP1:DVDD 1.4087E-01 DACs TEST = 0 CAL_IN N-side : a = 2.6815 b(slope) = 0.0043 chi2 = 99.0000 CAL_IN P-side : a = 2.4862 b(slope) = 0.0085 chi2 = 1.5926 VTN N-side : a = 0.1296 b(slope) = 0.0083 chi2 = 99.0000 VTN P-side : a = 0.0100 b(slope) = 0.0067 chi2 = 0.4164 VTP N-side = 0.7137 VTP p-side = 0.4428 CHI2 TEST = 0 CAL_BASE = 2.4885 V CAL_VREF = 3.0332 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 228 FUNCT@5.0V:ATOM1TO6B 228 FUNCT@5.0V:ATOM1TO6C 228 FUNCT@5.0V:ATOM1TO6D 228 FUNCT@5.0V:ATOM1TO6E 228 FUNCT@5.0V:ATOM7TO9A 272 FUNCT@5.0V:ATOM7TO9B 272 FUNCT@5.0V:ATOM7TO9C 272 FUNCT@5.0V:ATOM7TO9D 272 FUNCT@5.0V:ATOM7TO9E 272 FUNCT@5.0V:ATOM10TO12 496 FUNCT@5.0V:ATOM13A 1046 FUNCT@5.0V:ATOM13B 1102 FUNCT@5.0V:ATOM13C 1102 FUNCT@5.0V:ATOM15 1090 FUNCT@5.0V:ATOM17 3402 FUNCT@5.0V:ATOM18 3418 FUNCT@5.0V:ATOM18HF 3418 FUNCT@5.0V:ATOM19 3354 FUNCT@5.0V:ATOM19D 3369 FUNCT@5.0V:ATOM19E 2596 FUNCT@5.0V:ATOM19F 6469 FUNCT@5.0V:ATOM19FHF 6469 FUNCT@5.0V:ATOM20 1062 FUNCT@5.0V:ATOM21 1038 FUNCT@5.0V:ATOM22 1026 FUNCT@5.0V:ATOM23 958 FUNCT@5.0V:ATOM24 1058 FUNCT@5.0V:ATOM25 1044 FUNCT@5.0V:ATOM25HF 1044 FUNCT@5.0V:ATOM26A 1023 FUNCT@5.0V:ATOM26B 1832 FUNCT@5.0V:ATOM28 1160 FUNCT@5.0V:ATOM29 1160 FUNCT@5.0V:ATOM30 1160 FUNCT@5.0V:ATOM31A 794 FUNCT@5.0V:ATOM31B 983 FUNCT@5.0V:ATOM32 794 FUNCT@5.0V:ATOM33 1160 FUNCT@5.0V:ATOM34 268 FUNCT@5.0V:ATOM35 1294 FUNCT@5.0V:ATOM36 1050 FUNCT@5.0V:ATOM39 1071 FUNCT@5.0V:ATOM41 1597 FUNCT@5.0V:ATOM41A 1597 FUNCT@5.0V:ATOM42 214 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3649 FUNCT@5.0V:ATOM45C_40 3649 FUNCT@5.0V:ATOM46C_40 3649 FUNCT@5.0V:ATOM47C_40 3649 FUNCT@5.0V:ATOM48C_40 3649 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3649 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 272 FUNCT@5.0V:A10TO12HF 496 FUNCT@5.0V:ADAC37HF 272 CH.MASK TEST = 0 error detected at location:1227 NOISE TEST = 0 error detected at location:1385 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D 9.0000E-08 TMIN@4.8V:A7_9_60D 9.0000E-08 TMIN@4.8V:A10_12_50D 9.0000E-08 TMIN@4.8V:A10_12_60D 9.0000E-08 TMIN@4.8V:ADAC37_50D 9.0000E-08 TMIN@4.8V:ADAC37_60D 9.0000E-08 TMIN@5.0V:A7_9_50D 9.0000E-08 TMIN@5.0V:A7_9_60D 9.0000E-08 TMIN@5.0V:A10_12_50D 9.0000E-08 TMIN@5.0V:A10_12_60D 9.0000E-08 TMIN@5.0V:ADAC37_50D 9.0000E-08 TMIN@5.0V:ADAC37_60D 9.0000E-08 TMIN@5.2V:A7_9_50D 9.0000E-08 TMIN@5.2V:A7_9_60D 9.0000E-08 TMIN@5.2V:A10_12_50D 9.0000E-08 TMIN@5.2V:A10_12_60D 9.0000E-08 TMIN@5.2V:ADAC37_50D 9.0000E-08 TMIN@5.2V:ADAC37_60D 9.0000E-08 ---------- CHIP ID:514 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 0 error detected in test: Location: SUP_SHORT:VDD1 2.2272E-01 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A -1.0000E-38 IDDSB:VDD1A -1.0000E-38 IDDSB:VDD0B -1.0000E-38 IDDSB:VDD1B -1.0000E-38 IDDSB:VDD0C -1.0000E-38 IDDSB:VDD1C -1.0000E-38 IDDSB:VDD0D -1.0000E-38 IDDSB:VDD1D -1.0000E-38 V_AVDD2IPA:249/L9 -1.0000E-38 V_AVDD2IMA:277/L10 -1.0000E-38 AVDD_A:AVDDP-M -1.0000E-38 IAVDD2_A:AVDDP-M -1.0000E-38 V_V1RA:169/L5 -1.0000E-38 V_N310A:171/L6 -1.0000E-38 V_AVDD2IPB:249/L9 -1.0000E-38 V_AVDD2IMB:277/L10 -1.0000E-38 AVDD_B:AVDDP-M -1.0000E-38 IAVDD2_B:AVDDP-M -1.0000E-38 V_V1RB:169/L5 -1.0000E-38 V_N310B:171/L6 -1.0000E-38 V_AVDD2IPC:249/L9 -1.0000E-38 V_AVDD2IMC:277/L10 -1.0000E-38 AVDD_C:AVDDP-M -1.0000E-38 IAVDD2_C:AVDDP-M -1.0000E-38 V_V1RC:169/L5 -1.0000E-38 V_N310C:171/L6 -1.0000E-38 V_AVDD2IPD:249/L9 -1.0000E-38 V_AVDD2IMD:277/L10 -1.0000E-38 AVDD_D:AVDDP-M -1.0000E-38 IAVDD2_D:AVDDP-M -1.0000E-38 V_V1RD:169/L5 -1.0000E-38 V_N310D:171/L6 -1.0000E-38 IDDOP0:AVDD -1.0000E-38 IDDOP1:DVDD -1.0000E-38 DACs TEST = 0 CAL_IN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side = 0.0000 VTP p-side = 0.0000 CHI2 TEST = 0 CAL_BASE = 0.0000 V CAL_VREF = 0.0000 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 0 FUNCT@5.0V:ATOM1TO6B 0 FUNCT@5.0V:ATOM1TO6C 0 FUNCT@5.0V:ATOM1TO6D 0 FUNCT@5.0V:ATOM1TO6E 0 FUNCT@5.0V:ATOM7TO9A 0 FUNCT@5.0V:ATOM7TO9B 0 FUNCT@5.0V:ATOM7TO9C 0 FUNCT@5.0V:ATOM7TO9D 0 FUNCT@5.0V:ATOM7TO9E 0 FUNCT@5.0V:ATOM10TO12 0 FUNCT@5.0V:ATOM13A 0 FUNCT@5.0V:ATOM13B 0 FUNCT@5.0V:ATOM13C 0 FUNCT@5.0V:ATOM14 0 FUNCT@5.0V:ATOM15 0 FUNCT@5.0V:ATOM16 0 FUNCT@5.0V:ATOM17 0 FUNCT@5.0V:ATOM18 0 FUNCT@5.0V:ATOM18HF 0 FUNCT@5.0V:ATOM19 0 FUNCT@5.0V:ATOM19B 0 FUNCT@5.0V:ATOM19C 0 FUNCT@5.0V:ATOM19D 0 FUNCT@5.0V:ATOM19E 0 FUNCT@5.0V:ATOM19F 0 FUNCT@5.0V:ATOM19FHF 0 FUNCT@5.0V:ATOM20 0 FUNCT@5.0V:ATOM21 0 FUNCT@5.0V:ATOM22 0 FUNCT@5.0V:ATOM23 0 FUNCT@5.0V:ATOM24 0 FUNCT@5.0V:ATOM25 0 FUNCT@5.0V:ATOM25HF 0 FUNCT@5.0V:ATOM26A 0 FUNCT@5.0V:ATOM26B 0 FUNCT@5.0V:ATOM27 0 FUNCT@5.0V:ATOM28 0 FUNCT@5.0V:ATOM29 0 FUNCT@5.0V:ATOM30 0 FUNCT@5.0V:ATOM31A 0 FUNCT@5.0V:ATOM31B 0 FUNCT@5.0V:ATOM32 0 FUNCT@5.0V:ATOM33 0 FUNCT@5.0V:ATOM34 0 FUNCT@5.0V:ATOM35 0 FUNCT@5.0V:ATOM36 0 FUNCT@5.0V:ATOM38 0 FUNCT@5.0V:ATOM39 0 FUNCT@5.0V:ATOM40 0 FUNCT@5.0V:ATOM41 0 FUNCT@5.0V:ATOM41A 0 FUNCT@5.0V:ATOM42 0 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 0 FUNCT@5.0V:ATOM45C_40 0 FUNCT@5.0V:ATOM46C_40 0 FUNCT@5.0V:ATOM47C_40 0 FUNCT@5.0V:ATOM48C_40 0 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 0 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 0 FUNCT@5.0V:A10TO12HF 0 FUNCT@5.0V:ADAC37HF 0 CH.MASK TEST = 0 error detected at location:0 NOISE TEST = 0 error detected at location:0 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D -1.0000E-38 TMIN@4.8V:A7_9_60D -1.0000E-38 TMIN@4.8V:A10_12_50D -1.0000E-38 TMIN@4.8V:A10_12_60D -1.0000E-38 TMIN@4.8V:ADAC37_50D -1.0000E-38 TMIN@4.8V:ADAC37_60D -1.0000E-38 TMIN@5.0V:A7_9_50D -1.0000E-38 TMIN@5.0V:A7_9_60D -1.0000E-38 TMIN@5.0V:A10_12_50D -1.0000E-38 TMIN@5.0V:A10_12_60D -1.0000E-38 TMIN@5.0V:ADAC37_50D -1.0000E-38 TMIN@5.0V:ADAC37_60D -1.0000E-38 TMIN@5.2V:A7_9_50D -1.0000E-38 TMIN@5.2V:A7_9_60D -1.0000E-38 TMIN@5.2V:A10_12_50D -1.0000E-38 TMIN@5.2V:A10_12_60D -1.0000E-38 TMIN@5.2V:ADAC37_50D -1.0000E-38 TMIN@5.2V:ADAC37_60D -1.0000E-38 ---------- CHIP ID:414 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5170 b(slope) = 0.0084 chi2 = 1.0187 CAL_IN P-side : a = 2.5172 b(slope) = 0.0083 chi2 = 0.6433 VTN N-side : a = 0.0109 b(slope) = 0.0109 chi2 = 1.7821 VTN P-side : a = 0.0105 b(slope) = 0.0066 chi2 = 0.6043 VTP N-side = 0.7062 VTP p-side = 0.4338 CHI2 TEST = 1 CAL_BASE = 2.5220 V CAL_VREF = 3.0569 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 FUNCT@5.0V:ATOM42 262 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 +++++++++ SUMMARY OF RESULTS ++++++++++++++++++++++++() ++++++++++++++++ A A< B B< C --------------------------------------------------------------- 0 0 0 0 401 0 0 0 0 501 0 0 0 0 601 602 0 0 0 0 0 0 0 0 502 402 0 0 0 0 203 0 0 0 0 303 0 0 0 0 0 0 0 0 403 503 0 0 0 0 0 0 0 0 603 703 0 0 0 0 0 0 0 0 803 804 0 0 0 0 0 0 0 0 704 0 0 0 0 604 504 0 0 0 0 404 0 0 0 0 304 0 0 0 0 204 0 0 0 0 0 205 0 0 0 0 0 305 0 0 405 0 0 0 0 0 0 0 0 505 605 0 0 0 0 0 0 0 0 705 805 0 0 0 0 0 0 0 0 806 0 0 0 0 706 0 0 0 0 606 506 0 0 0 0 0 0 0 0 406 306 0 0 0 0 0 0 0 0 206 0 107 0 0 0 0 207 0 0 0 0 307 0 0 0 407 0 0 0 0 0 0 0 0 507 0 0 0 0 607 707 0 0 0 0 0 0 807 0 0 907 0 0 0 0 908 0 0 0 0 0 0 0 0 808 0 0 0 0 708 608 0 0 0 0 0 0 0 0 508 0 0 0 0 408 0 0 0 0 308 0 208 0 0 0 0 108 0 0 0 0 0 0 0 209 0 0 0 0 309 0 0 0 0 409 509 0 0 0 0 609 0 0 0 0 0 0 0 0 709 0 0 0 0 809 0 0 0 0 810 710 0 0 0 0 0 0 0 0 610 510 0 0 0 0 0 0 0 0 410 0 310 0 0 0 0 0 0 0 210 0 211 0 0 0 0 0 0 0 311 0 411 0 0 0 0 0 0 0 511 0 0 0 0 611 711 0 0 0 0 811 0 0 0 0 812 0 0 0 0 712 0 0 0 0 612 0 0 0 0 0 0 0 0 512 0 0 0 412 0 0 312 0 0 0 0 212 0 0 0 0 413 0 0 0 0 0 0 0 513 0 613 0 0 0 0 0 0 0 614 0 0 0 0 514 0 0 0 0 414 ---------------------------------------------------------------- 30 40 13 2 1 NUMBER OF CHIPS TESTED = 86 NUMBER OF A CHIPS = 30 NUMBER OF A< CHIPS = 13 NUMBER OF B CHIPS = 2 NUMBER OF B< CHIPS = 1 NUMBER OF C CHIPS = 40 YIELD = 34.88 % (YIELD WITH LT CHIPS= 50.00 %)