******************************************************************** wafer #11 ******************************************************************** ---------- CHIP ID:401 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.4307 b(slope) = 0.0092 chi2 = 99.0000 CAL_IN P-side : a = 2.4354 b(slope) = 0.0096 chi2 = 99.0000 VTN N-side : a = 0.0084 b(slope) = 0.0107 chi2 = 1.5635 VTN P-side : a = 0.0088 b(slope) = 0.0065 chi2 = 0.6094 VTP N-side = 0.6945 VTP p-side = 0.4278 CHI2 TEST = 0 CAL_BASE = 2.4399 V CAL_VREF = 2.9897 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:501 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4786 b(slope) = 0.0082 chi2 = 0.5855 CAL_IN P-side : a = 2.4786 b(slope) = 0.0082 chi2 = 0.6293 VTN N-side : a = 0.0088 b(slope) = 0.0107 chi2 = 0.7014 VTN P-side : a = 0.0086 b(slope) = 0.0065 chi2 = 0.7305 VTP N-side = 0.6922 VTP p-side = 0.4270 CHI2 TEST = 1 CAL_BASE = 2.4807 V CAL_VREF = 3.0083 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:601 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4695 b(slope) = 0.0083 chi2 = 0.7613 CAL_IN P-side : a = 2.4691 b(slope) = 0.0083 chi2 = 0.3682 VTN N-side : a = 0.0079 b(slope) = 0.0105 chi2 = 2.1934 VTN P-side : a = 0.0086 b(slope) = 0.0064 chi2 = 1.0999 VTP N-side = 0.6809 VTP p-side = 0.4201 CHI2 TEST = 1 CAL_BASE = 2.4719 V CAL_VREF = 3.0068 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:602 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4705 b(slope) = 0.0082 chi2 = 0.6356 CAL_IN P-side : a = 2.4707 b(slope) = 0.0082 chi2 = 1.0959 VTN N-side : a = 0.0083 b(slope) = 0.0106 chi2 = 1.6777 VTN P-side : a = 0.0087 b(slope) = 0.0065 chi2 = 1.1708 VTP N-side = 0.6874 VTP p-side = 0.4244 CHI2 TEST = 1 CAL_BASE = 2.4751 V CAL_VREF = 3.0032 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:502 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4652 b(slope) = 0.0083 chi2 = 0.6637 CAL_IN P-side : a = 2.4650 b(slope) = 0.0083 chi2 = 0.8607 VTN N-side : a = 0.0086 b(slope) = 0.0106 chi2 = 1.1602 VTN P-side : a = 0.0087 b(slope) = 0.0065 chi2 = 0.6036 VTP N-side = 0.6876 VTP p-side = 0.4246 CHI2 TEST = 1 CAL_BASE = 2.4692 V CAL_VREF = 3.0017 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:402 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4488 b(slope) = 0.0084 chi2 = 0.7993 CAL_IN P-side : a = 2.4487 b(slope) = 0.0083 chi2 = 0.8539 VTN N-side : a = 0.0083 b(slope) = 0.0106 chi2 = 1.6684 VTN P-side : a = 0.0087 b(slope) = 0.0065 chi2 = 1.2348 VTP N-side = 0.6870 VTP p-side = 0.4235 CHI2 TEST = 1 CAL_BASE = 2.4526 V CAL_VREF = 2.9871 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1895 FUNCT@5.0V:ATOM13B 1951 FUNCT@5.0V:ATOM13C 1951 FUNCT@5.0V:ATOM15 1939 FUNCT@5.0V:ATOM17 4251 FUNCT@5.0V:ATOM18 4267 FUNCT@5.0V:ATOM18HF 4267 FUNCT@5.0V:ATOM19 4203 FUNCT@5.0V:ATOM19D 4218 FUNCT@5.0V:ATOM19E 3445 FUNCT@5.0V:ATOM19F 7318 FUNCT@5.0V:ATOM19FHF 7318 FUNCT@5.0V:ATOM20 1911 FUNCT@5.0V:ATOM21 1887 FUNCT@5.0V:ATOM22 1875 FUNCT@5.0V:ATOM25 1893 FUNCT@5.0V:ATOM25HF 1893 FUNCT@5.0V:ATOM26A 1872 FUNCT@5.0V:ATOM26B 2681 FUNCT@5.0V:ATOM28 2009 FUNCT@5.0V:ATOM29 2009 FUNCT@5.0V:ATOM30 2009 FUNCT@5.0V:ATOM31A 1643 FUNCT@5.0V:ATOM31B 1832 FUNCT@5.0V:ATOM32 1643 FUNCT@5.0V:ATOM33 2009 FUNCT@5.0V:ATOM35 2143 FUNCT@5.0V:ATOM36 1899 FUNCT@5.0V:ATOM39 1920 FUNCT@5.0V:ATOM41 2446 FUNCT@5.0V:ATOM41A 2446 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4083 FUNCT@5.0V:ATOM45C_40 3683 FUNCT@5.0V:ATOM46C_40 4083 FUNCT@5.0V:ATOM47C_40 4083 FUNCT@5.0V:ATOM48C_40 4083 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4083 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:203 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4642 b(slope) = 0.0082 chi2 = 0.8962 CAL_IN P-side : a = 2.4645 b(slope) = 0.0082 chi2 = 0.4276 VTN N-side : a = 0.0096 b(slope) = 0.0104 chi2 = 0.6395 VTN P-side : a = 0.0093 b(slope) = 0.0063 chi2 = 0.4848 VTP N-side = 0.6781 VTP p-side = 0.4167 CHI2 TEST = 1 CAL_BASE = 2.4673 V CAL_VREF = 2.9900 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:303 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4599 b(slope) = 0.0082 chi2 = 1.5509 CAL_IN P-side : a = 2.4600 b(slope) = 0.0082 chi2 = 2.5875 VTN N-side : a = 0.0090 b(slope) = 0.0102 chi2 = 1.3989 VTN P-side : a = 0.0094 b(slope) = 0.0063 chi2 = 0.4748 VTP N-side = 0.6661 VTP p-side = 0.4107 CHI2 TEST = 1 CAL_BASE = 2.4617 V CAL_VREF = 2.9856 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:403 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4219 b(slope) = 0.0085 chi2 = 1.1771 CAL_IN P-side : a = 2.4223 b(slope) = 0.0085 chi2 = 0.9875 VTN N-side : a = 0.0094 b(slope) = 0.0104 chi2 = 0.4757 VTN P-side : a = 0.0094 b(slope) = 0.0064 chi2 = 0.3754 VTP N-side = 0.6789 VTP p-side = 0.4182 CHI2 TEST = 1 CAL_BASE = 2.4233 V CAL_VREF = 2.9690 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:503 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4418 b(slope) = 0.0084 chi2 = 0.4836 CAL_IN P-side : a = 2.4421 b(slope) = 0.0084 chi2 = 0.3547 VTN N-side : a = 0.0094 b(slope) = 0.0104 chi2 = 0.5197 VTN P-side : a = 0.0092 b(slope) = 0.0064 chi2 = 0.4934 VTP N-side = 0.6788 VTP p-side = 0.4198 CHI2 TEST = 1 CAL_BASE = 2.4434 V CAL_VREF = 2.9807 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1405 TMIN TEST = 1 ---------- CHIP ID:603 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4398 b(slope) = 0.0084 chi2 = 0.8654 CAL_IN P-side : a = 2.4399 b(slope) = 0.0084 chi2 = 0.5931 VTN N-side : a = 0.0089 b(slope) = 0.0105 chi2 = 1.0717 VTN P-side : a = 0.0091 b(slope) = 0.0064 chi2 = 0.6773 VTP N-side = 0.6828 VTP p-side = 0.4212 CHI2 TEST = 1 CAL_BASE = 2.4441 V CAL_VREF = 2.9812 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:703 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4564 b(slope) = 0.0083 chi2 = 0.9337 CAL_IN P-side : a = 2.4566 b(slope) = 0.0083 chi2 = 0.7826 VTN N-side : a = 0.0094 b(slope) = 0.0105 chi2 = 0.3961 VTN P-side : a = 0.0092 b(slope) = 0.0064 chi2 = 0.2985 VTP N-side = 0.6847 VTP p-side = 0.4219 CHI2 TEST = 1 CAL_BASE = 2.4585 V CAL_VREF = 2.9897 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:803 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 0 error detected in test: Value: IDDOP1:DVDD 1.2466E-01 DACs TEST = 1 CAL_IN N-side : a = 2.4478 b(slope) = 0.0084 chi2 = 0.4751 CAL_IN P-side : a = 2.4480 b(slope) = 0.0084 chi2 = 0.2424 VTN N-side : a = 0.0092 b(slope) = 0.0107 chi2 = 0.9026 VTN P-side : a = 0.0093 b(slope) = 0.0066 chi2 = 0.2671 VTP N-side = 0.6925 VTP p-side = 0.4301 CHI2 TEST = 1 CAL_BASE = 2.4504 V CAL_VREF = 2.9876 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM35 1550 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3683 FUNCT@5.0V:ATOM45C_40 3683 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 3683 FUNCT@5.0V:ATOM48C_40 3683 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3683 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:804 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4687 b(slope) = 0.0082 chi2 = 1.8146 CAL_IN P-side : a = 2.4688 b(slope) = 0.0082 chi2 = 2.2101 VTN N-side : a = 0.0093 b(slope) = 0.0107 chi2 = 0.5006 VTN P-side : a = 0.0094 b(slope) = 0.0066 chi2 = 0.5281 VTP N-side = 0.6940 VTP p-side = 0.4302 CHI2 TEST = 1 CAL_BASE = 2.4724 V CAL_VREF = 3.0000 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:704 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4463 b(slope) = 0.0084 chi2 = 0.6331 CAL_IN P-side : a = 2.4465 b(slope) = 0.0084 chi2 = 0.6317 VTN N-side : a = 0.0089 b(slope) = 0.0105 chi2 = 0.8031 VTN P-side : a = 0.0091 b(slope) = 0.0064 chi2 = 0.4653 VTP N-side = 0.6828 VTP p-side = 0.4225 CHI2 TEST = 1 CAL_BASE = 2.4490 V CAL_VREF = 2.9856 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:604 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4629 b(slope) = 0.0083 chi2 = 0.6165 CAL_IN P-side : a = 2.4628 b(slope) = 0.0083 chi2 = 0.5255 VTN N-side : a = 0.0093 b(slope) = 0.0106 chi2 = 1.0049 VTN P-side : a = 0.0094 b(slope) = 0.0065 chi2 = 0.4704 VTP N-side = 0.6870 VTP p-side = 0.4245 CHI2 TEST = 1 CAL_BASE = 2.4666 V CAL_VREF = 3.0017 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:504 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4348 b(slope) = 0.0085 chi2 = 0.4384 CAL_IN P-side : a = 2.4351 b(slope) = 0.0085 chi2 = 0.4647 VTN N-side : a = 0.0092 b(slope) = 0.0105 chi2 = 0.7056 VTN P-side : a = 0.0093 b(slope) = 0.0065 chi2 = 0.4072 VTP N-side = 0.6835 VTP p-side = 0.4237 CHI2 TEST = 1 CAL_BASE = 2.4368 V CAL_VREF = 2.9829 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:404 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4235 b(slope) = 0.0086 chi2 = 0.6317 CAL_IN P-side : a = 2.4237 b(slope) = 0.0086 chi2 = 0.2978 VTN N-side : a = 0.0090 b(slope) = 0.0105 chi2 = 0.7631 VTN P-side : a = 0.0091 b(slope) = 0.0064 chi2 = 0.2811 VTP N-side = 0.6852 VTP p-side = 0.4208 CHI2 TEST = 1 CAL_BASE = 2.4241 V CAL_VREF = 2.9758 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:304 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4377 b(slope) = 0.0083 chi2 = 0.4752 CAL_IN P-side : a = 2.4380 b(slope) = 0.0083 chi2 = 0.4745 VTN N-side : a = 0.0095 b(slope) = 0.0104 chi2 = 0.5039 VTN P-side : a = 0.0094 b(slope) = 0.0064 chi2 = 0.6262 VTP N-side = 0.6775 VTP p-side = 0.4174 CHI2 TEST = 1 CAL_BASE = 2.4385 V CAL_VREF = 2.9729 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:204 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.5649 b(slope) = 0.0114 chi2 = 99.0000 CAL_IN P-side : a = 2.4867 b(slope) = 0.0111 chi2 = 99.0000 VTN N-side : a = 0.0100 b(slope) = 0.0103 chi2 = 0.5706 VTN P-side : a = 0.0099 b(slope) = 0.0063 chi2 = 0.3851 VTP N-side = 0.6697 VTP p-side = 0.4117 CHI2 TEST = 0 CAL_BASE = 2.4451 V CAL_VREF = 2.9732 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:205 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4393 b(slope) = 0.0082 chi2 = 0.8095 CAL_IN P-side : a = 2.4394 b(slope) = 0.0082 chi2 = 0.9473 VTN N-side : a = 0.0100 b(slope) = 0.0104 chi2 = 0.8008 VTN P-side : a = 0.0099 b(slope) = 0.0063 chi2 = 0.6572 VTP N-side = 0.6749 VTP p-side = 0.4168 CHI2 TEST = 1 CAL_BASE = 2.4412 V CAL_VREF = 2.9658 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:305 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.4565 b(slope) = 0.0083 chi2 = 58.4798 CAL_IN P-side : a = 2.4615 b(slope) = 0.0083 chi2 = 20.8079 VTN N-side : a = 0.0095 b(slope) = 0.0103 chi2 = 0.9600 VTN P-side : a = 0.0094 b(slope) = 0.0063 chi2 = 0.4095 VTP N-side = 0.6719 VTP p-side = 0.4137 CHI2 TEST = 0 CAL_BASE = 2.4627 V CAL_VREF = 2.9853 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:405 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4258 b(slope) = 0.0085 chi2 = 0.6696 CAL_IN P-side : a = 2.4258 b(slope) = 0.0085 chi2 = 0.1851 VTN N-side : a = 0.0091 b(slope) = 0.0104 chi2 = 1.2604 VTN P-side : a = 0.0092 b(slope) = 0.0063 chi2 = 0.8758 VTP N-side = 0.6783 VTP p-side = 0.4166 CHI2 TEST = 1 CAL_BASE = 2.4297 V CAL_VREF = 2.9719 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:505 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4704 b(slope) = 0.0083 chi2 = 0.5875 CAL_IN P-side : a = 2.4704 b(slope) = 0.0083 chi2 = 0.3230 VTN N-side : a = 0.0090 b(slope) = 0.0105 chi2 = 1.0465 VTN P-side : a = 0.0093 b(slope) = 0.0064 chi2 = 0.7842 VTP N-side = 0.6822 VTP p-side = 0.4197 CHI2 TEST = 1 CAL_BASE = 2.4722 V CAL_VREF = 3.0066 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:605 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4571 b(slope) = 0.0083 chi2 = 0.6950 CAL_IN P-side : a = 2.4573 b(slope) = 0.0083 chi2 = 1.3065 VTN N-side : a = 0.0096 b(slope) = 0.0105 chi2 = 1.4081 VTN P-side : a = 0.0095 b(slope) = 0.0065 chi2 = 1.0068 VTP N-side = 0.6841 VTP p-side = 0.4234 CHI2 TEST = 1 CAL_BASE = 2.4575 V CAL_VREF = 2.9897 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:705 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4429 b(slope) = 0.0083 chi2 = 0.6628 CAL_IN P-side : a = 2.4431 b(slope) = 0.0083 chi2 = 0.4497 VTN N-side : a = 0.0096 b(slope) = 0.0106 chi2 = 1.5221 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.5087 VTP N-side = 0.6888 VTP p-side = 0.4280 CHI2 TEST = 1 CAL_BASE = 2.4460 V CAL_VREF = 2.9807 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:805 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4420 b(slope) = 0.0083 chi2 = 0.8352 CAL_IN P-side : a = 2.4424 b(slope) = 0.0083 chi2 = 0.4595 VTN N-side : a = 0.0095 b(slope) = 0.0106 chi2 = 0.8635 VTN P-side : a = 0.0093 b(slope) = 0.0065 chi2 = 0.5711 VTP N-side = 0.6908 VTP p-side = 0.4287 CHI2 TEST = 1 CAL_BASE = 2.4448 V CAL_VREF = 2.9773 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1052 FUNCT@5.0V:ATOM13B 1108 FUNCT@5.0V:ATOM13C 1108 FUNCT@5.0V:ATOM15 1096 FUNCT@5.0V:ATOM17 3408 FUNCT@5.0V:ATOM18 3424 FUNCT@5.0V:ATOM18HF 3424 FUNCT@5.0V:ATOM19 3360 FUNCT@5.0V:ATOM19D 3375 FUNCT@5.0V:ATOM19E 2602 FUNCT@5.0V:ATOM19F 6475 FUNCT@5.0V:ATOM19FHF 6475 FUNCT@5.0V:ATOM20 1068 FUNCT@5.0V:ATOM21 1044 FUNCT@5.0V:ATOM22 1032 FUNCT@5.0V:ATOM23 964 FUNCT@5.0V:ATOM24 1064 FUNCT@5.0V:ATOM25 1050 FUNCT@5.0V:ATOM25HF 1050 FUNCT@5.0V:ATOM26A 1029 FUNCT@5.0V:ATOM26B 1838 FUNCT@5.0V:ATOM28 1166 FUNCT@5.0V:ATOM29 1166 FUNCT@5.0V:ATOM30 1166 FUNCT@5.0V:ATOM31A 800 FUNCT@5.0V:ATOM31B 989 FUNCT@5.0V:ATOM32 800 FUNCT@5.0V:ATOM33 1166 FUNCT@5.0V:ATOM35 1300 FUNCT@5.0V:ATOM36 1056 FUNCT@5.0V:ATOM39 1077 FUNCT@5.0V:ATOM41 1603 FUNCT@5.0V:ATOM41A 1603 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3655 FUNCT@5.0V:ATOM45C_40 3655 FUNCT@5.0V:ATOM46C_40 3655 FUNCT@5.0V:ATOM47C_40 3655 FUNCT@5.0V:ATOM48C_40 3655 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3655 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1234 NOISE TEST = 0 error detected at location:1391 TMIN TEST = 1 ---------- CHIP ID:806 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4750 b(slope) = 0.0082 chi2 = 7.0685 CAL_IN P-side : a = 2.4782 b(slope) = 0.0082 chi2 = 2.5507 VTN N-side : a = 0.0092 b(slope) = 0.0106 chi2 = 0.7810 VTN P-side : a = 0.0093 b(slope) = 0.0065 chi2 = 0.6535 VTP N-side = 0.6880 VTP p-side = 0.4272 CHI2 TEST = 1 CAL_BASE = 2.4788 V CAL_VREF = 3.0010 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:706 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4575 b(slope) = 0.0083 chi2 = 0.4766 CAL_IN P-side : a = 2.4578 b(slope) = 0.0083 chi2 = 0.5200 VTN N-side : a = 0.0099 b(slope) = 0.0106 chi2 = 0.6388 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.5678 VTP N-side = 0.6879 VTP p-side = 0.4259 CHI2 TEST = 1 CAL_BASE = 2.4595 V CAL_VREF = 2.9934 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM19F 6657 FUNCT@5.0V:ATOM19FHF 6657 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:606 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4566 b(slope) = 0.0083 chi2 = 0.8496 CAL_IN P-side : a = 2.4566 b(slope) = 0.0083 chi2 = 0.4323 VTN N-side : a = 0.0098 b(slope) = 0.0104 chi2 = 1.1289 VTN P-side : a = 0.0095 b(slope) = 0.0064 chi2 = 0.5730 VTP N-side = 0.6791 VTP p-side = 0.4192 CHI2 TEST = 1 CAL_BASE = 2.4587 V CAL_VREF = 2.9932 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:506 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 0 error detected in test: Location: SUP_SHORT:VDD0 9.9689E-01 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A -1.0000E-38 IDDSB:VDD1A -1.0000E-38 IDDSB:VDD0B -1.0000E-38 IDDSB:VDD1B -1.0000E-38 IDDSB:VDD0C -1.0000E-38 IDDSB:VDD1C -1.0000E-38 IDDSB:VDD0D -1.0000E-38 IDDSB:VDD1D -1.0000E-38 V_AVDD2IPA:249/L9 -1.0000E-38 V_AVDD2IMA:277/L10 -1.0000E-38 AVDD_A:AVDDP-M -1.0000E-38 IAVDD2_A:AVDDP-M -1.0000E-38 V_V1RA:169/L5 -1.0000E-38 V_N310A:171/L6 -1.0000E-38 V_AVDD2IPB:249/L9 -1.0000E-38 V_AVDD2IMB:277/L10 -1.0000E-38 AVDD_B:AVDDP-M -1.0000E-38 IAVDD2_B:AVDDP-M -1.0000E-38 V_V1RB:169/L5 -1.0000E-38 V_N310B:171/L6 -1.0000E-38 V_AVDD2IPC:249/L9 -1.0000E-38 V_AVDD2IMC:277/L10 -1.0000E-38 AVDD_C:AVDDP-M -1.0000E-38 IAVDD2_C:AVDDP-M -1.0000E-38 V_V1RC:169/L5 -1.0000E-38 V_N310C:171/L6 -1.0000E-38 V_AVDD2IPD:249/L9 -1.0000E-38 V_AVDD2IMD:277/L10 -1.0000E-38 AVDD_D:AVDDP-M -1.0000E-38 IAVDD2_D:AVDDP-M -1.0000E-38 V_V1RD:169/L5 -1.0000E-38 V_N310D:171/L6 -1.0000E-38 IDDOP0:AVDD -1.0000E-38 IDDOP1:DVDD -1.0000E-38 DACs TEST = 0 CAL_IN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side = 0.0000 VTP p-side = 0.0000 CHI2 TEST = 0 CAL_BASE = 0.0000 V CAL_VREF = 0.0000 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 0 FUNCT@5.0V:ATOM1TO6B 0 FUNCT@5.0V:ATOM1TO6C 0 FUNCT@5.0V:ATOM1TO6D 0 FUNCT@5.0V:ATOM1TO6E 0 FUNCT@5.0V:ATOM7TO9A 0 FUNCT@5.0V:ATOM7TO9B 0 FUNCT@5.0V:ATOM7TO9C 0 FUNCT@5.0V:ATOM7TO9D 0 FUNCT@5.0V:ATOM7TO9E 0 FUNCT@5.0V:ATOM10TO12 0 FUNCT@5.0V:ATOM13A 0 FUNCT@5.0V:ATOM13B 0 FUNCT@5.0V:ATOM13C 0 FUNCT@5.0V:ATOM14 0 FUNCT@5.0V:ATOM15 0 FUNCT@5.0V:ATOM16 0 FUNCT@5.0V:ATOM17 0 FUNCT@5.0V:ATOM18 0 FUNCT@5.0V:ATOM18HF 0 FUNCT@5.0V:ATOM19 0 FUNCT@5.0V:ATOM19B 0 FUNCT@5.0V:ATOM19C 0 FUNCT@5.0V:ATOM19D 0 FUNCT@5.0V:ATOM19E 0 FUNCT@5.0V:ATOM19F 0 FUNCT@5.0V:ATOM19FHF 0 FUNCT@5.0V:ATOM20 0 FUNCT@5.0V:ATOM21 0 FUNCT@5.0V:ATOM22 0 FUNCT@5.0V:ATOM23 0 FUNCT@5.0V:ATOM24 0 FUNCT@5.0V:ATOM25 0 FUNCT@5.0V:ATOM25HF 0 FUNCT@5.0V:ATOM26A 0 FUNCT@5.0V:ATOM26B 0 FUNCT@5.0V:ATOM27 0 FUNCT@5.0V:ATOM28 0 FUNCT@5.0V:ATOM29 0 FUNCT@5.0V:ATOM30 0 FUNCT@5.0V:ATOM31A 0 FUNCT@5.0V:ATOM31B 0 FUNCT@5.0V:ATOM32 0 FUNCT@5.0V:ATOM33 0 FUNCT@5.0V:ATOM34 0 FUNCT@5.0V:ATOM35 0 FUNCT@5.0V:ATOM36 0 FUNCT@5.0V:ATOM38 0 FUNCT@5.0V:ATOM39 0 FUNCT@5.0V:ATOM40 0 FUNCT@5.0V:ATOM41 0 FUNCT@5.0V:ATOM41A 0 FUNCT@5.0V:ATOM42 0 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 0 FUNCT@5.0V:ATOM45C_40 0 FUNCT@5.0V:ATOM46C_40 0 FUNCT@5.0V:ATOM47C_40 0 FUNCT@5.0V:ATOM48C_40 0 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 0 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 0 FUNCT@5.0V:A10TO12HF 0 FUNCT@5.0V:ADAC37HF 0 CH.MASK TEST = 0 error detected at location:0 NOISE TEST = 0 error detected at location:0 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D -1.0000E-38 TMIN@4.8V:A7_9_60D -1.0000E-38 TMIN@4.8V:A10_12_50D -1.0000E-38 TMIN@4.8V:A10_12_60D -1.0000E-38 TMIN@4.8V:ADAC37_50D -1.0000E-38 TMIN@4.8V:ADAC37_60D -1.0000E-38 TMIN@5.0V:A7_9_50D -1.0000E-38 TMIN@5.0V:A7_9_60D -1.0000E-38 TMIN@5.0V:A10_12_50D -1.0000E-38 TMIN@5.0V:A10_12_60D -1.0000E-38 TMIN@5.0V:ADAC37_50D -1.0000E-38 TMIN@5.0V:ADAC37_60D -1.0000E-38 TMIN@5.2V:A7_9_50D -1.0000E-38 TMIN@5.2V:A7_9_60D -1.0000E-38 TMIN@5.2V:A10_12_50D -1.0000E-38 TMIN@5.2V:A10_12_60D -1.0000E-38 TMIN@5.2V:ADAC37_50D -1.0000E-38 TMIN@5.2V:ADAC37_60D -1.0000E-38 ---------- CHIP ID:406 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4080 b(slope) = 0.0086 chi2 = 0.7812 CAL_IN P-side : a = 2.4080 b(slope) = 0.0086 chi2 = 0.7059 VTN N-side : a = 0.0099 b(slope) = 0.0105 chi2 = 0.9642 VTN P-side : a = 0.0098 b(slope) = 0.0064 chi2 = 0.6048 VTP N-side = 0.6809 VTP p-side = 0.4190 CHI2 TEST = 1 CAL_BASE = 2.4094 V CAL_VREF = 2.9622 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:306 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4025 b(slope) = 0.0085 chi2 = 0.8243 CAL_IN P-side : a = 2.4024 b(slope) = 0.0085 chi2 = 3.0324 VTN N-side : a = 0.0091 b(slope) = 0.0104 chi2 = 1.0745 VTN P-side : a = 0.0095 b(slope) = 0.0064 chi2 = 0.3831 VTP N-side = 0.6771 VTP p-side = 0.4193 CHI2 TEST = 1 CAL_BASE = 2.4072 V CAL_VREF = 2.9534 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:206 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4447 b(slope) = 0.0083 chi2 = 6.1998 CAL_IN P-side : a = 2.4476 b(slope) = 0.0083 chi2 = 5.6414 VTN N-side : a = 0.0094 b(slope) = 0.0103 chi2 = 0.9618 VTN P-side : a = 0.0097 b(slope) = 0.0063 chi2 = 0.5561 VTP N-side = 0.6666 VTP p-side = 0.4117 CHI2 TEST = 1 CAL_BASE = 2.4448 V CAL_VREF = 2.9722 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:107 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4747 b(slope) = 0.0080 chi2 = 1.0162 CAL_IN P-side : a = 2.4744 b(slope) = 0.0080 chi2 = 1.2901 VTN N-side : a = 0.0104 b(slope) = 0.0102 chi2 = 1.3294 VTN P-side : a = 0.0103 b(slope) = 0.0062 chi2 = 0.7257 VTP N-side = 0.6655 VTP p-side = 0.4110 CHI2 TEST = 1 CAL_BASE = 2.4783 V CAL_VREF = 2.9922 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:207 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.4122 b(slope) = 0.0119 chi2 = 99.0000 CAL_IN P-side : a = 2.4515 b(slope) = 0.0109 chi2 = 99.0000 VTN N-side : a = 0.0097 b(slope) = 0.0103 chi2 = 1.0234 VTN P-side : a = 0.0100 b(slope) = 0.0063 chi2 = 0.9989 VTP N-side = 0.6692 VTP p-side = 0.4138 CHI2 TEST = 0 CAL_BASE = 2.4636 V CAL_VREF = 2.9817 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:307 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4334 b(slope) = 0.0083 chi2 = 0.8333 CAL_IN P-side : a = 2.4333 b(slope) = 0.0083 chi2 = 0.8108 VTN N-side : a = 0.0102 b(slope) = 0.0104 chi2 = 0.9134 VTN P-side : a = 0.0102 b(slope) = 0.0063 chi2 = 0.5642 VTP N-side = 0.6747 VTP p-side = 0.4155 CHI2 TEST = 1 CAL_BASE = 2.4385 V CAL_VREF = 2.9719 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:407 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 0 error detected in test: Location: SUP_SHORT:VDD1 5.9488E-01 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A -1.0000E-38 IDDSB:VDD1A -1.0000E-38 IDDSB:VDD0B -1.0000E-38 IDDSB:VDD1B -1.0000E-38 IDDSB:VDD0C -1.0000E-38 IDDSB:VDD1C -1.0000E-38 IDDSB:VDD0D -1.0000E-38 IDDSB:VDD1D -1.0000E-38 V_AVDD2IPA:249/L9 -1.0000E-38 V_AVDD2IMA:277/L10 -1.0000E-38 AVDD_A:AVDDP-M -1.0000E-38 IAVDD2_A:AVDDP-M -1.0000E-38 V_V1RA:169/L5 -1.0000E-38 V_N310A:171/L6 -1.0000E-38 V_AVDD2IPB:249/L9 -1.0000E-38 V_AVDD2IMB:277/L10 -1.0000E-38 AVDD_B:AVDDP-M -1.0000E-38 IAVDD2_B:AVDDP-M -1.0000E-38 V_V1RB:169/L5 -1.0000E-38 V_N310B:171/L6 -1.0000E-38 V_AVDD2IPC:249/L9 -1.0000E-38 V_AVDD2IMC:277/L10 -1.0000E-38 AVDD_C:AVDDP-M -1.0000E-38 IAVDD2_C:AVDDP-M -1.0000E-38 V_V1RC:169/L5 -1.0000E-38 V_N310C:171/L6 -1.0000E-38 V_AVDD2IPD:249/L9 -1.0000E-38 V_AVDD2IMD:277/L10 -1.0000E-38 AVDD_D:AVDDP-M -1.0000E-38 IAVDD2_D:AVDDP-M -1.0000E-38 V_V1RD:169/L5 -1.0000E-38 V_N310D:171/L6 -1.0000E-38 IDDOP0:AVDD -1.0000E-38 IDDOP1:DVDD -1.0000E-38 DACs TEST = 0 CAL_IN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side = 0.0000 VTP p-side = 0.0000 CHI2 TEST = 0 CAL_BASE = 0.0000 V CAL_VREF = 0.0000 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 0 FUNCT@5.0V:ATOM1TO6B 0 FUNCT@5.0V:ATOM1TO6C 0 FUNCT@5.0V:ATOM1TO6D 0 FUNCT@5.0V:ATOM1TO6E 0 FUNCT@5.0V:ATOM7TO9A 0 FUNCT@5.0V:ATOM7TO9B 0 FUNCT@5.0V:ATOM7TO9C 0 FUNCT@5.0V:ATOM7TO9D 0 FUNCT@5.0V:ATOM7TO9E 0 FUNCT@5.0V:ATOM10TO12 0 FUNCT@5.0V:ATOM13A 0 FUNCT@5.0V:ATOM13B 0 FUNCT@5.0V:ATOM13C 0 FUNCT@5.0V:ATOM14 0 FUNCT@5.0V:ATOM15 0 FUNCT@5.0V:ATOM16 0 FUNCT@5.0V:ATOM17 0 FUNCT@5.0V:ATOM18 0 FUNCT@5.0V:ATOM18HF 0 FUNCT@5.0V:ATOM19 0 FUNCT@5.0V:ATOM19B 0 FUNCT@5.0V:ATOM19C 0 FUNCT@5.0V:ATOM19D 0 FUNCT@5.0V:ATOM19E 0 FUNCT@5.0V:ATOM19F 0 FUNCT@5.0V:ATOM19FHF 0 FUNCT@5.0V:ATOM20 0 FUNCT@5.0V:ATOM21 0 FUNCT@5.0V:ATOM22 0 FUNCT@5.0V:ATOM23 0 FUNCT@5.0V:ATOM24 0 FUNCT@5.0V:ATOM25 0 FUNCT@5.0V:ATOM25HF 0 FUNCT@5.0V:ATOM26A 0 FUNCT@5.0V:ATOM26B 0 FUNCT@5.0V:ATOM27 0 FUNCT@5.0V:ATOM28 0 FUNCT@5.0V:ATOM29 0 FUNCT@5.0V:ATOM30 0 FUNCT@5.0V:ATOM31A 0 FUNCT@5.0V:ATOM31B 0 FUNCT@5.0V:ATOM32 0 FUNCT@5.0V:ATOM33 0 FUNCT@5.0V:ATOM34 0 FUNCT@5.0V:ATOM35 0 FUNCT@5.0V:ATOM36 0 FUNCT@5.0V:ATOM38 0 FUNCT@5.0V:ATOM39 0 FUNCT@5.0V:ATOM40 0 FUNCT@5.0V:ATOM41 0 FUNCT@5.0V:ATOM41A 0 FUNCT@5.0V:ATOM42 0 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 0 FUNCT@5.0V:ATOM45C_40 0 FUNCT@5.0V:ATOM46C_40 0 FUNCT@5.0V:ATOM47C_40 0 FUNCT@5.0V:ATOM48C_40 0 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 0 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 0 FUNCT@5.0V:A10TO12HF 0 FUNCT@5.0V:ADAC37HF 0 CH.MASK TEST = 0 error detected at location:0 NOISE TEST = 0 error detected at location:0 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D -1.0000E-38 TMIN@4.8V:A7_9_60D -1.0000E-38 TMIN@4.8V:A10_12_50D -1.0000E-38 TMIN@4.8V:A10_12_60D -1.0000E-38 TMIN@4.8V:ADAC37_50D -1.0000E-38 TMIN@4.8V:ADAC37_60D -1.0000E-38 TMIN@5.0V:A7_9_50D -1.0000E-38 TMIN@5.0V:A7_9_60D -1.0000E-38 TMIN@5.0V:A10_12_50D -1.0000E-38 TMIN@5.0V:A10_12_60D -1.0000E-38 TMIN@5.0V:ADAC37_50D -1.0000E-38 TMIN@5.0V:ADAC37_60D -1.0000E-38 TMIN@5.2V:A7_9_50D -1.0000E-38 TMIN@5.2V:A7_9_60D -1.0000E-38 TMIN@5.2V:A10_12_50D -1.0000E-38 TMIN@5.2V:A10_12_60D -1.0000E-38 TMIN@5.2V:ADAC37_50D -1.0000E-38 TMIN@5.2V:ADAC37_60D -1.0000E-38 ---------- CHIP ID:507 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4457 b(slope) = 0.0085 chi2 = 1.3659 CAL_IN P-side : a = 2.4461 b(slope) = 0.0085 chi2 = 1.0498 VTN N-side : a = 0.0096 b(slope) = 0.0104 chi2 = 1.1042 VTN P-side : a = 0.0098 b(slope) = 0.0063 chi2 = 0.4143 VTP N-side = 0.6769 VTP p-side = 0.4158 CHI2 TEST = 1 CAL_BASE = 2.4509 V CAL_VREF = 2.9944 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:607 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4431 b(slope) = 0.0084 chi2 = 0.6315 CAL_IN P-side : a = 2.4432 b(slope) = 0.0084 chi2 = 0.4308 VTN N-side : a = 0.0098 b(slope) = 0.0104 chi2 = 0.6836 VTN P-side : a = 0.0096 b(slope) = 0.0064 chi2 = 0.5475 VTP N-side = 0.6752 VTP p-side = 0.4195 CHI2 TEST = 1 CAL_BASE = 2.4458 V CAL_VREF = 2.9844 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:707 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4462 b(slope) = 0.0084 chi2 = 2.2725 CAL_IN P-side : a = 2.4465 b(slope) = 0.0084 chi2 = 1.5192 VTN N-side : a = 0.0099 b(slope) = 0.0107 chi2 = 0.6441 VTN P-side : a = 0.0096 b(slope) = 0.0066 chi2 = 0.1926 VTP N-side = 0.6935 VTP p-side = 0.4312 CHI2 TEST = 1 CAL_BASE = 2.4487 V CAL_VREF = 2.9876 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:807 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4836 b(slope) = 0.0080 chi2 = 0.4313 CAL_IN P-side : a = 2.4838 b(slope) = 0.0080 chi2 = 0.3612 VTN N-side : a = 0.0098 b(slope) = 0.0105 chi2 = 0.6812 VTN P-side : a = 0.0097 b(slope) = 0.0065 chi2 = 0.2621 VTP N-side = 0.6819 VTP p-side = 0.4246 CHI2 TEST = 1 CAL_BASE = 2.4861 V CAL_VREF = 3.0007 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:907 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4822 b(slope) = 0.0081 chi2 = 0.7466 CAL_IN P-side : a = 2.4827 b(slope) = 0.0081 chi2 = 0.8218 VTN N-side : a = 0.0099 b(slope) = 0.0107 chi2 = 0.5337 VTN P-side : a = 0.0100 b(slope) = 0.0066 chi2 = 0.5757 VTP N-side = 0.6950 VTP p-side = 0.4349 CHI2 TEST = 1 CAL_BASE = 2.4871 V CAL_VREF = 3.0076 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1046 FUNCT@5.0V:ATOM13B 1102 FUNCT@5.0V:ATOM13C 1102 FUNCT@5.0V:ATOM15 1090 FUNCT@5.0V:ATOM17 3402 FUNCT@5.0V:ATOM18 3418 FUNCT@5.0V:ATOM18HF 3418 FUNCT@5.0V:ATOM19 3354 FUNCT@5.0V:ATOM19D 3369 FUNCT@5.0V:ATOM19E 2596 FUNCT@5.0V:ATOM19F 6469 FUNCT@5.0V:ATOM19FHF 6469 FUNCT@5.0V:ATOM20 1062 FUNCT@5.0V:ATOM21 1038 FUNCT@5.0V:ATOM22 1026 FUNCT@5.0V:ATOM23 958 FUNCT@5.0V:ATOM24 1058 FUNCT@5.0V:ATOM25 1044 FUNCT@5.0V:ATOM25HF 1044 FUNCT@5.0V:ATOM26A 1023 FUNCT@5.0V:ATOM26B 1832 FUNCT@5.0V:ATOM28 1160 FUNCT@5.0V:ATOM29 1160 FUNCT@5.0V:ATOM30 1160 FUNCT@5.0V:ATOM31A 794 FUNCT@5.0V:ATOM31B 983 FUNCT@5.0V:ATOM32 794 FUNCT@5.0V:ATOM33 1160 FUNCT@5.0V:ATOM35 1294 FUNCT@5.0V:ATOM36 1050 FUNCT@5.0V:ATOM39 1071 FUNCT@5.0V:ATOM41 1597 FUNCT@5.0V:ATOM41A 1597 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3649 FUNCT@5.0V:ATOM45C_40 3649 FUNCT@5.0V:ATOM46C_40 3649 FUNCT@5.0V:ATOM47C_40 3649 FUNCT@5.0V:ATOM48C_40 3649 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3649 HF TEST = 1 CH.MASK TEST = 0 error detected at location:1227 NOISE TEST = 0 error detected at location:1385 TMIN TEST = 1 ---------- CHIP ID:908 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4833 b(slope) = 0.0081 chi2 = 0.9752 CAL_IN P-side : a = 2.4834 b(slope) = 0.0081 chi2 = 0.7694 VTN N-side : a = 0.0100 b(slope) = 0.0106 chi2 = 0.6008 VTN P-side : a = 0.0099 b(slope) = 0.0066 chi2 = 0.6676 VTP N-side = 0.6925 VTP p-side = 0.4335 CHI2 TEST = 1 CAL_BASE = 2.4861 V CAL_VREF = 3.0027 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4565 FUNCT@5.0V:ATOM45C_40 4565 FUNCT@5.0V:ATOM46C_40 4565 FUNCT@5.0V:ATOM47C_40 4565 FUNCT@5.0V:ATOM48C_40 4565 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4565 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:808 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4783 b(slope) = 0.0081 chi2 = 0.8052 CAL_IN P-side : a = 2.4784 b(slope) = 0.0081 chi2 = 1.5720 VTN N-side : a = 0.0098 b(slope) = 0.0107 chi2 = 0.6948 VTN P-side : a = 0.0099 b(slope) = 0.0066 chi2 = 0.6909 VTP N-side = 0.6924 VTP p-side = 0.4337 CHI2 TEST = 1 CAL_BASE = 2.4792 V CAL_VREF = 3.0007 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM18 13312 FUNCT@5.0V:ATOM18HF 13312 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:708 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4813 b(slope) = 0.0082 chi2 = 0.7818 CAL_IN P-side : a = 2.4815 b(slope) = 0.0082 chi2 = 1.0461 VTN N-side : a = 0.0100 b(slope) = 0.0106 chi2 = 0.9503 VTN P-side : a = 0.0098 b(slope) = 0.0065 chi2 = 0.4798 VTP N-side = 0.6881 VTP p-side = 0.4286 CHI2 TEST = 1 CAL_BASE = 2.4817 V CAL_VREF = 3.0076 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1404 TMIN TEST = 1 ---------- CHIP ID:608 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4845 b(slope) = 0.0082 chi2 = 0.8013 CAL_IN P-side : a = 2.4847 b(slope) = 0.0082 chi2 = 0.6581 VTN N-side : a = 0.0100 b(slope) = 0.0105 chi2 = 0.6751 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.8618 VTP N-side = 0.6844 VTP p-side = 0.4265 CHI2 TEST = 1 CAL_BASE = 2.4880 V CAL_VREF = 3.0107 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1559 FUNCT@5.0V:ATOM15 1603 FUNCT@5.0V:ATOM17 3915 FUNCT@5.0V:ATOM18 3931 FUNCT@5.0V:ATOM18HF 3931 FUNCT@5.0V:ATOM19 3867 FUNCT@5.0V:ATOM19D 3882 FUNCT@5.0V:ATOM19E 3109 FUNCT@5.0V:ATOM19F 6982 FUNCT@5.0V:ATOM19FHF 6982 FUNCT@5.0V:ATOM20 1575 FUNCT@5.0V:ATOM21 1551 FUNCT@5.0V:ATOM22 1539 FUNCT@5.0V:ATOM25 1557 FUNCT@5.0V:ATOM25HF 1557 FUNCT@5.0V:ATOM26A 1536 FUNCT@5.0V:ATOM26B 2345 FUNCT@5.0V:ATOM28 1673 FUNCT@5.0V:ATOM29 1673 FUNCT@5.0V:ATOM30 1673 FUNCT@5.0V:ATOM31A 1307 FUNCT@5.0V:ATOM31B 1496 FUNCT@5.0V:ATOM32 1307 FUNCT@5.0V:ATOM33 1673 FUNCT@5.0V:ATOM35 1807 FUNCT@5.0V:ATOM36 1563 FUNCT@5.0V:ATOM39 1584 FUNCT@5.0V:ATOM41 2110 FUNCT@5.0V:ATOM41A 2110 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5743 FUNCT@5.0V:ATOM45C_40 3715 FUNCT@5.0V:ATOM46C_40 3683 FUNCT@5.0V:ATOM47C_40 4647 FUNCT@5.0V:ATOM48C_40 5743 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5743 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:508 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5265 b(slope) = 0.0080 chi2 = 1.0181 CAL_IN P-side : a = 2.5267 b(slope) = 0.0080 chi2 = 0.9818 VTN N-side : a = 0.0099 b(slope) = 0.0106 chi2 = 1.3969 VTN P-side : a = 0.0099 b(slope) = 0.0065 chi2 = 0.6249 VTP N-side = 0.6875 VTP p-side = 0.4245 CHI2 TEST = 1 CAL_BASE = 2.5291 V CAL_VREF = 3.0381 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 1832 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:408 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4505 b(slope) = 0.0084 chi2 = 0.6503 CAL_IN P-side : a = 2.4509 b(slope) = 0.0084 chi2 = 0.4339 VTN N-side : a = 0.0095 b(slope) = 0.0106 chi2 = 1.0925 VTN P-side : a = 0.0098 b(slope) = 0.0065 chi2 = 0.9477 VTP N-side = 0.6863 VTP p-side = 0.4236 CHI2 TEST = 1 CAL_BASE = 2.4548 V CAL_VREF = 2.9910 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:308 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4345 b(slope) = 0.0084 chi2 = 1.0603 CAL_IN P-side : a = 2.4348 b(slope) = 0.0084 chi2 = 1.0068 VTN N-side : a = 0.0098 b(slope) = 0.0105 chi2 = 1.3086 VTN P-side : a = 0.0098 b(slope) = 0.0064 chi2 = 0.5947 VTP N-side = 0.6810 VTP p-side = 0.4228 CHI2 TEST = 1 CAL_BASE = 2.4370 V CAL_VREF = 2.9724 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:208 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4472 b(slope) = 0.0082 chi2 = 0.8968 CAL_IN P-side : a = 2.4478 b(slope) = 0.0082 chi2 = 1.0675 VTN N-side : a = 0.0104 b(slope) = 0.0104 chi2 = 1.0254 VTN P-side : a = 0.0101 b(slope) = 0.0064 chi2 = 0.5462 VTP N-side = 0.6751 VTP p-side = 0.4185 CHI2 TEST = 1 CAL_BASE = 2.4485 V CAL_VREF = 2.9724 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1401 TMIN TEST = 1 ---------- CHIP ID:108 ------------------ CLASS = B && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 100 CAL_IN N-side : a = 2.4420 b(slope) = 0.0083 chi2 = 12.9307 CAL_IN P-side : a = 2.4448 b(slope) = 0.0083 chi2 = 2.4805 VTN N-side : a = 0.0109 b(slope) = 0.0103 chi2 = 1.3294 VTN P-side : a = 0.0108 b(slope) = 0.0063 chi2 = 0.9458 VTP N-side = 0.6707 VTP p-side = 0.4161 CHI2 TEST = 100 CAL_BASE = 2.4468 V CAL_VREF = 2.9744 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM17 5536 FUNCT@5.0V:ATOM18 6636 FUNCT@5.0V:ATOM19 5488 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM36 4017 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:209 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4749 b(slope) = 0.0080 chi2 = 1.8292 CAL_IN P-side : a = 2.4754 b(slope) = 0.0080 chi2 = 1.2058 VTN N-side : a = 0.0105 b(slope) = 0.0103 chi2 = 0.8536 VTN P-side : a = 0.0105 b(slope) = 0.0063 chi2 = 0.4197 VTP N-side = 0.6732 VTP p-side = 0.4155 CHI2 TEST = 1 CAL_BASE = 2.4761 V CAL_VREF = 2.9912 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1408 TMIN TEST = 1 ---------- CHIP ID:309 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4547 b(slope) = 0.0082 chi2 = 0.6655 CAL_IN P-side : a = 2.4549 b(slope) = 0.0082 chi2 = 0.6218 VTN N-side : a = 0.0106 b(slope) = 0.0104 chi2 = 1.2924 VTN P-side : a = 0.0105 b(slope) = 0.0064 chi2 = 0.6641 VTP N-side = 0.6756 VTP p-side = 0.4182 CHI2 TEST = 1 CAL_BASE = 2.4558 V CAL_VREF = 2.9851 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM18HF 13763 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3409 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 1851 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 1973 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1607 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2107 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:409 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4524 b(slope) = 0.0084 chi2 = 0.8568 CAL_IN P-side : a = 2.4524 b(slope) = 0.0084 chi2 = 0.6764 VTN N-side : a = 0.0101 b(slope) = 0.0105 chi2 = 0.7820 VTN P-side : a = 0.0098 b(slope) = 0.0064 chi2 = 0.6002 VTP N-side = 0.6806 VTP p-side = 0.4190 CHI2 TEST = 1 CAL_BASE = 2.4553 V CAL_VREF = 2.9941 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:509 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4368 b(slope) = 0.0086 chi2 = 1.5622 CAL_IN P-side : a = 2.4372 b(slope) = 0.0086 chi2 = 1.3418 VTN N-side : a = 0.0092 b(slope) = 0.0106 chi2 = 1.6109 VTN P-side : a = 0.0097 b(slope) = 0.0065 chi2 = 0.4374 VTP N-side = 0.6902 VTP p-side = 0.4256 CHI2 TEST = 1 CAL_BASE = 2.4397 V CAL_VREF = 2.9912 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:609 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4959 b(slope) = 0.0082 chi2 = 0.8072 CAL_IN P-side : a = 2.4964 b(slope) = 0.0081 chi2 = 2.5914 VTN N-side : a = 0.0101 b(slope) = 0.0105 chi2 = 0.9676 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.7147 VTP N-side = 0.6857 VTP p-side = 0.4263 CHI2 TEST = 1 CAL_BASE = 2.5000 V CAL_VREF = 3.0222 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 0 error detected at location:1402 TMIN TEST = 1 ---------- CHIP ID:709 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.4138 b(slope) = 0.0112 chi2 = 99.0000 CAL_IN P-side : a = 2.4430 b(slope) = 0.0108 chi2 = 99.0000 VTN N-side : a = 0.0098 b(slope) = 0.0105 chi2 = 0.7016 VTN P-side : a = 0.0098 b(slope) = 0.0065 chi2 = 0.8298 VTP N-side = 0.6846 VTP p-side = 0.4251 CHI2 TEST = 0 CAL_BASE = 2.4551 V CAL_VREF = 2.9944 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1859 FUNCT@5.0V:ATOM15 1903 FUNCT@5.0V:ATOM17 4215 FUNCT@5.0V:ATOM18 4231 FUNCT@5.0V:ATOM18HF 4231 FUNCT@5.0V:ATOM19 5251 FUNCT@5.0V:ATOM19E 3408 FUNCT@5.0V:ATOM19F 7281 FUNCT@5.0V:ATOM19FHF 7281 FUNCT@5.0V:ATOM20 1874 FUNCT@5.0V:ATOM21 1850 FUNCT@5.0V:ATOM22 1838 FUNCT@5.0V:ATOM25 1856 FUNCT@5.0V:ATOM25HF 1856 FUNCT@5.0V:ATOM26A 1835 FUNCT@5.0V:ATOM26B 2644 FUNCT@5.0V:ATOM28 1972 FUNCT@5.0V:ATOM29 1972 FUNCT@5.0V:ATOM30 1974 FUNCT@5.0V:ATOM31A 1606 FUNCT@5.0V:ATOM31B 1795 FUNCT@5.0V:ATOM32 1608 FUNCT@5.0V:ATOM35 2106 FUNCT@5.0V:ATOM36 1863 FUNCT@5.0V:ATOM39 1885 FUNCT@5.0V:ATOM41 2410 FUNCT@5.0V:ATOM41A 2410 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:809 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4828 b(slope) = 0.0081 chi2 = 0.6962 CAL_IN P-side : a = 2.4828 b(slope) = 0.0081 chi2 = 0.5172 VTN N-side : a = 0.0100 b(slope) = 0.0107 chi2 = 1.1083 VTN P-side : a = 0.0097 b(slope) = 0.0066 chi2 = 1.1693 VTP N-side = 0.6929 VTP p-side = 0.4335 CHI2 TEST = 1 CAL_BASE = 2.4895 V CAL_VREF = 3.0073 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:810 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 3.0241 b(slope) = 0.0016 chi2 = 99.0000 CAL_IN P-side : a = 2.9964 b(slope) = 0.0019 chi2 = 99.0000 VTN N-side : a = 0.0104 b(slope) = 0.0108 chi2 = 1.7323 VTN P-side : a = 0.0100 b(slope) = 0.0067 chi2 = 0.8793 VTP N-side = 0.7042 VTP p-side = 0.4390 CHI2 TEST = 0 CAL_BASE = 2.5022 V CAL_VREF = 3.0232 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:710 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 0 error detected in test: Location: SUP_SHORT:VDD1 6.7618E-01 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A -1.0000E-38 IDDSB:VDD1A -1.0000E-38 IDDSB:VDD0B -1.0000E-38 IDDSB:VDD1B -1.0000E-38 IDDSB:VDD0C -1.0000E-38 IDDSB:VDD1C -1.0000E-38 IDDSB:VDD0D -1.0000E-38 IDDSB:VDD1D -1.0000E-38 V_AVDD2IPA:249/L9 -1.0000E-38 V_AVDD2IMA:277/L10 -1.0000E-38 AVDD_A:AVDDP-M -1.0000E-38 IAVDD2_A:AVDDP-M -1.0000E-38 V_V1RA:169/L5 -1.0000E-38 V_N310A:171/L6 -1.0000E-38 V_AVDD2IPB:249/L9 -1.0000E-38 V_AVDD2IMB:277/L10 -1.0000E-38 AVDD_B:AVDDP-M -1.0000E-38 IAVDD2_B:AVDDP-M -1.0000E-38 V_V1RB:169/L5 -1.0000E-38 V_N310B:171/L6 -1.0000E-38 V_AVDD2IPC:249/L9 -1.0000E-38 V_AVDD2IMC:277/L10 -1.0000E-38 AVDD_C:AVDDP-M -1.0000E-38 IAVDD2_C:AVDDP-M -1.0000E-38 V_V1RC:169/L5 -1.0000E-38 V_N310C:171/L6 -1.0000E-38 V_AVDD2IPD:249/L9 -1.0000E-38 V_AVDD2IMD:277/L10 -1.0000E-38 AVDD_D:AVDDP-M -1.0000E-38 IAVDD2_D:AVDDP-M -1.0000E-38 V_V1RD:169/L5 -1.0000E-38 V_N310D:171/L6 -1.0000E-38 IDDOP0:AVDD -1.0000E-38 IDDOP1:DVDD -1.0000E-38 DACs TEST = 0 CAL_IN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side = 0.0000 VTP p-side = 0.0000 CHI2 TEST = 0 CAL_BASE = 0.0000 V CAL_VREF = 0.0000 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 0 FUNCT@5.0V:ATOM1TO6B 0 FUNCT@5.0V:ATOM1TO6C 0 FUNCT@5.0V:ATOM1TO6D 0 FUNCT@5.0V:ATOM1TO6E 0 FUNCT@5.0V:ATOM7TO9A 0 FUNCT@5.0V:ATOM7TO9B 0 FUNCT@5.0V:ATOM7TO9C 0 FUNCT@5.0V:ATOM7TO9D 0 FUNCT@5.0V:ATOM7TO9E 0 FUNCT@5.0V:ATOM10TO12 0 FUNCT@5.0V:ATOM13A 0 FUNCT@5.0V:ATOM13B 0 FUNCT@5.0V:ATOM13C 0 FUNCT@5.0V:ATOM14 0 FUNCT@5.0V:ATOM15 0 FUNCT@5.0V:ATOM16 0 FUNCT@5.0V:ATOM17 0 FUNCT@5.0V:ATOM18 0 FUNCT@5.0V:ATOM18HF 0 FUNCT@5.0V:ATOM19 0 FUNCT@5.0V:ATOM19B 0 FUNCT@5.0V:ATOM19C 0 FUNCT@5.0V:ATOM19D 0 FUNCT@5.0V:ATOM19E 0 FUNCT@5.0V:ATOM19F 0 FUNCT@5.0V:ATOM19FHF 0 FUNCT@5.0V:ATOM20 0 FUNCT@5.0V:ATOM21 0 FUNCT@5.0V:ATOM22 0 FUNCT@5.0V:ATOM23 0 FUNCT@5.0V:ATOM24 0 FUNCT@5.0V:ATOM25 0 FUNCT@5.0V:ATOM25HF 0 FUNCT@5.0V:ATOM26A 0 FUNCT@5.0V:ATOM26B 0 FUNCT@5.0V:ATOM27 0 FUNCT@5.0V:ATOM28 0 FUNCT@5.0V:ATOM29 0 FUNCT@5.0V:ATOM30 0 FUNCT@5.0V:ATOM31A 0 FUNCT@5.0V:ATOM31B 0 FUNCT@5.0V:ATOM32 0 FUNCT@5.0V:ATOM33 0 FUNCT@5.0V:ATOM34 0 FUNCT@5.0V:ATOM35 0 FUNCT@5.0V:ATOM36 0 FUNCT@5.0V:ATOM38 0 FUNCT@5.0V:ATOM39 0 FUNCT@5.0V:ATOM40 0 FUNCT@5.0V:ATOM41 0 FUNCT@5.0V:ATOM41A 0 FUNCT@5.0V:ATOM42 0 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 0 FUNCT@5.0V:ATOM45C_40 0 FUNCT@5.0V:ATOM46C_40 0 FUNCT@5.0V:ATOM47C_40 0 FUNCT@5.0V:ATOM48C_40 0 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 0 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 0 FUNCT@5.0V:A10TO12HF 0 FUNCT@5.0V:ADAC37HF 0 CH.MASK TEST = 0 error detected at location:0 NOISE TEST = 0 error detected at location:0 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D -1.0000E-38 TMIN@4.8V:A7_9_60D -1.0000E-38 TMIN@4.8V:A10_12_50D -1.0000E-38 TMIN@4.8V:A10_12_60D -1.0000E-38 TMIN@4.8V:ADAC37_50D -1.0000E-38 TMIN@4.8V:ADAC37_60D -1.0000E-38 TMIN@5.0V:A7_9_50D -1.0000E-38 TMIN@5.0V:A7_9_60D -1.0000E-38 TMIN@5.0V:A10_12_50D -1.0000E-38 TMIN@5.0V:A10_12_60D -1.0000E-38 TMIN@5.0V:ADAC37_50D -1.0000E-38 TMIN@5.0V:ADAC37_60D -1.0000E-38 TMIN@5.2V:A7_9_50D -1.0000E-38 TMIN@5.2V:A7_9_60D -1.0000E-38 TMIN@5.2V:A10_12_50D -1.0000E-38 TMIN@5.2V:A10_12_60D -1.0000E-38 TMIN@5.2V:ADAC37_50D -1.0000E-38 TMIN@5.2V:ADAC37_60D -1.0000E-38 ---------- CHIP ID:610 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4756 b(slope) = 0.0085 chi2 = 0.6722 CAL_IN P-side : a = 2.4755 b(slope) = 0.0085 chi2 = 0.8339 VTN N-side : a = 0.0099 b(slope) = 0.0108 chi2 = 1.2876 VTN P-side : a = 0.0098 b(slope) = 0.0066 chi2 = 0.5352 VTP N-side = 0.6996 VTP p-side = 0.4328 CHI2 TEST = 1 CAL_BASE = 2.4766 V CAL_VREF = 3.0188 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:510 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4868 b(slope) = 0.0083 chi2 = 1.1809 CAL_IN P-side : a = 2.4867 b(slope) = 0.0083 chi2 = 0.9953 VTN N-side : a = 0.0105 b(slope) = 0.0107 chi2 = 1.7464 VTN P-side : a = 0.0101 b(slope) = 0.0065 chi2 = 0.9611 VTP N-side = 0.6951 VTP p-side = 0.4288 CHI2 TEST = 1 CAL_BASE = 2.4885 V CAL_VREF = 3.0205 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:410 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4760 b(slope) = 0.0082 chi2 = 0.9165 CAL_IN P-side : a = 2.4764 b(slope) = 0.0082 chi2 = 4.3790 VTN N-side : a = 0.0102 b(slope) = 0.0106 chi2 = 1.2722 VTN P-side : a = 0.0100 b(slope) = 0.0064 chi2 = 1.3857 VTP N-side = 0.6859 VTP p-side = 0.4219 CHI2 TEST = 1 CAL_BASE = 2.4785 V CAL_VREF = 3.0061 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 227 FUNCT@5.0V:ATOM1TO6B 227 FUNCT@5.0V:ATOM1TO6C 227 FUNCT@5.0V:ATOM1TO6D 227 FUNCT@5.0V:ATOM1TO6E 227 FUNCT@5.0V:ATOM7TO9A 271 FUNCT@5.0V:ATOM7TO9B 271 FUNCT@5.0V:ATOM7TO9C 271 FUNCT@5.0V:ATOM7TO9D 271 FUNCT@5.0V:ATOM7TO9E 271 FUNCT@5.0V:ATOM10TO12 495 FUNCT@5.0V:ATOM13A 1042 FUNCT@5.0V:ATOM13B 1098 FUNCT@5.0V:ATOM13C 1098 FUNCT@5.0V:ATOM15 1086 FUNCT@5.0V:ATOM17 3398 FUNCT@5.0V:ATOM18 3414 FUNCT@5.0V:ATOM18HF 3414 FUNCT@5.0V:ATOM19 3350 FUNCT@5.0V:ATOM19D 3365 FUNCT@5.0V:ATOM19E 2592 FUNCT@5.0V:ATOM19F 6465 FUNCT@5.0V:ATOM19FHF 6465 FUNCT@5.0V:ATOM20 1058 FUNCT@5.0V:ATOM21 1034 FUNCT@5.0V:ATOM22 1022 FUNCT@5.0V:ATOM23 954 FUNCT@5.0V:ATOM24 1054 FUNCT@5.0V:ATOM25 1040 FUNCT@5.0V:ATOM25HF 1040 FUNCT@5.0V:ATOM26A 1019 FUNCT@5.0V:ATOM26B 1828 FUNCT@5.0V:ATOM28 1156 FUNCT@5.0V:ATOM29 1156 FUNCT@5.0V:ATOM30 1156 FUNCT@5.0V:ATOM31A 790 FUNCT@5.0V:ATOM31B 979 FUNCT@5.0V:ATOM32 790 FUNCT@5.0V:ATOM33 1156 FUNCT@5.0V:ATOM35 1290 FUNCT@5.0V:ATOM36 1046 FUNCT@5.0V:ATOM39 1067 FUNCT@5.0V:ATOM41 1593 FUNCT@5.0V:ATOM41A 1593 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3646 FUNCT@5.0V:ATOM45C_40 3646 FUNCT@5.0V:ATOM46C_40 3646 FUNCT@5.0V:ATOM47C_40 3646 FUNCT@5.0V:ATOM48C_40 3646 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3646 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 271 FUNCT@5.0V:A10TO12HF 495 FUNCT@5.0V:ADAC37HF 271 CH.MASK TEST = 0 error detected at location:1224 NOISE TEST = 0 error detected at location:1381 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D 9.0000E-08 TMIN@4.8V:A7_9_60D 9.0000E-08 TMIN@4.8V:A10_12_50D 9.0000E-08 TMIN@4.8V:A10_12_60D 9.0000E-08 TMIN@4.8V:ADAC37_50D 9.0000E-08 TMIN@4.8V:ADAC37_60D 9.0000E-08 TMIN@5.0V:A7_9_50D 9.0000E-08 TMIN@5.0V:A7_9_60D 9.0000E-08 TMIN@5.0V:A10_12_50D 9.0000E-08 TMIN@5.0V:A10_12_60D 9.0000E-08 TMIN@5.0V:ADAC37_50D 9.0000E-08 TMIN@5.0V:ADAC37_60D 9.0000E-08 TMIN@5.2V:A7_9_50D 9.0000E-08 TMIN@5.2V:A7_9_60D 9.0000E-08 TMIN@5.2V:A10_12_50D 9.0000E-08 TMIN@5.2V:A10_12_60D 9.0000E-08 TMIN@5.2V:ADAC37_50D 9.0000E-08 TMIN@5.2V:ADAC37_60D 9.0000E-08 ---------- CHIP ID:310 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4481 b(slope) = 0.0083 chi2 = 2.2444 CAL_IN P-side : a = 2.4486 b(slope) = 0.0083 chi2 = 2.0449 VTN N-side : a = 0.0106 b(slope) = 0.0103 chi2 = 1.6489 VTN P-side : a = 0.0102 b(slope) = 0.0064 chi2 = 0.9208 VTP N-side = 0.6732 VTP p-side = 0.4179 CHI2 TEST = 1 CAL_BASE = 2.4512 V CAL_VREF = 2.9861 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM17 6620 FUNCT@5.0V:ATOM18 12917 FUNCT@5.0V:ATOM19F 8603 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:210 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 100 CAL_IN N-side : a = 2.4621 b(slope) = 0.0082 chi2 = 0.6958 CAL_IN P-side : a = 2.4603 b(slope) = 0.0083 chi2 = 15.6054 VTN N-side : a = 0.0107 b(slope) = 0.0106 chi2 = 0.9151 VTN P-side : a = 0.0104 b(slope) = 0.0065 chi2 = 0.8033 VTP N-side = 0.6913 VTP p-side = 0.4295 CHI2 TEST = 100 CAL_BASE = 2.4666 V CAL_VREF = 2.9924 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 1223 FUNCT@5.0V:ATOM13B 1279 FUNCT@5.0V:ATOM13C 1279 FUNCT@5.0V:ATOM15 1267 FUNCT@5.0V:ATOM17 3579 FUNCT@5.0V:ATOM18 3595 FUNCT@5.0V:ATOM18HF 3595 FUNCT@5.0V:ATOM19 3531 FUNCT@5.0V:ATOM19D 3546 FUNCT@5.0V:ATOM19E 2773 FUNCT@5.0V:ATOM19F 6646 FUNCT@5.0V:ATOM19FHF 6646 FUNCT@5.0V:ATOM20 1239 FUNCT@5.0V:ATOM21 1215 FUNCT@5.0V:ATOM22 1203 FUNCT@5.0V:ATOM25 1221 FUNCT@5.0V:ATOM25HF 1221 FUNCT@5.0V:ATOM26A 1200 FUNCT@5.0V:ATOM26B 2009 FUNCT@5.0V:ATOM28 1337 FUNCT@5.0V:ATOM29 1337 FUNCT@5.0V:ATOM30 1337 FUNCT@5.0V:ATOM31A 971 FUNCT@5.0V:ATOM31B 1160 FUNCT@5.0V:ATOM32 971 FUNCT@5.0V:ATOM33 1337 FUNCT@5.0V:ATOM35 1471 FUNCT@5.0V:ATOM36 1227 FUNCT@5.0V:ATOM39 1248 FUNCT@5.0V:ATOM41 1774 FUNCT@5.0V:ATOM41A 1774 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3747 FUNCT@5.0V:ATOM45C_40 3747 FUNCT@5.0V:ATOM46C_40 3747 FUNCT@5.0V:ATOM47C_40 3667 FUNCT@5.0V:ATOM48C_40 3747 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3747 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:211 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4488 b(slope) = 0.0083 chi2 = 0.6391 CAL_IN P-side : a = 2.4489 b(slope) = 0.0083 chi2 = 0.7527 VTN N-side : a = 0.0104 b(slope) = 0.0105 chi2 = 1.3442 VTN P-side : a = 0.0102 b(slope) = 0.0064 chi2 = 0.8666 VTP N-side = 0.6840 VTP p-side = 0.4197 CHI2 TEST = 1 CAL_BASE = 2.4529 V CAL_VREF = 2.9871 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4631 FUNCT@5.0V:ATOM45C_40 4631 FUNCT@5.0V:ATOM46C_40 4067 FUNCT@5.0V:ATOM47C_40 4281 FUNCT@5.0V:ATOM48C_40 4631 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4631 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:311 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.4876 b(slope) = 0.0085 chi2 = 99.0000 CAL_IN P-side : a = 2.4920 b(slope) = 0.0088 chi2 = 99.0000 VTN N-side : a = 0.0099 b(slope) = 0.0105 chi2 = 0.6346 VTN P-side : a = 0.0098 b(slope) = 0.0064 chi2 = 0.2913 VTP N-side = 0.6805 VTP p-side = 0.4196 CHI2 TEST = 0 CAL_BASE = 2.4971 V CAL_VREF = 3.0134 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:411 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4772 b(slope) = 0.0082 chi2 = 2.2501 CAL_IN P-side : a = 2.4775 b(slope) = 0.0082 chi2 = 2.3312 VTN N-side : a = 0.0096 b(slope) = 0.0105 chi2 = 1.1359 VTN P-side : a = 0.0099 b(slope) = 0.0064 chi2 = 1.3517 VTP N-side = 0.6837 VTP p-side = 0.4230 CHI2 TEST = 1 CAL_BASE = 2.4832 V CAL_VREF = 3.0115 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:511 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4717 b(slope) = 0.0083 chi2 = 1.5530 CAL_IN P-side : a = 2.4721 b(slope) = 0.0083 chi2 = 1.9337 VTN N-side : a = 0.0101 b(slope) = 0.0107 chi2 = 0.7726 VTN P-side : a = 0.0101 b(slope) = 0.0066 chi2 = 0.4131 VTP N-side = 0.6943 VTP p-side = 0.4309 CHI2 TEST = 1 CAL_BASE = 2.4736 V CAL_VREF = 3.0078 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 1919 FUNCT@5.0V:ATOM13C 1919 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 4067 FUNCT@5.0V:ATOM45C_40 4067 FUNCT@5.0V:ATOM46C_40 3669 FUNCT@5.0V:ATOM47C_40 4067 FUNCT@5.0V:ATOM48C_40 4067 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 4067 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:611 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4879 b(slope) = 0.0082 chi2 = 1.1343 CAL_IN P-side : a = 2.4881 b(slope) = 0.0082 chi2 = 1.3417 VTN N-side : a = 0.0107 b(slope) = 0.0107 chi2 = 0.6087 VTN P-side : a = 0.0105 b(slope) = 0.0066 chi2 = 0.5534 VTP N-side = 0.6978 VTP p-side = 0.4343 CHI2 TEST = 1 CAL_BASE = 2.4944 V CAL_VREF = 3.0195 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:711 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4707 b(slope) = 0.0084 chi2 = 1.0549 CAL_IN P-side : a = 2.4709 b(slope) = 0.0084 chi2 = 1.4025 VTN N-side : a = 0.0112 b(slope) = 0.0109 chi2 = 2.4674 VTN P-side : a = 0.0107 b(slope) = 0.0068 chi2 = 1.3241 VTP N-side = 0.7066 VTP p-side = 0.4444 CHI2 TEST = 1 CAL_BASE = 2.4746 V CAL_VREF = 3.0134 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:811 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4942 b(slope) = 0.0081 chi2 = 1.0492 CAL_IN P-side : a = 2.4942 b(slope) = 0.0081 chi2 = 0.8306 VTN N-side : a = 0.0107 b(slope) = 0.0108 chi2 = 1.7760 VTN P-side : a = 0.0102 b(slope) = 0.0067 chi2 = 0.9209 VTP N-side = 0.7014 VTP p-side = 0.4385 CHI2 TEST = 1 CAL_BASE = 2.4983 V CAL_VREF = 3.0166 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 5536 FUNCT@5.0V:ATOM18 10749 FUNCT@5.0V:ATOM19F 8603 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM31B 2033 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:812 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5043 b(slope) = 0.0082 chi2 = 0.7814 CAL_IN P-side : a = 2.5046 b(slope) = 0.0082 chi2 = 0.4512 VTN N-side : a = 0.0100 b(slope) = 0.0109 chi2 = 1.7279 VTN P-side : a = 0.0100 b(slope) = 0.0068 chi2 = 0.9322 VTP N-side = 0.7105 VTP p-side = 0.4442 CHI2 TEST = 1 CAL_BASE = 2.5103 V CAL_VREF = 3.0347 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 5887 FUNCT@5.0V:ATOM45C_40 5887 FUNCT@5.0V:ATOM46C_40 5887 FUNCT@5.0V:ATOM47C_40 3667 FUNCT@5.0V:ATOM48C_40 5887 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 5887 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:712 ------------------ CLASS = A && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4983 b(slope) = 0.0083 chi2 = 1.8652 CAL_IN P-side : a = 2.4985 b(slope) = 0.0082 chi2 = 2.2326 VTN N-side : a = 0.0102 b(slope) = 0.0108 chi2 = 0.7974 VTN P-side : a = 0.0100 b(slope) = 0.0067 chi2 = 0.5433 VTP N-side = 0.7029 VTP p-side = 0.4378 CHI2 TEST = 1 CAL_BASE = 2.5049 V CAL_VREF = 3.0357 V DIGITAL FUNC. TEST = 1 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:612 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4900 b(slope) = 0.0083 chi2 = 1.0133 CAL_IN P-side : a = 2.4903 b(slope) = 0.0083 chi2 = 0.9795 VTN N-side : a = 0.0098 b(slope) = 0.0108 chi2 = 0.7375 VTN P-side : a = 0.0098 b(slope) = 0.0066 chi2 = 0.4611 VTP N-side = 0.7041 VTP p-side = 0.4351 CHI2 TEST = 1 CAL_BASE = 2.4973 V CAL_VREF = 3.0317 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM18HF 11487 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:512 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4892 b(slope) = 0.0084 chi2 = 1.3775 CAL_IN P-side : a = 2.4890 b(slope) = 0.0084 chi2 = 0.8834 VTN N-side : a = 0.0100 b(slope) = 0.0108 chi2 = 1.6457 VTN P-side : a = 0.0100 b(slope) = 0.0066 chi2 = 0.7298 VTP N-side = 0.7019 VTP p-side = 0.4340 CHI2 TEST = 1 CAL_BASE = 2.4939 V CAL_VREF = 3.0315 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 1 TMIN TEST = 1 ---------- CHIP ID:412 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4822 b(slope) = 0.0083 chi2 = 1.3885 CAL_IN P-side : a = 2.4823 b(slope) = 0.0083 chi2 = 0.9368 VTN N-side : a = 0.0103 b(slope) = 0.0105 chi2 = 0.5347 VTN P-side : a = 0.0103 b(slope) = 0.0064 chi2 = 0.3638 VTP N-side = 0.6863 VTP p-side = 0.4220 CHI2 TEST = 1 CAL_BASE = 2.4844 V CAL_VREF = 3.0139 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:312 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4706 b(slope) = 0.0083 chi2 = 1.5727 CAL_IN P-side : a = 2.4709 b(slope) = 0.0083 chi2 = 1.6325 VTN N-side : a = 0.0099 b(slope) = 0.0106 chi2 = 0.7781 VTN P-side : a = 0.0100 b(slope) = 0.0065 chi2 = 0.8034 VTP N-side = 0.6857 VTP p-side = 0.4241 CHI2 TEST = 1 CAL_BASE = 2.4761 V CAL_VREF = 3.0098 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:212 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 0 error detected in test: Location: SUP_SHORT:VDD1 3.7442E-01 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A -1.0000E-38 IDDSB:VDD1A -1.0000E-38 IDDSB:VDD0B -1.0000E-38 IDDSB:VDD1B -1.0000E-38 IDDSB:VDD0C -1.0000E-38 IDDSB:VDD1C -1.0000E-38 IDDSB:VDD0D -1.0000E-38 IDDSB:VDD1D -1.0000E-38 V_AVDD2IPA:249/L9 -1.0000E-38 V_AVDD2IMA:277/L10 -1.0000E-38 AVDD_A:AVDDP-M -1.0000E-38 IAVDD2_A:AVDDP-M -1.0000E-38 V_V1RA:169/L5 -1.0000E-38 V_N310A:171/L6 -1.0000E-38 V_AVDD2IPB:249/L9 -1.0000E-38 V_AVDD2IMB:277/L10 -1.0000E-38 AVDD_B:AVDDP-M -1.0000E-38 IAVDD2_B:AVDDP-M -1.0000E-38 V_V1RB:169/L5 -1.0000E-38 V_N310B:171/L6 -1.0000E-38 V_AVDD2IPC:249/L9 -1.0000E-38 V_AVDD2IMC:277/L10 -1.0000E-38 AVDD_C:AVDDP-M -1.0000E-38 IAVDD2_C:AVDDP-M -1.0000E-38 V_V1RC:169/L5 -1.0000E-38 V_N310C:171/L6 -1.0000E-38 V_AVDD2IPD:249/L9 -1.0000E-38 V_AVDD2IMD:277/L10 -1.0000E-38 AVDD_D:AVDDP-M -1.0000E-38 IAVDD2_D:AVDDP-M -1.0000E-38 V_V1RD:169/L5 -1.0000E-38 V_N310D:171/L6 -1.0000E-38 IDDOP0:AVDD -1.0000E-38 IDDOP1:DVDD -1.0000E-38 DACs TEST = 0 CAL_IN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side = 0.0000 VTP p-side = 0.0000 CHI2 TEST = 0 CAL_BASE = 0.0000 V CAL_VREF = 0.0000 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 0 FUNCT@5.0V:ATOM1TO6B 0 FUNCT@5.0V:ATOM1TO6C 0 FUNCT@5.0V:ATOM1TO6D 0 FUNCT@5.0V:ATOM1TO6E 0 FUNCT@5.0V:ATOM7TO9A 0 FUNCT@5.0V:ATOM7TO9B 0 FUNCT@5.0V:ATOM7TO9C 0 FUNCT@5.0V:ATOM7TO9D 0 FUNCT@5.0V:ATOM7TO9E 0 FUNCT@5.0V:ATOM10TO12 0 FUNCT@5.0V:ATOM13A 0 FUNCT@5.0V:ATOM13B 0 FUNCT@5.0V:ATOM13C 0 FUNCT@5.0V:ATOM14 0 FUNCT@5.0V:ATOM15 0 FUNCT@5.0V:ATOM16 0 FUNCT@5.0V:ATOM17 0 FUNCT@5.0V:ATOM18 0 FUNCT@5.0V:ATOM18HF 0 FUNCT@5.0V:ATOM19 0 FUNCT@5.0V:ATOM19B 0 FUNCT@5.0V:ATOM19C 0 FUNCT@5.0V:ATOM19D 0 FUNCT@5.0V:ATOM19E 0 FUNCT@5.0V:ATOM19F 0 FUNCT@5.0V:ATOM19FHF 0 FUNCT@5.0V:ATOM20 0 FUNCT@5.0V:ATOM21 0 FUNCT@5.0V:ATOM22 0 FUNCT@5.0V:ATOM23 0 FUNCT@5.0V:ATOM24 0 FUNCT@5.0V:ATOM25 0 FUNCT@5.0V:ATOM25HF 0 FUNCT@5.0V:ATOM26A 0 FUNCT@5.0V:ATOM26B 0 FUNCT@5.0V:ATOM27 0 FUNCT@5.0V:ATOM28 0 FUNCT@5.0V:ATOM29 0 FUNCT@5.0V:ATOM30 0 FUNCT@5.0V:ATOM31A 0 FUNCT@5.0V:ATOM31B 0 FUNCT@5.0V:ATOM32 0 FUNCT@5.0V:ATOM33 0 FUNCT@5.0V:ATOM34 0 FUNCT@5.0V:ATOM35 0 FUNCT@5.0V:ATOM36 0 FUNCT@5.0V:ATOM38 0 FUNCT@5.0V:ATOM39 0 FUNCT@5.0V:ATOM40 0 FUNCT@5.0V:ATOM41 0 FUNCT@5.0V:ATOM41A 0 FUNCT@5.0V:ATOM42 0 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 0 FUNCT@5.0V:ATOM45C_40 0 FUNCT@5.0V:ATOM46C_40 0 FUNCT@5.0V:ATOM47C_40 0 FUNCT@5.0V:ATOM48C_40 0 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 0 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 0 FUNCT@5.0V:A10TO12HF 0 FUNCT@5.0V:ADAC37HF 0 CH.MASK TEST = 0 error detected at location:0 NOISE TEST = 0 error detected at location:0 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D -1.0000E-38 TMIN@4.8V:A7_9_60D -1.0000E-38 TMIN@4.8V:A10_12_50D -1.0000E-38 TMIN@4.8V:A10_12_60D -1.0000E-38 TMIN@4.8V:ADAC37_50D -1.0000E-38 TMIN@4.8V:ADAC37_60D -1.0000E-38 TMIN@5.0V:A7_9_50D -1.0000E-38 TMIN@5.0V:A7_9_60D -1.0000E-38 TMIN@5.0V:A10_12_50D -1.0000E-38 TMIN@5.0V:A10_12_60D -1.0000E-38 TMIN@5.0V:ADAC37_50D -1.0000E-38 TMIN@5.0V:ADAC37_60D -1.0000E-38 TMIN@5.2V:A7_9_50D -1.0000E-38 TMIN@5.2V:A7_9_60D -1.0000E-38 TMIN@5.2V:A10_12_50D -1.0000E-38 TMIN@5.2V:A10_12_60D -1.0000E-38 TMIN@5.2V:ADAC37_50D -1.0000E-38 TMIN@5.2V:ADAC37_60D -1.0000E-38 ---------- CHIP ID:413 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.4675 b(slope) = 0.0085 chi2 = 2.8553 CAL_IN P-side : a = 2.4680 b(slope) = 0.0085 chi2 = 2.8696 VTN N-side : a = 0.0097 b(slope) = 0.0106 chi2 = 0.7912 VTN P-side : a = 0.0099 b(slope) = 0.0064 chi2 = 0.6573 VTP N-side = 0.6869 VTP p-side = 0.4235 CHI2 TEST = 1 CAL_BASE = 2.4739 V CAL_VREF = 3.0178 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:513 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 0 CAL_IN N-side : a = 2.7664 b(slope) = 0.0000 chi2 = 0.3687 CAL_IN P-side : a = 2.7663 b(slope) = 0.0000 chi2 = 0.2055 VTN N-side : a = 0.2229 b(slope) = 0.0000 chi2 = 0.3443 VTN P-side : a = 0.1402 b(slope) = 0.0000 chi2 = 0.3562 VTP N-side = 0.6934 VTP p-side = 0.4278 CHI2 TEST = 1 CAL_BASE = 2.5090 V CAL_VREF = 3.0376 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 228 FUNCT@5.0V:ATOM1TO6B 228 FUNCT@5.0V:ATOM1TO6C 228 FUNCT@5.0V:ATOM1TO6D 228 FUNCT@5.0V:ATOM1TO6E 228 FUNCT@5.0V:ATOM7TO9A 272 FUNCT@5.0V:ATOM7TO9B 272 FUNCT@5.0V:ATOM7TO9C 272 FUNCT@5.0V:ATOM7TO9D 272 FUNCT@5.0V:ATOM7TO9E 272 FUNCT@5.0V:ATOM10TO12 496 FUNCT@5.0V:ATOM13A 1059 FUNCT@5.0V:ATOM13B 1115 FUNCT@5.0V:ATOM13C 1115 FUNCT@5.0V:ATOM14 1090 FUNCT@5.0V:ATOM15 1090 FUNCT@5.0V:ATOM17 3413 FUNCT@5.0V:ATOM18 3431 FUNCT@5.0V:ATOM18HF 3431 FUNCT@5.0V:ATOM19 3367 FUNCT@5.0V:ATOM19D 3382 FUNCT@5.0V:ATOM19E 2609 FUNCT@5.0V:ATOM19F 6482 FUNCT@5.0V:ATOM19FHF 6482 FUNCT@5.0V:ATOM20 1075 FUNCT@5.0V:ATOM21 1051 FUNCT@5.0V:ATOM22 1039 FUNCT@5.0V:ATOM23 971 FUNCT@5.0V:ATOM24 1071 FUNCT@5.0V:ATOM25 1057 FUNCT@5.0V:ATOM25HF 1057 FUNCT@5.0V:ATOM26A 1036 FUNCT@5.0V:ATOM26B 1845 FUNCT@5.0V:ATOM27 1023 FUNCT@5.0V:ATOM28 1171 FUNCT@5.0V:ATOM29 1173 FUNCT@5.0V:ATOM30 1173 FUNCT@5.0V:ATOM31A 807 FUNCT@5.0V:ATOM31B 996 FUNCT@5.0V:ATOM32 807 FUNCT@5.0V:ATOM33 1173 FUNCT@5.0V:ATOM34 268 FUNCT@5.0V:ATOM35 1306 FUNCT@5.0V:ATOM36 1063 FUNCT@5.0V:ATOM39 1082 FUNCT@5.0V:ATOM41 1170 FUNCT@5.0V:ATOM41A 1170 FUNCT@5.0V:ATOM42 369 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 3660 FUNCT@5.0V:ATOM45C_40 3660 FUNCT@5.0V:ATOM46C_40 3660 FUNCT@5.0V:ATOM47C_40 3660 FUNCT@5.0V:ATOM48C_40 3660 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 3660 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 272 FUNCT@5.0V:A10TO12HF 496 FUNCT@5.0V:ADAC37HF 272 CH.MASK TEST = 0 error detected at location:1238 NOISE TEST = 0 error detected at location:1398 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D 9.0000E-08 TMIN@4.8V:A7_9_60D 9.0000E-08 TMIN@4.8V:A10_12_50D 9.0000E-08 TMIN@4.8V:A10_12_60D 9.0000E-08 TMIN@4.8V:ADAC37_50D 9.0000E-08 TMIN@4.8V:ADAC37_60D 9.0000E-08 TMIN@5.0V:A7_9_50D 9.0000E-08 TMIN@5.0V:A7_9_60D 9.0000E-08 TMIN@5.0V:A10_12_50D 9.0000E-08 TMIN@5.0V:A10_12_60D 9.0000E-08 TMIN@5.0V:ADAC37_50D 9.0000E-08 TMIN@5.0V:ADAC37_60D 9.0000E-08 TMIN@5.2V:A7_9_50D 9.0000E-08 TMIN@5.2V:A7_9_60D 9.0000E-08 TMIN@5.2V:A10_12_50D 9.0000E-08 TMIN@5.2V:A10_12_60D 9.0000E-08 TMIN@5.2V:ADAC37_50D 9.0000E-08 TMIN@5.2V:ADAC37_60D 9.0000E-08 ---------- CHIP ID:613 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5180 b(slope) = 0.0082 chi2 = 1.1729 CAL_IN P-side : a = 2.5183 b(slope) = 0.0082 chi2 = 0.7076 VTN N-side : a = 0.0100 b(slope) = 0.0108 chi2 = 1.6356 VTN P-side : a = 0.0097 b(slope) = 0.0066 chi2 = 0.5883 VTP N-side = 0.6988 VTP p-side = 0.4323 CHI2 TEST = 1 CAL_BASE = 2.5210 V CAL_VREF = 3.0457 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:614 ------------------ CLASS = C && 0---------- CONTACTS TEST = 1 POWER TEST = 0 error detected in test: Location: SUP_SHORT:VDD0 2.2272E-01 ANALOG TEST = 0 error detected in test: Value: IDDSB:VDD0A -1.0000E-38 IDDSB:VDD1A -1.0000E-38 IDDSB:VDD0B -1.0000E-38 IDDSB:VDD1B -1.0000E-38 IDDSB:VDD0C -1.0000E-38 IDDSB:VDD1C -1.0000E-38 IDDSB:VDD0D -1.0000E-38 IDDSB:VDD1D -1.0000E-38 V_AVDD2IPA:249/L9 -1.0000E-38 V_AVDD2IMA:277/L10 -1.0000E-38 AVDD_A:AVDDP-M -1.0000E-38 IAVDD2_A:AVDDP-M -1.0000E-38 V_V1RA:169/L5 -1.0000E-38 V_N310A:171/L6 -1.0000E-38 V_AVDD2IPB:249/L9 -1.0000E-38 V_AVDD2IMB:277/L10 -1.0000E-38 AVDD_B:AVDDP-M -1.0000E-38 IAVDD2_B:AVDDP-M -1.0000E-38 V_V1RB:169/L5 -1.0000E-38 V_N310B:171/L6 -1.0000E-38 V_AVDD2IPC:249/L9 -1.0000E-38 V_AVDD2IMC:277/L10 -1.0000E-38 AVDD_C:AVDDP-M -1.0000E-38 IAVDD2_C:AVDDP-M -1.0000E-38 V_V1RC:169/L5 -1.0000E-38 V_N310C:171/L6 -1.0000E-38 V_AVDD2IPD:249/L9 -1.0000E-38 V_AVDD2IMD:277/L10 -1.0000E-38 AVDD_D:AVDDP-M -1.0000E-38 IAVDD2_D:AVDDP-M -1.0000E-38 V_V1RD:169/L5 -1.0000E-38 V_N310D:171/L6 -1.0000E-38 IDDOP0:AVDD -1.0000E-38 IDDOP1:DVDD -1.0000E-38 DACs TEST = 0 CAL_IN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN N-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side : a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side = 0.0000 VTP p-side = 0.0000 CHI2 TEST = 0 CAL_BASE = 0.0000 V CAL_VREF = 0.0000 V DIGITAL FUNC. TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM1TO6A 0 FUNCT@5.0V:ATOM1TO6B 0 FUNCT@5.0V:ATOM1TO6C 0 FUNCT@5.0V:ATOM1TO6D 0 FUNCT@5.0V:ATOM1TO6E 0 FUNCT@5.0V:ATOM7TO9A 0 FUNCT@5.0V:ATOM7TO9B 0 FUNCT@5.0V:ATOM7TO9C 0 FUNCT@5.0V:ATOM7TO9D 0 FUNCT@5.0V:ATOM7TO9E 0 FUNCT@5.0V:ATOM10TO12 0 FUNCT@5.0V:ATOM13A 0 FUNCT@5.0V:ATOM13B 0 FUNCT@5.0V:ATOM13C 0 FUNCT@5.0V:ATOM14 0 FUNCT@5.0V:ATOM15 0 FUNCT@5.0V:ATOM16 0 FUNCT@5.0V:ATOM17 0 FUNCT@5.0V:ATOM18 0 FUNCT@5.0V:ATOM18HF 0 FUNCT@5.0V:ATOM19 0 FUNCT@5.0V:ATOM19B 0 FUNCT@5.0V:ATOM19C 0 FUNCT@5.0V:ATOM19D 0 FUNCT@5.0V:ATOM19E 0 FUNCT@5.0V:ATOM19F 0 FUNCT@5.0V:ATOM19FHF 0 FUNCT@5.0V:ATOM20 0 FUNCT@5.0V:ATOM21 0 FUNCT@5.0V:ATOM22 0 FUNCT@5.0V:ATOM23 0 FUNCT@5.0V:ATOM24 0 FUNCT@5.0V:ATOM25 0 FUNCT@5.0V:ATOM25HF 0 FUNCT@5.0V:ATOM26A 0 FUNCT@5.0V:ATOM26B 0 FUNCT@5.0V:ATOM27 0 FUNCT@5.0V:ATOM28 0 FUNCT@5.0V:ATOM29 0 FUNCT@5.0V:ATOM30 0 FUNCT@5.0V:ATOM31A 0 FUNCT@5.0V:ATOM31B 0 FUNCT@5.0V:ATOM32 0 FUNCT@5.0V:ATOM33 0 FUNCT@5.0V:ATOM34 0 FUNCT@5.0V:ATOM35 0 FUNCT@5.0V:ATOM36 0 FUNCT@5.0V:ATOM38 0 FUNCT@5.0V:ATOM39 0 FUNCT@5.0V:ATOM40 0 FUNCT@5.0V:ATOM41 0 FUNCT@5.0V:ATOM41A 0 FUNCT@5.0V:ATOM42 0 CAL_INJ TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM44C_40 0 FUNCT@5.0V:ATOM45C_40 0 FUNCT@5.0V:ATOM46C_40 0 FUNCT@5.0V:ATOM47C_40 0 FUNCT@5.0V:ATOM48C_40 0 45D_20 TEST = 0 error detected in test: Location: FUNCT@5.0V:ATOM45D_20 0 HF TEST = 0 error detected in test: Location: FUNCT@5.0V:A7TO9HF 0 FUNCT@5.0V:A10TO12HF 0 FUNCT@5.0V:ADAC37HF 0 CH.MASK TEST = 0 error detected at location:0 NOISE TEST = 0 error detected at location:0 TMIN TEST = 0 error detected in test: Location: TMIN@4.8V:A7_9_50D -1.0000E-38 TMIN@4.8V:A7_9_60D -1.0000E-38 TMIN@4.8V:A10_12_50D -1.0000E-38 TMIN@4.8V:A10_12_60D -1.0000E-38 TMIN@4.8V:ADAC37_50D -1.0000E-38 TMIN@4.8V:ADAC37_60D -1.0000E-38 TMIN@5.0V:A7_9_50D -1.0000E-38 TMIN@5.0V:A7_9_60D -1.0000E-38 TMIN@5.0V:A10_12_50D -1.0000E-38 TMIN@5.0V:A10_12_60D -1.0000E-38 TMIN@5.0V:ADAC37_50D -1.0000E-38 TMIN@5.0V:ADAC37_60D -1.0000E-38 TMIN@5.2V:A7_9_50D -1.0000E-38 TMIN@5.2V:A7_9_60D -1.0000E-38 TMIN@5.2V:A10_12_50D -1.0000E-38 TMIN@5.2V:A10_12_60D -1.0000E-38 TMIN@5.2V:ADAC37_50D -1.0000E-38 TMIN@5.2V:ADAC37_60D -1.0000E-38 ---------- CHIP ID:514 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5066 b(slope) = 0.0084 chi2 = 1.5553 CAL_IN P-side : a = 2.5070 b(slope) = 0.0084 chi2 = 1.2518 VTN N-side : a = 0.0097 b(slope) = 0.0109 chi2 = 0.9894 VTN P-side : a = 0.0097 b(slope) = 0.0067 chi2 = 0.2616 VTP N-side = 0.7059 VTP p-side = 0.4370 CHI2 TEST = 1 CAL_BASE = 2.5122 V CAL_VREF = 3.0493 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 ---------- CHIP ID:414 ------------------ CLASS = A && 1---------- CONTACTS TEST = 1 POWER TEST = 1 ANALOG TEST = 1 DACs TEST = 1 CAL_IN N-side : a = 2.5063 b(slope) = 0.0083 chi2 = 2.1908 CAL_IN P-side : a = 2.5065 b(slope) = 0.0083 chi2 = 1.6931 VTN N-side : a = 0.0095 b(slope) = 0.0108 chi2 = 1.9970 VTN P-side : a = 0.0094 b(slope) = 0.0066 chi2 = 0.8400 VTP N-side = 0.7000 VTP p-side = 0.4300 CHI2 TEST = 1 CAL_BASE = 2.5110 V CAL_VREF = 3.0425 V DIGITAL FUNC. TEST = 2 error detected in test: Location: FUNCT@5.0V:ATOM13A 2096 FUNCT@5.0V:ATOM13B 2152 FUNCT@5.0V:ATOM13C 2152 FUNCT@5.0V:ATOM17 4452 FUNCT@5.0V:ATOM18 4468 FUNCT@5.0V:ATOM19 4404 FUNCT@5.0V:ATOM19D 4419 FUNCT@5.0V:ATOM19E 3646 FUNCT@5.0V:ATOM19F 7519 FUNCT@5.0V:ATOM20 2112 FUNCT@5.0V:ATOM21 2088 FUNCT@5.0V:ATOM22 2076 FUNCT@5.0V:ATOM23 984 FUNCT@5.0V:ATOM24 1084 FUNCT@5.0V:ATOM25 2094 FUNCT@5.0V:ATOM26A 2073 FUNCT@5.0V:ATOM26B 2882 FUNCT@5.0V:ATOM28 2210 FUNCT@5.0V:ATOM29 2210 FUNCT@5.0V:ATOM30 2210 FUNCT@5.0V:ATOM31A 1844 FUNCT@5.0V:ATOM31B 2033 FUNCT@5.0V:ATOM32 1844 FUNCT@5.0V:ATOM33 2210 FUNCT@5.0V:ATOM35 2344 FUNCT@5.0V:ATOM36 2100 FUNCT@5.0V:ATOM39 2121 FUNCT@5.0V:ATOM41 2647 CAL_INJ TEST = 1 test passed (out of 5): FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 HF TEST = 1 CH.MASK TEST = 1 NOISE TEST = 2 error detected at location:1411 TMIN TEST = 1 +++++++++ SUMMARY OF RESULTS ++++++++++++++++++++++++() ++++++++++++++++ A A< B B< C --------------------------------------------------------------- 0 0 0 0 401 501 0 0 0 0 601 0 0 0 0 602 0 0 0 0 502 0 0 0 0 0 0 0 0 402 203 0 0 0 0 303 0 0 0 0 403 0 0 0 0 0 0 0 0 503 603 0 0 0 0 703 0 0 0 0 0 0 0 0 803 804 0 0 0 0 704 0 0 0 0 604 0 0 0 0 504 0 0 0 0 404 0 0 0 0 304 0 0 0 0 0 0 0 0 204 205 0 0 0 0 0 0 0 0 305 405 0 0 0 0 505 0 0 0 0 605 0 0 0 0 705 0 0 0 0 0 0 0 0 805 806 0 0 0 0 0 0 0 0 706 606 0 0 0 0 0 0 0 0 506 406 0 0 0 0 306 0 0 0 0 206 0 0 0 0 107 0 0 0 0 0 0 0 0 207 307 0 0 0 0 0 0 0 0 407 507 0 0 0 0 607 0 0 0 0 707 0 0 0 0 807 0 0 0 0 0 0 0 0 907 0 0 0 0 908 0 0 0 0 808 0 0 0 0 708 0 0 0 0 608 0 0 0 0 508 408 0 0 0 0 308 0 0 0 0 0 0 0 0 208 0 0 0 108 0 0 0 0 0 209 0 0 0 0 309 0 409 0 0 0 0 509 0 0 0 0 0 0 0 609 0 0 0 0 709 809 0 0 0 0 0 0 0 0 810 0 0 0 0 710 0 610 0 0 0 510 0 0 0 0 0 0 0 0 410 0 310 0 0 0 0 0 0 0 210 0 0 0 0 211 0 0 0 0 311 411 0 0 0 0 0 0 0 0 511 0 611 0 0 0 0 711 0 0 0 0 811 0 0 0 0 0 0 0 812 712 0 0 0 0 0 0 0 0 612 0 512 0 0 0 0 412 0 0 0 0 312 0 0 0 0 0 0 0 212 0 413 0 0 0 0 0 0 0 513 0 613 0 0 0 0 0 0 0 614 0 514 0 0 0 0 414 0 0 0 ---------------------------------------------------------------- 37 34 14 0 1 NUMBER OF CHIPS TESTED = 86 NUMBER OF A CHIPS = 37 NUMBER OF A< CHIPS = 14 NUMBER OF B CHIPS = 0 NUMBER OF B< CHIPS = 1 NUMBER OF C CHIPS = 34 YIELD = 43.02 % (YIELD WITH LT CHIPS= 59.30 %)