------- CHIP ID:401 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0091 b(slope) = 0.0109 chi2 = 1.1221 VTN P-side: a = 0.0092 b(slope) = 0.0067 chi2 = 0.5050 CAL_IN N-side: a = 2.4722 b(slope) = 0.0091 chi2 = 99.0000 CAL_IN P-side: a = 2.4774 b(slope) = 0.0092 chi2 = 99.0000 VTP N-side(average) = 0.7100 V CAL_BASE = 2.4766 V VTP P-side(average) = 0.4366 V CAL_VREF = 3.0349 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:501 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.2285 b(slope) = 0.0044 chi2 = 99.0000 VTN P-side: a = 0.0960 b(slope) = 0.0033 chi2 = 99.0000 CAL_IN N-side: a = 2.7763 b(slope) = 0.0008 chi2 = 99.0000 CAL_IN P-side: a = 2.7668 b(slope) = 0.0012 chi2 = 99.0000 VTP N-side(average) = 0.7113 V CAL_BASE = 2.4719 V VTP P-side(average) = 0.4410 V CAL_VREF = 3.0396 V FUNCT. DIGITAL TEST = 52 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 FUNCT@5.0V:ATOM7TO9B 272.0 FUNCT@5.0V:ATOM7TO9C 272.0 FUNCT@5.0V:ATOM7TO9D 272.0 FUNCT@5.0V:ATOM7TO9E 272.0 FUNCT@5.0V:ATOM10TO12 496.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3353.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM34 268.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM38 304.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 FUNCT@5.0V:ATOM42 369.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:601 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0107 chi2 = 0.9620 VTN P-side: a = 0.0095 b(slope) = 0.0065 chi2 = 0.2890 CAL_IN N-side: a = 2.5021 b(slope) = 0.0085 chi2 = 0.9179 CAL_IN P-side: a = 2.5023 b(slope) = 0.0085 chi2 = 0.5517 VTP N-side(average) = 0.6964 V CAL_BASE = 2.5071 V VTP P-side(average) = 0.4258 V CAL_VREF = 3.0530 V FUNCT. DIGITAL TEST = 37 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1128.0 FUNCT@5.0V:ATOM13C 1128.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1047.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1216.0 FUNCT@5.0V:ATOM37B 1206.0 FUNCT@5.0V:ATOM37C 1191.0 FUNCT@5.0V:ATOM37D 1158.0 FUNCT@5.0V:ATOM37E 1150.0 FUNCT@5.0V:ATOM39 1096.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:602 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0132 b(slope) = 0.0110 chi2 = 0.6627 VTN P-side: a = 0.0129 b(slope) = 0.0067 chi2 = 0.2642 CAL_IN N-side: a = 2.4836 b(slope) = 0.0088 chi2 = 0.7403 CAL_IN P-side: a = 2.4836 b(slope) = 0.0088 chi2 = 0.6975 VTP N-side(average) = 0.7163 V CAL_BASE = 2.4873 V VTP P-side(average) = 0.4400 V CAL_VREF = 3.0486 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:502 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0090 b(slope) = 0.0110 chi2 = 2.2348 VTN P-side: a = 0.0093 b(slope) = 0.0067 chi2 = 0.7946 CAL_IN N-side: a = 2.5277 b(slope) = 0.0085 chi2 = 0.7550 CAL_IN P-side: a = 2.5279 b(slope) = 0.0085 chi2 = 0.5297 VTP N-side(average) = 0.7170 V CAL_BASE = 2.5308 V VTP P-side(average) = 0.4398 V CAL_VREF = 3.0759 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:402 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0089 b(slope) = 0.0108 chi2 = 1.5158 VTN P-side: a = 0.0094 b(slope) = 0.0066 chi2 = 0.9114 CAL_IN N-side: a = 2.5055 b(slope) = 0.0085 chi2 = 0.7215 CAL_IN P-side: a = 2.5056 b(slope) = 0.0085 chi2 = 0.6720 VTP N-side(average) = 0.7017 V CAL_BASE = 2.5093 V VTP P-side(average) = 0.4303 V CAL_VREF = 3.0559 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:203 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0096 b(slope) = 0.0107 chi2 = 1.0906 VTN P-side: a = 0.0096 b(slope) = 0.0066 chi2 = 0.5522 CAL_IN N-side: a = 3.0930 b(slope) = 0.0000 chi2 = 17.7413 CAL_IN P-side: a = 3.0917 b(slope) = 0.0001 chi2 = 41.3666 VTP N-side(average) = 0.6968 V CAL_BASE = 2.5249 V VTP P-side(average) = 0.4302 V CAL_VREF = 3.0501 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3667.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3668.0 FUNCT@5.0V:ATOM47C_40 3699.0 FUNCT@5.0V:ATOM48C_40 3667.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:303 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0105 chi2 = 2.4355 VTN P-side: a = 0.0098 b(slope) = 0.0063 chi2 = 0.4765 CAL_IN N-side: a = 2.5032 b(slope) = 0.0085 chi2 = 0.9173 CAL_IN P-side: a = 2.5029 b(slope) = 0.0085 chi2 = 0.6986 VTP N-side(average) = 0.6809 V CAL_BASE = 2.5054 V VTP P-side(average) = 0.4159 V CAL_VREF = 3.0466 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:403 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0219 b(slope) = 0.0106 chi2 = 99.0000 VTN P-side: a = 0.0099 b(slope) = 0.0067 chi2 = 0.4012 CAL_IN N-side: a = 2.5152 b(slope) = 0.0082 chi2 = 99.0000 CAL_IN P-side: a = 2.4989 b(slope) = 0.0086 chi2 = 0.6098 VTP N-side(average) = 0.7111 V CAL_BASE = 2.5005 V VTP P-side(average) = 0.4410 V CAL_VREF = 3.0527 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:503 --------------------------------------- CLASS=B -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0118 b(slope) = 0.0110 chi2 = 0.9425 VTN P-side: a = 0.0114 b(slope) = 0.0066 chi2 = 0.3369 CAL_IN N-side: a = 2.4860 b(slope) = 0.0087 chi2 = 0.6128 CAL_IN P-side: a = 2.4860 b(slope) = 0.0087 chi2 = 0.6159 VTP N-side(average) = 0.7163 V CAL_BASE = 2.4873 V VTP P-side(average) = 0.4371 V CAL_VREF = 3.0476 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5935.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:603 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0106 b(slope) = 0.0109 chi2 = 1.2283 VTN P-side: a = 0.0110 b(slope) = 0.0066 chi2 = 0.6267 CAL_IN N-side: a = 2.4825 b(slope) = 0.0087 chi2 = 0.5181 CAL_IN P-side: a = 2.4829 b(slope) = 0.0087 chi2 = 0.4276 VTP N-side(average) = 0.7081 V CAL_BASE = 2.4839 V VTP P-side(average) = 0.4354 V CAL_VREF = 3.0425 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:703 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0111 b(slope) = 0.0107 chi2 = 0.9406 VTN P-side: a = 0.0114 b(slope) = 0.0065 chi2 = 0.5241 CAL_IN N-side: a = 2.4842 b(slope) = 0.0086 chi2 = 0.6070 CAL_IN P-side: a = 2.4844 b(slope) = 0.0086 chi2 = 0.5415 VTP N-side(average) = 0.6979 V CAL_BASE = 2.4853 V VTP P-side(average) = 0.4295 V CAL_VREF = 3.0361 V FUNCT. DIGITAL TEST = 3 error detected in test: FUNCT@5.0V:ATOM28 1236.0 FUNCT@5.0V:ATOM29 1236.0 FUNCT@5.0V:ATOM30 1236.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4695.0 FUNCT@5.0V:ATOM45C_40 4695.0 FUNCT@5.0V:ATOM46C_40 4695.0 FUNCT@5.0V:ATOM47C_40 4695.0 FUNCT@5.0V:ATOM48C_40 4695.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4695.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:803 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0228 b(slope) = 0.0105 chi2 = 99.0000 VTN P-side: a = 0.0109 b(slope) = 0.0066 chi2 = 1.1516 CAL_IN N-side: a = 2.5043 b(slope) = 0.0080 chi2 = 99.0000 CAL_IN P-side: a = 2.4885 b(slope) = 0.0084 chi2 = 0.5975 VTP N-side(average) = 0.7021 V CAL_BASE = 2.4907 V VTP P-side(average) = 0.4343 V CAL_VREF = 3.0295 V FUNCT. DIGITAL TEST = 32 error detected in test: FUNCT@5.0V:ATOM13A 1842.0 FUNCT@5.0V:ATOM15 1886.0 FUNCT@5.0V:ATOM17 4198.0 FUNCT@5.0V:ATOM18 4214.0 FUNCT@5.0V:ATOM18HF 4214.0 FUNCT@5.0V:ATOM19 4150.0 FUNCT@5.0V:ATOM19D 4165.0 FUNCT@5.0V:ATOM19E 3394.0 FUNCT@5.0V:ATOM19F 7266.0 FUNCT@5.0V:ATOM19FHF 7266.0 FUNCT@5.0V:ATOM20 1859.0 FUNCT@5.0V:ATOM21 1837.0 FUNCT@5.0V:ATOM22 1823.0 FUNCT@5.0V:ATOM25 1841.0 FUNCT@5.0V:ATOM25HF 1841.0 FUNCT@5.0V:ATOM26A 1820.0 FUNCT@5.0V:ATOM26B 2629.0 FUNCT@5.0V:ATOM28 1959.0 FUNCT@5.0V:ATOM29 1957.0 FUNCT@5.0V:ATOM30 1956.0 FUNCT@5.0V:ATOM31A 1593.0 FUNCT@5.0V:ATOM31B 1780.0 FUNCT@5.0V:ATOM32 1590.0 FUNCT@5.0V:ATOM33 1956.0 FUNCT@5.0V:ATOM35 2092.0 FUNCT@5.0V:ATOM36 1846.0 FUNCT@5.0V:ATOM37A 2770.0 FUNCT@5.0V:ATOM37C 2747.0 FUNCT@5.0V:ATOM37D 2715.0 FUNCT@5.0V:ATOM39 1867.0 FUNCT@5.0V:ATOM41 2393.0 FUNCT@5.0V:ATOM41A 2393.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:804 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1012 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0108 chi2 = 3.1014 VTN P-side: a = 0.0105 b(slope) = 0.0066 chi2 = 0.7970 CAL_IN N-side: a = 2.4895 b(slope) = 0.0085 chi2 = 0.8040 CAL_IN P-side: a = 2.4895 b(slope) = 0.0085 chi2 = 0.6621 VTP N-side(average) = 0.7056 V CAL_BASE = 2.4915 V VTP P-side(average) = 0.4344 V CAL_VREF = 3.0354 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM35 1310.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1408.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:704 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0106 chi2 = 0.7307 VTN P-side: a = 0.0102 b(slope) = 0.0064 chi2 = 0.7567 CAL_IN N-side: a = 2.4802 b(slope) = 0.0086 chi2 = 0.6160 CAL_IN P-side: a = 2.4801 b(slope) = 0.0086 chi2 = 0.5533 VTP N-side(average) = 0.6923 V CAL_BASE = 2.4834 V VTP P-side(average) = 0.4238 V CAL_VREF = 3.0373 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:604 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0109 chi2 = 1.6370 VTN P-side: a = 0.0098 b(slope) = 0.0066 chi2 = 0.4388 CAL_IN N-side: a = 2.5130 b(slope) = 0.0085 chi2 = 0.6879 CAL_IN P-side: a = 2.5130 b(slope) = 0.0085 chi2 = 0.6192 VTP N-side(average) = 0.7064 V CAL_BASE = 2.5156 V VTP P-side(average) = 0.4363 V CAL_VREF = 3.0598 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:504 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0134 b(slope) = 0.0109 chi2 = 99.0000 VTN P-side: a = 0.0106 b(slope) = 0.0067 chi2 = 0.1833 CAL_IN N-side: a = 2.5127 b(slope) = 0.0085 chi2 = 99.0000 CAL_IN P-side: a = 2.5062 b(slope) = 0.0087 chi2 = 0.6541 VTP N-side(average) = 0.7124 V CAL_BASE = 2.5088 V VTP P-side(average) = 0.4378 V CAL_VREF = 3.0637 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:404 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0109 chi2 = 0.5809 VTN P-side: a = 0.0100 b(slope) = 0.0067 chi2 = 0.5717 CAL_IN N-side: a = 2.5172 b(slope) = 0.0085 chi2 = 0.6760 CAL_IN P-side: a = 2.5170 b(slope) = 0.0085 chi2 = 0.3390 VTP N-side(average) = 0.7072 V CAL_BASE = 2.5178 V VTP P-side(average) = 0.4390 V CAL_VREF = 3.0645 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:304 --------------------------------------- CLASS=C -------- CONTACTS TEST = 9 error detected in test: CONTACT:90/R6 0.0 CONTACT:138/T6 0.0 CONTACT:142/T7 0.0 CONTACT:293/B12 0.0 CONTACT:49/B13 0.0 CONTACT:45/B6 0.0 CONTACT:33/B7 0.0 CONTACT:10/T4 0.0 CONTACT:14/T5 0.0 POWER-ON TEST = 0 ANALOG TEST = 34 error detected in test: IDDSB:VDD0A 0.0000 IDDSB:VDD1A 0.0000 IDDSB:VDD0B 0.0000 IDDSB:VDD1B 0.0000 IDDSB:VDD0C 0.0000 IDDSB:VDD1C 0.0000 IDDSB:VDD0D 0.0000 IDDSB:VDD1D 0.0000 V_AVDD2IPA:249/L9 0.0000 V_AVDD2IMA:277/L10 0.0000 AVDD_A:AVDDP-M 0.0000 IAVDD2_A:AVDDP-M 0.0000 V_V1RA:169/L5 0.0000 V_N310A:171/L6 0.0000 V_AVDD2IPB:249/L9 0.0000 V_AVDD2IMB:277/L10 0.0000 AVDD_B:AVDDP-M 0.0000 IAVDD2_B:AVDDP-M 0.0000 V_V1RB:169/L5 0.0000 V_N310B:171/L6 0.0000 V_AVDD2IPC:249/L9 0.0000 V_AVDD2IMC:277/L10 0.0000 AVDD_C:AVDDP-M 0.0000 IAVDD2_C:AVDDP-M 0.0000 V_V1RC:169/L5 0.0000 V_N310C:171/L6 0.0000 V_AVDD2IPD:249/L9 0.0000 V_AVDD2IMD:277/L10 0.0000 AVDD_D:AVDDP-M 0.0000 IAVDD2_D:AVDDP-M 0.0000 V_V1RD:169/L5 0.0000 V_N310D:171/L6 0.0000 IDDOP0:AVDD 0.0000 IDDOP1:DVDD 0.0000 DACS TEST = 1 VTN N-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN N-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side(average) = 0.0000 V CAL_BASE = 0.0000 V VTP P-side(average) = 0.0000 V CAL_VREF = 0.0000 V FUNCT. DIGITAL TEST = 58 error detected in test: FUNCT@5.0V:ATOM1TO6A 0.0 FUNCT@5.0V:ATOM1TO6B 0.0 FUNCT@5.0V:ATOM1TO6C 0.0 FUNCT@5.0V:ATOM1TO6D 0.0 FUNCT@5.0V:ATOM1TO6E 0.0 FUNCT@5.0V:ATOM7TO9A 0.0 FUNCT@5.0V:ATOM7TO9B 0.0 FUNCT@5.0V:ATOM7TO9C 0.0 FUNCT@5.0V:ATOM7TO9D 0.0 FUNCT@5.0V:ATOM7TO9E 0.0 FUNCT@5.0V:ATOM10TO12 0.0 FUNCT@5.0V:ATOM13A 0.0 FUNCT@5.0V:ATOM13B 0.0 FUNCT@5.0V:ATOM13C 0.0 FUNCT@5.0V:ATOM14 0.0 FUNCT@5.0V:ATOM15 0.0 FUNCT@5.0V:ATOM16 0.0 FUNCT@5.0V:ATOM17 0.0 FUNCT@5.0V:ATOM18 0.0 FUNCT@5.0V:ATOM18HF 0.0 FUNCT@5.0V:ATOM19 0.0 FUNCT@5.0V:ATOM19B 0.0 FUNCT@5.0V:ATOM19C 0.0 FUNCT@5.0V:ATOM19D 0.0 FUNCT@5.0V:ATOM19E 0.0 FUNCT@5.0V:ATOM19F 0.0 FUNCT@5.0V:ATOM19FHF 0.0 FUNCT@5.0V:ATOM20 0.0 FUNCT@5.0V:ATOM21 0.0 FUNCT@5.0V:ATOM22 0.0 FUNCT@5.0V:ATOM23 0.0 FUNCT@5.0V:ATOM24 0.0 FUNCT@5.0V:ATOM25 0.0 FUNCT@5.0V:ATOM25HF 0.0 FUNCT@5.0V:ATOM26A 0.0 FUNCT@5.0V:ATOM26B 0.0 FUNCT@5.0V:ATOM27 0.0 FUNCT@5.0V:ATOM28 0.0 FUNCT@5.0V:ATOM29 0.0 FUNCT@5.0V:ATOM30 0.0 FUNCT@5.0V:ATOM31A 0.0 FUNCT@5.0V:ATOM31B 0.0 FUNCT@5.0V:ATOM32 0.0 FUNCT@5.0V:ATOM33 0.0 FUNCT@5.0V:ATOM34 0.0 FUNCT@5.0V:ATOM35 0.0 FUNCT@5.0V:ATOM36 0.0 FUNCT@5.0V:ATOM37A 0.0 FUNCT@5.0V:ATOM37B 0.0 FUNCT@5.0V:ATOM37C 0.0 FUNCT@5.0V:ATOM37D 0.0 FUNCT@5.0V:ATOM37E 0.0 FUNCT@5.0V:ATOM38 0.0 FUNCT@5.0V:ATOM39 0.0 FUNCT@5.0V:ATOM40 0.0 FUNCT@5.0V:ATOM41 0.0 FUNCT@5.0V:ATOM41A 0.0 FUNCT@5.0V:ATOM42 0.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 0.0 FUNCT@5.0V:ATOM45C_40 0.0 FUNCT@5.0V:ATOM46C_40 0.0 FUNCT@5.0V:ATOM47C_40 0.0 FUNCT@5.0V:ATOM48C_40 0.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 0.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 0.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 0.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 0.0 FUNCT@5.0V:A10TO12HF 0.0 FUNCT@5.0V:ADAC37HF 0.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:204 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0107 chi2 = 1.0595 VTN P-side: a = 0.0099 b(slope) = 0.0065 chi2 = 0.8480 CAL_IN N-side: a = 2.5303 b(slope) = 0.0082 chi2 = 0.3252 CAL_IN P-side: a = 2.5300 b(slope) = 0.0082 chi2 = 0.7092 VTP N-side(average) = 0.6961 V CAL_BASE = 2.5305 V VTP P-side(average) = 0.4278 V CAL_VREF = 3.0549 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:205 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0108 chi2 = 0.5134 VTN P-side: a = 0.0103 b(slope) = 0.0066 chi2 = 0.2451 CAL_IN N-side: a = 2.4953 b(slope) = 0.0085 chi2 = 1.9149 CAL_IN P-side: a = 2.4955 b(slope) = 0.0085 chi2 = 7.2825 VTP N-side(average) = 0.7037 V CAL_BASE = 2.4988 V VTP P-side(average) = 0.4369 V CAL_VREF = 3.0410 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:305 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0107 chi2 = 1.0277 VTN P-side: a = 0.0102 b(slope) = 0.0065 chi2 = 0.7966 CAL_IN N-side: a = 2.4838 b(slope) = 0.0086 chi2 = 0.6288 CAL_IN P-side: a = 2.4834 b(slope) = 0.0086 chi2 = 2.4910 VTP N-side(average) = 0.6958 V CAL_BASE = 2.4839 V VTP P-side(average) = 0.4292 V CAL_VREF = 3.0349 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:405 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0109 b(slope) = 0.0108 chi2 = 1.6884 VTN P-side: a = 0.0113 b(slope) = 0.0066 chi2 = 0.5037 CAL_IN N-side: a = 2.4841 b(slope) = 0.0086 chi2 = 0.5268 CAL_IN P-side: a = 2.4838 b(slope) = 0.0086 chi2 = 1.1074 VTP N-side(average) = 0.7015 V CAL_BASE = 2.4866 V VTP P-side(average) = 0.4325 V CAL_VREF = 3.0408 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:505 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0113 b(slope) = 0.0110 chi2 = 0.4886 VTN P-side: a = 0.0114 b(slope) = 0.0067 chi2 = 0.3317 CAL_IN N-side: a = 2.5036 b(slope) = 0.0087 chi2 = 1.0164 CAL_IN P-side: a = 2.5036 b(slope) = 0.0087 chi2 = 0.9593 VTP N-side(average) = 0.7139 V CAL_BASE = 2.5027 V VTP P-side(average) = 0.4397 V CAL_VREF = 3.0588 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:605 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0108 chi2 = 1.2165 VTN P-side: a = 0.0108 b(slope) = 0.0065 chi2 = 0.3196 CAL_IN N-side: a = 2.4759 b(slope) = 0.0087 chi2 = 0.8168 CAL_IN P-side: a = 2.4757 b(slope) = 0.0087 chi2 = 0.5546 VTP N-side(average) = 0.7055 V CAL_BASE = 2.4778 V VTP P-side(average) = 0.4307 V CAL_VREF = 3.0373 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:705 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0111 b(slope) = 0.0108 chi2 = 1.5845 VTN P-side: a = 0.0112 b(slope) = 0.0066 chi2 = 0.4834 CAL_IN N-side: a = 2.5027 b(slope) = 0.0085 chi2 = 0.7712 CAL_IN P-side: a = 2.5028 b(slope) = 0.0085 chi2 = 0.3727 VTP N-side(average) = 0.7025 V CAL_BASE = 2.5034 V VTP P-side(average) = 0.4348 V CAL_VREF = 3.0486 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:805 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0114 b(slope) = 0.0106 chi2 = 0.8684 VTN P-side: a = 0.0111 b(slope) = 0.0065 chi2 = 0.3790 CAL_IN N-side: a = 2.5116 b(slope) = 0.0083 chi2 = 0.8671 CAL_IN P-side: a = 2.5116 b(slope) = 0.0083 chi2 = 1.0835 VTP N-side(average) = 0.6921 V CAL_BASE = 2.5139 V VTP P-side(average) = 0.4270 V CAL_VREF = 3.0459 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:806 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0108 chi2 = 1.1018 VTN P-side: a = 0.0100 b(slope) = 0.0066 chi2 = 0.3735 CAL_IN N-side: a = 2.5082 b(slope) = 0.0083 chi2 = 1.6017 CAL_IN P-side: a = 2.5082 b(slope) = 0.0082 chi2 = 2.2640 VTP N-side(average) = 0.7047 V CAL_BASE = 2.5122 V VTP P-side(average) = 0.4364 V CAL_VREF = 3.0440 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:706 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0109 chi2 = 2.7831 VTN P-side: a = 0.0100 b(slope) = 0.0066 chi2 = 1.1659 CAL_IN N-side: a = 2.4805 b(slope) = 0.0088 chi2 = 1.1974 CAL_IN P-side: a = 2.4806 b(slope) = 0.0088 chi2 = 0.8628 VTP N-side(average) = 0.7099 V CAL_BASE = 2.4822 V VTP P-side(average) = 0.4349 V CAL_VREF = 3.0442 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:606 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0092 b(slope) = 0.0109 chi2 = 1.5591 VTN P-side: a = 0.0095 b(slope) = 0.0067 chi2 = 0.4004 CAL_IN N-side: a = 2.4853 b(slope) = 0.0087 chi2 = 0.9894 CAL_IN P-side: a = 2.4857 b(slope) = 0.0087 chi2 = 0.5735 VTP N-side(average) = 0.7102 V CAL_BASE = 2.4890 V VTP P-side(average) = 0.4396 V CAL_VREF = 3.0478 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:506 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0109 chi2 = 2.6783 VTN P-side: a = 0.0100 b(slope) = 0.0067 chi2 = 0.7259 CAL_IN N-side: a = 2.4869 b(slope) = 0.0088 chi2 = 0.8897 CAL_IN P-side: a = 2.4870 b(slope) = 0.0088 chi2 = 0.5459 VTP N-side(average) = 0.7114 V CAL_BASE = 2.4910 V VTP P-side(average) = 0.4385 V CAL_VREF = 3.0547 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1403.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:406 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0110 chi2 = 2.5637 VTN P-side: a = 0.0098 b(slope) = 0.0067 chi2 = 0.7608 CAL_IN N-side: a = 2.4745 b(slope) = 0.0088 chi2 = 0.8690 CAL_IN P-side: a = 2.4745 b(slope) = 0.0088 chi2 = 0.4257 VTP N-side(average) = 0.7172 V CAL_BASE = 2.4758 V VTP P-side(average) = 0.4399 V CAL_VREF = 3.0378 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3827.0 FUNCT@5.0V:ATOM45C_40 3827.0 FUNCT@5.0V:ATOM46C_40 3827.0 FUNCT@5.0V:ATOM47C_40 3827.0 FUNCT@5.0V:ATOM48C_40 3827.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3827.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:306 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0108 chi2 = 3.5917 VTN P-side: a = 0.0103 b(slope) = 0.0065 chi2 = 1.1937 CAL_IN N-side: a = 2.4842 b(slope) = 0.0086 chi2 = 1.3304 CAL_IN P-side: a = 2.4841 b(slope) = 0.0086 chi2 = 1.4144 VTP N-side(average) = 0.7024 V CAL_BASE = 2.4871 V VTP P-side(average) = 0.4306 V CAL_VREF = 3.0388 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:206 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: IDDSB:VDD0A 0.1112 IDDSB:VDD0B 0.1112 IDDSB:VDD0C 0.1112 IDDSB:VDD0D 0.1112 DACS TEST = 1 VTN N-side: a = 0.0197 b(slope) = 0.0104 chi2 = 99.0000 VTN P-side: a = 0.0142 b(slope) = 0.0064 chi2 = 1.1449 CAL_IN N-side: a = 2.4870 b(slope) = 0.0083 chi2 = 99.0000 CAL_IN P-side: a = 2.4806 b(slope) = 0.0085 chi2 = 4.1664 VTP N-side(average) = 0.6901 V CAL_BASE = 2.4788 V VTP P-side(average) = 0.4269 V CAL_VREF = 3.0154 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM10TO12 547.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 1 error detected in test: FUNCT@5.0V:A10TO12HF 547.0 TMIN TEST = 3 error detected in test: TMIN@4.8V:A10_12_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 ------- CHIP ID:107 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0105 chi2 = 0.7443 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.4017 CAL_IN N-side: a = 2.4870 b(slope) = 0.0085 chi2 = 0.8222 CAL_IN P-side: a = 2.4866 b(slope) = 0.0085 chi2 = 1.9418 VTP N-side(average) = 0.6861 V CAL_BASE = 2.4883 V VTP P-side(average) = 0.4226 V CAL_VREF = 3.0332 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:207 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0108 chi2 = 0.6096 VTN P-side: a = 0.0102 b(slope) = 0.0066 chi2 = 0.4882 CAL_IN N-side: a = 2.5124 b(slope) = 0.0085 chi2 = 0.3814 CAL_IN P-side: a = 2.5123 b(slope) = 0.0085 chi2 = 0.4131 VTP N-side(average) = 0.7034 V CAL_BASE = 2.5103 V VTP P-side(average) = 0.4331 V CAL_VREF = 3.0522 V FUNCT. DIGITAL TEST = 11 error detected in test: FUNCT@5.0V:ATOM17 7310.0 FUNCT@5.0V:ATOM18 10355.0 FUNCT@5.0V:ATOM18HF 10355.0 FUNCT@5.0V:ATOM25 2793.0 FUNCT@5.0V:ATOM25HF 2793.0 FUNCT@5.0V:ATOM28 1748.0 FUNCT@5.0V:ATOM29 1748.0 FUNCT@5.0V:ATOM30 1748.0 FUNCT@5.0V:ATOM37C 2359.0 FUNCT@5.0V:ATOM37D 2327.0 FUNCT@5.0V:ATOM37E 2318.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:307 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0106 chi2 = 1.0573 VTN P-side: a = 0.0098 b(slope) = 0.0064 chi2 = 0.6707 CAL_IN N-side: a = 2.4586 b(slope) = 0.0088 chi2 = 0.5294 CAL_IN P-side: a = 2.4585 b(slope) = 0.0088 chi2 = 0.3906 VTP N-side(average) = 0.6905 V CAL_BASE = 2.4636 V VTP P-side(average) = 0.4229 V CAL_VREF = 3.0281 V FUNCT. DIGITAL TEST = 4 error detected in test: FUNCT@5.0V:ATOM37B 1818.0 FUNCT@5.0V:ATOM37C 1802.0 FUNCT@5.0V:ATOM37D 1770.0 FUNCT@5.0V:ATOM37E 1761.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:407 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0109 chi2 = 2.0773 VTN P-side: a = 0.0097 b(slope) = 0.0066 chi2 = 0.5386 CAL_IN N-side: a = 2.4969 b(slope) = 0.0086 chi2 = 0.8753 CAL_IN P-side: a = 2.4969 b(slope) = 0.0086 chi2 = 0.5158 VTP N-side(average) = 0.7066 V CAL_BASE = 2.4980 V VTP P-side(average) = 0.4336 V CAL_VREF = 3.0510 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:507 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0219 b(slope) = 0.0106 chi2 = 99.0000 VTN P-side: a = 0.0097 b(slope) = 0.0066 chi2 = 0.3104 CAL_IN N-side: a = 2.5118 b(slope) = 0.0084 chi2 = 99.0000 CAL_IN P-side: a = 2.4956 b(slope) = 0.0088 chi2 = 8.0142 VTP N-side(average) = 0.7064 V CAL_BASE = 2.4980 V VTP P-side(average) = 0.4332 V CAL_VREF = 3.0596 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:607 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0108 chi2 = 0.9002 VTN P-side: a = 0.0100 b(slope) = 0.0066 chi2 = 0.2923 CAL_IN N-side: a = 2.4963 b(slope) = 0.0087 chi2 = 0.7908 CAL_IN P-side: a = 2.4965 b(slope) = 0.0087 chi2 = 0.5124 VTP N-side(average) = 0.7030 V CAL_BASE = 2.4973 V VTP P-side(average) = 0.4345 V CAL_VREF = 3.0530 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:707 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0107 chi2 = 0.8245 VTN P-side: a = 0.0104 b(slope) = 0.0066 chi2 = 0.5249 CAL_IN N-side: a = 2.4915 b(slope) = 0.0087 chi2 = 0.7445 CAL_IN P-side: a = 2.4916 b(slope) = 0.0087 chi2 = 0.5653 VTP N-side(average) = 0.6996 V CAL_BASE = 2.4934 V VTP P-side(average) = 0.4321 V CAL_VREF = 3.0478 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:807 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0106 b(slope) = 0.0108 chi2 = 0.9340 VTN P-side: a = 0.0104 b(slope) = 0.0067 chi2 = 0.7946 CAL_IN N-side: a = 2.4747 b(slope) = 0.0087 chi2 = 0.7062 CAL_IN P-side: a = 2.4751 b(slope) = 0.0087 chi2 = 0.6511 VTP N-side(average) = 0.7061 V CAL_BASE = 2.4746 V VTP P-side(average) = 0.4388 V CAL_VREF = 3.0334 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:907 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0110 chi2 = 3.4180 VTN P-side: a = 0.0105 b(slope) = 0.0068 chi2 = 0.4460 CAL_IN N-side: a = 2.5044 b(slope) = 0.0084 chi2 = 1.2413 CAL_IN P-side: a = 2.5046 b(slope) = 0.0083 chi2 = 1.1576 VTP N-side(average) = 0.7142 V CAL_BASE = 2.5056 V VTP P-side(average) = 0.4438 V CAL_VREF = 3.0408 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:908 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0106 chi2 = 2.6887 VTN P-side: a = 0.0100 b(slope) = 0.0065 chi2 = 0.9193 CAL_IN N-side: a = 2.5185 b(slope) = 0.0082 chi2 = 0.6444 CAL_IN P-side: a = 2.5185 b(slope) = 0.0082 chi2 = 0.2736 VTP N-side(average) = 0.6897 V CAL_BASE = 2.5227 V VTP P-side(average) = 0.4295 V CAL_VREF = 3.0457 V FUNCT. DIGITAL TEST = 5 error detected in test: FUNCT@5.0V:ATOM17 7738.0 FUNCT@5.0V:ATOM18 10789.0 FUNCT@5.0V:ATOM18HF 10789.0 FUNCT@5.0V:ATOM19F 10805.0 FUNCT@5.0V:ATOM19FHF 10805.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:808 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.2265 b(slope) = 0.0000 chi2 = 0.3132 VTN P-side: a = 0.1435 b(slope) = 0.0000 chi2 = 0.2406 CAL_IN N-side: a = 2.7765 b(slope) = 0.0000 chi2 = 0.3307 CAL_IN P-side: a = 2.7764 b(slope) = 0.0000 chi2 = 0.4561 VTP N-side(average) = 0.7050 V CAL_BASE = 2.5061 V VTP P-side(average) = 0.4385 V CAL_VREF = 3.0478 V FUNCT. DIGITAL TEST = 51 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 FUNCT@5.0V:ATOM7TO9B 272.0 FUNCT@5.0V:ATOM7TO9C 272.0 FUNCT@5.0V:ATOM7TO9D 272.0 FUNCT@5.0V:ATOM7TO9E 272.0 FUNCT@5.0V:ATOM10TO12 496.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM34 268.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 FUNCT@5.0V:ATOM42 369.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:708 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0107 chi2 = 2.3900 VTN P-side: a = 0.0102 b(slope) = 0.0066 chi2 = 0.8094 CAL_IN N-side: a = 2.5236 b(slope) = 0.0084 chi2 = 0.6057 CAL_IN P-side: a = 2.5235 b(slope) = 0.0084 chi2 = 0.8123 VTP N-side(average) = 0.6991 V CAL_BASE = 2.5276 V VTP P-side(average) = 0.4325 V CAL_VREF = 3.0654 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:608 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0099 b(slope) = 0.0111 chi2 = 1.0707 VTN P-side: a = 0.0102 b(slope) = 0.0067 chi2 = 0.6311 CAL_IN N-side: a = 3.0923 b(slope) = 0.0000 chi2 = 7.2142 CAL_IN P-side: a = 3.0926 b(slope) = 0.0000 chi2 = 3.5931 VTP N-side(average) = 0.7186 V CAL_BASE = 2.4851 V VTP P-side(average) = 0.4431 V CAL_VREF = 3.0579 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:508 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0109 chi2 = 1.7612 VTN P-side: a = 0.0104 b(slope) = 0.0067 chi2 = 0.6132 CAL_IN N-side: a = 2.5535 b(slope) = 0.0083 chi2 = 0.4255 CAL_IN P-side: a = 2.5535 b(slope) = 0.0083 chi2 = 0.7605 VTP N-side(average) = 0.7070 V CAL_BASE = 2.5579 V VTP P-side(average) = 0.4380 V CAL_VREF = 3.0906 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM10TO12 544.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 1 error detected in test: FUNCT@5.0V:A10TO12HF 544.0 TMIN TEST = 3 error detected in test: TMIN@4.8V:A10_12_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 ------- CHIP ID:408 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0109 chi2 = 3.3330 VTN P-side: a = 0.0109 b(slope) = 0.0066 chi2 = 0.9664 CAL_IN N-side: a = 2.4998 b(slope) = 0.0086 chi2 = 0.5657 CAL_IN P-side: a = 2.4995 b(slope) = 0.0086 chi2 = 0.9535 VTP N-side(average) = 0.7061 V CAL_BASE = 2.5046 V VTP P-side(average) = 0.4335 V CAL_VREF = 3.0554 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:308 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1027 DACS TEST = 1 VTN N-side: a = 0.0100 b(slope) = 0.0108 chi2 = 1.8540 VTN P-side: a = 0.0105 b(slope) = 0.0066 chi2 = 0.6680 CAL_IN N-side: a = 3.0925 b(slope) = 0.0000 chi2 = 3.3991 CAL_IN P-side: a = 3.0924 b(slope) = 0.0000 chi2 = 3.4214 VTP N-side(average) = 0.7022 V CAL_BASE = 2.4858 V VTP P-side(average) = 0.4336 V CAL_VREF = 3.0400 V FUNCT. DIGITAL TEST = 37 error detected in test: FUNCT@5.0V:ATOM13A 1064.0 FUNCT@5.0V:ATOM13B 1121.0 FUNCT@5.0V:ATOM13C 1121.0 FUNCT@5.0V:ATOM15 1107.0 FUNCT@5.0V:ATOM17 3420.0 FUNCT@5.0V:ATOM18 3436.0 FUNCT@5.0V:ATOM18HF 3436.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2614.0 FUNCT@5.0V:ATOM19F 6486.0 FUNCT@5.0V:ATOM19FHF 6486.0 FUNCT@5.0V:ATOM20 1079.0 FUNCT@5.0V:ATOM21 1056.0 FUNCT@5.0V:ATOM22 1044.0 FUNCT@5.0V:ATOM24 1074.0 FUNCT@5.0V:ATOM25 1062.0 FUNCT@5.0V:ATOM25HF 1062.0 FUNCT@5.0V:ATOM26A 1040.0 FUNCT@5.0V:ATOM26B 1849.0 FUNCT@5.0V:ATOM28 1177.0 FUNCT@5.0V:ATOM29 1177.0 FUNCT@5.0V:ATOM30 1177.0 FUNCT@5.0V:ATOM31A 811.0 FUNCT@5.0V:ATOM31B 1000.0 FUNCT@5.0V:ATOM32 811.0 FUNCT@5.0V:ATOM33 1177.0 FUNCT@5.0V:ATOM35 1311.0 FUNCT@5.0V:ATOM36 1068.0 FUNCT@5.0V:ATOM37A 1209.0 FUNCT@5.0V:ATOM37B 1201.0 FUNCT@5.0V:ATOM37C 1182.0 FUNCT@5.0V:ATOM37D 1150.0 FUNCT@5.0V:ATOM37E 1144.0 FUNCT@5.0V:ATOM39 1089.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3669.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3667.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:208 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0107 chi2 = 1.2767 VTN P-side: a = 0.0100 b(slope) = 0.0065 chi2 = 0.8087 CAL_IN N-side: a = 2.4842 b(slope) = 0.0086 chi2 = 0.6901 CAL_IN P-side: a = 2.4841 b(slope) = 0.0086 chi2 = 0.8739 VTP N-side(average) = 0.6971 V CAL_BASE = 2.4871 V VTP P-side(average) = 0.4292 V CAL_VREF = 3.0373 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:108 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0106 chi2 = 0.8271 VTN P-side: a = 0.0102 b(slope) = 0.0065 chi2 = 0.6539 CAL_IN N-side: a = 2.5081 b(slope) = 0.0083 chi2 = 0.6358 CAL_IN P-side: a = 2.5079 b(slope) = 0.0083 chi2 = 9.9932 VTP N-side(average) = 0.6915 V CAL_BASE = 2.5110 V VTP P-side(average) = 0.4272 V CAL_VREF = 3.0447 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:209 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0088 b(slope) = 0.0107 chi2 = 1.6715 VTN P-side: a = 0.0096 b(slope) = 0.0065 chi2 = 0.9026 CAL_IN N-side: a = 2.4700 b(slope) = 0.0097 chi2 = 99.0000 CAL_IN P-side: a = 2.4833 b(slope) = 0.0098 chi2 = 99.0000 VTP N-side(average) = 0.6976 V CAL_BASE = 2.4900 V VTP P-side(average) = 0.4280 V CAL_VREF = 3.0334 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:309 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0106 chi2 = 0.8604 VTN P-side: a = 0.0098 b(slope) = 0.0065 chi2 = 0.4654 CAL_IN N-side: a = 2.4736 b(slope) = 0.0086 chi2 = 0.6784 CAL_IN P-side: a = 2.4739 b(slope) = 0.0086 chi2 = 0.2481 VTP N-side(average) = 0.6921 V CAL_BASE = 2.4773 V VTP P-side(average) = 0.4266 V CAL_VREF = 3.0320 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:409 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0227 b(slope) = 0.0102 chi2 = 99.0000 VTN P-side: a = 0.0099 b(slope) = 0.0067 chi2 = 0.4870 CAL_IN N-side: a = 2.5003 b(slope) = 0.0082 chi2 = 99.0000 CAL_IN P-side: a = 2.4931 b(slope) = 0.0086 chi2 = 0.5540 VTP N-side(average) = 0.7058 V CAL_BASE = 2.4949 V VTP P-side(average) = 0.4373 V CAL_VREF = 3.0454 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:509 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0108 chi2 = 0.5328 VTN P-side: a = 0.0098 b(slope) = 0.0066 chi2 = 0.5146 CAL_IN N-side: a = 2.5221 b(slope) = 0.0085 chi2 = 1.3513 CAL_IN P-side: a = 2.5224 b(slope) = 0.0085 chi2 = 1.1639 VTP N-side(average) = 0.7021 V CAL_BASE = 2.5259 V VTP P-side(average) = 0.4320 V CAL_VREF = 3.0718 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:609 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0109 chi2 = 0.7802 VTN P-side: a = 0.0100 b(slope) = 0.0066 chi2 = 0.6006 CAL_IN N-side: a = 2.5118 b(slope) = 0.0086 chi2 = 0.7247 CAL_IN P-side: a = 2.5120 b(slope) = 0.0086 chi2 = 0.4342 VTP N-side(average) = 0.7075 V CAL_BASE = 2.5142 V VTP P-side(average) = 0.4348 V CAL_VREF = 3.0642 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:709 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0107 b(slope) = 0.0107 chi2 = 1.3630 VTN P-side: a = 0.0102 b(slope) = 0.0065 chi2 = 0.6038 CAL_IN N-side: a = 2.5140 b(slope) = 0.0085 chi2 = 0.4438 CAL_IN P-side: a = 2.5138 b(slope) = 0.0085 chi2 = 0.5468 VTP N-side(average) = 0.6959 V CAL_BASE = 2.5139 V VTP P-side(average) = 0.4290 V CAL_VREF = 3.0559 V FUNCT. DIGITAL TEST = 12 error detected in test: FUNCT@5.0V:ATOM13A 1619.0 FUNCT@5.0V:ATOM17 3975.0 FUNCT@5.0V:ATOM18 3991.0 FUNCT@5.0V:ATOM18HF 3991.0 FUNCT@5.0V:ATOM19E 3168.0 FUNCT@5.0V:ATOM21 1610.0 FUNCT@5.0V:ATOM22 1598.0 FUNCT@5.0V:ATOM24 1074.0 FUNCT@5.0V:ATOM25 1616.0 FUNCT@5.0V:ATOM25HF 1616.0 FUNCT@5.0V:ATOM36 1623.0 FUNCT@5.0V:ATOM39 1645.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:809 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0109 chi2 = 1.6895 VTN P-side: a = 0.0097 b(slope) = 0.0067 chi2 = 0.5509 CAL_IN N-side: a = 2.4845 b(slope) = 0.0085 chi2 = 0.9113 CAL_IN P-side: a = 2.4847 b(slope) = 0.0085 chi2 = 1.4507 VTP N-side(average) = 0.7095 V CAL_BASE = 2.4858 V VTP P-side(average) = 0.4395 V CAL_VREF = 3.0322 V FUNCT. DIGITAL TEST = 39 error detected in test: FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 FUNCT@5.0V:ATOM42 214.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:810 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0107 b(slope) = 0.0108 chi2 = 0.4512 VTN P-side: a = 0.0106 b(slope) = 0.0067 chi2 = 0.3075 CAL_IN N-side: a = 2.5181 b(slope) = 0.0083 chi2 = 1.0351 CAL_IN P-side: a = 2.5181 b(slope) = 0.0083 chi2 = 1.2460 VTP N-side(average) = 0.7023 V CAL_BASE = 2.5185 V VTP P-side(average) = 0.4389 V CAL_VREF = 3.0483 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:710 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0112 b(slope) = 0.0110 chi2 = 0.7670 VTN P-side: a = 0.0112 b(slope) = 0.0068 chi2 = 0.6712 CAL_IN N-side: a = 3.0921 b(slope) = 0.0000 chi2 = 3.1555 CAL_IN P-side: a = 3.0925 b(slope) = 0.0000 chi2 = 2.1852 VTP N-side(average) = 0.7150 V CAL_BASE = 2.5049 V VTP P-side(average) = 0.4476 V CAL_VREF = 3.0486 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1634.0 FUNCT@5.0V:ATOM15 1678.0 FUNCT@5.0V:ATOM17 3990.0 FUNCT@5.0V:ATOM18 4006.0 FUNCT@5.0V:ATOM18HF 4006.0 FUNCT@5.0V:ATOM19 3942.0 FUNCT@5.0V:ATOM19D 3957.0 FUNCT@5.0V:ATOM19E 3185.0 FUNCT@5.0V:ATOM19F 7167.0 FUNCT@5.0V:ATOM19FHF 7167.0 FUNCT@5.0V:ATOM20 1760.0 FUNCT@5.0V:ATOM21 1627.0 FUNCT@5.0V:ATOM22 1615.0 FUNCT@5.0V:ATOM25 1742.0 FUNCT@5.0V:ATOM25HF 1742.0 FUNCT@5.0V:ATOM26A 1611.0 FUNCT@5.0V:ATOM26B 2529.0 FUNCT@5.0V:ATOM28 1749.0 FUNCT@5.0V:ATOM29 1858.0 FUNCT@5.0V:ATOM30 1748.0 FUNCT@5.0V:ATOM31A 1383.0 FUNCT@5.0V:ATOM31B 1681.0 FUNCT@5.0V:ATOM32 1382.0 FUNCT@5.0V:ATOM33 1748.0 FUNCT@5.0V:ATOM35 1883.0 FUNCT@5.0V:ATOM36 1638.0 FUNCT@5.0V:ATOM37A 2354.0 FUNCT@5.0V:ATOM37B 2566.0 FUNCT@5.0V:ATOM37C 2331.0 FUNCT@5.0V:ATOM37D 2299.0 FUNCT@5.0V:ATOM37E 2289.0 FUNCT@5.0V:ATOM39 1659.0 FUNCT@5.0V:ATOM41 2185.0 FUNCT@5.0V:ATOM41A 2185.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:610 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0110 chi2 = 0.6627 VTN P-side: a = 0.0099 b(slope) = 0.0068 chi2 = 0.3033 CAL_IN N-side: a = 2.5106 b(slope) = 0.0087 chi2 = 0.5859 CAL_IN P-side: a = 2.5104 b(slope) = 0.0087 chi2 = 0.4955 VTP N-side(average) = 0.7170 V CAL_BASE = 2.5132 V VTP P-side(average) = 0.4439 V CAL_VREF = 3.0686 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:510 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0104 b(slope) = 0.0111 chi2 = 0.7896 VTN P-side: a = 0.0184 b(slope) = 0.0066 chi2 = 99.0000 CAL_IN N-side: a = 3.0926 b(slope) = 0.0000 chi2 = 3.7746 CAL_IN P-side: a = 3.0919 b(slope) = 0.0000 chi2 = 18.0138 VTP N-side(average) = 0.7212 V CAL_BASE = 2.5022 V VTP P-side(average) = 0.4432 V CAL_VREF = 3.0615 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1759.0 FUNCT@5.0V:ATOM13B 1823.0 FUNCT@5.0V:ATOM13C 1823.0 FUNCT@5.0V:ATOM15 1795.0 FUNCT@5.0V:ATOM17 4115.0 FUNCT@5.0V:ATOM18 4130.0 FUNCT@5.0V:ATOM18HF 4130.0 FUNCT@5.0V:ATOM19 4067.0 FUNCT@5.0V:ATOM19D 4082.0 FUNCT@5.0V:ATOM19E 3309.0 FUNCT@5.0V:ATOM19F 7183.0 FUNCT@5.0V:ATOM19FHF 7183.0 FUNCT@5.0V:ATOM20 1778.0 FUNCT@5.0V:ATOM21 1244.0 FUNCT@5.0V:ATOM22 1742.0 FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM24 1074.0 FUNCT@5.0V:ATOM25 1757.0 FUNCT@5.0V:ATOM25HF 1757.0 FUNCT@5.0V:ATOM26A 1735.0 FUNCT@5.0V:ATOM26B 2537.0 FUNCT@5.0V:ATOM28 1366.0 FUNCT@5.0V:ATOM29 1865.0 FUNCT@5.0V:ATOM30 1865.0 FUNCT@5.0V:ATOM31A 1000.0 FUNCT@5.0V:ATOM31B 1688.0 FUNCT@5.0V:ATOM32 1499.0 FUNCT@5.0V:ATOM33 1865.0 FUNCT@5.0V:ATOM35 2006.0 FUNCT@5.0V:ATOM36 1762.0 FUNCT@5.0V:ATOM37A 2614.0 FUNCT@5.0V:ATOM37B 1580.0 FUNCT@5.0V:ATOM37C 2586.0 FUNCT@5.0V:ATOM37D 2554.0 FUNCT@5.0V:ATOM37E 1523.0 FUNCT@5.0V:ATOM39 1784.0 FUNCT@5.0V:ATOM41 2302.0 FUNCT@5.0V:ATOM41A 2302.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4019.0 FUNCT@5.0V:ATOM45C_40 4019.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 4019.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4019.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:410 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0108 chi2 = 1.5378 VTN P-side: a = 0.0105 b(slope) = 0.0066 chi2 = 0.4691 CAL_IN N-side: a = 2.5219 b(slope) = 0.0084 chi2 = 0.5678 CAL_IN P-side: a = 2.5217 b(slope) = 0.0084 chi2 = 0.4362 VTP N-side(average) = 0.7030 V CAL_BASE = 2.5247 V VTP P-side(average) = 0.4321 V CAL_VREF = 3.0635 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:310 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0113 b(slope) = 0.0109 chi2 = 0.8143 VTN P-side: a = 0.0116 b(slope) = 0.0066 chi2 = 0.4195 CAL_IN N-side: a = 2.4970 b(slope) = 0.0085 chi2 = 0.5082 CAL_IN P-side: a = 2.4969 b(slope) = 0.0085 chi2 = 0.4274 VTP N-side(average) = 0.7085 V CAL_BASE = 2.4995 V VTP P-side(average) = 0.4343 V CAL_VREF = 3.0442 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 2 error detected in test: TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:210 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0120 b(slope) = 0.0106 chi2 = 1.9176 VTN P-side: a = 0.0123 b(slope) = 0.0065 chi2 = 1.0483 CAL_IN N-side: a = 2.5100 b(slope) = 0.0083 chi2 = 0.4891 CAL_IN P-side: a = 2.5101 b(slope) = 0.0083 chi2 = 0.7039 VTP N-side(average) = 0.6914 V CAL_BASE = 2.5127 V VTP P-side(average) = 0.4271 V CAL_VREF = 3.0474 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:211 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0127 b(slope) = 0.0106 chi2 = 0.4614 VTN P-side: a = 0.0126 b(slope) = 0.0065 chi2 = 0.5478 CAL_IN N-side: a = 2.4870 b(slope) = 0.0085 chi2 = 1.0318 CAL_IN P-side: a = 2.4870 b(slope) = 0.0085 chi2 = 1.5113 VTP N-side(average) = 0.6936 V CAL_BASE = 2.4853 V VTP P-side(average) = 0.4287 V CAL_VREF = 3.0305 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:311 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0127 b(slope) = 0.0107 chi2 = 0.8152 VTN P-side: a = 0.0132 b(slope) = 0.0065 chi2 = 0.7169 CAL_IN N-side: a = 2.5068 b(slope) = 0.0084 chi2 = 0.5589 CAL_IN P-side: a = 2.5068 b(slope) = 0.0084 chi2 = 0.3495 VTP N-side(average) = 0.6957 V CAL_BASE = 2.5098 V VTP P-side(average) = 0.4302 V CAL_VREF = 3.0461 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:411 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0106 chi2 = 1.2803 VTN P-side: a = 0.0107 b(slope) = 0.0065 chi2 = 0.4320 CAL_IN N-side: a = 2.5083 b(slope) = 0.0084 chi2 = 0.3686 CAL_IN P-side: a = 2.5086 b(slope) = 0.0084 chi2 = 0.7992 VTP N-side(average) = 0.6865 V CAL_BASE = 2.5085 V VTP P-side(average) = 0.4246 V CAL_VREF = 3.0483 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:511 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0107 chi2 = 1.5596 VTN P-side: a = 0.0106 b(slope) = 0.0065 chi2 = 0.6428 CAL_IN N-side: a = 2.4899 b(slope) = 0.0086 chi2 = 1.0160 CAL_IN P-side: a = 2.4904 b(slope) = 0.0086 chi2 = 0.5471 VTP N-side(average) = 0.6938 V CAL_BASE = 2.4922 V VTP P-side(average) = 0.4289 V CAL_VREF = 3.0430 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:611 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0110 b(slope) = 0.0109 chi2 = 0.6948 VTN P-side: a = 0.0108 b(slope) = 0.0067 chi2 = 0.5295 CAL_IN N-side: a = 2.5017 b(slope) = 0.0085 chi2 = 0.5522 CAL_IN P-side: a = 2.5017 b(slope) = 0.0085 chi2 = 2.0359 VTP N-side(average) = 0.7072 V CAL_BASE = 2.5071 V VTP P-side(average) = 0.4390 V CAL_VREF = 3.0527 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:711 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0110 b(slope) = 0.0108 chi2 = 1.0156 VTN P-side: a = 0.0107 b(slope) = 0.0067 chi2 = 0.7365 CAL_IN N-side: a = 2.5061 b(slope) = 0.0084 chi2 = 1.0114 CAL_IN P-side: a = 2.5061 b(slope) = 0.0084 chi2 = 0.9536 VTP N-side(average) = 0.7034 V CAL_BASE = 2.5076 V VTP P-side(average) = 0.4387 V CAL_VREF = 3.0437 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1120.0 FUNCT@5.0V:ATOM13C 1120.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM23 976.0 FUNCT@5.0V:ATOM24 1076.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1208.0 FUNCT@5.0V:ATOM37B 1200.0 FUNCT@5.0V:ATOM37C 1184.0 FUNCT@5.0V:ATOM37D 1152.0 FUNCT@5.0V:ATOM37E 1143.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1403.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:811 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0155 b(slope) = 0.0104 chi2 = 99.0000 VTN P-side: a = 0.0109 b(slope) = 0.0067 chi2 = 0.4682 CAL_IN N-side: a = 2.4856 b(slope) = 0.0085 chi2 = 99.0000 CAL_IN P-side: a = 2.4873 b(slope) = 0.0087 chi2 = 99.0000 VTP N-side(average) = 0.7032 V CAL_BASE = 2.4883 V VTP P-side(average) = 0.4402 V CAL_VREF = 3.0244 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:812 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0107 b(slope) = 0.0108 chi2 = 0.7478 VTN P-side: a = 0.0111 b(slope) = 0.0067 chi2 = 0.4135 CAL_IN N-side: a = 2.5028 b(slope) = 0.0083 chi2 = 0.5292 CAL_IN P-side: a = 2.5028 b(slope) = 0.0083 chi2 = 0.5236 VTP N-side(average) = 0.7044 V CAL_BASE = 2.5085 V VTP P-side(average) = 0.4392 V CAL_VREF = 3.0405 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:712 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0109 b(slope) = 0.0108 chi2 = 1.2338 VTN P-side: a = 0.0109 b(slope) = 0.0066 chi2 = 0.7126 CAL_IN N-side: a = 3.0925 b(slope) = 0.0000 chi2 = 3.5252 CAL_IN P-side: a = 3.0925 b(slope) = 0.0000 chi2 = 2.7641 VTP N-side(average) = 0.7030 V CAL_BASE = 2.5369 V VTP P-side(average) = 0.4352 V CAL_VREF = 3.0681 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:612 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0236 b(slope) = 0.0106 chi2 = 99.0000 VTN P-side: a = 0.0114 b(slope) = 0.0067 chi2 = 0.3659 CAL_IN N-side: a = 3.0923 b(slope) = 0.0000 chi2 = 2.8732 CAL_IN P-side: a = 3.0927 b(slope) = 0.0000 chi2 = 1.4703 VTP N-side(average) = 0.7077 V CAL_BASE = 2.5073 V VTP P-side(average) = 0.4393 V CAL_VREF = 3.0693 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:512 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0230 b(slope) = 0.0105 chi2 = 99.0000 VTN P-side: a = 0.0112 b(slope) = 0.0066 chi2 = 0.5367 CAL_IN N-side: a = 3.0925 b(slope) = 0.0000 chi2 = 2.7976 CAL_IN P-side: a = 3.0925 b(slope) = 0.0000 chi2 = 2.0408 VTP N-side(average) = 0.7037 V CAL_BASE = 2.4910 V VTP P-side(average) = 0.4345 V CAL_VREF = 3.0425 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:412 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0115 b(slope) = 0.0108 chi2 = 1.6724 VTN P-side: a = 0.0113 b(slope) = 0.0066 chi2 = 0.8594 CAL_IN N-side: a = 2.4721 b(slope) = 0.0087 chi2 = 0.7469 CAL_IN P-side: a = 2.4723 b(slope) = 0.0086 chi2 = 0.9346 VTP N-side(average) = 0.7006 V CAL_BASE = 2.4746 V VTP P-side(average) = 0.4317 V CAL_VREF = 3.0286 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:312 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0097 b(slope) = 0.0107 chi2 = 2.4411 VTN P-side: a = 0.0103 b(slope) = 0.0065 chi2 = 0.7075 CAL_IN N-side: a = 3.0924 b(slope) = 0.0000 chi2 = 2.6899 CAL_IN P-side: a = 3.0922 b(slope) = 0.0000 chi2 = 1.9612 VTP N-side(average) = 0.6949 V CAL_BASE = 2.4849 V VTP P-side(average) = 0.4283 V CAL_VREF = 3.0327 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:212 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0106 chi2 = 0.9622 VTN P-side: a = 0.0101 b(slope) = 0.0064 chi2 = 0.5725 CAL_IN N-side: a = 2.5021 b(slope) = 0.0083 chi2 = 1.1017 CAL_IN P-side: a = 2.5022 b(slope) = 0.0083 chi2 = 0.4344 VTP N-side(average) = 0.6867 V CAL_BASE = 2.5061 V VTP P-side(average) = 0.4200 V CAL_VREF = 3.0383 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:413 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0106 chi2 = 1.8167 VTN P-side: a = 0.0100 b(slope) = 0.0065 chi2 = 0.7220 CAL_IN N-side: a = 2.4932 b(slope) = 0.0084 chi2 = 0.5228 CAL_IN P-side: a = 2.4930 b(slope) = 0.0084 chi2 = 0.4236 VTP N-side(average) = 0.6913 V CAL_BASE = 2.4966 V VTP P-side(average) = 0.4257 V CAL_VREF = 3.0334 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:513 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0106 chi2 = 0.5372 VTN P-side: a = 0.0100 b(slope) = 0.0065 chi2 = 0.4003 CAL_IN N-side: a = 2.5097 b(slope) = 0.0083 chi2 = 1.6094 CAL_IN P-side: a = 2.5097 b(slope) = 0.0083 chi2 = 2.3091 VTP N-side(average) = 0.6916 V CAL_BASE = 2.5134 V VTP P-side(average) = 0.4287 V CAL_VREF = 3.0437 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:613 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0102 b(slope) = 0.0107 chi2 = 0.9048 VTN P-side: a = 0.0104 b(slope) = 0.0065 chi2 = 0.3014 CAL_IN N-side: a = 3.0926 b(slope) = 0.0000 chi2 = 2.5253 CAL_IN P-side: a = 3.0925 b(slope) = 0.0000 chi2 = 2.5961 VTP N-side(average) = 0.6986 V CAL_BASE = 2.4961 V VTP P-side(average) = 0.4299 V CAL_VREF = 3.0383 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4615.0 FUNCT@5.0V:ATOM45C_40 4615.0 FUNCT@5.0V:ATOM46C_40 4615.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 4615.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4615.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:614 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1097 IDDSB:VDD1B 0.1099 IDDSB:VDD1C 0.1100 IDDSB:VDD1D 0.1101 IDDOP1:DVDD 0.1370 DACS TEST = 1 VTN N-side: a = 0.0106 b(slope) = 0.0109 chi2 = 0.6898 VTN P-side: a = 0.0105 b(slope) = 0.0067 chi2 = 0.2265 CAL_IN N-side: a = 3.1040 b(slope) = -0.0021 chi2 = 99.0000 CAL_IN P-side: a = 2.4565 b(slope) = 0.0087 chi2 = 0.8050 VTP N-side(average) = 0.7116 V CAL_BASE = 2.4846 V VTP P-side(average) = 0.4401 V CAL_VREF = 3.0164 V FUNCT. DIGITAL TEST = 52 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 FUNCT@5.0V:ATOM7TO9B 272.0 FUNCT@5.0V:ATOM7TO9C 272.0 FUNCT@5.0V:ATOM7TO9D 272.0 FUNCT@5.0V:ATOM7TO9E 272.0 FUNCT@5.0V:ATOM10TO12 496.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM14 1082.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM34 268.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1097.0 FUNCT@5.0V:ATOM41A 1597.0 FUNCT@5.0V:ATOM42 214.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:514 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5144 V_V1RB:169/L5 3.5151 V_V1RC:169/L5 3.5151 V_V1RD:169/L5 3.5132 DACS TEST = 1 VTN N-side: a = 0.0094 b(slope) = 0.0108 chi2 = 0.6500 VTN P-side: a = 0.0094 b(slope) = 0.0066 chi2 = 0.7794 CAL_IN N-side: a = 3.0937 b(slope) = 0.0000 chi2 = 2.6192 CAL_IN P-side: a = 3.0938 b(slope) = 0.0000 chi2 = 2.9328 VTP N-side(average) = 0.6999 V CAL_BASE = 2.3757 V VTP P-side(average) = 0.4316 V CAL_VREF = 3.5268 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:414 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0091 b(slope) = 0.0107 chi2 = 1.5438 VTN P-side: a = 0.0096 b(slope) = 0.0065 chi2 = 0.7804 CAL_IN N-side: a = 3.0923 b(slope) = 0.0000 chi2 = 2.6220 CAL_IN P-side: a = 3.0924 b(slope) = 0.0000 chi2 = 2.6229 VTP N-side(average) = 0.6925 V CAL_BASE = 2.4946 V VTP P-side(average) = 0.4284 V CAL_VREF = 3.0283 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 +++++++++ WAFER DATA+++++++++++++++++++++++++++ CLASSES: A-->Good, B-->Probably Good, C-->Bad A B C ------------------------- 602 503 401 502 501 402 601 303 203 603 403 704 703 604 803 404 804 204 504 205 304 305 405 505 506 605 406 705 206 805 207 806 307 706 507 606 908 306 808 107 608 407 508 607 308 707 209 807 409 907 709 708 809 408 710 208 510 108 310 309 711 509 811 609 712 810 612 610 512 410 312 210 212 211 613 311 614 411 514 511 414 611 812 412 413 513 ---------------------------- 45 1 40 NUMBER OF CHIPS TESTED = 86 NUMBER OF CLASS A CHIPS = 45 NUMBER OF CLASS B CHIPS = 1 NUMBER OF CLASS C CHIPS = 40 YIELD = 52.33 %