------- CHIP ID:401 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0090 b(slope) = 0.0106 chi2 = 0.6558 VTN P-side: a = 0.0092 b(slope) = 0.0065 chi2 = 0.4449 CAL_IN N-side: a = 2.4405 b(slope) = 0.0084 chi2 = 0.5493 CAL_IN P-side: a = 2.4406 b(slope) = 0.0084 chi2 = 0.5830 VTP N-side(average) = 0.6910 V CAL_BASE = 2.4426 V VTP P-side(average) = 0.4264 V CAL_VREF = 2.9785 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1128.0 FUNCT@5.0V:ATOM13C 1128.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 7062.0 FUNCT@5.0V:ATOM19FHF 7062.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1084.0 FUNCT@5.0V:ATOM22 1619.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1616.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1216.0 FUNCT@5.0V:ATOM37B 1206.0 FUNCT@5.0V:ATOM37C 1190.0 FUNCT@5.0V:ATOM37D 1158.0 FUNCT@5.0V:ATOM37E 2293.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 2190.0 FUNCT@5.0V:ATOM41A 2190.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5791.0 FUNCT@5.0V:ATOM45C_40 5501.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 4115.0 FUNCT@5.0V:ATOM48C_40 4892.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5791.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:501 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0111 chi2 = 0.6391 VTN P-side: a = 0.0092 b(slope) = 0.0067 chi2 = 0.3954 CAL_IN N-side: a = 2.4440 b(slope) = 0.0084 chi2 = 0.6778 CAL_IN P-side: a = 2.4440 b(slope) = 0.0084 chi2 = 0.5958 VTP N-side(average) = 0.7234 V CAL_BASE = 2.4456 V VTP P-side(average) = 0.4393 V CAL_VREF = 2.9868 V FUNCT. DIGITAL TEST = 49 error detected in test: FUNCT@5.0V:ATOM1TO6A 275.0 FUNCT@5.0V:ATOM1TO6B 275.0 FUNCT@5.0V:ATOM1TO6C 230.0 FUNCT@5.0V:ATOM1TO6D 231.0 FUNCT@5.0V:ATOM1TO6E 232.0 FUNCT@5.0V:ATOM7TO9A 288.0 FUNCT@5.0V:ATOM7TO9B 288.0 FUNCT@5.0V:ATOM7TO9C 274.0 FUNCT@5.0V:ATOM7TO9D 275.0 FUNCT@5.0V:ATOM7TO9E 276.0 FUNCT@5.0V:ATOM10TO12 543.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 288.0 FUNCT@5.0V:A10TO12HF 543.0 FUNCT@5.0V:ADAC37HF 288.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:601 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0230 b(slope) = 0.0102 chi2 = 99.0000 VTN P-side: a = 0.0100 b(slope) = 0.0064 chi2 = 0.4488 CAL_IN N-side: a = 2.8850 b(slope) = 0.0005 chi2 = 99.0000 CAL_IN P-side: a = 2.8616 b(slope) = 0.0011 chi2 = 99.0000 VTP N-side(average) = 0.6815 V CAL_BASE = 2.4348 V VTP P-side(average) = 0.4190 V CAL_VREF = 2.9690 V FUNCT. DIGITAL TEST = 49 error detected in test: FUNCT@5.0V:ATOM1TO6A 275.0 FUNCT@5.0V:ATOM1TO6B 275.0 FUNCT@5.0V:ATOM1TO6C 230.0 FUNCT@5.0V:ATOM1TO6D 231.0 FUNCT@5.0V:ATOM1TO6E 232.0 FUNCT@5.0V:ATOM7TO9A 288.0 FUNCT@5.0V:ATOM7TO9B 288.0 FUNCT@5.0V:ATOM7TO9C 274.0 FUNCT@5.0V:ATOM7TO9D 275.0 FUNCT@5.0V:ATOM7TO9E 276.0 FUNCT@5.0V:ATOM10TO12 543.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 288.0 FUNCT@5.0V:A10TO12HF 543.0 FUNCT@5.0V:ADAC37HF 288.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:602 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0105 chi2 = 1.0280 VTN P-side: a = 0.0096 b(slope) = 0.0064 chi2 = 0.4351 CAL_IN N-side: a = 2.4484 b(slope) = 0.0082 chi2 = 0.5103 CAL_IN P-side: a = 2.4484 b(slope) = 0.0082 chi2 = 0.3806 VTP N-side(average) = 0.6810 V CAL_BASE = 2.4478 V VTP P-side(average) = 0.4223 V CAL_VREF = 2.9727 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:502 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0105 chi2 = 1.3906 VTN P-side: a = 0.0102 b(slope) = 0.0064 chi2 = 0.5803 CAL_IN N-side: a = 2.4328 b(slope) = 0.0083 chi2 = 0.6080 CAL_IN P-side: a = 2.4309 b(slope) = 0.0084 chi2 = 0.4220 VTP N-side(average) = 0.6853 V CAL_BASE = 2.4348 V VTP P-side(average) = 0.4234 V CAL_VREF = 2.9695 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:402 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0106 chi2 = 0.8960 VTN P-side: a = 0.0097 b(slope) = 0.0064 chi2 = 0.6666 CAL_IN N-side: a = 2.4375 b(slope) = 0.0083 chi2 = 0.5553 CAL_IN P-side: a = 2.4374 b(slope) = 0.0083 chi2 = 0.4258 VTP N-side(average) = 0.6889 V CAL_BASE = 2.4399 V VTP P-side(average) = 0.4231 V CAL_VREF = 2.9712 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:203 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0516 b(slope) = 0.0093 chi2 = 99.0000 VTN P-side: a = 0.0104 b(slope) = 0.0063 chi2 = 0.4813 CAL_IN N-side: a = 2.4870 b(slope) = 0.0070 chi2 = 99.0000 CAL_IN P-side: a = 2.4311 b(slope) = 0.0083 chi2 = 0.6860 VTP N-side(average) = 0.6697 V CAL_BASE = 2.4309 V VTP P-side(average) = 0.4154 V CAL_VREF = 2.9614 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:303 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0102 chi2 = 1.0797 VTN P-side: a = 0.0101 b(slope) = 0.0063 chi2 = 0.6907 CAL_IN N-side: a = 2.4429 b(slope) = 0.0081 chi2 = 0.8777 CAL_IN P-side: a = 2.4428 b(slope) = 0.0081 chi2 = 0.9337 VTP N-side(average) = 0.6666 V CAL_BASE = 2.4443 V VTP P-side(average) = 0.4130 V CAL_VREF = 2.9658 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:403 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0098 b(slope) = 0.0106 chi2 = 0.6429 VTN P-side: a = 0.0097 b(slope) = 0.0065 chi2 = 0.5332 CAL_IN N-side: a = 2.4032 b(slope) = 0.0085 chi2 = 99.0000 CAL_IN P-side: a = 2.4005 b(slope) = 0.0085 chi2 = 0.6656 VTP N-side(average) = 0.6859 V CAL_BASE = 2.4009 V VTP P-side(average) = 0.4254 V CAL_VREF = 2.9441 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:503 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0090 b(slope) = 0.0104 chi2 = 1.1795 VTN P-side: a = 0.0093 b(slope) = 0.0064 chi2 = 0.5894 CAL_IN N-side: a = 2.4654 b(slope) = 0.0081 chi2 = 0.7503 CAL_IN P-side: a = 2.4657 b(slope) = 0.0081 chi2 = 0.6198 VTP N-side(average) = 0.6780 V CAL_BASE = 2.4658 V VTP P-side(average) = 0.4184 V CAL_VREF = 2.9827 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:603 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0104 chi2 = 1.7780 VTN P-side: a = 0.0097 b(slope) = 0.0063 chi2 = 0.3429 CAL_IN N-side: a = 2.4243 b(slope) = 0.0082 chi2 = 0.7167 CAL_IN P-side: a = 2.4240 b(slope) = 0.0082 chi2 = 0.4953 VTP N-side(average) = 0.6756 V CAL_BASE = 2.4255 V VTP P-side(average) = 0.4168 V CAL_VREF = 2.9546 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM35 1598.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:703 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0103 chi2 = 1.7019 VTN P-side: a = 0.0096 b(slope) = 0.0064 chi2 = 0.4612 CAL_IN N-side: a = 2.4143 b(slope) = 0.0083 chi2 = 0.5918 CAL_IN P-side: a = 2.4142 b(slope) = 0.0083 chi2 = 0.4939 VTP N-side(average) = 0.6711 V CAL_BASE = 2.4192 V VTP P-side(average) = 0.4178 V CAL_VREF = 2.9492 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:803 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0106 chi2 = 1.1250 VTN P-side: a = 0.0102 b(slope) = 0.0066 chi2 = 0.5350 CAL_IN N-side: a = 2.4578 b(slope) = 0.0080 chi2 = 1.2601 CAL_IN P-side: a = 2.4575 b(slope) = 0.0080 chi2 = 1.2431 VTP N-side(average) = 0.6907 V CAL_BASE = 2.4560 V VTP P-side(average) = 0.4317 V CAL_VREF = 2.9670 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:804 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1206 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0105 chi2 = 2.7778 VTN P-side: a = 0.0100 b(slope) = 0.0065 chi2 = 0.3752 CAL_IN N-side: a = 2.4518 b(slope) = 0.0080 chi2 = 0.5033 CAL_IN P-side: a = 2.4519 b(slope) = 0.0080 chi2 = 0.5381 VTP N-side(average) = 0.6853 V CAL_BASE = 2.4541 V VTP P-side(average) = 0.4275 V CAL_VREF = 2.9702 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1054.0 FUNCT@5.0V:ATOM13B 1110.0 FUNCT@5.0V:ATOM13C 1110.0 FUNCT@5.0V:ATOM15 1098.0 FUNCT@5.0V:ATOM17 3410.0 FUNCT@5.0V:ATOM18 3426.0 FUNCT@5.0V:ATOM18HF 3426.0 FUNCT@5.0V:ATOM19 3362.0 FUNCT@5.0V:ATOM19D 3377.0 FUNCT@5.0V:ATOM19E 2604.0 FUNCT@5.0V:ATOM19F 6477.0 FUNCT@5.0V:ATOM19FHF 6477.0 FUNCT@5.0V:ATOM20 1070.0 FUNCT@5.0V:ATOM21 1046.0 FUNCT@5.0V:ATOM22 1034.0 FUNCT@5.0V:ATOM23 966.0 FUNCT@5.0V:ATOM24 1066.0 FUNCT@5.0V:ATOM25 1052.0 FUNCT@5.0V:ATOM25HF 1052.0 FUNCT@5.0V:ATOM26A 1031.0 FUNCT@5.0V:ATOM26B 1840.0 FUNCT@5.0V:ATOM28 1168.0 FUNCT@5.0V:ATOM29 1168.0 FUNCT@5.0V:ATOM30 1168.0 FUNCT@5.0V:ATOM31A 802.0 FUNCT@5.0V:ATOM31B 991.0 FUNCT@5.0V:ATOM32 802.0 FUNCT@5.0V:ATOM33 1168.0 FUNCT@5.0V:ATOM35 1302.0 FUNCT@5.0V:ATOM36 1058.0 FUNCT@5.0V:ATOM37A 1198.0 FUNCT@5.0V:ATOM37B 1190.0 FUNCT@5.0V:ATOM37C 1174.0 FUNCT@5.0V:ATOM37D 1142.0 FUNCT@5.0V:ATOM37E 1133.0 FUNCT@5.0V:ATOM39 1079.0 FUNCT@5.0V:ATOM41 1605.0 FUNCT@5.0V:ATOM41A 1605.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5679.0 FUNCT@5.0V:ATOM45C_40 5679.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 5679.0 FUNCT@5.0V:ATOM48C_40 5679.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5679.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1393.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:704 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0090 b(slope) = 0.0103 chi2 = 1.1946 VTN P-side: a = 0.0093 b(slope) = 0.0063 chi2 = 0.7558 CAL_IN N-side: a = 2.4324 b(slope) = 0.0082 chi2 = 0.6972 CAL_IN P-side: a = 2.4325 b(slope) = 0.0082 chi2 = 1.5717 VTP N-side(average) = 0.6719 V CAL_BASE = 2.4329 V VTP P-side(average) = 0.4158 V CAL_VREF = 2.9600 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:604 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0104 chi2 = 0.7658 VTN P-side: a = 0.0099 b(slope) = 0.0063 chi2 = 0.3629 CAL_IN N-side: a = 2.4462 b(slope) = 0.0082 chi2 = 0.8129 CAL_IN P-side: a = 2.4463 b(slope) = 0.0082 chi2 = 0.7509 VTP N-side(average) = 0.6753 V CAL_BASE = 2.4480 V VTP P-side(average) = 0.4173 V CAL_VREF = 2.9705 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:504 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0104 chi2 = 1.0414 VTN P-side: a = 0.0098 b(slope) = 0.0063 chi2 = 0.6015 CAL_IN N-side: a = 2.4299 b(slope) = 0.0082 chi2 = 0.6655 CAL_IN P-side: a = 2.4294 b(slope) = 0.0083 chi2 = 6.4216 VTP N-side(average) = 0.6784 V CAL_BASE = 2.4341 V VTP P-side(average) = 0.4169 V CAL_VREF = 2.9619 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:404 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0105 chi2 = 0.8667 VTN P-side: a = 0.0098 b(slope) = 0.0064 chi2 = 0.4925 CAL_IN N-side: a = 2.4312 b(slope) = 0.0083 chi2 = 0.8853 CAL_IN P-side: a = 2.4317 b(slope) = 0.0082 chi2 = 0.3868 VTP N-side(average) = 0.6812 V CAL_BASE = 2.4338 V VTP P-side(average) = 0.4220 V CAL_VREF = 2.9617 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:304 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0104 chi2 = 0.5658 VTN P-side: a = 0.0100 b(slope) = 0.0063 chi2 = 0.7132 CAL_IN N-side: a = 2.4349 b(slope) = 0.0081 chi2 = 0.6433 CAL_IN P-side: a = 2.4349 b(slope) = 0.0081 chi2 = 0.3989 VTP N-side(average) = 0.6753 V CAL_BASE = 2.4373 V VTP P-side(average) = 0.4154 V CAL_VREF = 2.9583 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:204 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0113 b(slope) = 0.0103 chi2 = 1.3499 VTN P-side: a = 0.0111 b(slope) = 0.0062 chi2 = 0.2195 CAL_IN N-side: a = 2.4517 b(slope) = 0.0080 chi2 = 0.7953 CAL_IN P-side: a = 2.4515 b(slope) = 0.0080 chi2 = 1.4362 VTP N-side(average) = 0.6718 V CAL_BASE = 2.4522 V VTP P-side(average) = 0.4114 V CAL_VREF = 2.9668 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5179.0 FUNCT@5.0V:ATOM45C_40 5179.0 FUNCT@5.0V:ATOM46C_40 4681.0 FUNCT@5.0V:ATOM47C_40 5179.0 FUNCT@5.0V:ATOM48C_40 5179.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5179.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:205 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0103 chi2 = 1.2056 VTN P-side: a = 0.0106 b(slope) = 0.0063 chi2 = 0.4531 CAL_IN N-side: a = 2.4147 b(slope) = 0.0083 chi2 = 0.7534 CAL_IN P-side: a = 2.4149 b(slope) = 0.0083 chi2 = 0.5788 VTP N-side(average) = 0.6711 V CAL_BASE = 2.4182 V VTP P-side(average) = 0.4151 V CAL_VREF = 2.9478 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:305 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0103 chi2 = 1.3217 VTN P-side: a = 0.0097 b(slope) = 0.0063 chi2 = 0.6634 CAL_IN N-side: a = 2.3923 b(slope) = 0.0085 chi2 = 0.7620 CAL_IN P-side: a = 2.3924 b(slope) = 0.0084 chi2 = 0.6125 VTP N-side(average) = 0.6695 V CAL_BASE = 2.3950 V VTP P-side(average) = 0.4129 V CAL_VREF = 2.9363 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:405 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0092 b(slope) = 0.0104 chi2 = 1.8845 VTN P-side: a = 0.0098 b(slope) = 0.0064 chi2 = 0.8886 CAL_IN N-side: a = 2.4039 b(slope) = 0.0084 chi2 = 0.6706 CAL_IN P-side: a = 2.4038 b(slope) = 0.0084 chi2 = 0.4009 VTP N-side(average) = 0.6790 V CAL_BASE = 2.4053 V VTP P-side(average) = 0.4223 V CAL_VREF = 2.9419 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:505 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0105 chi2 = 0.9582 VTN P-side: a = 0.0102 b(slope) = 0.0063 chi2 = 0.8561 CAL_IN N-side: a = 2.4149 b(slope) = 0.0083 chi2 = 0.8355 CAL_IN P-side: a = 2.4147 b(slope) = 0.0083 chi2 = 0.4133 VTP N-side(average) = 0.6815 V CAL_BASE = 2.4158 V VTP P-side(average) = 0.4177 V CAL_VREF = 2.9497 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:605 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0103 chi2 = 0.7166 VTN P-side: a = 0.0097 b(slope) = 0.0063 chi2 = 0.3026 CAL_IN N-side: a = 2.4353 b(slope) = 0.0082 chi2 = 0.9744 CAL_IN P-side: a = 2.4354 b(slope) = 0.0082 chi2 = 0.8443 VTP N-side(average) = 0.6708 V CAL_BASE = 2.4377 V VTP P-side(average) = 0.4161 V CAL_VREF = 2.9612 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:705 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0104 chi2 = 1.3696 VTN P-side: a = 0.0098 b(slope) = 0.0064 chi2 = 0.4367 CAL_IN N-side: a = 2.4385 b(slope) = 0.0080 chi2 = 0.7104 CAL_IN P-side: a = 2.4384 b(slope) = 0.0080 chi2 = 0.5841 VTP N-side(average) = 0.6762 V CAL_BASE = 2.4429 V VTP P-side(average) = 0.4223 V CAL_VREF = 2.9583 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4407.0 FUNCT@5.0V:ATOM45C_40 4407.0 FUNCT@5.0V:ATOM46C_40 4277.0 FUNCT@5.0V:ATOM47C_40 4277.0 FUNCT@5.0V:ATOM48C_40 4407.0 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:805 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0097 b(slope) = 0.0103 chi2 = 1.1597 VTN P-side: a = 0.0099 b(slope) = 0.0064 chi2 = 0.3021 CAL_IN N-side: a = 2.3864 b(slope) = 0.0138 chi2 = 99.0000 CAL_IN P-side: a = 2.4127 b(slope) = 0.0120 chi2 = 99.0000 VTP N-side(average) = 0.6721 V CAL_BASE = 2.4107 V VTP P-side(average) = 0.4184 V CAL_VREF = 2.9404 V FUNCT. DIGITAL TEST = 6 error detected in test: FUNCT@5.0V:ATOM19F 7577.0 FUNCT@5.0V:ATOM19FHF 7577.0 FUNCT@5.0V:ATOM21 1062.0 FUNCT@5.0V:ATOM37B 1222.0 FUNCT@5.0V:ATOM37C 1514.0 FUNCT@5.0V:ATOM37E 1571.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:806 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0105 chi2 = 1.7695 VTN P-side: a = 0.0100 b(slope) = 0.0064 chi2 = 0.9278 CAL_IN N-side: a = 2.4413 b(slope) = 0.0081 chi2 = 0.7178 CAL_IN P-side: a = 2.4412 b(slope) = 0.0081 chi2 = 1.0512 VTP N-side(average) = 0.6809 V CAL_BASE = 2.4431 V VTP P-side(average) = 0.4214 V CAL_VREF = 2.9627 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:706 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0104 chi2 = 0.5387 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.4029 CAL_IN N-side: a = 2.4355 b(slope) = 0.0082 chi2 = 0.6279 CAL_IN P-side: a = 2.4356 b(slope) = 0.0082 chi2 = 0.3368 VTP N-side(average) = 0.6782 V CAL_BASE = 2.4373 V VTP P-side(average) = 0.4241 V CAL_VREF = 2.9651 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM36 3076.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:606 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0103 chi2 = 0.5133 VTN P-side: a = 0.0104 b(slope) = 0.0063 chi2 = 0.3518 CAL_IN N-side: a = 2.4284 b(slope) = 0.0082 chi2 = 0.4364 CAL_IN P-side: a = 2.4286 b(slope) = 0.0082 chi2 = 0.3651 VTP N-side(average) = 0.6724 V CAL_BASE = 2.4331 V VTP P-side(average) = 0.4159 V CAL_VREF = 2.9578 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:506 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0104 chi2 = 1.4247 VTN P-side: a = 0.0108 b(slope) = 0.0063 chi2 = 0.5872 CAL_IN N-side: a = 2.4296 b(slope) = 0.0083 chi2 = 1.0633 CAL_IN P-side: a = 2.4299 b(slope) = 0.0083 chi2 = 1.0677 VTP N-side(average) = 0.6743 V CAL_BASE = 2.4309 V VTP P-side(average) = 0.4174 V CAL_VREF = 2.9600 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:406 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0105 chi2 = 0.7827 VTN P-side: a = 0.0105 b(slope) = 0.0065 chi2 = 0.4675 CAL_IN N-side: a = 2.4078 b(slope) = 0.0085 chi2 = 0.5911 CAL_IN P-side: a = 2.4077 b(slope) = 0.0085 chi2 = 0.3633 VTP N-side(average) = 0.6855 V CAL_BASE = 2.4116 V VTP P-side(average) = 0.4248 V CAL_VREF = 2.9541 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:306 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0103 chi2 = 1.0680 VTN P-side: a = 0.0106 b(slope) = 0.0063 chi2 = 0.5574 CAL_IN N-side: a = 2.4336 b(slope) = 0.0082 chi2 = 0.6502 CAL_IN P-side: a = 2.4337 b(slope) = 0.0081 chi2 = 0.9383 VTP N-side(average) = 0.6708 V CAL_BASE = 2.4346 V VTP P-side(average) = 0.4167 V CAL_VREF = 2.9570 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3987.0 FUNCT@5.0V:ATOM45C_40 3780.0 FUNCT@5.0V:ATOM46C_40 3987.0 FUNCT@5.0V:ATOM47C_40 3667.0 FUNCT@5.0V:ATOM48C_40 3987.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3987.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:206 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0101 chi2 = 1.0843 VTN P-side: a = 0.0103 b(slope) = 0.0062 chi2 = 0.8536 CAL_IN N-side: a = 2.4183 b(slope) = 0.0082 chi2 = 1.1152 CAL_IN P-side: a = 2.4185 b(slope) = 0.0082 chi2 = 1.1405 VTP N-side(average) = 0.6592 V CAL_BASE = 2.4209 V VTP P-side(average) = 0.4079 V CAL_VREF = 2.9458 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:107 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0219 b(slope) = 0.0098 chi2 = 99.0000 VTN P-side: a = 0.0105 b(slope) = 0.0061 chi2 = 0.3213 CAL_IN N-side: a = 2.4672 b(slope) = 0.0076 chi2 = 99.0000 CAL_IN P-side: a = 2.4524 b(slope) = 0.0079 chi2 = 0.4513 VTP N-side(average) = 0.6551 V CAL_BASE = 2.4573 V VTP P-side(average) = 0.4046 V CAL_VREF = 2.9656 V FUNCT. DIGITAL TEST = 13 error detected in test: FUNCT@5.0V:ATOM17 6670.0 FUNCT@5.0V:ATOM18 5602.0 FUNCT@5.0V:ATOM18HF 5602.0 FUNCT@5.0V:ATOM25 2208.0 FUNCT@5.0V:ATOM25HF 2208.0 FUNCT@5.0V:ATOM28 1189.0 FUNCT@5.0V:ATOM29 1188.0 FUNCT@5.0V:ATOM30 1188.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM37D 1159.0 FUNCT@5.0V:ATOM37E 1150.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:207 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0101 chi2 = 1.5145 VTN P-side: a = 0.0107 b(slope) = 0.0062 chi2 = 0.4539 CAL_IN N-side: a = 2.4308 b(slope) = 0.0081 chi2 = 0.7150 CAL_IN P-side: a = 2.4306 b(slope) = 0.0081 chi2 = 1.7036 VTP N-side(average) = 0.6607 V CAL_BASE = 2.4351 V VTP P-side(average) = 0.4105 V CAL_VREF = 2.9548 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:307 --------------------------------------- CLASS=B -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0102 chi2 = 0.9010 VTN P-side: a = 0.0107 b(slope) = 0.0063 chi2 = 0.5942 CAL_IN N-side: a = 2.4226 b(slope) = 0.0082 chi2 = 0.7725 CAL_IN P-side: a = 2.4225 b(slope) = 0.0082 chi2 = 0.8818 VTP N-side(average) = 0.6676 V CAL_BASE = 2.4277 V VTP P-side(average) = 0.4147 V CAL_VREF = 2.9512 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4147.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:407 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0107 b(slope) = 0.0103 chi2 = 1.0391 VTN P-side: a = 0.0108 b(slope) = 0.0063 chi2 = 0.5286 CAL_IN N-side: a = 2.4354 b(slope) = 0.0081 chi2 = 0.6045 CAL_IN P-side: a = 2.4351 b(slope) = 0.0081 chi2 = 0.6119 VTP N-side(average) = 0.6695 V CAL_BASE = 2.4370 V VTP P-side(average) = 0.4148 V CAL_VREF = 2.9578 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:507 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0117 b(slope) = 0.0103 chi2 = 0.5484 VTN P-side: a = 0.0117 b(slope) = 0.0063 chi2 = 0.5313 CAL_IN N-side: a = 2.4741 b(slope) = 0.0080 chi2 = 0.5190 CAL_IN P-side: a = 2.4746 b(slope) = 0.0080 chi2 = 0.6758 VTP N-side(average) = 0.6699 V CAL_BASE = 2.4773 V VTP P-side(average) = 0.4167 V CAL_VREF = 2.9922 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3811.0 FUNCT@5.0V:ATOM45C_40 3811.0 FUNCT@5.0V:ATOM46C_40 3811.0 FUNCT@5.0V:ATOM47C_40 3811.0 FUNCT@5.0V:ATOM48C_40 3811.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3811.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:607 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0117 b(slope) = 0.0103 chi2 = 1.0818 VTN P-side: a = 0.0120 b(slope) = 0.0063 chi2 = 0.3858 CAL_IN N-side: a = 2.4324 b(slope) = 0.0082 chi2 = 0.7443 CAL_IN P-side: a = 2.4325 b(slope) = 0.0082 chi2 = 0.5701 VTP N-side(average) = 0.6704 V CAL_BASE = 2.4360 V VTP P-side(average) = 0.4171 V CAL_VREF = 2.9607 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:707 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0120 b(slope) = 0.0103 chi2 = 1.3524 VTN P-side: a = 0.0123 b(slope) = 0.0064 chi2 = 0.3954 CAL_IN N-side: a = 2.4337 b(slope) = 0.0081 chi2 = 0.5190 CAL_IN P-side: a = 2.4339 b(slope) = 0.0081 chi2 = 0.4235 VTP N-side(average) = 0.6744 V CAL_BASE = 2.4390 V VTP P-side(average) = 0.4200 V CAL_VREF = 2.9600 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:807 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0108 b(slope) = 0.0105 chi2 = 0.7957 VTN P-side: a = 0.0105 b(slope) = 0.0065 chi2 = 0.3520 CAL_IN N-side: a = 2.4449 b(slope) = 0.0080 chi2 = 0.8998 CAL_IN P-side: a = 2.4447 b(slope) = 0.0080 chi2 = 0.5358 VTP N-side(average) = 0.6865 V CAL_BASE = 2.4497 V VTP P-side(average) = 0.4301 V CAL_VREF = 2.9643 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:907 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0109 b(slope) = 0.0106 chi2 = 0.9022 VTN P-side: a = 0.0110 b(slope) = 0.0066 chi2 = 0.4517 CAL_IN N-side: a = 2.4308 b(slope) = 0.0081 chi2 = 0.6206 CAL_IN P-side: a = 2.4309 b(slope) = 0.0081 chi2 = 0.5597 VTP N-side(average) = 0.6926 V CAL_BASE = 2.4334 V VTP P-side(average) = 0.4344 V CAL_VREF = 2.9546 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:908 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0118 b(slope) = 0.0107 chi2 = 0.7109 VTN P-side: a = 0.0118 b(slope) = 0.0066 chi2 = 0.2840 CAL_IN N-side: a = 2.4460 b(slope) = 0.0081 chi2 = 0.6415 CAL_IN P-side: a = 2.4457 b(slope) = 0.0081 chi2 = 0.7272 VTP N-side(average) = 0.6958 V CAL_BASE = 2.4487 V VTP P-side(average) = 0.4374 V CAL_VREF = 2.9653 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:808 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0107 b(slope) = 0.0105 chi2 = 1.5482 VTN P-side: a = 0.0110 b(slope) = 0.0065 chi2 = 0.3487 CAL_IN N-side: a = 2.4455 b(slope) = 0.0081 chi2 = 1.0454 CAL_IN P-side: a = 2.4447 b(slope) = 0.0081 chi2 = 4.8964 VTP N-side(average) = 0.6866 V CAL_BASE = 2.4507 V VTP P-side(average) = 0.4299 V CAL_VREF = 2.9692 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:708 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0109 b(slope) = 0.0104 chi2 = 1.4145 VTN P-side: a = 0.0109 b(slope) = 0.0065 chi2 = 0.3875 CAL_IN N-side: a = 2.4832 b(slope) = 0.0079 chi2 = 0.5135 CAL_IN P-side: a = 2.4836 b(slope) = 0.0079 chi2 = 0.6569 VTP N-side(average) = 0.6807 V CAL_BASE = 2.4880 V VTP P-side(average) = 0.4265 V CAL_VREF = 2.9917 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:608 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0113 b(slope) = 0.0105 chi2 = 0.4932 VTN P-side: a = 0.0112 b(slope) = 0.0064 chi2 = 0.4447 CAL_IN N-side: a = 2.4279 b(slope) = 0.0080 chi2 = 27.6871 CAL_IN P-side: a = 2.4244 b(slope) = 0.0081 chi2 = 32.1230 VTP N-side(average) = 0.6828 V CAL_BASE = 2.4290 V VTP P-side(average) = 0.4236 V CAL_VREF = 3.0496 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1128.0 FUNCT@5.0V:ATOM13C 1128.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19E 2626.0 FUNCT@5.0V:ATOM19F 6498.0 FUNCT@5.0V:ATOM19FHF 6498.0 FUNCT@5.0V:ATOM20 1091.0 FUNCT@5.0V:ATOM21 1066.0 FUNCT@5.0V:ATOM22 1054.0 FUNCT@5.0V:ATOM24 1074.0 FUNCT@5.0V:ATOM25 1073.0 FUNCT@5.0V:ATOM25HF 1073.0 FUNCT@5.0V:ATOM26A 1051.0 FUNCT@5.0V:ATOM26B 1861.0 FUNCT@5.0V:ATOM28 1188.0 FUNCT@5.0V:ATOM29 1188.0 FUNCT@5.0V:ATOM30 1190.0 FUNCT@5.0V:ATOM31A 822.0 FUNCT@5.0V:ATOM31B 1011.0 FUNCT@5.0V:ATOM32 824.0 FUNCT@5.0V:ATOM35 1324.0 FUNCT@5.0V:ATOM36 1078.0 FUNCT@5.0V:ATOM37B 1210.0 FUNCT@5.0V:ATOM37C 1194.0 FUNCT@5.0V:ATOM37D 1162.0 FUNCT@5.0V:ATOM37E 1151.0 FUNCT@5.0V:ATOM39 1100.0 FUNCT@5.0V:ATOM41 1625.0 FUNCT@5.0V:ATOM41A 1625.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:508 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0103 chi2 = 1.0200 VTN P-side: a = 0.0102 b(slope) = 0.0063 chi2 = 0.7169 CAL_IN N-side: a = 2.4809 b(slope) = 0.0080 chi2 = 0.6070 CAL_IN P-side: a = 2.4813 b(slope) = 0.0080 chi2 = 0.7909 VTP N-side(average) = 0.6739 V CAL_BASE = 2.4834 V VTP P-side(average) = 0.4179 V CAL_VREF = 2.9966 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 3 error detected in test: TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:408 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0104 chi2 = 0.9410 VTN P-side: a = 0.0105 b(slope) = 0.0064 chi2 = 0.2587 CAL_IN N-side: a = 2.4350 b(slope) = 0.0082 chi2 = 0.7597 CAL_IN P-side: a = 2.4351 b(slope) = 0.0082 chi2 = 0.7007 VTP N-side(average) = 0.6781 V CAL_BASE = 2.4363 V VTP P-side(average) = 0.4209 V CAL_VREF = 2.9634 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:308 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0108 b(slope) = 0.0104 chi2 = 1.1557 VTN P-side: a = 0.0110 b(slope) = 0.0063 chi2 = 0.4665 CAL_IN N-side: a = 2.4561 b(slope) = 0.0080 chi2 = 0.9290 CAL_IN P-side: a = 2.4563 b(slope) = 0.0080 chi2 = 0.8544 VTP N-side(average) = 0.6755 V CAL_BASE = 2.4604 V VTP P-side(average) = 0.4162 V CAL_VREF = 2.9736 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:208 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0108 b(slope) = 0.0102 chi2 = 1.1339 VTN P-side: a = 0.0111 b(slope) = 0.0062 chi2 = 0.3706 CAL_IN N-side: a = 2.4245 b(slope) = 0.0082 chi2 = 0.6419 CAL_IN P-side: a = 2.4244 b(slope) = 0.0082 chi2 = 1.7681 VTP N-side(average) = 0.6657 V CAL_BASE = 2.4263 V VTP P-side(average) = 0.4112 V CAL_VREF = 2.9526 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:108 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0427 b(slope) = 0.0095 chi2 = 99.0000 VTN P-side: a = 0.0109 b(slope) = 0.0062 chi2 = 0.4756 CAL_IN N-side: a = 2.5014 b(slope) = 0.0070 chi2 = 99.0000 CAL_IN P-side: a = 2.4594 b(slope) = 0.0080 chi2 = 0.8008 VTP N-side(average) = 0.6683 V CAL_BASE = 2.4622 V VTP P-side(average) = 0.4121 V CAL_VREF = 2.9748 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:209 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0106 b(slope) = 0.0101 chi2 = 1.0927 VTN P-side: a = 0.0108 b(slope) = 0.0062 chi2 = 0.1910 CAL_IN N-side: a = 2.4283 b(slope) = 0.0082 chi2 = 1.0286 CAL_IN P-side: a = 2.4284 b(slope) = 0.0082 chi2 = 1.0589 VTP N-side(average) = 0.6577 V CAL_BASE = 2.4307 V VTP P-side(average) = 0.4071 V CAL_VREF = 2.9543 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:309 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0106 b(slope) = 0.0102 chi2 = 0.7290 VTN P-side: a = 0.0107 b(slope) = 0.0063 chi2 = 0.3328 CAL_IN N-side: a = 3.0463 b(slope) = 0.0011 chi2 = 99.0000 CAL_IN P-side: a = 3.0097 b(slope) = 0.0016 chi2 = 99.0000 VTP N-side(average) = 0.6667 V CAL_BASE = 2.4214 V VTP P-side(average) = 0.4121 V CAL_VREF = 2.9524 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:409 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0111 b(slope) = 0.0104 chi2 = 0.7740 VTN P-side: a = 0.0111 b(slope) = 0.0064 chi2 = 0.4828 CAL_IN N-side: a = 2.4199 b(slope) = 0.0084 chi2 = 0.9366 CAL_IN P-side: a = 2.4200 b(slope) = 0.0084 chi2 = 0.7212 VTP N-side(average) = 0.6765 V CAL_BASE = 2.4251 V VTP P-side(average) = 0.4200 V CAL_VREF = 2.9604 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3955.0 FUNCT@5.0V:ATOM45C_40 3668.0 FUNCT@5.0V:ATOM46C_40 3667.0 FUNCT@5.0V:ATOM47C_40 3955.0 FUNCT@5.0V:ATOM48C_40 3955.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3955.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:509 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0111 b(slope) = 0.0113 chi2 = 0.9029 VTN P-side: a = 0.0110 b(slope) = 0.0069 chi2 = 0.5675 CAL_IN N-side: a = 3.0939 b(slope) = 0.0000 chi2 = 3.3918 CAL_IN P-side: a = 3.0939 b(slope) = 0.0000 chi2 = 2.5084 VTP N-side(average) = 0.7346 V CAL_BASE = 2.4548 V VTP P-side(average) = 0.4526 V CAL_VREF = 2.9827 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3670.0 FUNCT@5.0V:ATOM46C_40 3667.0 FUNCT@5.0V:ATOM47C_40 4890.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:609 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0105 chi2 = 0.5521 VTN P-side: a = 0.0107 b(slope) = 0.0065 chi2 = 0.6971 CAL_IN N-side: a = 2.4291 b(slope) = 0.0083 chi2 = 0.4590 CAL_IN P-side: a = 2.4294 b(slope) = 0.0083 chi2 = 0.3217 VTP N-side(average) = 0.6856 V CAL_BASE = 2.4324 V VTP P-side(average) = 0.4279 V CAL_VREF = 2.9663 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM36 3459.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5678.0 FUNCT@5.0V:ATOM45C_40 4277.0 FUNCT@5.0V:ATOM46C_40 3686.0 FUNCT@5.0V:ATOM47C_40 4279.0 FUNCT@5.0V:ATOM48C_40 5678.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5678.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:709 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0109 b(slope) = 0.0104 chi2 = 0.9825 VTN P-side: a = 0.0109 b(slope) = 0.0064 chi2 = 0.4154 CAL_IN N-side: a = 2.4437 b(slope) = 0.0080 chi2 = 0.5393 CAL_IN P-side: a = 2.4438 b(slope) = 0.0080 chi2 = 0.4489 VTP N-side(average) = 0.6792 V CAL_BASE = 2.4490 V VTP P-side(average) = 0.4237 V CAL_VREF = 2.9651 V FUNCT. DIGITAL TEST = 14 error detected in test: FUNCT@5.0V:ATOM19F 6788.0 FUNCT@5.0V:ATOM19FHF 6788.0 FUNCT@5.0V:ATOM20 1381.0 FUNCT@5.0V:ATOM21 1357.0 FUNCT@5.0V:ATOM22 1342.0 FUNCT@5.0V:ATOM25 1363.0 FUNCT@5.0V:ATOM25HF 1363.0 FUNCT@5.0V:ATOM26A 1342.0 FUNCT@5.0V:ATOM26B 2151.0 FUNCT@5.0V:ATOM28 1479.0 FUNCT@5.0V:ATOM29 1479.0 FUNCT@5.0V:ATOM31A 1113.0 FUNCT@5.0V:ATOM31B 1302.0 FUNCT@5.0V:ATOM37D 1754.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:809 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0121 b(slope) = 0.0106 chi2 = 0.7684 VTN P-side: a = 0.0118 b(slope) = 0.0066 chi2 = 0.4215 CAL_IN N-side: a = 2.4368 b(slope) = 0.0081 chi2 = 0.6352 CAL_IN P-side: a = 2.4370 b(slope) = 0.0081 chi2 = 0.4701 VTP N-side(average) = 0.6936 V CAL_BASE = 2.4412 V VTP P-side(average) = 0.4338 V CAL_VREF = 2.9624 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:810 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0243 b(slope) = 0.0105 chi2 = 99.0000 VTN P-side: a = 0.0124 b(slope) = 0.0067 chi2 = 0.5825 CAL_IN N-side: a = 2.4635 b(slope) = 0.0079 chi2 = 99.0000 CAL_IN P-side: a = 2.4483 b(slope) = 0.0082 chi2 = 0.5004 VTP N-side(average) = 0.7018 V CAL_BASE = 2.4492 V VTP P-side(average) = 0.4405 V CAL_VREF = 2.9761 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:710 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0118 b(slope) = 0.0106 chi2 = 0.5688 VTN P-side: a = 0.0119 b(slope) = 0.0066 chi2 = 0.5480 CAL_IN N-side: a = 2.4724 b(slope) = 0.0080 chi2 = 0.7114 CAL_IN P-side: a = 2.4726 b(slope) = 0.0080 chi2 = 0.4528 VTP N-side(average) = 0.6938 V CAL_BASE = 2.4761 V VTP P-side(average) = 0.4331 V CAL_VREF = 2.9910 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:610 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0120 b(slope) = 0.0107 chi2 = 0.8149 VTN P-side: a = 0.0119 b(slope) = 0.0066 chi2 = 0.5386 CAL_IN N-side: a = 2.4549 b(slope) = 0.0083 chi2 = 0.6711 CAL_IN P-side: a = 2.4550 b(slope) = 0.0083 chi2 = 0.6474 VTP N-side(average) = 0.6988 V CAL_BASE = 2.4604 V VTP P-side(average) = 0.4350 V CAL_VREF = 2.9910 V FUNCT. DIGITAL TEST = 4 error detected in test: FUNCT@5.0V:ATOM18 11067.0 FUNCT@5.0V:ATOM18HF 11067.0 FUNCT@5.0V:ATOM35 1578.0 FUNCT@5.0V:ATOM36 2996.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3809.0 FUNCT@5.0V:ATOM45C_40 3809.0 FUNCT@5.0V:ATOM46C_40 3665.0 FUNCT@5.0V:ATOM47C_40 3665.0 FUNCT@5.0V:ATOM48C_40 3809.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3809.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1243.0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 1 error detected in test: TMIN@4.8V:ADAC37_50D 0.0 ------- CHIP ID:510 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0103 b(slope) = 0.0105 chi2 = 2.0217 VTN P-side: a = 0.0105 b(slope) = 0.0064 chi2 = 0.4794 CAL_IN N-side: a = 3.0923 b(slope) = 0.0000 chi2 = 2.8338 CAL_IN P-side: a = 3.0921 b(slope) = 0.0000 chi2 = 4.4233 VTP N-side(average) = 0.6836 V CAL_BASE = 2.4570 V VTP P-side(average) = 0.4236 V CAL_VREF = 2.9841 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:410 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0107 b(slope) = 0.0106 chi2 = 1.1496 VTN P-side: a = 0.0110 b(slope) = 0.0064 chi2 = 0.6356 CAL_IN N-side: a = 3.0923 b(slope) = 0.0000 chi2 = 3.2940 CAL_IN P-side: a = 3.0925 b(slope) = 0.0000 chi2 = 2.3913 VTP N-side(average) = 0.6885 V CAL_BASE = 2.4519 V VTP P-side(average) = 0.4239 V CAL_VREF = 2.9783 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:310 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0117 b(slope) = 0.0103 chi2 = 0.8096 VTN P-side: a = 0.0117 b(slope) = 0.0063 chi2 = 0.8531 CAL_IN N-side: a = 2.4660 b(slope) = 0.0080 chi2 = 0.5197 CAL_IN P-side: a = 2.4660 b(slope) = 0.0080 chi2 = 0.2330 VTP N-side(average) = 0.6728 V CAL_BASE = 2.4702 V VTP P-side(average) = 0.4165 V CAL_VREF = 2.9853 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:210 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0117 b(slope) = 0.0101 chi2 = 0.7357 VTN P-side: a = 0.0118 b(slope) = 0.0062 chi2 = 0.5517 CAL_IN N-side: a = 2.4568 b(slope) = 0.0080 chi2 = 0.3380 CAL_IN P-side: a = 2.4570 b(slope) = 0.0080 chi2 = 0.3633 VTP N-side(average) = 0.6619 V CAL_BASE = 2.4612 V VTP P-side(average) = 0.4071 V CAL_VREF = 2.9766 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5967.0 FUNCT@5.0V:ATOM45C_40 5967.0 FUNCT@5.0V:ATOM46C_40 5501.0 FUNCT@5.0V:ATOM47C_40 4277.0 FUNCT@5.0V:ATOM48C_40 5967.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5967.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:211 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0112 b(slope) = 0.0101 chi2 = 0.9343 VTN P-side: a = 0.0115 b(slope) = 0.0061 chi2 = 0.4204 CAL_IN N-side: a = 2.4604 b(slope) = 0.0081 chi2 = 0.6457 CAL_IN P-side: a = 2.4600 b(slope) = 0.0081 chi2 = 0.3185 VTP N-side(average) = 0.6561 V CAL_BASE = 2.4631 V VTP P-side(average) = 0.4054 V CAL_VREF = 2.9805 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:311 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0124 b(slope) = 0.0104 chi2 = 1.1236 VTN P-side: a = 0.0125 b(slope) = 0.0063 chi2 = 0.6343 CAL_IN N-side: a = 2.4218 b(slope) = 0.0127 chi2 = 99.0000 CAL_IN P-side: a = 2.4522 b(slope) = 0.0111 chi2 = 99.0000 VTP N-side(average) = 0.6769 V CAL_BASE = 2.4558 V VTP P-side(average) = 0.4165 V CAL_VREF = 2.9829 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:411 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0120 b(slope) = 0.0104 chi2 = 1.2134 VTN P-side: a = 0.0123 b(slope) = 0.0064 chi2 = 0.4189 CAL_IN N-side: a = 2.4778 b(slope) = 0.0081 chi2 = 0.7445 CAL_IN P-side: a = 2.4780 b(slope) = 0.0081 chi2 = 0.6797 VTP N-side(average) = 0.6781 V CAL_BASE = 2.4810 V VTP P-side(average) = 0.4204 V CAL_VREF = 2.9978 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:511 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0113 b(slope) = 0.0105 chi2 = 1.0691 VTN P-side: a = 0.0117 b(slope) = 0.0064 chi2 = 0.6462 CAL_IN N-side: a = 2.4694 b(slope) = 0.0082 chi2 = 6.0756 CAL_IN P-side: a = 2.4735 b(slope) = 0.0082 chi2 = 2.9957 VTP N-side(average) = 0.6859 V CAL_BASE = 2.4732 V VTP P-side(average) = 0.4253 V CAL_VREF = 2.9917 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1052.0 FUNCT@5.0V:ATOM13B 1109.0 FUNCT@5.0V:ATOM13C 1109.0 FUNCT@5.0V:ATOM15 1096.0 FUNCT@5.0V:ATOM17 3408.0 FUNCT@5.0V:ATOM18 3424.0 FUNCT@5.0V:ATOM18HF 3424.0 FUNCT@5.0V:ATOM19 3360.0 FUNCT@5.0V:ATOM19D 3375.0 FUNCT@5.0V:ATOM19E 2602.0 FUNCT@5.0V:ATOM19F 6476.0 FUNCT@5.0V:ATOM19FHF 6476.0 FUNCT@5.0V:ATOM20 1069.0 FUNCT@5.0V:ATOM21 1045.0 FUNCT@5.0V:ATOM22 1032.0 FUNCT@5.0V:ATOM23 964.0 FUNCT@5.0V:ATOM24 1064.0 FUNCT@5.0V:ATOM25 1050.0 FUNCT@5.0V:ATOM25HF 1050.0 FUNCT@5.0V:ATOM26A 1030.0 FUNCT@5.0V:ATOM26B 1838.0 FUNCT@5.0V:ATOM28 1167.0 FUNCT@5.0V:ATOM29 1167.0 FUNCT@5.0V:ATOM30 1167.0 FUNCT@5.0V:ATOM31A 800.0 FUNCT@5.0V:ATOM31B 989.0 FUNCT@5.0V:ATOM32 800.0 FUNCT@5.0V:ATOM33 1167.0 FUNCT@5.0V:ATOM35 1301.0 FUNCT@5.0V:ATOM36 1056.0 FUNCT@5.0V:ATOM37A 1197.0 FUNCT@5.0V:ATOM37B 1188.0 FUNCT@5.0V:ATOM37C 1173.0 FUNCT@5.0V:ATOM37D 1141.0 FUNCT@5.0V:ATOM37E 1132.0 FUNCT@5.0V:ATOM39 1077.0 FUNCT@5.0V:ATOM41 1604.0 FUNCT@5.0V:ATOM41A 1604.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3662.0 FUNCT@5.0V:ATOM45C_40 3662.0 FUNCT@5.0V:ATOM46C_40 3662.0 FUNCT@5.0V:ATOM47C_40 3662.0 FUNCT@5.0V:ATOM48C_40 3662.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3662.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1233.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1392.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:611 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0114 b(slope) = 0.0106 chi2 = 0.5733 VTN P-side: a = 0.0116 b(slope) = 0.0065 chi2 = 0.3903 CAL_IN N-side: a = 2.4304 b(slope) = 0.0085 chi2 = 1.1792 CAL_IN P-side: a = 2.4306 b(slope) = 0.0085 chi2 = 0.7022 VTP N-side(average) = 0.6936 V CAL_BASE = 2.4353 V VTP P-side(average) = 0.4309 V CAL_VREF = 2.9785 V FUNCT. DIGITAL TEST = 15 error detected in test: FUNCT@5.0V:ATOM17 7194.0 FUNCT@5.0V:ATOM18 10115.0 FUNCT@5.0V:ATOM18HF 10240.0 FUNCT@5.0V:ATOM25 3168.0 FUNCT@5.0V:ATOM25HF 3168.0 FUNCT@5.0V:ATOM28 1700.0 FUNCT@5.0V:ATOM29 1701.0 FUNCT@5.0V:ATOM30 1700.0 FUNCT@5.0V:ATOM31A 1335.0 FUNCT@5.0V:ATOM32 1334.0 FUNCT@5.0V:ATOM37A 3126.0 FUNCT@5.0V:ATOM37B 3126.0 FUNCT@5.0V:ATOM37C 3110.0 FUNCT@5.0V:ATOM37D 3078.0 FUNCT@5.0V:ATOM37E 3073.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:711 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0111 b(slope) = 0.0108 chi2 = 1.2712 VTN P-side: a = 0.0114 b(slope) = 0.0066 chi2 = 0.7819 CAL_IN N-side: a = 2.4405 b(slope) = 0.0083 chi2 = 0.7077 CAL_IN P-side: a = 2.4409 b(slope) = 0.0083 chi2 = 0.3150 VTP N-side(average) = 0.7010 V CAL_BASE = 2.4421 V VTP P-side(average) = 0.4374 V CAL_VREF = 2.9775 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:811 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0107 b(slope) = 0.0107 chi2 = 1.0299 VTN P-side: a = 0.0108 b(slope) = 0.0066 chi2 = 0.4654 CAL_IN N-side: a = 2.4182 b(slope) = 0.0084 chi2 = 0.6236 CAL_IN P-side: a = 2.4182 b(slope) = 0.0084 chi2 = 0.5690 VTP N-side(average) = 0.6974 V CAL_BASE = 2.4207 V VTP P-side(average) = 0.4333 V CAL_VREF = 2.9592 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:812 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1194 DACS TEST = 0 VTN N-side: a = 0.0116 b(slope) = 0.0108 chi2 = 0.6471 VTN P-side: a = 0.0116 b(slope) = 0.0066 chi2 = 0.1628 CAL_IN N-side: a = 2.4618 b(slope) = 0.0082 chi2 = 1.0531 CAL_IN P-side: a = 2.4618 b(slope) = 0.0082 chi2 = 0.5910 VTP N-side(average) = 0.7018 V CAL_BASE = 2.4675 V VTP P-side(average) = 0.4350 V CAL_VREF = 2.9951 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1128.0 FUNCT@5.0V:ATOM13C 1128.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1216.0 FUNCT@5.0V:ATOM37B 1206.0 FUNCT@5.0V:ATOM37C 1191.0 FUNCT@5.0V:ATOM37D 1160.0 FUNCT@5.0V:ATOM37E 1151.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:712 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0120 b(slope) = 0.0108 chi2 = 0.8662 VTN P-side: a = 0.0119 b(slope) = 0.0067 chi2 = 0.7339 CAL_IN N-side: a = 3.0906 b(slope) = 0.0001 chi2 = 8.5489 CAL_IN P-side: a = 3.0833 b(slope) = 0.0002 chi2 = 56.8040 VTP N-side(average) = 0.7059 V CAL_BASE = 2.4807 V VTP P-side(average) = 0.4411 V CAL_VREF = 3.0046 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:612 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0107 b(slope) = 0.0107 chi2 = 1.2841 VTN P-side: a = 0.0111 b(slope) = 0.0066 chi2 = 0.4300 CAL_IN N-side: a = 3.0924 b(slope) = 0.0000 chi2 = 2.6026 CAL_IN P-side: a = 3.0926 b(slope) = 0.0000 chi2 = 4.5673 VTP N-side(average) = 0.6948 V CAL_BASE = 2.4485 V VTP P-side(average) = 0.4317 V CAL_VREF = 2.9988 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:512 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0111 b(slope) = 0.0106 chi2 = 0.7600 VTN P-side: a = 0.0111 b(slope) = 0.0065 chi2 = 0.3886 CAL_IN N-side: a = 3.0923 b(slope) = 0.0000 chi2 = 3.5200 CAL_IN P-side: a = 3.0926 b(slope) = 0.0000 chi2 = 3.4282 VTP N-side(average) = 0.6931 V CAL_BASE = 2.4758 V VTP P-side(average) = 0.4305 V CAL_VREF = 3.0012 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:412 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0104 b(slope) = 0.0106 chi2 = 0.9055 VTN P-side: a = 0.0108 b(slope) = 0.0064 chi2 = 0.4733 CAL_IN N-side: a = 3.0922 b(slope) = 0.0000 chi2 = 4.3882 CAL_IN P-side: a = 3.0921 b(slope) = 0.0000 chi2 = 2.8400 VTP N-side(average) = 0.6875 V CAL_BASE = 2.4441 V VTP P-side(average) = 0.4248 V CAL_VREF = 2.9829 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:312 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0102 b(slope) = 0.0104 chi2 = 1.5625 VTN P-side: a = 0.0105 b(slope) = 0.0063 chi2 = 0.6450 CAL_IN N-side: a = 3.0923 b(slope) = 0.0000 chi2 = 2.3559 CAL_IN P-side: a = 3.0925 b(slope) = 0.0000 chi2 = 1.9141 VTP N-side(average) = 0.6767 V CAL_BASE = 2.4812 V VTP P-side(average) = 0.4175 V CAL_VREF = 3.0044 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 3 error detected in test: TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:212 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0111 b(slope) = 0.0103 chi2 = 0.6551 VTN P-side: a = 0.0113 b(slope) = 0.0063 chi2 = 0.5397 CAL_IN N-side: a = 3.0925 b(slope) = 0.0000 chi2 = 3.0264 CAL_IN P-side: a = 3.0924 b(slope) = 0.0000 chi2 = 2.5428 VTP N-side(average) = 0.6732 V CAL_BASE = 2.4919 V VTP P-side(average) = 0.4146 V CAL_VREF = 3.0071 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:413 --------------------------------------- CLASS=B -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0121 b(slope) = 0.0106 chi2 = 0.5008 VTN P-side: a = 0.0119 b(slope) = 0.0065 chi2 = 0.3329 CAL_IN N-side: a = 2.4593 b(slope) = 0.0083 chi2 = 0.6973 CAL_IN P-side: a = 2.4596 b(slope) = 0.0083 chi2 = 0.8545 VTP N-side(average) = 0.6923 V CAL_BASE = 2.4624 V VTP P-side(average) = 0.4307 V CAL_VREF = 2.9956 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3747.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:513 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0111 b(slope) = 0.0106 chi2 = 0.8669 VTN P-side: a = 0.0114 b(slope) = 0.0065 chi2 = 0.5550 CAL_IN N-side: a = 2.4665 b(slope) = 0.0083 chi2 = 1.1259 CAL_IN P-side: a = 2.4669 b(slope) = 0.0083 chi2 = 1.6977 VTP N-side(average) = 0.6937 V CAL_BASE = 2.4717 V VTP P-side(average) = 0.4281 V CAL_VREF = 3.0051 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:613 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0110 b(slope) = 0.0107 chi2 = 0.8532 VTN P-side: a = 0.0110 b(slope) = 0.0066 chi2 = 0.4891 CAL_IN N-side: a = 2.4639 b(slope) = 0.0083 chi2 = 0.9183 CAL_IN P-side: a = 2.4641 b(slope) = 0.0083 chi2 = 0.8349 VTP N-side(average) = 0.6960 V CAL_BASE = 2.4690 V VTP P-side(average) = 0.4341 V CAL_VREF = 3.0020 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:614 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1769 IDDSB:VDD1B 0.1772 IDDSB:VDD1C 0.1774 IDDSB:VDD1D 0.1775 IDDOP1:DVDD 0.2046 DACS TEST = 1 VTN N-side: a = 0.2287 b(slope) = 0.0000 chi2 = 0.2039 VTN P-side: a = 0.1449 b(slope) = 0.0000 chi2 = 0.2372 CAL_IN N-side: a = 2.7613 b(slope) = 0.0000 chi2 = 0.3495 CAL_IN P-side: a = 2.7612 b(slope) = 0.0000 chi2 = 0.3262 VTP N-side(average) = 0.7098 V CAL_BASE = 2.4980 V VTP P-side(average) = 0.4402 V CAL_VREF = 3.0288 V FUNCT. DIGITAL TEST = 58 error detected in test: FUNCT@5.0V:ATOM1TO6A 212.0 FUNCT@5.0V:ATOM1TO6B 212.0 FUNCT@5.0V:ATOM1TO6C 212.0 FUNCT@5.0V:ATOM1TO6D 212.0 FUNCT@5.0V:ATOM1TO6E 212.0 FUNCT@5.0V:ATOM7TO9A 212.0 FUNCT@5.0V:ATOM7TO9B 212.0 FUNCT@5.0V:ATOM7TO9C 212.0 FUNCT@5.0V:ATOM7TO9D 212.0 FUNCT@5.0V:ATOM7TO9E 212.0 FUNCT@5.0V:ATOM10TO12 212.0 FUNCT@5.0V:ATOM13A 212.0 FUNCT@5.0V:ATOM13B 212.0 FUNCT@5.0V:ATOM13C 212.0 FUNCT@5.0V:ATOM14 212.0 FUNCT@5.0V:ATOM15 212.0 FUNCT@5.0V:ATOM16 212.0 FUNCT@5.0V:ATOM17 212.0 FUNCT@5.0V:ATOM18 212.0 FUNCT@5.0V:ATOM18HF 212.0 FUNCT@5.0V:ATOM19 212.0 FUNCT@5.0V:ATOM19B 212.0 FUNCT@5.0V:ATOM19C 212.0 FUNCT@5.0V:ATOM19D 212.0 FUNCT@5.0V:ATOM19E 212.0 FUNCT@5.0V:ATOM19F 212.0 FUNCT@5.0V:ATOM19FHF 212.0 FUNCT@5.0V:ATOM20 212.0 FUNCT@5.0V:ATOM21 212.0 FUNCT@5.0V:ATOM22 212.0 FUNCT@5.0V:ATOM23 212.0 FUNCT@5.0V:ATOM24 212.0 FUNCT@5.0V:ATOM25 212.0 FUNCT@5.0V:ATOM25HF 212.0 FUNCT@5.0V:ATOM26A 212.0 FUNCT@5.0V:ATOM26B 212.0 FUNCT@5.0V:ATOM27 212.0 FUNCT@5.0V:ATOM28 212.0 FUNCT@5.0V:ATOM29 212.0 FUNCT@5.0V:ATOM30 212.0 FUNCT@5.0V:ATOM31A 212.0 FUNCT@5.0V:ATOM31B 212.0 FUNCT@5.0V:ATOM32 212.0 FUNCT@5.0V:ATOM33 212.0 FUNCT@5.0V:ATOM34 212.0 FUNCT@5.0V:ATOM35 212.0 FUNCT@5.0V:ATOM36 212.0 FUNCT@5.0V:ATOM37A 212.0 FUNCT@5.0V:ATOM37B 212.0 FUNCT@5.0V:ATOM37C 212.0 FUNCT@5.0V:ATOM37D 212.0 FUNCT@5.0V:ATOM37E 212.0 FUNCT@5.0V:ATOM38 212.0 FUNCT@5.0V:ATOM39 212.0 FUNCT@5.0V:ATOM40 212.0 FUNCT@5.0V:ATOM41 212.0 FUNCT@5.0V:ATOM41A 212.0 FUNCT@5.0V:ATOM42 212.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 212.0 FUNCT@5.0V:ATOM45C_40 212.0 FUNCT@5.0V:ATOM46C_40 212.0 FUNCT@5.0V:ATOM47C_40 212.0 FUNCT@5.0V:ATOM48C_40 212.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 212.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 212.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 212.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 212.0 FUNCT@5.0V:A10TO12HF 212.0 FUNCT@5.0V:ADAC37HF 212.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:514 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5122 V_V1RB:169/L5 3.5120 V_V1RC:169/L5 3.5124 V_V1RD:169/L5 3.5107 DACS TEST = 1 VTN N-side: a = 0.0092 b(slope) = 0.0107 chi2 = 0.5840 VTN P-side: a = 0.0094 b(slope) = 0.0066 chi2 = 0.4535 CAL_IN N-side: a = 3.0938 b(slope) = 0.0000 chi2 = 3.2950 CAL_IN P-side: a = 3.0938 b(slope) = 0.0000 chi2 = 2.9779 VTP N-side(average) = 0.6962 V CAL_BASE = 2.3904 V VTP P-side(average) = 0.4309 V CAL_VREF = 3.5247 V FUNCT. DIGITAL TEST = 9 error detected in test: FUNCT@5.0V:ATOM18 13795.0 FUNCT@5.0V:ATOM18HF 13795.0 FUNCT@5.0V:ATOM19E 3441.0 FUNCT@5.0V:ATOM21 1883.0 FUNCT@5.0V:ATOM28 2005.0 FUNCT@5.0V:ATOM31A 1639.0 FUNCT@5.0V:ATOM35 2139.0 FUNCT@5.0V:ATOM37B 2858.0 FUNCT@5.0V:ATOM37E 2801.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:414 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0111 b(slope) = 0.0107 chi2 = 0.5027 VTN P-side: a = 0.0112 b(slope) = 0.0065 chi2 = 0.3416 CAL_IN N-side: a = 3.0922 b(slope) = 0.0000 chi2 = 8.4353 CAL_IN P-side: a = 3.0925 b(slope) = 0.0000 chi2 = 2.6585 VTP N-side(average) = 0.6955 V CAL_BASE = 2.4746 V VTP P-side(average) = 0.4266 V CAL_VREF = 3.0195 V FUNCT. DIGITAL TEST = 16 error detected in test: FUNCT@5.0V:ATOM13A 1459.0 FUNCT@5.0V:ATOM17 5594.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM25 2221.0 FUNCT@5.0V:ATOM25HF 2221.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37C 1197.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3684.0 FUNCT@5.0V:ATOM45C_40 4083.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 4277.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4927.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 +++++++++ WAFER DATA+++++++++++++++++++++++++++ CLASSES: A-->Good, B-->Probably Good, C-->Bad A B C ------------------------- 602 307 401 502 413 501 402 601 303 203 503 403 703 603 803 804 704 204 604 705 504 805 404 706 304 306 205 107 305 507 405 608 505 508 605 108 806 309 606 409 506 509 406 609 206 709 207 810 407 610 607 510 707 410 807 210 907 311 908 511 808 611 708 812 408 712 308 612 208 512 209 412 809 312 710 212 310 614 211 514 411 414 711 811 513 613 ---------------------------- 44 2 40 NUMBER OF CHIPS TESTED = 86 NUMBER OF CLASS A CHIPS = 44 NUMBER OF CLASS B CHIPS = 2 NUMBER OF CLASS C CHIPS = 40 YIELD = 51.16 %