------- CHIP ID:401 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD0A 0.1276 IDDSB:VDD0B 0.1275 IDDSB:VDD0C 0.1275 IDDSB:VDD0D 0.1276 IDDOP0:AVDD 0.1067 DACS TEST = 0 VTN N-side: a = 0.0127 b(slope) = 0.0106 chi2 = 0.9119 VTN P-side: a = 0.0129 b(slope) = 0.0065 chi2 = 0.5559 CAL_IN N-side: a = 2.4370 b(slope) = 0.0085 chi2 = 1.3223 CAL_IN P-side: a = 2.4368 b(slope) = 0.0085 chi2 = 1.8795 VTP N-side(average) = 0.6955 V CAL_BASE = 2.4399 V VTP P-side(average) = 0.4295 V CAL_VREF = 2.9880 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1110.0 FUNCT@5.0V:ATOM13B 1166.0 FUNCT@5.0V:ATOM13C 1166.0 FUNCT@5.0V:ATOM15 1154.0 FUNCT@5.0V:ATOM17 3466.0 FUNCT@5.0V:ATOM18 3482.0 FUNCT@5.0V:ATOM18HF 3482.0 FUNCT@5.0V:ATOM19 3418.0 FUNCT@5.0V:ATOM19D 3433.0 FUNCT@5.0V:ATOM19E 2660.0 FUNCT@5.0V:ATOM19F 6533.0 FUNCT@5.0V:ATOM19FHF 6533.0 FUNCT@5.0V:ATOM20 1126.0 FUNCT@5.0V:ATOM21 1104.0 FUNCT@5.0V:ATOM22 1092.0 FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM24 1075.0 FUNCT@5.0V:ATOM25 1108.0 FUNCT@5.0V:ATOM25HF 1108.0 FUNCT@5.0V:ATOM26A 1089.0 FUNCT@5.0V:ATOM26B 1898.0 FUNCT@5.0V:ATOM28 1226.0 FUNCT@5.0V:ATOM29 1226.0 FUNCT@5.0V:ATOM30 1226.0 FUNCT@5.0V:ATOM31A 858.0 FUNCT@5.0V:ATOM31B 1047.0 FUNCT@5.0V:ATOM32 858.0 FUNCT@5.0V:ATOM33 1224.0 FUNCT@5.0V:ATOM35 1358.0 FUNCT@5.0V:ATOM36 1114.0 FUNCT@5.0V:ATOM37A 1303.0 FUNCT@5.0V:ATOM37B 1295.0 FUNCT@5.0V:ATOM37C 1279.0 FUNCT@5.0V:ATOM37D 1247.0 FUNCT@5.0V:ATOM37E 1238.0 FUNCT@5.0V:ATOM39 1135.0 FUNCT@5.0V:ATOM41 1661.0 FUNCT@5.0V:ATOM41A 1661.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4311.0 FUNCT@5.0V:ATOM45C_40 4311.0 FUNCT@5.0V:ATOM46C_40 4311.0 FUNCT@5.0V:ATOM47C_40 4277.0 FUNCT@5.0V:ATOM48C_40 4311.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4311.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1403.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:501 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0092 b(slope) = 0.0106 chi2 = 1.3805 VTN P-side: a = 0.0092 b(slope) = 0.0065 chi2 = 0.4791 CAL_IN N-side: a = 2.4543 b(slope) = 0.0089 chi2 = 99.0000 CAL_IN P-side: a = 2.4602 b(slope) = 0.0091 chi2 = 99.0000 VTP N-side(average) = 0.6880 V CAL_BASE = 2.4641 V VTP P-side(average) = 0.4248 V CAL_VREF = 2.9973 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:601 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0105 chi2 = 1.9436 VTN P-side: a = 0.0094 b(slope) = 0.0064 chi2 = 0.7014 CAL_IN N-side: a = 2.4444 b(slope) = 0.0083 chi2 = 0.4621 CAL_IN P-side: a = 2.4443 b(slope) = 0.0083 chi2 = 0.4927 VTP N-side(average) = 0.6842 V CAL_BASE = 2.4470 V VTP P-side(average) = 0.4214 V CAL_VREF = 2.9812 V FUNCT. DIGITAL TEST = 31 error detected in test: FUNCT@5.0V:ATOM13A 1415.0 FUNCT@5.0V:ATOM13B 1471.0 FUNCT@5.0V:ATOM13C 1471.0 FUNCT@5.0V:ATOM15 1459.0 FUNCT@5.0V:ATOM17 3771.0 FUNCT@5.0V:ATOM18 3787.0 FUNCT@5.0V:ATOM18HF 3787.0 FUNCT@5.0V:ATOM19 3723.0 FUNCT@5.0V:ATOM19D 3738.0 FUNCT@5.0V:ATOM19E 2965.0 FUNCT@5.0V:ATOM19F 6838.0 FUNCT@5.0V:ATOM19FHF 6838.0 FUNCT@5.0V:ATOM20 1431.0 FUNCT@5.0V:ATOM21 1407.0 FUNCT@5.0V:ATOM22 1395.0 FUNCT@5.0V:ATOM25 1413.0 FUNCT@5.0V:ATOM25HF 1413.0 FUNCT@5.0V:ATOM26A 1392.0 FUNCT@5.0V:ATOM26B 2201.0 FUNCT@5.0V:ATOM28 1529.0 FUNCT@5.0V:ATOM29 1529.0 FUNCT@5.0V:ATOM30 1529.0 FUNCT@5.0V:ATOM31A 1163.0 FUNCT@5.0V:ATOM31B 1352.0 FUNCT@5.0V:ATOM32 1163.0 FUNCT@5.0V:ATOM33 1529.0 FUNCT@5.0V:ATOM35 1663.0 FUNCT@5.0V:ATOM36 1419.0 FUNCT@5.0V:ATOM39 1440.0 FUNCT@5.0V:ATOM41 1966.0 FUNCT@5.0V:ATOM41A 1966.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3843.0 FUNCT@5.0V:ATOM45C_40 3843.0 FUNCT@5.0V:ATOM46C_40 3843.0 FUNCT@5.0V:ATOM47C_40 3669.0 FUNCT@5.0V:ATOM48C_40 3843.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3843.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:602 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0269 b(slope) = 0.0096 chi2 = 99.0000 VTN P-side: a = 0.0099 b(slope) = 0.0064 chi2 = 0.3059 CAL_IN N-side: a = 2.4671 b(slope) = 0.0078 chi2 = 99.0000 CAL_IN P-side: a = 2.4580 b(slope) = 0.0083 chi2 = 1.4925 VTP N-side(average) = 0.6850 V CAL_BASE = 2.4600 V VTP P-side(average) = 0.4212 V CAL_VREF = 2.9924 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:502 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0107 chi2 = 0.7111 VTN P-side: a = 0.0104 b(slope) = 0.0065 chi2 = 0.3291 CAL_IN N-side: a = 2.4467 b(slope) = 0.0085 chi2 = 0.8018 CAL_IN P-side: a = 2.4464 b(slope) = 0.0085 chi2 = 1.2249 VTP N-side(average) = 0.6930 V CAL_BASE = 2.4512 V VTP P-side(average) = 0.4292 V CAL_VREF = 2.9944 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:402 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.2233 b(slope) = 0.0000 chi2 = 0.2446 VTN P-side: a = 0.1410 b(slope) = 0.0000 chi2 = 0.3367 CAL_IN N-side: a = 2.7240 b(slope) = 0.0000 chi2 = 0.6395 CAL_IN P-side: a = 2.7254 b(slope) = 0.0000 chi2 = 1.6090 VTP N-side(average) = 0.6944 V CAL_BASE = 2.4565 V VTP P-side(average) = 0.4302 V CAL_VREF = 2.9954 V FUNCT. DIGITAL TEST = 58 error detected in test: FUNCT@5.0V:ATOM1TO6A 212.0 FUNCT@5.0V:ATOM1TO6B 212.0 FUNCT@5.0V:ATOM1TO6C 212.0 FUNCT@5.0V:ATOM1TO6D 212.0 FUNCT@5.0V:ATOM1TO6E 212.0 FUNCT@5.0V:ATOM7TO9A 212.0 FUNCT@5.0V:ATOM7TO9B 212.0 FUNCT@5.0V:ATOM7TO9C 212.0 FUNCT@5.0V:ATOM7TO9D 212.0 FUNCT@5.0V:ATOM7TO9E 212.0 FUNCT@5.0V:ATOM10TO12 212.0 FUNCT@5.0V:ATOM13A 212.0 FUNCT@5.0V:ATOM13B 212.0 FUNCT@5.0V:ATOM13C 212.0 FUNCT@5.0V:ATOM14 213.0 FUNCT@5.0V:ATOM15 212.0 FUNCT@5.0V:ATOM16 212.0 FUNCT@5.0V:ATOM17 212.0 FUNCT@5.0V:ATOM18 212.0 FUNCT@5.0V:ATOM18HF 212.0 FUNCT@5.0V:ATOM19 212.0 FUNCT@5.0V:ATOM19B 212.0 FUNCT@5.0V:ATOM19C 212.0 FUNCT@5.0V:ATOM19D 212.0 FUNCT@5.0V:ATOM19E 212.0 FUNCT@5.0V:ATOM19F 212.0 FUNCT@5.0V:ATOM19FHF 212.0 FUNCT@5.0V:ATOM20 212.0 FUNCT@5.0V:ATOM21 212.0 FUNCT@5.0V:ATOM22 212.0 FUNCT@5.0V:ATOM23 212.0 FUNCT@5.0V:ATOM24 212.0 FUNCT@5.0V:ATOM25 212.0 FUNCT@5.0V:ATOM25HF 212.0 FUNCT@5.0V:ATOM26A 212.0 FUNCT@5.0V:ATOM26B 212.0 FUNCT@5.0V:ATOM27 212.0 FUNCT@5.0V:ATOM28 212.0 FUNCT@5.0V:ATOM29 212.0 FUNCT@5.0V:ATOM30 212.0 FUNCT@5.0V:ATOM31A 212.0 FUNCT@5.0V:ATOM31B 212.0 FUNCT@5.0V:ATOM32 212.0 FUNCT@5.0V:ATOM33 212.0 FUNCT@5.0V:ATOM34 212.0 FUNCT@5.0V:ATOM35 212.0 FUNCT@5.0V:ATOM36 212.0 FUNCT@5.0V:ATOM37A 212.0 FUNCT@5.0V:ATOM37B 212.0 FUNCT@5.0V:ATOM37C 212.0 FUNCT@5.0V:ATOM37D 212.0 FUNCT@5.0V:ATOM37E 212.0 FUNCT@5.0V:ATOM38 212.0 FUNCT@5.0V:ATOM39 212.0 FUNCT@5.0V:ATOM40 212.0 FUNCT@5.0V:ATOM41 212.0 FUNCT@5.0V:ATOM41A 212.0 FUNCT@5.0V:ATOM42 212.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 212.0 FUNCT@5.0V:ATOM45C_40 212.0 FUNCT@5.0V:ATOM46C_40 212.0 FUNCT@5.0V:ATOM47C_40 212.0 FUNCT@5.0V:ATOM48C_40 212.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 212.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 212.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 212.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 212.0 FUNCT@5.0V:A10TO12HF 212.0 FUNCT@5.0V:ADAC37HF 212.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:203 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0104 chi2 = 1.3286 VTN P-side: a = 0.0106 b(slope) = 0.0063 chi2 = 0.3993 CAL_IN N-side: a = 2.4633 b(slope) = 0.0083 chi2 = 0.5920 CAL_IN P-side: a = 2.4634 b(slope) = 0.0083 chi2 = 0.6518 VTP N-side(average) = 0.6774 V CAL_BASE = 2.4627 V VTP P-side(average) = 0.4168 V CAL_VREF = 2.9939 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:303 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0103 chi2 = 1.1848 VTN P-side: a = 0.0098 b(slope) = 0.0063 chi2 = 0.6470 CAL_IN N-side: a = 2.4788 b(slope) = 0.0081 chi2 = 1.8007 CAL_IN P-side: a = 2.4803 b(slope) = 0.0082 chi2 = 1.6021 VTP N-side(average) = 0.6735 V CAL_BASE = 2.4812 V VTP P-side(average) = 0.4139 V CAL_VREF = 3.0015 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:403 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD0A 0.1413 IDDSB:VDD0B 0.1413 IDDSB:VDD0C 0.1413 IDDSB:VDD0D 0.1413 IDDOP0:AVDD 0.1183 DACS TEST = 0 VTN N-side: a = 0.0161 b(slope) = 0.0103 chi2 = 0.6726 VTN P-side: a = 0.0159 b(slope) = 0.0063 chi2 = 0.3778 CAL_IN N-side: a = 2.3957 b(slope) = 0.0084 chi2 = 0.7119 CAL_IN P-side: a = 2.3958 b(slope) = 0.0084 chi2 = 0.7885 VTP N-side(average) = 0.6799 V CAL_BASE = 2.3989 V VTP P-side(average) = 0.4233 V CAL_VREF = 2.9358 V FUNCT. DIGITAL TEST = 3 error detected in test: FUNCT@5.0V:ATOM13B 1950.0 FUNCT@5.0V:ATOM18 5682.0 FUNCT@5.0V:ATOM26A 1823.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:503 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0105 chi2 = 0.9514 VTN P-side: a = 0.0100 b(slope) = 0.0064 chi2 = 0.4936 CAL_IN N-side: a = 2.4546 b(slope) = 0.0082 chi2 = 0.5272 CAL_IN P-side: a = 2.4543 b(slope) = 0.0082 chi2 = 0.6968 VTP N-side(average) = 0.6822 V CAL_BASE = 2.4587 V VTP P-side(average) = 0.4241 V CAL_VREF = 2.9856 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:603 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD0A 0.1391 IDDSB:VDD0B 0.1391 IDDSB:VDD0C 0.1391 IDDSB:VDD0D 0.1391 IDDOP0:AVDD 0.1165 DACS TEST = 0 VTN N-side: a = 0.0165 b(slope) = 0.0101 chi2 = 1.3563 VTN P-side: a = 0.0167 b(slope) = 0.0062 chi2 = 0.4357 CAL_IN N-side: a = 2.4210 b(slope) = 0.0079 chi2 = 1.1308 CAL_IN P-side: a = 2.4207 b(slope) = 0.0079 chi2 = 0.6234 VTP N-side(average) = 0.6637 V CAL_BASE = 2.4241 V VTP P-side(average) = 0.4120 V CAL_VREF = 2.9329 V FUNCT. DIGITAL TEST = 3 error detected in test: FUNCT@5.0V:ATOM17 4502.0 FUNCT@5.0V:ATOM25 2208.0 FUNCT@5.0V:ATOM33 2088.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:703 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0106 b(slope) = 0.0104 chi2 = 1.0962 VTN P-side: a = 0.0109 b(slope) = 0.0064 chi2 = 0.8056 CAL_IN N-side: a = 2.4200 b(slope) = 0.0085 chi2 = 0.4839 CAL_IN P-side: a = 2.4201 b(slope) = 0.0085 chi2 = 0.7110 VTP N-side(average) = 0.6809 V CAL_BASE = 2.4241 V VTP P-side(average) = 0.4198 V CAL_VREF = 2.9656 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:803 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0106 b(slope) = 0.0106 chi2 = 1.5208 VTN P-side: a = 0.0108 b(slope) = 0.0065 chi2 = 0.6136 CAL_IN N-side: a = 2.4602 b(slope) = 0.0082 chi2 = 0.5347 CAL_IN P-side: a = 2.4598 b(slope) = 0.0082 chi2 = 0.5502 VTP N-side(average) = 0.6915 V CAL_BASE = 2.4639 V VTP P-side(average) = 0.4290 V CAL_VREF = 2.9888 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:804 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0112 b(slope) = 0.0106 chi2 = 0.5369 VTN P-side: a = 0.0112 b(slope) = 0.0064 chi2 = 0.4487 CAL_IN N-side: a = 2.4447 b(slope) = 0.0083 chi2 = 0.9335 CAL_IN P-side: a = 2.4445 b(slope) = 0.0083 chi2 = 0.4317 VTP N-side(average) = 0.6899 V CAL_BASE = 2.4495 V VTP P-side(average) = 0.4246 V CAL_VREF = 2.9792 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:704 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1228 DACS TEST = 0 VTN N-side: a = 0.0138 b(slope) = 0.0104 chi2 = 1.6930 VTN P-side: a = 0.0140 b(slope) = 0.0063 chi2 = 0.6308 CAL_IN N-side: a = 2.4596 b(slope) = 0.0081 chi2 = 0.5748 CAL_IN P-side: a = 2.4595 b(slope) = 0.0081 chi2 = 0.5530 VTP N-side(average) = 0.6799 V CAL_BASE = 2.4634 V VTP P-side(average) = 0.4212 V CAL_VREF = 2.9822 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1055.0 FUNCT@5.0V:ATOM13B 1111.0 FUNCT@5.0V:ATOM13C 1111.0 FUNCT@5.0V:ATOM15 1099.0 FUNCT@5.0V:ATOM17 3411.0 FUNCT@5.0V:ATOM18 3427.0 FUNCT@5.0V:ATOM18HF 3427.0 FUNCT@5.0V:ATOM19 3363.0 FUNCT@5.0V:ATOM19D 3378.0 FUNCT@5.0V:ATOM19E 2605.0 FUNCT@5.0V:ATOM19F 6478.0 FUNCT@5.0V:ATOM19FHF 6478.0 FUNCT@5.0V:ATOM20 1071.0 FUNCT@5.0V:ATOM21 1047.0 FUNCT@5.0V:ATOM22 1035.0 FUNCT@5.0V:ATOM23 967.0 FUNCT@5.0V:ATOM24 1067.0 FUNCT@5.0V:ATOM25 1053.0 FUNCT@5.0V:ATOM25HF 1053.0 FUNCT@5.0V:ATOM26A 1032.0 FUNCT@5.0V:ATOM26B 1841.0 FUNCT@5.0V:ATOM28 1169.0 FUNCT@5.0V:ATOM29 1169.0 FUNCT@5.0V:ATOM30 1169.0 FUNCT@5.0V:ATOM31A 803.0 FUNCT@5.0V:ATOM31B 992.0 FUNCT@5.0V:ATOM32 803.0 FUNCT@5.0V:ATOM33 1169.0 FUNCT@5.0V:ATOM35 1303.0 FUNCT@5.0V:ATOM36 1059.0 FUNCT@5.0V:ATOM37A 1199.0 FUNCT@5.0V:ATOM37B 1191.0 FUNCT@5.0V:ATOM37C 1175.0 FUNCT@5.0V:ATOM37D 1143.0 FUNCT@5.0V:ATOM37E 1134.0 FUNCT@5.0V:ATOM39 1080.0 FUNCT@5.0V:ATOM41 1606.0 FUNCT@5.0V:ATOM41A 1606.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3656.0 FUNCT@5.0V:ATOM45C_40 3656.0 FUNCT@5.0V:ATOM46C_40 3656.0 FUNCT@5.0V:ATOM47C_40 3656.0 FUNCT@5.0V:ATOM48C_40 3656.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3656.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1234.0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:604 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0104 chi2 = 2.0397 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.8712 CAL_IN N-side: a = 2.4391 b(slope) = 0.0083 chi2 = 0.5063 CAL_IN P-side: a = 2.4391 b(slope) = 0.0083 chi2 = 0.2890 VTP N-side(average) = 0.6783 V CAL_BASE = 2.4436 V VTP P-side(average) = 0.4203 V CAL_VREF = 2.9744 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:504 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0106 chi2 = 3.1827 VTN P-side: a = 0.0101 b(slope) = 0.0065 chi2 = 1.1144 CAL_IN N-side: a = 2.4485 b(slope) = 0.0084 chi2 = 0.8292 CAL_IN P-side: a = 2.4486 b(slope) = 0.0083 chi2 = 1.9535 VTP N-side(average) = 0.6923 V CAL_BASE = 2.4522 V VTP P-side(average) = 0.4276 V CAL_VREF = 2.9873 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4759.0 FUNCT@5.0V:ATOM45C_40 4759.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3747.0 FUNCT@5.0V:ATOM48C_40 4759.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4759.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:404 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0104 chi2 = 0.5680 VTN P-side: a = 0.0101 b(slope) = 0.0064 chi2 = 0.3816 CAL_IN N-side: a = 2.4545 b(slope) = 0.0083 chi2 = 0.7032 CAL_IN P-side: a = 2.4545 b(slope) = 0.0083 chi2 = 0.6184 VTP N-side(average) = 0.6783 V CAL_BASE = 2.4570 V VTP P-side(average) = 0.4186 V CAL_VREF = 2.9912 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:304 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0506 b(slope) = 0.0045 chi2 = 99.0000 VTN P-side: a = 0.0091 b(slope) = 0.0032 chi2 = 31.2138 CAL_IN N-side: a = 2.5409 b(slope) = -0.0003 chi2 = 99.0000 CAL_IN P-side: a = 2.5036 b(slope) = 0.0000 chi2 = 0.5584 VTP N-side(average) = 0.6890 V CAL_BASE = 2.4739 V VTP P-side(average) = 0.4247 V CAL_VREF = 3.0015 V FUNCT. DIGITAL TEST = 6 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 2 error detected in test: TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 ------- CHIP ID:204 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0106 b(slope) = 0.0105 chi2 = 1.1164 VTN P-side: a = 0.0105 b(slope) = 0.0064 chi2 = 0.3474 CAL_IN N-side: a = 2.4606 b(slope) = 0.0083 chi2 = 0.6132 CAL_IN P-side: a = 2.4608 b(slope) = 0.0083 chi2 = 0.3954 VTP N-side(average) = 0.6833 V CAL_BASE = 2.4661 V VTP P-side(average) = 0.4223 V CAL_VREF = 2.9954 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:205 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD0A 0.1448 IDDSB:VDD0B 0.1447 IDDSB:VDD0C 0.1447 IDDSB:VDD0D 0.1447 IDDOP0:AVDD 0.1199 DACS TEST = 0 VTN N-side: a = 0.0173 b(slope) = 0.0101 chi2 = 1.6670 VTN P-side: a = 0.0173 b(slope) = 0.0062 chi2 = 0.5226 CAL_IN N-side: a = 2.4282 b(slope) = 0.0080 chi2 = 1.6108 CAL_IN P-side: a = 2.4307 b(slope) = 0.0081 chi2 = 3.9526 VTP N-side(average) = 0.6656 V CAL_BASE = 2.4304 V VTP P-side(average) = 0.4135 V CAL_VREF = 2.9465 V FUNCT. DIGITAL TEST = 12 error detected in test: FUNCT@5.0V:ATOM15 1986.0 FUNCT@5.0V:ATOM17 3450.0 FUNCT@5.0V:ATOM18 4550.0 FUNCT@5.0V:ATOM18HF 5602.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19E 3524.0 FUNCT@5.0V:ATOM19FHF 9745.0 FUNCT@5.0V:ATOM23 984.0 FUNCT@5.0V:ATOM36 3047.0 FUNCT@5.0V:ATOM37E 3038.0 FUNCT@5.0V:ATOM39 1999.0 FUNCT@5.0V:ATOM41A 2605.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3907.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1408.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:305 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0115 b(slope) = 0.0104 chi2 = 0.3786 VTN P-side: a = 0.0114 b(slope) = 0.0064 chi2 = 0.3856 CAL_IN N-side: a = 2.4259 b(slope) = 0.0084 chi2 = 0.4919 CAL_IN P-side: a = 2.4258 b(slope) = 0.0084 chi2 = 0.3865 VTP N-side(average) = 0.6756 V CAL_BASE = 2.4272 V VTP P-side(average) = 0.4189 V CAL_VREF = 2.9653 V FUNCT. DIGITAL TEST = 3 error detected in test: FUNCT@5.0V:ATOM18 11071.0 FUNCT@5.0V:ATOM23 975.0 FUNCT@5.0V:ATOM24 1075.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:405 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0106 chi2 = 1.8458 VTN P-side: a = 0.0106 b(slope) = 0.0065 chi2 = 0.8136 CAL_IN N-side: a = 2.4471 b(slope) = 0.0084 chi2 = 0.7472 CAL_IN P-side: a = 2.4470 b(slope) = 0.0084 chi2 = 0.5910 VTP N-side(average) = 0.6931 V CAL_BASE = 2.4473 V VTP P-side(average) = 0.4286 V CAL_VREF = 2.9844 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:505 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0111 b(slope) = 0.0105 chi2 = 1.4873 VTN P-side: a = 0.0114 b(slope) = 0.0064 chi2 = 0.3224 CAL_IN N-side: a = 2.4564 b(slope) = 0.0083 chi2 = 0.5932 CAL_IN P-side: a = 2.4564 b(slope) = 0.0083 chi2 = 0.3186 VTP N-side(average) = 0.6866 V CAL_BASE = 2.4587 V VTP P-side(average) = 0.4231 V CAL_VREF = 2.9915 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:605 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.2189 b(slope) = 0.0000 chi2 = 0.2286 VTN P-side: a = 0.1379 b(slope) = 0.0000 chi2 = 0.3876 CAL_IN N-side: a = 2.6997 b(slope) = 0.0000 chi2 = 0.4217 CAL_IN P-side: a = 2.6999 b(slope) = 0.0000 chi2 = 0.3919 VTP N-side(average) = 0.6797 V CAL_BASE = 2.4363 V VTP P-side(average) = 0.4194 V CAL_VREF = 2.9705 V FUNCT. DIGITAL TEST = 58 error detected in test: FUNCT@5.0V:ATOM1TO6A 213.0 FUNCT@5.0V:ATOM1TO6B 213.0 FUNCT@5.0V:ATOM1TO6C 213.0 FUNCT@5.0V:ATOM1TO6D 213.0 FUNCT@5.0V:ATOM1TO6E 213.0 FUNCT@5.0V:ATOM7TO9A 213.0 FUNCT@5.0V:ATOM7TO9B 213.0 FUNCT@5.0V:ATOM7TO9C 213.0 FUNCT@5.0V:ATOM7TO9D 213.0 FUNCT@5.0V:ATOM7TO9E 213.0 FUNCT@5.0V:ATOM10TO12 213.0 FUNCT@5.0V:ATOM13A 213.0 FUNCT@5.0V:ATOM13B 213.0 FUNCT@5.0V:ATOM13C 213.0 FUNCT@5.0V:ATOM14 213.0 FUNCT@5.0V:ATOM15 213.0 FUNCT@5.0V:ATOM16 213.0 FUNCT@5.0V:ATOM17 213.0 FUNCT@5.0V:ATOM18 213.0 FUNCT@5.0V:ATOM18HF 213.0 FUNCT@5.0V:ATOM19 213.0 FUNCT@5.0V:ATOM19B 213.0 FUNCT@5.0V:ATOM19C 213.0 FUNCT@5.0V:ATOM19D 213.0 FUNCT@5.0V:ATOM19E 213.0 FUNCT@5.0V:ATOM19F 213.0 FUNCT@5.0V:ATOM19FHF 213.0 FUNCT@5.0V:ATOM20 213.0 FUNCT@5.0V:ATOM21 213.0 FUNCT@5.0V:ATOM22 213.0 FUNCT@5.0V:ATOM23 213.0 FUNCT@5.0V:ATOM24 213.0 FUNCT@5.0V:ATOM25 213.0 FUNCT@5.0V:ATOM25HF 213.0 FUNCT@5.0V:ATOM26A 213.0 FUNCT@5.0V:ATOM26B 213.0 FUNCT@5.0V:ATOM27 213.0 FUNCT@5.0V:ATOM28 213.0 FUNCT@5.0V:ATOM29 213.0 FUNCT@5.0V:ATOM30 213.0 FUNCT@5.0V:ATOM31A 213.0 FUNCT@5.0V:ATOM31B 213.0 FUNCT@5.0V:ATOM32 213.0 FUNCT@5.0V:ATOM33 213.0 FUNCT@5.0V:ATOM34 213.0 FUNCT@5.0V:ATOM35 213.0 FUNCT@5.0V:ATOM36 213.0 FUNCT@5.0V:ATOM37A 213.0 FUNCT@5.0V:ATOM37B 213.0 FUNCT@5.0V:ATOM37C 213.0 FUNCT@5.0V:ATOM37D 213.0 FUNCT@5.0V:ATOM37E 213.0 FUNCT@5.0V:ATOM38 213.0 FUNCT@5.0V:ATOM39 213.0 FUNCT@5.0V:ATOM40 213.0 FUNCT@5.0V:ATOM41 213.0 FUNCT@5.0V:ATOM41A 213.0 FUNCT@5.0V:ATOM42 213.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 213.0 FUNCT@5.0V:ATOM45C_40 213.0 FUNCT@5.0V:ATOM46C_40 213.0 FUNCT@5.0V:ATOM47C_40 213.0 FUNCT@5.0V:ATOM48C_40 213.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 213.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 213.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 213.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 213.0 FUNCT@5.0V:A10TO12HF 213.0 FUNCT@5.0V:ADAC37HF 213.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:705 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0104 chi2 = 0.8093 VTN P-side: a = 0.0100 b(slope) = 0.0064 chi2 = 0.4236 CAL_IN N-side: a = 2.4596 b(slope) = 0.0081 chi2 = 0.8628 CAL_IN P-side: a = 2.4599 b(slope) = 0.0081 chi2 = 1.0971 VTP N-side(average) = 0.6767 V CAL_BASE = 2.4590 V VTP P-side(average) = 0.4202 V CAL_VREF = 2.9788 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:805 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0104 chi2 = 0.9800 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.6879 CAL_IN N-side: a = 2.4311 b(slope) = 0.0082 chi2 = 0.4593 CAL_IN P-side: a = 2.4314 b(slope) = 0.0082 chi2 = 0.7961 VTP N-side(average) = 0.6740 V CAL_BASE = 2.4338 V VTP P-side(average) = 0.4187 V CAL_VREF = 2.9619 V FUNCT. DIGITAL TEST = 7 error detected in test: FUNCT@5.0V:ATOM13B 1871.0 FUNCT@5.0V:ATOM13C 1871.0 FUNCT@5.0V:ATOM37A 2710.0 FUNCT@5.0V:ATOM37B 2702.0 FUNCT@5.0V:ATOM37C 2686.0 FUNCT@5.0V:ATOM37D 2654.0 FUNCT@5.0V:ATOM37E 2645.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5259.0 FUNCT@5.0V:ATOM45C_40 5259.0 FUNCT@5.0V:ATOM46C_40 5259.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 5259.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5259.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:806 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0106 b(slope) = 0.0104 chi2 = 0.6482 VTN P-side: a = 0.0106 b(slope) = 0.0064 chi2 = 0.3141 CAL_IN N-side: a = 2.4226 b(slope) = 0.0083 chi2 = 0.7870 CAL_IN P-side: a = 2.4227 b(slope) = 0.0083 chi2 = 0.6952 VTP N-side(average) = 0.6785 V CAL_BASE = 2.4265 V VTP P-side(average) = 0.4208 V CAL_VREF = 2.9568 V FUNCT. DIGITAL TEST = 20 error detected in test: FUNCT@5.0V:ATOM13A 1750.0 FUNCT@5.0V:ATOM17 4106.0 FUNCT@5.0V:ATOM18 4122.0 FUNCT@5.0V:ATOM18HF 4122.0 FUNCT@5.0V:ATOM19 4058.0 FUNCT@5.0V:ATOM19D 4073.0 FUNCT@5.0V:ATOM19E 3300.0 FUNCT@5.0V:ATOM21 1742.0 FUNCT@5.0V:ATOM22 1730.0 FUNCT@5.0V:ATOM24 1075.0 FUNCT@5.0V:ATOM25 1748.0 FUNCT@5.0V:ATOM25HF 1748.0 FUNCT@5.0V:ATOM26A 1727.0 FUNCT@5.0V:ATOM26B 3061.0 FUNCT@5.0V:ATOM36 1754.0 FUNCT@5.0V:ATOM37A 1668.0 FUNCT@5.0V:ATOM37B 1660.0 FUNCT@5.0V:ATOM37D 1612.0 FUNCT@5.0V:ATOM37E 1603.0 FUNCT@5.0V:ATOM39 1775.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:706 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0533 b(slope) = 0.0039 chi2 = 99.0000 VTN P-side: a = 0.0456 b(slope) = 0.0020 chi2 = 99.0000 CAL_IN N-side: a = 2.5021 b(slope) = 0.0026 chi2 = 99.0000 CAL_IN P-side: a = 2.5311 b(slope) = 0.0015 chi2 = 99.0000 VTP N-side(average) = 0.6699 V CAL_BASE = 2.4639 V VTP P-side(average) = 0.4155 V CAL_VREF = 2.9863 V FUNCT. DIGITAL TEST = 6 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 2 error detected in test: TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 ------- CHIP ID:606 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0104 chi2 = 1.1489 VTN P-side: a = 0.0098 b(slope) = 0.0064 chi2 = 0.6802 CAL_IN N-side: a = 2.4494 b(slope) = 0.0082 chi2 = 0.8712 CAL_IN P-side: a = 2.4492 b(slope) = 0.0083 chi2 = 1.0113 VTP N-side(average) = 0.6756 V CAL_BASE = 2.4492 V VTP P-side(average) = 0.4194 V CAL_VREF = 2.9780 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:506 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.2190 b(slope) = 0.0000 chi2 = 0.2604 VTN P-side: a = 0.1377 b(slope) = 0.0000 chi2 = 0.2610 CAL_IN N-side: a = 2.7179 b(slope) = 0.0000 chi2 = 0.4201 CAL_IN P-side: a = 2.7165 b(slope) = 0.0000 chi2 = 1.6071 VTP N-side(average) = 0.6812 V CAL_BASE = 2.4509 V VTP P-side(average) = 0.4199 V CAL_VREF = 2.9873 V FUNCT. DIGITAL TEST = 58 error detected in test: FUNCT@5.0V:ATOM1TO6A 213.0 FUNCT@5.0V:ATOM1TO6B 213.0 FUNCT@5.0V:ATOM1TO6C 213.0 FUNCT@5.0V:ATOM1TO6D 213.0 FUNCT@5.0V:ATOM1TO6E 213.0 FUNCT@5.0V:ATOM7TO9A 213.0 FUNCT@5.0V:ATOM7TO9B 213.0 FUNCT@5.0V:ATOM7TO9C 213.0 FUNCT@5.0V:ATOM7TO9D 213.0 FUNCT@5.0V:ATOM7TO9E 213.0 FUNCT@5.0V:ATOM10TO12 213.0 FUNCT@5.0V:ATOM13A 213.0 FUNCT@5.0V:ATOM13B 213.0 FUNCT@5.0V:ATOM13C 213.0 FUNCT@5.0V:ATOM14 213.0 FUNCT@5.0V:ATOM15 213.0 FUNCT@5.0V:ATOM16 213.0 FUNCT@5.0V:ATOM17 213.0 FUNCT@5.0V:ATOM18 213.0 FUNCT@5.0V:ATOM18HF 213.0 FUNCT@5.0V:ATOM19 213.0 FUNCT@5.0V:ATOM19B 213.0 FUNCT@5.0V:ATOM19C 213.0 FUNCT@5.0V:ATOM19D 213.0 FUNCT@5.0V:ATOM19E 213.0 FUNCT@5.0V:ATOM19F 213.0 FUNCT@5.0V:ATOM19FHF 213.0 FUNCT@5.0V:ATOM20 213.0 FUNCT@5.0V:ATOM21 213.0 FUNCT@5.0V:ATOM22 213.0 FUNCT@5.0V:ATOM23 213.0 FUNCT@5.0V:ATOM24 213.0 FUNCT@5.0V:ATOM25 213.0 FUNCT@5.0V:ATOM25HF 213.0 FUNCT@5.0V:ATOM26A 213.0 FUNCT@5.0V:ATOM26B 213.0 FUNCT@5.0V:ATOM27 213.0 FUNCT@5.0V:ATOM28 213.0 FUNCT@5.0V:ATOM29 213.0 FUNCT@5.0V:ATOM30 213.0 FUNCT@5.0V:ATOM31A 213.0 FUNCT@5.0V:ATOM31B 213.0 FUNCT@5.0V:ATOM32 213.0 FUNCT@5.0V:ATOM33 213.0 FUNCT@5.0V:ATOM34 213.0 FUNCT@5.0V:ATOM35 213.0 FUNCT@5.0V:ATOM36 213.0 FUNCT@5.0V:ATOM37A 213.0 FUNCT@5.0V:ATOM37B 213.0 FUNCT@5.0V:ATOM37C 213.0 FUNCT@5.0V:ATOM37D 213.0 FUNCT@5.0V:ATOM37E 213.0 FUNCT@5.0V:ATOM38 213.0 FUNCT@5.0V:ATOM39 213.0 FUNCT@5.0V:ATOM40 213.0 FUNCT@5.0V:ATOM41 213.0 FUNCT@5.0V:ATOM41A 213.0 FUNCT@5.0V:ATOM42 213.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 213.0 FUNCT@5.0V:ATOM45C_40 213.0 FUNCT@5.0V:ATOM46C_40 213.0 FUNCT@5.0V:ATOM47C_40 213.0 FUNCT@5.0V:ATOM48C_40 213.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 213.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 213.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 213.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 213.0 FUNCT@5.0V:A10TO12HF 213.0 FUNCT@5.0V:ADAC37HF 213.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:406 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0105 chi2 = 1.3436 VTN P-side: a = 0.0100 b(slope) = 0.0064 chi2 = 0.6667 CAL_IN N-side: a = 2.4231 b(slope) = 0.0085 chi2 = 0.6441 CAL_IN P-side: a = 2.4231 b(slope) = 0.0085 chi2 = 0.3108 VTP N-side(average) = 0.6829 V CAL_BASE = 2.4263 V VTP P-side(average) = 0.4201 V CAL_VREF = 2.9739 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:306 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0106 chi2 = 2.1588 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.5492 CAL_IN N-side: a = 2.4264 b(slope) = 0.0084 chi2 = 0.5238 CAL_IN P-side: a = 2.4264 b(slope) = 0.0084 chi2 = 0.2287 VTP N-side(average) = 0.6891 V CAL_BASE = 2.4311 V VTP P-side(average) = 0.4243 V CAL_VREF = 2.9714 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:206 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 6 error detected in test: IDDSB:VDD0A 0.1428 IDDSB:VDD0B 0.1429 IDDSB:VDD0C 0.1429 IDDSB:VDD0D 0.1428 IDDOP0:AVDD 0.1185 IDDOP1:DVDD 0.1449 DACS TEST = 0 VTN N-side: a = 0.0165 b(slope) = 0.0101 chi2 = 0.6535 VTN P-side: a = 0.0165 b(slope) = 0.0062 chi2 = 0.4720 CAL_IN N-side: a = 2.4352 b(slope) = 0.0080 chi2 = 1.1822 CAL_IN P-side: a = 2.4351 b(slope) = 0.0080 chi2 = 3.8116 VTP N-side(average) = 0.6631 V CAL_BASE = 2.4387 V VTP P-side(average) = 0.4127 V CAL_VREF = 2.9499 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1128.0 FUNCT@5.0V:ATOM13C 1128.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1216.0 FUNCT@5.0V:ATOM37B 1206.0 FUNCT@5.0V:ATOM37C 1191.0 FUNCT@5.0V:ATOM37D 1160.0 FUNCT@5.0V:ATOM37E 1151.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 212.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:107 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0105 chi2 = 1.6102 VTN P-side: a = 0.0108 b(slope) = 0.0064 chi2 = 0.8997 CAL_IN N-side: a = 2.4641 b(slope) = 0.0083 chi2 = 1.0802 CAL_IN P-side: a = 2.4645 b(slope) = 0.0083 chi2 = 1.0521 VTP N-side(average) = 0.6845 V CAL_BASE = 2.4673 V VTP P-side(average) = 0.4250 V CAL_VREF = 2.9973 V FUNCT. DIGITAL TEST = 22 error detected in test: FUNCT@5.0V:ATOM17 4494.0 FUNCT@5.0V:ATOM18 3425.0 FUNCT@5.0V:ATOM18HF 3425.0 FUNCT@5.0V:ATOM19F 8537.0 FUNCT@5.0V:ATOM19FHF 8537.0 FUNCT@5.0V:ATOM20 1069.0 FUNCT@5.0V:ATOM21 1045.0 FUNCT@5.0V:ATOM23 965.0 FUNCT@5.0V:ATOM24 1065.0 FUNCT@5.0V:ATOM26A 1030.0 FUNCT@5.0V:ATOM26B 3052.0 FUNCT@5.0V:ATOM28 1167.0 FUNCT@5.0V:ATOM29 1167.0 FUNCT@5.0V:ATOM30 1167.0 FUNCT@5.0V:ATOM31A 801.0 FUNCT@5.0V:ATOM32 801.0 FUNCT@5.0V:ATOM33 1167.0 FUNCT@5.0V:ATOM35 1301.0 FUNCT@5.0V:ATOM36 1057.0 FUNCT@5.0V:ATOM37B 1189.0 FUNCT@5.0V:ATOM37C 1173.0 FUNCT@5.0V:ATOM37D 1141.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4268.0 FUNCT@5.0V:ATOM45C_40 4268.0 FUNCT@5.0V:ATOM46C_40 4268.0 FUNCT@5.0V:ATOM47C_40 3668.0 FUNCT@5.0V:ATOM48C_40 4268.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4268.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1235.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1392.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:207 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0105 chi2 = 0.8731 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.3746 CAL_IN N-side: a = 2.4530 b(slope) = 0.0083 chi2 = 1.4180 CAL_IN P-side: a = 2.4528 b(slope) = 0.0083 chi2 = 2.1455 VTP N-side(average) = 0.6827 V CAL_BASE = 2.4522 V VTP P-side(average) = 0.4218 V CAL_VREF = 2.9834 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:307 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0103 chi2 = 1.9248 VTN P-side: a = 0.0104 b(slope) = 0.0063 chi2 = 0.7839 CAL_IN N-side: a = 2.4612 b(slope) = 0.0082 chi2 = 0.4991 CAL_IN P-side: a = 2.4614 b(slope) = 0.0082 chi2 = 0.5069 VTP N-side(average) = 0.6688 V CAL_BASE = 2.4631 V VTP P-side(average) = 0.4138 V CAL_VREF = 2.9871 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:407 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0104 chi2 = 1.2213 VTN P-side: a = 0.0105 b(slope) = 0.0063 chi2 = 0.7364 CAL_IN N-side: a = 2.4383 b(slope) = 0.0084 chi2 = 0.6597 CAL_IN P-side: a = 2.4387 b(slope) = 0.0084 chi2 = 0.5288 VTP N-side(average) = 0.6784 V CAL_BASE = 2.4407 V VTP P-side(average) = 0.4170 V CAL_VREF = 2.9797 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:507 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0105 chi2 = 1.0689 VTN P-side: a = 0.0097 b(slope) = 0.0064 chi2 = 0.5594 CAL_IN N-side: a = 2.4509 b(slope) = 0.0083 chi2 = 1.0554 CAL_IN P-side: a = 2.4510 b(slope) = 0.0083 chi2 = 0.4475 VTP N-side(average) = 0.6831 V CAL_BASE = 2.4556 V VTP P-side(average) = 0.4185 V CAL_VREF = 2.9876 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 2039.0 FUNCT@5.0V:ATOM13B 2094.0 FUNCT@5.0V:ATOM13C 2095.0 FUNCT@5.0V:ATOM15 2083.0 FUNCT@5.0V:ATOM17 4403.0 FUNCT@5.0V:ATOM18 4423.0 FUNCT@5.0V:ATOM18HF 4424.0 FUNCT@5.0V:ATOM19 4358.0 FUNCT@5.0V:ATOM19D 4374.0 FUNCT@5.0V:ATOM19E 3600.0 FUNCT@5.0V:ATOM19F 7473.0 FUNCT@5.0V:ATOM19FHF 7473.0 FUNCT@5.0V:ATOM20 2066.0 FUNCT@5.0V:ATOM21 2043.0 FUNCT@5.0V:ATOM22 2019.0 FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM24 1074.0 FUNCT@5.0V:ATOM25 2037.0 FUNCT@5.0V:ATOM25HF 2048.0 FUNCT@5.0V:ATOM26A 2024.0 FUNCT@5.0V:ATOM26B 2837.0 FUNCT@5.0V:ATOM28 2160.0 FUNCT@5.0V:ATOM29 2160.0 FUNCT@5.0V:ATOM30 2166.0 FUNCT@5.0V:ATOM31A 1798.0 FUNCT@5.0V:ATOM31B 1985.0 FUNCT@5.0V:ATOM32 1794.0 FUNCT@5.0V:ATOM33 2153.0 FUNCT@5.0V:ATOM35 2298.0 FUNCT@5.0V:ATOM36 2055.0 FUNCT@5.0V:ATOM37A 3158.0 FUNCT@5.0V:ATOM37B 3151.0 FUNCT@5.0V:ATOM37C 3134.0 FUNCT@5.0V:ATOM37D 3102.0 FUNCT@5.0V:ATOM37E 3093.0 FUNCT@5.0V:ATOM39 2064.0 FUNCT@5.0V:ATOM41 2590.0 FUNCT@5.0V:ATOM41A 2602.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3987.0 FUNCT@5.0V:ATOM45C_40 3987.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3667.0 FUNCT@5.0V:ATOM48C_40 3987.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3987.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1243.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:607 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0103 chi2 = 0.9753 VTN P-side: a = 0.0103 b(slope) = 0.0063 chi2 = 0.6973 CAL_IN N-side: a = 2.4320 b(slope) = 0.0083 chi2 = 0.6258 CAL_IN P-side: a = 2.4322 b(slope) = 0.0083 chi2 = 0.6322 VTP N-side(average) = 0.6726 V CAL_BASE = 2.4341 V VTP P-side(average) = 0.4148 V CAL_VREF = 2.9692 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:707 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0104 chi2 = 2.3837 VTN P-side: a = 0.0102 b(slope) = 0.0063 chi2 = 0.4900 CAL_IN N-side: a = 2.4462 b(slope) = 0.0082 chi2 = 0.9258 CAL_IN P-side: a = 2.4455 b(slope) = 0.0082 chi2 = 3.5615 VTP N-side(average) = 0.6745 V CAL_BASE = 2.4468 V VTP P-side(average) = 0.4173 V CAL_VREF = 2.9727 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:807 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0104 chi2 = 0.5708 VTN P-side: a = 0.0100 b(slope) = 0.0064 chi2 = 0.6091 CAL_IN N-side: a = 2.4522 b(slope) = 0.0082 chi2 = 1.5605 CAL_IN P-side: a = 2.4518 b(slope) = 0.0082 chi2 = 4.7900 VTP N-side(average) = 0.6798 V CAL_BASE = 2.4504 V VTP P-side(average) = 0.4231 V CAL_VREF = 2.9727 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:907 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0105 chi2 = 1.2755 VTN P-side: a = 0.0099 b(slope) = 0.0065 chi2 = 0.3268 CAL_IN N-side: a = 2.4443 b(slope) = 0.0082 chi2 = 0.8434 CAL_IN P-side: a = 2.4444 b(slope) = 0.0081 chi2 = 0.5535 VTP N-side(average) = 0.6835 V CAL_BASE = 2.4465 V VTP P-side(average) = 0.4259 V CAL_VREF = 2.9685 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:908 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0097 b(slope) = 0.0106 chi2 = 1.5668 VTN P-side: a = 0.0066 b(slope) = 0.0064 chi2 = 99.0000 CAL_IN N-side: a = 2.4790 b(slope) = 0.0080 chi2 = 1.2218 CAL_IN P-side: a = 2.4776 b(slope) = 0.0080 chi2 = 99.0000 VTP N-side(average) = 0.6904 V CAL_BASE = 2.4844 V VTP P-side(average) = 0.4288 V CAL_VREF = 3.0000 V FUNCT. DIGITAL TEST = 2 error detected in test: FUNCT@5.0V:ATOM36 3383.0 FUNCT@5.0V:ATOM37D 2604.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5081.0 FUNCT@5.0V:ATOM45C_40 5081.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 5081.0 FUNCT@5.0V:ATOM48C_40 5081.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5081.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:808 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0093 b(slope) = 0.0105 chi2 = 2.1904 VTN P-side: a = 0.0099 b(slope) = 0.0065 chi2 = 1.2216 CAL_IN N-side: a = 2.4363 b(slope) = 0.0129 chi2 = 99.0000 CAL_IN P-side: a = 2.4515 b(slope) = 0.0113 chi2 = 99.0000 VTP N-side(average) = 0.6848 V CAL_BASE = 2.4458 V VTP P-side(average) = 0.4252 V CAL_VREF = 2.9722 V FUNCT. DIGITAL TEST = 2 error detected in test: FUNCT@5.0V:ATOM19F 8953.0 FUNCT@5.0V:ATOM19FHF 8953.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:708 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0105 chi2 = 1.2480 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.4848 CAL_IN N-side: a = 2.4588 b(slope) = 0.0082 chi2 = 0.8832 CAL_IN P-side: a = 2.4585 b(slope) = 0.0082 chi2 = 0.9657 VTP N-side(average) = 0.6806 V CAL_BASE = 2.4627 V VTP P-side(average) = 0.4207 V CAL_VREF = 2.9863 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:608 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0104 chi2 = 0.9951 VTN P-side: a = 0.0106 b(slope) = 0.0063 chi2 = 0.5707 CAL_IN N-side: a = 2.4815 b(slope) = 0.0080 chi2 = 0.4254 CAL_IN P-side: a = 2.4812 b(slope) = 0.0080 chi2 = 0.4881 VTP N-side(average) = 0.6756 V CAL_BASE = 2.4846 V VTP P-side(average) = 0.4184 V CAL_VREF = 2.9995 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 3 error detected in test: TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:508 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0104 chi2 = 0.5779 VTN P-side: a = 0.0102 b(slope) = 0.0063 chi2 = 0.4280 CAL_IN N-side: a = 2.5097 b(slope) = 0.0079 chi2 = 0.6464 CAL_IN P-side: a = 2.5100 b(slope) = 0.0079 chi2 = 0.4529 VTP N-side(average) = 0.6740 V CAL_BASE = 2.5139 V VTP P-side(average) = 0.4162 V CAL_VREF = 3.0205 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:408 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0105 chi2 = 1.0763 VTN P-side: a = 0.0100 b(slope) = 0.0064 chi2 = 0.6310 CAL_IN N-side: a = 2.4346 b(slope) = 0.0085 chi2 = 1.3661 CAL_IN P-side: a = 2.4349 b(slope) = 0.0085 chi2 = 0.8271 VTP N-side(average) = 0.6829 V CAL_BASE = 2.4360 V VTP P-side(average) = 0.4240 V CAL_VREF = 2.9780 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:308 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0104 chi2 = 0.7102 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.6441 CAL_IN N-side: a = 2.4357 b(slope) = 0.0084 chi2 = 1.2284 CAL_IN P-side: a = 2.4361 b(slope) = 0.0084 chi2 = 0.7291 VTP N-side(average) = 0.6797 V CAL_BASE = 2.4409 V VTP P-side(average) = 0.4201 V CAL_VREF = 2.9795 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:208 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0108 b(slope) = 0.0103 chi2 = 99.0000 VTN P-side: a = 0.0109 b(slope) = 0.0064 chi2 = 0.6259 CAL_IN N-side: a = 2.4362 b(slope) = 0.0084 chi2 = 99.0000 CAL_IN P-side: a = 2.4364 b(slope) = 0.0085 chi2 = 0.4728 VTP N-side(average) = 0.6820 V CAL_BASE = 2.4414 V VTP P-side(average) = 0.4202 V CAL_VREF = 2.9832 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:108 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0116 b(slope) = 0.0104 chi2 = 1.0025 VTN P-side: a = 0.0115 b(slope) = 0.0064 chi2 = 0.7069 CAL_IN N-side: a = 2.4871 b(slope) = 0.0081 chi2 = 0.9573 CAL_IN P-side: a = 2.4871 b(slope) = 0.0081 chi2 = 1.7929 VTP N-side(average) = 0.6815 V CAL_BASE = 2.4893 V VTP P-side(average) = 0.4221 V CAL_VREF = 3.0078 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5951.0 FUNCT@5.0V:ATOM45C_40 5951.0 FUNCT@5.0V:ATOM46C_40 3667.0 FUNCT@5.0V:ATOM47C_40 5951.0 FUNCT@5.0V:ATOM48C_40 5951.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5951.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:209 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0218 b(slope) = 0.0102 chi2 = 99.0000 VTN P-side: a = 0.0102 b(slope) = 0.0064 chi2 = 0.2431 CAL_IN N-side: a = 2.4729 b(slope) = 0.0079 chi2 = 99.0000 CAL_IN P-side: a = 2.4576 b(slope) = 0.0083 chi2 = 0.5276 VTP N-side(average) = 0.6790 V CAL_BASE = 2.4592 V VTP P-side(average) = 0.4197 V CAL_VREF = 2.9890 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:309 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0105 chi2 = 0.4518 VTN P-side: a = 0.0104 b(slope) = 0.0064 chi2 = 0.3683 CAL_IN N-side: a = 2.4111 b(slope) = 0.0086 chi2 = 0.6872 CAL_IN P-side: a = 2.4112 b(slope) = 0.0086 chi2 = 0.3494 VTP N-side(average) = 0.6827 V CAL_BASE = 2.4121 V VTP P-side(average) = 0.4232 V CAL_VREF = 2.9636 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 1 error detected in test: TMIN@5.2V:A10_12_50D 0.0 ------- CHIP ID:409 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0105 chi2 = 1.4471 VTN P-side: a = 0.0105 b(slope) = 0.0064 chi2 = 0.6486 CAL_IN N-side: a = 2.4201 b(slope) = 0.0085 chi2 = 0.8986 CAL_IN P-side: a = 2.4203 b(slope) = 0.0085 chi2 = 0.6443 VTP N-side(average) = 0.6851 V CAL_BASE = 2.4202 V VTP P-side(average) = 0.4239 V CAL_VREF = 2.9668 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:509 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0106 chi2 = 0.7352 VTN P-side: a = 0.0102 b(slope) = 0.0065 chi2 = 0.2425 CAL_IN N-side: a = 2.4512 b(slope) = 0.0084 chi2 = 0.8454 CAL_IN P-side: a = 2.4514 b(slope) = 0.0084 chi2 = 0.6232 VTP N-side(average) = 0.6883 V CAL_BASE = 2.4519 V VTP P-side(average) = 0.4258 V CAL_VREF = 2.9888 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:609 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD0A 0.1424 IDDSB:VDD0B 0.1424 IDDSB:VDD0C 0.1424 IDDSB:VDD0D 0.1424 IDDOP0:AVDD 0.1190 DACS TEST = 0 VTN N-side: a = 0.0168 b(slope) = 0.0101 chi2 = 0.5639 VTN P-side: a = 0.0167 b(slope) = 0.0061 chi2 = 0.4622 CAL_IN N-side: a = 2.4223 b(slope) = 0.0080 chi2 = 0.8168 CAL_IN P-side: a = 2.4228 b(slope) = 0.0079 chi2 = 0.3908 VTP N-side(average) = 0.6646 V CAL_BASE = 2.4260 V VTP P-side(average) = 0.4114 V CAL_VREF = 2.9353 V FUNCT. DIGITAL TEST = 10 error detected in test: FUNCT@5.0V:ATOM13C 2110.0 FUNCT@5.0V:ATOM17 5014.0 FUNCT@5.0V:ATOM18HF 10227.0 FUNCT@5.0V:ATOM19 3642.0 FUNCT@5.0V:ATOM19E 3604.0 FUNCT@5.0V:ATOM25 2080.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM36 2044.0 FUNCT@5.0V:ATOM37E 1150.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1408.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:709 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0105 chi2 = 0.7732 VTN P-side: a = 0.0107 b(slope) = 0.0065 chi2 = 0.4929 CAL_IN N-side: a = 2.4397 b(slope) = 0.0083 chi2 = 0.9947 CAL_IN P-side: a = 2.4396 b(slope) = 0.0083 chi2 = 1.3481 VTP N-side(average) = 0.6817 V CAL_BASE = 2.4380 V VTP P-side(average) = 0.4258 V CAL_VREF = 2.9670 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:809 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0096 b(slope) = 0.0106 chi2 = 0.8474 VTN P-side: a = 0.0098 b(slope) = 0.0066 chi2 = 0.7095 CAL_IN N-side: a = 2.4548 b(slope) = 0.0083 chi2 = 85.7814 CAL_IN P-side: a = 2.4596 b(slope) = 0.0083 chi2 = 72.2161 VTP N-side(average) = 0.6881 V CAL_BASE = 2.4590 V VTP P-side(average) = 0.4307 V CAL_VREF = 2.9748 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3859.0 FUNCT@5.0V:ATOM45C_40 3859.0 FUNCT@5.0V:ATOM46C_40 3859.0 FUNCT@5.0V:ATOM47C_40 3859.0 FUNCT@5.0V:ATOM48C_40 3859.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3859.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:810 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0106 chi2 = 1.0268 VTN P-side: a = 0.0105 b(slope) = 0.0065 chi2 = 0.5021 CAL_IN N-side: a = 2.4545 b(slope) = 0.0082 chi2 = 0.7040 CAL_IN P-side: a = 2.4544 b(slope) = 0.0082 chi2 = 0.5634 VTP N-side(average) = 0.6890 V CAL_BASE = 2.4585 V VTP P-side(average) = 0.4287 V CAL_VREF = 2.9829 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:710 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0104 chi2 = 1.8879 VTN P-side: a = 0.0100 b(slope) = 0.0064 chi2 = 0.5209 CAL_IN N-side: a = 2.4804 b(slope) = 0.0080 chi2 = 0.7030 CAL_IN P-side: a = 2.4804 b(slope) = 0.0080 chi2 = 0.4284 VTP N-side(average) = 0.6791 V CAL_BASE = 2.4853 V VTP P-side(average) = 0.4194 V CAL_VREF = 2.9985 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:610 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0105 chi2 = 0.7594 VTN P-side: a = 0.0107 b(slope) = 0.0064 chi2 = 0.4802 CAL_IN N-side: a = 2.4873 b(slope) = 0.0081 chi2 = 0.6178 CAL_IN P-side: a = 2.4873 b(slope) = 0.0080 chi2 = 0.1809 VTP N-side(average) = 0.6818 V CAL_BASE = 2.4917 V VTP P-side(average) = 0.4187 V CAL_VREF = 3.0081 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:510 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDSB:VDD0A 0.1158 DACS TEST = 0 VTN N-side: a = 0.0107 b(slope) = 0.0105 chi2 = 1.3706 VTN P-side: a = 0.0109 b(slope) = 0.0064 chi2 = 0.5062 CAL_IN N-side: a = 2.4376 b(slope) = 0.0084 chi2 = 0.7421 CAL_IN P-side: a = 2.4380 b(slope) = 0.0084 chi2 = 0.6917 VTP N-side(average) = 0.6835 V CAL_BASE = 2.4412 V VTP P-side(average) = 0.4228 V CAL_VREF = 2.9807 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4471.0 FUNCT@5.0V:ATOM45C_40 3667.0 FUNCT@5.0V:ATOM46C_40 4471.0 FUNCT@5.0V:ATOM47C_40 4471.0 FUNCT@5.0V:ATOM48C_40 4471.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4471.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:410 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0327 b(slope) = 0.0100 chi2 = 99.0000 VTN P-side: a = 0.0100 b(slope) = 0.0065 chi2 = 0.6019 CAL_IN N-side: a = 2.5072 b(slope) = 0.0075 chi2 = 99.0000 CAL_IN P-side: a = 2.4778 b(slope) = 0.0081 chi2 = 0.8002 VTP N-side(average) = 0.6876 V CAL_BASE = 2.4792 V VTP P-side(average) = 0.4250 V CAL_VREF = 3.0012 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1239.0 FUNCT@5.0V:ATOM13B 1311.0 FUNCT@5.0V:ATOM13C 1311.0 FUNCT@5.0V:ATOM15 1283.0 FUNCT@5.0V:ATOM17 3595.0 FUNCT@5.0V:ATOM18 3611.0 FUNCT@5.0V:ATOM18HF 3611.0 FUNCT@5.0V:ATOM19 3547.0 FUNCT@5.0V:ATOM19D 3562.0 FUNCT@5.0V:ATOM19E 2789.0 FUNCT@5.0V:ATOM19F 6662.0 FUNCT@5.0V:ATOM19FHF 6662.0 FUNCT@5.0V:ATOM20 1255.0 FUNCT@5.0V:ATOM21 1231.0 FUNCT@5.0V:ATOM22 1219.0 FUNCT@5.0V:ATOM25 1237.0 FUNCT@5.0V:ATOM25HF 1237.0 FUNCT@5.0V:ATOM26A 1216.0 FUNCT@5.0V:ATOM26B 2025.0 FUNCT@5.0V:ATOM28 1353.0 FUNCT@5.0V:ATOM29 1353.0 FUNCT@5.0V:ATOM30 1353.0 FUNCT@5.0V:ATOM31A 987.0 FUNCT@5.0V:ATOM31B 1176.0 FUNCT@5.0V:ATOM32 987.0 FUNCT@5.0V:ATOM33 1353.0 FUNCT@5.0V:ATOM35 1487.0 FUNCT@5.0V:ATOM36 1243.0 FUNCT@5.0V:ATOM37A 1575.0 FUNCT@5.0V:ATOM37B 1567.0 FUNCT@5.0V:ATOM37C 1551.0 FUNCT@5.0V:ATOM37D 1519.0 FUNCT@5.0V:ATOM37E 1510.0 FUNCT@5.0V:ATOM39 1264.0 FUNCT@5.0V:ATOM41 1790.0 FUNCT@5.0V:ATOM41A 1790.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3763.0 FUNCT@5.0V:ATOM45C_40 3763.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3763.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3763.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:310 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0104 chi2 = 1.3964 VTN P-side: a = 0.0101 b(slope) = 0.0063 chi2 = 0.5650 CAL_IN N-side: a = 2.4544 b(slope) = 0.0081 chi2 = 0.8880 CAL_IN P-side: a = 2.4553 b(slope) = 0.0081 chi2 = 0.6943 VTP N-side(average) = 0.6802 V CAL_BASE = 2.4580 V VTP P-side(average) = 0.4169 V CAL_VREF = 2.9773 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:210 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0105 chi2 = 0.7832 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.5801 CAL_IN N-side: a = 2.4653 b(slope) = 0.0082 chi2 = 0.6707 CAL_IN P-side: a = 2.4655 b(slope) = 0.0082 chi2 = 0.5684 VTP N-side(average) = 0.6815 V CAL_BASE = 2.4688 V VTP P-side(average) = 0.4189 V CAL_VREF = 2.9968 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1131.0 FUNCT@5.0V:ATOM13C 1131.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM23 981.0 FUNCT@5.0V:ATOM24 1081.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1222.0 FUNCT@5.0V:ATOM37B 1210.0 FUNCT@5.0V:ATOM37C 1190.0 FUNCT@5.0V:ATOM37D 1158.0 FUNCT@5.0V:ATOM37E 1152.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3682.0 FUNCT@5.0V:ATOM45C_40 3682.0 FUNCT@5.0V:ATOM46C_40 3682.0 FUNCT@5.0V:ATOM47C_40 3682.0 FUNCT@5.0V:ATOM48C_40 3682.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3682.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1250.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1408.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:211 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0400 b(slope) = 0.0098 chi2 = 99.0000 VTN P-side: a = 0.0104 b(slope) = 0.0064 chi2 = 0.3489 CAL_IN N-side: a = 2.5069 b(slope) = 0.0074 chi2 = 99.0000 CAL_IN P-side: a = 2.4694 b(slope) = 0.0083 chi2 = 1.4820 VTP N-side(average) = 0.6839 V CAL_BASE = 2.4707 V VTP P-side(average) = 0.4201 V CAL_VREF = 3.0002 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:311 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0097 b(slope) = 0.0104 chi2 = 0.9623 VTN P-side: a = 0.0100 b(slope) = 0.0064 chi2 = 0.4341 CAL_IN N-side: a = 3.0939 b(slope) = 0.0000 chi2 = 2.3797 CAL_IN P-side: a = 3.0941 b(slope) = 0.0000 chi2 = 1.5013 VTP N-side(average) = 0.6773 V CAL_BASE = 2.4883 V VTP P-side(average) = 0.4178 V CAL_VREF = 3.0073 V FUNCT. DIGITAL TEST = 2 error detected in test: FUNCT@5.0V:ATOM13B 1674.0 FUNCT@5.0V:ATOM13C 1674.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:411 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0104 chi2 = 1.6100 VTN P-side: a = 0.0103 b(slope) = 0.0063 chi2 = 0.5501 CAL_IN N-side: a = 2.4565 b(slope) = 0.0083 chi2 = 0.6911 CAL_IN P-side: a = 2.4564 b(slope) = 0.0083 chi2 = 0.3085 VTP N-side(average) = 0.6775 V CAL_BASE = 2.4595 V VTP P-side(average) = 0.4164 V CAL_VREF = 2.9915 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:511 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0436 b(slope) = 0.0098 chi2 = 99.0000 VTN P-side: a = 0.0103 b(slope) = 0.0065 chi2 = 0.5777 CAL_IN N-side: a = 2.4885 b(slope) = 0.0074 chi2 = 99.0000 CAL_IN P-side: a = 2.4448 b(slope) = 0.0084 chi2 = 2.0991 VTP N-side(average) = 0.6890 V CAL_BASE = 2.4470 V VTP P-side(average) = 0.4280 V CAL_VREF = 2.9856 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:611 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0107 chi2 = 0.6438 VTN P-side: a = 0.0107 b(slope) = 0.0065 chi2 = 0.5162 CAL_IN N-side: a = 2.4730 b(slope) = 0.0083 chi2 = 0.6345 CAL_IN P-side: a = 2.4729 b(slope) = 0.0083 chi2 = 0.6019 VTP N-side(average) = 0.6969 V CAL_BASE = 2.4771 V VTP P-side(average) = 0.4305 V CAL_VREF = 3.0078 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM36 2983.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:711 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0114 b(slope) = 0.0105 chi2 = 0.9077 VTN P-side: a = 0.0109 b(slope) = 0.0065 chi2 = 0.4029 CAL_IN N-side: a = 2.4695 b(slope) = 0.0082 chi2 = 0.8765 CAL_IN P-side: a = 2.4696 b(slope) = 0.0082 chi2 = 0.5413 VTP N-side(average) = 0.6848 V CAL_BASE = 2.4734 V VTP P-side(average) = 0.4265 V CAL_VREF = 2.9985 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:811 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0228 b(slope) = 0.0104 chi2 = 99.0000 VTN P-side: a = 0.0108 b(slope) = 0.0065 chi2 = 0.3629 CAL_IN N-side: a = 2.4779 b(slope) = 0.0078 chi2 = 99.0000 CAL_IN P-side: a = 2.4630 b(slope) = 0.0081 chi2 = 0.5142 VTP N-side(average) = 0.6956 V CAL_BASE = 2.4685 V VTP P-side(average) = 0.4310 V CAL_VREF = 2.9888 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1159.0 FUNCT@5.0V:ATOM13B 1214.0 FUNCT@5.0V:ATOM13C 1214.0 FUNCT@5.0V:ATOM15 1203.0 FUNCT@5.0V:ATOM17 3515.0 FUNCT@5.0V:ATOM18 3531.0 FUNCT@5.0V:ATOM18HF 3531.0 FUNCT@5.0V:ATOM19 3467.0 FUNCT@5.0V:ATOM19D 3482.0 FUNCT@5.0V:ATOM19E 2709.0 FUNCT@5.0V:ATOM19F 6582.0 FUNCT@5.0V:ATOM19FHF 6582.0 FUNCT@5.0V:ATOM20 1175.0 FUNCT@5.0V:ATOM21 1151.0 FUNCT@5.0V:ATOM22 1139.0 FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM24 1074.0 FUNCT@5.0V:ATOM25 1157.0 FUNCT@5.0V:ATOM25HF 1157.0 FUNCT@5.0V:ATOM26A 1136.0 FUNCT@5.0V:ATOM26B 1945.0 FUNCT@5.0V:ATOM28 1273.0 FUNCT@5.0V:ATOM29 1273.0 FUNCT@5.0V:ATOM30 1273.0 FUNCT@5.0V:ATOM31A 907.0 FUNCT@5.0V:ATOM31B 1096.0 FUNCT@5.0V:ATOM32 907.0 FUNCT@5.0V:ATOM33 1273.0 FUNCT@5.0V:ATOM35 1407.0 FUNCT@5.0V:ATOM36 1163.0 FUNCT@5.0V:ATOM37A 1398.0 FUNCT@5.0V:ATOM37B 1390.0 FUNCT@5.0V:ATOM37C 1374.0 FUNCT@5.0V:ATOM37D 1342.0 FUNCT@5.0V:ATOM37E 1333.0 FUNCT@5.0V:ATOM39 1184.0 FUNCT@5.0V:ATOM41 1710.0 FUNCT@5.0V:ATOM41A 1710.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3713.0 FUNCT@5.0V:ATOM45C_40 3713.0 FUNCT@5.0V:ATOM46C_40 3665.0 FUNCT@5.0V:ATOM47C_40 3665.0 FUNCT@5.0V:ATOM48C_40 3713.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3713.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1243.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:812 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0108 chi2 = 1.2796 VTN P-side: a = 0.0102 b(slope) = 0.0066 chi2 = 0.3265 CAL_IN N-side: a = 2.4736 b(slope) = 0.0082 chi2 = 0.9144 CAL_IN P-side: a = 2.4737 b(slope) = 0.0081 chi2 = 0.4952 VTP N-side(average) = 0.7005 V CAL_BASE = 2.4790 V VTP P-side(average) = 0.4343 V CAL_VREF = 3.0017 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:712 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0108 chi2 = 0.7078 VTN P-side: a = 0.0105 b(slope) = 0.0067 chi2 = 0.5708 CAL_IN N-side: a = 2.4640 b(slope) = 0.0083 chi2 = 1.1040 CAL_IN P-side: a = 2.4644 b(slope) = 0.0083 chi2 = 0.9861 VTP N-side(average) = 0.7021 V CAL_BASE = 2.4712 V VTP P-side(average) = 0.4382 V CAL_VREF = 3.0005 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:612 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0212 b(slope) = 0.0103 chi2 = 99.0000 VTN P-side: a = 0.0100 b(slope) = 0.0065 chi2 = 0.4105 CAL_IN N-side: a = 2.4814 b(slope) = 0.0079 chi2 = 99.0000 CAL_IN P-side: a = 2.4672 b(slope) = 0.0082 chi2 = 0.7738 VTP N-side(average) = 0.6887 V CAL_BASE = 2.4717 V VTP P-side(average) = 0.4274 V CAL_VREF = 3.0010 V FUNCT. DIGITAL TEST = 2 error detected in test: FUNCT@5.0V:ATOM18 12196.0 FUNCT@5.0V:ATOM18HF 12196.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:512 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0108 chi2 = 1.1298 VTN P-side: a = 0.0101 b(slope) = 0.0066 chi2 = 0.4722 CAL_IN N-side: a = 2.4427 b(slope) = 0.0085 chi2 = 0.9398 CAL_IN P-side: a = 2.4431 b(slope) = 0.0085 chi2 = 1.0473 VTP N-side(average) = 0.7007 V CAL_BASE = 2.4482 V VTP P-side(average) = 0.4334 V CAL_VREF = 2.9915 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3923.0 FUNCT@5.0V:ATOM45C_40 3923.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3923.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3923.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:412 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0106 chi2 = 0.7410 VTN P-side: a = 0.0107 b(slope) = 0.0065 chi2 = 0.3841 CAL_IN N-side: a = 2.4804 b(slope) = 0.0081 chi2 = 0.7248 CAL_IN P-side: a = 2.4804 b(slope) = 0.0081 chi2 = 0.3936 VTP N-side(average) = 0.6918 V CAL_BASE = 2.4849 V VTP P-side(average) = 0.4274 V CAL_VREF = 3.0059 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM37D 1434.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:312 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0333 b(slope) = 0.0100 chi2 = 99.0000 VTN P-side: a = 0.0109 b(slope) = 0.0064 chi2 = 0.5895 CAL_IN N-side: a = 2.4985 b(slope) = 0.0075 chi2 = 99.0000 CAL_IN P-side: a = 2.4694 b(slope) = 0.0082 chi2 = 0.9575 VTP N-side(average) = 0.6835 V CAL_BASE = 2.4717 V VTP P-side(average) = 0.4187 V CAL_VREF = 2.9988 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:212 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0105 chi2 = 0.8006 VTN P-side: a = 0.0104 b(slope) = 0.0064 chi2 = 0.4434 CAL_IN N-side: a = 2.4815 b(slope) = 0.0082 chi2 = 0.8506 CAL_IN P-side: a = 2.4812 b(slope) = 0.0082 chi2 = 0.6834 VTP N-side(average) = 0.6855 V CAL_BASE = 2.4851 V VTP P-side(average) = 0.4223 V CAL_VREF = 3.0132 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:413 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0105 chi2 = 2.0542 VTN P-side: a = 0.0099 b(slope) = 0.0065 chi2 = 0.6908 CAL_IN N-side: a = 2.4692 b(slope) = 0.0083 chi2 = 0.6468 CAL_IN P-side: a = 2.4695 b(slope) = 0.0083 chi2 = 0.4803 VTP N-side(average) = 0.6870 V CAL_BASE = 2.4722 V VTP P-side(average) = 0.4264 V CAL_VREF = 3.0049 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4327.0 FUNCT@5.0V:ATOM45C_40 4327.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 4327.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4327.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:513 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0105 chi2 = 1.2106 VTN P-side: a = 0.0104 b(slope) = 0.0065 chi2 = 0.2792 CAL_IN N-side: a = 2.4756 b(slope) = 0.0083 chi2 = 0.5788 CAL_IN P-side: a = 2.4758 b(slope) = 0.0083 chi2 = 0.4448 VTP N-side(average) = 0.6865 V CAL_BASE = 2.4800 V VTP P-side(average) = 0.4261 V CAL_VREF = 3.0112 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:613 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0106 chi2 = 0.8388 VTN P-side: a = 0.0101 b(slope) = 0.0065 chi2 = 0.3612 CAL_IN N-side: a = 2.4813 b(slope) = 0.0082 chi2 = 3.6103 CAL_IN P-side: a = 2.4846 b(slope) = 0.0082 chi2 = 2.5320 VTP N-side(average) = 0.6919 V CAL_BASE = 2.4878 V VTP P-side(average) = 0.4280 V CAL_VREF = 3.0107 V FUNCT. DIGITAL TEST = 31 error detected in test: FUNCT@5.0V:ATOM13A 1939.0 FUNCT@5.0V:ATOM15 1983.0 FUNCT@5.0V:ATOM17 4295.0 FUNCT@5.0V:ATOM18 4311.0 FUNCT@5.0V:ATOM18HF 4311.0 FUNCT@5.0V:ATOM19 5331.0 FUNCT@5.0V:ATOM19E 3488.0 FUNCT@5.0V:ATOM19F 7361.0 FUNCT@5.0V:ATOM19FHF 7361.0 FUNCT@5.0V:ATOM20 1954.0 FUNCT@5.0V:ATOM21 1930.0 FUNCT@5.0V:ATOM22 1918.0 FUNCT@5.0V:ATOM25 1936.0 FUNCT@5.0V:ATOM25HF 1936.0 FUNCT@5.0V:ATOM26A 1915.0 FUNCT@5.0V:ATOM26B 2724.0 FUNCT@5.0V:ATOM28 2052.0 FUNCT@5.0V:ATOM29 2052.0 FUNCT@5.0V:ATOM30 2054.0 FUNCT@5.0V:ATOM31A 1686.0 FUNCT@5.0V:ATOM31B 1875.0 FUNCT@5.0V:ATOM32 1688.0 FUNCT@5.0V:ATOM35 2186.0 FUNCT@5.0V:ATOM36 1943.0 FUNCT@5.0V:ATOM37B 2954.0 FUNCT@5.0V:ATOM37C 2938.0 FUNCT@5.0V:ATOM37D 2906.0 FUNCT@5.0V:ATOM37E 2897.0 FUNCT@5.0V:ATOM39 1965.0 FUNCT@5.0V:ATOM41 2490.0 FUNCT@5.0V:ATOM41A 2490.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:614 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0110 chi2 = 1.2290 VTN P-side: a = 0.0097 b(slope) = 0.0067 chi2 = 0.4920 CAL_IN N-side: a = 2.4846 b(slope) = 0.0084 chi2 = 2.4271 CAL_IN P-side: a = 2.4851 b(slope) = 0.0084 chi2 = 1.2154 VTP N-side(average) = 0.7168 V CAL_BASE = 2.4885 V VTP P-side(average) = 0.4414 V CAL_VREF = 3.0276 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:514 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0109 chi2 = 2.2651 VTN P-side: a = 0.0101 b(slope) = 0.0067 chi2 = 0.7568 CAL_IN N-side: a = 2.4865 b(slope) = 0.0084 chi2 = 1.2916 CAL_IN P-side: a = 2.4859 b(slope) = 0.0084 chi2 = 7.3320 VTP N-side(average) = 0.7080 V CAL_BASE = 2.4900 V VTP P-side(average) = 0.4385 V CAL_VREF = 3.0283 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:414 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0109 b(slope) = 0.0109 chi2 = 0.5659 VTN P-side: a = 0.0109 b(slope) = 0.0066 chi2 = 0.5678 CAL_IN N-side: a = 2.4680 b(slope) = 0.0085 chi2 = 0.6298 CAL_IN P-side: a = 2.4684 b(slope) = 0.0085 chi2 = 0.5164 VTP N-side(average) = 0.7073 V CAL_BASE = 2.4734 V VTP P-side(average) = 0.4372 V CAL_VREF = 3.0190 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 +++++++++ WAFER DATA+++++++++++++++++++++++++++ CLASSES: A-->Good, B-->Probably Good, C-->Bad A B C ------------------------- 502 401 203 501 303 601 503 602 703 402 803 403 804 603 604 704 404 504 204 304 405 205 705 305 606 505 406 605 306 805 207 806 307 706 407 506 607 206 707 107 807 507 907 908 708 808 508 608 408 208 308 108 409 209 509 309 709 609 810 809 710 510 610 410 310 210 411 211 711 311 812 511 712 611 212 811 513 612 614 512 514 412 414 312 413 613 ---------------------------- 42 0 44 NUMBER OF CHIPS TESTED = 86 NUMBER OF CLASS A CHIPS = 42 NUMBER OF CLASS B CHIPS = 0 NUMBER OF CLASS C CHIPS = 44 YIELD = 48.84 %