------- CHIP ID:401 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0109 chi2 = 1.8845 VTN P-side: a = 0.0094 b(slope) = 0.0066 chi2 = 0.4316 CAL_IN N-side: a = 2.4732 b(slope) = 0.0088 chi2 = 1.6707 CAL_IN P-side: a = 2.4726 b(slope) = 0.0088 chi2 = 2.6245 VTP N-side(average) = 0.7075 V CAL_BASE = 2.4744 V VTP P-side(average) = 0.4332 V CAL_VREF = 3.0364 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1131.0 FUNCT@5.0V:ATOM13C 1131.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM23 984.0 FUNCT@5.0V:ATOM24 1084.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1248.0 FUNCT@5.0V:ATOM37B 1206.0 FUNCT@5.0V:ATOM37C 1191.0 FUNCT@5.0V:ATOM37D 1160.0 FUNCT@5.0V:ATOM37E 1152.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3681.0 FUNCT@5.0V:ATOM45C_40 3681.0 FUNCT@5.0V:ATOM46C_40 3681.0 FUNCT@5.0V:ATOM47C_40 3681.0 FUNCT@5.0V:ATOM48C_40 3681.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3681.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1255.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1411.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:501 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0087 b(slope) = 0.0111 chi2 = 2.0839 VTN P-side: a = 0.0091 b(slope) = 0.0067 chi2 = 0.6870 CAL_IN N-side: a = 2.4723 b(slope) = 0.0088 chi2 = 1.4310 CAL_IN P-side: a = 2.4728 b(slope) = 0.0088 chi2 = 0.6574 VTP N-side(average) = 0.7211 V CAL_BASE = 2.4753 V VTP P-side(average) = 0.4416 V CAL_VREF = 3.0359 V FUNCT. DIGITAL TEST = 39 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM27 1023.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1160.0 FUNCT@5.0V:ATOM37E 1152.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 0 TMIN TEST = 1 error detected in test: TMIN@5.2V:A10_12_50D 0.0 ------- CHIP ID:601 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0090 b(slope) = 0.0109 chi2 = 0.8054 VTN P-side: a = 0.0090 b(slope) = 0.0066 chi2 = 0.4393 CAL_IN N-side: a = 2.4870 b(slope) = 0.0086 chi2 = 1.9435 CAL_IN P-side: a = 2.4869 b(slope) = 0.0086 chi2 = 1.4609 VTP N-side(average) = 0.7085 V CAL_BASE = 2.4878 V VTP P-side(average) = 0.4334 V CAL_VREF = 3.0391 V FUNCT. DIGITAL TEST = 39 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1128.0 FUNCT@5.0V:ATOM13C 1119.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1051.0 FUNCT@5.0V:ATOM23 976.0 FUNCT@5.0V:ATOM24 1082.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1072.0 FUNCT@5.0V:ATOM26A 1047.0 FUNCT@5.0V:ATOM26B 1861.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 822.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1216.0 FUNCT@5.0V:ATOM37B 1199.0 FUNCT@5.0V:ATOM37C 1190.0 FUNCT@5.0V:ATOM37D 1158.0 FUNCT@5.0V:ATOM37E 1150.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3666.0 FUNCT@5.0V:ATOM45C_40 3666.0 FUNCT@5.0V:ATOM46C_40 3666.0 FUNCT@5.0V:ATOM47C_40 3666.0 FUNCT@5.0V:ATOM48C_40 3666.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3666.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1244.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:602 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0088 b(slope) = 0.0109 chi2 = 2.2077 VTN P-side: a = 0.0092 b(slope) = 0.0066 chi2 = 0.7104 CAL_IN N-side: a = 2.4938 b(slope) = 0.0086 chi2 = 0.5651 CAL_IN P-side: a = 2.4942 b(slope) = 0.0086 chi2 = 0.5648 VTP N-side(average) = 0.7084 V CAL_BASE = 2.4968 V VTP P-side(average) = 0.4326 V CAL_VREF = 3.0464 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:502 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0093 b(slope) = 0.0110 chi2 = 1.9351 VTN P-side: a = 0.0097 b(slope) = 0.0067 chi2 = 0.5723 CAL_IN N-side: a = 2.5688 b(slope) = 0.0021 chi2 = 99.0000 CAL_IN P-side: a = 2.5238 b(slope) = 0.0034 chi2 = 99.0000 VTP N-side(average) = 0.7117 V CAL_BASE = 2.5056 V VTP P-side(average) = 0.4394 V CAL_VREF = 3.0549 V FUNCT. DIGITAL TEST = 35 error detected in test: FUNCT@5.0V:ATOM13A 1095.0 FUNCT@5.0V:ATOM15 1139.0 FUNCT@5.0V:ATOM17 3451.0 FUNCT@5.0V:ATOM18 3467.0 FUNCT@5.0V:ATOM18HF 3467.0 FUNCT@5.0V:ATOM19 3403.0 FUNCT@5.0V:ATOM19D 3418.0 FUNCT@5.0V:ATOM19E 2645.0 FUNCT@5.0V:ATOM19F 6518.0 FUNCT@5.0V:ATOM19FHF 6518.0 FUNCT@5.0V:ATOM20 1111.0 FUNCT@5.0V:ATOM21 1087.0 FUNCT@5.0V:ATOM22 1075.0 FUNCT@5.0V:ATOM25 1093.0 FUNCT@5.0V:ATOM25HF 1093.0 FUNCT@5.0V:ATOM26A 1072.0 FUNCT@5.0V:ATOM26B 1881.0 FUNCT@5.0V:ATOM28 1209.0 FUNCT@5.0V:ATOM29 1209.0 FUNCT@5.0V:ATOM30 1209.0 FUNCT@5.0V:ATOM31A 843.0 FUNCT@5.0V:ATOM31B 1032.0 FUNCT@5.0V:ATOM32 843.0 FUNCT@5.0V:ATOM33 1209.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1343.0 FUNCT@5.0V:ATOM36 1099.0 FUNCT@5.0V:ATOM37A 1286.0 FUNCT@5.0V:ATOM37B 1278.0 FUNCT@5.0V:ATOM37C 1262.0 FUNCT@5.0V:ATOM37D 1230.0 FUNCT@5.0V:ATOM37E 1221.0 FUNCT@5.0V:ATOM39 1120.0 FUNCT@5.0V:ATOM41 1646.0 FUNCT@5.0V:ATOM41A 1646.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4295.0 FUNCT@5.0V:ATOM45C_40 4295.0 FUNCT@5.0V:ATOM46C_40 4295.0 FUNCT@5.0V:ATOM47C_40 3667.0 FUNCT@5.0V:ATOM48C_40 4295.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:402 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 2 VTN N-side: a = 0.0092 b(slope) = 0.0110 chi2 = 1.5011 VTN P-side: a = 0.0098 b(slope) = 0.0067 chi2 = 0.8890 CAL_IN N-side: a = 2.4522 b(slope) = 0.0089 chi2 = 1.7726 CAL_IN P-side: a = 2.4518 b(slope) = 0.0089 chi2 = 14.2362 VTP N-side(average) = 0.7114 V CAL_BASE = 2.4526 V VTP P-side(average) = 0.4382 V CAL_VREF = 3.0254 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5551.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 5551.0 FUNCT@5.0V:ATOM47C_40 5501.0 FUNCT@5.0V:ATOM48C_40 5551.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5551.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:203 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0107 chi2 = 0.6606 VTN P-side: a = 0.0102 b(slope) = 0.0065 chi2 = 0.6389 CAL_IN N-side: a = 2.5102 b(slope) = 0.0084 chi2 = 0.4714 CAL_IN P-side: a = 2.5104 b(slope) = 0.0084 chi2 = 0.3796 VTP N-side(average) = 0.6949 V CAL_BASE = 2.5098 V VTP P-side(average) = 0.4263 V CAL_VREF = 3.0452 V FUNCT. DIGITAL TEST = 4 error detected in test: FUNCT@5.0V:ATOM13B 1995.0 FUNCT@5.0V:ATOM13C 1995.0 FUNCT@5.0V:ATOM37B 2938.0 FUNCT@5.0V:ATOM37E 2881.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5903.0 FUNCT@5.0V:ATOM45C_40 4279.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 5903.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5903.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:303 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0108 chi2 = 1.3606 VTN P-side: a = 0.0103 b(slope) = 0.0066 chi2 = 0.2315 CAL_IN N-side: a = 2.4976 b(slope) = 0.0085 chi2 = 1.0678 CAL_IN P-side: a = 2.4974 b(slope) = 0.0085 chi2 = 2.0021 VTP N-side(average) = 0.7038 V CAL_BASE = 2.4993 V VTP P-side(average) = 0.4314 V CAL_VREF = 3.0425 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:403 --------------------------------------- CLASS=B -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 2 VTN N-side: a = 0.0102 b(slope) = 0.0109 chi2 = 1.5803 VTN P-side: a = 0.0101 b(slope) = 0.0066 chi2 = 0.6152 CAL_IN N-side: a = 2.4675 b(slope) = 0.0088 chi2 = 3.3162 CAL_IN P-side: a = 2.4685 b(slope) = 0.0089 chi2 = 13.0808 VTP N-side(average) = 0.7085 V CAL_BASE = 2.4697 V VTP P-side(average) = 0.4350 V CAL_VREF = 3.0361 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:503 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0109 chi2 = 2.4226 VTN P-side: a = 0.0098 b(slope) = 0.0066 chi2 = 0.8051 CAL_IN N-side: a = 2.5035 b(slope) = 0.0086 chi2 = 0.5242 CAL_IN P-side: a = 2.5032 b(slope) = 0.0086 chi2 = 1.7836 VTP N-side(average) = 0.7058 V CAL_BASE = 2.5054 V VTP P-side(average) = 0.4325 V CAL_VREF = 3.0588 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1687.0 FUNCT@5.0V:ATOM13B 1722.0 FUNCT@5.0V:ATOM13C 1722.0 FUNCT@5.0V:ATOM15 1731.0 FUNCT@5.0V:ATOM17 4043.0 FUNCT@5.0V:ATOM18 4059.0 FUNCT@5.0V:ATOM18HF 4059.0 FUNCT@5.0V:ATOM19 3995.0 FUNCT@5.0V:ATOM19D 4010.0 FUNCT@5.0V:ATOM19E 3237.0 FUNCT@5.0V:ATOM19F 7110.0 FUNCT@5.0V:ATOM19FHF 7110.0 FUNCT@5.0V:ATOM20 1703.0 FUNCT@5.0V:ATOM21 1679.0 FUNCT@5.0V:ATOM22 1667.0 FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM25 1685.0 FUNCT@5.0V:ATOM25HF 1685.0 FUNCT@5.0V:ATOM26A 1664.0 FUNCT@5.0V:ATOM26B 2473.0 FUNCT@5.0V:ATOM28 1801.0 FUNCT@5.0V:ATOM29 1801.0 FUNCT@5.0V:ATOM30 1801.0 FUNCT@5.0V:ATOM31A 1435.0 FUNCT@5.0V:ATOM31B 1624.0 FUNCT@5.0V:ATOM32 1435.0 FUNCT@5.0V:ATOM33 1801.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1934.0 FUNCT@5.0V:ATOM36 1691.0 FUNCT@5.0V:ATOM37A 2470.0 FUNCT@5.0V:ATOM37B 2462.0 FUNCT@5.0V:ATOM37C 2446.0 FUNCT@5.0V:ATOM37D 2414.0 FUNCT@5.0V:ATOM37E 2337.0 FUNCT@5.0V:ATOM39 1712.0 FUNCT@5.0V:ATOM41 2238.0 FUNCT@5.0V:ATOM41A 2238.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5807.0 FUNCT@5.0V:ATOM45C_40 5807.0 FUNCT@5.0V:ATOM46C_40 5807.0 FUNCT@5.0V:ATOM47C_40 4277.0 FUNCT@5.0V:ATOM48C_40 5807.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5807.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1247.0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:603 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0090 b(slope) = 0.0109 chi2 = 3.0170 VTN P-side: a = 0.0095 b(slope) = 0.0066 chi2 = 0.7833 CAL_IN N-side: a = 2.4710 b(slope) = 0.0088 chi2 = 0.5007 CAL_IN P-side: a = 2.4708 b(slope) = 0.0088 chi2 = 0.2839 VTP N-side(average) = 0.7057 V CAL_BASE = 2.4700 V VTP P-side(average) = 0.4352 V CAL_VREF = 3.0342 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:703 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0216 b(slope) = 0.0106 chi2 = 99.0000 VTN P-side: a = 0.0103 b(slope) = 0.0066 chi2 = 0.4474 CAL_IN N-side: a = 2.5205 b(slope) = 0.0082 chi2 = 99.0000 CAL_IN P-side: a = 2.5057 b(slope) = 0.0086 chi2 = 1.1015 VTP N-side(average) = 0.7076 V CAL_BASE = 2.5073 V VTP P-side(average) = 0.4365 V CAL_VREF = 3.0552 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:803 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0111 chi2 = 3.5778 VTN P-side: a = 0.0097 b(slope) = 0.0069 chi2 = 0.7390 CAL_IN N-side: a = 2.5218 b(slope) = 0.0084 chi2 = 0.5207 CAL_IN P-side: a = 2.5219 b(slope) = 0.0084 chi2 = 0.5015 VTP N-side(average) = 0.7241 V CAL_BASE = 2.5227 V VTP P-side(average) = 0.4534 V CAL_VREF = 3.0596 V FUNCT. DIGITAL TEST = 32 error detected in test: FUNCT@5.0V:ATOM13A 1351.0 FUNCT@5.0V:ATOM13B 1407.0 FUNCT@5.0V:ATOM13C 1407.0 FUNCT@5.0V:ATOM15 1395.0 FUNCT@5.0V:ATOM17 3707.0 FUNCT@5.0V:ATOM18 3723.0 FUNCT@5.0V:ATOM18HF 3723.0 FUNCT@5.0V:ATOM19 3659.0 FUNCT@5.0V:ATOM19D 3674.0 FUNCT@5.0V:ATOM19E 2901.0 FUNCT@5.0V:ATOM19F 6774.0 FUNCT@5.0V:ATOM19FHF 6774.0 FUNCT@5.0V:ATOM20 1367.0 FUNCT@5.0V:ATOM21 1343.0 FUNCT@5.0V:ATOM22 1331.0 FUNCT@5.0V:ATOM25 1349.0 FUNCT@5.0V:ATOM25HF 1349.0 FUNCT@5.0V:ATOM26A 1328.0 FUNCT@5.0V:ATOM26B 2137.0 FUNCT@5.0V:ATOM28 1465.0 FUNCT@5.0V:ATOM29 1465.0 FUNCT@5.0V:ATOM30 1465.0 FUNCT@5.0V:ATOM31A 1099.0 FUNCT@5.0V:ATOM31B 1288.0 FUNCT@5.0V:ATOM32 1099.0 FUNCT@5.0V:ATOM33 1465.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1599.0 FUNCT@5.0V:ATOM36 1355.0 FUNCT@5.0V:ATOM39 1376.0 FUNCT@5.0V:ATOM41 1902.0 FUNCT@5.0V:ATOM41A 1902.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3811.0 FUNCT@5.0V:ATOM45C_40 3811.0 FUNCT@5.0V:ATOM46C_40 3811.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3811.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3811.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:804 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0111 chi2 = 1.7524 VTN P-side: a = 0.0102 b(slope) = 0.0068 chi2 = 0.7880 CAL_IN N-side: a = 2.5170 b(slope) = 0.0086 chi2 = 2.7547 CAL_IN P-side: a = 2.5170 b(slope) = 0.0086 chi2 = 2.0284 VTP N-side(average) = 0.7232 V CAL_BASE = 2.5178 V VTP P-side(average) = 0.4448 V CAL_VREF = 3.0671 V FUNCT. DIGITAL TEST = 2 error detected in test: FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM37D 2988.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:704 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0117 b(slope) = 0.0110 chi2 = 1.1933 VTN P-side: a = 0.0119 b(slope) = 0.0067 chi2 = 0.8249 CAL_IN N-side: a = 2.5133 b(slope) = 0.0085 chi2 = 1.3796 CAL_IN P-side: a = 2.5129 b(slope) = 0.0085 chi2 = 0.5356 VTP N-side(average) = 0.7156 V CAL_BASE = 2.5147 V VTP P-side(average) = 0.4445 V CAL_VREF = 3.0608 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:604 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0110 b(slope) = 0.0108 chi2 = 0.5256 VTN P-side: a = 0.0110 b(slope) = 0.0066 chi2 = 0.3252 CAL_IN N-side: a = 2.4807 b(slope) = 0.0087 chi2 = 0.5390 CAL_IN P-side: a = 2.4806 b(slope) = 0.0087 chi2 = 0.2928 VTP N-side(average) = 0.7028 V CAL_BASE = 2.4834 V VTP P-side(average) = 0.4340 V CAL_VREF = 3.0435 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:504 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0109 chi2 = 0.6792 VTN P-side: a = 0.0100 b(slope) = 0.0067 chi2 = 0.5671 CAL_IN N-side: a = 2.5150 b(slope) = 0.0086 chi2 = 0.6403 CAL_IN P-side: a = 2.5147 b(slope) = 0.0086 chi2 = 0.9671 VTP N-side(average) = 0.7112 V CAL_BASE = 2.5168 V VTP P-side(average) = 0.4398 V CAL_VREF = 3.0689 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:404 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0109 chi2 = 2.1243 VTN P-side: a = 0.0100 b(slope) = 0.0066 chi2 = 0.4450 CAL_IN N-side: a = 2.4774 b(slope) = 0.0088 chi2 = 0.8214 CAL_IN P-side: a = 2.4776 b(slope) = 0.0088 chi2 = 1.6777 VTP N-side(average) = 0.7084 V CAL_BASE = 2.4768 V VTP P-side(average) = 0.4311 V CAL_VREF = 3.0440 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:304 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0099 b(slope) = 0.0108 chi2 = 0.9641 VTN P-side: a = 0.0099 b(slope) = 0.0066 chi2 = 0.5978 CAL_IN N-side: a = 3.0690 b(slope) = 0.0006 chi2 = 99.0000 CAL_IN P-side: a = 3.0399 b(slope) = 0.0010 chi2 = 99.0000 VTP N-side(average) = 0.7043 V CAL_BASE = 2.4980 V VTP P-side(average) = 0.4316 V CAL_VREF = 3.0474 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:204 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0223 b(slope) = 0.0104 chi2 = 99.0000 VTN P-side: a = 0.0104 b(slope) = 0.0065 chi2 = 0.4597 CAL_IN N-side: a = 2.5171 b(slope) = 0.0081 chi2 = 99.0000 CAL_IN P-side: a = 2.5015 b(slope) = 0.0085 chi2 = 0.5877 VTP N-side(average) = 0.6966 V CAL_BASE = 2.5007 V VTP P-side(average) = 0.4290 V CAL_VREF = 3.0432 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:205 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0108 chi2 = 0.9861 VTN P-side: a = 0.0102 b(slope) = 0.0066 chi2 = 0.4456 CAL_IN N-side: a = 2.4795 b(slope) = 0.0086 chi2 = 0.6908 CAL_IN P-side: a = 2.4794 b(slope) = 0.0086 chi2 = 0.6449 VTP N-side(average) = 0.7004 V CAL_BASE = 2.4861 V VTP P-side(average) = 0.4314 V CAL_VREF = 3.0361 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:305 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0317 b(slope) = 0.0103 chi2 = 99.0000 VTN P-side: a = 0.0100 b(slope) = 0.0066 chi2 = 0.6242 CAL_IN N-side: a = 2.5176 b(slope) = 0.0080 chi2 = 99.0000 CAL_IN P-side: a = 2.4885 b(slope) = 0.0086 chi2 = 0.2941 VTP N-side(average) = 0.6997 V CAL_BASE = 2.4878 V VTP P-side(average) = 0.4306 V CAL_VREF = 3.0415 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:405 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0108 chi2 = 2.5297 VTN P-side: a = 0.0102 b(slope) = 0.0066 chi2 = 1.8895 CAL_IN N-side: a = 2.4719 b(slope) = 0.0088 chi2 = 1.3352 CAL_IN P-side: a = 2.4716 b(slope) = 0.0088 chi2 = 1.8652 VTP N-side(average) = 0.7013 V CAL_BASE = 2.4744 V VTP P-side(average) = 0.4329 V CAL_VREF = 3.0388 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:505 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0108 chi2 = 1.8471 VTN P-side: a = 0.0101 b(slope) = 0.0066 chi2 = 0.4735 CAL_IN N-side: a = 2.4696 b(slope) = 0.0089 chi2 = 0.5439 CAL_IN P-side: a = 2.4696 b(slope) = 0.0089 chi2 = 1.2775 VTP N-side(average) = 0.7019 V CAL_BASE = 2.4744 V VTP P-side(average) = 0.4307 V CAL_VREF = 3.0464 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:605 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0105 b(slope) = 0.0109 chi2 = 2.0796 VTN P-side: a = 0.0108 b(slope) = 0.0066 chi2 = 0.8377 CAL_IN N-side: a = 3.0159 b(slope) = 0.0018 chi2 = 99.0000 CAL_IN P-side: a = 2.9863 b(slope) = 0.0020 chi2 = 99.0000 VTP N-side(average) = 0.7068 V CAL_BASE = 2.5088 V VTP P-side(average) = 0.4359 V CAL_VREF = 3.0544 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1334.0 FUNCT@5.0V:ATOM13B 1399.0 FUNCT@5.0V:ATOM13C 1399.0 FUNCT@5.0V:ATOM15 1378.0 FUNCT@5.0V:ATOM17 3690.0 FUNCT@5.0V:ATOM18 3706.0 FUNCT@5.0V:ATOM18HF 3706.0 FUNCT@5.0V:ATOM19 3642.0 FUNCT@5.0V:ATOM19D 3657.0 FUNCT@5.0V:ATOM19E 2884.0 FUNCT@5.0V:ATOM19F 6757.0 FUNCT@5.0V:ATOM19FHF 6757.0 FUNCT@5.0V:ATOM20 1350.0 FUNCT@5.0V:ATOM21 1326.0 FUNCT@5.0V:ATOM22 1314.0 FUNCT@5.0V:ATOM23 975.0 FUNCT@5.0V:ATOM24 1075.0 FUNCT@5.0V:ATOM25 1332.0 FUNCT@5.0V:ATOM25HF 1332.0 FUNCT@5.0V:ATOM26A 1311.0 FUNCT@5.0V:ATOM26B 2120.0 FUNCT@5.0V:ATOM28 1448.0 FUNCT@5.0V:ATOM29 1448.0 FUNCT@5.0V:ATOM30 1448.0 FUNCT@5.0V:ATOM31A 1082.0 FUNCT@5.0V:ATOM31B 1271.0 FUNCT@5.0V:ATOM32 1082.0 FUNCT@5.0V:ATOM33 1448.0 FUNCT@5.0V:ATOM35 1582.0 FUNCT@5.0V:ATOM36 1338.0 FUNCT@5.0V:ATOM37A 1759.0 FUNCT@5.0V:ATOM37B 1752.0 FUNCT@5.0V:ATOM37C 1734.0 FUNCT@5.0V:ATOM37D 1702.0 FUNCT@5.0V:ATOM37E 1694.0 FUNCT@5.0V:ATOM39 1359.0 FUNCT@5.0V:ATOM41 1885.0 FUNCT@5.0V:ATOM41A 1885.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3810.0 FUNCT@5.0V:ATOM45C_40 3810.0 FUNCT@5.0V:ATOM46C_40 3810.0 FUNCT@5.0V:ATOM47C_40 3810.0 FUNCT@5.0V:ATOM48C_40 3810.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3810.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1244.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:705 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0109 chi2 = 0.8520 VTN P-side: a = 0.0105 b(slope) = 0.0066 chi2 = 0.3665 CAL_IN N-side: a = 2.5160 b(slope) = 0.0084 chi2 = 0.6336 CAL_IN P-side: a = 2.5161 b(slope) = 0.0084 chi2 = 0.5943 VTP N-side(average) = 0.7069 V CAL_BASE = 2.5168 V VTP P-side(average) = 0.4372 V CAL_VREF = 3.0564 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5099.0 FUNCT@5.0V:ATOM45C_40 5099.0 FUNCT@5.0V:ATOM46C_40 5099.0 FUNCT@5.0V:ATOM47C_40 4891.0 FUNCT@5.0V:ATOM48C_40 5099.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5099.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:805 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0109 chi2 = 0.7099 VTN P-side: a = 0.0098 b(slope) = 0.0067 chi2 = 0.2916 CAL_IN N-side: a = 2.5107 b(slope) = 0.0084 chi2 = 0.7693 CAL_IN P-side: a = 2.5107 b(slope) = 0.0084 chi2 = 0.6137 VTP N-side(average) = 0.7086 V CAL_BASE = 2.5117 V VTP P-side(average) = 0.4380 V CAL_VREF = 3.0520 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5823.0 FUNCT@5.0V:ATOM45C_40 5823.0 FUNCT@5.0V:ATOM46C_40 5823.0 FUNCT@5.0V:ATOM47C_40 5501.0 FUNCT@5.0V:ATOM48C_40 5823.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5823.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:806 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0109 chi2 = 1.1581 VTN P-side: a = 0.0097 b(slope) = 0.0067 chi2 = 0.6071 CAL_IN N-side: a = 2.5139 b(slope) = 0.0086 chi2 = 1.1606 CAL_IN P-side: a = 2.5137 b(slope) = 0.0086 chi2 = 0.6707 VTP N-side(average) = 0.7092 V CAL_BASE = 2.5139 V VTP P-side(average) = 0.4419 V CAL_VREF = 3.0627 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:706 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0109 chi2 = 0.9510 VTN P-side: a = 0.0099 b(slope) = 0.0067 chi2 = 0.4263 CAL_IN N-side: a = 2.4951 b(slope) = 0.0087 chi2 = 0.4789 CAL_IN P-side: a = 2.4952 b(slope) = 0.0087 chi2 = 0.9015 VTP N-side(average) = 0.7117 V CAL_BASE = 2.4954 V VTP P-side(average) = 0.4420 V CAL_VREF = 3.0530 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:606 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0108 chi2 = 1.0018 VTN P-side: a = 0.0099 b(slope) = 0.0065 chi2 = 0.7131 CAL_IN N-side: a = 2.5036 b(slope) = 0.0086 chi2 = 2.2213 CAL_IN P-side: a = 2.5060 b(slope) = 0.0086 chi2 = 2.1738 VTP N-side(average) = 0.7033 V CAL_BASE = 2.5064 V VTP P-side(average) = 0.4294 V CAL_VREF = 3.0525 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:506 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0109 chi2 = 3.9512 VTN P-side: a = 0.0106 b(slope) = 0.0066 chi2 = 1.1683 CAL_IN N-side: a = 2.4936 b(slope) = 0.0088 chi2 = 1.0478 CAL_IN P-side: a = 2.4938 b(slope) = 0.0088 chi2 = 0.6023 VTP N-side(average) = 0.7067 V CAL_BASE = 2.4959 V VTP P-side(average) = 0.4360 V CAL_VREF = 3.0601 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:406 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0110 chi2 = 1.0233 VTN P-side: a = 0.0104 b(slope) = 0.0066 chi2 = 0.8235 CAL_IN N-side: a = 2.4964 b(slope) = 0.0087 chi2 = 0.5797 CAL_IN P-side: a = 2.4965 b(slope) = 0.0087 chi2 = 0.5657 VTP N-side(average) = 0.7121 V CAL_BASE = 2.5017 V VTP P-side(average) = 0.4340 V CAL_VREF = 3.0571 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1319.0 FUNCT@5.0V:ATOM13B 1391.0 FUNCT@5.0V:ATOM13C 1391.0 FUNCT@5.0V:ATOM15 1363.0 FUNCT@5.0V:ATOM17 3675.0 FUNCT@5.0V:ATOM18 3691.0 FUNCT@5.0V:ATOM18HF 3691.0 FUNCT@5.0V:ATOM19 3627.0 FUNCT@5.0V:ATOM19D 3642.0 FUNCT@5.0V:ATOM19E 2869.0 FUNCT@5.0V:ATOM19F 6742.0 FUNCT@5.0V:ATOM19FHF 6742.0 FUNCT@5.0V:ATOM20 1335.0 FUNCT@5.0V:ATOM21 1311.0 FUNCT@5.0V:ATOM22 1299.0 FUNCT@5.0V:ATOM25 1317.0 FUNCT@5.0V:ATOM25HF 1317.0 FUNCT@5.0V:ATOM26A 1296.0 FUNCT@5.0V:ATOM26B 2105.0 FUNCT@5.0V:ATOM28 1433.0 FUNCT@5.0V:ATOM29 1433.0 FUNCT@5.0V:ATOM30 1433.0 FUNCT@5.0V:ATOM31A 1067.0 FUNCT@5.0V:ATOM31B 1256.0 FUNCT@5.0V:ATOM32 1067.0 FUNCT@5.0V:ATOM33 1433.0 FUNCT@5.0V:ATOM35 1567.0 FUNCT@5.0V:ATOM36 1323.0 FUNCT@5.0V:ATOM37A 1735.0 FUNCT@5.0V:ATOM37B 1727.0 FUNCT@5.0V:ATOM37C 1711.0 FUNCT@5.0V:ATOM37D 1679.0 FUNCT@5.0V:ATOM37E 1670.0 FUNCT@5.0V:ATOM39 1344.0 FUNCT@5.0V:ATOM41 1870.0 FUNCT@5.0V:ATOM41A 1870.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4407.0 FUNCT@5.0V:ATOM45C_40 4407.0 FUNCT@5.0V:ATOM46C_40 4407.0 FUNCT@5.0V:ATOM47C_40 3747.0 FUNCT@5.0V:ATOM48C_40 4407.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4407.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:306 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0112 b(slope) = 0.0109 chi2 = 1.3085 VTN P-side: a = 0.0115 b(slope) = 0.0067 chi2 = 0.7459 CAL_IN N-side: a = 2.4890 b(slope) = 0.0087 chi2 = 1.3174 CAL_IN P-side: a = 2.4893 b(slope) = 0.0087 chi2 = 0.8861 VTP N-side(average) = 0.7115 V CAL_BASE = 2.4902 V VTP P-side(average) = 0.4389 V CAL_VREF = 3.0444 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1735.0 FUNCT@5.0V:ATOM13B 1791.0 FUNCT@5.0V:ATOM13C 1791.0 FUNCT@5.0V:ATOM15 1779.0 FUNCT@5.0V:ATOM17 4091.0 FUNCT@5.0V:ATOM18 4107.0 FUNCT@5.0V:ATOM18HF 4107.0 FUNCT@5.0V:ATOM19 4043.0 FUNCT@5.0V:ATOM19D 4058.0 FUNCT@5.0V:ATOM19E 3285.0 FUNCT@5.0V:ATOM19F 7158.0 FUNCT@5.0V:ATOM19FHF 7158.0 FUNCT@5.0V:ATOM20 1751.0 FUNCT@5.0V:ATOM21 1727.0 FUNCT@5.0V:ATOM22 1715.0 FUNCT@5.0V:ATOM25 1733.0 FUNCT@5.0V:ATOM25HF 1733.0 FUNCT@5.0V:ATOM26A 1712.0 FUNCT@5.0V:ATOM26B 2521.0 FUNCT@5.0V:ATOM28 1190.0 FUNCT@5.0V:ATOM29 1191.0 FUNCT@5.0V:ATOM30 1189.0 FUNCT@5.0V:ATOM31A 1483.0 FUNCT@5.0V:ATOM31B 1672.0 FUNCT@5.0V:ATOM32 1483.0 FUNCT@5.0V:ATOM33 1849.0 FUNCT@5.0V:ATOM35 1983.0 FUNCT@5.0V:ATOM36 1739.0 FUNCT@5.0V:ATOM37A 2551.0 FUNCT@5.0V:ATOM37B 2550.0 FUNCT@5.0V:ATOM37C 2534.0 FUNCT@5.0V:ATOM37D 2182.0 FUNCT@5.0V:ATOM37E 2174.0 FUNCT@5.0V:ATOM39 1760.0 FUNCT@5.0V:ATOM41 2286.0 FUNCT@5.0V:ATOM41A 2286.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4003.0 FUNCT@5.0V:ATOM45C_40 4003.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 4003.0 FUNCT@5.0V:ATOM48C_40 4003.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4003.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:206 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0113 b(slope) = 0.0107 chi2 = 2.0918 VTN P-side: a = 0.0117 b(slope) = 0.0065 chi2 = 0.8129 CAL_IN N-side: a = 2.4907 b(slope) = 0.0085 chi2 = 0.8783 CAL_IN P-side: a = 2.4905 b(slope) = 0.0085 chi2 = 0.5555 VTP N-side(average) = 0.6974 V CAL_BASE = 2.4907 V VTP P-side(average) = 0.4311 V CAL_VREF = 3.0339 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1128.0 FUNCT@5.0V:ATOM13C 1128.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM25 1072.0 FUNCT@5.0V:ATOM25HF 1072.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1216.0 FUNCT@5.0V:ATOM37B 1206.0 FUNCT@5.0V:ATOM37C 1191.0 FUNCT@5.0V:ATOM37D 1160.0 FUNCT@5.0V:ATOM37E 1151.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:107 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0123 b(slope) = 0.0108 chi2 = 1.0320 VTN P-side: a = 0.0127 b(slope) = 0.0066 chi2 = 0.6711 CAL_IN N-side: a = 2.4871 b(slope) = 0.0085 chi2 = 0.8077 CAL_IN P-side: a = 2.4871 b(slope) = 0.0085 chi2 = 1.0559 VTP N-side(average) = 0.7059 V CAL_BASE = 2.4939 V VTP P-side(average) = 0.4369 V CAL_VREF = 3.0388 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:207 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 3 error detected in test: IDDSB:VDD1C 0.1017 IDDSB:VDD1D 0.1071 IDDOP1:DVDD 0.1289 DACS TEST = 1 VTN N-side: a = 0.0195 b(slope) = 0.0025 chi2 = 99.0000 VTN P-side: a = 0.0138 b(slope) = 0.0016 chi2 = 99.0000 CAL_IN N-side: a = 2.5162 b(slope) = -0.0001 chi2 = 99.0000 CAL_IN P-side: a = 2.5133 b(slope) = -0.0001 chi2 = 99.0000 VTP N-side(average) = 0.6965 V CAL_BASE = 2.4946 V VTP P-side(average) = 0.4291 V CAL_VREF = 3.0437 V FUNCT. DIGITAL TEST = 49 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 264.0 FUNCT@5.0V:ATOM7TO9B 264.0 FUNCT@5.0V:ATOM7TO9C 264.0 FUNCT@5.0V:ATOM7TO9D 264.0 FUNCT@5.0V:ATOM7TO9E 264.0 FUNCT@5.0V:ATOM10TO12 264.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1146.0 FUNCT@5.0V:ATOM13C 1146.0 FUNCT@5.0V:ATOM15 1109.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3388.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1045.0 FUNCT@5.0V:ATOM23 975.0 FUNCT@5.0V:ATOM24 1075.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1313.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1222.0 FUNCT@5.0V:ATOM37B 1214.0 FUNCT@5.0V:ATOM37C 1198.0 FUNCT@5.0V:ATOM37D 1166.0 FUNCT@5.0V:ATOM37E 1157.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 3 error detected in test: TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 ------- CHIP ID:307 --------------------------------------- CLASS=B -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0120 b(slope) = 0.0108 chi2 = 0.8660 VTN P-side: a = 0.0122 b(slope) = 0.0066 chi2 = 0.6392 CAL_IN N-side: a = 2.4892 b(slope) = 0.0086 chi2 = 0.7637 CAL_IN P-side: a = 2.4894 b(slope) = 0.0086 chi2 = 0.6930 VTP N-side(average) = 0.7062 V CAL_BASE = 2.4905 V VTP P-side(average) = 0.4361 V CAL_VREF = 3.0432 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4679.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:407 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0123 b(slope) = 0.0107 chi2 = 0.8546 VTN P-side: a = 0.0123 b(slope) = 0.0066 chi2 = 0.4447 CAL_IN N-side: a = 2.5075 b(slope) = 0.0085 chi2 = 0.7277 CAL_IN P-side: a = 2.5075 b(slope) = 0.0085 chi2 = 0.8486 VTP N-side(average) = 0.6992 V CAL_BASE = 2.5112 V VTP P-side(average) = 0.4339 V CAL_VREF = 3.0564 V FUNCT. DIGITAL TEST = 6 error detected in test: FUNCT@5.0V:ATOM18 11455.0 FUNCT@5.0V:ATOM18HF 11455.0 FUNCT@5.0V:ATOM19F 7141.0 FUNCT@5.0V:ATOM19FHF 7141.0 FUNCT@5.0V:ATOM35 1966.0 FUNCT@5.0V:ATOM36 3639.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4002.0 FUNCT@5.0V:ATOM45C_40 4002.0 FUNCT@5.0V:ATOM46C_40 4002.0 FUNCT@5.0V:ATOM47C_40 4002.0 FUNCT@5.0V:ATOM48C_40 4002.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4002.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1244.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:507 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0125 b(slope) = 0.0110 chi2 = 2.5099 VTN P-side: a = 0.0127 b(slope) = 0.0067 chi2 = 0.5525 CAL_IN N-side: a = 2.5220 b(slope) = 0.0086 chi2 = 0.8854 CAL_IN P-side: a = 2.5224 b(slope) = 0.0086 chi2 = 0.8936 VTP N-side(average) = 0.7159 V CAL_BASE = 2.5252 V VTP P-side(average) = 0.4404 V CAL_VREF = 3.0732 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:607 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0130 b(slope) = 0.0107 chi2 = 0.6896 VTN P-side: a = 0.0129 b(slope) = 0.0066 chi2 = 0.2667 CAL_IN N-side: a = 2.4892 b(slope) = 0.0087 chi2 = 0.7090 CAL_IN P-side: a = 2.4892 b(slope) = 0.0087 chi2 = 5.1191 VTP N-side(average) = 0.6990 V CAL_BASE = 2.4885 V VTP P-side(average) = 0.4344 V CAL_VREF = 3.0478 V FUNCT. DIGITAL TEST = 25 error detected in test: FUNCT@5.0V:ATOM13A 1287.0 FUNCT@5.0V:ATOM15 1331.0 FUNCT@5.0V:ATOM17 3643.0 FUNCT@5.0V:ATOM18 3659.0 FUNCT@5.0V:ATOM18HF 3659.0 FUNCT@5.0V:ATOM19 3595.0 FUNCT@5.0V:ATOM19D 3610.0 FUNCT@5.0V:ATOM19E 2837.0 FUNCT@5.0V:ATOM19F 6710.0 FUNCT@5.0V:ATOM19FHF 6710.0 FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM25 1285.0 FUNCT@5.0V:ATOM26B 3060.0 FUNCT@5.0V:ATOM28 1401.0 FUNCT@5.0V:ATOM31A 1035.0 FUNCT@5.0V:ATOM33 1401.0 FUNCT@5.0V:ATOM35 1535.0 FUNCT@5.0V:ATOM36 1291.0 FUNCT@5.0V:ATOM37A 1670.0 FUNCT@5.0V:ATOM37B 1662.0 FUNCT@5.0V:ATOM37C 1646.0 FUNCT@5.0V:ATOM37D 1614.0 FUNCT@5.0V:ATOM39 1312.0 FUNCT@5.0V:ATOM41 1838.0 FUNCT@5.0V:ATOM41A 1838.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4391.0 FUNCT@5.0V:ATOM45C_40 4391.0 FUNCT@5.0V:ATOM46C_40 3667.0 FUNCT@5.0V:ATOM47C_40 3699.0 FUNCT@5.0V:ATOM48C_40 4391.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4391.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:707 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0106 b(slope) = 0.0109 chi2 = 1.3444 VTN P-side: a = 0.0106 b(slope) = 0.0067 chi2 = 0.2071 CAL_IN N-side: a = 2.4898 b(slope) = 0.0086 chi2 = 1.0680 CAL_IN P-side: a = 2.4896 b(slope) = 0.0086 chi2 = 0.9133 VTP N-side(average) = 0.7093 V CAL_BASE = 2.4907 V VTP P-side(average) = 0.4396 V CAL_VREF = 3.0440 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:807 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0107 b(slope) = 0.0110 chi2 = 0.8741 VTN P-side: a = 0.0106 b(slope) = 0.0068 chi2 = 0.3454 CAL_IN N-side: a = 2.4987 b(slope) = 0.0086 chi2 = 1.1206 CAL_IN P-side: a = 2.4984 b(slope) = 0.0086 chi2 = 1.1224 VTP N-side(average) = 0.7176 V CAL_BASE = 2.5027 V VTP P-side(average) = 0.4487 V CAL_VREF = 3.0544 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:907 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0109 chi2 = 3.6776 VTN P-side: a = 0.0107 b(slope) = 0.0068 chi2 = 1.3361 CAL_IN N-side: a = 2.4885 b(slope) = 0.0086 chi2 = 0.9327 CAL_IN P-side: a = 2.4890 b(slope) = 0.0086 chi2 = 0.7440 VTP N-side(average) = 0.7111 V CAL_BASE = 2.4915 V VTP P-side(average) = 0.4441 V CAL_VREF = 3.0408 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:908 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0108 b(slope) = 0.0110 chi2 = 1.1682 VTN P-side: a = 0.0108 b(slope) = 0.0068 chi2 = 0.6213 CAL_IN N-side: a = 2.4982 b(slope) = 0.0085 chi2 = 1.1057 CAL_IN P-side: a = 2.4981 b(slope) = 0.0085 chi2 = 1.2353 VTP N-side(average) = 0.7126 V CAL_BASE = 2.5022 V VTP P-side(average) = 0.4455 V CAL_VREF = 3.0481 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:808 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0111 b(slope) = 0.0113 chi2 = 1.2025 VTN P-side: a = 0.0110 b(slope) = 0.0069 chi2 = 0.4276 CAL_IN N-side: a = 2.5008 b(slope) = 0.0087 chi2 = 1.1876 CAL_IN P-side: a = 2.5010 b(slope) = 0.0087 chi2 = 1.0546 VTP N-side(average) = 0.7349 V CAL_BASE = 2.5012 V VTP P-side(average) = 0.4569 V CAL_VREF = 3.0598 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:708 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0109 chi2 = 1.6594 VTN P-side: a = 0.0100 b(slope) = 0.0067 chi2 = 1.1573 CAL_IN N-side: a = 2.5007 b(slope) = 0.0085 chi2 = 1.1357 CAL_IN P-side: a = 2.5010 b(slope) = 0.0085 chi2 = 0.7800 VTP N-side(average) = 0.7102 V CAL_BASE = 2.5046 V VTP P-side(average) = 0.4414 V CAL_VREF = 3.0515 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:608 --------------------------------------- CLASS=B -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 2 VTN N-side: a = 0.0100 b(slope) = 0.0109 chi2 = 1.4381 VTN P-side: a = 0.0102 b(slope) = 0.0067 chi2 = 0.4918 CAL_IN N-side: a = 2.4941 b(slope) = 0.0087 chi2 = 1.0675 CAL_IN P-side: a = 2.4940 b(slope) = 0.0087 chi2 = 27.3406 VTP N-side(average) = 0.7064 V CAL_BASE = 2.4961 V VTP P-side(average) = 0.4373 V CAL_VREF = 3.0557 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:508 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0111 b(slope) = 0.0110 chi2 = 0.7609 VTN P-side: a = 0.0113 b(slope) = 0.0067 chi2 = 0.4642 CAL_IN N-side: a = 2.5503 b(slope) = 0.0083 chi2 = 1.2202 CAL_IN P-side: a = 2.5501 b(slope) = 0.0083 chi2 = 1.3875 VTP N-side(average) = 0.7142 V CAL_BASE = 2.5552 V VTP P-side(average) = 0.4406 V CAL_VREF = 3.0901 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:408 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0110 chi2 = 4.1453 VTN P-side: a = 0.0112 b(slope) = 0.0067 chi2 = 1.7463 CAL_IN N-side: a = 2.5138 b(slope) = 0.0085 chi2 = 1.2384 CAL_IN P-side: a = 2.5140 b(slope) = 0.0085 chi2 = 0.8209 VTP N-side(average) = 0.7144 V CAL_BASE = 2.5183 V VTP P-side(average) = 0.4434 V CAL_VREF = 3.0625 V FUNCT. DIGITAL TEST = 2 error detected in test: FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM35 1294.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:308 --------------------------------------- CLASS=B -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 2 VTN N-side: a = 0.0119 b(slope) = 0.0110 chi2 = 1.2340 VTN P-side: a = 0.0122 b(slope) = 0.0067 chi2 = 0.4709 CAL_IN N-side: a = 2.5034 b(slope) = 0.0086 chi2 = 1.4429 CAL_IN P-side: a = 2.5031 b(slope) = 0.0087 chi2 = 12.7026 VTP N-side(average) = 0.7146 V CAL_BASE = 2.5066 V VTP P-side(average) = 0.4414 V CAL_VREF = 3.0584 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:208 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: IDDSB:VDD1B 0.1002 IDDSB:VDD1C 0.1059 IDDSB:VDD1D 0.1111 IDDOP1:DVDD 0.1453 DACS TEST = 0 VTN N-side: a = 0.0129 b(slope) = 0.0108 chi2 = 0.9094 VTN P-side: a = 0.0131 b(slope) = 0.0066 chi2 = 0.4982 CAL_IN N-side: a = 2.4976 b(slope) = 0.0086 chi2 = 1.0464 CAL_IN P-side: a = 2.4980 b(slope) = 0.0086 chi2 = 0.8411 VTP N-side(average) = 0.7037 V CAL_BASE = 2.5017 V VTP P-side(average) = 0.4360 V CAL_VREF = 3.0503 V FUNCT. DIGITAL TEST = 30 error detected in test: FUNCT@5.0V:ATOM13A 1059.0 FUNCT@5.0V:ATOM13B 1131.0 FUNCT@5.0V:ATOM13C 1131.0 FUNCT@5.0V:ATOM15 1119.0 FUNCT@5.0V:ATOM17 3415.0 FUNCT@5.0V:ATOM18 3447.0 FUNCT@5.0V:ATOM18HF 3447.0 FUNCT@5.0V:ATOM19 3367.0 FUNCT@5.0V:ATOM19D 3382.0 FUNCT@5.0V:ATOM19E 2609.0 FUNCT@5.0V:ATOM19F 6482.0 FUNCT@5.0V:ATOM19FHF 6482.0 FUNCT@5.0V:ATOM20 1091.0 FUNCT@5.0V:ATOM22 1055.0 FUNCT@5.0V:ATOM23 971.0 FUNCT@5.0V:ATOM25 1057.0 FUNCT@5.0V:ATOM25HF 1057.0 FUNCT@5.0V:ATOM26A 1036.0 FUNCT@5.0V:ATOM26B 1861.0 FUNCT@5.0V:ATOM29 1189.0 FUNCT@5.0V:ATOM31B 996.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1323.0 FUNCT@5.0V:ATOM36 1079.0 FUNCT@5.0V:ATOM37B 1195.0 FUNCT@5.0V:ATOM37D 1163.0 FUNCT@5.0V:ATOM37E 1138.0 FUNCT@5.0V:ATOM39 1084.0 FUNCT@5.0V:ATOM41 1610.0 FUNCT@5.0V:ATOM41A 1610.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3662.0 FUNCT@5.0V:ATOM45C_40 3662.0 FUNCT@5.0V:ATOM46C_40 3662.0 FUNCT@5.0V:ATOM47C_40 3662.0 FUNCT@5.0V:ATOM48C_40 3662.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3662.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1240.0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:108 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0131 b(slope) = 0.0108 chi2 = 3.1930 VTN P-side: a = 0.0136 b(slope) = 0.0067 chi2 = 0.6875 CAL_IN N-side: a = 2.5060 b(slope) = 0.0084 chi2 = 1.6043 CAL_IN P-side: a = 2.5060 b(slope) = 0.0084 chi2 = 2.5314 VTP N-side(average) = 0.7076 V CAL_BASE = 2.5085 V VTP P-side(average) = 0.4418 V CAL_VREF = 3.0464 V FUNCT. DIGITAL TEST = 21 error detected in test: FUNCT@5.0V:ATOM13B 1230.0 FUNCT@5.0V:ATOM13C 1230.0 FUNCT@5.0V:ATOM17 5690.0 FUNCT@5.0V:ATOM18 10905.0 FUNCT@5.0V:ATOM18HF 10905.0 FUNCT@5.0V:ATOM19F 7673.0 FUNCT@5.0V:ATOM19FHF 7673.0 FUNCT@5.0V:ATOM21 1158.0 FUNCT@5.0V:ATOM22 1147.0 FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM24 1074.0 FUNCT@5.0V:ATOM25 2313.0 FUNCT@5.0V:ATOM25HF 2313.0 FUNCT@5.0V:ATOM26A 1144.0 FUNCT@5.0V:ATOM26B 3060.0 FUNCT@5.0V:ATOM37A 1430.0 FUNCT@5.0V:ATOM37B 1414.0 FUNCT@5.0V:ATOM37C 1399.0 FUNCT@5.0V:ATOM37D 1368.0 FUNCT@5.0V:ATOM37E 1360.0 FUNCT@5.0V:ATOM39 1197.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3729.0 FUNCT@5.0V:ATOM45C_40 3729.0 FUNCT@5.0V:ATOM46C_40 3729.0 FUNCT@5.0V:ATOM47C_40 3729.0 FUNCT@5.0V:ATOM48C_40 3729.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3729.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1243.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:209 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0130 b(slope) = 0.0107 chi2 = 0.9501 VTN P-side: a = 0.0131 b(slope) = 0.0065 chi2 = 0.5921 CAL_IN N-side: a = 2.4924 b(slope) = 0.0086 chi2 = 0.8716 CAL_IN P-side: a = 2.4926 b(slope) = 0.0086 chi2 = 0.7012 VTP N-side(average) = 0.7005 V CAL_BASE = 2.4927 V VTP P-side(average) = 0.4331 V CAL_VREF = 3.0437 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:309 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0143 b(slope) = 0.0108 chi2 = 1.2481 VTN P-side: a = 0.0144 b(slope) = 0.0066 chi2 = 0.4851 CAL_IN N-side: a = 2.4691 b(slope) = 0.0088 chi2 = 0.8750 CAL_IN P-side: a = 2.4687 b(slope) = 0.0088 chi2 = 1.5878 VTP N-side(average) = 0.7076 V CAL_BASE = 2.4702 V VTP P-side(average) = 0.4374 V CAL_VREF = 3.0344 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:409 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1279 IDDSB:VDD1B 0.1341 IDDSB:VDD1C 0.1372 IDDSB:VDD1D 0.1432 IDDOP1:DVDD 0.1661 DACS TEST = 1 VTN N-side: a = 0.0257 b(slope) = 0.0107 chi2 = 99.0000 VTN P-side: a = 0.0137 b(slope) = 0.0067 chi2 = 0.6366 CAL_IN N-side: a = 2.5290 b(slope) = 0.0111 chi2 = 99.0000 CAL_IN P-side: a = 2.5078 b(slope) = 0.0104 chi2 = 99.0000 VTP N-side(average) = 0.7149 V CAL_BASE = 2.4900 V VTP P-side(average) = 0.4423 V CAL_VREF = 3.0481 V FUNCT. DIGITAL TEST = 2 error detected in test: FUNCT@5.0V:ATOM22 1154.0 FUNCT@5.0V:ATOM26A 1151.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:509 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0126 b(slope) = 0.0109 chi2 = 0.8679 VTN P-side: a = 0.0129 b(slope) = 0.0066 chi2 = 0.5194 CAL_IN N-side: a = 2.5359 b(slope) = 0.0085 chi2 = 2.5470 CAL_IN P-side: a = 2.5379 b(slope) = 0.0086 chi2 = 5.4814 VTP N-side(average) = 0.7128 V CAL_BASE = 2.5378 V VTP P-side(average) = 0.4395 V CAL_VREF = 3.0842 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:609 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0116 b(slope) = 0.0110 chi2 = 1.9160 VTN P-side: a = 0.0120 b(slope) = 0.0067 chi2 = 0.5074 CAL_IN N-side: a = 2.5263 b(slope) = 0.0085 chi2 = 0.7220 CAL_IN P-side: a = 2.5264 b(slope) = 0.0085 chi2 = 0.4469 VTP N-side(average) = 0.7148 V CAL_BASE = 2.5310 V VTP P-side(average) = 0.4428 V CAL_VREF = 3.0754 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:709 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0109 b(slope) = 0.0108 chi2 = 0.8029 VTN P-side: a = 0.0109 b(slope) = 0.0066 chi2 = 0.4870 CAL_IN N-side: a = 2.5005 b(slope) = 0.0086 chi2 = 7.9129 CAL_IN P-side: a = 2.5036 b(slope) = 0.0087 chi2 = 3.8016 VTP N-side(average) = 0.7037 V CAL_BASE = 2.5039 V VTP P-side(average) = 0.4359 V CAL_VREF = 3.0513 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:809 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0112 chi2 = 0.9662 VTN P-side: a = 0.0109 b(slope) = 0.0069 chi2 = 0.6896 CAL_IN N-side: a = 2.5140 b(slope) = 0.0085 chi2 = 1.0677 CAL_IN P-side: a = 2.5143 b(slope) = 0.0085 chi2 = 0.4004 VTP N-side(average) = 0.7257 V CAL_BASE = 2.5166 V VTP P-side(average) = 0.4527 V CAL_VREF = 3.0593 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:810 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.2315 b(slope) = 0.0000 chi2 = 0.2871 VTN P-side: a = 0.1477 b(slope) = 0.0000 chi2 = 0.2568 CAL_IN N-side: a = 2.8034 b(slope) = 0.0000 chi2 = 0.3811 CAL_IN P-side: a = 2.8034 b(slope) = 0.0000 chi2 = 0.2441 VTP N-side(average) = 0.7194 V CAL_BASE = 2.5422 V VTP P-side(average) = 0.4498 V CAL_VREF = 3.0735 V FUNCT. DIGITAL TEST = 57 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 212.0 FUNCT@5.0V:ATOM1TO6C 212.0 FUNCT@5.0V:ATOM1TO6D 212.0 FUNCT@5.0V:ATOM1TO6E 212.0 FUNCT@5.0V:ATOM7TO9A 212.0 FUNCT@5.0V:ATOM7TO9B 212.0 FUNCT@5.0V:ATOM7TO9C 212.0 FUNCT@5.0V:ATOM7TO9D 212.0 FUNCT@5.0V:ATOM7TO9E 212.0 FUNCT@5.0V:ATOM10TO12 212.0 FUNCT@5.0V:ATOM13A 212.0 FUNCT@5.0V:ATOM13B 212.0 FUNCT@5.0V:ATOM13C 1130.0 FUNCT@5.0V:ATOM15 212.0 FUNCT@5.0V:ATOM16 212.0 FUNCT@5.0V:ATOM17 212.0 FUNCT@5.0V:ATOM18 212.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 212.0 FUNCT@5.0V:ATOM19B 212.0 FUNCT@5.0V:ATOM19C 212.0 FUNCT@5.0V:ATOM19D 212.0 FUNCT@5.0V:ATOM19E 212.0 FUNCT@5.0V:ATOM19F 212.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 212.0 FUNCT@5.0V:ATOM21 212.0 FUNCT@5.0V:ATOM22 212.0 FUNCT@5.0V:ATOM23 212.0 FUNCT@5.0V:ATOM24 212.0 FUNCT@5.0V:ATOM25 212.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 212.0 FUNCT@5.0V:ATOM26B 212.0 FUNCT@5.0V:ATOM27 212.0 FUNCT@5.0V:ATOM28 212.0 FUNCT@5.0V:ATOM29 212.0 FUNCT@5.0V:ATOM30 212.0 FUNCT@5.0V:ATOM31A 212.0 FUNCT@5.0V:ATOM31B 212.0 FUNCT@5.0V:ATOM32 212.0 FUNCT@5.0V:ATOM33 212.0 FUNCT@5.0V:ATOM34 212.0 FUNCT@5.0V:ATOM35 212.0 FUNCT@5.0V:ATOM36 212.0 FUNCT@5.0V:ATOM37A 212.0 FUNCT@5.0V:ATOM37B 212.0 FUNCT@5.0V:ATOM37C 212.0 FUNCT@5.0V:ATOM37D 212.0 FUNCT@5.0V:ATOM37E 212.0 FUNCT@5.0V:ATOM38 212.0 FUNCT@5.0V:ATOM39 212.0 FUNCT@5.0V:ATOM40 212.0 FUNCT@5.0V:ATOM41 212.0 FUNCT@5.0V:ATOM41A 212.0 FUNCT@5.0V:ATOM42 212.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 212.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:710 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0110 chi2 = 0.8182 VTN P-side: a = 0.0107 b(slope) = 0.0068 chi2 = 0.3886 CAL_IN N-side: a = 2.5251 b(slope) = 0.0084 chi2 = 1.2525 CAL_IN P-side: a = 2.5248 b(slope) = 0.0085 chi2 = 0.6649 VTP N-side(average) = 0.7182 V CAL_BASE = 2.5268 V VTP P-side(average) = 0.4458 V CAL_VREF = 3.0684 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:610 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0118 b(slope) = 0.0111 chi2 = 2.7044 VTN P-side: a = 0.0121 b(slope) = 0.0068 chi2 = 0.3529 CAL_IN N-side: a = 2.5330 b(slope) = 0.0085 chi2 = 0.6726 CAL_IN P-side: a = 2.5331 b(slope) = 0.0085 chi2 = 0.2966 VTP N-side(average) = 0.7230 V CAL_BASE = 2.5386 V VTP P-side(average) = 0.4483 V CAL_VREF = 3.0837 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:510 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1005 DACS TEST = 0 VTN N-side: a = 0.0124 b(slope) = 0.0111 chi2 = 1.4972 VTN P-side: a = 0.0125 b(slope) = 0.0068 chi2 = 0.4572 CAL_IN N-side: a = 2.4974 b(slope) = 0.0088 chi2 = 0.7412 CAL_IN P-side: a = 2.4974 b(slope) = 0.0087 chi2 = 0.6677 VTP N-side(average) = 0.7242 V CAL_BASE = 2.4985 V VTP P-side(average) = 0.4480 V CAL_VREF = 3.0596 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:410 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0118 b(slope) = 0.0109 chi2 = 0.8421 VTN P-side: a = 0.0119 b(slope) = 0.0067 chi2 = 0.7778 CAL_IN N-side: a = 2.4906 b(slope) = 0.0087 chi2 = 0.8508 CAL_IN P-side: a = 2.4906 b(slope) = 0.0087 chi2 = 0.7142 VTP N-side(average) = 0.7132 V CAL_BASE = 2.4966 V VTP P-side(average) = 0.4421 V CAL_VREF = 3.0518 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:310 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0116 b(slope) = 0.0109 chi2 = 1.3665 VTN P-side: a = 0.0118 b(slope) = 0.0066 chi2 = 0.4331 CAL_IN N-side: a = 2.4878 b(slope) = 0.0086 chi2 = 0.8733 CAL_IN P-side: a = 2.4877 b(slope) = 0.0086 chi2 = 0.8642 VTP N-side(average) = 0.7078 V CAL_BASE = 2.4924 V VTP P-side(average) = 0.4345 V CAL_VREF = 3.0432 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:210 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0109 chi2 = 2.3297 VTN P-side: a = 0.0104 b(slope) = 0.0066 chi2 = 0.5626 CAL_IN N-side: a = 2.5228 b(slope) = 0.0084 chi2 = 2.3749 CAL_IN P-side: a = 2.5253 b(slope) = 0.0085 chi2 = 3.6145 VTP N-side(average) = 0.7062 V CAL_BASE = 2.5256 V VTP P-side(average) = 0.4331 V CAL_VREF = 3.0657 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:211 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0109 chi2 = 1.5942 VTN P-side: a = 0.0104 b(slope) = 0.0066 chi2 = 0.6549 CAL_IN N-side: a = 2.4975 b(slope) = 0.0086 chi2 = 1.0372 CAL_IN P-side: a = 2.4975 b(slope) = 0.0086 chi2 = 0.5480 VTP N-side(average) = 0.7065 V CAL_BASE = 2.4985 V VTP P-side(average) = 0.4328 V CAL_VREF = 3.0478 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:311 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0098 b(slope) = 0.0109 chi2 = 1.0795 VTN P-side: a = 0.0101 b(slope) = 0.0066 chi2 = 0.3962 CAL_IN N-side: a = 2.4581 b(slope) = 0.0117 chi2 = 99.0000 CAL_IN P-side: a = 2.4843 b(slope) = 0.0104 chi2 = 99.0000 VTP N-side(average) = 0.7064 V CAL_BASE = 2.4878 V VTP P-side(average) = 0.4324 V CAL_VREF = 3.0440 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:411 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0109 chi2 = 2.9173 VTN P-side: a = 0.0103 b(slope) = 0.0066 chi2 = 0.9082 CAL_IN N-side: a = 2.5180 b(slope) = 0.0085 chi2 = 1.6871 CAL_IN P-side: a = 2.5185 b(slope) = 0.0084 chi2 = 2.4995 VTP N-side(average) = 0.7106 V CAL_BASE = 2.5212 V VTP P-side(average) = 0.4366 V CAL_VREF = 3.0640 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:511 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0108 chi2 = 0.6996 VTN P-side: a = 0.0097 b(slope) = 0.0066 chi2 = 0.3388 CAL_IN N-side: a = 2.5329 b(slope) = 0.0083 chi2 = 0.6904 CAL_IN P-side: a = 2.5322 b(slope) = 0.0084 chi2 = 0.3418 VTP N-side(average) = 0.7044 V CAL_BASE = 2.5349 V VTP P-side(average) = 0.4340 V CAL_VREF = 3.0708 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:611 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0111 chi2 = 1.0945 VTN P-side: a = 0.0098 b(slope) = 0.0068 chi2 = 0.5140 CAL_IN N-side: a = 2.5116 b(slope) = 0.0085 chi2 = 0.8835 CAL_IN P-side: a = 2.5116 b(slope) = 0.0085 chi2 = 0.3259 VTP N-side(average) = 0.7195 V CAL_BASE = 2.5181 V VTP P-side(average) = 0.4449 V CAL_VREF = 3.0637 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4374.0 FUNCT@5.0V:ATOM45C_40 4374.0 FUNCT@5.0V:ATOM46C_40 4374.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 4374.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4374.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:711 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0112 chi2 = 0.8455 VTN P-side: a = 0.0097 b(slope) = 0.0068 chi2 = 0.6184 CAL_IN N-side: a = 2.5006 b(slope) = 0.0085 chi2 = 0.6146 CAL_IN P-side: a = 2.5008 b(slope) = 0.0084 chi2 = 1.1008 VTP N-side(average) = 0.7268 V CAL_BASE = 2.5061 V VTP P-side(average) = 0.4467 V CAL_VREF = 3.0496 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:811 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0111 chi2 = 0.7440 VTN P-side: a = 0.0100 b(slope) = 0.0069 chi2 = 0.5391 CAL_IN N-side: a = 2.5140 b(slope) = 0.0084 chi2 = 0.6054 CAL_IN P-side: a = 2.5141 b(slope) = 0.0084 chi2 = 0.3194 VTP N-side(average) = 0.7224 V CAL_BASE = 2.5171 V VTP P-side(average) = 0.4522 V CAL_VREF = 3.0557 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:812 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0112 chi2 = 0.7987 VTN P-side: a = 0.0105 b(slope) = 0.0069 chi2 = 0.6177 CAL_IN N-side: a = 2.5127 b(slope) = 0.0084 chi2 = 1.2437 CAL_IN P-side: a = 2.5128 b(slope) = 0.0084 chi2 = 0.5069 VTP N-side(average) = 0.7275 V CAL_BASE = 2.5173 V VTP P-side(average) = 0.4523 V CAL_VREF = 3.0559 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:712 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0338 b(slope) = 0.0106 chi2 = 99.0000 VTN P-side: a = 0.0098 b(slope) = 0.0068 chi2 = 0.3924 CAL_IN N-side: a = 2.5266 b(slope) = 0.0078 chi2 = 99.0000 CAL_IN P-side: a = 2.4959 b(slope) = 0.0085 chi2 = 0.3748 VTP N-side(average) = 0.7233 V CAL_BASE = 2.5034 V VTP P-side(average) = 0.4474 V CAL_VREF = 3.0505 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:612 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0088 b(slope) = 0.0111 chi2 = 2.6588 VTN P-side: a = 0.0094 b(slope) = 0.0068 chi2 = 0.6168 CAL_IN N-side: a = 2.5134 b(slope) = 0.0085 chi2 = 1.6413 CAL_IN P-side: a = 2.5140 b(slope) = 0.0085 chi2 = 1.1203 VTP N-side(average) = 0.7201 V CAL_BASE = 2.5183 V VTP P-side(average) = 0.4480 V CAL_VREF = 3.0630 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:512 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0094 b(slope) = 0.0110 chi2 = 1.3244 VTN P-side: a = 0.0098 b(slope) = 0.0068 chi2 = 0.6194 CAL_IN N-side: a = 2.4922 b(slope) = 0.0111 chi2 = 99.0000 CAL_IN P-side: a = 2.5147 b(slope) = 0.0100 chi2 = 99.0000 VTP N-side(average) = 0.7154 V CAL_BASE = 2.5154 V VTP P-side(average) = 0.4433 V CAL_VREF = 3.0603 V FUNCT. DIGITAL TEST = 8 error detected in test: FUNCT@5.0V:ATOM13B 1291.0 FUNCT@5.0V:ATOM13C 1291.0 FUNCT@5.0V:ATOM25 2221.0 FUNCT@5.0V:ATOM25HF 2221.0 FUNCT@5.0V:ATOM37B 1404.0 FUNCT@5.0V:ATOM37C 1195.0 FUNCT@5.0V:ATOM37D 1163.0 FUNCT@5.0V:ATOM37E 1347.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:412 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0109 chi2 = 0.8556 VTN P-side: a = 0.0107 b(slope) = 0.0066 chi2 = 0.5142 CAL_IN N-side: a = 2.5009 b(slope) = 0.0085 chi2 = 0.7842 CAL_IN P-side: a = 2.5008 b(slope) = 0.0085 chi2 = 0.6649 VTP N-side(average) = 0.7103 V CAL_BASE = 2.5068 V VTP P-side(average) = 0.4369 V CAL_VREF = 3.0510 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:312 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0097 b(slope) = 0.0109 chi2 = 1.8013 VTN P-side: a = 0.0102 b(slope) = 0.0067 chi2 = 0.5049 CAL_IN N-side: a = 2.5529 b(slope) = 0.0109 chi2 = 99.0000 CAL_IN P-side: a = 2.5459 b(slope) = 0.0097 chi2 = 99.0000 VTP N-side(average) = 0.7090 V CAL_BASE = 2.5339 V VTP P-side(average) = 0.4378 V CAL_VREF = 3.0674 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:212 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0222 b(slope) = 0.0107 chi2 = 99.0000 VTN P-side: a = 0.0114 b(slope) = 0.0066 chi2 = 0.7625 CAL_IN N-side: a = 2.5003 b(slope) = 0.0083 chi2 = 99.0000 CAL_IN P-side: a = 2.4853 b(slope) = 0.0086 chi2 = 1.0943 VTP N-side(average) = 0.7141 V CAL_BASE = 2.4897 V VTP P-side(average) = 0.4383 V CAL_VREF = 3.0425 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5323.0 FUNCT@5.0V:ATOM45C_40 3667.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 5323.0 FUNCT@5.0V:ATOM48C_40 5323.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5323.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:413 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0115 b(slope) = 0.0109 chi2 = 1.2371 VTN P-side: a = 0.0118 b(slope) = 0.0066 chi2 = 0.3445 CAL_IN N-side: a = 2.4937 b(slope) = 0.0086 chi2 = 0.9415 CAL_IN P-side: a = 2.4942 b(slope) = 0.0086 chi2 = 0.7263 VTP N-side(average) = 0.7080 V CAL_BASE = 2.4976 V VTP P-side(average) = 0.4360 V CAL_VREF = 3.0466 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 2009.0 FUNCT@5.0V:ATOM15 2053.0 FUNCT@5.0V:ATOM17 4365.0 FUNCT@5.0V:ATOM18 4381.0 FUNCT@5.0V:ATOM18HF 4381.0 FUNCT@5.0V:ATOM19 4317.0 FUNCT@5.0V:ATOM19D 4332.0 FUNCT@5.0V:ATOM19E 3559.0 FUNCT@5.0V:ATOM19F 7432.0 FUNCT@5.0V:ATOM19FHF 7432.0 FUNCT@5.0V:ATOM20 2025.0 FUNCT@5.0V:ATOM21 2001.0 FUNCT@5.0V:ATOM22 1989.0 FUNCT@5.0V:ATOM25 2007.0 FUNCT@5.0V:ATOM25HF 2007.0 FUNCT@5.0V:ATOM26A 1986.0 FUNCT@5.0V:ATOM26B 2795.0 FUNCT@5.0V:ATOM28 2123.0 FUNCT@5.0V:ATOM29 2123.0 FUNCT@5.0V:ATOM30 2123.0 FUNCT@5.0V:ATOM31A 1757.0 FUNCT@5.0V:ATOM31B 1946.0 FUNCT@5.0V:ATOM32 1757.0 FUNCT@5.0V:ATOM33 2123.0 FUNCT@5.0V:ATOM35 2257.0 FUNCT@5.0V:ATOM36 2013.0 FUNCT@5.0V:ATOM37A 3113.0 FUNCT@5.0V:ATOM37B 3105.0 FUNCT@5.0V:ATOM37C 3089.0 FUNCT@5.0V:ATOM37D 3057.0 FUNCT@5.0V:ATOM37E 3048.0 FUNCT@5.0V:ATOM39 2034.0 FUNCT@5.0V:ATOM41 2560.0 FUNCT@5.0V:ATOM41A 2560.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5968.0 FUNCT@5.0V:ATOM45C_40 5968.0 FUNCT@5.0V:ATOM46C_40 4277.0 FUNCT@5.0V:ATOM47C_40 5503.0 FUNCT@5.0V:ATOM48C_40 5968.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5968.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:513 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0121 b(slope) = 0.0107 chi2 = 1.1169 VTN P-side: a = 0.0119 b(slope) = 0.0066 chi2 = 0.3788 CAL_IN N-side: a = 2.4926 b(slope) = 0.0085 chi2 = 1.2226 CAL_IN P-side: a = 2.4931 b(slope) = 0.0085 chi2 = 1.1020 VTP N-side(average) = 0.7006 V CAL_BASE = 2.4990 V VTP P-side(average) = 0.4329 V CAL_VREF = 3.0461 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:613 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0110 chi2 = 1.0287 VTN P-side: a = 0.0100 b(slope) = 0.0068 chi2 = 0.7787 CAL_IN N-side: a = 2.4814 b(slope) = 0.0086 chi2 = 0.7298 CAL_IN P-side: a = 2.4816 b(slope) = 0.0086 chi2 = 0.7445 VTP N-side(average) = 0.7129 V CAL_BASE = 2.4893 V VTP P-side(average) = 0.4433 V CAL_VREF = 3.0400 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:614 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0111 chi2 = 1.7640 VTN P-side: a = 0.0095 b(slope) = 0.0068 chi2 = 0.4878 CAL_IN N-side: a = 2.4983 b(slope) = 0.0085 chi2 = 1.4002 CAL_IN P-side: a = 2.4982 b(slope) = 0.0085 chi2 = 0.7456 VTP N-side(average) = 0.7214 V CAL_BASE = 2.5020 V VTP P-side(average) = 0.4464 V CAL_VREF = 3.0440 V FUNCT. DIGITAL TEST = 51 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 FUNCT@5.0V:ATOM7TO9B 272.0 FUNCT@5.0V:ATOM7TO9C 272.0 FUNCT@5.0V:ATOM7TO9D 272.0 FUNCT@5.0V:ATOM7TO9E 272.0 FUNCT@5.0V:ATOM10TO12 496.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM34 268.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 FUNCT@5.0V:ATOM42 214.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:514 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.2282 b(slope) = 0.0000 chi2 = 0.3345 VTN P-side: a = 0.1432 b(slope) = 0.0000 chi2 = 0.2601 CAL_IN N-side: a = 2.7658 b(slope) = 0.0000 chi2 = 0.3851 CAL_IN P-side: a = 2.7658 b(slope) = 0.0000 chi2 = 0.3298 VTP N-side(average) = 0.7112 V CAL_BASE = 2.4944 V VTP P-side(average) = 0.4379 V CAL_VREF = 3.0469 V FUNCT. DIGITAL TEST = 51 error detected in test: FUNCT@5.0V:ATOM1TO6A 275.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 FUNCT@5.0V:ATOM7TO9B 272.0 FUNCT@5.0V:ATOM7TO9C 272.0 FUNCT@5.0V:ATOM7TO9D 272.0 FUNCT@5.0V:ATOM7TO9E 272.0 FUNCT@5.0V:ATOM10TO12 496.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM34 268.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 FUNCT@5.0V:ATOM42 369.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 288.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:414 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0109 chi2 = 1.1825 VTN P-side: a = 0.0099 b(slope) = 0.0066 chi2 = 0.6632 CAL_IN N-side: a = 2.4957 b(slope) = 0.0085 chi2 = 0.6267 CAL_IN P-side: a = 2.4952 b(slope) = 0.0085 chi2 = 0.6293 VTP N-side(average) = 0.7084 V CAL_BASE = 2.4993 V VTP P-side(average) = 0.4364 V CAL_VREF = 3.0422 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM42 262.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 +++++++++ WAFER DATA+++++++++++++++++++++++++++ CLASSES: A-->Good, B-->Probably Good, C-->Bad A B C ------------------------- 303 403 401 404 307 501 205 608 601 405 308 602 505 502 706 402 506 203 107 503 507 603 707 703 708 803 508 804 209 704 309 604 509 504 609 304 709 204 710 305 610 605 410 705 310 805 211 806 411 606 811 406 812 306 612 206 412 207 513 407 613 607 807 907 908 808 408 208 108 409 809 810 510 210 311 511 611 711 712 512 312 212 413 614 514 414 ---------------------------- 29 4 53 NUMBER OF CHIPS TESTED = 86 NUMBER OF CLASS A CHIPS = 29 NUMBER OF CLASS B CHIPS = 4 NUMBER OF CLASS C CHIPS = 53 YIELD = 33.72 %