------- CHIP ID:401 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1034 IDDSB:VDD1B 0.1097 IDDSB:VDD1C 0.1154 IDDSB:VDD1D 0.1204 IDDOP1:DVDD 0.1163 DACS TEST = 1 VTN N-side: a = 0.0091 b(slope) = 0.0110 chi2 = 1.1783 VTN P-side: a = 0.0093 b(slope) = 0.0066 chi2 = 0.5435 CAL_IN N-side: a = 2.4487 b(slope) = 0.0102 chi2 = 99.0000 CAL_IN P-side: a = 2.4625 b(slope) = 0.0102 chi2 = 99.0000 VTP N-side(average) = 0.7137 V CAL_BASE = 2.4700 V VTP P-side(average) = 0.4341 V CAL_VREF = 3.0461 V FUNCT. DIGITAL TEST = 6 error detected in test: FUNCT@5.0V:ATOM13B 1611.0 FUNCT@5.0V:ATOM13C 1611.0 FUNCT@5.0V:ATOM37B 2170.0 FUNCT@5.0V:ATOM37C 2154.0 FUNCT@5.0V:ATOM37D 2122.0 FUNCT@5.0V:ATOM37E 2113.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:501 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: IDDSB:VDD1B 0.1053 IDDSB:VDD1C 0.1111 IDDSB:VDD1D 0.1161 IDDOP1:DVDD 0.1064 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0108 chi2 = 1.2479 VTN P-side: a = 0.0094 b(slope) = 0.0065 chi2 = 0.5326 CAL_IN N-side: a = 2.4865 b(slope) = 0.0089 chi2 = 0.7216 CAL_IN P-side: a = 2.4865 b(slope) = 0.0089 chi2 = 0.9209 VTP N-side(average) = 0.7026 V CAL_BASE = 2.4878 V VTP P-side(average) = 0.4279 V CAL_VREF = 3.0557 V FUNCT. DIGITAL TEST = 4 error detected in test: FUNCT@5.0V:ATOM13B 1851.0 FUNCT@5.0V:ATOM13C 1851.0 FUNCT@5.0V:ATOM37C 2635.0 FUNCT@5.0V:ATOM37D 2603.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:601 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: IDDSB:VDD1B 0.1045 IDDSB:VDD1C 0.1101 IDDSB:VDD1D 0.1149 IDDOP1:DVDD 0.1093 DACS TEST = 1 VTN N-side: a = 0.0089 b(slope) = 0.0103 chi2 = 1.4859 VTN P-side: a = 0.0092 b(slope) = 0.0062 chi2 = 0.6929 CAL_IN N-side: a = 2.4951 b(slope) = 0.0086 chi2 = 12.4102 CAL_IN P-side: a = 2.4865 b(slope) = 0.0077 chi2 = 99.0000 VTP N-side(average) = 0.6716 V CAL_BASE = 2.4861 V VTP P-side(average) = 0.4080 V CAL_VREF = 3.0413 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:602 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 2 error detected in test: IDDSB:VDD1C 0.1015 IDDSB:VDD1D 0.1067 DACS TEST = 1 VTN N-side: a = 0.0086 b(slope) = 0.0062 chi2 = 11.1270 VTN P-side: a = 0.0089 b(slope) = 0.0063 chi2 = 6.2849 CAL_IN N-side: a = 2.5891 b(slope) = 0.0077 chi2 = 32.4539 CAL_IN P-side: a = 2.5135 b(slope) = 0.0083 chi2 = 20.2643 VTP N-side(average) = 0.4056 V CAL_BASE = 2.5916 V VTP P-side(average) = 0.4131 V CAL_VREF = 3.0828 V FUNCT. DIGITAL TEST = 35 error detected in test: FUNCT@5.0V:ATOM13A 1656.0 FUNCT@5.0V:ATOM15 1700.0 FUNCT@5.0V:ATOM17 4012.0 FUNCT@5.0V:ATOM18 4028.0 FUNCT@5.0V:ATOM18HF 4028.0 FUNCT@5.0V:ATOM19 3964.0 FUNCT@5.0V:ATOM19D 3979.0 FUNCT@5.0V:ATOM19E 3206.0 FUNCT@5.0V:ATOM19F 7079.0 FUNCT@5.0V:ATOM19FHF 7079.0 FUNCT@5.0V:ATOM20 1672.0 FUNCT@5.0V:ATOM21 1648.0 FUNCT@5.0V:ATOM22 1636.0 FUNCT@5.0V:ATOM25 1654.0 FUNCT@5.0V:ATOM25HF 1654.0 FUNCT@5.0V:ATOM26A 1633.0 FUNCT@5.0V:ATOM26B 2442.0 FUNCT@5.0V:ATOM28 1770.0 FUNCT@5.0V:ATOM29 1770.0 FUNCT@5.0V:ATOM30 1770.0 FUNCT@5.0V:ATOM31A 1404.0 FUNCT@5.0V:ATOM31B 1593.0 FUNCT@5.0V:ATOM32 1404.0 FUNCT@5.0V:ATOM33 1770.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1904.0 FUNCT@5.0V:ATOM36 1660.0 FUNCT@5.0V:ATOM37A 2408.0 FUNCT@5.0V:ATOM37B 2400.0 FUNCT@5.0V:ATOM37C 2384.0 FUNCT@5.0V:ATOM37D 2352.0 FUNCT@5.0V:ATOM37E 2343.0 FUNCT@5.0V:ATOM39 1681.0 FUNCT@5.0V:ATOM41 2207.0 FUNCT@5.0V:ATOM41A 2207.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5791.0 FUNCT@5.0V:ATOM45C_40 5791.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3667.0 FUNCT@5.0V:ATOM48C_40 5791.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5791.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:502 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: IDDSB:VDD1B 0.1054 IDDSB:VDD1C 0.1109 IDDSB:VDD1D 0.1160 IDDOP1:DVDD 0.1062 DACS TEST = 1 VTN N-side: a = 0.1614 b(slope) = 0.0023 chi2 = 99.0000 VTN P-side: a = 0.0762 b(slope) = 0.0030 chi2 = 99.0000 CAL_IN N-side: a = 2.6585 b(slope) = 0.0028 chi2 = 99.0000 CAL_IN P-side: a = 2.6558 b(slope) = 0.0039 chi2 = 99.0000 VTP N-side(average) = 0.7008 V CAL_BASE = 2.4959 V VTP P-side(average) = 0.4226 V CAL_VREF = 3.0498 V FUNCT. DIGITAL TEST = 37 error detected in test: FUNCT@5.0V:ATOM13A 1079.0 FUNCT@5.0V:ATOM13B 1519.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1123.0 FUNCT@5.0V:ATOM17 3435.0 FUNCT@5.0V:ATOM18 3451.0 FUNCT@5.0V:ATOM18HF 3451.0 FUNCT@5.0V:ATOM19 3387.0 FUNCT@5.0V:ATOM19D 3402.0 FUNCT@5.0V:ATOM19E 2629.0 FUNCT@5.0V:ATOM19F 6502.0 FUNCT@5.0V:ATOM19FHF 6502.0 FUNCT@5.0V:ATOM20 1095.0 FUNCT@5.0V:ATOM21 1071.0 FUNCT@5.0V:ATOM22 1059.0 FUNCT@5.0V:ATOM25 1077.0 FUNCT@5.0V:ATOM25HF 1077.0 FUNCT@5.0V:ATOM26A 1056.0 FUNCT@5.0V:ATOM26B 1865.0 FUNCT@5.0V:ATOM28 1193.0 FUNCT@5.0V:ATOM29 1193.0 FUNCT@5.0V:ATOM30 1193.0 FUNCT@5.0V:ATOM31A 827.0 FUNCT@5.0V:ATOM31B 1016.0 FUNCT@5.0V:ATOM32 827.0 FUNCT@5.0V:ATOM33 1193.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1327.0 FUNCT@5.0V:ATOM36 1083.0 FUNCT@5.0V:ATOM37A 2006.0 FUNCT@5.0V:ATOM37B 1998.0 FUNCT@5.0V:ATOM37C 1982.0 FUNCT@5.0V:ATOM37D 1950.0 FUNCT@5.0V:ATOM37E 1941.0 FUNCT@5.0V:ATOM39 1104.0 FUNCT@5.0V:ATOM41 1630.0 FUNCT@5.0V:ATOM41A 1630.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:402 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1077 IDDSB:VDD1B 0.1137 IDDSB:VDD1C 0.1195 IDDSB:VDD1D 0.1246 IDDOP1:DVDD 0.1117 DACS TEST = 2 VTN N-side: a = 0.0081 b(slope) = 0.0107 chi2 = 0.7940 VTN P-side: a = 0.0083 b(slope) = 0.0064 chi2 = 0.5735 CAL_IN N-side: a = 2.5670 b(slope) = 0.0082 chi2 = 26.0952 CAL_IN P-side: a = 2.5710 b(slope) = 0.0082 chi2 = 17.2951 VTP N-side(average) = 0.6913 V CAL_BASE = 2.5671 V VTP P-side(average) = 0.4188 V CAL_VREF = 3.0869 V FUNCT. DIGITAL TEST = 37 error detected in test: FUNCT@5.0V:ATOM13A 1191.0 FUNCT@5.0V:ATOM13B 1615.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1235.0 FUNCT@5.0V:ATOM17 3547.0 FUNCT@5.0V:ATOM18 3563.0 FUNCT@5.0V:ATOM18HF 3563.0 FUNCT@5.0V:ATOM19 3499.0 FUNCT@5.0V:ATOM19D 3514.0 FUNCT@5.0V:ATOM19E 2741.0 FUNCT@5.0V:ATOM19F 6614.0 FUNCT@5.0V:ATOM19FHF 6614.0 FUNCT@5.0V:ATOM20 1207.0 FUNCT@5.0V:ATOM21 1183.0 FUNCT@5.0V:ATOM22 1171.0 FUNCT@5.0V:ATOM25 1189.0 FUNCT@5.0V:ATOM25HF 1189.0 FUNCT@5.0V:ATOM26A 1168.0 FUNCT@5.0V:ATOM26B 1977.0 FUNCT@5.0V:ATOM28 1305.0 FUNCT@5.0V:ATOM29 1305.0 FUNCT@5.0V:ATOM30 1305.0 FUNCT@5.0V:ATOM31A 939.0 FUNCT@5.0V:ATOM31B 1128.0 FUNCT@5.0V:ATOM32 939.0 FUNCT@5.0V:ATOM33 1305.0 FUNCT@5.0V:ATOM35 1439.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 FUNCT@5.0V:ATOM42 214.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:203 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0092 b(slope) = 0.0107 chi2 = 2.0579 VTN P-side: a = 0.0097 b(slope) = 0.0065 chi2 = 0.6214 CAL_IN N-side: a = 2.5001 b(slope) = 0.0083 chi2 = 0.7933 CAL_IN P-side: a = 2.4999 b(slope) = 0.0083 chi2 = 2.0166 VTP N-side(average) = 0.6929 V CAL_BASE = 2.5000 V VTP P-side(average) = 0.4269 V CAL_VREF = 3.0308 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:303 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0113 chi2 = 1.0275 VTN P-side: a = 0.0094 b(slope) = 0.0068 chi2 = 0.4799 CAL_IN N-side: a = 2.5240 b(slope) = 0.0082 chi2 = 0.4723 CAL_IN P-side: a = 2.5242 b(slope) = 0.0082 chi2 = 0.6127 VTP N-side(average) = 0.7318 V CAL_BASE = 2.5252 V VTP P-side(average) = 0.4425 V CAL_VREF = 3.0493 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5307.0 FUNCT@5.0V:ATOM45C_40 5163.0 FUNCT@5.0V:ATOM46C_40 4503.0 FUNCT@5.0V:ATOM47C_40 5307.0 FUNCT@5.0V:ATOM48C_40 5003.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5307.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:403 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 3 error detected in test: IDDSB:VDD1C 0.1026 IDDSB:VDD1D 0.1074 IDDOP1:DVDD 0.1047 DACS TEST = 1 VTN N-side: a = 0.1722 b(slope) = 0.0026 chi2 = 99.0000 VTN P-side: a = 0.0809 b(slope) = 0.0035 chi2 = 99.0000 CAL_IN N-side: a = 2.6907 b(slope) = 0.0022 chi2 = 99.0000 CAL_IN P-side: a = 2.6468 b(slope) = 0.0046 chi2 = 99.0000 VTP N-side(average) = 0.6851 V CAL_BASE = 2.4844 V VTP P-side(average) = 0.4188 V CAL_VREF = 3.0376 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1287.0 FUNCT@5.0V:ATOM15 1331.0 FUNCT@5.0V:ATOM17 3643.0 FUNCT@5.0V:ATOM18 3659.0 FUNCT@5.0V:ATOM18HF 3659.0 FUNCT@5.0V:ATOM19 3595.0 FUNCT@5.0V:ATOM19D 3610.0 FUNCT@5.0V:ATOM19E 2837.0 FUNCT@5.0V:ATOM19F 6710.0 FUNCT@5.0V:ATOM19FHF 6710.0 FUNCT@5.0V:ATOM20 1303.0 FUNCT@5.0V:ATOM21 1279.0 FUNCT@5.0V:ATOM22 1267.0 FUNCT@5.0V:ATOM25 1285.0 FUNCT@5.0V:ATOM25HF 1285.0 FUNCT@5.0V:ATOM26A 1264.0 FUNCT@5.0V:ATOM26B 2073.0 FUNCT@5.0V:ATOM28 1401.0 FUNCT@5.0V:ATOM29 1401.0 FUNCT@5.0V:ATOM30 1401.0 FUNCT@5.0V:ATOM31A 1035.0 FUNCT@5.0V:ATOM31B 1224.0 FUNCT@5.0V:ATOM32 1035.0 FUNCT@5.0V:ATOM33 1401.0 FUNCT@5.0V:ATOM35 1535.0 FUNCT@5.0V:ATOM36 1291.0 FUNCT@5.0V:ATOM37A 1670.0 FUNCT@5.0V:ATOM37B 1662.0 FUNCT@5.0V:ATOM37C 1646.0 FUNCT@5.0V:ATOM37D 1614.0 FUNCT@5.0V:ATOM37E 1605.0 FUNCT@5.0V:ATOM39 1312.0 FUNCT@5.0V:ATOM41 1838.0 FUNCT@5.0V:ATOM41A 1838.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4391.0 FUNCT@5.0V:ATOM45C_40 4391.0 FUNCT@5.0V:ATOM46C_40 4391.0 FUNCT@5.0V:ATOM47C_40 4391.0 FUNCT@5.0V:ATOM48C_40 4391.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4391.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:503 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1049 IDDSB:VDD1B 0.1109 IDDSB:VDD1C 0.1161 IDDSB:VDD1D 0.1208 IDDOP1:DVDD 0.1060 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0104 chi2 = 2.3879 VTN P-side: a = 0.0096 b(slope) = 0.0064 chi2 = 0.5334 CAL_IN N-side: a = 2.6153 b(slope) = 0.0071 chi2 = 0.3599 CAL_IN P-side: a = 2.5484 b(slope) = 0.0081 chi2 = 0.4491 VTP N-side(average) = 0.6793 V CAL_BASE = 2.6152 V VTP P-side(average) = 0.4184 V CAL_VREF = 3.0679 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:603 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDSB:VDD1D 0.1042 DACS TEST = 1 VTN N-side: a = 0.0104 b(slope) = 0.0101 chi2 = 0.4521 VTN P-side: a = 0.0103 b(slope) = 0.0062 chi2 = 0.5716 CAL_IN N-side: a = 2.7396 b(slope) = 0.0076 chi2 = 99.0000 CAL_IN P-side: a = 2.6014 b(slope) = 0.0089 chi2 = 99.0000 VTP N-side(average) = 0.6594 V CAL_BASE = 2.5286 V VTP P-side(average) = 0.4055 V CAL_VREF = 3.0422 V FUNCT. DIGITAL TEST = 8 error detected in test: FUNCT@5.0V:ATOM1TO6A 2199.0 FUNCT@5.0V:ATOM13B 1807.0 FUNCT@5.0V:ATOM13C 1807.0 FUNCT@5.0V:ATOM37A 2582.0 FUNCT@5.0V:ATOM37B 2574.0 FUNCT@5.0V:ATOM37C 2558.0 FUNCT@5.0V:ATOM37D 2526.0 FUNCT@5.0V:ATOM37E 2517.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5227.0 FUNCT@5.0V:ATOM45C_40 4908.0 FUNCT@5.0V:ATOM46C_40 5227.0 FUNCT@5.0V:ATOM47C_40 5227.0 FUNCT@5.0V:ATOM48C_40 5227.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5227.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:703 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0221 b(slope) = 0.0101 chi2 = 99.0000 VTN P-side: a = 0.0104 b(slope) = 0.0063 chi2 = 0.4122 CAL_IN N-side: a = 2.8364 b(slope) = 0.0054 chi2 = 99.0000 CAL_IN P-side: a = 2.6406 b(slope) = 0.0082 chi2 = 99.0000 VTP N-side(average) = 0.6760 V CAL_BASE = 2.5515 V VTP P-side(average) = 0.4128 V CAL_VREF = 3.0618 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:803 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0106 chi2 = 3.5608 VTN P-side: a = 0.0106 b(slope) = 0.0065 chi2 = 0.9541 CAL_IN N-side: a = 2.4896 b(slope) = 0.0083 chi2 = 0.8774 CAL_IN P-side: a = 2.4894 b(slope) = 0.0083 chi2 = 0.7461 VTP N-side(average) = 0.6920 V CAL_BASE = 2.4851 V VTP P-side(average) = 0.4308 V CAL_VREF = 3.0151 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:804 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0092 b(slope) = 0.0106 chi2 = 1.5493 VTN P-side: a = 0.0095 b(slope) = 0.0065 chi2 = 0.9119 CAL_IN N-side: a = 2.4856 b(slope) = 0.0082 chi2 = 1.0970 CAL_IN P-side: a = 2.4854 b(slope) = 0.0082 chi2 = 0.4285 VTP N-side(average) = 0.6905 V CAL_BASE = 2.4866 V VTP P-side(average) = 0.4293 V CAL_VREF = 3.0107 V FUNCT. DIGITAL TEST = 2 error detected in test: FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM26A 1640.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:704 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0090 b(slope) = 0.0103 chi2 = 1.0464 VTN P-side: a = 0.0092 b(slope) = 0.0062 chi2 = 0.3136 CAL_IN N-side: a = 2.5153 b(slope) = 0.0081 chi2 = 1.4415 CAL_IN P-side: a = 2.5162 b(slope) = 0.0081 chi2 = 5.9243 VTP N-side(average) = 0.6685 V CAL_BASE = 2.5190 V VTP P-side(average) = 0.4052 V CAL_VREF = 3.0388 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1128.0 FUNCT@5.0V:ATOM13C 1128.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 962.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM23 882.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 926.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1026.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1216.0 FUNCT@5.0V:ATOM37B 1206.0 FUNCT@5.0V:ATOM37C 1191.0 FUNCT@5.0V:ATOM37D 1160.0 FUNCT@5.0V:ATOM37E 1151.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:604 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1019 IDDSB:VDD1B 0.1080 IDDSB:VDD1C 0.1136 IDDSB:VDD1D 0.1182 IDDOP1:DVDD 0.1110 DACS TEST = 1 VTN N-side: a = 0.0986 b(slope) = 0.0056 chi2 = 99.0000 VTN P-side: a = 0.1055 b(slope) = 0.0011 chi2 = 99.0000 CAL_IN N-side: a = 2.5381 b(slope) = 0.0050 chi2 = 99.0000 CAL_IN P-side: a = 2.6151 b(slope) = 0.0020 chi2 = 99.0000 VTP N-side(average) = 0.6784 V CAL_BASE = 2.4207 V VTP P-side(average) = 0.4105 V CAL_VREF = 2.9890 V FUNCT. DIGITAL TEST = 39 error detected in test: FUNCT@5.0V:ATOM1TO6A 212.0 FUNCT@5.0V:ATOM13A 1095.0 FUNCT@5.0V:ATOM13B 2168.0 FUNCT@5.0V:ATOM13C 2168.0 FUNCT@5.0V:ATOM15 1139.0 FUNCT@5.0V:ATOM17 3451.0 FUNCT@5.0V:ATOM18 3467.0 FUNCT@5.0V:ATOM18HF 3467.0 FUNCT@5.0V:ATOM19 3403.0 FUNCT@5.0V:ATOM19D 3418.0 FUNCT@5.0V:ATOM19E 2645.0 FUNCT@5.0V:ATOM19F 6518.0 FUNCT@5.0V:ATOM19FHF 6518.0 FUNCT@5.0V:ATOM20 1111.0 FUNCT@5.0V:ATOM21 1087.0 FUNCT@5.0V:ATOM22 1075.0 FUNCT@5.0V:ATOM23 1000.0 FUNCT@5.0V:ATOM24 1100.0 FUNCT@5.0V:ATOM25 1093.0 FUNCT@5.0V:ATOM25HF 1093.0 FUNCT@5.0V:ATOM26A 1072.0 FUNCT@5.0V:ATOM26B 1881.0 FUNCT@5.0V:ATOM28 1209.0 FUNCT@5.0V:ATOM29 1209.0 FUNCT@5.0V:ATOM30 1209.0 FUNCT@5.0V:ATOM31A 843.0 FUNCT@5.0V:ATOM31B 1032.0 FUNCT@5.0V:ATOM32 843.0 FUNCT@5.0V:ATOM33 1209.0 FUNCT@5.0V:ATOM35 1343.0 FUNCT@5.0V:ATOM36 1099.0 FUNCT@5.0V:ATOM37A 1286.0 FUNCT@5.0V:ATOM37B 1278.0 FUNCT@5.0V:ATOM37C 1262.0 FUNCT@5.0V:ATOM37D 1230.0 FUNCT@5.0V:ATOM37E 1221.0 FUNCT@5.0V:ATOM39 1120.0 FUNCT@5.0V:ATOM41 1646.0 FUNCT@5.0V:ATOM41A 1646.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4261.0 FUNCT@5.0V:ATOM45C_40 3811.0 FUNCT@5.0V:ATOM46C_40 4261.0 FUNCT@5.0V:ATOM47C_40 4261.0 FUNCT@5.0V:ATOM48C_40 4261.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4261.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1427.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:504 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: IDDSB:VDD1B 0.1060 IDDSB:VDD1C 0.1111 IDDSB:VDD1D 0.1161 IDDOP1:DVDD 0.1082 DACS TEST = 0 VTN N-side: a = 0.0082 b(slope) = 0.0107 chi2 = 3.8308 VTN P-side: a = 0.0090 b(slope) = 0.0064 chi2 = 1.1357 CAL_IN N-side: a = 2.5053 b(slope) = 0.0085 chi2 = 1.5224 CAL_IN P-side: a = 2.5051 b(slope) = 0.0085 chi2 = 1.0445 VTP N-side(average) = 0.6930 V CAL_BASE = 2.5020 V VTP P-side(average) = 0.4222 V CAL_VREF = 3.0457 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1119.0 FUNCT@5.0V:ATOM13C 1119.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM23 975.0 FUNCT@5.0V:ATOM24 1077.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1216.0 FUNCT@5.0V:ATOM37B 1201.0 FUNCT@5.0V:ATOM37C 1183.0 FUNCT@5.0V:ATOM37D 1151.0 FUNCT@5.0V:ATOM37E 1142.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3668.0 FUNCT@5.0V:ATOM45C_40 3666.0 FUNCT@5.0V:ATOM46C_40 3668.0 FUNCT@5.0V:ATOM47C_40 3666.0 FUNCT@5.0V:ATOM48C_40 3666.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3666.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1244.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:404 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 3 error detected in test: IDDSB:VDD1C 0.1004 IDDSB:VDD1D 0.1053 IDDOP1:DVDD 0.1072 DACS TEST = 1 VTN N-side: a = 0.2246 b(slope) = 0.0000 chi2 = 0.3237 VTN P-side: a = 0.1387 b(slope) = 0.0000 chi2 = 0.4156 CAL_IN N-side: a = 2.7727 b(slope) = 0.0000 chi2 = 0.2636 CAL_IN P-side: a = 2.7728 b(slope) = 0.0000 chi2 = 0.3016 VTP N-side(average) = 0.7019 V CAL_BASE = 2.5120 V VTP P-side(average) = 0.4253 V CAL_VREF = 3.0474 V FUNCT. DIGITAL TEST = 51 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 FUNCT@5.0V:ATOM7TO9B 272.0 FUNCT@5.0V:ATOM7TO9C 272.0 FUNCT@5.0V:ATOM7TO9D 272.0 FUNCT@5.0V:ATOM7TO9E 272.0 FUNCT@5.0V:ATOM10TO12 496.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 2152.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM34 268.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 FUNCT@5.0V:ATOM42 214.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:304 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0105 chi2 = 1.1214 VTN P-side: a = 0.0100 b(slope) = 0.0063 chi2 = 0.3163 CAL_IN N-side: a = 2.4713 b(slope) = 0.0086 chi2 = 0.6819 CAL_IN P-side: a = 2.4712 b(slope) = 0.0086 chi2 = 0.3687 VTP N-side(average) = 0.6835 V CAL_BASE = 2.4807 V VTP P-side(average) = 0.4156 V CAL_VREF = 3.0300 V FUNCT. DIGITAL TEST = 8 error detected in test: FUNCT@5.0V:ATOM13B 1503.0 FUNCT@5.0V:ATOM13C 1503.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM37A 1974.0 FUNCT@5.0V:ATOM37B 1966.0 FUNCT@5.0V:ATOM37C 1950.0 FUNCT@5.0V:ATOM37D 1918.0 FUNCT@5.0V:ATOM37E 1909.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3859.0 FUNCT@5.0V:ATOM45C_40 3859.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3859.0 FUNCT@5.0V:ATOM48C_40 3859.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3859.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1411.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:204 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0106 chi2 = 0.7522 VTN P-side: a = 0.0108 b(slope) = 0.0065 chi2 = 0.4107 CAL_IN N-side: a = 2.5251 b(slope) = 0.0081 chi2 = 1.1385 CAL_IN P-side: a = 2.5249 b(slope) = 0.0081 chi2 = 0.9669 VTP N-side(average) = 0.6929 V CAL_BASE = 2.5232 V VTP P-side(average) = 0.4278 V CAL_VREF = 3.0427 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:205 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0110 b(slope) = 0.0106 chi2 = 0.6989 VTN P-side: a = 0.0112 b(slope) = 0.0065 chi2 = 0.3843 CAL_IN N-side: a = 2.4739 b(slope) = 0.0084 chi2 = 0.9166 CAL_IN P-side: a = 2.4737 b(slope) = 0.0084 chi2 = 0.7645 VTP N-side(average) = 0.6900 V CAL_BASE = 2.4763 V VTP P-side(average) = 0.4261 V CAL_VREF = 3.0117 V FUNCT. DIGITAL TEST = 35 error detected in test: FUNCT@5.0V:ATOM13A 1543.0 FUNCT@5.0V:ATOM15 1587.0 FUNCT@5.0V:ATOM17 3899.0 FUNCT@5.0V:ATOM18 3915.0 FUNCT@5.0V:ATOM18HF 3915.0 FUNCT@5.0V:ATOM19 3851.0 FUNCT@5.0V:ATOM19D 3866.0 FUNCT@5.0V:ATOM19E 3093.0 FUNCT@5.0V:ATOM19F 6966.0 FUNCT@5.0V:ATOM19FHF 6966.0 FUNCT@5.0V:ATOM20 1559.0 FUNCT@5.0V:ATOM21 1535.0 FUNCT@5.0V:ATOM22 1523.0 FUNCT@5.0V:ATOM25 1541.0 FUNCT@5.0V:ATOM25HF 1541.0 FUNCT@5.0V:ATOM26A 1520.0 FUNCT@5.0V:ATOM26B 2329.0 FUNCT@5.0V:ATOM28 1657.0 FUNCT@5.0V:ATOM29 1657.0 FUNCT@5.0V:ATOM30 1657.0 FUNCT@5.0V:ATOM31A 1291.0 FUNCT@5.0V:ATOM31B 1480.0 FUNCT@5.0V:ATOM32 1291.0 FUNCT@5.0V:ATOM33 1657.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1791.0 FUNCT@5.0V:ATOM36 1547.0 FUNCT@5.0V:ATOM37A 2183.0 FUNCT@5.0V:ATOM37B 2175.0 FUNCT@5.0V:ATOM37C 2159.0 FUNCT@5.0V:ATOM37D 2127.0 FUNCT@5.0V:ATOM37E 2118.0 FUNCT@5.0V:ATOM39 1568.0 FUNCT@5.0V:ATOM41 2094.0 FUNCT@5.0V:ATOM41A 2094.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4518.0 FUNCT@5.0V:ATOM45C_40 4518.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 4277.0 FUNCT@5.0V:ATOM48C_40 4518.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4518.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:305 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDSB:VDD1D 0.1011 DACS TEST = 0 VTN N-side: a = 0.0108 b(slope) = 0.0113 chi2 = 1.8524 VTN P-side: a = 0.0112 b(slope) = 0.0068 chi2 = 0.3723 CAL_IN N-side: a = 2.4472 b(slope) = 0.0087 chi2 = 0.4238 CAL_IN P-side: a = 2.4475 b(slope) = 0.0087 chi2 = 0.6329 VTP N-side(average) = 0.7384 V CAL_BASE = 2.4478 V VTP P-side(average) = 0.4470 V CAL_VREF = 3.0061 V FUNCT. DIGITAL TEST = 7 error detected in test: FUNCT@5.0V:ATOM13B 1598.0 FUNCT@5.0V:ATOM13C 1598.0 FUNCT@5.0V:ATOM37A 2166.0 FUNCT@5.0V:ATOM37B 2158.0 FUNCT@5.0V:ATOM37C 2142.0 FUNCT@5.0V:ATOM37D 2110.0 FUNCT@5.0V:ATOM37E 2101.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3923.0 FUNCT@5.0V:ATOM45C_40 3843.0 FUNCT@5.0V:ATOM46C_40 3731.0 FUNCT@5.0V:ATOM47C_40 3667.0 FUNCT@5.0V:ATOM48C_40 3923.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3923.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:405 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 2 error detected in test: IDDSB:VDD1C 0.1002 IDDSB:VDD1D 0.1053 DACS TEST = 0 VTN N-side: a = 0.0115 b(slope) = 0.0106 chi2 = 0.8298 VTN P-side: a = 0.0119 b(slope) = 0.0064 chi2 = 0.4897 CAL_IN N-side: a = 2.4777 b(slope) = 0.0086 chi2 = 0.6142 CAL_IN P-side: a = 2.4774 b(slope) = 0.0086 chi2 = 0.6754 VTP N-side(average) = 0.6893 V CAL_BASE = 2.4800 V VTP P-side(average) = 0.4198 V CAL_VREF = 3.0300 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:505 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 2 error detected in test: IDDSB:VDD1C 0.1023 IDDSB:VDD1D 0.1069 DACS TEST = 0 VTN N-side: a = 0.0112 b(slope) = 0.0106 chi2 = 1.6348 VTN P-side: a = 0.0113 b(slope) = 0.0065 chi2 = 0.4903 CAL_IN N-side: a = 2.4627 b(slope) = 0.0087 chi2 = 1.5177 CAL_IN P-side: a = 2.4628 b(slope) = 0.0087 chi2 = 1.0440 VTP N-side(average) = 0.6930 V CAL_BASE = 2.4641 V VTP P-side(average) = 0.4260 V CAL_VREF = 3.0244 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM37D 3144.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5503.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:605 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1105 IDDSB:VDD1B 0.1170 IDDSB:VDD1C 0.1227 IDDSB:VDD1D 0.1283 IDDOP1:DVDD 0.1214 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0102 chi2 = 1.3758 VTN P-side: a = 0.0104 b(slope) = 0.0062 chi2 = 0.8641 CAL_IN N-side: a = 2.4632 b(slope) = 0.0085 chi2 = 0.4984 CAL_IN P-side: a = 2.5002 b(slope) = 0.0079 chi2 = 0.5288 VTP N-side(average) = 0.6629 V CAL_BASE = 2.4678 V VTP P-side(average) = 0.4076 V CAL_VREF = 3.0139 V FUNCT. DIGITAL TEST = 49 error detected in test: FUNCT@5.0V:ATOM1TO6A 227.0 FUNCT@5.0V:ATOM1TO6B 227.0 FUNCT@5.0V:ATOM1TO6C 227.0 FUNCT@5.0V:ATOM1TO6D 227.0 FUNCT@5.0V:ATOM1TO6E 227.0 FUNCT@5.0V:ATOM7TO9A 271.0 FUNCT@5.0V:ATOM7TO9B 271.0 FUNCT@5.0V:ATOM7TO9C 271.0 FUNCT@5.0V:ATOM7TO9D 271.0 FUNCT@5.0V:ATOM7TO9E 271.0 FUNCT@5.0V:ATOM10TO12 495.0 FUNCT@5.0V:ATOM13A 1042.0 FUNCT@5.0V:ATOM13B 1098.0 FUNCT@5.0V:ATOM13C 1098.0 FUNCT@5.0V:ATOM15 1086.0 FUNCT@5.0V:ATOM17 3398.0 FUNCT@5.0V:ATOM18 3414.0 FUNCT@5.0V:ATOM18HF 3414.0 FUNCT@5.0V:ATOM19 3350.0 FUNCT@5.0V:ATOM19D 3365.0 FUNCT@5.0V:ATOM19E 2592.0 FUNCT@5.0V:ATOM19F 6465.0 FUNCT@5.0V:ATOM19FHF 6465.0 FUNCT@5.0V:ATOM20 1058.0 FUNCT@5.0V:ATOM21 1034.0 FUNCT@5.0V:ATOM22 1022.0 FUNCT@5.0V:ATOM23 954.0 FUNCT@5.0V:ATOM24 1054.0 FUNCT@5.0V:ATOM25 1040.0 FUNCT@5.0V:ATOM25HF 1040.0 FUNCT@5.0V:ATOM26A 1019.0 FUNCT@5.0V:ATOM26B 1828.0 FUNCT@5.0V:ATOM28 1156.0 FUNCT@5.0V:ATOM29 1156.0 FUNCT@5.0V:ATOM30 1156.0 FUNCT@5.0V:ATOM31A 790.0 FUNCT@5.0V:ATOM31B 979.0 FUNCT@5.0V:ATOM32 790.0 FUNCT@5.0V:ATOM33 1156.0 FUNCT@5.0V:ATOM35 1290.0 FUNCT@5.0V:ATOM36 1046.0 FUNCT@5.0V:ATOM37A 1186.0 FUNCT@5.0V:ATOM37B 1178.0 FUNCT@5.0V:ATOM37C 1162.0 FUNCT@5.0V:ATOM37D 1130.0 FUNCT@5.0V:ATOM37E 1121.0 FUNCT@5.0V:ATOM39 1067.0 FUNCT@5.0V:ATOM41 1593.0 FUNCT@5.0V:ATOM41A 1593.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3646.0 FUNCT@5.0V:ATOM45C_40 3646.0 FUNCT@5.0V:ATOM46C_40 3646.0 FUNCT@5.0V:ATOM47C_40 3646.0 FUNCT@5.0V:ATOM48C_40 3646.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3646.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1224.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1381.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 271.0 FUNCT@5.0V:A10TO12HF 495.0 FUNCT@5.0V:ADAC37HF 271.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:705 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0103 chi2 = 0.5673 VTN P-side: a = 0.0100 b(slope) = 0.0062 chi2 = 0.6167 CAL_IN N-side: a = 2.4963 b(slope) = 0.0082 chi2 = 0.5214 CAL_IN P-side: a = 2.4964 b(slope) = 0.0082 chi2 = 0.2915 VTP N-side(average) = 0.6686 V CAL_BASE = 2.4980 V VTP P-side(average) = 0.4095 V CAL_VREF = 3.0237 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1111.0 FUNCT@5.0V:ATOM15 1155.0 FUNCT@5.0V:ATOM17 3467.0 FUNCT@5.0V:ATOM18 3483.0 FUNCT@5.0V:ATOM18HF 3483.0 FUNCT@5.0V:ATOM19 3419.0 FUNCT@5.0V:ATOM19D 3434.0 FUNCT@5.0V:ATOM19E 2661.0 FUNCT@5.0V:ATOM19F 6534.0 FUNCT@5.0V:ATOM19FHF 6534.0 FUNCT@5.0V:ATOM20 1127.0 FUNCT@5.0V:ATOM21 1103.0 FUNCT@5.0V:ATOM22 1091.0 FUNCT@5.0V:ATOM25 1109.0 FUNCT@5.0V:ATOM25HF 1109.0 FUNCT@5.0V:ATOM26A 1088.0 FUNCT@5.0V:ATOM26B 1897.0 FUNCT@5.0V:ATOM28 1225.0 FUNCT@5.0V:ATOM29 1225.0 FUNCT@5.0V:ATOM30 1225.0 FUNCT@5.0V:ATOM31A 859.0 FUNCT@5.0V:ATOM31B 1048.0 FUNCT@5.0V:ATOM32 859.0 FUNCT@5.0V:ATOM33 1225.0 FUNCT@5.0V:ATOM35 1359.0 FUNCT@5.0V:ATOM36 1115.0 FUNCT@5.0V:ATOM37A 1302.0 FUNCT@5.0V:ATOM37B 1294.0 FUNCT@5.0V:ATOM37C 1278.0 FUNCT@5.0V:ATOM37D 1246.0 FUNCT@5.0V:ATOM37E 1237.0 FUNCT@5.0V:ATOM39 1136.0 FUNCT@5.0V:ATOM41 1662.0 FUNCT@5.0V:ATOM41A 1662.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4311.0 FUNCT@5.0V:ATOM45C_40 4311.0 FUNCT@5.0V:ATOM46C_40 4311.0 FUNCT@5.0V:ATOM47C_40 3667.0 FUNCT@5.0V:ATOM48C_40 4311.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4311.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1404.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:805 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0109 chi2 = 0.8681 VTN P-side: a = 0.0097 b(slope) = 0.0066 chi2 = 0.1865 CAL_IN N-side: a = 2.4779 b(slope) = 0.0082 chi2 = 0.4242 CAL_IN P-side: a = 2.4779 b(slope) = 0.0082 chi2 = 0.5996 VTP N-side(average) = 0.7095 V CAL_BASE = 2.4807 V VTP P-side(average) = 0.4306 V CAL_VREF = 3.0039 V FUNCT. DIGITAL TEST = 3 error detected in test: FUNCT@5.0V:ATOM19FHF 9993.0 FUNCT@5.0V:ATOM32 1066.0 FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:806 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0192 b(slope) = 0.0102 chi2 = 99.0000 VTN P-side: a = 0.0092 b(slope) = 0.0063 chi2 = 0.5095 CAL_IN N-side: a = 2.4970 b(slope) = 0.0079 chi2 = 99.0000 CAL_IN P-side: a = 2.4834 b(slope) = 0.0082 chi2 = 0.6711 VTP N-side(average) = 0.6785 V CAL_BASE = 2.4829 V VTP P-side(average) = 0.4115 V CAL_VREF = 3.0095 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM19F 10617.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:706 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD0A 0.1341 IDDSB:VDD0B 0.1357 IDDSB:VDD0C 0.1356 IDDSB:VDD0D 0.1356 IDDOP0:AVDD 0.1141 DACS TEST = 0 VTN N-side: a = 0.0149 b(slope) = 0.0100 chi2 = 1.7623 VTN P-side: a = 0.0153 b(slope) = 0.0061 chi2 = 0.6809 CAL_IN N-side: a = 2.4253 b(slope) = 0.0083 chi2 = 0.6858 CAL_IN P-side: a = 2.4250 b(slope) = 0.0083 chi2 = 0.7152 VTP N-side(average) = 0.6577 V CAL_BASE = 2.4316 V VTP P-side(average) = 0.4073 V CAL_VREF = 2.9624 V FUNCT. DIGITAL TEST = 11 error detected in test: FUNCT@5.0V:ATOM15 1138.0 FUNCT@5.0V:ATOM17 4502.0 FUNCT@5.0V:ATOM18 4518.0 FUNCT@5.0V:ATOM18HF 4518.0 FUNCT@5.0V:ATOM19 4454.0 FUNCT@5.0V:ATOM19F 7569.0 FUNCT@5.0V:ATOM19FHF 7569.0 FUNCT@5.0V:ATOM25 2208.0 FUNCT@5.0V:ATOM25HF 2208.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM36 2983.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5099.0 FUNCT@5.0V:ATOM45C_40 3667.0 FUNCT@5.0V:ATOM46C_40 4501.0 FUNCT@5.0V:ATOM47C_40 4519.0 FUNCT@5.0V:ATOM48C_40 4279.0 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:606 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDSB:VDD1D 0.1022 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0103 chi2 = 0.5850 VTN P-side: a = 0.0096 b(slope) = 0.0062 chi2 = 0.2072 CAL_IN N-side: a = 2.5214 b(slope) = 0.0079 chi2 = 1.2580 CAL_IN P-side: a = 2.5211 b(slope) = 0.0079 chi2 = 1.6060 VTP N-side(average) = 0.6683 V CAL_BASE = 2.5222 V VTP P-side(average) = 0.4076 V CAL_VREF = 3.0315 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1831.0 FUNCT@5.0V:ATOM15 1875.0 FUNCT@5.0V:ATOM17 4187.0 FUNCT@5.0V:ATOM18 4203.0 FUNCT@5.0V:ATOM18HF 4203.0 FUNCT@5.0V:ATOM19 4139.0 FUNCT@5.0V:ATOM19D 4154.0 FUNCT@5.0V:ATOM19E 3381.0 FUNCT@5.0V:ATOM19F 7254.0 FUNCT@5.0V:ATOM19FHF 7254.0 FUNCT@5.0V:ATOM20 1847.0 FUNCT@5.0V:ATOM21 1823.0 FUNCT@5.0V:ATOM22 1811.0 FUNCT@5.0V:ATOM25 1829.0 FUNCT@5.0V:ATOM25HF 1829.0 FUNCT@5.0V:ATOM26A 1808.0 FUNCT@5.0V:ATOM26B 2617.0 FUNCT@5.0V:ATOM28 1945.0 FUNCT@5.0V:ATOM29 1945.0 FUNCT@5.0V:ATOM30 1945.0 FUNCT@5.0V:ATOM31A 1579.0 FUNCT@5.0V:ATOM31B 1768.0 FUNCT@5.0V:ATOM32 1579.0 FUNCT@5.0V:ATOM33 1945.0 FUNCT@5.0V:ATOM35 2079.0 FUNCT@5.0V:ATOM36 1835.0 FUNCT@5.0V:ATOM37A 2758.0 FUNCT@5.0V:ATOM37B 2750.0 FUNCT@5.0V:ATOM37C 2734.0 FUNCT@5.0V:ATOM37D 2702.0 FUNCT@5.0V:ATOM37E 2693.0 FUNCT@5.0V:ATOM39 1856.0 FUNCT@5.0V:ATOM41 2382.0 FUNCT@5.0V:ATOM41A 2382.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4663.0 FUNCT@5.0V:ATOM45C_40 4663.0 FUNCT@5.0V:ATOM46C_40 3731.0 FUNCT@5.0V:ATOM47C_40 4663.0 FUNCT@5.0V:ATOM48C_40 4663.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4663.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:506 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDSB:VDD1D 0.1006 DACS TEST = 1 VTN N-side: a = 0.0608 b(slope) = 0.0073 chi2 = 99.0000 VTN P-side: a = 0.0208 b(slope) = 0.0052 chi2 = 99.0000 CAL_IN N-side: a = 2.5228 b(slope) = 0.0067 chi2 = 99.0000 CAL_IN P-side: a = 2.5050 b(slope) = 0.0073 chi2 = 99.0000 VTP N-side(average) = 0.6809 V CAL_BASE = 2.5024 V VTP P-side(average) = 0.4137 V CAL_VREF = 3.0344 V FUNCT. DIGITAL TEST = 39 error detected in test: FUNCT@5.0V:ATOM1TO6A 2595.0 FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1128.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM24 212.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 FUNCT@5.0V:ATOM42 214.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:406 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 2 error detected in test: IDDSB:VDD1D 0.1036 IDDOP1:DVDD 0.1054 DACS TEST = 1 VTN N-side: a = 0.2232 b(slope) = 0.0000 chi2 = 0.2716 VTN P-side: a = 0.1390 b(slope) = 0.0000 chi2 = 0.3665 CAL_IN N-side: a = 2.7976 b(slope) = 0.0000 chi2 = 0.3412 CAL_IN P-side: a = 2.7918 b(slope) = 0.0000 chi2 = 0.2848 VTP N-side(average) = 0.6965 V CAL_BASE = 2.5498 V VTP P-side(average) = 0.4248 V CAL_VREF = 3.0574 V FUNCT. DIGITAL TEST = 51 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 FUNCT@5.0V:ATOM7TO9B 272.0 FUNCT@5.0V:ATOM7TO9C 272.0 FUNCT@5.0V:ATOM7TO9D 272.0 FUNCT@5.0V:ATOM7TO9E 272.0 FUNCT@5.0V:ATOM10TO12 496.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 2047.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM34 268.0 FUNCT@5.0V:ATOM35 226.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 FUNCT@5.0V:ATOM42 214.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:306 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0320 b(slope) = 0.0100 chi2 = 99.0000 VTN P-side: a = 0.0096 b(slope) = 0.0062 chi2 = 0.6374 CAL_IN N-side: a = 2.5264 b(slope) = 0.0078 chi2 = 99.0000 CAL_IN P-side: a = 2.4959 b(slope) = 0.0085 chi2 = 0.7909 VTP N-side(average) = 0.6830 V CAL_BASE = 2.5005 V VTP P-side(average) = 0.4083 V CAL_VREF = 3.0440 V FUNCT. DIGITAL TEST = 11 error detected in test: FUNCT@5.0V:ATOM17 7166.0 FUNCT@5.0V:ATOM18HF 6063.0 FUNCT@5.0V:ATOM19E 3061.0 FUNCT@5.0V:ATOM19FHF 10197.0 FUNCT@5.0V:ATOM25HF 1556.0 FUNCT@5.0V:ATOM31B 1459.0 FUNCT@5.0V:ATOM33 1672.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM37E 2142.0 FUNCT@5.0V:ATOM39 1547.0 FUNCT@5.0V:ATOM41A 2074.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:206 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0106 chi2 = 0.7028 VTN P-side: a = 0.0101 b(slope) = 0.0065 chi2 = 0.4554 CAL_IN N-side: a = 2.5032 b(slope) = 0.0081 chi2 = 1.3405 CAL_IN P-side: a = 2.5058 b(slope) = 0.0082 chi2 = 2.0327 VTP N-side(average) = 0.6907 V CAL_BASE = 2.5034 V VTP P-side(average) = 0.4278 V CAL_VREF = 3.0229 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM37D 1708.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:107 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0104 chi2 = 1.4768 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.5941 CAL_IN N-side: a = 2.4712 b(slope) = 0.0083 chi2 = 0.4914 CAL_IN P-side: a = 2.4709 b(slope) = 0.0083 chi2 = 0.6093 VTP N-side(average) = 0.6801 V CAL_BASE = 2.4741 V VTP P-side(average) = 0.4193 V CAL_VREF = 3.0056 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:207 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0106 chi2 = 0.7969 VTN P-side: a = 0.0102 b(slope) = 0.0065 chi2 = 0.8001 CAL_IN N-side: a = 2.4706 b(slope) = 0.0084 chi2 = 0.8718 CAL_IN P-side: a = 2.4705 b(slope) = 0.0084 chi2 = 0.9854 VTP N-side(average) = 0.6895 V CAL_BASE = 2.4724 V VTP P-side(average) = 0.4282 V CAL_VREF = 3.0081 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1191.0 FUNCT@5.0V:ATOM15 1235.0 FUNCT@5.0V:ATOM17 3547.0 FUNCT@5.0V:ATOM18 3563.0 FUNCT@5.0V:ATOM18HF 3563.0 FUNCT@5.0V:ATOM19 3499.0 FUNCT@5.0V:ATOM19D 3514.0 FUNCT@5.0V:ATOM19E 2741.0 FUNCT@5.0V:ATOM19F 6614.0 FUNCT@5.0V:ATOM19FHF 6614.0 FUNCT@5.0V:ATOM20 1207.0 FUNCT@5.0V:ATOM21 1183.0 FUNCT@5.0V:ATOM22 1171.0 FUNCT@5.0V:ATOM25 1189.0 FUNCT@5.0V:ATOM25HF 1189.0 FUNCT@5.0V:ATOM26A 1168.0 FUNCT@5.0V:ATOM26B 1977.0 FUNCT@5.0V:ATOM28 1305.0 FUNCT@5.0V:ATOM29 1305.0 FUNCT@5.0V:ATOM30 1305.0 FUNCT@5.0V:ATOM31A 939.0 FUNCT@5.0V:ATOM31B 1128.0 FUNCT@5.0V:ATOM32 939.0 FUNCT@5.0V:ATOM33 1305.0 FUNCT@5.0V:ATOM35 1439.0 FUNCT@5.0V:ATOM36 1195.0 FUNCT@5.0V:ATOM37A 1462.0 FUNCT@5.0V:ATOM37B 1454.0 FUNCT@5.0V:ATOM37C 1438.0 FUNCT@5.0V:ATOM37D 1406.0 FUNCT@5.0V:ATOM37E 1397.0 FUNCT@5.0V:ATOM39 1216.0 FUNCT@5.0V:ATOM41 1742.0 FUNCT@5.0V:ATOM41A 1742.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5567.0 FUNCT@5.0V:ATOM45C_40 3955.0 FUNCT@5.0V:ATOM46C_40 3699.0 FUNCT@5.0V:ATOM47C_40 4890.0 FUNCT@5.0V:ATOM48C_40 5567.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5567.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 2 error detected in test: TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:307 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0109 chi2 = 0.7910 VTN P-side: a = 0.0104 b(slope) = 0.0066 chi2 = 0.5340 CAL_IN N-side: a = 2.4745 b(slope) = 0.0084 chi2 = 0.4714 CAL_IN P-side: a = 2.4744 b(slope) = 0.0084 chi2 = 0.4151 VTP N-side(average) = 0.7073 V CAL_BASE = 2.4753 V VTP P-side(average) = 0.4349 V CAL_VREF = 3.0137 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1511.0 FUNCT@5.0V:ATOM13B 1215.0 FUNCT@5.0V:ATOM13C 1215.0 FUNCT@5.0V:ATOM15 1555.0 FUNCT@5.0V:ATOM17 3867.0 FUNCT@5.0V:ATOM18 3883.0 FUNCT@5.0V:ATOM18HF 3883.0 FUNCT@5.0V:ATOM19 3819.0 FUNCT@5.0V:ATOM19D 3834.0 FUNCT@5.0V:ATOM19E 2964.0 FUNCT@5.0V:ATOM19F 6934.0 FUNCT@5.0V:ATOM19FHF 6934.0 FUNCT@5.0V:ATOM20 1527.0 FUNCT@5.0V:ATOM21 1503.0 FUNCT@5.0V:ATOM22 1491.0 FUNCT@5.0V:ATOM25 1509.0 FUNCT@5.0V:ATOM25HF 1509.0 FUNCT@5.0V:ATOM26A 1488.0 FUNCT@5.0V:ATOM26B 2297.0 FUNCT@5.0V:ATOM28 1625.0 FUNCT@5.0V:ATOM29 1625.0 FUNCT@5.0V:ATOM30 1625.0 FUNCT@5.0V:ATOM31A 1259.0 FUNCT@5.0V:ATOM31B 1448.0 FUNCT@5.0V:ATOM32 1259.0 FUNCT@5.0V:ATOM33 1625.0 FUNCT@5.0V:ATOM35 1759.0 FUNCT@5.0V:ATOM36 1515.0 FUNCT@5.0V:ATOM37A 1398.0 FUNCT@5.0V:ATOM37B 1390.0 FUNCT@5.0V:ATOM37C 1374.0 FUNCT@5.0V:ATOM37D 1342.0 FUNCT@5.0V:ATOM37E 1333.0 FUNCT@5.0V:ATOM39 1536.0 FUNCT@5.0V:ATOM41 2062.0 FUNCT@5.0V:ATOM41A 2062.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3715.0 FUNCT@5.0V:ATOM45C_40 3715.0 FUNCT@5.0V:ATOM46C_40 3715.0 FUNCT@5.0V:ATOM47C_40 3715.0 FUNCT@5.0V:ATOM48C_40 3715.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3715.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:407 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDSB:VDD1D 0.1011 DACS TEST = 1 VTN N-side: a = 0.1729 b(slope) = 0.0033 chi2 = 99.0000 VTN P-side: a = 0.1058 b(slope) = 0.0016 chi2 = 99.0000 CAL_IN N-side: a = 2.5386 b(slope) = 0.0030 chi2 = 99.0000 CAL_IN P-side: a = 2.5511 b(slope) = 0.0024 chi2 = 99.0000 VTP N-side(average) = 0.7288 V CAL_BASE = 2.3420 V VTP P-side(average) = 0.4432 V CAL_VREF = 2.9490 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1053.0 FUNCT@5.0V:ATOM13B 1109.0 FUNCT@5.0V:ATOM13C 1109.0 FUNCT@5.0V:ATOM15 1097.0 FUNCT@5.0V:ATOM17 3409.0 FUNCT@5.0V:ATOM18 3425.0 FUNCT@5.0V:ATOM18HF 3425.0 FUNCT@5.0V:ATOM19 3361.0 FUNCT@5.0V:ATOM19D 3376.0 FUNCT@5.0V:ATOM19E 2603.0 FUNCT@5.0V:ATOM19F 6476.0 FUNCT@5.0V:ATOM19FHF 6476.0 FUNCT@5.0V:ATOM20 1069.0 FUNCT@5.0V:ATOM21 1045.0 FUNCT@5.0V:ATOM22 1033.0 FUNCT@5.0V:ATOM23 965.0 FUNCT@5.0V:ATOM24 1065.0 FUNCT@5.0V:ATOM25 1051.0 FUNCT@5.0V:ATOM25HF 1051.0 FUNCT@5.0V:ATOM26A 1030.0 FUNCT@5.0V:ATOM26B 1839.0 FUNCT@5.0V:ATOM28 1167.0 FUNCT@5.0V:ATOM29 1167.0 FUNCT@5.0V:ATOM30 1167.0 FUNCT@5.0V:ATOM31A 801.0 FUNCT@5.0V:ATOM31B 990.0 FUNCT@5.0V:ATOM32 801.0 FUNCT@5.0V:ATOM33 1167.0 FUNCT@5.0V:ATOM35 1301.0 FUNCT@5.0V:ATOM36 1057.0 FUNCT@5.0V:ATOM37A 1197.0 FUNCT@5.0V:ATOM37B 1189.0 FUNCT@5.0V:ATOM37C 1173.0 FUNCT@5.0V:ATOM37D 1141.0 FUNCT@5.0V:ATOM37E 1132.0 FUNCT@5.0V:ATOM39 1078.0 FUNCT@5.0V:ATOM41 1604.0 FUNCT@5.0V:ATOM41A 1604.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3662.0 FUNCT@5.0V:ATOM45C_40 3662.0 FUNCT@5.0V:ATOM46C_40 3662.0 FUNCT@5.0V:ATOM47C_40 3662.0 FUNCT@5.0V:ATOM48C_40 3662.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3662.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1233.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1392.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:507 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 2 error detected in test: IDDSB:VDD1C 0.1059 IDDSB:VDD1D 0.1108 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0105 chi2 = 0.9119 VTN P-side: a = 0.0097 b(slope) = 0.0063 chi2 = 0.3701 CAL_IN N-side: a = 2.4895 b(slope) = 0.0086 chi2 = 0.8552 CAL_IN P-side: a = 2.4896 b(slope) = 0.0086 chi2 = 0.6993 VTP N-side(average) = 0.6792 V CAL_BASE = 2.4939 V VTP P-side(average) = 0.4134 V CAL_VREF = 3.0437 V FUNCT. DIGITAL TEST = 17 error detected in test: FUNCT@5.0V:ATOM13B 1759.0 FUNCT@5.0V:ATOM13C 1759.0 FUNCT@5.0V:ATOM17 5594.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 2486.0 FUNCT@5.0V:ATOM37C 2462.0 FUNCT@5.0V:ATOM37D 2430.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:607 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 6 error detected in test: IDDSB:VDD0A 0.1369 IDDSB:VDD0B 0.1369 IDDSB:VDD0C 0.1369 IDDSB:VDD0D 0.1369 IDDSB:VDD1D 0.1049 IDDOP0:AVDD 0.1157 DACS TEST = 0 VTN N-side: a = 0.0155 b(slope) = 0.0099 chi2 = 0.6065 VTN P-side: a = 0.0153 b(slope) = 0.0060 chi2 = 0.5375 CAL_IN N-side: a = 2.3998 b(slope) = 0.0084 chi2 = 0.8265 CAL_IN P-side: a = 2.3998 b(slope) = 0.0084 chi2 = 0.9176 VTP N-side(average) = 0.6476 V CAL_BASE = 2.4053 V VTP P-side(average) = 0.3973 V CAL_VREF = 2.9436 V FUNCT. DIGITAL TEST = 12 error detected in test: FUNCT@5.0V:ATOM13B 1439.0 FUNCT@5.0V:ATOM13C 1439.0 FUNCT@5.0V:ATOM17 3879.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM23 981.0 FUNCT@5.0V:ATOM26B 3060.0 FUNCT@5.0V:ATOM37A 1846.0 FUNCT@5.0V:ATOM37B 1838.0 FUNCT@5.0V:ATOM37C 1822.0 FUNCT@5.0V:ATOM37D 1790.0 FUNCT@5.0V:ATOM37E 1781.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3667.0 FUNCT@5.0V:ATOM45C_40 3827.0 FUNCT@5.0V:ATOM46C_40 3827.0 FUNCT@5.0V:ATOM47C_40 3827.0 FUNCT@5.0V:ATOM48C_40 3667.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3827.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:707 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0210 b(slope) = 0.0099 chi2 = 99.0000 VTN P-side: a = 0.0097 b(slope) = 0.0062 chi2 = 0.4207 CAL_IN N-side: a = 2.4360 b(slope) = 0.0083 chi2 = 99.0000 CAL_IN P-side: a = 2.4198 b(slope) = 0.0087 chi2 = 0.9088 VTP N-side(average) = 0.6644 V CAL_BASE = 2.4272 V VTP P-side(average) = 0.4063 V CAL_VREF = 2.9846 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1143.0 FUNCT@5.0V:ATOM15 1187.0 FUNCT@5.0V:ATOM17 3499.0 FUNCT@5.0V:ATOM18 3515.0 FUNCT@5.0V:ATOM18HF 3515.0 FUNCT@5.0V:ATOM19 3451.0 FUNCT@5.0V:ATOM19D 3466.0 FUNCT@5.0V:ATOM19E 2693.0 FUNCT@5.0V:ATOM19F 6566.0 FUNCT@5.0V:ATOM19FHF 6566.0 FUNCT@5.0V:ATOM20 1159.0 FUNCT@5.0V:ATOM21 1135.0 FUNCT@5.0V:ATOM22 1123.0 FUNCT@5.0V:ATOM25 1141.0 FUNCT@5.0V:ATOM25HF 1141.0 FUNCT@5.0V:ATOM26A 1120.0 FUNCT@5.0V:ATOM26B 1929.0 FUNCT@5.0V:ATOM28 1257.0 FUNCT@5.0V:ATOM29 1257.0 FUNCT@5.0V:ATOM30 1257.0 FUNCT@5.0V:ATOM31A 891.0 FUNCT@5.0V:ATOM31B 1080.0 FUNCT@5.0V:ATOM32 891.0 FUNCT@5.0V:ATOM33 1257.0 FUNCT@5.0V:ATOM35 1391.0 FUNCT@5.0V:ATOM36 1147.0 FUNCT@5.0V:ATOM37A 1366.0 FUNCT@5.0V:ATOM37B 1358.0 FUNCT@5.0V:ATOM37C 1342.0 FUNCT@5.0V:ATOM37D 1310.0 FUNCT@5.0V:ATOM37E 1301.0 FUNCT@5.0V:ATOM39 1168.0 FUNCT@5.0V:ATOM41 1694.0 FUNCT@5.0V:ATOM41A 1694.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:807 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1009 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0110 chi2 = 0.4596 VTN P-side: a = 0.0101 b(slope) = 0.0067 chi2 = 0.2738 CAL_IN N-side: a = 2.4712 b(slope) = 0.0083 chi2 = 0.5616 CAL_IN P-side: a = 2.4713 b(slope) = 0.0082 chi2 = 0.3344 VTP N-side(average) = 0.7178 V CAL_BASE = 2.4768 V VTP P-side(average) = 0.4413 V CAL_VREF = 3.0061 V FUNCT. DIGITAL TEST = 39 error detected in test: FUNCT@5.0V:ATOM13A 1053.0 FUNCT@5.0V:ATOM13B 1109.0 FUNCT@5.0V:ATOM13C 1109.0 FUNCT@5.0V:ATOM15 1097.0 FUNCT@5.0V:ATOM17 3409.0 FUNCT@5.0V:ATOM18 3425.0 FUNCT@5.0V:ATOM18HF 3425.0 FUNCT@5.0V:ATOM19 3361.0 FUNCT@5.0V:ATOM19D 3376.0 FUNCT@5.0V:ATOM19E 2603.0 FUNCT@5.0V:ATOM19F 6476.0 FUNCT@5.0V:ATOM19FHF 6476.0 FUNCT@5.0V:ATOM20 1069.0 FUNCT@5.0V:ATOM21 1045.0 FUNCT@5.0V:ATOM22 1033.0 FUNCT@5.0V:ATOM23 965.0 FUNCT@5.0V:ATOM24 1065.0 FUNCT@5.0V:ATOM25 1051.0 FUNCT@5.0V:ATOM25HF 1051.0 FUNCT@5.0V:ATOM26A 1030.0 FUNCT@5.0V:ATOM26B 1839.0 FUNCT@5.0V:ATOM28 1167.0 FUNCT@5.0V:ATOM29 1167.0 FUNCT@5.0V:ATOM30 1167.0 FUNCT@5.0V:ATOM31A 801.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 801.0 FUNCT@5.0V:ATOM33 1167.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1301.0 FUNCT@5.0V:ATOM36 1057.0 FUNCT@5.0V:ATOM37A 1197.0 FUNCT@5.0V:ATOM37B 1189.0 FUNCT@5.0V:ATOM37C 1173.0 FUNCT@5.0V:ATOM37D 1141.0 FUNCT@5.0V:ATOM37E 1132.0 FUNCT@5.0V:ATOM39 1078.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3662.0 FUNCT@5.0V:ATOM45C_40 3662.0 FUNCT@5.0V:ATOM46C_40 3662.0 FUNCT@5.0V:ATOM47C_40 3662.0 FUNCT@5.0V:ATOM48C_40 3662.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3662.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1233.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1392.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:907 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0105 chi2 = 1.1569 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.2639 CAL_IN N-side: a = 2.4721 b(slope) = 0.0082 chi2 = 0.7327 CAL_IN P-side: a = 2.4718 b(slope) = 0.0081 chi2 = 2.4212 VTP N-side(average) = 0.6815 V CAL_BASE = 2.4702 V VTP P-side(average) = 0.4234 V CAL_VREF = 2.9941 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:908 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0097 b(slope) = 0.0105 chi2 = 0.9452 VTN P-side: a = 0.0100 b(slope) = 0.0065 chi2 = 0.6297 CAL_IN N-side: a = 2.4513 b(slope) = 0.0104 chi2 = 99.0000 CAL_IN P-side: a = 2.4748 b(slope) = 0.0102 chi2 = 99.0000 VTP N-side(average) = 0.6834 V CAL_BASE = 2.4863 V VTP P-side(average) = 0.4284 V CAL_VREF = 3.0032 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:808 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0104 chi2 = 0.9744 VTN P-side: a = 0.0096 b(slope) = 0.0063 chi2 = 0.4135 CAL_IN N-side: a = 2.4978 b(slope) = 0.0081 chi2 = 0.4103 CAL_IN P-side: a = 2.4982 b(slope) = 0.0081 chi2 = 0.5412 VTP N-side(average) = 0.6753 V CAL_BASE = 2.5081 V VTP P-side(average) = 0.4123 V CAL_VREF = 3.0273 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:708 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0102 chi2 = 1.2390 VTN P-side: a = 0.0097 b(slope) = 0.0061 chi2 = 0.4698 CAL_IN N-side: a = 2.4797 b(slope) = 0.0082 chi2 = 0.7085 CAL_IN P-side: a = 2.4797 b(slope) = 0.0082 chi2 = 0.4703 VTP N-side(average) = 0.6615 V CAL_BASE = 2.4846 V VTP P-side(average) = 0.4022 V CAL_VREF = 3.0132 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:608 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0092 b(slope) = 0.0102 chi2 = 0.7554 VTN P-side: a = 0.0092 b(slope) = 0.0062 chi2 = 0.3163 CAL_IN N-side: a = 2.4405 b(slope) = 0.0085 chi2 = 0.6442 CAL_IN P-side: a = 2.4406 b(slope) = 0.0085 chi2 = 1.2141 VTP N-side(average) = 0.6651 V CAL_BASE = 2.4463 V VTP P-side(average) = 0.4078 V CAL_VREF = 2.9932 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:508 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0104 chi2 = 1.0253 VTN P-side: a = 0.0093 b(slope) = 0.0063 chi2 = 0.5676 CAL_IN N-side: a = 2.5348 b(slope) = 0.0080 chi2 = 0.8600 CAL_IN P-side: a = 2.5330 b(slope) = 0.0079 chi2 = 0.5020 VTP N-side(average) = 0.6763 V CAL_BASE = 2.5373 V VTP P-side(average) = 0.4148 V CAL_VREF = 3.0501 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1751.0 FUNCT@5.0V:ATOM15 1795.0 FUNCT@5.0V:ATOM17 4107.0 FUNCT@5.0V:ATOM18 4123.0 FUNCT@5.0V:ATOM18HF 4123.0 FUNCT@5.0V:ATOM19 4059.0 FUNCT@5.0V:ATOM19D 4074.0 FUNCT@5.0V:ATOM19E 3301.0 FUNCT@5.0V:ATOM19F 7174.0 FUNCT@5.0V:ATOM19FHF 7174.0 FUNCT@5.0V:ATOM20 1767.0 FUNCT@5.0V:ATOM21 1743.0 FUNCT@5.0V:ATOM22 1731.0 FUNCT@5.0V:ATOM25 1749.0 FUNCT@5.0V:ATOM25HF 1749.0 FUNCT@5.0V:ATOM26A 1728.0 FUNCT@5.0V:ATOM26B 2537.0 FUNCT@5.0V:ATOM28 1865.0 FUNCT@5.0V:ATOM29 1865.0 FUNCT@5.0V:ATOM30 1865.0 FUNCT@5.0V:ATOM31A 1499.0 FUNCT@5.0V:ATOM31B 1688.0 FUNCT@5.0V:ATOM32 1499.0 FUNCT@5.0V:ATOM33 1865.0 FUNCT@5.0V:ATOM35 1999.0 FUNCT@5.0V:ATOM36 1755.0 FUNCT@5.0V:ATOM37A 2582.0 FUNCT@5.0V:ATOM37B 2574.0 FUNCT@5.0V:ATOM37C 2558.0 FUNCT@5.0V:ATOM37D 2526.0 FUNCT@5.0V:ATOM37E 2517.0 FUNCT@5.0V:ATOM39 1776.0 FUNCT@5.0V:ATOM41 2302.0 FUNCT@5.0V:ATOM41A 2302.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4631.0 FUNCT@5.0V:ATOM45C_40 4631.0 FUNCT@5.0V:ATOM46C_40 4631.0 FUNCT@5.0V:ATOM47C_40 4551.0 FUNCT@5.0V:ATOM48C_40 4631.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4631.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:408 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1320 IDDSB:VDD1B 0.1371 IDDSB:VDD1C 0.1429 IDDSB:VDD1D 0.1476 IDDOP1:DVDD 0.1648 DACS TEST = 1 VTN N-side: a = 0.0093 b(slope) = 0.0103 chi2 = 0.6316 VTN P-side: a = 0.0095 b(slope) = 0.0062 chi2 = 0.4926 CAL_IN N-side: a = 3.0215 b(slope) = 0.0017 chi2 = 99.0000 CAL_IN P-side: a = 2.9539 b(slope) = 0.0026 chi2 = 99.0000 VTP N-side(average) = 0.6727 V CAL_BASE = 2.5754 V VTP P-side(average) = 0.4104 V CAL_VREF = 3.0715 V FUNCT. DIGITAL TEST = 39 error detected in test: FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:308 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0114 chi2 = 1.1872 VTN P-side: a = 0.0099 b(slope) = 0.0068 chi2 = 0.2261 CAL_IN N-side: a = 2.6313 b(slope) = 0.0072 chi2 = 0.5560 CAL_IN P-side: a = 2.6316 b(slope) = 0.0072 chi2 = 0.3669 VTP N-side(average) = 0.7406 V CAL_BASE = 2.6443 V VTP P-side(average) = 0.4490 V CAL_VREF = 3.1074 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 2040.0 FUNCT@5.0V:ATOM15 2084.0 FUNCT@5.0V:ATOM17 4396.0 FUNCT@5.0V:ATOM18 4412.0 FUNCT@5.0V:ATOM18HF 4412.0 FUNCT@5.0V:ATOM19 4348.0 FUNCT@5.0V:ATOM19D 4054.0 FUNCT@5.0V:ATOM19E 3590.0 FUNCT@5.0V:ATOM19F 7463.0 FUNCT@5.0V:ATOM19FHF 7463.0 FUNCT@5.0V:ATOM20 1746.0 FUNCT@5.0V:ATOM21 2032.0 FUNCT@5.0V:ATOM22 2020.0 FUNCT@5.0V:ATOM25 2038.0 FUNCT@5.0V:ATOM25HF 2038.0 FUNCT@5.0V:ATOM26A 1707.0 FUNCT@5.0V:ATOM26B 2826.0 FUNCT@5.0V:ATOM28 2154.0 FUNCT@5.0V:ATOM29 2154.0 FUNCT@5.0V:ATOM30 2154.0 FUNCT@5.0V:ATOM31A 1788.0 FUNCT@5.0V:ATOM31B 1977.0 FUNCT@5.0V:ATOM32 1788.0 FUNCT@5.0V:ATOM33 2154.0 FUNCT@5.0V:ATOM35 2288.0 FUNCT@5.0V:ATOM36 1850.0 FUNCT@5.0V:ATOM37A 3176.0 FUNCT@5.0V:ATOM37B 3168.0 FUNCT@5.0V:ATOM37C 3152.0 FUNCT@5.0V:ATOM37D 3120.0 FUNCT@5.0V:ATOM37E 3111.0 FUNCT@5.0V:ATOM39 2065.0 FUNCT@5.0V:ATOM41 2591.0 FUNCT@5.0V:ATOM41A 2591.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5983.0 FUNCT@5.0V:ATOM45C_40 4115.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 5823.0 FUNCT@5.0V:ATOM48C_40 5983.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5983.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:208 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0106 chi2 = 1.1027 VTN P-side: a = 0.0098 b(slope) = 0.0065 chi2 = 0.5572 CAL_IN N-side: a = 2.4710 b(slope) = 0.0084 chi2 = 0.5909 CAL_IN P-side: a = 2.4708 b(slope) = 0.0084 chi2 = 0.4353 VTP N-side(average) = 0.6889 V CAL_BASE = 2.4714 V VTP P-side(average) = 0.4249 V CAL_VREF = 3.0081 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:108 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0092 b(slope) = 0.0106 chi2 = 1.4972 VTN P-side: a = 0.0098 b(slope) = 0.0065 chi2 = 0.8644 CAL_IN N-side: a = 2.5006 b(slope) = 0.0081 chi2 = 0.4834 CAL_IN P-side: a = 2.5005 b(slope) = 0.0081 chi2 = 0.4941 VTP N-side(average) = 0.6858 V CAL_BASE = 2.5027 V VTP P-side(average) = 0.4242 V CAL_VREF = 3.0210 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:209 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0106 chi2 = 0.7284 VTN P-side: a = 0.0099 b(slope) = 0.0064 chi2 = 0.6514 CAL_IN N-side: a = 2.4699 b(slope) = 0.0084 chi2 = 0.7420 CAL_IN P-side: a = 2.4701 b(slope) = 0.0084 chi2 = 0.5629 VTP N-side(average) = 0.6890 V CAL_BASE = 2.4688 V VTP P-side(average) = 0.4223 V CAL_VREF = 3.0064 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:309 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0105 chi2 = 0.9667 VTN P-side: a = 0.0098 b(slope) = 0.0065 chi2 = 0.4415 CAL_IN N-side: a = 2.4355 b(slope) = 0.0086 chi2 = 0.7538 CAL_IN P-side: a = 2.4353 b(slope) = 0.0086 chi2 = 1.2094 VTP N-side(average) = 0.6852 V CAL_BASE = 2.4370 V VTP P-side(average) = 0.4252 V CAL_VREF = 2.9893 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1143.0 FUNCT@5.0V:ATOM15 1187.0 FUNCT@5.0V:ATOM17 3499.0 FUNCT@5.0V:ATOM18 3515.0 FUNCT@5.0V:ATOM18HF 3515.0 FUNCT@5.0V:ATOM19 3451.0 FUNCT@5.0V:ATOM19D 3466.0 FUNCT@5.0V:ATOM19E 2693.0 FUNCT@5.0V:ATOM19F 6566.0 FUNCT@5.0V:ATOM19FHF 6566.0 FUNCT@5.0V:ATOM20 1159.0 FUNCT@5.0V:ATOM21 1135.0 FUNCT@5.0V:ATOM22 1123.0 FUNCT@5.0V:ATOM25 1141.0 FUNCT@5.0V:ATOM25HF 1141.0 FUNCT@5.0V:ATOM26A 1120.0 FUNCT@5.0V:ATOM26B 1929.0 FUNCT@5.0V:ATOM28 1257.0 FUNCT@5.0V:ATOM29 1257.0 FUNCT@5.0V:ATOM30 1257.0 FUNCT@5.0V:ATOM31A 891.0 FUNCT@5.0V:ATOM31B 1080.0 FUNCT@5.0V:ATOM32 891.0 FUNCT@5.0V:ATOM33 1257.0 FUNCT@5.0V:ATOM35 1391.0 FUNCT@5.0V:ATOM36 1147.0 FUNCT@5.0V:ATOM37A 1366.0 FUNCT@5.0V:ATOM37B 1358.0 FUNCT@5.0V:ATOM37C 1342.0 FUNCT@5.0V:ATOM37D 1310.0 FUNCT@5.0V:ATOM37E 1301.0 FUNCT@5.0V:ATOM39 1168.0 FUNCT@5.0V:ATOM41 1694.0 FUNCT@5.0V:ATOM41A 1694.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3731.0 FUNCT@5.0V:ATOM45C_40 3731.0 FUNCT@5.0V:ATOM46C_40 3731.0 FUNCT@5.0V:ATOM47C_40 3731.0 FUNCT@5.0V:ATOM48C_40 3731.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3731.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:409 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0113 chi2 = 0.9608 VTN P-side: a = 0.0100 b(slope) = 0.0068 chi2 = 0.2123 CAL_IN N-side: a = 2.3550 b(slope) = 0.0094 chi2 = 0.8583 CAL_IN P-side: a = 2.3552 b(slope) = 0.0094 chi2 = 0.3665 VTP N-side(average) = 0.7330 V CAL_BASE = 2.3547 V VTP P-side(average) = 0.4460 V CAL_VREF = 2.9568 V FUNCT. DIGITAL TEST = 21 error detected in test: FUNCT@5.0V:ATOM18 13880.0 FUNCT@5.0V:ATOM18HF 13880.0 FUNCT@5.0V:ATOM19E 3525.0 FUNCT@5.0V:ATOM19F 7398.0 FUNCT@5.0V:ATOM19FHF 7398.0 FUNCT@5.0V:ATOM20 1991.0 FUNCT@5.0V:ATOM21 1967.0 FUNCT@5.0V:ATOM22 1955.0 FUNCT@5.0V:ATOM25 1973.0 FUNCT@5.0V:ATOM25HF 1973.0 FUNCT@5.0V:ATOM26A 1952.0 FUNCT@5.0V:ATOM26B 2761.0 FUNCT@5.0V:ATOM28 2089.0 FUNCT@5.0V:ATOM29 2089.0 FUNCT@5.0V:ATOM31A 1723.0 FUNCT@5.0V:ATOM31B 1912.0 FUNCT@5.0V:ATOM35 2223.0 FUNCT@5.0V:ATOM37B 3038.0 FUNCT@5.0V:ATOM37C 3022.0 FUNCT@5.0V:ATOM37D 2990.0 FUNCT@5.0V:ATOM37E 2126.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM47C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:509 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 2 error detected in test: IDDSB:VDD1C 0.1022 IDDSB:VDD1D 0.1072 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0114 chi2 = 2.3634 VTN P-side: a = 0.0103 b(slope) = 0.0069 chi2 = 0.6689 CAL_IN N-side: a = 2.1392 b(slope) = 0.0113 chi2 = 0.7433 CAL_IN P-side: a = 2.1390 b(slope) = 0.0113 chi2 = 0.4391 VTP N-side(average) = 0.7424 V CAL_BASE = 2.1411 V VTP P-side(average) = 0.4563 V CAL_VREF = 2.8650 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:609 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDSB:VDD1D 0.1015 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0102 chi2 = 1.2067 VTN P-side: a = 0.0099 b(slope) = 0.0062 chi2 = 0.4112 CAL_IN N-side: a = 2.3620 b(slope) = 0.0092 chi2 = 0.5081 CAL_IN P-side: a = 2.3621 b(slope) = 0.0092 chi2 = 0.4355 VTP N-side(average) = 0.6648 V CAL_BASE = 2.3726 V VTP P-side(average) = 0.4067 V CAL_VREF = 2.9656 V FUNCT. DIGITAL TEST = 7 error detected in test: FUNCT@5.0V:ATOM13B 2126.0 FUNCT@5.0V:ATOM13C 2126.0 FUNCT@5.0V:ATOM37A 3222.0 FUNCT@5.0V:ATOM37B 3214.0 FUNCT@5.0V:ATOM37C 3198.0 FUNCT@5.0V:ATOM37D 3166.0 FUNCT@5.0V:ATOM37E 2286.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5385.0 FUNCT@5.0V:ATOM45C_40 4892.0 FUNCT@5.0V:ATOM46C_40 4280.0 FUNCT@5.0V:ATOM47C_40 5385.0 FUNCT@5.0V:ATOM48C_40 5385.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5385.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:709 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0106 b(slope) = 0.0102 chi2 = 0.8058 VTN P-side: a = 0.0102 b(slope) = 0.0061 chi2 = 0.5461 CAL_IN N-side: a = 2.5064 b(slope) = 0.0081 chi2 = 0.5803 CAL_IN P-side: a = 2.5066 b(slope) = 0.0081 chi2 = 0.4223 VTP N-side(average) = 0.6633 V CAL_BASE = 2.5066 V VTP P-side(average) = 0.4048 V CAL_VREF = 3.0261 V FUNCT. DIGITAL TEST = 4 error detected in test: FUNCT@5.0V:ATOM19F 9065.0 FUNCT@5.0V:ATOM25 1472.0 FUNCT@5.0V:ATOM37C 2013.0 FUNCT@5.0V:ATOM37D 1974.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5695.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:809 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0105 chi2 = 1.9312 VTN P-side: a = 0.0097 b(slope) = 0.0064 chi2 = 0.8537 CAL_IN N-side: a = 2.5501 b(slope) = 0.0076 chi2 = 0.6869 CAL_IN P-side: a = 2.5502 b(slope) = 0.0076 chi2 = 0.3129 VTP N-side(average) = 0.6862 V CAL_BASE = 2.5566 V VTP P-side(average) = 0.4225 V CAL_VREF = 3.0459 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3731.0 FUNCT@5.0V:ATOM45C_40 3731.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3731.0 FUNCT@5.0V:ATOM48C_40 3731.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3731.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:810 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0114 chi2 = 1.5026 VTN P-side: a = 0.0096 b(slope) = 0.0069 chi2 = 1.0909 CAL_IN N-side: a = 2.4858 b(slope) = 0.0082 chi2 = 0.5734 CAL_IN P-side: a = 2.4856 b(slope) = 0.0082 chi2 = 0.3476 VTP N-side(average) = 0.7382 V CAL_BASE = 2.4834 V VTP P-side(average) = 0.4502 V CAL_VREF = 3.0112 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:710 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0104 chi2 = 1.4040 VTN P-side: a = 0.0094 b(slope) = 0.0063 chi2 = 0.5169 CAL_IN N-side: a = 2.5023 b(slope) = 0.0082 chi2 = 1.0027 CAL_IN P-side: a = 2.5025 b(slope) = 0.0082 chi2 = 0.5793 VTP N-side(average) = 0.6773 V CAL_BASE = 2.5071 V VTP P-side(average) = 0.4126 V CAL_VREF = 3.0293 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:610 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0085 b(slope) = 0.0102 chi2 = 1.4377 VTN P-side: a = 0.0089 b(slope) = 0.0062 chi2 = 0.5913 CAL_IN N-side: a = 2.5642 b(slope) = 0.0077 chi2 = 1.0493 CAL_IN P-side: a = 2.5644 b(slope) = 0.0077 chi2 = 0.9224 VTP N-side(average) = 0.6620 V CAL_BASE = 2.5710 V VTP P-side(average) = 0.4043 V CAL_VREF = 3.0649 V FUNCT. DIGITAL TEST = 35 error detected in test: FUNCT@5.0V:ATOM13A 1927.0 FUNCT@5.0V:ATOM15 1971.0 FUNCT@5.0V:ATOM17 4283.0 FUNCT@5.0V:ATOM18 4299.0 FUNCT@5.0V:ATOM18HF 4299.0 FUNCT@5.0V:ATOM19 4235.0 FUNCT@5.0V:ATOM19D 4250.0 FUNCT@5.0V:ATOM19E 3477.0 FUNCT@5.0V:ATOM19F 7350.0 FUNCT@5.0V:ATOM19FHF 7350.0 FUNCT@5.0V:ATOM20 1943.0 FUNCT@5.0V:ATOM21 1919.0 FUNCT@5.0V:ATOM22 1907.0 FUNCT@5.0V:ATOM25 1925.0 FUNCT@5.0V:ATOM25HF 1925.0 FUNCT@5.0V:ATOM26A 1904.0 FUNCT@5.0V:ATOM26B 2713.0 FUNCT@5.0V:ATOM28 2041.0 FUNCT@5.0V:ATOM29 2041.0 FUNCT@5.0V:ATOM30 2041.0 FUNCT@5.0V:ATOM31A 1675.0 FUNCT@5.0V:ATOM31B 1864.0 FUNCT@5.0V:ATOM32 1675.0 FUNCT@5.0V:ATOM33 2041.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 2175.0 FUNCT@5.0V:ATOM36 1931.0 FUNCT@5.0V:ATOM37A 2950.0 FUNCT@5.0V:ATOM37B 2942.0 FUNCT@5.0V:ATOM37C 2926.0 FUNCT@5.0V:ATOM37D 2894.0 FUNCT@5.0V:ATOM37E 2885.0 FUNCT@5.0V:ATOM39 1952.0 FUNCT@5.0V:ATOM41 2478.0 FUNCT@5.0V:ATOM41A 2478.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4711.0 FUNCT@5.0V:ATOM45C_40 4711.0 FUNCT@5.0V:ATOM46C_40 4711.0 FUNCT@5.0V:ATOM47C_40 4279.0 FUNCT@5.0V:ATOM48C_40 4711.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4711.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:510 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 1 error detected in test: SUP_SHORT:VDD1 0.4 ANALOG TEST = 34 error detected in test: IDDSB:VDD0A 0.0000 IDDSB:VDD1A 0.0000 IDDSB:VDD0B 0.0000 IDDSB:VDD1B 0.0000 IDDSB:VDD0C 0.0000 IDDSB:VDD1C 0.0000 IDDSB:VDD0D 0.0000 IDDSB:VDD1D 0.0000 V_AVDD2IPA:249/L9 0.0000 V_AVDD2IMA:277/L10 0.0000 AVDD_A:AVDDP-M 0.0000 IAVDD2_A:AVDDP-M 0.0000 V_V1RA:169/L5 0.0000 V_N310A:171/L6 0.0000 V_AVDD2IPB:249/L9 0.0000 V_AVDD2IMB:277/L10 0.0000 AVDD_B:AVDDP-M 0.0000 IAVDD2_B:AVDDP-M 0.0000 V_V1RB:169/L5 0.0000 V_N310B:171/L6 0.0000 V_AVDD2IPC:249/L9 0.0000 V_AVDD2IMC:277/L10 0.0000 AVDD_C:AVDDP-M 0.0000 IAVDD2_C:AVDDP-M 0.0000 V_V1RC:169/L5 0.0000 V_N310C:171/L6 0.0000 V_AVDD2IPD:249/L9 0.0000 V_AVDD2IMD:277/L10 0.0000 AVDD_D:AVDDP-M 0.0000 IAVDD2_D:AVDDP-M 0.0000 V_V1RD:169/L5 0.0000 V_N310D:171/L6 0.0000 IDDOP0:AVDD 0.0000 IDDOP1:DVDD 0.0000 DACS TEST = 1 VTN N-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN N-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side(average) = 0.0000 V CAL_BASE = 0.0000 V VTP P-side(average) = 0.0000 V CAL_VREF = 0.0000 V FUNCT. DIGITAL TEST = 58 error detected in test: FUNCT@5.0V:ATOM1TO6A 0.0 FUNCT@5.0V:ATOM1TO6B 0.0 FUNCT@5.0V:ATOM1TO6C 0.0 FUNCT@5.0V:ATOM1TO6D 0.0 FUNCT@5.0V:ATOM1TO6E 0.0 FUNCT@5.0V:ATOM7TO9A 0.0 FUNCT@5.0V:ATOM7TO9B 0.0 FUNCT@5.0V:ATOM7TO9C 0.0 FUNCT@5.0V:ATOM7TO9D 0.0 FUNCT@5.0V:ATOM7TO9E 0.0 FUNCT@5.0V:ATOM10TO12 0.0 FUNCT@5.0V:ATOM13A 0.0 FUNCT@5.0V:ATOM13B 0.0 FUNCT@5.0V:ATOM13C 0.0 FUNCT@5.0V:ATOM14 0.0 FUNCT@5.0V:ATOM15 0.0 FUNCT@5.0V:ATOM16 0.0 FUNCT@5.0V:ATOM17 0.0 FUNCT@5.0V:ATOM18 0.0 FUNCT@5.0V:ATOM18HF 0.0 FUNCT@5.0V:ATOM19 0.0 FUNCT@5.0V:ATOM19B 0.0 FUNCT@5.0V:ATOM19C 0.0 FUNCT@5.0V:ATOM19D 0.0 FUNCT@5.0V:ATOM19E 0.0 FUNCT@5.0V:ATOM19F 0.0 FUNCT@5.0V:ATOM19FHF 0.0 FUNCT@5.0V:ATOM20 0.0 FUNCT@5.0V:ATOM21 0.0 FUNCT@5.0V:ATOM22 0.0 FUNCT@5.0V:ATOM23 0.0 FUNCT@5.0V:ATOM24 0.0 FUNCT@5.0V:ATOM25 0.0 FUNCT@5.0V:ATOM25HF 0.0 FUNCT@5.0V:ATOM26A 0.0 FUNCT@5.0V:ATOM26B 0.0 FUNCT@5.0V:ATOM27 0.0 FUNCT@5.0V:ATOM28 0.0 FUNCT@5.0V:ATOM29 0.0 FUNCT@5.0V:ATOM30 0.0 FUNCT@5.0V:ATOM31A 0.0 FUNCT@5.0V:ATOM31B 0.0 FUNCT@5.0V:ATOM32 0.0 FUNCT@5.0V:ATOM33 0.0 FUNCT@5.0V:ATOM34 0.0 FUNCT@5.0V:ATOM35 0.0 FUNCT@5.0V:ATOM36 0.0 FUNCT@5.0V:ATOM37A 0.0 FUNCT@5.0V:ATOM37B 0.0 FUNCT@5.0V:ATOM37C 0.0 FUNCT@5.0V:ATOM37D 0.0 FUNCT@5.0V:ATOM37E 0.0 FUNCT@5.0V:ATOM38 0.0 FUNCT@5.0V:ATOM39 0.0 FUNCT@5.0V:ATOM40 0.0 FUNCT@5.0V:ATOM41 0.0 FUNCT@5.0V:ATOM41A 0.0 FUNCT@5.0V:ATOM42 0.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 0.0 FUNCT@5.0V:ATOM45C_40 0.0 FUNCT@5.0V:ATOM46C_40 0.0 FUNCT@5.0V:ATOM47C_40 0.0 FUNCT@5.0V:ATOM48C_40 0.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 0.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 0.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 0.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 0.0 FUNCT@5.0V:A10TO12HF 0.0 FUNCT@5.0V:ADAC37HF 0.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:410 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD0A 0.1380 IDDSB:VDD0B 0.1380 IDDSB:VDD0C 0.1380 IDDSB:VDD0D 0.1380 IDDOP0:AVDD 0.1153 DACS TEST = 0 VTN N-side: a = 0.0145 b(slope) = 0.0102 chi2 = 0.5681 VTN P-side: a = 0.0149 b(slope) = 0.0062 chi2 = 0.4359 CAL_IN N-side: a = 2.4609 b(slope) = 0.0082 chi2 = 1.4975 CAL_IN P-side: a = 2.4610 b(slope) = 0.0082 chi2 = 0.7631 VTP N-side(average) = 0.6713 V CAL_BASE = 2.4627 V VTP P-side(average) = 0.4114 V CAL_VREF = 2.9895 V FUNCT. DIGITAL TEST = 39 error detected in test: FUNCT@5.0V:ATOM13A 1063.0 FUNCT@5.0V:ATOM13B 1119.0 FUNCT@5.0V:ATOM13C 1119.0 FUNCT@5.0V:ATOM15 1107.0 FUNCT@5.0V:ATOM17 3419.0 FUNCT@5.0V:ATOM18 3435.0 FUNCT@5.0V:ATOM18HF 3435.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3386.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1079.0 FUNCT@5.0V:ATOM21 1055.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM24 1074.0 FUNCT@5.0V:ATOM25 1061.0 FUNCT@5.0V:ATOM25HF 1061.0 FUNCT@5.0V:ATOM26A 1040.0 FUNCT@5.0V:ATOM26B 1849.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1177.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 811.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1311.0 FUNCT@5.0V:ATOM36 1068.0 FUNCT@5.0V:ATOM37A 1206.0 FUNCT@5.0V:ATOM37B 1198.0 FUNCT@5.0V:ATOM37C 1183.0 FUNCT@5.0V:ATOM37D 1150.0 FUNCT@5.0V:ATOM37E 1141.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1614.0 FUNCT@5.0V:ATOM41A 1614.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3665.0 FUNCT@5.0V:ATOM45C_40 3665.0 FUNCT@5.0V:ATOM46C_40 3665.0 FUNCT@5.0V:ATOM47C_40 3697.0 FUNCT@5.0V:ATOM48C_40 3665.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3666.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1243.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1408.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:310 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0257 b(slope) = 0.0096 chi2 = 99.0000 VTN P-side: a = 0.0102 b(slope) = 0.0064 chi2 = 0.8562 CAL_IN N-side: a = 2.4752 b(slope) = 0.0078 chi2 = 99.0000 CAL_IN P-side: a = 2.4636 b(slope) = 0.0084 chi2 = 0.6620 VTP N-side(average) = 0.6798 V CAL_BASE = 2.4714 V VTP P-side(average) = 0.4211 V CAL_VREF = 3.0090 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:210 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 16 error detected in test: V_AVDD2IMA:277/L10 2.2285 AVDD_A:AVDDP-M 0.0859 IAVDD2_A:AVDDP-M 0.0086 V_N310A:171/L6 2.2280 V_AVDD2IMB:277/L10 2.2288 AVDD_B:AVDDP-M 0.0857 IAVDD2_B:AVDDP-M 0.0086 V_N310B:171/L6 2.2280 V_AVDD2IMC:277/L10 2.2288 AVDD_C:AVDDP-M 0.0854 IAVDD2_C:AVDDP-M 0.0085 V_N310C:171/L6 2.2283 V_AVDD2IMD:277/L10 2.2288 AVDD_D:AVDDP-M 0.0857 IAVDD2_D:AVDDP-M 0.0086 V_N310D:171/L6 2.2283 DACS TEST = 0 VTN N-side: a = 0.0118 b(slope) = 0.0104 chi2 = 1.2839 VTN P-side: a = 0.0108 b(slope) = 0.0063 chi2 = 0.7025 CAL_IN N-side: a = 2.4891 b(slope) = 0.0082 chi2 = 0.8782 CAL_IN P-side: a = 2.4898 b(slope) = 0.0082 chi2 = 0.5979 VTP N-side(average) = 0.6771 V CAL_BASE = 2.4912 V VTP P-side(average) = 0.4157 V CAL_VREF = 3.0171 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3843.0 FUNCT@5.0V:ATOM45C_40 3843.0 FUNCT@5.0V:ATOM46C_40 3668.0 FUNCT@5.0V:ATOM47C_40 3667.0 FUNCT@5.0V:ATOM48C_40 3843.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3843.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:211 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0226 b(slope) = 0.0100 chi2 = 99.0000 VTN P-side: a = 0.0110 b(slope) = 0.0063 chi2 = 0.6869 CAL_IN N-side: a = 2.4755 b(slope) = 0.0108 chi2 = 99.0000 CAL_IN P-side: a = 2.4903 b(slope) = 0.0102 chi2 = 99.0000 VTP N-side(average) = 0.6692 V CAL_BASE = 2.4968 V VTP P-side(average) = 0.4121 V CAL_VREF = 3.0208 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:311 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0105 chi2 = 0.6242 VTN P-side: a = 0.0104 b(slope) = 0.0064 chi2 = 0.2276 CAL_IN N-side: a = 2.4744 b(slope) = 0.0084 chi2 = 0.7666 CAL_IN P-side: a = 2.4745 b(slope) = 0.0084 chi2 = 1.2190 VTP N-side(average) = 0.6838 V CAL_BASE = 2.4788 V VTP P-side(average) = 0.4186 V CAL_VREF = 3.0178 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:411 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0327 b(slope) = 0.0101 chi2 = 99.0000 VTN P-side: a = 0.0096 b(slope) = 0.0065 chi2 = 0.6233 CAL_IN N-side: a = 2.5041 b(slope) = 0.0077 chi2 = 99.0000 CAL_IN P-side: a = 2.4740 b(slope) = 0.0084 chi2 = 0.5252 VTP N-side(average) = 0.6929 V CAL_BASE = 2.4827 V VTP P-side(average) = 0.4272 V CAL_VREF = 3.0225 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:511 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD0A 0.1391 IDDSB:VDD0B 0.1392 IDDSB:VDD0C 0.1393 IDDSB:VDD0D 0.1393 IDDOP0:AVDD 0.1180 DACS TEST = 0 VTN N-side: a = 0.0154 b(slope) = 0.0101 chi2 = 0.6499 VTN P-side: a = 0.0153 b(slope) = 0.0061 chi2 = 0.5694 CAL_IN N-side: a = 2.4986 b(slope) = 0.0078 chi2 = 0.7192 CAL_IN P-side: a = 2.4987 b(slope) = 0.0078 chi2 = 0.6514 VTP N-side(average) = 0.6633 V CAL_BASE = 2.5054 V VTP P-side(average) = 0.4074 V CAL_VREF = 3.0024 V FUNCT. DIGITAL TEST = 26 error detected in test: FUNCT@5.0V:ATOM13A 1158.0 FUNCT@5.0V:ATOM13B 1227.0 FUNCT@5.0V:ATOM13C 1223.0 FUNCT@5.0V:ATOM15 1295.0 FUNCT@5.0V:ATOM17 3514.0 FUNCT@5.0V:ATOM18 3530.0 FUNCT@5.0V:ATOM18HF 3482.0 FUNCT@5.0V:ATOM19 3466.0 FUNCT@5.0V:ATOM19D 3394.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 9833.0 FUNCT@5.0V:ATOM19FHF 9833.0 FUNCT@5.0V:ATOM21 1066.0 FUNCT@5.0V:ATOM22 1323.0 FUNCT@5.0V:ATOM25 1156.0 FUNCT@5.0V:ATOM25HF 1088.0 FUNCT@5.0V:ATOM26A 1135.0 FUNCT@5.0V:ATOM26B 2133.0 FUNCT@5.0V:ATOM29 1449.0 FUNCT@5.0V:ATOM32 906.0 FUNCT@5.0V:ATOM33 1272.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1406.0 FUNCT@5.0V:ATOM36 1339.0 FUNCT@5.0V:ATOM37E 1166.0 FUNCT@5.0V:ATOM39 1183.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM45C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:611 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0113 chi2 = 0.4896 VTN P-side: a = 0.0096 b(slope) = 0.0068 chi2 = 0.3170 CAL_IN N-side: a = 2.4752 b(slope) = 0.0083 chi2 = 1.0803 CAL_IN P-side: a = 2.4749 b(slope) = 0.0083 chi2 = 1.0799 VTP N-side(average) = 0.7330 V CAL_BASE = 2.4773 V VTP P-side(average) = 0.4483 V CAL_VREF = 3.0120 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM17 3818.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:711 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1382 IDDSB:VDD1B 0.1455 IDDSB:VDD1C 0.1513 IDDSB:VDD1D 0.1567 IDDOP1:DVDD 0.1822 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0107 chi2 = 2.0545 VTN P-side: a = 0.0094 b(slope) = 0.0066 chi2 = 0.6405 CAL_IN N-side: a = 2.4885 b(slope) = 0.0082 chi2 = 1.3405 CAL_IN P-side: a = 2.4893 b(slope) = 0.0082 chi2 = 2.4552 VTP N-side(average) = 0.6936 V CAL_BASE = 2.4900 V VTP P-side(average) = 0.4304 V CAL_VREF = 3.0142 V FUNCT. DIGITAL TEST = 39 error detected in test: FUNCT@5.0V:ATOM13A 1396.0 FUNCT@5.0V:ATOM13B 1468.0 FUNCT@5.0V:ATOM13C 1468.0 FUNCT@5.0V:ATOM15 1440.0 FUNCT@5.0V:ATOM17 3752.0 FUNCT@5.0V:ATOM18 3768.0 FUNCT@5.0V:ATOM18HF 3768.0 FUNCT@5.0V:ATOM19 3734.0 FUNCT@5.0V:ATOM19D 3749.0 FUNCT@5.0V:ATOM19E 2946.0 FUNCT@5.0V:ATOM19F 6547.0 FUNCT@5.0V:ATOM19FHF 6547.0 FUNCT@5.0V:ATOM20 1140.0 FUNCT@5.0V:ATOM21 1146.0 FUNCT@5.0V:ATOM22 1294.0 FUNCT@5.0V:ATOM23 975.0 FUNCT@5.0V:ATOM24 1075.0 FUNCT@5.0V:ATOM25 1122.0 FUNCT@5.0V:ATOM25HF 1122.0 FUNCT@5.0V:ATOM26A 1101.0 FUNCT@5.0V:ATOM26B 1910.0 FUNCT@5.0V:ATOM28 1269.0 FUNCT@5.0V:ATOM29 1222.0 FUNCT@5.0V:ATOM30 1510.0 FUNCT@5.0V:ATOM31A 903.0 FUNCT@5.0V:ATOM31B 1061.0 FUNCT@5.0V:ATOM32 1144.0 FUNCT@5.0V:ATOM33 1540.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1644.0 FUNCT@5.0V:ATOM36 1400.0 FUNCT@5.0V:ATOM37A 1923.0 FUNCT@5.0V:ATOM37B 1931.0 FUNCT@5.0V:ATOM37C 1850.0 FUNCT@5.0V:ATOM37D 1452.0 FUNCT@5.0V:ATOM37E 1874.0 FUNCT@5.0V:ATOM39 1421.0 FUNCT@5.0V:ATOM41 1947.0 FUNCT@5.0V:ATOM41A 1947.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3938.0 FUNCT@5.0V:ATOM45C_40 3938.0 FUNCT@5.0V:ATOM46C_40 3938.0 FUNCT@5.0V:ATOM47C_40 3938.0 FUNCT@5.0V:ATOM48C_40 3938.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3938.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1244.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:811 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0108 chi2 = 1.2155 VTN P-side: a = 0.0101 b(slope) = 0.0067 chi2 = 0.5687 CAL_IN N-side: a = 2.4776 b(slope) = 0.0082 chi2 = 1.9594 CAL_IN P-side: a = 2.4789 b(slope) = 0.0082 chi2 = 3.9867 VTP N-side(average) = 0.7014 V CAL_BASE = 2.4802 V VTP P-side(average) = 0.4391 V CAL_VREF = 3.0044 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:812 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0106 chi2 = 0.7440 VTN P-side: a = 0.0100 b(slope) = 0.0065 chi2 = 0.6572 CAL_IN N-side: a = 2.4911 b(slope) = 0.0081 chi2 = 0.8822 CAL_IN P-side: a = 2.4910 b(slope) = 0.0081 chi2 = 1.0172 VTP N-side(average) = 0.6886 V CAL_BASE = 2.4915 V VTP P-side(average) = 0.4271 V CAL_VREF = 3.0127 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:712 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0116 chi2 = 0.5300 VTN P-side: a = 0.0095 b(slope) = 0.0071 chi2 = 0.8048 CAL_IN N-side: a = 2.4915 b(slope) = 0.0082 chi2 = 0.9680 CAL_IN P-side: a = 2.4917 b(slope) = 0.0082 chi2 = 1.3734 VTP N-side(average) = 0.7544 V CAL_BASE = 2.4988 V VTP P-side(average) = 0.4641 V CAL_VREF = 3.0264 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:612 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0090 b(slope) = 0.0113 chi2 = 2.0394 VTN P-side: a = 0.0094 b(slope) = 0.0068 chi2 = 0.7937 CAL_IN N-side: a = 2.5278 b(slope) = 0.0079 chi2 = 0.4366 CAL_IN P-side: a = 2.5281 b(slope) = 0.0079 chi2 = 0.2872 VTP N-side(average) = 0.7323 V CAL_BASE = 2.5327 V VTP P-side(average) = 0.4437 V CAL_VREF = 3.0408 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM18HF 4614.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5163.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:512 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0109 chi2 = 1.8846 VTN P-side: a = 0.0097 b(slope) = 0.0066 chi2 = 0.7929 CAL_IN N-side: a = 2.5617 b(slope) = 0.0078 chi2 = 0.6443 CAL_IN P-side: a = 2.5620 b(slope) = 0.0078 chi2 = 1.2703 VTP N-side(average) = 0.7064 V CAL_BASE = 2.5691 V VTP P-side(average) = 0.4310 V CAL_VREF = 3.0674 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM23 974.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4647.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 4004.0 FUNCT@5.0V:ATOM47C_40 3670.0 FUNCT@5.0V:ATOM48C_40 4647.0 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:412 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0104 b(slope) = 0.0107 chi2 = 0.7165 VTN P-side: a = 0.0238 b(slope) = 0.0052 chi2 = 99.0000 CAL_IN N-side: a = 2.5059 b(slope) = 0.0083 chi2 = 0.7443 CAL_IN P-side: a = 2.5177 b(slope) = 0.0071 chi2 = 99.0000 VTP N-side(average) = 0.6952 V CAL_BASE = 2.5046 V VTP P-side(average) = 0.4254 V CAL_VREF = 3.0339 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:312 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0125 b(slope) = 0.0105 chi2 = 0.7823 VTN P-side: a = 0.0125 b(slope) = 0.0064 chi2 = 0.4098 CAL_IN N-side: a = 2.5104 b(slope) = 0.0082 chi2 = 0.5819 CAL_IN P-side: a = 2.5107 b(slope) = 0.0081 chi2 = 0.5048 VTP N-side(average) = 0.6829 V CAL_BASE = 2.5134 V VTP P-side(average) = 0.4241 V CAL_VREF = 3.0364 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:212 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0219 b(slope) = 0.0104 chi2 = 99.0000 VTN P-side: a = 0.0103 b(slope) = 0.0065 chi2 = 0.6814 CAL_IN N-side: a = 2.5351 b(slope) = 0.0078 chi2 = 99.0000 CAL_IN P-side: a = 2.5201 b(slope) = 0.0081 chi2 = 1.2395 VTP N-side(average) = 0.6930 V CAL_BASE = 2.5222 V VTP P-side(average) = 0.4269 V CAL_VREF = 3.0449 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:413 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0106 chi2 = 1.6738 VTN P-side: a = 0.0099 b(slope) = 0.0065 chi2 = 0.6650 CAL_IN N-side: a = 2.4534 b(slope) = 0.0086 chi2 = 0.7891 CAL_IN P-side: a = 2.4536 b(slope) = 0.0086 chi2 = 0.7273 VTP N-side(average) = 0.6927 V CAL_BASE = 2.4578 V VTP P-side(average) = 0.4290 V CAL_VREF = 3.0085 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:513 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0092 b(slope) = 0.0104 chi2 = 0.6142 VTN P-side: a = 0.0095 b(slope) = 0.0063 chi2 = 0.2580 CAL_IN N-side: a = 2.5769 b(slope) = 0.0076 chi2 = 0.6366 CAL_IN P-side: a = 2.5769 b(slope) = 0.0076 chi2 = 0.3794 VTP N-side(average) = 0.6778 V CAL_BASE = 2.5745 V VTP P-side(average) = 0.4124 V CAL_VREF = 3.0637 V FUNCT. DIGITAL TEST = 5 error detected in test: FUNCT@5.0V:ATOM18 11103.0 FUNCT@5.0V:ATOM19D 4249.0 FUNCT@5.0V:ATOM25HF 2640.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM39 1519.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:613 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0105 chi2 = 1.0432 VTN P-side: a = 0.0100 b(slope) = 0.0064 chi2 = 0.7250 CAL_IN N-side: a = 2.4550 b(slope) = 0.0084 chi2 = 0.7097 CAL_IN P-side: a = 2.4553 b(slope) = 0.0084 chi2 = 0.4222 VTP N-side(average) = 0.6801 V CAL_BASE = 2.4607 V VTP P-side(average) = 0.4199 V CAL_VREF = 2.9959 V FUNCT. DIGITAL TEST = 7 error detected in test: FUNCT@5.0V:ATOM17 6234.0 FUNCT@5.0V:ATOM18 5171.0 FUNCT@5.0V:ATOM18HF 5171.0 FUNCT@5.0V:ATOM21 1706.0 FUNCT@5.0V:ATOM24 1074.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM37E 2446.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5386.0 FUNCT@5.0V:ATOM45C_40 5386.0 FUNCT@5.0V:ATOM46C_40 3667.0 FUNCT@5.0V:ATOM47C_40 5386.0 FUNCT@5.0V:ATOM48C_40 5386.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5386.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:614 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0088 b(slope) = 0.0115 chi2 = 0.8149 VTN P-side: a = 0.0091 b(slope) = 0.0069 chi2 = 0.6279 CAL_IN N-side: a = 2.5210 b(slope) = 0.0081 chi2 = 0.5511 CAL_IN P-side: a = 2.5211 b(slope) = 0.0081 chi2 = 0.5829 VTP N-side(average) = 0.7434 V CAL_BASE = 2.5283 V VTP P-side(average) = 0.4547 V CAL_VREF = 3.0452 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1383.0 FUNCT@5.0V:ATOM15 1427.0 FUNCT@5.0V:ATOM17 3739.0 FUNCT@5.0V:ATOM18 3755.0 FUNCT@5.0V:ATOM18HF 3755.0 FUNCT@5.0V:ATOM19 3691.0 FUNCT@5.0V:ATOM19D 3706.0 FUNCT@5.0V:ATOM19E 2933.0 FUNCT@5.0V:ATOM19F 6806.0 FUNCT@5.0V:ATOM19FHF 6806.0 FUNCT@5.0V:ATOM20 1399.0 FUNCT@5.0V:ATOM21 1375.0 FUNCT@5.0V:ATOM22 1363.0 FUNCT@5.0V:ATOM25 1381.0 FUNCT@5.0V:ATOM25HF 1381.0 FUNCT@5.0V:ATOM26A 1360.0 FUNCT@5.0V:ATOM26B 2169.0 FUNCT@5.0V:ATOM28 1497.0 FUNCT@5.0V:ATOM29 1497.0 FUNCT@5.0V:ATOM30 1497.0 FUNCT@5.0V:ATOM31A 1131.0 FUNCT@5.0V:ATOM31B 1320.0 FUNCT@5.0V:ATOM32 1131.0 FUNCT@5.0V:ATOM33 1497.0 FUNCT@5.0V:ATOM35 1631.0 FUNCT@5.0V:ATOM36 1387.0 FUNCT@5.0V:ATOM37A 1862.0 FUNCT@5.0V:ATOM37B 1854.0 FUNCT@5.0V:ATOM37C 1838.0 FUNCT@5.0V:ATOM37D 1806.0 FUNCT@5.0V:ATOM37E 1797.0 FUNCT@5.0V:ATOM39 1408.0 FUNCT@5.0V:ATOM41 1934.0 FUNCT@5.0V:ATOM41A 1934.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4439.0 FUNCT@5.0V:ATOM45C_40 4439.0 FUNCT@5.0V:ATOM46C_40 4439.0 FUNCT@5.0V:ATOM47C_40 4439.0 FUNCT@5.0V:ATOM48C_40 4439.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4439.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1406.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:514 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0114 chi2 = 0.6345 VTN P-side: a = 0.0097 b(slope) = 0.0069 chi2 = 0.3492 CAL_IN N-side: a = 2.4857 b(slope) = 0.0085 chi2 = 0.9351 CAL_IN P-side: a = 2.4854 b(slope) = 0.0085 chi2 = 0.6217 VTP N-side(average) = 0.7420 V CAL_BASE = 2.4890 V VTP P-side(average) = 0.4520 V CAL_VREF = 3.0322 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:414 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0107 chi2 = 0.4545 VTN P-side: a = 0.0100 b(slope) = 0.0065 chi2 = 0.2222 CAL_IN N-side: a = 2.4939 b(slope) = 0.0083 chi2 = 1.1641 CAL_IN P-side: a = 2.4940 b(slope) = 0.0083 chi2 = 0.5172 VTP N-side(average) = 0.6954 V CAL_BASE = 2.4949 V VTP P-side(average) = 0.4270 V CAL_VREF = 3.0266 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 +++++++++ WAFER DATA+++++++++++++++++++++++++++ CLASSES: A-->Good, B-->Probably Good, C-->Bad A B C ------------------------- 203 401 803 501 204 601 107 602 907 502 808 402 708 303 608 403 208 503 108 603 209 703 810 804 710 704 311 604 811 504 812 404 712 304 312 205 413 305 514 405 414 505 605 705 805 806 706 606 506 406 306 206 207 307 407 507 607 707 807 908 508 408 308 309 409 509 609 709 809 610 510 410 310 210 211 411 511 611 711 612 512 412 212 513 613 614 ---------------------------- 21 0 65 NUMBER OF CHIPS TESTED = 86 NUMBER OF CLASS A CHIPS = 21 NUMBER OF CLASS B CHIPS = 0 NUMBER OF CLASS C CHIPS = 65 YIELD = 24.42 %