------- CHIP ID:401 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0112 chi2 = 1.1258 VTN P-side: a = 0.0098 b(slope) = 0.0068 chi2 = 0.4882 CAL_IN N-side: a = 2.4926 b(slope) = 0.0088 chi2 = 1.4421 CAL_IN P-side: a = 2.4923 b(slope) = 0.0088 chi2 = 1.0708 VTP N-side(average) = 0.7259 V CAL_BASE = 2.4963 V VTP P-side(average) = 0.4449 V CAL_VREF = 3.0610 V FUNCT. DIGITAL TEST = 39 error detected in test: FUNCT@5.0V:ATOM13A 1055.0 FUNCT@5.0V:ATOM13B 1111.0 FUNCT@5.0V:ATOM13C 1111.0 FUNCT@5.0V:ATOM15 1099.0 FUNCT@5.0V:ATOM17 3411.0 FUNCT@5.0V:ATOM18 3425.0 FUNCT@5.0V:ATOM18HF 3425.0 FUNCT@5.0V:ATOM19 3363.0 FUNCT@5.0V:ATOM19D 3378.0 FUNCT@5.0V:ATOM19E 2605.0 FUNCT@5.0V:ATOM19F 6478.0 FUNCT@5.0V:ATOM19FHF 6478.0 FUNCT@5.0V:ATOM20 1069.0 FUNCT@5.0V:ATOM21 1045.0 FUNCT@5.0V:ATOM22 1038.0 FUNCT@5.0V:ATOM23 965.0 FUNCT@5.0V:ATOM24 1065.0 FUNCT@5.0V:ATOM25 1053.0 FUNCT@5.0V:ATOM25HF 1053.0 FUNCT@5.0V:ATOM26A 1030.0 FUNCT@5.0V:ATOM26B 1844.0 FUNCT@5.0V:ATOM28 1167.0 FUNCT@5.0V:ATOM29 1167.0 FUNCT@5.0V:ATOM30 1167.0 FUNCT@5.0V:ATOM31A 801.0 FUNCT@5.0V:ATOM31B 992.0 FUNCT@5.0V:ATOM32 801.0 FUNCT@5.0V:ATOM33 1167.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1301.0 FUNCT@5.0V:ATOM36 1057.0 FUNCT@5.0V:ATOM37A 1199.0 FUNCT@5.0V:ATOM37B 1189.0 FUNCT@5.0V:ATOM37C 1173.0 FUNCT@5.0V:ATOM37D 1141.0 FUNCT@5.0V:ATOM37E 1134.0 FUNCT@5.0V:ATOM39 1080.0 FUNCT@5.0V:ATOM41 1606.0 FUNCT@5.0V:ATOM41A 1606.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3659.0 FUNCT@5.0V:ATOM45C_40 3659.0 FUNCT@5.0V:ATOM46C_40 3659.0 FUNCT@5.0V:ATOM47C_40 3659.0 FUNCT@5.0V:ATOM48C_40 3659.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3659.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1235.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1392.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:501 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0117 b(slope) = 0.0110 chi2 = 1.1273 VTN P-side: a = 0.0114 b(slope) = 0.0068 chi2 = 0.4064 CAL_IN N-side: a = 2.5191 b(slope) = 0.0085 chi2 = 0.5868 CAL_IN P-side: a = 2.5191 b(slope) = 0.0085 chi2 = 0.6215 VTP N-side(average) = 0.7176 V CAL_BASE = 2.5190 V VTP P-side(average) = 0.4460 V CAL_VREF = 3.0603 V FUNCT. DIGITAL TEST = 39 error detected in test: FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 0 TMIN TEST = 1 error detected in test: TMIN@5.2V:A7_9_50D 0.0 ------- CHIP ID:601 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0109 chi2 = 1.0738 VTN P-side: a = 0.0100 b(slope) = 0.0067 chi2 = 0.4698 CAL_IN N-side: a = 2.5293 b(slope) = 0.0084 chi2 = 0.6079 CAL_IN P-side: a = 2.5291 b(slope) = 0.0084 chi2 = 0.4634 VTP N-side(average) = 0.7074 V CAL_BASE = 2.5298 V VTP P-side(average) = 0.4366 V CAL_VREF = 3.0681 V FUNCT. DIGITAL TEST = 3 error detected in test: FUNCT@5.0V:ATOM17 5594.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM36 2983.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:602 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0108 chi2 = 2.9791 VTN P-side: a = 0.0103 b(slope) = 0.0066 chi2 = 1.3386 CAL_IN N-side: a = 2.5282 b(slope) = 0.0085 chi2 = 0.6924 CAL_IN P-side: a = 2.5284 b(slope) = 0.0085 chi2 = 0.6574 VTP N-side(average) = 0.7036 V CAL_BASE = 2.5303 V VTP P-side(average) = 0.4325 V CAL_VREF = 3.0725 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:502 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0110 chi2 = 1.3443 VTN P-side: a = 0.0106 b(slope) = 0.0067 chi2 = 0.6337 CAL_IN N-side: a = 2.4967 b(slope) = 0.0087 chi2 = 0.5918 CAL_IN P-side: a = 2.4967 b(slope) = 0.0087 chi2 = 0.3630 VTP N-side(average) = 0.7155 V CAL_BASE = 2.5002 V VTP P-side(average) = 0.4403 V CAL_VREF = 3.0593 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:402 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0109 b(slope) = 0.0110 chi2 = 2.2056 VTN P-side: a = 0.0107 b(slope) = 0.0067 chi2 = 0.8100 CAL_IN N-side: a = 2.5040 b(slope) = 0.0086 chi2 = 1.0667 CAL_IN P-side: a = 2.5042 b(slope) = 0.0086 chi2 = 1.1151 VTP N-side(average) = 0.7126 V CAL_BASE = 2.5093 V VTP P-side(average) = 0.4395 V CAL_VREF = 3.0593 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3923.0 FUNCT@5.0V:ATOM45C_40 3923.0 FUNCT@5.0V:ATOM46C_40 3923.0 FUNCT@5.0V:ATOM47C_40 3923.0 FUNCT@5.0V:ATOM48C_40 3923.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3923.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:203 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0247 b(slope) = 0.0103 chi2 = 99.0000 VTN P-side: a = 0.0120 b(slope) = 0.0064 chi2 = 0.6440 CAL_IN N-side: a = 2.5210 b(slope) = 0.0083 chi2 = 99.0000 CAL_IN P-side: a = 2.5047 b(slope) = 0.0086 chi2 = 2.6259 VTP N-side(average) = 0.6931 V CAL_BASE = 2.5068 V VTP P-side(average) = 0.4224 V CAL_VREF = 3.0625 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:303 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0102 b(slope) = 0.0109 chi2 = 1.1409 VTN P-side: a = 0.0105 b(slope) = 0.0066 chi2 = 0.4177 CAL_IN N-side: a = 2.4536 b(slope) = 0.0115 chi2 = 99.0000 CAL_IN P-side: a = 2.4813 b(slope) = 0.0105 chi2 = 99.0000 VTP N-side(average) = 0.7080 V CAL_BASE = 2.4812 V VTP P-side(average) = 0.4349 V CAL_VREF = 3.0471 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1936.0 FUNCT@5.0V:ATOM15 1980.0 FUNCT@5.0V:ATOM17 4292.0 FUNCT@5.0V:ATOM18 4306.0 FUNCT@5.0V:ATOM18HF 4306.0 FUNCT@5.0V:ATOM19 4244.0 FUNCT@5.0V:ATOM19D 4259.0 FUNCT@5.0V:ATOM19E 3486.0 FUNCT@5.0V:ATOM19F 7359.0 FUNCT@5.0V:ATOM19FHF 7359.0 FUNCT@5.0V:ATOM20 1950.0 FUNCT@5.0V:ATOM21 1928.0 FUNCT@5.0V:ATOM22 1915.0 FUNCT@5.0V:ATOM25 1934.0 FUNCT@5.0V:ATOM25HF 1934.0 FUNCT@5.0V:ATOM26A 1911.0 FUNCT@5.0V:ATOM26B 2721.0 FUNCT@5.0V:ATOM28 2048.0 FUNCT@5.0V:ATOM29 2048.0 FUNCT@5.0V:ATOM30 2048.0 FUNCT@5.0V:ATOM31A 1682.0 FUNCT@5.0V:ATOM31B 1873.0 FUNCT@5.0V:ATOM32 1682.0 FUNCT@5.0V:ATOM33 2048.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 2182.0 FUNCT@5.0V:ATOM36 1938.0 FUNCT@5.0V:ATOM37A 2960.0 FUNCT@5.0V:ATOM37B 2952.0 FUNCT@5.0V:ATOM37C 2934.0 FUNCT@5.0V:ATOM37D 2902.0 FUNCT@5.0V:ATOM39 1961.0 FUNCT@5.0V:ATOM41 2487.0 FUNCT@5.0V:ATOM41A 2487.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:403 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0109 b(slope) = 0.0109 chi2 = 1.0783 VTN P-side: a = 0.0108 b(slope) = 0.0066 chi2 = 0.3095 CAL_IN N-side: a = 2.4830 b(slope) = 0.0089 chi2 = 1.1480 CAL_IN P-side: a = 2.4833 b(slope) = 0.0088 chi2 = 0.9182 VTP N-side(average) = 0.7103 V CAL_BASE = 2.4822 V VTP P-side(average) = 0.4357 V CAL_VREF = 3.0496 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1095.0 FUNCT@5.0V:ATOM15 1139.0 FUNCT@5.0V:ATOM17 3451.0 FUNCT@5.0V:ATOM18 3467.0 FUNCT@5.0V:ATOM18HF 3467.0 FUNCT@5.0V:ATOM19 3403.0 FUNCT@5.0V:ATOM19D 3418.0 FUNCT@5.0V:ATOM19E 2645.0 FUNCT@5.0V:ATOM19F 6518.0 FUNCT@5.0V:ATOM19FHF 6518.0 FUNCT@5.0V:ATOM20 1111.0 FUNCT@5.0V:ATOM21 1087.0 FUNCT@5.0V:ATOM22 1075.0 FUNCT@5.0V:ATOM25 1093.0 FUNCT@5.0V:ATOM25HF 1093.0 FUNCT@5.0V:ATOM26A 1072.0 FUNCT@5.0V:ATOM26B 1881.0 FUNCT@5.0V:ATOM28 1209.0 FUNCT@5.0V:ATOM29 1209.0 FUNCT@5.0V:ATOM30 1209.0 FUNCT@5.0V:ATOM31A 843.0 FUNCT@5.0V:ATOM31B 1032.0 FUNCT@5.0V:ATOM32 843.0 FUNCT@5.0V:ATOM33 1209.0 FUNCT@5.0V:ATOM35 1343.0 FUNCT@5.0V:ATOM36 1099.0 FUNCT@5.0V:ATOM37A 1286.0 FUNCT@5.0V:ATOM37B 1278.0 FUNCT@5.0V:ATOM37C 1262.0 FUNCT@5.0V:ATOM37D 1230.0 FUNCT@5.0V:ATOM37E 1221.0 FUNCT@5.0V:ATOM39 1120.0 FUNCT@5.0V:ATOM41 1646.0 FUNCT@5.0V:ATOM41A 1646.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4295.0 FUNCT@5.0V:ATOM45C_40 4295.0 FUNCT@5.0V:ATOM46C_40 4295.0 FUNCT@5.0V:ATOM47C_40 4295.0 FUNCT@5.0V:ATOM48C_40 4295.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4295.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:503 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0110 b(slope) = 0.0109 chi2 = 0.8717 VTN P-side: a = 0.0107 b(slope) = 0.0066 chi2 = 0.6956 CAL_IN N-side: a = 2.4825 b(slope) = 0.0088 chi2 = 0.7807 CAL_IN P-side: a = 2.4828 b(slope) = 0.0088 chi2 = 0.6292 VTP N-side(average) = 0.7106 V CAL_BASE = 2.4844 V VTP P-side(average) = 0.4371 V CAL_VREF = 3.0493 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:603 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0114 b(slope) = 0.0109 chi2 = 1.0731 VTN P-side: a = 0.0113 b(slope) = 0.0066 chi2 = 0.5405 CAL_IN N-side: a = 2.4896 b(slope) = 0.0086 chi2 = 0.7415 CAL_IN P-side: a = 2.4899 b(slope) = 0.0086 chi2 = 0.6295 VTP N-side(average) = 0.7068 V CAL_BASE = 2.4905 V VTP P-side(average) = 0.4376 V CAL_VREF = 3.0452 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:703 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0112 b(slope) = 0.0108 chi2 = 1.3822 VTN P-side: a = 0.0112 b(slope) = 0.0066 chi2 = 0.7116 CAL_IN N-side: a = 2.4929 b(slope) = 0.0087 chi2 = 1.1603 CAL_IN P-side: a = 2.4931 b(slope) = 0.0087 chi2 = 0.5325 VTP N-side(average) = 0.7034 V CAL_BASE = 2.4907 V VTP P-side(average) = 0.4330 V CAL_VREF = 3.0461 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:803 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0116 b(slope) = 0.0111 chi2 = 0.6694 VTN P-side: a = 0.0115 b(slope) = 0.0069 chi2 = 0.3075 CAL_IN N-side: a = 2.5218 b(slope) = 0.0084 chi2 = 1.1224 CAL_IN P-side: a = 2.5215 b(slope) = 0.0085 chi2 = 0.2482 VTP N-side(average) = 0.7215 V CAL_BASE = 2.5227 V VTP P-side(average) = 0.4532 V CAL_VREF = 3.0642 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5903.0 FUNCT@5.0V:ATOM45C_40 5903.0 FUNCT@5.0V:ATOM46C_40 5903.0 FUNCT@5.0V:ATOM47C_40 4277.0 FUNCT@5.0V:ATOM48C_40 5903.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5903.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:804 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0110 chi2 = 1.7351 VTN P-side: a = 0.0095 b(slope) = 0.0068 chi2 = 0.5830 CAL_IN N-side: a = 2.4965 b(slope) = 0.0087 chi2 = 1.4377 CAL_IN P-side: a = 2.4965 b(slope) = 0.0087 chi2 = 1.8603 VTP N-side(average) = 0.7165 V CAL_BASE = 2.4946 V VTP P-side(average) = 0.4450 V CAL_VREF = 3.0510 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:704 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0088 b(slope) = 0.0109 chi2 = 1.3200 VTN P-side: a = 0.0093 b(slope) = 0.0067 chi2 = 0.3797 CAL_IN N-side: a = 2.5049 b(slope) = 0.0086 chi2 = 3.1179 CAL_IN P-side: a = 2.5038 b(slope) = 0.0086 chi2 = 52.8361 VTP N-side(average) = 0.7070 V CAL_BASE = 2.5076 V VTP P-side(average) = 0.4377 V CAL_VREF = 3.0591 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:604 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0109 chi2 = 1.6193 VTN P-side: a = 0.0098 b(slope) = 0.0067 chi2 = 0.7881 CAL_IN N-side: a = 2.5059 b(slope) = 0.0086 chi2 = 0.5748 CAL_IN P-side: a = 2.5060 b(slope) = 0.0086 chi2 = 0.5697 VTP N-side(average) = 0.7102 V CAL_BASE = 2.5083 V VTP P-side(average) = 0.4372 V CAL_VREF = 3.0615 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:504 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0090 b(slope) = 0.0111 chi2 = 1.8655 VTN P-side: a = 0.0095 b(slope) = 0.0067 chi2 = 0.7114 CAL_IN N-side: a = 2.4930 b(slope) = 0.0087 chi2 = 0.8857 CAL_IN P-side: a = 2.4929 b(slope) = 0.0087 chi2 = 1.0673 VTP N-side(average) = 0.7186 V CAL_BASE = 2.4951 V VTP P-side(average) = 0.4420 V CAL_VREF = 3.0549 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:404 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0098 b(slope) = 0.0110 chi2 = 0.9241 VTN P-side: a = 0.0098 b(slope) = 0.0067 chi2 = 0.5450 CAL_IN N-side: a = 3.0924 b(slope) = 0.0000 chi2 = 2.9783 CAL_IN P-side: a = 3.0924 b(slope) = 0.0000 chi2 = 1.6309 VTP N-side(average) = 0.7133 V CAL_BASE = 2.4934 V VTP P-side(average) = 0.4391 V CAL_VREF = 3.0603 V FUNCT. DIGITAL TEST = 32 error detected in test: FUNCT@5.0V:ATOM13A 1922.0 FUNCT@5.0V:ATOM15 1966.0 FUNCT@5.0V:ATOM17 4278.0 FUNCT@5.0V:ATOM18 4294.0 FUNCT@5.0V:ATOM18HF 4294.0 FUNCT@5.0V:ATOM19 4230.0 FUNCT@5.0V:ATOM19D 4245.0 FUNCT@5.0V:ATOM19E 3472.0 FUNCT@5.0V:ATOM19F 7347.0 FUNCT@5.0V:ATOM19FHF 7347.0 FUNCT@5.0V:ATOM20 1940.0 FUNCT@5.0V:ATOM21 1915.0 FUNCT@5.0V:ATOM25 1922.0 FUNCT@5.0V:ATOM25HF 1922.0 FUNCT@5.0V:ATOM26A 1901.0 FUNCT@5.0V:ATOM26B 2710.0 FUNCT@5.0V:ATOM28 2037.0 FUNCT@5.0V:ATOM29 2038.0 FUNCT@5.0V:ATOM30 2037.0 FUNCT@5.0V:ATOM31A 1671.0 FUNCT@5.0V:ATOM31B 1861.0 FUNCT@5.0V:ATOM32 1671.0 FUNCT@5.0V:ATOM33 2036.0 FUNCT@5.0V:ATOM35 2170.0 FUNCT@5.0V:ATOM36 1926.0 FUNCT@5.0V:ATOM37A 2930.0 FUNCT@5.0V:ATOM37B 2923.0 FUNCT@5.0V:ATOM37C 2908.0 FUNCT@5.0V:ATOM37E 2866.0 FUNCT@5.0V:ATOM39 1948.0 FUNCT@5.0V:ATOM41 2473.0 FUNCT@5.0V:ATOM41A 2473.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:304 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0769 b(slope) = 0.0094 chi2 = 99.0000 VTN P-side: a = 0.0094 b(slope) = 0.0067 chi2 = 0.7968 CAL_IN N-side: a = 3.0927 b(slope) = 0.0000 chi2 = 2.7741 CAL_IN P-side: a = 3.0925 b(slope) = 0.0000 chi2 = 2.1298 VTP N-side(average) = 0.7086 V CAL_BASE = 2.4790 V VTP P-side(average) = 0.4370 V CAL_VREF = 3.0476 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:204 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0089 b(slope) = 0.0110 chi2 = 1.8658 VTN P-side: a = 0.0094 b(slope) = 0.0066 chi2 = 0.6387 CAL_IN N-side: a = 3.0924 b(slope) = 0.0000 chi2 = 2.8617 CAL_IN P-side: a = 3.0926 b(slope) = 0.0000 chi2 = 2.6055 VTP N-side(average) = 0.7112 V CAL_BASE = 2.5171 V VTP P-side(average) = 0.4357 V CAL_VREF = 3.0669 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:205 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0108 chi2 = 1.1050 VTN P-side: a = 0.0099 b(slope) = 0.0066 chi2 = 0.6434 CAL_IN N-side: a = 2.5026 b(slope) = 0.0087 chi2 = 0.5854 CAL_IN P-side: a = 2.5023 b(slope) = 0.0087 chi2 = 0.7586 VTP N-side(average) = 0.7052 V CAL_BASE = 2.5002 V VTP P-side(average) = 0.4346 V CAL_VREF = 3.0593 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:305 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0108 chi2 = 0.9953 VTN P-side: a = 0.0098 b(slope) = 0.0066 chi2 = 0.3401 CAL_IN N-side: a = 2.4970 b(slope) = 0.0087 chi2 = 0.4002 CAL_IN P-side: a = 2.4970 b(slope) = 0.0086 chi2 = 0.5249 VTP N-side(average) = 0.7015 V CAL_BASE = 2.5000 V VTP P-side(average) = 0.4323 V CAL_VREF = 3.0547 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:405 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0110 chi2 = 1.1666 VTN P-side: a = 0.0099 b(slope) = 0.0067 chi2 = 0.5349 CAL_IN N-side: a = 2.4585 b(slope) = 0.0090 chi2 = 0.9419 CAL_IN P-side: a = 2.4585 b(slope) = 0.0090 chi2 = 0.8551 VTP N-side(average) = 0.7131 V CAL_BASE = 2.4612 V VTP P-side(average) = 0.4401 V CAL_VREF = 3.0386 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:505 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: IDDSB:VDD0A 0.1180 IDDSB:VDD0B 0.1180 IDDSB:VDD0C 0.1180 IDDSB:VDD0D 0.1180 DACS TEST = 0 VTN N-side: a = 0.0143 b(slope) = 0.0107 chi2 = 1.0133 VTN P-side: a = 0.0146 b(slope) = 0.0065 chi2 = 0.4285 CAL_IN N-side: a = 2.4827 b(slope) = 0.0085 chi2 = 0.8205 CAL_IN P-side: a = 2.4826 b(slope) = 0.0085 chi2 = 0.8406 VTP N-side(average) = 0.7011 V CAL_BASE = 2.4868 V VTP P-side(average) = 0.4346 V CAL_VREF = 3.0315 V FUNCT. DIGITAL TEST = 12 error detected in test: FUNCT@5.0V:ATOM1TO6A 276.0 FUNCT@5.0V:ATOM1TO6B 278.0 FUNCT@5.0V:ATOM1TO6C 278.0 FUNCT@5.0V:ATOM1TO6D 278.0 FUNCT@5.0V:ATOM1TO6E 278.0 FUNCT@5.0V:ATOM7TO9A 322.0 FUNCT@5.0V:ATOM7TO9B 322.0 FUNCT@5.0V:ATOM7TO9C 322.0 FUNCT@5.0V:ATOM7TO9D 322.0 FUNCT@5.0V:ATOM7TO9E 322.0 FUNCT@5.0V:ATOM10TO12 547.0 FUNCT@5.0V:ATOM35 2555.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3667.0 FUNCT@5.0V:ATOM46C_40 3667.0 FUNCT@5.0V:ATOM47C_40 4277.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 320.0 FUNCT@5.0V:A10TO12HF 547.0 FUNCT@5.0V:ADAC37HF 322.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:605 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0109 chi2 = 1.6443 VTN P-side: a = 0.0103 b(slope) = 0.0067 chi2 = 0.4583 CAL_IN N-side: a = 2.4947 b(slope) = 0.0087 chi2 = 0.5737 CAL_IN P-side: a = 2.4947 b(slope) = 0.0087 chi2 = 0.5760 VTP N-side(average) = 0.7079 V CAL_BASE = 2.4988 V VTP P-side(average) = 0.4370 V CAL_VREF = 3.0549 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:705 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0110 chi2 = 0.7886 VTN P-side: a = 0.0097 b(slope) = 0.0067 chi2 = 0.5301 CAL_IN N-side: a = 2.5032 b(slope) = 0.0086 chi2 = 0.8152 CAL_IN P-side: a = 2.5031 b(slope) = 0.0086 chi2 = 0.5474 VTP N-side(average) = 0.7128 V CAL_BASE = 2.5061 V VTP P-side(average) = 0.4423 V CAL_VREF = 3.0588 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:805 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0110 chi2 = 0.6357 VTN P-side: a = 0.0101 b(slope) = 0.0068 chi2 = 0.4030 CAL_IN N-side: a = 2.4835 b(slope) = 0.0087 chi2 = 0.6350 CAL_IN P-side: a = 2.4834 b(slope) = 0.0087 chi2 = 0.3461 VTP N-side(average) = 0.7125 V CAL_BASE = 2.4868 V VTP P-side(average) = 0.4450 V CAL_VREF = 3.0442 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:806 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0108 chi2 = 0.5641 VTN P-side: a = 0.0096 b(slope) = 0.0067 chi2 = 0.4724 CAL_IN N-side: a = 2.4881 b(slope) = 0.0086 chi2 = 1.0061 CAL_IN P-side: a = 2.4880 b(slope) = 0.0086 chi2 = 0.6594 VTP N-side(average) = 0.7051 V CAL_BASE = 2.4910 V VTP P-side(average) = 0.4400 V CAL_VREF = 3.0444 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:706 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0110 chi2 = 2.3703 VTN P-side: a = 0.0101 b(slope) = 0.0067 chi2 = 0.5715 CAL_IN N-side: a = 2.4957 b(slope) = 0.0087 chi2 = 2.3040 CAL_IN P-side: a = 2.4980 b(slope) = 0.0087 chi2 = 1.0709 VTP N-side(average) = 0.7155 V CAL_BASE = 2.4966 V VTP P-side(average) = 0.4409 V CAL_VREF = 3.1057 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:606 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5124 V_V1RB:169/L5 3.5122 V_V1RC:169/L5 3.5129 V_V1RD:169/L5 3.5110 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0108 chi2 = 0.7388 VTN P-side: a = 0.0096 b(slope) = 0.0065 chi2 = 0.5131 CAL_IN N-side: a = 2.3877 b(slope) = 0.0088 chi2 = 0.6327 CAL_IN P-side: a = 2.3876 b(slope) = 0.0088 chi2 = 0.5412 VTP N-side(average) = 0.6991 V CAL_BASE = 2.3911 V VTP P-side(average) = 0.4297 V CAL_VREF = 3.5252 V FUNCT. DIGITAL TEST = 14 error detected in test: FUNCT@5.0V:ATOM13A 1878.0 FUNCT@5.0V:ATOM17 4234.0 FUNCT@5.0V:ATOM19 4186.0 FUNCT@5.0V:ATOM19D 4201.0 FUNCT@5.0V:ATOM19E 3428.0 FUNCT@5.0V:ATOM21 1870.0 FUNCT@5.0V:ATOM22 1858.0 FUNCT@5.0V:ATOM25 1876.0 FUNCT@5.0V:ATOM25HF 1876.0 FUNCT@5.0V:ATOM26A 1855.0 FUNCT@5.0V:ATOM26B 3061.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM36 3111.0 FUNCT@5.0V:ATOM39 1903.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4954.0 FUNCT@5.0V:ATOM45C_40 4954.0 FUNCT@5.0V:ATOM46C_40 3668.0 FUNCT@5.0V:ATOM47C_40 4277.0 FUNCT@5.0V:ATOM48C_40 4954.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4954.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:506 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5205 V_V1RB:169/L5 3.5198 V_V1RC:169/L5 3.5203 V_V1RD:169/L5 3.5173 DACS TEST = 1 VTN N-side: a = 0.0089 b(slope) = 0.0109 chi2 = 2.2762 VTN P-side: a = 0.0095 b(slope) = 0.0067 chi2 = 1.0339 CAL_IN N-side: a = 3.0934 b(slope) = 0.0000 chi2 = 55.2165 CAL_IN P-side: a = 3.0938 b(slope) = 0.0000 chi2 = 2.4043 VTP N-side(average) = 0.7077 V CAL_BASE = 2.4539 V VTP P-side(average) = 0.4366 V CAL_VREF = 3.5322 V FUNCT. DIGITAL TEST = 5 error detected in test: FUNCT@5.0V:ATOM13B 1130.0 FUNCT@5.0V:ATOM13C 1130.0 FUNCT@5.0V:ATOM26A 1050.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM37E 1152.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:406 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5083 V_V1RB:169/L5 3.5076 V_V1RC:169/L5 3.5085 V_V1RD:169/L5 3.5071 DACS TEST = 1 VTN N-side: a = 0.0080 b(slope) = 0.0110 chi2 = 1.3779 VTN P-side: a = 0.0084 b(slope) = 0.0067 chi2 = 0.6935 CAL_IN N-side: a = 3.0935 b(slope) = 0.0000 chi2 = 1.8009 CAL_IN P-side: a = 3.0935 b(slope) = 0.0000 chi2 = 3.3936 VTP N-side(average) = 0.7141 V CAL_BASE = 2.4097 V VTP P-side(average) = 0.4370 V CAL_VREF = 3.5208 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:306 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5027 V_V1RB:169/L5 3.5032 V_V1RC:169/L5 3.5037 V_V1RD:169/L5 3.5015 DACS TEST = 0 VTN N-side: a = 0.0088 b(slope) = 0.0109 chi2 = 0.6612 VTN P-side: a = 0.0088 b(slope) = 0.0066 chi2 = 0.2901 CAL_IN N-side: a = 2.3958 b(slope) = 0.0087 chi2 = 0.5521 CAL_IN P-side: a = 2.3958 b(slope) = 0.0087 chi2 = 1.3726 VTP N-side(average) = 0.7067 V CAL_BASE = 2.3962 V VTP P-side(average) = 0.4341 V CAL_VREF = 3.5156 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:206 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0096 b(slope) = 0.0108 chi2 = 1.8796 VTN P-side: a = 0.0098 b(slope) = 0.0065 chi2 = 0.8020 CAL_IN N-side: a = 3.0924 b(slope) = 0.0000 chi2 = 2.7498 CAL_IN P-side: a = 3.0923 b(slope) = 0.0000 chi2 = 2.0637 VTP N-side(average) = 0.7045 V CAL_BASE = 2.5010 V VTP P-side(average) = 0.4300 V CAL_VREF = 3.0659 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:107 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0100 b(slope) = 0.0107 chi2 = 1.7710 VTN P-side: a = 0.0103 b(slope) = 0.0065 chi2 = 0.7341 CAL_IN N-side: a = 3.0925 b(slope) = 0.0000 chi2 = 3.6518 CAL_IN P-side: a = 3.0929 b(slope) = 0.0000 chi2 = 4.5710 VTP N-side(average) = 0.6973 V CAL_BASE = 2.5120 V VTP P-side(average) = 0.4294 V CAL_VREF = 3.0718 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:207 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0109 chi2 = 2.5615 VTN P-side: a = 0.0106 b(slope) = 0.0066 chi2 = 0.9943 CAL_IN N-side: a = 2.5137 b(slope) = 0.0085 chi2 = 0.9826 CAL_IN P-side: a = 2.5137 b(slope) = 0.0085 chi2 = 0.9908 VTP N-side(average) = 0.7067 V CAL_BASE = 2.5198 V VTP P-side(average) = 0.4353 V CAL_VREF = 3.0664 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:307 --------------------------------------- CLASS=B -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0106 b(slope) = 0.0109 chi2 = 1.8540 VTN P-side: a = 0.0109 b(slope) = 0.0067 chi2 = 0.4642 CAL_IN N-side: a = 2.4823 b(slope) = 0.0088 chi2 = 0.6959 CAL_IN P-side: a = 2.4824 b(slope) = 0.0088 chi2 = 1.1023 VTP N-side(average) = 0.7096 V CAL_BASE = 2.4871 V VTP P-side(average) = 0.4381 V CAL_VREF = 3.0520 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5503.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:407 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0107 b(slope) = 0.0109 chi2 = 1.5352 VTN P-side: a = 0.0104 b(slope) = 0.0066 chi2 = 1.1198 CAL_IN N-side: a = 2.5078 b(slope) = 0.0086 chi2 = 0.8048 CAL_IN P-side: a = 2.5078 b(slope) = 0.0086 chi2 = 0.7515 VTP N-side(average) = 0.7106 V CAL_BASE = 2.5105 V VTP P-side(average) = 0.4350 V CAL_VREF = 3.0591 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1409.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:507 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0109 chi2 = 0.8176 VTN P-side: a = 0.0101 b(slope) = 0.0067 chi2 = 0.5178 CAL_IN N-side: a = 2.4972 b(slope) = 0.0087 chi2 = 0.8436 CAL_IN P-side: a = 2.4975 b(slope) = 0.0087 chi2 = 0.8698 VTP N-side(average) = 0.7103 V CAL_BASE = 2.5027 V VTP P-side(average) = 0.4386 V CAL_VREF = 3.0625 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:607 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0106 b(slope) = 0.0109 chi2 = 1.3828 VTN P-side: a = 0.0101 b(slope) = 0.0067 chi2 = 0.7018 CAL_IN N-side: a = 2.4753 b(slope) = 0.0088 chi2 = 0.7784 CAL_IN P-side: a = 2.4754 b(slope) = 0.0088 chi2 = 0.6568 VTP N-side(average) = 0.7077 V CAL_BASE = 2.4771 V VTP P-side(average) = 0.4369 V CAL_VREF = 3.0442 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:707 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0108 chi2 = 0.7291 VTN P-side: a = 0.0098 b(slope) = 0.0066 chi2 = 0.5469 CAL_IN N-side: a = 2.5372 b(slope) = 0.0083 chi2 = 0.5792 CAL_IN P-side: a = 2.5369 b(slope) = 0.0083 chi2 = 0.7463 VTP N-side(average) = 0.6998 V CAL_BASE = 2.5403 V VTP P-side(average) = 0.4319 V CAL_VREF = 3.0706 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:807 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0110 chi2 = 1.7998 VTN P-side: a = 0.0105 b(slope) = 0.0068 chi2 = 0.6194 CAL_IN N-side: a = 2.4868 b(slope) = 0.0087 chi2 = 0.9277 CAL_IN P-side: a = 2.4868 b(slope) = 0.0087 chi2 = 0.8484 VTP N-side(average) = 0.7153 V CAL_BASE = 2.4900 V VTP P-side(average) = 0.4456 V CAL_VREF = 3.0447 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:907 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0108 b(slope) = 0.0110 chi2 = 1.0647 VTN P-side: a = 0.0111 b(slope) = 0.0067 chi2 = 0.4775 CAL_IN N-side: a = 2.4924 b(slope) = 0.0086 chi2 = 1.3763 CAL_IN P-side: a = 2.4936 b(slope) = 0.0087 chi2 = 2.3445 VTP N-side(average) = 0.7158 V CAL_BASE = 2.4929 V VTP P-side(average) = 0.4433 V CAL_VREF = 3.0452 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:908 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.4927 V_V1RB:169/L5 3.4927 V_V1RC:169/L5 3.4929 V_V1RD:169/L5 3.4915 DACS TEST = 0 VTN N-side: a = 0.0087 b(slope) = 0.0113 chi2 = 1.2360 VTN P-side: a = 0.0090 b(slope) = 0.0070 chi2 = 0.5248 CAL_IN N-side: a = 2.4211 b(slope) = 0.0084 chi2 = 0.7517 CAL_IN P-side: a = 2.4212 b(slope) = 0.0084 chi2 = 0.5654 VTP N-side(average) = 0.7345 V CAL_BASE = 2.4851 V VTP P-side(average) = 0.4571 V CAL_VREF = 3.5046 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:808 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5103 V_V1RB:169/L5 3.5107 V_V1RC:169/L5 3.5107 V_V1RD:169/L5 3.5085 DACS TEST = 0 VTN N-side: a = 0.0092 b(slope) = 0.0110 chi2 = 0.8996 VTN P-side: a = 0.0093 b(slope) = 0.0068 chi2 = 0.3968 CAL_IN N-side: a = 2.4218 b(slope) = 0.0085 chi2 = 0.5076 CAL_IN P-side: a = 2.4219 b(slope) = 0.0085 chi2 = 0.3490 VTP N-side(average) = 0.7165 V CAL_BASE = 2.4241 V VTP P-side(average) = 0.4472 V CAL_VREF = 3.5220 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:708 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5076 V_V1RB:169/L5 3.5076 V_V1RC:169/L5 3.5078 V_V1RD:169/L5 3.5056 DACS TEST = 1 VTN N-side: a = 0.0089 b(slope) = 0.0109 chi2 = 0.6015 VTN P-side: a = 0.0090 b(slope) = 0.0067 chi2 = 0.2891 CAL_IN N-side: a = 3.0934 b(slope) = 0.0000 chi2 = 2.6541 CAL_IN P-side: a = 3.0936 b(slope) = 0.0000 chi2 = 2.8534 VTP N-side(average) = 0.7061 V CAL_BASE = 2.4004 V VTP P-side(average) = 0.4384 V CAL_VREF = 3.5195 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:608 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0099 b(slope) = 0.0108 chi2 = 0.9036 VTN P-side: a = 0.0100 b(slope) = 0.0066 chi2 = 0.6240 CAL_IN N-side: a = 3.0925 b(slope) = 0.0000 chi2 = 2.7082 CAL_IN P-side: a = 3.0927 b(slope) = 0.0000 chi2 = 2.6231 VTP N-side(average) = 0.7032 V CAL_BASE = 2.5166 V VTP P-side(average) = 0.4330 V CAL_VREF = 3.0608 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:508 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5227 V_V1RB:169/L5 3.5225 V_V1RC:169/L5 3.5217 V_V1RD:169/L5 3.5203 DACS TEST = 1 VTN N-side: a = 0.0091 b(slope) = 0.0109 chi2 = 1.1934 VTN P-side: a = 0.0091 b(slope) = 0.0066 chi2 = 0.3702 CAL_IN N-side: a = 3.0933 b(slope) = 0.0000 chi2 = 2.5420 CAL_IN P-side: a = 3.0936 b(slope) = 0.0000 chi2 = 2.9260 VTP N-side(average) = 0.7057 V CAL_BASE = 2.4487 V VTP P-side(average) = 0.4354 V CAL_VREF = 3.5347 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:408 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5071 V_V1RB:169/L5 3.5076 V_V1RC:169/L5 3.5083 V_V1RD:169/L5 3.5064 DACS TEST = 1 VTN N-side: a = 0.0096 b(slope) = 0.0110 chi2 = 1.4885 VTN P-side: a = 0.0099 b(slope) = 0.0067 chi2 = 0.6650 CAL_IN N-side: a = 3.0932 b(slope) = 0.0000 chi2 = 57.7440 CAL_IN P-side: a = 3.0940 b(slope) = 0.0000 chi2 = 2.6615 VTP N-side(average) = 0.7117 V CAL_BASE = 2.4009 V VTP P-side(average) = 0.4382 V CAL_VREF = 3.5198 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:308 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0112 b(slope) = 0.0108 chi2 = 0.9930 VTN P-side: a = 0.0112 b(slope) = 0.0066 chi2 = 0.4610 CAL_IN N-side: a = 2.5173 b(slope) = 0.0086 chi2 = 1.1424 CAL_IN P-side: a = 2.5176 b(slope) = 0.0086 chi2 = 0.9689 VTP N-side(average) = 0.7053 V CAL_BASE = 2.5168 V VTP P-side(average) = 0.4374 V CAL_VREF = 3.0706 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:208 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0113 b(slope) = 0.0108 chi2 = 0.9689 VTN P-side: a = 0.0113 b(slope) = 0.0066 chi2 = 0.6170 CAL_IN N-side: a = 3.0926 b(slope) = 0.0000 chi2 = 3.6019 CAL_IN P-side: a = 3.0927 b(slope) = 0.0000 chi2 = 3.1783 VTP N-side(average) = 0.7032 V CAL_BASE = 2.5181 V VTP P-side(average) = 0.4329 V CAL_VREF = 3.0669 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1403.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:108 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0112 b(slope) = 0.0108 chi2 = 0.5937 VTN P-side: a = 0.0114 b(slope) = 0.0065 chi2 = 0.4315 CAL_IN N-side: a = 3.0926 b(slope) = 0.0000 chi2 = 2.0286 CAL_IN P-side: a = 3.0927 b(slope) = 0.0000 chi2 = 1.6424 VTP N-side(average) = 0.7017 V CAL_BASE = 2.5105 V VTP P-side(average) = 0.4312 V CAL_VREF = 3.0642 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:209 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.4929 V_V1RB:169/L5 3.4927 V_V1RC:169/L5 3.4932 V_V1RD:169/L5 3.4907 DACS TEST = 0 VTN N-side: a = 0.0108 b(slope) = 0.0107 chi2 = 0.8085 VTN P-side: a = 0.0106 b(slope) = 0.0065 chi2 = 0.3298 CAL_IN N-side: a = 2.3849 b(slope) = 0.0087 chi2 = 0.7446 CAL_IN P-side: a = 2.3850 b(slope) = 0.0087 chi2 = 0.6053 VTP N-side(average) = 0.6990 V CAL_BASE = 2.3928 V VTP P-side(average) = 0.4303 V CAL_VREF = 3.5044 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1863.0 FUNCT@5.0V:ATOM15 1907.0 FUNCT@5.0V:ATOM17 4219.0 FUNCT@5.0V:ATOM18 4235.0 FUNCT@5.0V:ATOM18HF 4235.0 FUNCT@5.0V:ATOM19 4171.0 FUNCT@5.0V:ATOM19D 4186.0 FUNCT@5.0V:ATOM19E 3413.0 FUNCT@5.0V:ATOM19F 7286.0 FUNCT@5.0V:ATOM19FHF 7286.0 FUNCT@5.0V:ATOM20 1879.0 FUNCT@5.0V:ATOM21 1855.0 FUNCT@5.0V:ATOM22 1843.0 FUNCT@5.0V:ATOM25 1861.0 FUNCT@5.0V:ATOM25HF 1861.0 FUNCT@5.0V:ATOM26A 1840.0 FUNCT@5.0V:ATOM26B 2649.0 FUNCT@5.0V:ATOM28 1977.0 FUNCT@5.0V:ATOM29 1977.0 FUNCT@5.0V:ATOM30 1977.0 FUNCT@5.0V:ATOM31A 1611.0 FUNCT@5.0V:ATOM31B 1800.0 FUNCT@5.0V:ATOM32 1611.0 FUNCT@5.0V:ATOM33 1977.0 FUNCT@5.0V:ATOM35 2111.0 FUNCT@5.0V:ATOM36 1867.0 FUNCT@5.0V:ATOM37A 2823.0 FUNCT@5.0V:ATOM37B 2815.0 FUNCT@5.0V:ATOM37C 2799.0 FUNCT@5.0V:ATOM37D 2767.0 FUNCT@5.0V:ATOM37E 2758.0 FUNCT@5.0V:ATOM39 1888.0 FUNCT@5.0V:ATOM41 2414.0 FUNCT@5.0V:ATOM41A 2414.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4678.0 FUNCT@5.0V:ATOM45C_40 4678.0 FUNCT@5.0V:ATOM46C_40 4035.0 FUNCT@5.0V:ATOM47C_40 3667.0 FUNCT@5.0V:ATOM48C_40 4678.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4678.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:309 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0113 b(slope) = 0.0108 chi2 = 0.8171 VTN P-side: a = 0.0112 b(slope) = 0.0066 chi2 = 0.5199 CAL_IN N-side: a = 3.0928 b(slope) = 0.0000 chi2 = 3.3961 CAL_IN P-side: a = 3.0927 b(slope) = 0.0000 chi2 = 2.5538 VTP N-side(average) = 0.7017 V CAL_BASE = 2.4592 V VTP P-side(average) = 0.4328 V CAL_VREF = 3.0842 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:409 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5088 V_V1RB:169/L5 3.5090 V_V1RC:169/L5 3.5083 V_V1RD:169/L5 3.5066 DACS TEST = 0 VTN N-side: a = 0.0109 b(slope) = 0.0109 chi2 = 0.8693 VTN P-side: a = 0.0106 b(slope) = 0.0066 chi2 = 0.2245 CAL_IN N-side: a = 2.4077 b(slope) = 0.0086 chi2 = 0.6456 CAL_IN P-side: a = 2.4073 b(slope) = 0.0086 chi2 = 0.9935 VTP N-side(average) = 0.7076 V CAL_BASE = 2.4092 V VTP P-side(average) = 0.4368 V CAL_VREF = 3.5203 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:509 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0112 b(slope) = 0.0109 chi2 = 0.8435 VTN P-side: a = 0.0113 b(slope) = 0.0066 chi2 = 0.2768 CAL_IN N-side: a = 3.0925 b(slope) = 0.0000 chi2 = 3.0154 CAL_IN P-side: a = 3.0925 b(slope) = 0.0000 chi2 = 2.7459 VTP N-side(average) = 0.7079 V CAL_BASE = 2.5117 V VTP P-side(average) = 0.4357 V CAL_VREF = 3.0662 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:609 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5147 V_V1RB:169/L5 3.5139 V_V1RC:169/L5 3.5147 V_V1RD:169/L5 3.5120 DACS TEST = 1 VTN N-side: a = 0.0100 b(slope) = 0.0109 chi2 = 0.5659 VTN P-side: a = 0.0102 b(slope) = 0.0067 chi2 = 0.4528 CAL_IN N-side: a = 3.0938 b(slope) = 0.0000 chi2 = 2.3130 CAL_IN P-side: a = 3.0934 b(slope) = 0.0000 chi2 = 3.4252 VTP N-side(average) = 0.7067 V CAL_BASE = 2.4155 V VTP P-side(average) = 0.4375 V CAL_VREF = 3.5261 V FUNCT. DIGITAL TEST = 30 error detected in test: FUNCT@5.0V:ATOM13A 1622.0 FUNCT@5.0V:ATOM13B 1679.0 FUNCT@5.0V:ATOM13C 1679.0 FUNCT@5.0V:ATOM15 1666.0 FUNCT@5.0V:ATOM17 3978.0 FUNCT@5.0V:ATOM18 3994.0 FUNCT@5.0V:ATOM18HF 3994.0 FUNCT@5.0V:ATOM19 3930.0 FUNCT@5.0V:ATOM19D 3945.0 FUNCT@5.0V:ATOM19E 3172.0 FUNCT@5.0V:ATOM19F 7045.0 FUNCT@5.0V:ATOM19FHF 7045.0 FUNCT@5.0V:ATOM20 1638.0 FUNCT@5.0V:ATOM24 1075.0 FUNCT@5.0V:ATOM25 1620.0 FUNCT@5.0V:ATOM25HF 1620.0 FUNCT@5.0V:ATOM31A 1370.0 FUNCT@5.0V:ATOM31B 1559.0 FUNCT@5.0V:ATOM32 1370.0 FUNCT@5.0V:ATOM33 1736.0 FUNCT@5.0V:ATOM35 1870.0 FUNCT@5.0V:ATOM36 1626.0 FUNCT@5.0V:ATOM37A 2326.0 FUNCT@5.0V:ATOM37B 2318.0 FUNCT@5.0V:ATOM37C 2302.0 FUNCT@5.0V:ATOM37D 2270.0 FUNCT@5.0V:ATOM37E 2261.0 FUNCT@5.0V:ATOM39 1647.0 FUNCT@5.0V:ATOM41 2173.0 FUNCT@5.0V:ATOM41A 2173.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5163.0 FUNCT@5.0V:ATOM45C_40 5163.0 FUNCT@5.0V:ATOM46C_40 4309.0 FUNCT@5.0V:ATOM47C_40 3667.0 FUNCT@5.0V:ATOM48C_40 5163.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5163.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:709 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5093 V_V1RB:169/L5 3.5098 V_V1RC:169/L5 3.5093 V_V1RD:169/L5 3.5073 DACS TEST = 1 VTN N-side: a = 0.0108 b(slope) = 0.0109 chi2 = 0.7690 VTN P-side: a = 0.0109 b(slope) = 0.0067 chi2 = 0.8111 CAL_IN N-side: a = 3.0935 b(slope) = 0.0000 chi2 = 3.8326 CAL_IN P-side: a = 3.0938 b(slope) = 0.0000 chi2 = 2.9543 VTP N-side(average) = 0.7107 V CAL_BASE = 2.4248 V VTP P-side(average) = 0.4419 V CAL_VREF = 3.5215 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:809 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0122 b(slope) = 0.0111 chi2 = 0.7080 VTN P-side: a = 0.0122 b(slope) = 0.0068 chi2 = 0.5491 CAL_IN N-side: a = 3.0927 b(slope) = 0.0000 chi2 = 2.1645 CAL_IN P-side: a = 3.0928 b(slope) = 0.0000 chi2 = 2.2981 VTP N-side(average) = 0.7232 V CAL_BASE = 2.5823 V VTP P-side(average) = 0.4511 V CAL_VREF = 3.0918 V FUNCT. DIGITAL TEST = 6 error detected in test: FUNCT@5.0V:ATOM13B 1947.0 FUNCT@5.0V:ATOM13C 1947.0 FUNCT@5.0V:ATOM37B 2842.0 FUNCT@5.0V:ATOM37C 2826.0 FUNCT@5.0V:ATOM37D 2794.0 FUNCT@5.0V:ATOM37E 2785.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:810 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.5144 V_V1RB:169/L5 3.5144 V_V1RC:169/L5 3.5144 V_V1RD:169/L5 3.5127 DACS TEST = 1 VTN N-side: a = 0.0114 b(slope) = 0.0110 chi2 = 0.5147 VTN P-side: a = 0.0112 b(slope) = 0.0068 chi2 = 0.4954 CAL_IN N-side: a = 3.0935 b(slope) = 0.0000 chi2 = 2.6841 CAL_IN P-side: a = 3.0936 b(slope) = 0.0000 chi2 = 4.7171 VTP N-side(average) = 0.7140 V CAL_BASE = 2.4844 V VTP P-side(average) = 0.4446 V CAL_VREF = 3.5266 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM37D 1738.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:710 --------------------------------------- CLASS=B -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 2 VTN N-side: a = 0.0100 b(slope) = 0.0111 chi2 = 0.8211 VTN P-side: a = 0.0101 b(slope) = 0.0068 chi2 = 0.3244 CAL_IN N-side: a = 2.5396 b(slope) = 0.0083 chi2 = 1.4742 CAL_IN P-side: a = 2.5396 b(slope) = 0.0083 chi2 = 25.2261 VTP N-side(average) = 0.7209 V CAL_BASE = 2.5444 V VTP P-side(average) = 0.4464 V CAL_VREF = 3.0776 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:610 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0134 b(slope) = 0.0109 chi2 = 1.0757 VTN P-side: a = 0.0130 b(slope) = 0.0067 chi2 = 0.4582 CAL_IN N-side: a = 2.5351 b(slope) = 0.0084 chi2 = 1.0851 CAL_IN P-side: a = 2.5355 b(slope) = 0.0084 chi2 = 0.3330 VTP N-side(average) = 0.7128 V CAL_BASE = 2.5364 V VTP P-side(average) = 0.4446 V CAL_VREF = 3.0745 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:510 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0123 b(slope) = 0.0110 chi2 = 2.2139 VTN P-side: a = 0.0128 b(slope) = 0.0067 chi2 = 0.4498 CAL_IN N-side: a = 2.5183 b(slope) = 0.0085 chi2 = 1.1077 CAL_IN P-side: a = 2.5182 b(slope) = 0.0085 chi2 = 1.1586 VTP N-side(average) = 0.7160 V CAL_BASE = 2.5220 V VTP P-side(average) = 0.4430 V CAL_VREF = 3.0649 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:410 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0134 b(slope) = 0.0109 chi2 = 0.6561 VTN P-side: a = 0.0134 b(slope) = 0.0066 chi2 = 0.6039 CAL_IN N-side: a = 2.5149 b(slope) = 0.0085 chi2 = 0.6282 CAL_IN P-side: a = 2.5150 b(slope) = 0.0085 chi2 = 0.5864 VTP N-side(average) = 0.7100 V CAL_BASE = 2.5210 V VTP P-side(average) = 0.4387 V CAL_VREF = 3.0652 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:310 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0129 b(slope) = 0.0108 chi2 = 0.7130 VTN P-side: a = 0.0127 b(slope) = 0.0066 chi2 = 0.2472 CAL_IN N-side: a = 2.5142 b(slope) = 0.0085 chi2 = 0.8784 CAL_IN P-side: a = 2.5143 b(slope) = 0.0084 chi2 = 1.8793 VTP N-side(average) = 0.7048 V CAL_BASE = 2.5183 V VTP P-side(average) = 0.4329 V CAL_VREF = 3.0632 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:210 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0135 b(slope) = 0.0109 chi2 = 0.7678 VTN P-side: a = 0.0133 b(slope) = 0.0066 chi2 = 0.3607 CAL_IN N-side: a = 2.5179 b(slope) = 0.0085 chi2 = 0.8808 CAL_IN P-side: a = 2.5176 b(slope) = 0.0084 chi2 = 1.5953 VTP N-side(average) = 0.7119 V CAL_BASE = 2.5198 V VTP P-side(average) = 0.4361 V CAL_VREF = 3.0627 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:211 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0123 b(slope) = 0.0107 chi2 = 0.7756 VTN P-side: a = 0.0125 b(slope) = 0.0065 chi2 = 0.4352 CAL_IN N-side: a = 2.5207 b(slope) = 0.0085 chi2 = 1.0252 CAL_IN P-side: a = 2.5207 b(slope) = 0.0085 chi2 = 0.6423 VTP N-side(average) = 0.6991 V CAL_BASE = 2.5239 V VTP P-side(average) = 0.4294 V CAL_VREF = 3.0679 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4343.0 FUNCT@5.0V:ATOM45C_40 4343.0 FUNCT@5.0V:ATOM46C_40 3875.0 FUNCT@5.0V:ATOM47C_40 4343.0 FUNCT@5.0V:ATOM48C_40 4343.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4343.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:311 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0107 chi2 = 0.6674 VTN P-side: a = 0.0107 b(slope) = 0.0065 chi2 = 0.3592 CAL_IN N-side: a = 2.4881 b(slope) = 0.0087 chi2 = 0.7568 CAL_IN P-side: a = 2.4882 b(slope) = 0.0087 chi2 = 0.2560 VTP N-side(average) = 0.6963 V CAL_BASE = 2.4929 V VTP P-side(average) = 0.4293 V CAL_VREF = 3.0496 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:411 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0114 b(slope) = 0.0107 chi2 = 0.6904 VTN P-side: a = 0.0111 b(slope) = 0.0066 chi2 = 0.3930 CAL_IN N-side: a = 2.5112 b(slope) = 0.0085 chi2 = 1.1330 CAL_IN P-side: a = 2.5115 b(slope) = 0.0084 chi2 = 1.0256 VTP N-side(average) = 0.6976 V CAL_BASE = 2.5168 V VTP P-side(average) = 0.4314 V CAL_VREF = 3.0598 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:511 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0108 chi2 = 1.0488 VTN P-side: a = 0.0103 b(slope) = 0.0066 chi2 = 0.3305 CAL_IN N-side: a = 2.4914 b(slope) = 0.0085 chi2 = 0.8155 CAL_IN P-side: a = 2.4914 b(slope) = 0.0085 chi2 = 1.3881 VTP N-side(average) = 0.7019 V CAL_BASE = 2.4956 V VTP P-side(average) = 0.4363 V CAL_VREF = 3.0408 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:611 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0110 chi2 = 1.1293 VTN P-side: a = 0.0103 b(slope) = 0.0068 chi2 = 0.2933 CAL_IN N-side: a = 2.5046 b(slope) = 0.0085 chi2 = 0.7869 CAL_IN P-side: a = 2.5045 b(slope) = 0.0085 chi2 = 0.3423 VTP N-side(average) = 0.7170 V CAL_BASE = 2.5098 V VTP P-side(average) = 0.4441 V CAL_VREF = 3.0557 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:711 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0110 chi2 = 0.8137 VTN P-side: a = 0.0103 b(slope) = 0.0068 chi2 = 0.4955 CAL_IN N-side: a = 2.4846 b(slope) = 0.0086 chi2 = 0.8969 CAL_IN P-side: a = 2.4846 b(slope) = 0.0086 chi2 = 0.7876 VTP N-side(average) = 0.7144 V CAL_BASE = 2.4897 V VTP P-side(average) = 0.4452 V CAL_VREF = 3.0400 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:811 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0109 chi2 = 0.8314 VTN P-side: a = 0.0103 b(slope) = 0.0068 chi2 = 0.2625 CAL_IN N-side: a = 2.4955 b(slope) = 0.0084 chi2 = 1.4219 CAL_IN P-side: a = 2.4961 b(slope) = 0.0084 chi2 = 1.4986 VTP N-side(average) = 0.7114 V CAL_BASE = 2.5007 V VTP P-side(average) = 0.4461 V CAL_VREF = 3.0396 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:812 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0111 chi2 = 0.7492 VTN P-side: a = 0.0106 b(slope) = 0.0068 chi2 = 0.6148 CAL_IN N-side: a = 2.5088 b(slope) = 0.0083 chi2 = 0.6554 CAL_IN P-side: a = 2.5091 b(slope) = 0.0083 chi2 = 0.9171 VTP N-side(average) = 0.7216 V CAL_BASE = 2.5139 V VTP P-side(average) = 0.4463 V CAL_VREF = 3.0466 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:712 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0109 chi2 = 1.3953 VTN P-side: a = 0.0106 b(slope) = 0.0067 chi2 = 0.6110 CAL_IN N-side: a = 2.4921 b(slope) = 0.0084 chi2 = 1.3593 CAL_IN P-side: a = 2.4925 b(slope) = 0.0084 chi2 = 0.5727 VTP N-side(average) = 0.7111 V CAL_BASE = 2.4934 V VTP P-side(average) = 0.4409 V CAL_VREF = 3.0325 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:612 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0110 chi2 = 1.5344 VTN P-side: a = 0.0099 b(slope) = 0.0067 chi2 = 0.6768 CAL_IN N-side: a = 2.4925 b(slope) = 0.0086 chi2 = 1.1914 CAL_IN P-side: a = 2.4926 b(slope) = 0.0086 chi2 = 0.4757 VTP N-side(average) = 0.7132 V CAL_BASE = 2.4961 V VTP P-side(average) = 0.4408 V CAL_VREF = 3.0440 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:512 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0108 chi2 = 0.6606 VTN P-side: a = 0.0103 b(slope) = 0.0066 chi2 = 0.3726 CAL_IN N-side: a = 2.5241 b(slope) = 0.0084 chi2 = 0.8957 CAL_IN P-side: a = 2.5239 b(slope) = 0.0084 chi2 = 0.5262 VTP N-side(average) = 0.7045 V CAL_BASE = 2.5276 V VTP P-side(average) = 0.4355 V CAL_VREF = 3.0652 V FUNCT. DIGITAL TEST = 31 error detected in test: FUNCT@5.0V:ATOM13A 1847.0 FUNCT@5.0V:ATOM13B 1903.0 FUNCT@5.0V:ATOM13C 1903.0 FUNCT@5.0V:ATOM15 1891.0 FUNCT@5.0V:ATOM17 4203.0 FUNCT@5.0V:ATOM18 4219.0 FUNCT@5.0V:ATOM18HF 4219.0 FUNCT@5.0V:ATOM19 4155.0 FUNCT@5.0V:ATOM19D 4170.0 FUNCT@5.0V:ATOM19E 3397.0 FUNCT@5.0V:ATOM19F 7270.0 FUNCT@5.0V:ATOM19FHF 7270.0 FUNCT@5.0V:ATOM20 1863.0 FUNCT@5.0V:ATOM21 1839.0 FUNCT@5.0V:ATOM22 1827.0 FUNCT@5.0V:ATOM25 1845.0 FUNCT@5.0V:ATOM25HF 1845.0 FUNCT@5.0V:ATOM26A 1824.0 FUNCT@5.0V:ATOM26B 2633.0 FUNCT@5.0V:ATOM28 1961.0 FUNCT@5.0V:ATOM29 1961.0 FUNCT@5.0V:ATOM30 1961.0 FUNCT@5.0V:ATOM31A 1595.0 FUNCT@5.0V:ATOM31B 1784.0 FUNCT@5.0V:ATOM32 1595.0 FUNCT@5.0V:ATOM33 1961.0 FUNCT@5.0V:ATOM35 2095.0 FUNCT@5.0V:ATOM36 1851.0 FUNCT@5.0V:ATOM39 1872.0 FUNCT@5.0V:ATOM41 2398.0 FUNCT@5.0V:ATOM41A 2398.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5275.0 FUNCT@5.0V:ATOM45C_40 4923.0 FUNCT@5.0V:ATOM46C_40 4890.0 FUNCT@5.0V:ATOM47C_40 5275.0 FUNCT@5.0V:ATOM48C_40 5275.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5275.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:412 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0108 chi2 = 1.0015 VTN P-side: a = 0.0101 b(slope) = 0.0066 chi2 = 0.5898 CAL_IN N-side: a = 2.5088 b(slope) = 0.0085 chi2 = 0.6836 CAL_IN P-side: a = 2.5088 b(slope) = 0.0085 chi2 = 0.6738 VTP N-side(average) = 0.7032 V CAL_BASE = 2.5122 V VTP P-side(average) = 0.4320 V CAL_VREF = 3.0547 V FUNCT. DIGITAL TEST = 11 error detected in test: FUNCT@5.0V:ATOM18 10563.0 FUNCT@5.0V:ATOM18HF 10563.0 FUNCT@5.0V:ATOM25 3056.0 FUNCT@5.0V:ATOM25HF 3056.0 FUNCT@5.0V:ATOM28 2038.0 FUNCT@5.0V:ATOM29 2039.0 FUNCT@5.0V:ATOM30 2037.0 FUNCT@5.0V:ATOM37A 2915.0 FUNCT@5.0V:ATOM37B 2908.0 FUNCT@5.0V:ATOM37C 2893.0 FUNCT@5.0V:ATOM37E 2851.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:312 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0102 b(slope) = 0.0107 chi2 = 1.1383 VTN P-side: a = 0.0104 b(slope) = 0.0065 chi2 = 0.3525 CAL_IN N-side: a = 2.5096 b(slope) = 0.0085 chi2 = 2.2148 CAL_IN P-side: a = 2.5124 b(slope) = 0.0085 chi2 = 39.2654 VTP N-side(average) = 0.6990 V CAL_BASE = 2.5127 V VTP P-side(average) = 0.4296 V CAL_VREF = 3.0540 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:212 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0108 b(slope) = 0.0108 chi2 = 0.5906 VTN P-side: a = 0.0107 b(slope) = 0.0065 chi2 = 0.3480 CAL_IN N-side: a = 2.5291 b(slope) = 0.0084 chi2 = 1.2094 CAL_IN P-side: a = 2.5290 b(slope) = 0.0084 chi2 = 0.5708 VTP N-side(average) = 0.7042 V CAL_BASE = 2.5330 V VTP P-side(average) = 0.4308 V CAL_VREF = 3.0708 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:413 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0114 b(slope) = 0.0106 chi2 = 1.3999 VTN P-side: a = 0.0109 b(slope) = 0.0065 chi2 = 0.4504 CAL_IN N-side: a = 2.5023 b(slope) = 0.0085 chi2 = 0.5958 CAL_IN P-side: a = 2.5023 b(slope) = 0.0084 chi2 = 1.1216 VTP N-side(average) = 0.6949 V CAL_BASE = 2.5049 V VTP P-side(average) = 0.4293 V CAL_VREF = 3.0464 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:513 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0106 chi2 = 0.9371 VTN P-side: a = 0.0103 b(slope) = 0.0065 chi2 = 0.4202 CAL_IN N-side: a = 2.4842 b(slope) = 0.0084 chi2 = 1.1002 CAL_IN P-side: a = 2.4843 b(slope) = 0.0084 chi2 = 0.6800 VTP N-side(average) = 0.6878 V CAL_BASE = 2.4897 V VTP P-side(average) = 0.4244 V CAL_VREF = 3.0305 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:613 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0109 chi2 = 0.7921 VTN P-side: a = 0.0102 b(slope) = 0.0067 chi2 = 0.4037 CAL_IN N-side: a = 2.4771 b(slope) = 0.0085 chi2 = 0.9599 CAL_IN P-side: a = 2.4772 b(slope) = 0.0085 chi2 = 0.8843 VTP N-side(average) = 0.7083 V CAL_BASE = 2.4815 V VTP P-side(average) = 0.4423 V CAL_VREF = 3.0295 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:614 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1577 IDDSB:VDD1B 0.1579 IDDSB:VDD1C 0.1581 IDDSB:VDD1D 0.1582 IDDOP1:DVDD 0.1823 DACS TEST = 1 VTN N-side: a = 0.2308 b(slope) = 0.0000 chi2 = 0.3086 VTN P-side: a = 0.1459 b(slope) = 0.0000 chi2 = 0.3668 CAL_IN N-side: a = 2.7690 b(slope) = 0.0000 chi2 = 0.3501 CAL_IN P-side: a = 2.7692 b(slope) = 0.0000 chi2 = 0.3239 VTP N-side(average) = 0.7153 V CAL_BASE = 2.5090 V VTP P-side(average) = 0.4429 V CAL_VREF = 3.0417 V FUNCT. DIGITAL TEST = 58 error detected in test: FUNCT@5.0V:ATOM1TO6A 212.0 FUNCT@5.0V:ATOM1TO6B 212.0 FUNCT@5.0V:ATOM1TO6C 212.0 FUNCT@5.0V:ATOM1TO6D 212.0 FUNCT@5.0V:ATOM1TO6E 212.0 FUNCT@5.0V:ATOM7TO9A 212.0 FUNCT@5.0V:ATOM7TO9B 212.0 FUNCT@5.0V:ATOM7TO9C 212.0 FUNCT@5.0V:ATOM7TO9D 212.0 FUNCT@5.0V:ATOM7TO9E 212.0 FUNCT@5.0V:ATOM10TO12 212.0 FUNCT@5.0V:ATOM13A 212.0 FUNCT@5.0V:ATOM13B 212.0 FUNCT@5.0V:ATOM13C 212.0 FUNCT@5.0V:ATOM14 212.0 FUNCT@5.0V:ATOM15 212.0 FUNCT@5.0V:ATOM16 212.0 FUNCT@5.0V:ATOM17 212.0 FUNCT@5.0V:ATOM18 212.0 FUNCT@5.0V:ATOM18HF 212.0 FUNCT@5.0V:ATOM19 212.0 FUNCT@5.0V:ATOM19B 212.0 FUNCT@5.0V:ATOM19C 212.0 FUNCT@5.0V:ATOM19D 212.0 FUNCT@5.0V:ATOM19E 212.0 FUNCT@5.0V:ATOM19F 212.0 FUNCT@5.0V:ATOM19FHF 212.0 FUNCT@5.0V:ATOM20 212.0 FUNCT@5.0V:ATOM21 212.0 FUNCT@5.0V:ATOM22 212.0 FUNCT@5.0V:ATOM23 212.0 FUNCT@5.0V:ATOM24 212.0 FUNCT@5.0V:ATOM25 212.0 FUNCT@5.0V:ATOM25HF 212.0 FUNCT@5.0V:ATOM26A 212.0 FUNCT@5.0V:ATOM26B 212.0 FUNCT@5.0V:ATOM27 212.0 FUNCT@5.0V:ATOM28 212.0 FUNCT@5.0V:ATOM29 212.0 FUNCT@5.0V:ATOM30 212.0 FUNCT@5.0V:ATOM31A 212.0 FUNCT@5.0V:ATOM31B 212.0 FUNCT@5.0V:ATOM32 212.0 FUNCT@5.0V:ATOM33 212.0 FUNCT@5.0V:ATOM34 212.0 FUNCT@5.0V:ATOM35 212.0 FUNCT@5.0V:ATOM36 212.0 FUNCT@5.0V:ATOM37A 212.0 FUNCT@5.0V:ATOM37B 212.0 FUNCT@5.0V:ATOM37C 212.0 FUNCT@5.0V:ATOM37D 212.0 FUNCT@5.0V:ATOM37E 212.0 FUNCT@5.0V:ATOM38 212.0 FUNCT@5.0V:ATOM39 212.0 FUNCT@5.0V:ATOM40 212.0 FUNCT@5.0V:ATOM41 212.0 FUNCT@5.0V:ATOM41A 212.0 FUNCT@5.0V:ATOM42 212.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 212.0 FUNCT@5.0V:ATOM45C_40 212.0 FUNCT@5.0V:ATOM46C_40 212.0 FUNCT@5.0V:ATOM47C_40 212.0 FUNCT@5.0V:ATOM48C_40 212.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 212.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 212.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 212.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 212.0 FUNCT@5.0V:A10TO12HF 212.0 FUNCT@5.0V:ADAC37HF 212.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:514 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0108 b(slope) = 0.0109 chi2 = 1.0380 VTN P-side: a = 0.0108 b(slope) = 0.0066 chi2 = 0.6736 CAL_IN N-side: a = 2.4976 b(slope) = 0.0084 chi2 = 0.4637 CAL_IN P-side: a = 2.4977 b(slope) = 0.0084 chi2 = 0.6082 VTP N-side(average) = 0.7108 V CAL_BASE = 2.5046 V VTP P-side(average) = 0.4363 V CAL_VREF = 3.0417 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:414 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 2 VTN N-side: a = 0.0107 b(slope) = 0.0108 chi2 = 0.8463 VTN P-side: a = 0.0107 b(slope) = 0.0066 chi2 = 0.3523 CAL_IN N-side: a = 2.4848 b(slope) = 0.0086 chi2 = 26.3041 CAL_IN P-side: a = 2.4883 b(slope) = 0.0086 chi2 = 18.0702 VTP N-side(average) = 0.7048 V CAL_BASE = 2.4902 V VTP P-side(average) = 0.4335 V CAL_VREF = 3.0330 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 8 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 +++++++++ WAFER DATA+++++++++++++++++++++++++++ CLASSES: A-->Good, B-->Probably Good, C-->Bad A B C ------------------------- 604 307 401 205 710 501 305 601 405 602 705 502 706 402 207 203 507 303 308 403 610 503 510 603 410 703 310 803 311 804 411 704 511 504 811 404 812 304 712 204 612 505 413 605 513 805 613 806 514 606 506 406 306 206 107 407 607 707 807 907 908 808 708 608 508 408 208 108 209 309 409 509 609 709 809 810 210 211 611 711 512 412 312 212 614 414 ---------------------------- 24 2 60 NUMBER OF CHIPS TESTED = 86 NUMBER OF CLASS A CHIPS = 24 NUMBER OF CLASS B CHIPS = 2 NUMBER OF CLASS C CHIPS = 60 YIELD = 27.91 %