------- CHIP ID:401 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0083 b(slope) = 0.0109 chi2 = 1.7446 VTN P-side: a = 0.0088 b(slope) = 0.0066 chi2 = 0.9662 CAL_IN N-side: a = 2.4671 b(slope) = 0.0086 chi2 = 0.8421 CAL_IN P-side: a = 2.4670 b(slope) = 0.0086 chi2 = 0.5289 VTP N-side(average) = 0.7065 V CAL_BASE = 2.4673 V VTP P-side(average) = 0.4340 V CAL_VREF = 3.0212 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:501 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1219 DACS TEST = 1 VTN N-side: a = 0.2252 b(slope) = 0.0000 chi2 = 0.2534 VTN P-side: a = 0.1413 b(slope) = 0.0000 chi2 = 0.1936 CAL_IN N-side: a = 2.7464 b(slope) = 0.0000 chi2 = 0.2869 CAL_IN P-side: a = 2.7463 b(slope) = 0.0000 chi2 = 0.2398 VTP N-side(average) = 0.7004 V CAL_BASE = 2.4766 V VTP P-side(average) = 0.4316 V CAL_VREF = 3.0242 V FUNCT. DIGITAL TEST = 51 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 FUNCT@5.0V:ATOM7TO9B 272.0 FUNCT@5.0V:ATOM7TO9C 272.0 FUNCT@5.0V:ATOM7TO9D 272.0 FUNCT@5.0V:ATOM7TO9E 272.0 FUNCT@5.0V:ATOM10TO12 496.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM34 268.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 FUNCT@5.0V:ATOM42 214.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:601 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0084 b(slope) = 0.0110 chi2 = 4.0869 VTN P-side: a = 0.0092 b(slope) = 0.0067 chi2 = 0.9028 CAL_IN N-side: a = 2.4737 b(slope) = 0.0086 chi2 = 0.6973 CAL_IN P-side: a = 2.4737 b(slope) = 0.0086 chi2 = 0.3757 VTP N-side(average) = 0.7150 V CAL_BASE = 2.4729 V VTP P-side(average) = 0.4404 V CAL_VREF = 3.0247 V FUNCT. DIGITAL TEST = 37 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1128.0 FUNCT@5.0V:ATOM13C 1128.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3430.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1062.0 FUNCT@5.0V:ATOM22 1054.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1047.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1216.0 FUNCT@5.0V:ATOM37B 1206.0 FUNCT@5.0V:ATOM37C 1190.0 FUNCT@5.0V:ATOM37D 1158.0 FUNCT@5.0V:ATOM37E 1150.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:602 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0090 b(slope) = 0.0110 chi2 = 2.6876 VTN P-side: a = 0.0097 b(slope) = 0.0067 chi2 = 1.0730 CAL_IN N-side: a = 2.4494 b(slope) = 0.0087 chi2 = 0.7394 CAL_IN P-side: a = 2.4495 b(slope) = 0.0087 chi2 = 0.6466 VTP N-side(average) = 0.7146 V CAL_BASE = 2.4541 V VTP P-side(average) = 0.4422 V CAL_VREF = 3.0139 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:502 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0107 chi2 = 1.2723 VTN P-side: a = 0.0105 b(slope) = 0.0065 chi2 = 0.7128 CAL_IN N-side: a = 2.4628 b(slope) = 0.0086 chi2 = 0.4218 CAL_IN P-side: a = 2.4629 b(slope) = 0.0086 chi2 = 1.0301 VTP N-side(average) = 0.6964 V CAL_BASE = 2.4643 V VTP P-side(average) = 0.4305 V CAL_VREF = 3.0181 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:402 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0108 chi2 = 1.6918 VTN P-side: a = 0.0105 b(slope) = 0.0066 chi2 = 0.7262 CAL_IN N-side: a = 2.4595 b(slope) = 0.0086 chi2 = 1.8920 CAL_IN P-side: a = 2.4616 b(slope) = 0.0086 chi2 = 1.4011 VTP N-side(average) = 0.7049 V CAL_BASE = 2.4602 V VTP P-side(average) = 0.4356 V CAL_VREF = 3.0081 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1404.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:203 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0115 b(slope) = 0.0104 chi2 = 0.7315 VTN P-side: a = 0.0112 b(slope) = 0.0063 chi2 = 0.3291 CAL_IN N-side: a = 2.4526 b(slope) = 0.0085 chi2 = 0.6279 CAL_IN P-side: a = 2.4526 b(slope) = 0.0085 chi2 = 0.8418 VTP N-side(average) = 0.6770 V CAL_BASE = 2.4553 V VTP P-side(average) = 0.4181 V CAL_VREF = 3.0012 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:303 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0118 b(slope) = 0.0105 chi2 = 0.9270 VTN P-side: a = 0.0115 b(slope) = 0.0064 chi2 = 0.4492 CAL_IN N-side: a = 2.4693 b(slope) = 0.0084 chi2 = 1.2462 CAL_IN P-side: a = 2.4689 b(slope) = 0.0084 chi2 = 3.9941 VTP N-side(average) = 0.6825 V CAL_BASE = 2.4692 V VTP P-side(average) = 0.4201 V CAL_VREF = 3.0081 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:403 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0117 b(slope) = 0.0107 chi2 = 0.6554 VTN P-side: a = 0.0116 b(slope) = 0.0065 chi2 = 0.3896 CAL_IN N-side: a = 2.4420 b(slope) = 0.0087 chi2 = 0.4592 CAL_IN P-side: a = 2.4421 b(slope) = 0.0087 chi2 = 0.3857 VTP N-side(average) = 0.7003 V CAL_BASE = 2.4456 V VTP P-side(average) = 0.4291 V CAL_VREF = 2.9995 V FUNCT. DIGITAL TEST = 15 error detected in test: FUNCT@5.0V:ATOM19F 7268.0 FUNCT@5.0V:ATOM19FHF 7268.0 FUNCT@5.0V:ATOM20 1861.0 FUNCT@5.0V:ATOM21 1836.0 FUNCT@5.0V:ATOM22 1824.0 FUNCT@5.0V:ATOM25 1843.0 FUNCT@5.0V:ATOM25HF 1843.0 FUNCT@5.0V:ATOM26A 1822.0 FUNCT@5.0V:ATOM26B 2631.0 FUNCT@5.0V:ATOM28 1958.0 FUNCT@5.0V:ATOM29 1959.0 FUNCT@5.0V:ATOM31A 1592.0 FUNCT@5.0V:ATOM31B 1782.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM37D 2716.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:503 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0108 b(slope) = 0.0107 chi2 = 1.6213 VTN P-side: a = 0.0113 b(slope) = 0.0066 chi2 = 0.9498 CAL_IN N-side: a = 2.4653 b(slope) = 0.0084 chi2 = 0.8297 CAL_IN P-side: a = 2.4651 b(slope) = 0.0084 chi2 = 0.8886 VTP N-side(average) = 0.6999 V CAL_BASE = 2.4663 V VTP P-side(average) = 0.4322 V CAL_VREF = 3.0076 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:603 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0106 b(slope) = 0.0106 chi2 = 1.6448 VTN P-side: a = 0.0110 b(slope) = 0.0065 chi2 = 0.7083 CAL_IN N-side: a = 2.4671 b(slope) = 0.0086 chi2 = 0.4516 CAL_IN P-side: a = 2.4671 b(slope) = 0.0086 chi2 = 0.4881 VTP N-side(average) = 0.6930 V CAL_BASE = 2.4651 V VTP P-side(average) = 0.4298 V CAL_VREF = 3.0129 V FUNCT. DIGITAL TEST = 27 error detected in test: FUNCT@5.0V:ATOM13A 1284.0 FUNCT@5.0V:ATOM15 1328.0 FUNCT@5.0V:ATOM17 3640.0 FUNCT@5.0V:ATOM18 3656.0 FUNCT@5.0V:ATOM18HF 3656.0 FUNCT@5.0V:ATOM19 4676.0 FUNCT@5.0V:ATOM19E 2834.0 FUNCT@5.0V:ATOM19F 6707.0 FUNCT@5.0V:ATOM19FHF 6707.0 FUNCT@5.0V:ATOM20 1300.0 FUNCT@5.0V:ATOM21 1275.0 FUNCT@5.0V:ATOM25 1282.0 FUNCT@5.0V:ATOM25HF 1282.0 FUNCT@5.0V:ATOM26A 1261.0 FUNCT@5.0V:ATOM26B 2070.0 FUNCT@5.0V:ATOM28 1397.0 FUNCT@5.0V:ATOM29 1398.0 FUNCT@5.0V:ATOM30 1398.0 FUNCT@5.0V:ATOM31A 1031.0 FUNCT@5.0V:ATOM31B 1221.0 FUNCT@5.0V:ATOM32 1032.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1532.0 FUNCT@5.0V:ATOM36 1288.0 FUNCT@5.0V:ATOM39 1309.0 FUNCT@5.0V:ATOM41 1835.0 FUNCT@5.0V:ATOM41A 1835.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:703 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 1 error detected in test: SUP_SHORT:VDD1 1.0 ANALOG TEST = 34 error detected in test: IDDSB:VDD0A 0.0000 IDDSB:VDD1A 0.0000 IDDSB:VDD0B 0.0000 IDDSB:VDD1B 0.0000 IDDSB:VDD0C 0.0000 IDDSB:VDD1C 0.0000 IDDSB:VDD0D 0.0000 IDDSB:VDD1D 0.0000 V_AVDD2IPA:249/L9 0.0000 V_AVDD2IMA:277/L10 0.0000 AVDD_A:AVDDP-M 0.0000 IAVDD2_A:AVDDP-M 0.0000 V_V1RA:169/L5 0.0000 V_N310A:171/L6 0.0000 V_AVDD2IPB:249/L9 0.0000 V_AVDD2IMB:277/L10 0.0000 AVDD_B:AVDDP-M 0.0000 IAVDD2_B:AVDDP-M 0.0000 V_V1RB:169/L5 0.0000 V_N310B:171/L6 0.0000 V_AVDD2IPC:249/L9 0.0000 V_AVDD2IMC:277/L10 0.0000 AVDD_C:AVDDP-M 0.0000 IAVDD2_C:AVDDP-M 0.0000 V_V1RC:169/L5 0.0000 V_N310C:171/L6 0.0000 V_AVDD2IPD:249/L9 0.0000 V_AVDD2IMD:277/L10 0.0000 AVDD_D:AVDDP-M 0.0000 IAVDD2_D:AVDDP-M 0.0000 V_V1RD:169/L5 0.0000 V_N310D:171/L6 0.0000 IDDOP0:AVDD 0.0000 IDDOP1:DVDD 0.0000 DACS TEST = 1 VTN N-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN N-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side(average) = 0.0000 V CAL_BASE = 0.0000 V VTP P-side(average) = 0.0000 V CAL_VREF = 0.0000 V FUNCT. DIGITAL TEST = 58 error detected in test: FUNCT@5.0V:ATOM1TO6A 0.0 FUNCT@5.0V:ATOM1TO6B 0.0 FUNCT@5.0V:ATOM1TO6C 0.0 FUNCT@5.0V:ATOM1TO6D 0.0 FUNCT@5.0V:ATOM1TO6E 0.0 FUNCT@5.0V:ATOM7TO9A 0.0 FUNCT@5.0V:ATOM7TO9B 0.0 FUNCT@5.0V:ATOM7TO9C 0.0 FUNCT@5.0V:ATOM7TO9D 0.0 FUNCT@5.0V:ATOM7TO9E 0.0 FUNCT@5.0V:ATOM10TO12 0.0 FUNCT@5.0V:ATOM13A 0.0 FUNCT@5.0V:ATOM13B 0.0 FUNCT@5.0V:ATOM13C 0.0 FUNCT@5.0V:ATOM14 0.0 FUNCT@5.0V:ATOM15 0.0 FUNCT@5.0V:ATOM16 0.0 FUNCT@5.0V:ATOM17 0.0 FUNCT@5.0V:ATOM18 0.0 FUNCT@5.0V:ATOM18HF 0.0 FUNCT@5.0V:ATOM19 0.0 FUNCT@5.0V:ATOM19B 0.0 FUNCT@5.0V:ATOM19C 0.0 FUNCT@5.0V:ATOM19D 0.0 FUNCT@5.0V:ATOM19E 0.0 FUNCT@5.0V:ATOM19F 0.0 FUNCT@5.0V:ATOM19FHF 0.0 FUNCT@5.0V:ATOM20 0.0 FUNCT@5.0V:ATOM21 0.0 FUNCT@5.0V:ATOM22 0.0 FUNCT@5.0V:ATOM23 0.0 FUNCT@5.0V:ATOM24 0.0 FUNCT@5.0V:ATOM25 0.0 FUNCT@5.0V:ATOM25HF 0.0 FUNCT@5.0V:ATOM26A 0.0 FUNCT@5.0V:ATOM26B 0.0 FUNCT@5.0V:ATOM27 0.0 FUNCT@5.0V:ATOM28 0.0 FUNCT@5.0V:ATOM29 0.0 FUNCT@5.0V:ATOM30 0.0 FUNCT@5.0V:ATOM31A 0.0 FUNCT@5.0V:ATOM31B 0.0 FUNCT@5.0V:ATOM32 0.0 FUNCT@5.0V:ATOM33 0.0 FUNCT@5.0V:ATOM34 0.0 FUNCT@5.0V:ATOM35 0.0 FUNCT@5.0V:ATOM36 0.0 FUNCT@5.0V:ATOM37A 0.0 FUNCT@5.0V:ATOM37B 0.0 FUNCT@5.0V:ATOM37C 0.0 FUNCT@5.0V:ATOM37D 0.0 FUNCT@5.0V:ATOM37E 0.0 FUNCT@5.0V:ATOM38 0.0 FUNCT@5.0V:ATOM39 0.0 FUNCT@5.0V:ATOM40 0.0 FUNCT@5.0V:ATOM41 0.0 FUNCT@5.0V:ATOM41A 0.0 FUNCT@5.0V:ATOM42 0.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 0.0 FUNCT@5.0V:ATOM45C_40 0.0 FUNCT@5.0V:ATOM46C_40 0.0 FUNCT@5.0V:ATOM47C_40 0.0 FUNCT@5.0V:ATOM48C_40 0.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 0.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 0.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 0.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 0.0 FUNCT@5.0V:A10TO12HF 0.0 FUNCT@5.0V:ADAC37HF 0.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:803 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0110 chi2 = 3.5920 VTN P-side: a = 0.0102 b(slope) = 0.0068 chi2 = 0.7253 CAL_IN N-side: a = 2.4722 b(slope) = 0.0085 chi2 = 0.6939 CAL_IN P-side: a = 2.4725 b(slope) = 0.0085 chi2 = 0.5834 VTP N-side(average) = 0.7167 V CAL_BASE = 2.4744 V VTP P-side(average) = 0.4439 V CAL_VREF = 3.0181 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:804 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0108 chi2 = 1.5978 VTN P-side: a = 0.0104 b(slope) = 0.0066 chi2 = 0.4106 CAL_IN N-side: a = 2.5061 b(slope) = 0.0084 chi2 = 0.4903 CAL_IN P-side: a = 2.5065 b(slope) = 0.0083 chi2 = 0.6756 VTP N-side(average) = 0.7037 V CAL_BASE = 2.5061 V VTP P-side(average) = 0.4358 V CAL_VREF = 3.0413 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:704 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0108 chi2 = 1.4187 VTN P-side: a = 0.0105 b(slope) = 0.0065 chi2 = 0.4117 CAL_IN N-side: a = 2.4567 b(slope) = 0.0086 chi2 = 1.0740 CAL_IN P-side: a = 2.4566 b(slope) = 0.0086 chi2 = 0.9898 VTP N-side(average) = 0.6995 V CAL_BASE = 2.4617 V VTP P-side(average) = 0.4300 V CAL_VREF = 3.0103 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:604 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0108 chi2 = 1.9538 VTN P-side: a = 0.0102 b(slope) = 0.0066 chi2 = 0.8204 CAL_IN N-side: a = 2.4931 b(slope) = 0.0083 chi2 = 0.6486 CAL_IN P-side: a = 2.4930 b(slope) = 0.0083 chi2 = 1.1704 VTP N-side(average) = 0.7036 V CAL_BASE = 2.4951 V VTP P-side(average) = 0.4357 V CAL_VREF = 3.0268 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:504 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0107 chi2 = 1.5019 VTN P-side: a = 0.0109 b(slope) = 0.0066 chi2 = 0.4605 CAL_IN N-side: a = 2.4530 b(slope) = 0.0086 chi2 = 0.8084 CAL_IN P-side: a = 2.4531 b(slope) = 0.0086 chi2 = 1.1349 VTP N-side(average) = 0.6982 V CAL_BASE = 2.4541 V VTP P-side(average) = 0.4329 V CAL_VREF = 3.0076 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:404 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0107 chi2 = 0.6255 VTN P-side: a = 0.0099 b(slope) = 0.0065 chi2 = 0.5896 CAL_IN N-side: a = 2.4356 b(slope) = 0.0087 chi2 = 1.5100 CAL_IN P-side: a = 2.4353 b(slope) = 0.0087 chi2 = 1.1712 VTP N-side(average) = 0.6929 V CAL_BASE = 2.4365 V VTP P-side(average) = 0.4280 V CAL_VREF = 2.9961 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:304 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0107 chi2 = 1.1352 VTN P-side: a = 0.0096 b(slope) = 0.0066 chi2 = 0.6645 CAL_IN N-side: a = 2.4364 b(slope) = 0.0086 chi2 = 0.8130 CAL_IN P-side: a = 2.4362 b(slope) = 0.0085 chi2 = 2.1430 VTP N-side(average) = 0.6957 V CAL_BASE = 2.4387 V VTP P-side(average) = 0.4302 V CAL_VREF = 2.9880 V FUNCT. DIGITAL TEST = 31 error detected in test: FUNCT@5.0V:ATOM13A 1927.0 FUNCT@5.0V:ATOM13B 1983.0 FUNCT@5.0V:ATOM13C 1983.0 FUNCT@5.0V:ATOM15 1971.0 FUNCT@5.0V:ATOM17 4283.0 FUNCT@5.0V:ATOM18 4299.0 FUNCT@5.0V:ATOM18HF 4299.0 FUNCT@5.0V:ATOM19 4235.0 FUNCT@5.0V:ATOM19D 4250.0 FUNCT@5.0V:ATOM19E 3477.0 FUNCT@5.0V:ATOM19F 7350.0 FUNCT@5.0V:ATOM19FHF 7350.0 FUNCT@5.0V:ATOM20 1943.0 FUNCT@5.0V:ATOM21 1919.0 FUNCT@5.0V:ATOM22 1907.0 FUNCT@5.0V:ATOM25 1925.0 FUNCT@5.0V:ATOM25HF 1925.0 FUNCT@5.0V:ATOM26A 1904.0 FUNCT@5.0V:ATOM26B 2713.0 FUNCT@5.0V:ATOM28 2041.0 FUNCT@5.0V:ATOM29 2041.0 FUNCT@5.0V:ATOM30 2041.0 FUNCT@5.0V:ATOM31A 1675.0 FUNCT@5.0V:ATOM31B 1864.0 FUNCT@5.0V:ATOM32 1675.0 FUNCT@5.0V:ATOM33 2041.0 FUNCT@5.0V:ATOM35 2175.0 FUNCT@5.0V:ATOM36 1931.0 FUNCT@5.0V:ATOM39 1952.0 FUNCT@5.0V:ATOM41 2478.0 FUNCT@5.0V:ATOM41A 2478.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4099.0 FUNCT@5.0V:ATOM45C_40 4099.0 FUNCT@5.0V:ATOM46C_40 4099.0 FUNCT@5.0V:ATOM47C_40 4099.0 FUNCT@5.0V:ATOM48C_40 4099.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4099.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1403.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:204 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0221 b(slope) = 0.0102 chi2 = 99.0000 VTN P-side: a = 0.0105 b(slope) = 0.0064 chi2 = 0.3189 CAL_IN N-side: a = 2.4687 b(slope) = 0.0082 chi2 = 99.0000 CAL_IN P-side: a = 2.4575 b(slope) = 0.0086 chi2 = 15.9238 VTP N-side(average) = 0.6843 V CAL_BASE = 2.4556 V VTP P-side(average) = 0.4199 V CAL_VREF = 2.9966 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:205 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0105 chi2 = 1.0985 VTN P-side: a = 0.0108 b(slope) = 0.0064 chi2 = 0.3862 CAL_IN N-side: a = 2.4461 b(slope) = 0.0085 chi2 = 0.6005 CAL_IN P-side: a = 2.4464 b(slope) = 0.0085 chi2 = 0.5522 VTP N-side(average) = 0.6835 V CAL_BASE = 2.4468 V VTP P-side(average) = 0.4196 V CAL_VREF = 2.9890 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:305 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0105 chi2 = 1.6688 VTN P-side: a = 0.0107 b(slope) = 0.0064 chi2 = 0.5831 CAL_IN N-side: a = 2.4499 b(slope) = 0.0084 chi2 = 0.8808 CAL_IN P-side: a = 2.4501 b(slope) = 0.0084 chi2 = 0.8173 VTP N-side(average) = 0.6812 V CAL_BASE = 2.4522 V VTP P-side(average) = 0.4191 V CAL_VREF = 2.9885 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:405 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0226 b(slope) = 0.0104 chi2 = 99.0000 VTN P-side: a = 0.0108 b(slope) = 0.0065 chi2 = 0.4428 CAL_IN N-side: a = 2.4649 b(slope) = 0.0082 chi2 = 99.0000 CAL_IN P-side: a = 2.4489 b(slope) = 0.0085 chi2 = 0.7583 VTP N-side(average) = 0.6941 V CAL_BASE = 2.4524 V VTP P-side(average) = 0.4273 V CAL_VREF = 2.9985 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:505 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0107 chi2 = 1.3678 VTN P-side: a = 0.0103 b(slope) = 0.0065 chi2 = 0.7166 CAL_IN N-side: a = 2.4629 b(slope) = 0.0085 chi2 = 0.6132 CAL_IN P-side: a = 2.4625 b(slope) = 0.0085 chi2 = 0.5459 VTP N-side(average) = 0.6979 V CAL_BASE = 2.4639 V VTP P-side(average) = 0.4290 V CAL_VREF = 3.0110 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:605 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0107 chi2 = 1.3872 VTN P-side: a = 0.0104 b(slope) = 0.0065 chi2 = 0.5984 CAL_IN N-side: a = 2.4616 b(slope) = 0.0086 chi2 = 0.5242 CAL_IN P-side: a = 2.4617 b(slope) = 0.0086 chi2 = 0.5016 VTP N-side(average) = 0.6943 V CAL_BASE = 2.4597 V VTP P-side(average) = 0.4266 V CAL_VREF = 3.0120 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:705 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0108 chi2 = 1.6087 VTN P-side: a = 0.0106 b(slope) = 0.0067 chi2 = 0.4659 CAL_IN N-side: a = 2.4882 b(slope) = 0.0083 chi2 = 1.2366 CAL_IN P-side: a = 2.4880 b(slope) = 0.0083 chi2 = 1.3618 VTP N-side(average) = 0.7018 V CAL_BASE = 2.4900 V VTP P-side(average) = 0.4377 V CAL_VREF = 3.0227 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:805 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0107 chi2 = 1.0796 VTN P-side: a = 0.0094 b(slope) = 0.0066 chi2 = 0.7314 CAL_IN N-side: a = 2.4671 b(slope) = 0.0086 chi2 = 0.4852 CAL_IN P-side: a = 2.4670 b(slope) = 0.0086 chi2 = 0.2303 VTP N-side(average) = 0.6931 V CAL_BASE = 2.4688 V VTP P-side(average) = 0.4329 V CAL_VREF = 3.0173 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:806 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0107 chi2 = 0.9920 VTN P-side: a = 0.0096 b(slope) = 0.0066 chi2 = 0.5299 CAL_IN N-side: a = 2.4780 b(slope) = 0.0084 chi2 = 0.8437 CAL_IN P-side: a = 2.4780 b(slope) = 0.0084 chi2 = 0.5716 VTP N-side(average) = 0.6991 V CAL_BASE = 2.4822 V VTP P-side(average) = 0.4320 V CAL_VREF = 3.0227 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:706 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0092 b(slope) = 0.0108 chi2 = 1.0636 VTN P-side: a = 0.0095 b(slope) = 0.0066 chi2 = 0.7077 CAL_IN N-side: a = 2.4530 b(slope) = 0.0086 chi2 = 0.7263 CAL_IN P-side: a = 2.4529 b(slope) = 0.0086 chi2 = 0.4047 VTP N-side(average) = 0.7016 V CAL_BASE = 2.4543 V VTP P-side(average) = 0.4305 V CAL_VREF = 3.0088 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:606 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0108 chi2 = 0.6971 VTN P-side: a = 0.0100 b(slope) = 0.0066 chi2 = 0.2957 CAL_IN N-side: a = 2.4653 b(slope) = 0.0085 chi2 = 0.6485 CAL_IN P-side: a = 2.4655 b(slope) = 0.0085 chi2 = 0.4577 VTP N-side(average) = 0.7029 V CAL_BASE = 2.4680 V VTP P-side(average) = 0.4336 V CAL_VREF = 3.0144 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:506 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0106 chi2 = 1.7139 VTN P-side: a = 0.0106 b(slope) = 0.0064 chi2 = 0.5873 CAL_IN N-side: a = 2.4959 b(slope) = 0.0083 chi2 = 0.8794 CAL_IN P-side: a = 2.4960 b(slope) = 0.0083 chi2 = 0.5559 VTP N-side(average) = 0.6877 V CAL_BASE = 2.4956 V VTP P-side(average) = 0.4245 V CAL_VREF = 3.0303 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 1 error detected in test: TMIN@4.8V:A7_9_50D 0.0 ------- CHIP ID:406 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0107 chi2 = 2.3774 VTN P-side: a = 0.0102 b(slope) = 0.0065 chi2 = 0.7573 CAL_IN N-side: a = 2.4546 b(slope) = 0.0085 chi2 = 0.7799 CAL_IN P-side: a = 2.4548 b(slope) = 0.0085 chi2 = 0.4009 VTP N-side(average) = 0.6944 V CAL_BASE = 2.4604 V VTP P-side(average) = 0.4291 V CAL_VREF = 3.0046 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:306 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0106 chi2 = 1.9127 VTN P-side: a = 0.0098 b(slope) = 0.0065 chi2 = 0.8240 CAL_IN N-side: a = 2.4360 b(slope) = 0.0085 chi2 = 0.6174 CAL_IN P-side: a = 2.4358 b(slope) = 0.0085 chi2 = 0.6122 VTP N-side(average) = 0.6890 V CAL_BASE = 2.4390 V VTP P-side(average) = 0.4251 V CAL_VREF = 2.9849 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1404.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:206 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0105 chi2 = 2.1820 VTN P-side: a = 0.0104 b(slope) = 0.0064 chi2 = 0.5769 CAL_IN N-side: a = 2.4495 b(slope) = 0.0084 chi2 = 0.8848 CAL_IN P-side: a = 2.4492 b(slope) = 0.0084 chi2 = 0.5974 VTP N-side(average) = 0.6808 V CAL_BASE = 2.4504 V VTP P-side(average) = 0.4192 V CAL_VREF = 2.9856 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:107 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0104 chi2 = 1.1422 VTN P-side: a = 0.0106 b(slope) = 0.0063 chi2 = 0.4281 CAL_IN N-side: a = 2.4509 b(slope) = 0.0084 chi2 = 0.7516 CAL_IN P-side: a = 2.4510 b(slope) = 0.0084 chi2 = 0.4937 VTP N-side(average) = 0.6758 V CAL_BASE = 2.4560 V VTP P-side(average) = 0.4177 V CAL_VREF = 2.9927 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:207 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0105 chi2 = 0.8586 VTN P-side: a = 0.0101 b(slope) = 0.0064 chi2 = 0.6250 CAL_IN N-side: a = 2.4587 b(slope) = 0.0083 chi2 = 1.0151 CAL_IN P-side: a = 2.4586 b(slope) = 0.0083 chi2 = 1.0594 VTP N-side(average) = 0.6823 V CAL_BASE = 2.4595 V VTP P-side(average) = 0.4211 V CAL_VREF = 2.9902 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:307 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0105 chi2 = 2.0290 VTN P-side: a = 0.0095 b(slope) = 0.0065 chi2 = 0.4413 CAL_IN N-side: a = 2.4640 b(slope) = 0.0084 chi2 = 0.6806 CAL_IN P-side: a = 2.4642 b(slope) = 0.0084 chi2 = 0.5439 VTP N-side(average) = 0.6851 V CAL_BASE = 2.4646 V VTP P-side(average) = 0.4235 V CAL_VREF = 2.9995 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:407 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0105 chi2 = 1.6506 VTN P-side: a = 0.0098 b(slope) = 0.0064 chi2 = 0.7483 CAL_IN N-side: a = 2.4597 b(slope) = 0.0085 chi2 = 0.9965 CAL_IN P-side: a = 2.4592 b(slope) = 0.0085 chi2 = 0.6901 VTP N-side(average) = 0.6846 V CAL_BASE = 2.4590 V VTP P-side(average) = 0.4231 V CAL_VREF = 3.0061 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:507 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0090 b(slope) = 0.0107 chi2 = 2.5748 VTN P-side: a = 0.0096 b(slope) = 0.0065 chi2 = 0.7415 CAL_IN N-side: a = 2.4664 b(slope) = 0.0086 chi2 = 0.7344 CAL_IN P-side: a = 2.4662 b(slope) = 0.0086 chi2 = 0.8920 VTP N-side(average) = 0.6967 V CAL_BASE = 2.4685 V VTP P-side(average) = 0.4299 V CAL_VREF = 3.0166 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:607 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0106 chi2 = 0.9881 VTN P-side: a = 0.0101 b(slope) = 0.0065 chi2 = 0.5461 CAL_IN N-side: a = 2.4688 b(slope) = 0.0085 chi2 = 0.6904 CAL_IN P-side: a = 2.4688 b(slope) = 0.0085 chi2 = 0.4430 VTP N-side(average) = 0.6904 V CAL_BASE = 2.4712 V VTP P-side(average) = 0.4257 V CAL_VREF = 3.0151 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:707 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0105 chi2 = 0.5102 VTN P-side: a = 0.0095 b(slope) = 0.0064 chi2 = 0.5942 CAL_IN N-side: a = 2.4773 b(slope) = 0.0085 chi2 = 0.7763 CAL_IN P-side: a = 2.4775 b(slope) = 0.0085 chi2 = 1.2082 VTP N-side(average) = 0.6846 V CAL_BASE = 2.4819 V VTP P-side(average) = 0.4231 V CAL_VREF = 3.0227 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:807 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0109 chi2 = 0.6075 VTN P-side: a = 0.0097 b(slope) = 0.0067 chi2 = 0.2167 CAL_IN N-side: a = 2.4769 b(slope) = 0.0085 chi2 = 0.5239 CAL_IN P-side: a = 2.4770 b(slope) = 0.0085 chi2 = 0.4435 VTP N-side(average) = 0.7085 V CAL_BASE = 2.4834 V VTP P-side(average) = 0.4419 V CAL_VREF = 3.0268 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4099.0 FUNCT@5.0V:ATOM45C_40 4099.0 FUNCT@5.0V:ATOM46C_40 3669.0 FUNCT@5.0V:ATOM47C_40 3667.0 FUNCT@5.0V:ATOM48C_40 4099.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4099.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:907 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0113 chi2 = 0.9322 VTN P-side: a = 0.0097 b(slope) = 0.0070 chi2 = 0.3983 CAL_IN N-side: a = 2.4913 b(slope) = 0.0085 chi2 = 0.4522 CAL_IN P-side: a = 2.4916 b(slope) = 0.0085 chi2 = 0.3545 VTP N-side(average) = 0.7302 V CAL_BASE = 2.4919 V VTP P-side(average) = 0.4581 V CAL_VREF = 3.0332 V FUNCT. DIGITAL TEST = 15 error detected in test: FUNCT@5.0V:ATOM18 11629.0 FUNCT@5.0V:ATOM18HF 11629.0 FUNCT@5.0V:ATOM19 4200.0 FUNCT@5.0V:ATOM19D 4215.0 FUNCT@5.0V:ATOM21 1884.0 FUNCT@5.0V:ATOM22 1872.0 FUNCT@5.0V:ATOM25 3038.0 FUNCT@5.0V:ATOM25HF 3038.0 FUNCT@5.0V:ATOM28 2006.0 FUNCT@5.0V:ATOM31A 1640.0 FUNCT@5.0V:ATOM33 2006.0 FUNCT@5.0V:ATOM37A 2868.0 FUNCT@5.0V:ATOM37B 2860.0 FUNCT@5.0V:ATOM37D 2812.0 FUNCT@5.0V:ATOM37E 2803.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:908 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0111 b(slope) = 0.0111 chi2 = 1.4505 VTN P-side: a = 0.0112 b(slope) = 0.0068 chi2 = 0.6594 CAL_IN N-side: a = 2.4878 b(slope) = 0.0085 chi2 = 0.7892 CAL_IN P-side: a = 2.4877 b(slope) = 0.0085 chi2 = 0.6293 VTP N-side(average) = 0.7223 V CAL_BASE = 2.4934 V VTP P-side(average) = 0.4499 V CAL_VREF = 3.0359 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:808 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0107 b(slope) = 0.0109 chi2 = 1.5637 VTN P-side: a = 0.0110 b(slope) = 0.0067 chi2 = 0.7892 CAL_IN N-side: a = 2.5040 b(slope) = 0.0084 chi2 = 0.7071 CAL_IN P-side: a = 2.5040 b(slope) = 0.0084 chi2 = 0.6949 VTP N-side(average) = 0.7096 V CAL_BASE = 2.5066 V VTP P-side(average) = 0.4414 V CAL_VREF = 3.0427 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:708 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0108 chi2 = 0.6615 VTN P-side: a = 0.0095 b(slope) = 0.0067 chi2 = 0.6591 CAL_IN N-side: a = 2.4933 b(slope) = 0.0084 chi2 = 0.7137 CAL_IN P-side: a = 2.4934 b(slope) = 0.0084 chi2 = 1.3020 VTP N-side(average) = 0.7033 V CAL_BASE = 2.4956 V VTP P-side(average) = 0.4379 V CAL_VREF = 3.0352 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:608 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0107 chi2 = 0.9968 VTN P-side: a = 0.0098 b(slope) = 0.0066 chi2 = 0.3016 CAL_IN N-side: a = 2.4940 b(slope) = 0.0083 chi2 = 0.7932 CAL_IN P-side: a = 2.4940 b(slope) = 0.0083 chi2 = 1.0435 VTP N-side(average) = 0.6989 V CAL_BASE = 2.4971 V VTP P-side(average) = 0.4316 V CAL_VREF = 3.0308 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:508 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1127 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0107 chi2 = 1.3377 VTN P-side: a = 0.0099 b(slope) = 0.0065 chi2 = 0.3162 CAL_IN N-side: a = 2.5128 b(slope) = 0.0083 chi2 = 2.0203 CAL_IN P-side: a = 2.5127 b(slope) = 0.0083 chi2 = 1.7516 VTP N-side(average) = 0.6927 V CAL_BASE = 2.5159 V VTP P-side(average) = 0.4286 V CAL_VREF = 3.0471 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:408 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0106 chi2 = 1.5623 VTN P-side: a = 0.0104 b(slope) = 0.0065 chi2 = 0.8227 CAL_IN N-side: a = 2.4641 b(slope) = 0.0085 chi2 = 1.0389 CAL_IN P-side: a = 2.4642 b(slope) = 0.0085 chi2 = 1.0210 VTP N-side(average) = 0.6932 V CAL_BASE = 2.4678 V VTP P-side(average) = 0.4270 V CAL_VREF = 3.0110 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1409.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:308 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0112 b(slope) = 0.0106 chi2 = 1.1438 VTN P-side: a = 0.0115 b(slope) = 0.0065 chi2 = 0.9520 CAL_IN N-side: a = 2.4528 b(slope) = 0.0085 chi2 = 1.4031 CAL_IN P-side: a = 2.4529 b(slope) = 0.0085 chi2 = 1.1877 VTP N-side(average) = 0.6914 V CAL_BASE = 2.4541 V VTP P-side(average) = 0.4274 V CAL_VREF = 3.0015 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5951.0 FUNCT@5.0V:ATOM45C_40 4890.0 FUNCT@5.0V:ATOM46C_40 3699.0 FUNCT@5.0V:ATOM47C_40 4890.0 FUNCT@5.0V:ATOM48C_40 5951.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5951.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:208 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0105 chi2 = 1.3770 VTN P-side: a = 0.0099 b(slope) = 0.0064 chi2 = 0.6225 CAL_IN N-side: a = 2.4698 b(slope) = 0.0083 chi2 = 1.3378 CAL_IN P-side: a = 2.4698 b(slope) = 0.0083 chi2 = 0.7256 VTP N-side(average) = 0.6823 V CAL_BASE = 2.4739 V VTP P-side(average) = 0.4188 V CAL_VREF = 3.0039 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:108 --------------------------------------- CLASS=C -------- CONTACTS TEST = 2 error detected in test: CONTACT:138/T6 -0.7 CONTACT:142/T7 -0.7 POWER-ON TEST = 0 ANALOG TEST = 34 error detected in test: IDDSB:VDD0A 0.0000 IDDSB:VDD1A 0.0000 IDDSB:VDD0B 0.0000 IDDSB:VDD1B 0.0000 IDDSB:VDD0C 0.0000 IDDSB:VDD1C 0.0000 IDDSB:VDD0D 0.0000 IDDSB:VDD1D 0.0000 V_AVDD2IPA:249/L9 0.0000 V_AVDD2IMA:277/L10 0.0000 AVDD_A:AVDDP-M 0.0000 IAVDD2_A:AVDDP-M 0.0000 V_V1RA:169/L5 0.0000 V_N310A:171/L6 0.0000 V_AVDD2IPB:249/L9 0.0000 V_AVDD2IMB:277/L10 0.0000 AVDD_B:AVDDP-M 0.0000 IAVDD2_B:AVDDP-M 0.0000 V_V1RB:169/L5 0.0000 V_N310B:171/L6 0.0000 V_AVDD2IPC:249/L9 0.0000 V_AVDD2IMC:277/L10 0.0000 AVDD_C:AVDDP-M 0.0000 IAVDD2_C:AVDDP-M 0.0000 V_V1RC:169/L5 0.0000 V_N310C:171/L6 0.0000 V_AVDD2IPD:249/L9 0.0000 V_AVDD2IMD:277/L10 0.0000 AVDD_D:AVDDP-M 0.0000 IAVDD2_D:AVDDP-M 0.0000 V_V1RD:169/L5 0.0000 V_N310D:171/L6 0.0000 IDDOP0:AVDD 0.0000 IDDOP1:DVDD 0.0000 DACS TEST = 1 VTN N-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN N-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side(average) = 0.0000 V CAL_BASE = 0.0000 V VTP P-side(average) = 0.0000 V CAL_VREF = 0.0000 V FUNCT. DIGITAL TEST = 58 error detected in test: FUNCT@5.0V:ATOM1TO6A 0.0 FUNCT@5.0V:ATOM1TO6B 0.0 FUNCT@5.0V:ATOM1TO6C 0.0 FUNCT@5.0V:ATOM1TO6D 0.0 FUNCT@5.0V:ATOM1TO6E 0.0 FUNCT@5.0V:ATOM7TO9A 0.0 FUNCT@5.0V:ATOM7TO9B 0.0 FUNCT@5.0V:ATOM7TO9C 0.0 FUNCT@5.0V:ATOM7TO9D 0.0 FUNCT@5.0V:ATOM7TO9E 0.0 FUNCT@5.0V:ATOM10TO12 0.0 FUNCT@5.0V:ATOM13A 0.0 FUNCT@5.0V:ATOM13B 0.0 FUNCT@5.0V:ATOM13C 0.0 FUNCT@5.0V:ATOM14 0.0 FUNCT@5.0V:ATOM15 0.0 FUNCT@5.0V:ATOM16 0.0 FUNCT@5.0V:ATOM17 0.0 FUNCT@5.0V:ATOM18 0.0 FUNCT@5.0V:ATOM18HF 0.0 FUNCT@5.0V:ATOM19 0.0 FUNCT@5.0V:ATOM19B 0.0 FUNCT@5.0V:ATOM19C 0.0 FUNCT@5.0V:ATOM19D 0.0 FUNCT@5.0V:ATOM19E 0.0 FUNCT@5.0V:ATOM19F 0.0 FUNCT@5.0V:ATOM19FHF 0.0 FUNCT@5.0V:ATOM20 0.0 FUNCT@5.0V:ATOM21 0.0 FUNCT@5.0V:ATOM22 0.0 FUNCT@5.0V:ATOM23 0.0 FUNCT@5.0V:ATOM24 0.0 FUNCT@5.0V:ATOM25 0.0 FUNCT@5.0V:ATOM25HF 0.0 FUNCT@5.0V:ATOM26A 0.0 FUNCT@5.0V:ATOM26B 0.0 FUNCT@5.0V:ATOM27 0.0 FUNCT@5.0V:ATOM28 0.0 FUNCT@5.0V:ATOM29 0.0 FUNCT@5.0V:ATOM30 0.0 FUNCT@5.0V:ATOM31A 0.0 FUNCT@5.0V:ATOM31B 0.0 FUNCT@5.0V:ATOM32 0.0 FUNCT@5.0V:ATOM33 0.0 FUNCT@5.0V:ATOM34 0.0 FUNCT@5.0V:ATOM35 0.0 FUNCT@5.0V:ATOM36 0.0 FUNCT@5.0V:ATOM37A 0.0 FUNCT@5.0V:ATOM37B 0.0 FUNCT@5.0V:ATOM37C 0.0 FUNCT@5.0V:ATOM37D 0.0 FUNCT@5.0V:ATOM37E 0.0 FUNCT@5.0V:ATOM38 0.0 FUNCT@5.0V:ATOM39 0.0 FUNCT@5.0V:ATOM40 0.0 FUNCT@5.0V:ATOM41 0.0 FUNCT@5.0V:ATOM41A 0.0 FUNCT@5.0V:ATOM42 0.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 0.0 FUNCT@5.0V:ATOM45C_40 0.0 FUNCT@5.0V:ATOM46C_40 0.0 FUNCT@5.0V:ATOM47C_40 0.0 FUNCT@5.0V:ATOM48C_40 0.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 0.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 0.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 0.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 0.0 FUNCT@5.0V:A10TO12HF 0.0 FUNCT@5.0V:ADAC37HF 0.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:209 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0101 b(slope) = 0.0104 chi2 = 0.8698 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.2755 CAL_IN N-side: a = 2.4353 b(slope) = 0.0123 chi2 = 99.0000 CAL_IN P-side: a = 2.4683 b(slope) = 0.0108 chi2 = 99.0000 VTP N-side(average) = 0.6801 V CAL_BASE = 2.4688 V VTP P-side(average) = 0.4193 V CAL_VREF = 2.9993 V FUNCT. DIGITAL TEST = 31 error detected in test: FUNCT@5.0V:ATOM13A 1347.0 FUNCT@5.0V:ATOM15 1391.0 FUNCT@5.0V:ATOM17 3703.0 FUNCT@5.0V:ATOM18 3719.0 FUNCT@5.0V:ATOM18HF 3719.0 FUNCT@5.0V:ATOM19 4739.0 FUNCT@5.0V:ATOM19E 2896.0 FUNCT@5.0V:ATOM19F 6769.0 FUNCT@5.0V:ATOM19FHF 6769.0 FUNCT@5.0V:ATOM20 1362.0 FUNCT@5.0V:ATOM21 1338.0 FUNCT@5.0V:ATOM22 1326.0 FUNCT@5.0V:ATOM25 1344.0 FUNCT@5.0V:ATOM25HF 1344.0 FUNCT@5.0V:ATOM26A 1323.0 FUNCT@5.0V:ATOM26B 2132.0 FUNCT@5.0V:ATOM28 1460.0 FUNCT@5.0V:ATOM29 1460.0 FUNCT@5.0V:ATOM30 1462.0 FUNCT@5.0V:ATOM31A 1094.0 FUNCT@5.0V:ATOM31B 1283.0 FUNCT@5.0V:ATOM32 1096.0 FUNCT@5.0V:ATOM35 1594.0 FUNCT@5.0V:ATOM36 1351.0 FUNCT@5.0V:ATOM37B 1770.0 FUNCT@5.0V:ATOM37C 1754.0 FUNCT@5.0V:ATOM37D 1722.0 FUNCT@5.0V:ATOM37E 1713.0 FUNCT@5.0V:ATOM39 1373.0 FUNCT@5.0V:ATOM41 1898.0 FUNCT@5.0V:ATOM41A 1898.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:309 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0106 chi2 = 1.0369 VTN P-side: a = 0.0104 b(slope) = 0.0065 chi2 = 0.3488 CAL_IN N-side: a = 2.4764 b(slope) = 0.0083 chi2 = 0.6969 CAL_IN P-side: a = 2.4762 b(slope) = 0.0083 chi2 = 0.5048 VTP N-side(average) = 0.6924 V CAL_BASE = 2.4797 V VTP P-side(average) = 0.4282 V CAL_VREF = 3.0115 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:409 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0121 b(slope) = 0.0107 chi2 = 0.9183 VTN P-side: a = 0.0116 b(slope) = 0.0065 chi2 = 0.7047 CAL_IN N-side: a = 2.4783 b(slope) = 0.0084 chi2 = 1.5366 CAL_IN P-side: a = 2.4786 b(slope) = 0.0084 chi2 = 0.8655 VTP N-side(average) = 0.6964 V CAL_BASE = 2.4822 V VTP P-side(average) = 0.4306 V CAL_VREF = 3.0176 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:509 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0107 chi2 = 0.7877 VTN P-side: a = 0.0102 b(slope) = 0.0066 chi2 = 0.4848 CAL_IN N-side: a = 2.4916 b(slope) = 0.0085 chi2 = 0.8796 CAL_IN P-side: a = 2.4915 b(slope) = 0.0085 chi2 = 1.0959 VTP N-side(average) = 0.6948 V CAL_BASE = 2.4936 V VTP P-side(average) = 0.4325 V CAL_VREF = 3.0361 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:609 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0107 chi2 = 1.0106 VTN P-side: a = 0.0094 b(slope) = 0.0066 chi2 = 0.6563 CAL_IN N-side: a = 2.4983 b(slope) = 0.0083 chi2 = 0.8951 CAL_IN P-side: a = 2.4986 b(slope) = 0.0083 chi2 = 0.4937 VTP N-side(average) = 0.6978 V CAL_BASE = 2.5027 V VTP P-side(average) = 0.4302 V CAL_VREF = 3.0352 V FUNCT. DIGITAL TEST = 28 error detected in test: FUNCT@5.0V:ATOM13A 1474.0 FUNCT@5.0V:ATOM15 1518.0 FUNCT@5.0V:ATOM17 3830.0 FUNCT@5.0V:ATOM18 3846.0 FUNCT@5.0V:ATOM18HF 3846.0 FUNCT@5.0V:ATOM19 4866.0 FUNCT@5.0V:ATOM19E 3025.0 FUNCT@5.0V:ATOM19F 6900.0 FUNCT@5.0V:ATOM19FHF 6900.0 FUNCT@5.0V:ATOM20 1493.0 FUNCT@5.0V:ATOM21 1469.0 FUNCT@5.0V:ATOM22 1455.0 FUNCT@5.0V:ATOM25 1475.0 FUNCT@5.0V:ATOM25HF 1475.0 FUNCT@5.0V:ATOM26A 1452.0 FUNCT@5.0V:ATOM26B 2261.0 FUNCT@5.0V:ATOM28 1589.0 FUNCT@5.0V:ATOM30 1588.0 FUNCT@5.0V:ATOM31A 1223.0 FUNCT@5.0V:ATOM31B 1414.0 FUNCT@5.0V:ATOM32 1222.0 FUNCT@5.0V:ATOM35 1723.0 FUNCT@5.0V:ATOM36 1478.0 FUNCT@5.0V:ATOM37C 2011.0 FUNCT@5.0V:ATOM37D 1979.0 FUNCT@5.0V:ATOM39 1499.0 FUNCT@5.0V:ATOM41 2025.0 FUNCT@5.0V:ATOM41A 2025.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:709 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0108 chi2 = 1.2130 VTN P-side: a = 0.0094 b(slope) = 0.0067 chi2 = 0.5544 CAL_IN N-side: a = 2.4899 b(slope) = 0.0084 chi2 = 0.9645 CAL_IN P-side: a = 2.4895 b(slope) = 0.0084 chi2 = 0.4509 VTP N-side(average) = 0.7020 V CAL_BASE = 2.4941 V VTP P-side(average) = 0.4369 V CAL_VREF = 3.0327 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:809 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0111 chi2 = 2.2992 VTN P-side: a = 0.0096 b(slope) = 0.0068 chi2 = 0.7387 CAL_IN N-side: a = 2.4543 b(slope) = 0.0087 chi2 = 0.9178 CAL_IN P-side: a = 2.4544 b(slope) = 0.0087 chi2 = 1.5343 VTP N-side(average) = 0.7181 V CAL_BASE = 2.4539 V VTP P-side(average) = 0.4481 V CAL_VREF = 3.0115 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:810 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 2 error detected in test: IDDSB:VDD1D 0.1003 IDDOP1:DVDD 0.1231 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0111 chi2 = 2.0012 VTN P-side: a = 0.0099 b(slope) = 0.0068 chi2 = 0.6754 CAL_IN N-side: a = 2.4981 b(slope) = 0.0084 chi2 = 0.8421 CAL_IN P-side: a = 2.4984 b(slope) = 0.0084 chi2 = 0.7911 VTP N-side(average) = 0.7188 V CAL_BASE = 2.5066 V VTP P-side(average) = 0.4474 V CAL_VREF = 3.0437 V FUNCT. DIGITAL TEST = 37 error detected in test: FUNCT@5.0V:ATOM13A 1960.0 FUNCT@5.0V:ATOM13B 2015.0 FUNCT@5.0V:ATOM13C 2015.0 FUNCT@5.0V:ATOM15 2004.0 FUNCT@5.0V:ATOM17 4316.0 FUNCT@5.0V:ATOM18 4332.0 FUNCT@5.0V:ATOM18HF 4332.0 FUNCT@5.0V:ATOM19 4268.0 FUNCT@5.0V:ATOM19D 4283.0 FUNCT@5.0V:ATOM19E 3510.0 FUNCT@5.0V:ATOM19F 6837.0 FUNCT@5.0V:ATOM19FHF 6837.0 FUNCT@5.0V:ATOM20 1976.0 FUNCT@5.0V:ATOM21 1952.0 FUNCT@5.0V:ATOM22 1940.0 FUNCT@5.0V:ATOM23 976.0 FUNCT@5.0V:ATOM25 1958.0 FUNCT@5.0V:ATOM25HF 1958.0 FUNCT@5.0V:ATOM26A 1937.0 FUNCT@5.0V:ATOM26B 2746.0 FUNCT@5.0V:ATOM28 2074.0 FUNCT@5.0V:ATOM29 2074.0 FUNCT@5.0V:ATOM30 2074.0 FUNCT@5.0V:ATOM31A 1708.0 FUNCT@5.0V:ATOM31B 1897.0 FUNCT@5.0V:ATOM32 1708.0 FUNCT@5.0V:ATOM33 2074.0 FUNCT@5.0V:ATOM35 2208.0 FUNCT@5.0V:ATOM36 1964.0 FUNCT@5.0V:ATOM37A 2999.0 FUNCT@5.0V:ATOM37B 2991.0 FUNCT@5.0V:ATOM37C 2975.0 FUNCT@5.0V:ATOM37D 2943.0 FUNCT@5.0V:ATOM37E 2934.0 FUNCT@5.0V:ATOM39 1985.0 FUNCT@5.0V:ATOM41 2511.0 FUNCT@5.0V:ATOM41A 2511.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4115.0 FUNCT@5.0V:ATOM45C_40 4115.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 4115.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4115.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:710 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0111 b(slope) = 0.0111 chi2 = 1.2349 VTN P-side: a = 0.0111 b(slope) = 0.0068 chi2 = 0.9263 CAL_IN N-side: a = 2.4812 b(slope) = 0.0086 chi2 = 0.3996 CAL_IN P-side: a = 2.4812 b(slope) = 0.0086 chi2 = 0.3954 VTP N-side(average) = 0.7210 V CAL_BASE = 2.4858 V VTP P-side(average) = 0.4477 V CAL_VREF = 3.0347 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:610 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1229 DACS TEST = 0 VTN N-side: a = 0.0118 b(slope) = 0.0109 chi2 = 0.8040 VTN P-side: a = 0.0117 b(slope) = 0.0067 chi2 = 0.2978 CAL_IN N-side: a = 2.5169 b(slope) = 0.0083 chi2 = 0.5552 CAL_IN P-side: a = 2.5169 b(slope) = 0.0083 chi2 = 0.4616 VTP N-side(average) = 0.7104 V CAL_BASE = 2.5212 V VTP P-side(average) = 0.4425 V CAL_VREF = 3.0557 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1959.0 FUNCT@5.0V:ATOM13B 2031.0 FUNCT@5.0V:ATOM13C 2031.0 FUNCT@5.0V:ATOM15 2003.0 FUNCT@5.0V:ATOM17 4315.0 FUNCT@5.0V:ATOM18 4331.0 FUNCT@5.0V:ATOM18HF 4331.0 FUNCT@5.0V:ATOM19 4267.0 FUNCT@5.0V:ATOM19D 4282.0 FUNCT@5.0V:ATOM19E 3509.0 FUNCT@5.0V:ATOM19F 7382.0 FUNCT@5.0V:ATOM19FHF 7382.0 FUNCT@5.0V:ATOM20 1975.0 FUNCT@5.0V:ATOM21 1951.0 FUNCT@5.0V:ATOM22 1939.0 FUNCT@5.0V:ATOM25 1957.0 FUNCT@5.0V:ATOM25HF 1957.0 FUNCT@5.0V:ATOM26A 1936.0 FUNCT@5.0V:ATOM26B 2745.0 FUNCT@5.0V:ATOM28 2073.0 FUNCT@5.0V:ATOM29 2073.0 FUNCT@5.0V:ATOM30 2073.0 FUNCT@5.0V:ATOM31A 1707.0 FUNCT@5.0V:ATOM31B 1896.0 FUNCT@5.0V:ATOM32 1707.0 FUNCT@5.0V:ATOM33 2073.0 FUNCT@5.0V:ATOM35 1342.0 FUNCT@5.0V:ATOM36 1963.0 FUNCT@5.0V:ATOM37A 3015.0 FUNCT@5.0V:ATOM37B 3007.0 FUNCT@5.0V:ATOM37C 2991.0 FUNCT@5.0V:ATOM37D 2959.0 FUNCT@5.0V:ATOM37E 2950.0 FUNCT@5.0V:ATOM39 1984.0 FUNCT@5.0V:ATOM41 2510.0 FUNCT@5.0V:ATOM41A 2510.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3810.0 FUNCT@5.0V:ATOM45C_40 3810.0 FUNCT@5.0V:ATOM46C_40 3810.0 FUNCT@5.0V:ATOM47C_40 3810.0 FUNCT@5.0V:ATOM48C_40 3810.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3810.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1248.0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:510 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0109 chi2 = 0.6345 VTN P-side: a = 0.0102 b(slope) = 0.0067 chi2 = 0.6067 CAL_IN N-side: a = 2.5136 b(slope) = 0.0083 chi2 = 1.1544 CAL_IN P-side: a = 2.5137 b(slope) = 0.0083 chi2 = 0.5736 VTP N-side(average) = 0.7090 V CAL_BASE = 2.5173 V VTP P-side(average) = 0.4380 V CAL_VREF = 3.0481 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:410 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0108 chi2 = 1.0133 VTN P-side: a = 0.0100 b(slope) = 0.0066 chi2 = 0.2497 CAL_IN N-side: a = 2.4738 b(slope) = 0.0086 chi2 = 1.4224 CAL_IN P-side: a = 2.4739 b(slope) = 0.0085 chi2 = 1.3329 VTP N-side(average) = 0.7012 V CAL_BASE = 2.4753 V VTP P-side(average) = 0.4324 V CAL_VREF = 3.0234 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:310 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0105 chi2 = 1.5364 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.5526 CAL_IN N-side: a = 2.4883 b(slope) = 0.0083 chi2 = 0.6789 CAL_IN P-side: a = 2.4875 b(slope) = 0.0083 chi2 = 5.6915 VTP N-side(average) = 0.6853 V CAL_BASE = 2.4922 V VTP P-side(average) = 0.4201 V CAL_VREF = 3.0232 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:210 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0106 chi2 = 1.1129 VTN P-side: a = 0.0106 b(slope) = 0.0065 chi2 = 0.6479 CAL_IN N-side: a = 2.4773 b(slope) = 0.0082 chi2 = 0.8984 CAL_IN P-side: a = 2.4771 b(slope) = 0.0083 chi2 = 9.8181 VTP N-side(average) = 0.6926 V CAL_BASE = 2.4802 V VTP P-side(average) = 0.4275 V CAL_VREF = 3.0073 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5871.0 FUNCT@5.0V:ATOM45C_40 5871.0 FUNCT@5.0V:ATOM46C_40 5501.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 5871.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5871.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:211 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0112 b(slope) = 0.0104 chi2 = 0.8245 VTN P-side: a = 0.0113 b(slope) = 0.0063 chi2 = 0.5327 CAL_IN N-side: a = 2.5273 b(slope) = 0.0117 chi2 = 99.0000 CAL_IN P-side: a = 2.4999 b(slope) = 0.0107 chi2 = 99.0000 VTP N-side(average) = 0.6798 V CAL_BASE = 2.4739 V VTP P-side(average) = 0.4182 V CAL_VREF = 3.0085 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:311 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0118 b(slope) = 0.0105 chi2 = 0.9977 VTN P-side: a = 0.0117 b(slope) = 0.0064 chi2 = 0.4491 CAL_IN N-side: a = 2.4730 b(slope) = 0.0083 chi2 = 1.0890 CAL_IN P-side: a = 2.4730 b(slope) = 0.0083 chi2 = 0.6144 VTP N-side(average) = 0.6838 V CAL_BASE = 2.4788 V VTP P-side(average) = 0.4238 V CAL_VREF = 3.0127 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:411 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0115 b(slope) = 0.0107 chi2 = 1.5328 VTN P-side: a = 0.0116 b(slope) = 0.0066 chi2 = 0.4107 CAL_IN N-side: a = 2.4998 b(slope) = 0.0084 chi2 = 0.8532 CAL_IN P-side: a = 2.4997 b(slope) = 0.0084 chi2 = 0.9526 VTP N-side(average) = 0.6988 V CAL_BASE = 2.5039 V VTP P-side(average) = 0.4318 V CAL_VREF = 3.0403 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:511 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0122 b(slope) = 0.0107 chi2 = 1.2741 VTN P-side: a = 0.0126 b(slope) = 0.0066 chi2 = 0.4241 CAL_IN N-side: a = 2.5068 b(slope) = 0.0083 chi2 = 0.6358 CAL_IN P-side: a = 2.5069 b(slope) = 0.0083 chi2 = 0.5353 VTP N-side(average) = 0.6990 V CAL_BASE = 2.5100 V VTP P-side(average) = 0.4352 V CAL_VREF = 3.0415 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:611 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0110 b(slope) = 0.0111 chi2 = 0.7322 VTN P-side: a = 0.0110 b(slope) = 0.0068 chi2 = 0.3135 CAL_IN N-side: a = 2.5011 b(slope) = 0.0085 chi2 = 0.6174 CAL_IN P-side: a = 2.5009 b(slope) = 0.0085 chi2 = 0.4891 VTP N-side(average) = 0.7204 V CAL_BASE = 2.5044 V VTP P-side(average) = 0.4478 V CAL_VREF = 3.0471 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM36 3891.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:711 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0086 b(slope) = 0.0110 chi2 = 1.8618 VTN P-side: a = 0.0091 b(slope) = 0.0068 chi2 = 0.9933 CAL_IN N-side: a = 2.5034 b(slope) = 0.0084 chi2 = 1.2645 CAL_IN P-side: a = 2.5035 b(slope) = 0.0084 chi2 = 0.8605 VTP N-side(average) = 0.7122 V CAL_BASE = 2.5083 V VTP P-side(average) = 0.4436 V CAL_VREF = 3.0444 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:811 --------------------------------------- CLASS=B -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0111 chi2 = 0.7802 VTN P-side: a = 0.0096 b(slope) = 0.0069 chi2 = 0.2456 CAL_IN N-side: a = 2.4939 b(slope) = 0.0084 chi2 = 1.2280 CAL_IN P-side: a = 2.4938 b(slope) = 0.0084 chi2 = 0.8563 VTP N-side(average) = 0.7217 V CAL_BASE = 2.4995 V VTP P-side(average) = 0.4526 V CAL_VREF = 3.0378 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5259.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:812 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0111 chi2 = 1.0883 VTN P-side: a = 0.0099 b(slope) = 0.0068 chi2 = 0.6497 CAL_IN N-side: a = 2.5056 b(slope) = 0.0085 chi2 = 0.7303 CAL_IN P-side: a = 2.5059 b(slope) = 0.0085 chi2 = 0.4799 VTP N-side(average) = 0.7224 V CAL_BASE = 2.5103 V VTP P-side(average) = 0.4490 V CAL_VREF = 3.0537 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:712 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0111 chi2 = 0.8854 VTN P-side: a = 0.0101 b(slope) = 0.0069 chi2 = 0.5010 CAL_IN N-side: a = 2.5294 b(slope) = 0.0082 chi2 = 0.8504 CAL_IN P-side: a = 2.5294 b(slope) = 0.0082 chi2 = 0.8773 VTP N-side(average) = 0.7226 V CAL_BASE = 2.5357 V VTP P-side(average) = 0.4501 V CAL_VREF = 3.0623 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:612 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0111 chi2 = 2.1123 VTN P-side: a = 0.0105 b(slope) = 0.0068 chi2 = 0.6683 CAL_IN N-side: a = 2.5043 b(slope) = 0.0085 chi2 = 0.9082 CAL_IN P-side: a = 2.5041 b(slope) = 0.0085 chi2 = 0.8059 VTP N-side(average) = 0.7231 V CAL_BASE = 2.5073 V VTP P-side(average) = 0.4485 V CAL_VREF = 3.0532 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:512 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0110 chi2 = 2.1242 VTN P-side: a = 0.0096 b(slope) = 0.0067 chi2 = 0.8845 CAL_IN N-side: a = 2.4996 b(slope) = 0.0085 chi2 = 0.6083 CAL_IN P-side: a = 2.4998 b(slope) = 0.0085 chi2 = 0.3829 VTP N-side(average) = 0.7106 V CAL_BASE = 2.5037 V VTP P-side(average) = 0.4388 V CAL_VREF = 3.0483 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:412 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0108 chi2 = 1.1931 VTN P-side: a = 0.0100 b(slope) = 0.0066 chi2 = 1.1841 CAL_IN N-side: a = 2.4801 b(slope) = 0.0086 chi2 = 1.2978 CAL_IN P-side: a = 2.4802 b(slope) = 0.0085 chi2 = 0.5299 VTP N-side(average) = 0.7053 V CAL_BASE = 2.4827 V VTP P-side(average) = 0.4334 V CAL_VREF = 3.0300 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:312 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0108 chi2 = 1.6281 VTN P-side: a = 0.0096 b(slope) = 0.0066 chi2 = 0.7289 CAL_IN N-side: a = 2.4934 b(slope) = 0.0084 chi2 = 0.6071 CAL_IN P-side: a = 2.4936 b(slope) = 0.0083 chi2 = 0.9637 VTP N-side(average) = 0.6993 V CAL_BASE = 2.4954 V VTP P-side(average) = 0.4298 V CAL_VREF = 3.0310 V FUNCT. DIGITAL TEST = 4 error detected in test: FUNCT@5.0V:ATOM18 11337.0 FUNCT@5.0V:ATOM18HF 11337.0 FUNCT@5.0V:ATOM19F 6500.0 FUNCT@5.0V:ATOM19FHF 6500.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:212 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0107 chi2 = 1.1602 VTN P-side: a = 0.0100 b(slope) = 0.0064 chi2 = 0.4946 CAL_IN N-side: a = 2.4969 b(slope) = 0.0083 chi2 = 0.8506 CAL_IN P-side: a = 2.4968 b(slope) = 0.0083 chi2 = 0.5314 VTP N-side(average) = 0.6934 V CAL_BASE = 2.5007 V VTP P-side(average) = 0.4233 V CAL_VREF = 3.0303 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:413 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0109 chi2 = 0.8171 VTN P-side: a = 0.0105 b(slope) = 0.0066 chi2 = 0.2952 CAL_IN N-side: a = 2.4840 b(slope) = 0.0086 chi2 = 0.8533 CAL_IN P-side: a = 2.4840 b(slope) = 0.0086 chi2 = 0.6409 VTP N-side(average) = 0.7073 V CAL_BASE = 2.4917 V VTP P-side(average) = 0.4362 V CAL_VREF = 3.0435 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:513 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0109 chi2 = 0.6853 VTN P-side: a = 0.0094 b(slope) = 0.0066 chi2 = 0.6216 CAL_IN N-side: a = 2.4661 b(slope) = 0.0088 chi2 = 0.7402 CAL_IN P-side: a = 2.4662 b(slope) = 0.0088 chi2 = 0.8092 VTP N-side(average) = 0.7065 V CAL_BASE = 2.4712 V VTP P-side(average) = 0.4336 V CAL_VREF = 3.0334 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:613 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0090 b(slope) = 0.0111 chi2 = 1.1615 VTN P-side: a = 0.0093 b(slope) = 0.0069 chi2 = 0.8035 CAL_IN N-side: a = 2.5036 b(slope) = 0.0085 chi2 = 0.9013 CAL_IN P-side: a = 2.5038 b(slope) = 0.0085 chi2 = 0.2480 VTP N-side(average) = 0.7225 V CAL_BASE = 2.5105 V VTP P-side(average) = 0.4490 V CAL_VREF = 3.0564 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1367.0 FUNCT@5.0V:ATOM13B 1438.0 FUNCT@5.0V:ATOM13C 1438.0 FUNCT@5.0V:ATOM15 1411.0 FUNCT@5.0V:ATOM17 3723.0 FUNCT@5.0V:ATOM18 3739.0 FUNCT@5.0V:ATOM18HF 3739.0 FUNCT@5.0V:ATOM19 3675.0 FUNCT@5.0V:ATOM19D 3690.0 FUNCT@5.0V:ATOM19E 2917.0 FUNCT@5.0V:ATOM19F 6790.0 FUNCT@5.0V:ATOM19FHF 6790.0 FUNCT@5.0V:ATOM20 1383.0 FUNCT@5.0V:ATOM21 1359.0 FUNCT@5.0V:ATOM22 1347.0 FUNCT@5.0V:ATOM25 1365.0 FUNCT@5.0V:ATOM25HF 1365.0 FUNCT@5.0V:ATOM26A 1344.0 FUNCT@5.0V:ATOM26B 2153.0 FUNCT@5.0V:ATOM28 1481.0 FUNCT@5.0V:ATOM29 1481.0 FUNCT@5.0V:ATOM30 1481.0 FUNCT@5.0V:ATOM31A 1115.0 FUNCT@5.0V:ATOM31B 1304.0 FUNCT@5.0V:ATOM32 1115.0 FUNCT@5.0V:ATOM33 1481.0 FUNCT@5.0V:ATOM35 1615.0 FUNCT@5.0V:ATOM36 1371.0 FUNCT@5.0V:ATOM37A 1830.0 FUNCT@5.0V:ATOM37B 1822.0 FUNCT@5.0V:ATOM37C 1806.0 FUNCT@5.0V:ATOM37D 1774.0 FUNCT@5.0V:ATOM37E 1765.0 FUNCT@5.0V:ATOM39 1392.0 FUNCT@5.0V:ATOM41 1918.0 FUNCT@5.0V:ATOM41A 1918.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5550.0 FUNCT@5.0V:ATOM45C_40 5550.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 4277.0 FUNCT@5.0V:ATOM48C_40 5550.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5550.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:614 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1337 IDDSB:VDD1B 0.1309 IDDSB:VDD1C 0.1295 IDDSB:VDD1D 0.1284 IDDOP1:DVDD 0.1566 DACS TEST = 1 VTN N-side: a = 0.2362 b(slope) = 0.0000 chi2 = 0.3799 VTN P-side: a = 0.1488 b(slope) = 0.0000 chi2 = 0.2091 CAL_IN N-side: a = 2.7915 b(slope) = 0.0000 chi2 = 0.4305 CAL_IN P-side: a = 2.7913 b(slope) = 0.0000 chi2 = 0.4544 VTP N-side(average) = 0.7393 V CAL_BASE = 2.5222 V VTP P-side(average) = 0.4575 V CAL_VREF = 3.0730 V FUNCT. DIGITAL TEST = 58 error detected in test: FUNCT@5.0V:ATOM1TO6A 212.0 FUNCT@5.0V:ATOM1TO6B 212.0 FUNCT@5.0V:ATOM1TO6C 212.0 FUNCT@5.0V:ATOM1TO6D 212.0 FUNCT@5.0V:ATOM1TO6E 212.0 FUNCT@5.0V:ATOM7TO9A 212.0 FUNCT@5.0V:ATOM7TO9B 212.0 FUNCT@5.0V:ATOM7TO9C 212.0 FUNCT@5.0V:ATOM7TO9D 212.0 FUNCT@5.0V:ATOM7TO9E 212.0 FUNCT@5.0V:ATOM10TO12 212.0 FUNCT@5.0V:ATOM13A 212.0 FUNCT@5.0V:ATOM13B 212.0 FUNCT@5.0V:ATOM13C 212.0 FUNCT@5.0V:ATOM14 212.0 FUNCT@5.0V:ATOM15 212.0 FUNCT@5.0V:ATOM16 212.0 FUNCT@5.0V:ATOM17 212.0 FUNCT@5.0V:ATOM18 212.0 FUNCT@5.0V:ATOM18HF 212.0 FUNCT@5.0V:ATOM19 212.0 FUNCT@5.0V:ATOM19B 212.0 FUNCT@5.0V:ATOM19C 212.0 FUNCT@5.0V:ATOM19D 212.0 FUNCT@5.0V:ATOM19E 212.0 FUNCT@5.0V:ATOM19F 212.0 FUNCT@5.0V:ATOM19FHF 212.0 FUNCT@5.0V:ATOM20 212.0 FUNCT@5.0V:ATOM21 212.0 FUNCT@5.0V:ATOM22 212.0 FUNCT@5.0V:ATOM23 212.0 FUNCT@5.0V:ATOM24 212.0 FUNCT@5.0V:ATOM25 212.0 FUNCT@5.0V:ATOM25HF 212.0 FUNCT@5.0V:ATOM26A 212.0 FUNCT@5.0V:ATOM26B 212.0 FUNCT@5.0V:ATOM27 212.0 FUNCT@5.0V:ATOM28 212.0 FUNCT@5.0V:ATOM29 212.0 FUNCT@5.0V:ATOM30 212.0 FUNCT@5.0V:ATOM31A 212.0 FUNCT@5.0V:ATOM31B 212.0 FUNCT@5.0V:ATOM32 212.0 FUNCT@5.0V:ATOM33 212.0 FUNCT@5.0V:ATOM34 212.0 FUNCT@5.0V:ATOM35 212.0 FUNCT@5.0V:ATOM36 212.0 FUNCT@5.0V:ATOM37A 212.0 FUNCT@5.0V:ATOM37B 212.0 FUNCT@5.0V:ATOM37C 212.0 FUNCT@5.0V:ATOM37D 212.0 FUNCT@5.0V:ATOM37E 212.0 FUNCT@5.0V:ATOM38 212.0 FUNCT@5.0V:ATOM39 212.0 FUNCT@5.0V:ATOM40 212.0 FUNCT@5.0V:ATOM41 212.0 FUNCT@5.0V:ATOM41A 212.0 FUNCT@5.0V:ATOM42 212.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 212.0 FUNCT@5.0V:ATOM45C_40 212.0 FUNCT@5.0V:ATOM46C_40 212.0 FUNCT@5.0V:ATOM47C_40 212.0 FUNCT@5.0V:ATOM48C_40 212.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 212.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 212.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 212.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 212.0 FUNCT@5.0V:A10TO12HF 212.0 FUNCT@5.0V:ADAC37HF 212.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:514 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0110 b(slope) = 0.0112 chi2 = 0.6687 VTN P-side: a = 0.0107 b(slope) = 0.0068 chi2 = 0.8599 CAL_IN N-side: a = 2.4932 b(slope) = 0.0087 chi2 = 0.7839 CAL_IN P-side: a = 2.4931 b(slope) = 0.0087 chi2 = 0.9738 VTP N-side(average) = 0.7298 V CAL_BASE = 2.5005 V VTP P-side(average) = 0.4465 V CAL_VREF = 3.0588 V FUNCT. DIGITAL TEST = 7 error detected in test: FUNCT@5.0V:ATOM13B 1551.0 FUNCT@5.0V:ATOM13C 1551.0 FUNCT@5.0V:ATOM37A 2054.0 FUNCT@5.0V:ATOM37B 2046.0 FUNCT@5.0V:ATOM37C 2030.0 FUNCT@5.0V:ATOM37D 1998.0 FUNCT@5.0V:ATOM37E 1989.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3892.0 FUNCT@5.0V:ATOM45C_40 3892.0 FUNCT@5.0V:ATOM46C_40 3892.0 FUNCT@5.0V:ATOM47C_40 3892.0 FUNCT@5.0V:ATOM48C_40 3892.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3892.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:414 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0110 chi2 = 1.6798 VTN P-side: a = 0.0098 b(slope) = 0.0067 chi2 = 0.7006 CAL_IN N-side: a = 2.5148 b(slope) = 0.0085 chi2 = 0.5778 CAL_IN P-side: a = 2.5145 b(slope) = 0.0085 chi2 = 0.5569 VTP N-side(average) = 0.7161 V CAL_BASE = 2.5195 V VTP P-side(average) = 0.4412 V CAL_VREF = 3.0630 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 +++++++++ WAFER DATA+++++++++++++++++++++++++++ CLASSES: A-->Good, B-->Probably Good, C-->Bad A B C ------------------------- 203 811 401 503 501 704 601 504 602 205 502 505 402 605 303 705 403 806 603 706 703 406 803 206 804 107 604 207 404 307 304 407 204 507 305 707 405 708 805 608 606 208 506 309 306 409 607 509 807 709 907 809 908 710 808 510 508 410 408 310 308 311 108 411 209 711 609 812 810 712 610 612 210 512 211 412 511 212 611 413 312 513 613 414 614 514 ---------------------------- 42 1 43 NUMBER OF CHIPS TESTED = 86 NUMBER OF CLASS A CHIPS = 42 NUMBER OF CLASS B CHIPS = 1 NUMBER OF CLASS C CHIPS = 43 YIELD = 48.84 %