------- CHIP ID:401 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0087 b(slope) = 0.0112 chi2 = 1.3202 VTN P-side: a = 0.0089 b(slope) = 0.0068 chi2 = 0.5262 CAL_IN N-side: a = 2.4942 b(slope) = 0.0089 chi2 = 0.9212 CAL_IN P-side: a = 2.4938 b(slope) = 0.0089 chi2 = 0.5888 VTP N-side(average) = 0.7237 V CAL_BASE = 2.4971 V VTP P-side(average) = 0.4460 V CAL_VREF = 3.0652 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:501 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0083 b(slope) = 0.0111 chi2 = 1.2118 VTN P-side: a = 0.0083 b(slope) = 0.0067 chi2 = 0.5325 CAL_IN N-side: a = 2.5120 b(slope) = 0.0086 chi2 = 0.6276 CAL_IN P-side: a = 2.5120 b(slope) = 0.0086 chi2 = 0.6369 VTP N-side(average) = 0.7216 V CAL_BASE = 2.5159 V VTP P-side(average) = 0.4408 V CAL_VREF = 3.0647 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:601 --------------------------------------- CLASS=C -------- CONTACTS TEST = 9 error detected in test: CONTACT:202/R8 0.0 CONTACT:138/T6 0.0 CONTACT:142/T7 0.0 CONTACT:293/B12 0.0 CONTACT:49/B13 0.0 CONTACT:45/B6 0.0 CONTACT:33/B7 0.0 CONTACT:10/T4 0.0 CONTACT:14/T5 0.0 POWER-ON TEST = 0 ANALOG TEST = 34 error detected in test: IDDSB:VDD0A 0.0000 IDDSB:VDD1A 0.0000 IDDSB:VDD0B 0.0000 IDDSB:VDD1B 0.0000 IDDSB:VDD0C 0.0000 IDDSB:VDD1C 0.0000 IDDSB:VDD0D 0.0000 IDDSB:VDD1D 0.0000 V_AVDD2IPA:249/L9 0.0000 V_AVDD2IMA:277/L10 0.0000 AVDD_A:AVDDP-M 0.0000 IAVDD2_A:AVDDP-M 0.0000 V_V1RA:169/L5 0.0000 V_N310A:171/L6 0.0000 V_AVDD2IPB:249/L9 0.0000 V_AVDD2IMB:277/L10 0.0000 AVDD_B:AVDDP-M 0.0000 IAVDD2_B:AVDDP-M 0.0000 V_V1RB:169/L5 0.0000 V_N310B:171/L6 0.0000 V_AVDD2IPC:249/L9 0.0000 V_AVDD2IMC:277/L10 0.0000 AVDD_C:AVDDP-M 0.0000 IAVDD2_C:AVDDP-M 0.0000 V_V1RC:169/L5 0.0000 V_N310C:171/L6 0.0000 V_AVDD2IPD:249/L9 0.0000 V_AVDD2IMD:277/L10 0.0000 AVDD_D:AVDDP-M 0.0000 IAVDD2_D:AVDDP-M 0.0000 V_V1RD:169/L5 0.0000 V_N310D:171/L6 0.0000 IDDOP0:AVDD 0.0000 IDDOP1:DVDD 0.0000 DACS TEST = 1 VTN N-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN N-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side(average) = 0.0000 V CAL_BASE = 0.0000 V VTP P-side(average) = 0.0000 V CAL_VREF = 0.0000 V FUNCT. DIGITAL TEST = 58 error detected in test: FUNCT@5.0V:ATOM1TO6A 0.0 FUNCT@5.0V:ATOM1TO6B 0.0 FUNCT@5.0V:ATOM1TO6C 0.0 FUNCT@5.0V:ATOM1TO6D 0.0 FUNCT@5.0V:ATOM1TO6E 0.0 FUNCT@5.0V:ATOM7TO9A 0.0 FUNCT@5.0V:ATOM7TO9B 0.0 FUNCT@5.0V:ATOM7TO9C 0.0 FUNCT@5.0V:ATOM7TO9D 0.0 FUNCT@5.0V:ATOM7TO9E 0.0 FUNCT@5.0V:ATOM10TO12 0.0 FUNCT@5.0V:ATOM13A 0.0 FUNCT@5.0V:ATOM13B 0.0 FUNCT@5.0V:ATOM13C 0.0 FUNCT@5.0V:ATOM14 0.0 FUNCT@5.0V:ATOM15 0.0 FUNCT@5.0V:ATOM16 0.0 FUNCT@5.0V:ATOM17 0.0 FUNCT@5.0V:ATOM18 0.0 FUNCT@5.0V:ATOM18HF 0.0 FUNCT@5.0V:ATOM19 0.0 FUNCT@5.0V:ATOM19B 0.0 FUNCT@5.0V:ATOM19C 0.0 FUNCT@5.0V:ATOM19D 0.0 FUNCT@5.0V:ATOM19E 0.0 FUNCT@5.0V:ATOM19F 0.0 FUNCT@5.0V:ATOM19FHF 0.0 FUNCT@5.0V:ATOM20 0.0 FUNCT@5.0V:ATOM21 0.0 FUNCT@5.0V:ATOM22 0.0 FUNCT@5.0V:ATOM23 0.0 FUNCT@5.0V:ATOM24 0.0 FUNCT@5.0V:ATOM25 0.0 FUNCT@5.0V:ATOM25HF 0.0 FUNCT@5.0V:ATOM26A 0.0 FUNCT@5.0V:ATOM26B 0.0 FUNCT@5.0V:ATOM27 0.0 FUNCT@5.0V:ATOM28 0.0 FUNCT@5.0V:ATOM29 0.0 FUNCT@5.0V:ATOM30 0.0 FUNCT@5.0V:ATOM31A 0.0 FUNCT@5.0V:ATOM31B 0.0 FUNCT@5.0V:ATOM32 0.0 FUNCT@5.0V:ATOM33 0.0 FUNCT@5.0V:ATOM34 0.0 FUNCT@5.0V:ATOM35 0.0 FUNCT@5.0V:ATOM36 0.0 FUNCT@5.0V:ATOM37A 0.0 FUNCT@5.0V:ATOM37B 0.0 FUNCT@5.0V:ATOM37C 0.0 FUNCT@5.0V:ATOM37D 0.0 FUNCT@5.0V:ATOM37E 0.0 FUNCT@5.0V:ATOM38 0.0 FUNCT@5.0V:ATOM39 0.0 FUNCT@5.0V:ATOM40 0.0 FUNCT@5.0V:ATOM41 0.0 FUNCT@5.0V:ATOM41A 0.0 FUNCT@5.0V:ATOM42 0.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 0.0 FUNCT@5.0V:ATOM45C_40 0.0 FUNCT@5.0V:ATOM46C_40 0.0 FUNCT@5.0V:ATOM47C_40 0.0 FUNCT@5.0V:ATOM48C_40 0.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 0.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 0.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 0.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 0.0 FUNCT@5.0V:A10TO12HF 0.0 FUNCT@5.0V:ADAC37HF 0.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:602 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0085 b(slope) = 0.0108 chi2 = 3.8577 VTN P-side: a = 0.0090 b(slope) = 0.0066 chi2 = 1.2520 CAL_IN N-side: a = 2.4979 b(slope) = 0.0086 chi2 = 1.0323 CAL_IN P-side: a = 2.4976 b(slope) = 0.0086 chi2 = 1.1254 VTP N-side(average) = 0.6999 V CAL_BASE = 2.5024 V VTP P-side(average) = 0.4293 V CAL_VREF = 3.0520 V FUNCT. DIGITAL TEST = 3 error detected in test: FUNCT@5.0V:ATOM18 11320.0 FUNCT@5.0V:ATOM18HF 11320.0 FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3937.0 FUNCT@5.0V:ATOM45C_40 3937.0 FUNCT@5.0V:ATOM46C_40 3665.0 FUNCT@5.0V:ATOM47C_40 3665.0 FUNCT@5.0V:ATOM48C_40 3937.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3937.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1243.0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:502 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0084 b(slope) = 0.0110 chi2 = 2.8959 VTN P-side: a = 0.0091 b(slope) = 0.0067 chi2 = 0.9506 CAL_IN N-side: a = 2.5073 b(slope) = 0.0085 chi2 = 1.5091 CAL_IN P-side: a = 2.5071 b(slope) = 0.0085 chi2 = 4.3038 VTP N-side(average) = 0.7137 V CAL_BASE = 2.5132 V VTP P-side(average) = 0.4381 V CAL_VREF = 3.0588 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:402 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0110 chi2 = 0.9119 VTN P-side: a = 0.0097 b(slope) = 0.0067 chi2 = 0.4822 CAL_IN N-side: a = 2.4590 b(slope) = 0.0089 chi2 = 1.3392 CAL_IN P-side: a = 2.4590 b(slope) = 0.0089 chi2 = 1.2218 VTP N-side(average) = 0.7122 V CAL_BASE = 2.4590 V VTP P-side(average) = 0.4379 V CAL_VREF = 3.0315 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:203 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0107 chi2 = 0.7439 VTN P-side: a = 0.0100 b(slope) = 0.0065 chi2 = 0.2720 CAL_IN N-side: a = 2.4930 b(slope) = 0.0085 chi2 = 1.3213 CAL_IN P-side: a = 2.4928 b(slope) = 0.0085 chi2 = 6.1032 VTP N-side(average) = 0.6933 V CAL_BASE = 2.4980 V VTP P-side(average) = 0.4272 V CAL_VREF = 3.0449 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:303 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0108 chi2 = 1.9907 VTN P-side: a = 0.0102 b(slope) = 0.0066 chi2 = 0.4467 CAL_IN N-side: a = 2.4939 b(slope) = 0.0085 chi2 = 0.5604 CAL_IN P-side: a = 2.4942 b(slope) = 0.0085 chi2 = 0.6718 VTP N-side(average) = 0.7012 V CAL_BASE = 2.4963 V VTP P-side(average) = 0.4329 V CAL_VREF = 3.0437 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM47C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:403 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0110 chi2 = 2.3777 VTN P-side: a = 0.0106 b(slope) = 0.0067 chi2 = 0.9122 CAL_IN N-side: a = 2.4601 b(slope) = 0.0089 chi2 = 1.4475 CAL_IN P-side: a = 2.4603 b(slope) = 0.0089 chi2 = 1.0251 VTP N-side(average) = 0.7145 V CAL_BASE = 2.4600 V VTP P-side(average) = 0.4385 V CAL_VREF = 3.0327 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:503 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0110 chi2 = 3.5024 VTN P-side: a = 0.0101 b(slope) = 0.0067 chi2 = 1.0372 CAL_IN N-side: a = 2.4779 b(slope) = 0.0087 chi2 = 1.1495 CAL_IN P-side: a = 2.4778 b(slope) = 0.0087 chi2 = 1.0159 VTP N-side(average) = 0.7133 V CAL_BASE = 2.4824 V VTP P-side(average) = 0.4405 V CAL_VREF = 3.0422 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:603 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0106 chi2 = 2.0399 VTN P-side: a = 0.0105 b(slope) = 0.0065 chi2 = 0.6055 CAL_IN N-side: a = 2.4729 b(slope) = 0.0086 chi2 = 0.6299 CAL_IN P-side: a = 2.4729 b(slope) = 0.0086 chi2 = 0.4454 VTP N-side(average) = 0.6932 V CAL_BASE = 2.4736 V VTP P-side(average) = 0.4263 V CAL_VREF = 3.0220 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:703 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0112 b(slope) = 0.0107 chi2 = 1.9162 VTN P-side: a = 0.0113 b(slope) = 0.0065 chi2 = 1.0481 CAL_IN N-side: a = 2.4879 b(slope) = 0.0085 chi2 = 0.6530 CAL_IN P-side: a = 2.4876 b(slope) = 0.0085 chi2 = 0.5861 VTP N-side(average) = 0.6984 V CAL_BASE = 2.4910 V VTP P-side(average) = 0.4311 V CAL_VREF = 3.0366 V FUNCT. DIGITAL TEST = 2 error detected in test: FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM36 2995.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:803 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0109 chi2 = 1.6089 VTN P-side: a = 0.0107 b(slope) = 0.0068 chi2 = 1.2593 CAL_IN N-side: a = 2.4937 b(slope) = 0.0085 chi2 = 0.5837 CAL_IN P-side: a = 2.4939 b(slope) = 0.0085 chi2 = 0.5973 VTP N-side(average) = 0.7120 V CAL_BASE = 2.4963 V VTP P-side(average) = 0.4450 V CAL_VREF = 3.0422 V FUNCT. DIGITAL TEST = 12 error detected in test: FUNCT@5.0V:ATOM17 5458.0 FUNCT@5.0V:ATOM18 5476.0 FUNCT@5.0V:ATOM18HF 5476.0 FUNCT@5.0V:ATOM19 5410.0 FUNCT@5.0V:ATOM20 2034.0 FUNCT@5.0V:ATOM21 2010.0 FUNCT@5.0V:ATOM22 1998.0 FUNCT@5.0V:ATOM25 1984.0 FUNCT@5.0V:ATOM25HF 1984.0 FUNCT@5.0V:ATOM26A 1959.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM37E 2992.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:804 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0110 chi2 = 0.8861 VTN P-side: a = 0.0098 b(slope) = 0.0068 chi2 = 0.3567 CAL_IN N-side: a = 2.4866 b(slope) = 0.0086 chi2 = 1.7712 CAL_IN P-side: a = 2.4867 b(slope) = 0.0086 chi2 = 1.5253 VTP N-side(average) = 0.7127 V CAL_BASE = 2.4871 V VTP P-side(average) = 0.4445 V CAL_VREF = 3.0388 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:704 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0084 b(slope) = 0.0108 chi2 = 1.7114 VTN P-side: a = 0.0088 b(slope) = 0.0066 chi2 = 1.0063 CAL_IN N-side: a = 2.4982 b(slope) = 0.0084 chi2 = 1.1632 CAL_IN P-side: a = 2.4981 b(slope) = 0.0084 chi2 = 1.1105 VTP N-side(average) = 0.7017 V CAL_BASE = 2.5015 V VTP P-side(average) = 0.4339 V CAL_VREF = 3.0413 V FUNCT. DIGITAL TEST = 2 error detected in test: FUNCT@5.0V:ATOM18 11336.0 FUNCT@5.0V:ATOM18HF 11336.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3937.0 FUNCT@5.0V:ATOM45C_40 3937.0 FUNCT@5.0V:ATOM46C_40 3937.0 FUNCT@5.0V:ATOM47C_40 3937.0 FUNCT@5.0V:ATOM48C_40 3937.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3937.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1243.0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:604 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0080 b(slope) = 0.0107 chi2 = 1.7882 VTN P-side: a = 0.0087 b(slope) = 0.0065 chi2 = 0.7331 CAL_IN N-side: a = 2.4896 b(slope) = 0.0084 chi2 = 0.4650 CAL_IN P-side: a = 2.4896 b(slope) = 0.0084 chi2 = 0.4319 VTP N-side(average) = 0.6926 V CAL_BASE = 2.4900 V VTP P-side(average) = 0.4272 V CAL_VREF = 3.0298 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:504 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1020 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0108 chi2 = 1.0032 VTN P-side: a = 0.0093 b(slope) = 0.0066 chi2 = 0.5001 CAL_IN N-side: a = 2.5127 b(slope) = 0.0084 chi2 = 0.5142 CAL_IN P-side: a = 2.5127 b(slope) = 0.0084 chi2 = 0.5029 VTP N-side(average) = 0.7036 V CAL_BASE = 2.5188 V VTP P-side(average) = 0.4339 V CAL_VREF = 3.0552 V FUNCT. DIGITAL TEST = 29 error detected in test: FUNCT@5.0V:ATOM13A 1053.0 FUNCT@5.0V:ATOM17 3409.0 FUNCT@5.0V:ATOM18 3425.0 FUNCT@5.0V:ATOM18HF 3425.0 FUNCT@5.0V:ATOM19 3361.0 FUNCT@5.0V:ATOM19D 3376.0 FUNCT@5.0V:ATOM19E 2603.0 FUNCT@5.0V:ATOM19F 6476.0 FUNCT@5.0V:ATOM19FHF 6476.0 FUNCT@5.0V:ATOM20 1069.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM25 1051.0 FUNCT@5.0V:ATOM25HF 1051.0 FUNCT@5.0V:ATOM26A 1030.0 FUNCT@5.0V:ATOM28 1167.0 FUNCT@5.0V:ATOM29 1167.0 FUNCT@5.0V:ATOM30 1167.0 FUNCT@5.0V:ATOM31A 801.0 FUNCT@5.0V:ATOM31B 990.0 FUNCT@5.0V:ATOM32 801.0 FUNCT@5.0V:ATOM33 1167.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM36 1057.0 FUNCT@5.0V:ATOM37A 1197.0 FUNCT@5.0V:ATOM37B 1206.0 FUNCT@5.0V:ATOM37D 1160.0 FUNCT@5.0V:ATOM37E 1151.0 FUNCT@5.0V:ATOM39 1078.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3662.0 FUNCT@5.0V:ATOM45C_40 3662.0 FUNCT@5.0V:ATOM46C_40 3662.0 FUNCT@5.0V:ATOM47C_40 3662.0 FUNCT@5.0V:ATOM48C_40 3662.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3662.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1233.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1392.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:404 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0089 b(slope) = 0.0110 chi2 = 0.5895 VTN P-side: a = 0.0091 b(slope) = 0.0067 chi2 = 0.4385 CAL_IN N-side: a = 2.4766 b(slope) = 0.0087 chi2 = 0.5925 CAL_IN P-side: a = 2.4763 b(slope) = 0.0087 chi2 = 0.5782 VTP N-side(average) = 0.7148 V CAL_BASE = 2.4815 V VTP P-side(average) = 0.4389 V CAL_VREF = 3.0398 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:304 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0087 b(slope) = 0.0107 chi2 = 1.6146 VTN P-side: a = 0.0091 b(slope) = 0.0066 chi2 = 0.3910 CAL_IN N-side: a = 2.4766 b(slope) = 0.0087 chi2 = 0.8497 CAL_IN P-side: a = 2.4767 b(slope) = 0.0087 chi2 = 1.4715 VTP N-side(average) = 0.6970 V CAL_BASE = 2.4788 V VTP P-side(average) = 0.4304 V CAL_VREF = 3.0342 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:204 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0087 b(slope) = 0.0108 chi2 = 1.3899 VTN P-side: a = 0.0091 b(slope) = 0.0066 chi2 = 0.3200 CAL_IN N-side: a = 2.4939 b(slope) = 0.0085 chi2 = 0.9911 CAL_IN P-side: a = 2.4941 b(slope) = 0.0084 chi2 = 0.8586 VTP N-side(average) = 0.7008 V CAL_BASE = 2.4968 V VTP P-side(average) = 0.4321 V CAL_VREF = 3.0391 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:205 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0213 b(slope) = 0.0105 chi2 = 99.0000 VTN P-side: a = 0.0091 b(slope) = 0.0066 chi2 = 0.2773 CAL_IN N-side: a = 2.4992 b(slope) = 0.0082 chi2 = 99.0000 CAL_IN P-side: a = 2.4834 b(slope) = 0.0086 chi2 = 0.9207 VTP N-side(average) = 0.6982 V CAL_BASE = 2.4858 V VTP P-side(average) = 0.4298 V CAL_VREF = 3.0359 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:305 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0088 b(slope) = 0.0107 chi2 = 1.5633 VTN P-side: a = 0.0092 b(slope) = 0.0065 chi2 = 0.9434 CAL_IN N-side: a = 2.4862 b(slope) = 0.0085 chi2 = 0.6115 CAL_IN P-side: a = 2.4863 b(slope) = 0.0085 chi2 = 0.4448 VTP N-side(average) = 0.6975 V CAL_BASE = 2.4915 V VTP P-side(average) = 0.4263 V CAL_VREF = 3.0334 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:405 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0092 b(slope) = 0.0109 chi2 = 0.9154 VTN P-side: a = 0.0095 b(slope) = 0.0066 chi2 = 0.3305 CAL_IN N-side: a = 2.4588 b(slope) = 0.0087 chi2 = 3.3090 CAL_IN P-side: a = 2.4583 b(slope) = 0.0087 chi2 = 3.6401 VTP N-side(average) = 0.7060 V CAL_BASE = 2.4629 V VTP P-side(average) = 0.4329 V CAL_VREF = 3.0229 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:505 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0108 chi2 = 1.0689 VTN P-side: a = 0.0096 b(slope) = 0.0066 chi2 = 0.6030 CAL_IN N-side: a = 2.4692 b(slope) = 0.0089 chi2 = 0.6417 CAL_IN P-side: a = 2.4690 b(slope) = 0.0089 chi2 = 0.8347 VTP N-side(average) = 0.7008 V CAL_BASE = 2.4714 V VTP P-side(average) = 0.4335 V CAL_VREF = 3.0378 V FUNCT. DIGITAL TEST = 39 error detected in test: FUNCT@5.0V:ATOM13A 1343.0 FUNCT@5.0V:ATOM13B 1406.0 FUNCT@5.0V:ATOM13C 1406.0 FUNCT@5.0V:ATOM15 1390.0 FUNCT@5.0V:ATOM17 3699.0 FUNCT@5.0V:ATOM18 3715.0 FUNCT@5.0V:ATOM18HF 3715.0 FUNCT@5.0V:ATOM19 3651.0 FUNCT@5.0V:ATOM19D 3666.0 FUNCT@5.0V:ATOM19E 2893.0 FUNCT@5.0V:ATOM19F 6766.0 FUNCT@5.0V:ATOM19FHF 6766.0 FUNCT@5.0V:ATOM20 1362.0 FUNCT@5.0V:ATOM21 1334.0 FUNCT@5.0V:ATOM22 1324.0 FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM24 1074.0 FUNCT@5.0V:ATOM25 1341.0 FUNCT@5.0V:ATOM25HF 1341.0 FUNCT@5.0V:ATOM26A 1320.0 FUNCT@5.0V:ATOM26B 2133.0 FUNCT@5.0V:ATOM28 1457.0 FUNCT@5.0V:ATOM29 1457.0 FUNCT@5.0V:ATOM30 1457.0 FUNCT@5.0V:ATOM31A 1090.0 FUNCT@5.0V:ATOM31B 1280.0 FUNCT@5.0V:ATOM32 1090.0 FUNCT@5.0V:ATOM33 1457.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1590.0 FUNCT@5.0V:ATOM36 1346.0 FUNCT@5.0V:ATOM37A 1779.0 FUNCT@5.0V:ATOM37B 1770.0 FUNCT@5.0V:ATOM37C 1754.0 FUNCT@5.0V:ATOM37D 1719.0 FUNCT@5.0V:ATOM37E 1712.0 FUNCT@5.0V:ATOM39 1368.0 FUNCT@5.0V:ATOM41 1894.0 FUNCT@5.0V:ATOM41A 1894.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3809.0 FUNCT@5.0V:ATOM45C_40 3809.0 FUNCT@5.0V:ATOM46C_40 3667.0 FUNCT@5.0V:ATOM47C_40 3809.0 FUNCT@5.0V:ATOM48C_40 3809.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3809.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1243.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:605 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0078 b(slope) = 0.0107 chi2 = 2.6665 VTN P-side: a = 0.0086 b(slope) = 0.0065 chi2 = 1.6423 CAL_IN N-side: a = 2.4727 b(slope) = 0.0085 chi2 = 0.8593 CAL_IN P-side: a = 2.4726 b(slope) = 0.0085 chi2 = 1.0811 VTP N-side(average) = 0.6958 V CAL_BASE = 2.4746 V VTP P-side(average) = 0.4277 V CAL_VREF = 3.0168 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:705 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0087 b(slope) = 0.0106 chi2 = 1.5802 VTN P-side: a = 0.0091 b(slope) = 0.0065 chi2 = 0.7905 CAL_IN N-side: a = 2.5207 b(slope) = 0.0082 chi2 = 0.7145 CAL_IN P-side: a = 2.5206 b(slope) = 0.0082 chi2 = 1.0661 VTP N-side(average) = 0.6909 V CAL_BASE = 2.5212 V VTP P-side(average) = 0.4274 V CAL_VREF = 3.0469 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:805 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0092 b(slope) = 0.0107 chi2 = 1.1644 VTN P-side: a = 0.0094 b(slope) = 0.0065 chi2 = 0.7693 CAL_IN N-side: a = 2.4694 b(slope) = 0.0086 chi2 = 0.6713 CAL_IN P-side: a = 2.4695 b(slope) = 0.0086 chi2 = 0.4646 VTP N-side(average) = 0.6923 V CAL_BASE = 2.4714 V VTP P-side(average) = 0.4286 V CAL_VREF = 3.0208 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:806 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0087 b(slope) = 0.0108 chi2 = 2.5894 VTN P-side: a = 0.0094 b(slope) = 0.0067 chi2 = 1.1061 CAL_IN N-side: a = 2.5078 b(slope) = 0.0083 chi2 = 0.5591 CAL_IN P-side: a = 2.5078 b(slope) = 0.0083 chi2 = 0.7133 VTP N-side(average) = 0.7020 V CAL_BASE = 2.5083 V VTP P-side(average) = 0.4398 V CAL_VREF = 3.0427 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:706 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0089 b(slope) = 0.0107 chi2 = 1.3656 VTN P-side: a = 0.0093 b(slope) = 0.0065 chi2 = 0.5131 CAL_IN N-side: a = 2.4615 b(slope) = 0.0087 chi2 = 1.4368 CAL_IN P-side: a = 2.4611 b(slope) = 0.0087 chi2 = 1.6730 VTP N-side(average) = 0.6943 V CAL_BASE = 2.4639 V VTP P-side(average) = 0.4285 V CAL_VREF = 3.0212 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:606 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0092 b(slope) = 0.0104 chi2 = 0.6592 VTN P-side: a = 0.0092 b(slope) = 0.0063 chi2 = 0.3907 CAL_IN N-side: a = 2.4706 b(slope) = 0.0084 chi2 = 0.7507 CAL_IN P-side: a = 2.4705 b(slope) = 0.0084 chi2 = 0.8468 VTP N-side(average) = 0.6756 V CAL_BASE = 2.4744 V VTP P-side(average) = 0.4154 V CAL_VREF = 3.0115 V FUNCT. DIGITAL TEST = 35 error detected in test: FUNCT@5.0V:ATOM13A 1959.0 FUNCT@5.0V:ATOM15 2003.0 FUNCT@5.0V:ATOM17 4315.0 FUNCT@5.0V:ATOM18 4331.0 FUNCT@5.0V:ATOM18HF 4331.0 FUNCT@5.0V:ATOM19 4267.0 FUNCT@5.0V:ATOM19D 4282.0 FUNCT@5.0V:ATOM19E 3509.0 FUNCT@5.0V:ATOM19F 7382.0 FUNCT@5.0V:ATOM19FHF 7382.0 FUNCT@5.0V:ATOM20 1975.0 FUNCT@5.0V:ATOM21 1951.0 FUNCT@5.0V:ATOM22 1939.0 FUNCT@5.0V:ATOM25 1957.0 FUNCT@5.0V:ATOM25HF 1957.0 FUNCT@5.0V:ATOM26A 1936.0 FUNCT@5.0V:ATOM26B 2745.0 FUNCT@5.0V:ATOM28 2073.0 FUNCT@5.0V:ATOM29 2073.0 FUNCT@5.0V:ATOM30 2073.0 FUNCT@5.0V:ATOM31A 1707.0 FUNCT@5.0V:ATOM31B 1896.0 FUNCT@5.0V:ATOM32 1707.0 FUNCT@5.0V:ATOM33 2073.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 2207.0 FUNCT@5.0V:ATOM36 1963.0 FUNCT@5.0V:ATOM37A 3014.0 FUNCT@5.0V:ATOM37B 3006.0 FUNCT@5.0V:ATOM37C 2990.0 FUNCT@5.0V:ATOM37D 2958.0 FUNCT@5.0V:ATOM37E 2949.0 FUNCT@5.0V:ATOM39 1984.0 FUNCT@5.0V:ATOM41 2510.0 FUNCT@5.0V:ATOM41A 2510.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4727.0 FUNCT@5.0V:ATOM45C_40 4727.0 FUNCT@5.0V:ATOM46C_40 4727.0 FUNCT@5.0V:ATOM47C_40 4727.0 FUNCT@5.0V:ATOM48C_40 4727.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4727.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:506 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0109 chi2 = 0.8681 VTN P-side: a = 0.0095 b(slope) = 0.0066 chi2 = 0.5281 CAL_IN N-side: a = 2.5084 b(slope) = 0.0086 chi2 = 0.9077 CAL_IN P-side: a = 2.5084 b(slope) = 0.0086 chi2 = 0.3768 VTP N-side(average) = 0.7081 V CAL_BASE = 2.5098 V VTP P-side(average) = 0.4356 V CAL_VREF = 3.0588 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3955.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3955.0 FUNCT@5.0V:ATOM47C_40 3955.0 FUNCT@5.0V:ATOM48C_40 3955.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3955.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:406 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0084 b(slope) = 0.0108 chi2 = 2.6592 VTN P-side: a = 0.0093 b(slope) = 0.0066 chi2 = 0.7612 CAL_IN N-side: a = 2.4700 b(slope) = 0.0087 chi2 = 0.6163 CAL_IN P-side: a = 2.4698 b(slope) = 0.0087 chi2 = 0.6784 VTP N-side(average) = 0.7005 V CAL_BASE = 2.4746 V VTP P-side(average) = 0.4315 V CAL_VREF = 3.0293 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:306 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0108 chi2 = 1.8362 VTN P-side: a = 0.0094 b(slope) = 0.0065 chi2 = 0.4453 CAL_IN N-side: a = 2.4754 b(slope) = 0.0086 chi2 = 0.8285 CAL_IN P-side: a = 2.4761 b(slope) = 0.0087 chi2 = 1.7944 VTP N-side(average) = 0.7010 V CAL_BASE = 2.4751 V VTP P-side(average) = 0.4291 V CAL_VREF = 3.0259 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:206 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0107 chi2 = 0.8141 VTN P-side: a = 0.0096 b(slope) = 0.0065 chi2 = 0.5069 CAL_IN N-side: a = 2.5077 b(slope) = 0.0083 chi2 = 0.6670 CAL_IN P-side: a = 2.5078 b(slope) = 0.0083 chi2 = 0.6272 VTP N-side(average) = 0.6934 V CAL_BASE = 2.5117 V VTP P-side(average) = 0.4243 V CAL_VREF = 3.0415 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:107 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0105 chi2 = 0.8526 VTN P-side: a = 0.0099 b(slope) = 0.0064 chi2 = 0.3950 CAL_IN N-side: a = 2.4937 b(slope) = 0.0084 chi2 = 0.8295 CAL_IN P-side: a = 2.4938 b(slope) = 0.0084 chi2 = 0.5639 VTP N-side(average) = 0.6798 V CAL_BASE = 2.4971 V VTP P-side(average) = 0.4188 V CAL_VREF = 3.0364 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:207 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0107 chi2 = 0.6038 VTN P-side: a = 0.0096 b(slope) = 0.0065 chi2 = 0.6234 CAL_IN N-side: a = 2.4893 b(slope) = 0.0084 chi2 = 0.6370 CAL_IN P-side: a = 2.4895 b(slope) = 0.0084 chi2 = 2.0354 VTP N-side(average) = 0.6933 V CAL_BASE = 2.4912 V VTP P-side(average) = 0.4258 V CAL_VREF = 3.0332 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:307 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0107 chi2 = 1.4376 VTN P-side: a = 0.0096 b(slope) = 0.0065 chi2 = 0.5674 CAL_IN N-side: a = 2.4784 b(slope) = 0.0085 chi2 = 0.7540 CAL_IN P-side: a = 2.4786 b(slope) = 0.0085 chi2 = 0.8388 VTP N-side(average) = 0.6942 V CAL_BASE = 2.4824 V VTP P-side(average) = 0.4281 V CAL_VREF = 3.0286 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:407 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0220 b(slope) = 0.0104 chi2 = 99.0000 VTN P-side: a = 0.0096 b(slope) = 0.0065 chi2 = 0.5719 CAL_IN N-side: a = 2.4737 b(slope) = 0.0083 chi2 = 99.0000 CAL_IN P-side: a = 2.4579 b(slope) = 0.0087 chi2 = 0.9846 VTP N-side(average) = 0.6941 V CAL_BASE = 2.4609 V VTP P-side(average) = 0.4253 V CAL_VREF = 3.0176 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:507 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0107 chi2 = 0.7812 VTN P-side: a = 0.0102 b(slope) = 0.0065 chi2 = 0.3444 CAL_IN N-side: a = 2.5031 b(slope) = 0.0085 chi2 = 0.6944 CAL_IN P-side: a = 2.5032 b(slope) = 0.0084 chi2 = 2.2719 VTP N-side(average) = 0.6951 V CAL_BASE = 2.5073 V VTP P-side(average) = 0.4279 V CAL_VREF = 3.0520 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:607 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0095 b(slope) = 0.0105 chi2 = 1.8483 VTN P-side: a = 0.0099 b(slope) = 0.0064 chi2 = 0.6555 CAL_IN N-side: a = 2.4494 b(slope) = 0.0130 chi2 = 99.0000 CAL_IN P-side: a = 2.4504 b(slope) = 0.0114 chi2 = 99.0000 VTP N-side(average) = 0.6820 V CAL_BASE = 2.4382 V VTP P-side(average) = 0.4214 V CAL_VREF = 2.9980 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:707 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0113 b(slope) = 0.0106 chi2 = 0.9075 VTN P-side: a = 0.0113 b(slope) = 0.0065 chi2 = 0.5927 CAL_IN N-side: a = 2.4977 b(slope) = 0.0084 chi2 = 0.8830 CAL_IN P-side: a = 2.4975 b(slope) = 0.0084 chi2 = 0.6855 VTP N-side(average) = 0.6907 V CAL_BASE = 2.5024 V VTP P-side(average) = 0.4283 V CAL_VREF = 3.0381 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:807 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0109 chi2 = 1.9432 VTN P-side: a = 0.0100 b(slope) = 0.0067 chi2 = 0.4099 CAL_IN N-side: a = 2.5046 b(slope) = 0.0083 chi2 = 0.8452 CAL_IN P-side: a = 2.5045 b(slope) = 0.0083 chi2 = 0.9516 VTP N-side(average) = 0.7121 V CAL_BASE = 2.5068 V VTP P-side(average) = 0.4422 V CAL_VREF = 3.0405 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:907 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0109 chi2 = 1.1154 VTN P-side: a = 0.0100 b(slope) = 0.0067 chi2 = 1.0528 CAL_IN N-side: a = 2.4894 b(slope) = 0.0084 chi2 = 1.2170 CAL_IN P-side: a = 2.4893 b(slope) = 0.0084 chi2 = 2.9939 VTP N-side(average) = 0.7093 V CAL_BASE = 2.4917 V VTP P-side(average) = 0.4408 V CAL_VREF = 3.0303 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:908 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0109 chi2 = 1.8875 VTN P-side: a = 0.0101 b(slope) = 0.0067 chi2 = 0.5477 CAL_IN N-side: a = 2.5053 b(slope) = 0.0083 chi2 = 0.5600 CAL_IN P-side: a = 2.5051 b(slope) = 0.0083 chi2 = 0.4718 VTP N-side(average) = 0.7077 V CAL_BASE = 2.5054 V VTP P-side(average) = 0.4398 V CAL_VREF = 3.0398 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:808 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0225 b(slope) = 0.0106 chi2 = 99.0000 VTN P-side: a = 0.0097 b(slope) = 0.0067 chi2 = 0.4173 CAL_IN N-side: a = 2.5154 b(slope) = 0.0080 chi2 = 99.0000 CAL_IN P-side: a = 2.4995 b(slope) = 0.0084 chi2 = 1.7352 VTP N-side(average) = 0.7094 V CAL_BASE = 2.5017 V VTP P-side(average) = 0.4398 V CAL_VREF = 3.0369 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:708 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0108 chi2 = 0.8506 VTN P-side: a = 0.0097 b(slope) = 0.0066 chi2 = 0.3182 CAL_IN N-side: a = 2.4854 b(slope) = 0.0084 chi2 = 0.5371 CAL_IN P-side: a = 2.4855 b(slope) = 0.0084 chi2 = 0.4343 VTP N-side(average) = 0.7016 V CAL_BASE = 2.4883 V VTP P-side(average) = 0.4356 V CAL_VREF = 3.0293 V FUNCT. DIGITAL TEST = 5 error detected in test: FUNCT@5.0V:ATOM13B 1307.0 FUNCT@5.0V:ATOM13C 1307.0 FUNCT@5.0V:ATOM37B 1562.0 FUNCT@5.0V:ATOM37C 1546.0 FUNCT@5.0V:ATOM37E 1505.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:608 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0087 b(slope) = 0.0106 chi2 = 1.4257 VTN P-side: a = 0.0090 b(slope) = 0.0065 chi2 = 0.7639 CAL_IN N-side: a = 2.4890 b(slope) = 0.0083 chi2 = 0.5760 CAL_IN P-side: a = 2.4890 b(slope) = 0.0082 chi2 = 0.7193 VTP N-side(average) = 0.6880 V CAL_BASE = 2.4900 V VTP P-side(average) = 0.4256 V CAL_VREF = 3.0190 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4535.0 FUNCT@5.0V:ATOM45C_40 4535.0 FUNCT@5.0V:ATOM46C_40 4535.0 FUNCT@5.0V:ATOM47C_40 4535.0 FUNCT@5.0V:ATOM48C_40 4535.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4535.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:508 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0108 chi2 = 0.7973 VTN P-side: a = 0.0096 b(slope) = 0.0066 chi2 = 0.4446 CAL_IN N-side: a = 2.5285 b(slope) = 0.0083 chi2 = 0.9156 CAL_IN P-side: a = 2.5283 b(slope) = 0.0083 chi2 = 1.4886 VTP N-side(average) = 0.6993 V CAL_BASE = 2.5312 V VTP P-side(average) = 0.4314 V CAL_VREF = 3.0630 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:408 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0108 chi2 = 0.9293 VTN P-side: a = 0.0095 b(slope) = 0.0066 chi2 = 0.4171 CAL_IN N-side: a = 2.4867 b(slope) = 0.0085 chi2 = 0.5451 CAL_IN P-side: a = 2.4868 b(slope) = 0.0085 chi2 = 0.5648 VTP N-side(average) = 0.6988 V CAL_BASE = 2.4897 V VTP P-side(average) = 0.4315 V CAL_VREF = 3.0357 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:308 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0092 b(slope) = 0.0109 chi2 = 1.4555 VTN P-side: a = 0.0095 b(slope) = 0.0066 chi2 = 0.8056 CAL_IN N-side: a = 2.4716 b(slope) = 0.0086 chi2 = 1.7028 CAL_IN P-side: a = 2.4718 b(slope) = 0.0086 chi2 = 1.6382 VTP N-side(average) = 0.7073 V CAL_BASE = 2.4746 V VTP P-side(average) = 0.4356 V CAL_VREF = 3.0264 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:208 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0107 chi2 = 0.4824 VTN P-side: a = 0.0096 b(slope) = 0.0065 chi2 = 0.2367 CAL_IN N-side: a = 2.4852 b(slope) = 0.0084 chi2 = 0.6156 CAL_IN P-side: a = 2.4852 b(slope) = 0.0084 chi2 = 2.5184 VTP N-side(average) = 0.6957 V CAL_BASE = 2.4873 V VTP P-side(average) = 0.4270 V CAL_VREF = 3.0278 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:108 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0108 chi2 = 0.4178 VTN P-side: a = 0.0096 b(slope) = 0.0065 chi2 = 0.3842 CAL_IN N-side: a = 2.4768 b(slope) = 0.0085 chi2 = 0.6296 CAL_IN P-side: a = 2.4765 b(slope) = 0.0085 chi2 = 0.6756 VTP N-side(average) = 0.7007 V CAL_BASE = 2.4797 V VTP P-side(average) = 0.4286 V CAL_VREF = 3.0268 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:209 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0308 b(slope) = 0.0057 chi2 = 99.0000 VTN P-side: a = 0.0032 b(slope) = 0.0042 chi2 = 99.0000 CAL_IN N-side: a = 2.5065 b(slope) = 0.0018 chi2 = 99.0000 CAL_IN P-side: a = 2.4687 b(slope) = 0.0032 chi2 = 99.0000 VTP N-side(average) = 0.6961 V CAL_BASE = 2.4553 V VTP P-side(average) = 0.4320 V CAL_VREF = 3.0134 V FUNCT. DIGITAL TEST = 6 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 2 error detected in test: TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 ------- CHIP ID:309 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0108 chi2 = 1.2886 VTN P-side: a = 0.0097 b(slope) = 0.0066 chi2 = 0.6375 CAL_IN N-side: a = 2.4695 b(slope) = 0.0086 chi2 = 0.5633 CAL_IN P-side: a = 2.4694 b(slope) = 0.0086 chi2 = 0.2721 VTP N-side(average) = 0.7027 V CAL_BASE = 2.4722 V VTP P-side(average) = 0.4340 V CAL_VREF = 3.0220 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1053.0 FUNCT@5.0V:ATOM13B 1119.0 FUNCT@5.0V:ATOM13C 1119.0 FUNCT@5.0V:ATOM15 1107.0 FUNCT@5.0V:ATOM17 3409.0 FUNCT@5.0V:ATOM18 3425.0 FUNCT@5.0V:ATOM18HF 3425.0 FUNCT@5.0V:ATOM19 3361.0 FUNCT@5.0V:ATOM19D 3376.0 FUNCT@5.0V:ATOM19E 2603.0 FUNCT@5.0V:ATOM19F 6476.0 FUNCT@5.0V:ATOM19FHF 6476.0 FUNCT@5.0V:ATOM20 1069.0 FUNCT@5.0V:ATOM21 1055.0 FUNCT@5.0V:ATOM22 1043.0 FUNCT@5.0V:ATOM25 1051.0 FUNCT@5.0V:ATOM25HF 1051.0 FUNCT@5.0V:ATOM26A 1030.0 FUNCT@5.0V:ATOM26B 1849.0 FUNCT@5.0V:ATOM28 1167.0 FUNCT@5.0V:ATOM29 1167.0 FUNCT@5.0V:ATOM30 1167.0 FUNCT@5.0V:ATOM31A 801.0 FUNCT@5.0V:ATOM31B 990.0 FUNCT@5.0V:ATOM32 801.0 FUNCT@5.0V:ATOM33 1167.0 FUNCT@5.0V:ATOM35 1311.0 FUNCT@5.0V:ATOM36 1057.0 FUNCT@5.0V:ATOM37A 1197.0 FUNCT@5.0V:ATOM37B 1199.0 FUNCT@5.0V:ATOM37C 1183.0 FUNCT@5.0V:ATOM37D 1151.0 FUNCT@5.0V:ATOM37E 1142.0 FUNCT@5.0V:ATOM39 1078.0 FUNCT@5.0V:ATOM41 1614.0 FUNCT@5.0V:ATOM41A 1614.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3662.0 FUNCT@5.0V:ATOM45C_40 3662.0 FUNCT@5.0V:ATOM46C_40 3662.0 FUNCT@5.0V:ATOM47C_40 3662.0 FUNCT@5.0V:ATOM48C_40 3662.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3662.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1233.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1392.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:409 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0108 chi2 = 0.7607 VTN P-side: a = 0.0099 b(slope) = 0.0066 chi2 = 0.3948 CAL_IN N-side: a = 2.4907 b(slope) = 0.0084 chi2 = 0.6084 CAL_IN P-side: a = 2.4907 b(slope) = 0.0084 chi2 = 0.6296 VTP N-side(average) = 0.7007 V CAL_BASE = 2.4929 V VTP P-side(average) = 0.4304 V CAL_VREF = 3.0342 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:509 --------------------------------------- CLASS=B -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 2 VTN N-side: a = 0.0094 b(slope) = 0.0107 chi2 = 1.0288 VTN P-side: a = 0.0096 b(slope) = 0.0065 chi2 = 0.3370 CAL_IN N-side: a = 2.4978 b(slope) = 0.0085 chi2 = 0.7074 CAL_IN P-side: a = 2.4973 b(slope) = 0.0085 chi2 = 10.8970 VTP N-side(average) = 0.6959 V CAL_BASE = 2.5000 V VTP P-side(average) = 0.4285 V CAL_VREF = 3.0442 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:609 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0090 b(slope) = 0.0105 chi2 = 1.0010 VTN P-side: a = 0.0091 b(slope) = 0.0065 chi2 = 0.6438 CAL_IN N-side: a = 2.4853 b(slope) = 0.0083 chi2 = 0.7616 CAL_IN P-side: a = 2.4851 b(slope) = 0.0083 chi2 = 0.5800 VTP N-side(average) = 0.6851 V CAL_BASE = 2.4905 V VTP P-side(average) = 0.4241 V CAL_VREF = 3.0222 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:709 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0109 chi2 = 0.3993 VTN P-side: a = 0.0095 b(slope) = 0.0067 chi2 = 0.3473 CAL_IN N-side: a = 2.4866 b(slope) = 0.0084 chi2 = 0.7330 CAL_IN P-side: a = 2.4864 b(slope) = 0.0084 chi2 = 0.5816 VTP N-side(average) = 0.7053 V CAL_BASE = 2.4922 V VTP P-side(average) = 0.4389 V CAL_VREF = 3.0320 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:809 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0109 chi2 = 0.5848 VTN P-side: a = 0.0096 b(slope) = 0.0068 chi2 = 0.2703 CAL_IN N-side: a = 2.5215 b(slope) = 0.0081 chi2 = 0.7640 CAL_IN P-side: a = 2.5216 b(slope) = 0.0081 chi2 = 0.9091 VTP N-side(average) = 0.7097 V CAL_BASE = 2.5271 V VTP P-side(average) = 0.4438 V CAL_VREF = 3.0486 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:810 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0111 chi2 = 1.4011 VTN P-side: a = 0.0097 b(slope) = 0.0068 chi2 = 0.5823 CAL_IN N-side: a = 2.5111 b(slope) = 0.0083 chi2 = 1.0196 CAL_IN P-side: a = 2.5114 b(slope) = 0.0083 chi2 = 0.8432 VTP N-side(average) = 0.7211 V CAL_BASE = 2.5164 V VTP P-side(average) = 0.4472 V CAL_VREF = 3.0452 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:710 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1068 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0109 chi2 = 0.9741 VTN P-side: a = 0.0096 b(slope) = 0.0067 chi2 = 0.4344 CAL_IN N-side: a = 2.5121 b(slope) = 0.0083 chi2 = 1.4001 CAL_IN P-side: a = 2.5125 b(slope) = 0.0083 chi2 = 0.5067 VTP N-side(average) = 0.7110 V CAL_BASE = 2.5181 V VTP P-side(average) = 0.4411 V CAL_VREF = 3.0493 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1295.0 FUNCT@5.0V:ATOM13B 1358.0 FUNCT@5.0V:ATOM13C 1358.0 FUNCT@5.0V:ATOM15 1343.0 FUNCT@5.0V:ATOM17 3651.0 FUNCT@5.0V:ATOM18 3666.0 FUNCT@5.0V:ATOM18HF 3666.0 FUNCT@5.0V:ATOM19 3603.0 FUNCT@5.0V:ATOM19D 3618.0 FUNCT@5.0V:ATOM19E 2845.0 FUNCT@5.0V:ATOM19F 6721.0 FUNCT@5.0V:ATOM19FHF 6721.0 FUNCT@5.0V:ATOM20 1311.0 FUNCT@5.0V:ATOM21 1288.0 FUNCT@5.0V:ATOM22 1058.0 FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM24 1074.0 FUNCT@5.0V:ATOM25 1293.0 FUNCT@5.0V:ATOM25HF 1293.0 FUNCT@5.0V:ATOM26A 1055.0 FUNCT@5.0V:ATOM26B 2084.0 FUNCT@5.0V:ATOM28 1408.0 FUNCT@5.0V:ATOM29 1408.0 FUNCT@5.0V:ATOM30 1408.0 FUNCT@5.0V:ATOM31A 1035.0 FUNCT@5.0V:ATOM31B 1224.0 FUNCT@5.0V:ATOM32 1035.0 FUNCT@5.0V:ATOM33 1408.0 FUNCT@5.0V:ATOM35 1542.0 FUNCT@5.0V:ATOM36 1298.0 FUNCT@5.0V:ATOM37A 1670.0 FUNCT@5.0V:ATOM37B 1662.0 FUNCT@5.0V:ATOM37C 1646.0 FUNCT@5.0V:ATOM37D 1163.0 FUNCT@5.0V:ATOM37E 1614.0 FUNCT@5.0V:ATOM39 1320.0 FUNCT@5.0V:ATOM41 1850.0 FUNCT@5.0V:ATOM41A 1850.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3793.0 FUNCT@5.0V:ATOM45C_40 3793.0 FUNCT@5.0V:ATOM46C_40 3793.0 FUNCT@5.0V:ATOM47C_40 3665.0 FUNCT@5.0V:ATOM48C_40 3793.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3793.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1243.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:610 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0088 b(slope) = 0.0107 chi2 = 1.9608 VTN P-side: a = 0.0093 b(slope) = 0.0066 chi2 = 0.7674 CAL_IN N-side: a = 2.5001 b(slope) = 0.0083 chi2 = 2.4692 CAL_IN P-side: a = 2.5018 b(slope) = 0.0084 chi2 = 2.4191 VTP N-side(average) = 0.6959 V CAL_BASE = 2.5032 V VTP P-side(average) = 0.4301 V CAL_VREF = 3.0371 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:510 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0110 chi2 = 0.6167 VTN P-side: a = 0.0103 b(slope) = 0.0067 chi2 = 0.4781 CAL_IN N-side: a = 2.5170 b(slope) = 0.0084 chi2 = 0.9274 CAL_IN P-side: a = 2.5169 b(slope) = 0.0084 chi2 = 0.4662 VTP N-side(average) = 0.7146 V CAL_BASE = 2.5183 V VTP P-side(average) = 0.4422 V CAL_VREF = 3.0574 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4019.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 4019.0 FUNCT@5.0V:ATOM47C_40 4019.0 FUNCT@5.0V:ATOM48C_40 4019.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4019.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:410 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0213 b(slope) = 0.0106 chi2 = 99.0000 VTN P-side: a = 0.0094 b(slope) = 0.0066 chi2 = 0.3098 CAL_IN N-side: a = 2.5063 b(slope) = 0.0082 chi2 = 99.0000 CAL_IN P-side: a = 2.4905 b(slope) = 0.0086 chi2 = 0.5695 VTP N-side(average) = 0.7068 V CAL_BASE = 2.4936 V VTP P-side(average) = 0.4349 V CAL_VREF = 3.0437 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:310 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0093 b(slope) = 0.0108 chi2 = 0.7944 VTN P-side: a = 0.0095 b(slope) = 0.0065 chi2 = 0.3261 CAL_IN N-side: a = 2.5040 b(slope) = 0.0084 chi2 = 0.6669 CAL_IN P-side: a = 2.5040 b(slope) = 0.0084 chi2 = 0.6803 VTP N-side(average) = 0.7011 V CAL_BASE = 2.5093 V VTP P-side(average) = 0.4293 V CAL_VREF = 3.0457 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:210 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0108 chi2 = 1.0730 VTN P-side: a = 0.0101 b(slope) = 0.0066 chi2 = 0.7753 CAL_IN N-side: a = 2.5091 b(slope) = 0.0084 chi2 = 0.9957 CAL_IN P-side: a = 2.5089 b(slope) = 0.0085 chi2 = 0.6144 VTP N-side(average) = 0.7001 V CAL_BASE = 2.5093 V VTP P-side(average) = 0.4306 V CAL_VREF = 3.0508 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:211 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0106 chi2 = 0.6910 VTN P-side: a = 0.0096 b(slope) = 0.0064 chi2 = 0.4832 CAL_IN N-side: a = 2.4931 b(slope) = 0.0085 chi2 = 0.5778 CAL_IN P-side: a = 2.4933 b(slope) = 0.0085 chi2 = 0.3038 VTP N-side(average) = 0.6902 V CAL_BASE = 2.4973 V VTP P-side(average) = 0.4209 V CAL_VREF = 3.0410 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:311 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0107 chi2 = 1.0855 VTN P-side: a = 0.0094 b(slope) = 0.0065 chi2 = 0.7611 CAL_IN N-side: a = 2.4972 b(slope) = 0.0085 chi2 = 1.0868 CAL_IN P-side: a = 2.4972 b(slope) = 0.0084 chi2 = 1.0665 VTP N-side(average) = 0.6972 V CAL_BASE = 2.5024 V VTP P-side(average) = 0.4268 V CAL_VREF = 3.0437 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:411 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0107 chi2 = 1.0327 VTN P-side: a = 0.0099 b(slope) = 0.0066 chi2 = 0.3284 CAL_IN N-side: a = 2.5049 b(slope) = 0.0084 chi2 = 0.6449 CAL_IN P-side: a = 2.5049 b(slope) = 0.0084 chi2 = 1.1540 VTP N-side(average) = 0.6966 V CAL_BASE = 2.5076 V VTP P-side(average) = 0.4301 V CAL_VREF = 3.0483 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:511 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0107 chi2 = 0.5437 VTN P-side: a = 0.0104 b(slope) = 0.0065 chi2 = 0.6817 CAL_IN N-side: a = 2.4946 b(slope) = 0.0084 chi2 = 0.6336 CAL_IN P-side: a = 2.4946 b(slope) = 0.0084 chi2 = 3.0974 VTP N-side(average) = 0.6960 V CAL_BASE = 2.4971 V VTP P-side(average) = 0.4307 V CAL_VREF = 3.0378 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:611 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0097 b(slope) = 0.0107 chi2 = 0.9472 VTN P-side: a = 0.0097 b(slope) = 0.0065 chi2 = 0.5784 CAL_IN N-side: a = 2.5098 b(slope) = 0.0082 chi2 = 1.7769 CAL_IN P-side: a = 2.5117 b(slope) = 0.0082 chi2 = 2.9440 VTP N-side(average) = 0.6952 V CAL_BASE = 2.5164 V VTP P-side(average) = 0.4284 V CAL_VREF = 3.0381 V FUNCT. DIGITAL TEST = 35 error detected in test: FUNCT@5.0V:ATOM13A 1543.0 FUNCT@5.0V:ATOM15 1587.0 FUNCT@5.0V:ATOM17 3899.0 FUNCT@5.0V:ATOM18 3915.0 FUNCT@5.0V:ATOM18HF 3915.0 FUNCT@5.0V:ATOM19 3851.0 FUNCT@5.0V:ATOM19D 3866.0 FUNCT@5.0V:ATOM19E 3093.0 FUNCT@5.0V:ATOM19F 6966.0 FUNCT@5.0V:ATOM19FHF 6966.0 FUNCT@5.0V:ATOM20 1559.0 FUNCT@5.0V:ATOM21 1535.0 FUNCT@5.0V:ATOM22 1523.0 FUNCT@5.0V:ATOM25 1541.0 FUNCT@5.0V:ATOM25HF 1541.0 FUNCT@5.0V:ATOM26A 1520.0 FUNCT@5.0V:ATOM26B 2329.0 FUNCT@5.0V:ATOM28 1657.0 FUNCT@5.0V:ATOM29 1657.0 FUNCT@5.0V:ATOM30 1657.0 FUNCT@5.0V:ATOM31A 1291.0 FUNCT@5.0V:ATOM31B 1480.0 FUNCT@5.0V:ATOM32 1291.0 FUNCT@5.0V:ATOM33 1657.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1791.0 FUNCT@5.0V:ATOM36 1547.0 FUNCT@5.0V:ATOM37A 2182.0 FUNCT@5.0V:ATOM37B 2174.0 FUNCT@5.0V:ATOM37C 2158.0 FUNCT@5.0V:ATOM37D 2126.0 FUNCT@5.0V:ATOM37E 2117.0 FUNCT@5.0V:ATOM39 1568.0 FUNCT@5.0V:ATOM41 2094.0 FUNCT@5.0V:ATOM41A 2094.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4519.0 FUNCT@5.0V:ATOM45C_40 3685.0 FUNCT@5.0V:ATOM46C_40 4277.0 FUNCT@5.0V:ATOM47C_40 4519.0 FUNCT@5.0V:ATOM48C_40 4519.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4519.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:711 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0109 chi2 = 0.5281 VTN P-side: a = 0.0096 b(slope) = 0.0067 chi2 = 0.2966 CAL_IN N-side: a = 2.4993 b(slope) = 0.0084 chi2 = 1.0041 CAL_IN P-side: a = 2.4997 b(slope) = 0.0084 chi2 = 0.7671 VTP N-side(average) = 0.7073 V CAL_BASE = 2.5034 V VTP P-side(average) = 0.4411 V CAL_VREF = 3.0410 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:811 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0110 chi2 = 1.0143 VTN P-side: a = 0.0098 b(slope) = 0.0067 chi2 = 0.6300 CAL_IN N-side: a = 2.4843 b(slope) = 0.0084 chi2 = 1.3832 CAL_IN P-side: a = 2.4841 b(slope) = 0.0084 chi2 = 1.4448 VTP N-side(average) = 0.7140 V CAL_BASE = 2.4871 V VTP P-side(average) = 0.4421 V CAL_VREF = 3.0281 V FUNCT. DIGITAL TEST = 4 error detected in test: FUNCT@5.0V:ATOM37A 2115.0 FUNCT@5.0V:ATOM37B 2107.0 FUNCT@5.0V:ATOM37D 2060.0 FUNCT@5.0V:ATOM37E 2050.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:812 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0111 chi2 = 0.8101 VTN P-side: a = 0.0104 b(slope) = 0.0068 chi2 = 0.3184 CAL_IN N-side: a = 2.4752 b(slope) = 0.0086 chi2 = 0.5529 CAL_IN P-side: a = 2.4753 b(slope) = 0.0086 chi2 = 0.3786 VTP N-side(average) = 0.7203 V CAL_BASE = 2.4783 V VTP P-side(average) = 0.4461 V CAL_VREF = 3.0300 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:712 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0110 chi2 = 1.3982 VTN P-side: a = 0.0104 b(slope) = 0.0068 chi2 = 0.4857 CAL_IN N-side: a = 2.4735 b(slope) = 0.0085 chi2 = 0.4504 CAL_IN P-side: a = 2.4733 b(slope) = 0.0085 chi2 = 2.4302 VTP N-side(average) = 0.7169 V CAL_BASE = 2.4785 V VTP P-side(average) = 0.4465 V CAL_VREF = 3.0229 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM37D 3114.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:612 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0215 b(slope) = 0.0105 chi2 = 99.0000 VTN P-side: a = 0.0094 b(slope) = 0.0066 chi2 = 0.6847 CAL_IN N-side: a = 2.4927 b(slope) = 0.0081 chi2 = 99.0000 CAL_IN P-side: a = 2.4771 b(slope) = 0.0085 chi2 = 0.3580 VTP N-side(average) = 0.6979 V CAL_BASE = 2.4810 V VTP P-side(average) = 0.4316 V CAL_VREF = 3.0234 V FUNCT. DIGITAL TEST = 7 error detected in test: FUNCT@5.0V:ATOM13B 1599.0 FUNCT@5.0V:ATOM13C 1599.0 FUNCT@5.0V:ATOM37A 2166.0 FUNCT@5.0V:ATOM37B 2158.0 FUNCT@5.0V:ATOM37C 2142.0 FUNCT@5.0V:ATOM37D 2110.0 FUNCT@5.0V:ATOM37E 2101.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3907.0 FUNCT@5.0V:ATOM45C_40 3907.0 FUNCT@5.0V:ATOM46C_40 3907.0 FUNCT@5.0V:ATOM47C_40 3907.0 FUNCT@5.0V:ATOM48C_40 3907.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3907.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:512 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0109 chi2 = 0.8889 VTN P-side: a = 0.0098 b(slope) = 0.0067 chi2 = 0.5299 CAL_IN N-side: a = 2.4839 b(slope) = 0.0086 chi2 = 1.0233 CAL_IN P-side: a = 2.4841 b(slope) = 0.0086 chi2 = 0.6742 VTP N-side(average) = 0.7071 V CAL_BASE = 2.4883 V VTP P-side(average) = 0.4399 V CAL_VREF = 3.0386 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:412 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0107 chi2 = 1.6662 VTN P-side: a = 0.0097 b(slope) = 0.0066 chi2 = 0.4444 CAL_IN N-side: a = 2.5452 b(slope) = 0.0081 chi2 = 0.8434 CAL_IN P-side: a = 2.5453 b(slope) = 0.0081 chi2 = 0.9956 VTP N-side(average) = 0.6981 V CAL_BASE = 2.5522 V VTP P-side(average) = 0.4307 V CAL_VREF = 3.0723 V FUNCT. DIGITAL TEST = 7 error detected in test: FUNCT@5.0V:ATOM13B 1775.0 FUNCT@5.0V:ATOM13C 1775.0 FUNCT@5.0V:ATOM37A 2518.0 FUNCT@5.0V:ATOM37B 2510.0 FUNCT@5.0V:ATOM37C 2494.0 FUNCT@5.0V:ATOM37D 2462.0 FUNCT@5.0V:ATOM37E 2453.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5211.0 FUNCT@5.0V:ATOM45C_40 5211.0 FUNCT@5.0V:ATOM46C_40 3667.0 FUNCT@5.0V:ATOM47C_40 5211.0 FUNCT@5.0V:ATOM48C_40 5211.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5211.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:312 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0110 chi2 = 2.2495 VTN P-side: a = 0.0100 b(slope) = 0.0066 chi2 = 1.0008 CAL_IN N-side: a = 2.5186 b(slope) = 0.0083 chi2 = 1.2808 CAL_IN P-side: a = 2.5187 b(slope) = 0.0083 chi2 = 2.2333 VTP N-side(average) = 0.7127 V CAL_BASE = 2.5217 V VTP P-side(average) = 0.4361 V CAL_VREF = 3.0544 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:212 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0106 chi2 = 0.6466 VTN P-side: a = 0.0104 b(slope) = 0.0064 chi2 = 0.6953 CAL_IN N-side: a = 2.5187 b(slope) = 0.0084 chi2 = 2.1287 CAL_IN P-side: a = 2.5192 b(slope) = 0.0084 chi2 = 1.2697 VTP N-side(average) = 0.6906 V CAL_BASE = 2.5244 V VTP P-side(average) = 0.4238 V CAL_VREF = 3.0615 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:413 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0108 chi2 = 0.5059 VTN P-side: a = 0.0104 b(slope) = 0.0066 chi2 = 0.3347 CAL_IN N-side: a = 2.5258 b(slope) = 0.0082 chi2 = 1.3246 CAL_IN P-side: a = 2.5257 b(slope) = 0.0082 chi2 = 1.5347 VTP N-side(average) = 0.7019 V CAL_BASE = 2.5334 V VTP P-side(average) = 0.4352 V CAL_VREF = 3.0601 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:513 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0108 chi2 = 1.3654 VTN P-side: a = 0.0100 b(slope) = 0.0066 chi2 = 0.4154 CAL_IN N-side: a = 2.4918 b(slope) = 0.0085 chi2 = 0.7884 CAL_IN P-side: a = 2.4921 b(slope) = 0.0085 chi2 = 0.5648 VTP N-side(average) = 0.7032 V CAL_BASE = 2.4956 V VTP P-side(average) = 0.4344 V CAL_VREF = 3.0398 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:613 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0110 chi2 = 1.5528 VTN P-side: a = 0.0102 b(slope) = 0.0067 chi2 = 0.6193 CAL_IN N-side: a = 2.4896 b(slope) = 0.0084 chi2 = 0.8545 CAL_IN P-side: a = 2.4895 b(slope) = 0.0084 chi2 = 0.7294 VTP N-side(average) = 0.7125 V CAL_BASE = 2.4922 V VTP P-side(average) = 0.4383 V CAL_VREF = 3.0334 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:614 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0111 chi2 = 1.3144 VTN P-side: a = 0.0093 b(slope) = 0.0068 chi2 = 0.7465 CAL_IN N-side: a = 2.4934 b(slope) = 0.0085 chi2 = 0.4867 CAL_IN P-side: a = 2.4935 b(slope) = 0.0085 chi2 = 0.6433 VTP N-side(average) = 0.7175 V CAL_BASE = 2.5005 V VTP P-side(average) = 0.4425 V CAL_VREF = 3.0432 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3650.0 FUNCT@5.0V:ATOM45C_40 5920.0 FUNCT@5.0V:ATOM46C_40 3650.0 FUNCT@5.0V:ATOM47C_40 5501.0 FUNCT@5.0V:ATOM48C_40 3650.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3650.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1228.0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:514 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0216 b(slope) = 0.0105 chi2 = 99.0000 VTN P-side: a = 0.0095 b(slope) = 0.0066 chi2 = 0.2562 CAL_IN N-side: a = 2.5172 b(slope) = 0.0081 chi2 = 99.0000 CAL_IN P-side: a = 2.5015 b(slope) = 0.0085 chi2 = 0.5913 VTP N-side(average) = 0.7022 V CAL_BASE = 2.5046 V VTP P-side(average) = 0.4328 V CAL_VREF = 3.0478 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1055.0 FUNCT@5.0V:ATOM13B 1111.0 FUNCT@5.0V:ATOM13C 1111.0 FUNCT@5.0V:ATOM15 1099.0 FUNCT@5.0V:ATOM17 3411.0 FUNCT@5.0V:ATOM18 3427.0 FUNCT@5.0V:ATOM18HF 3427.0 FUNCT@5.0V:ATOM19 3363.0 FUNCT@5.0V:ATOM19D 3378.0 FUNCT@5.0V:ATOM19E 2605.0 FUNCT@5.0V:ATOM19F 6478.0 FUNCT@5.0V:ATOM19FHF 6478.0 FUNCT@5.0V:ATOM20 1071.0 FUNCT@5.0V:ATOM21 1047.0 FUNCT@5.0V:ATOM22 1035.0 FUNCT@5.0V:ATOM23 967.0 FUNCT@5.0V:ATOM24 1067.0 FUNCT@5.0V:ATOM25 1053.0 FUNCT@5.0V:ATOM25HF 1053.0 FUNCT@5.0V:ATOM26A 1032.0 FUNCT@5.0V:ATOM26B 1841.0 FUNCT@5.0V:ATOM28 1169.0 FUNCT@5.0V:ATOM29 1169.0 FUNCT@5.0V:ATOM30 1169.0 FUNCT@5.0V:ATOM31A 803.0 FUNCT@5.0V:ATOM31B 992.0 FUNCT@5.0V:ATOM32 803.0 FUNCT@5.0V:ATOM33 1169.0 FUNCT@5.0V:ATOM35 1303.0 FUNCT@5.0V:ATOM36 1059.0 FUNCT@5.0V:ATOM37A 1199.0 FUNCT@5.0V:ATOM37B 1191.0 FUNCT@5.0V:ATOM37C 1175.0 FUNCT@5.0V:ATOM37D 1143.0 FUNCT@5.0V:ATOM37E 1134.0 FUNCT@5.0V:ATOM39 1080.0 FUNCT@5.0V:ATOM41 1606.0 FUNCT@5.0V:ATOM41A 1606.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4270.0 FUNCT@5.0V:ATOM45C_40 4270.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 4270.0 FUNCT@5.0V:ATOM48C_40 4270.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4270.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1236.0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:414 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1039 IDDSB:VDD1B 0.1106 IDDSB:VDD1C 0.1159 IDDSB:VDD1D 0.1212 IDDOP1:DVDD 0.1263 DACS TEST = 0 VTN N-side: a = 0.0126 b(slope) = 0.0109 chi2 = 0.8111 VTN P-side: a = 0.0129 b(slope) = 0.0066 chi2 = 0.7736 CAL_IN N-side: a = 2.5054 b(slope) = 0.0084 chi2 = 0.6875 CAL_IN P-side: a = 2.5054 b(slope) = 0.0084 chi2 = 0.7078 VTP N-side(average) = 0.7122 V CAL_BASE = 2.5166 V VTP P-side(average) = 0.4370 V CAL_VREF = 3.0557 V FUNCT. DIGITAL TEST = 37 error detected in test: FUNCT@5.0V:ATOM13A 1063.0 FUNCT@5.0V:ATOM13B 1120.0 FUNCT@5.0V:ATOM13C 1120.0 FUNCT@5.0V:ATOM15 1107.0 FUNCT@5.0V:ATOM17 3419.0 FUNCT@5.0V:ATOM18 3435.0 FUNCT@5.0V:ATOM18HF 3435.0 FUNCT@5.0V:ATOM19 3371.0 FUNCT@5.0V:ATOM19D 3386.0 FUNCT@5.0V:ATOM19E 2613.0 FUNCT@5.0V:ATOM19F 6486.0 FUNCT@5.0V:ATOM19FHF 6486.0 FUNCT@5.0V:ATOM20 1079.0 FUNCT@5.0V:ATOM21 1055.0 FUNCT@5.0V:ATOM22 1043.0 FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM25 1061.0 FUNCT@5.0V:ATOM25HF 1061.0 FUNCT@5.0V:ATOM26A 1040.0 FUNCT@5.0V:ATOM26B 1849.0 FUNCT@5.0V:ATOM28 1177.0 FUNCT@5.0V:ATOM29 1177.0 FUNCT@5.0V:ATOM30 1177.0 FUNCT@5.0V:ATOM31A 811.0 FUNCT@5.0V:ATOM31B 1000.0 FUNCT@5.0V:ATOM32 811.0 FUNCT@5.0V:ATOM33 1177.0 FUNCT@5.0V:ATOM35 1311.0 FUNCT@5.0V:ATOM36 1067.0 FUNCT@5.0V:ATOM37A 1206.0 FUNCT@5.0V:ATOM37B 1198.0 FUNCT@5.0V:ATOM37C 1182.0 FUNCT@5.0V:ATOM37D 1150.0 FUNCT@5.0V:ATOM37E 1141.0 FUNCT@5.0V:ATOM39 1088.0 FUNCT@5.0V:ATOM41 1614.0 FUNCT@5.0V:ATOM41A 1614.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3667.0 FUNCT@5.0V:ATOM45C_40 3667.0 FUNCT@5.0V:ATOM46C_40 3667.0 FUNCT@5.0V:ATOM47C_40 3667.0 FUNCT@5.0V:ATOM48C_40 3667.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3667.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 +++++++++ WAFER DATA+++++++++++++++++++++++++++ CLASSES: A-->Good, B-->Probably Good, C-->Bad A B C ------------------------- 401 509 501 402 601 203 602 303 502 403 503 804 603 404 703 304 803 204 704 305 604 405 504 705 205 706 505 406 605 306 805 206 806 107 606 207 506 307 407 507 607 707 808 807 708 907 608 908 209 508 309 408 609 308 710 208 610 108 510 409 410 709 611 809 811 810 712 310 612 210 412 211 614 311 514 411 414 511 711 812 512 312 212 413 513 613 ---------------------------- 47 1 38 NUMBER OF CHIPS TESTED = 86 NUMBER OF CLASS A CHIPS = 47 NUMBER OF CLASS B CHIPS = 1 NUMBER OF CLASS C CHIPS = 38 YIELD = 54.65 %