------- CHIP ID:401 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0091 b(slope) = 0.0110 chi2 = 1.5744 VTN P-side: a = 0.0093 b(slope) = 0.0067 chi2 = 0.7261 CAL_IN N-side: a = 2.4792 b(slope) = 0.0090 chi2 = 0.6399 CAL_IN P-side: a = 2.4790 b(slope) = 0.0090 chi2 = 0.5959 VTP N-side(average) = 0.7141 V CAL_BASE = 2.4822 V VTP P-side(average) = 0.4404 V CAL_VREF = 3.0591 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1128.0 FUNCT@5.0V:ATOM13C 1128.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1051.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1047.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1216.0 FUNCT@5.0V:ATOM37B 1206.0 FUNCT@5.0V:ATOM37C 1190.0 FUNCT@5.0V:ATOM37D 1158.0 FUNCT@5.0V:ATOM37E 1150.0 FUNCT@5.0V:ATOM39 1097.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:501 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1005 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0111 chi2 = 0.8769 VTN P-side: a = 0.0094 b(slope) = 0.0068 chi2 = 0.3107 CAL_IN N-side: a = 2.5046 b(slope) = 0.0089 chi2 = 1.1040 CAL_IN P-side: a = 2.5044 b(slope) = 0.0088 chi2 = 3.4531 VTP N-side(average) = 0.7190 V CAL_BASE = 2.5081 V VTP P-side(average) = 0.4433 V CAL_VREF = 3.0774 V FUNCT. DIGITAL TEST = 50 error detected in test: FUNCT@5.0V:ATOM1TO6A 229.0 FUNCT@5.0V:ATOM1TO6B 230.0 FUNCT@5.0V:ATOM1TO6C 229.0 FUNCT@5.0V:ATOM1TO6D 229.0 FUNCT@5.0V:ATOM1TO6E 229.0 FUNCT@5.0V:ATOM7TO9A 273.0 FUNCT@5.0V:ATOM7TO9B 274.0 FUNCT@5.0V:ATOM7TO9C 273.0 FUNCT@5.0V:ATOM7TO9D 273.0 FUNCT@5.0V:ATOM7TO9E 273.0 FUNCT@5.0V:ATOM10TO12 498.0 FUNCT@5.0V:ATOM13A 1043.0 FUNCT@5.0V:ATOM13B 1099.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1087.0 FUNCT@5.0V:ATOM17 3399.0 FUNCT@5.0V:ATOM18 3415.0 FUNCT@5.0V:ATOM18HF 3415.0 FUNCT@5.0V:ATOM19 3351.0 FUNCT@5.0V:ATOM19D 3366.0 FUNCT@5.0V:ATOM19E 2593.0 FUNCT@5.0V:ATOM19F 6466.0 FUNCT@5.0V:ATOM19FHF 6466.0 FUNCT@5.0V:ATOM20 1059.0 FUNCT@5.0V:ATOM21 1035.0 FUNCT@5.0V:ATOM22 1023.0 FUNCT@5.0V:ATOM23 955.0 FUNCT@5.0V:ATOM24 1055.0 FUNCT@5.0V:ATOM25 1041.0 FUNCT@5.0V:ATOM25HF 1041.0 FUNCT@5.0V:ATOM26A 1020.0 FUNCT@5.0V:ATOM26B 1829.0 FUNCT@5.0V:ATOM28 1157.0 FUNCT@5.0V:ATOM29 1157.0 FUNCT@5.0V:ATOM30 1157.0 FUNCT@5.0V:ATOM31A 791.0 FUNCT@5.0V:ATOM31B 980.0 FUNCT@5.0V:ATOM32 791.0 FUNCT@5.0V:ATOM33 1157.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1047.0 FUNCT@5.0V:ATOM37A 1187.0 FUNCT@5.0V:ATOM37B 1179.0 FUNCT@5.0V:ATOM37C 1163.0 FUNCT@5.0V:ATOM37D 1131.0 FUNCT@5.0V:ATOM37E 1122.0 FUNCT@5.0V:ATOM39 1068.0 FUNCT@5.0V:ATOM41 1594.0 FUNCT@5.0V:ATOM41A 1594.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1382.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 274.0 FUNCT@5.0V:A10TO12HF 498.0 FUNCT@5.0V:ADAC37HF 273.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:601 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0093 b(slope) = 0.0110 chi2 = 1.3484 VTN P-side: a = 0.0089 b(slope) = 0.0066 chi2 = 0.6928 CAL_IN N-side: a = 2.5861 b(slope) = 0.0078 chi2 = 99.0000 CAL_IN P-side: a = 2.6424 b(slope) = 0.0063 chi2 = 99.0000 VTP N-side(average) = 0.7115 V CAL_BASE = 2.5049 V VTP P-side(average) = 0.4348 V CAL_VREF = 3.0579 V FUNCT. DIGITAL TEST = 40 error detected in test: FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3415.0 FUNCT@5.0V:ATOM18 3432.0 FUNCT@5.0V:ATOM18HF 3432.0 FUNCT@5.0V:ATOM19 3367.0 FUNCT@5.0V:ATOM19D 3382.0 FUNCT@5.0V:ATOM19E 2609.0 FUNCT@5.0V:ATOM19F 6483.0 FUNCT@5.0V:ATOM19FHF 6483.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM27 1023.0 FUNCT@5.0V:ATOM28 1173.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 808.0 FUNCT@5.0V:ATOM31B 996.0 FUNCT@5.0V:ATOM32 808.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1142.0 FUNCT@5.0V:ATOM39 1084.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 FUNCT@5.0V:ATOM42 214.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3663.0 FUNCT@5.0V:ATOM45C_40 3663.0 FUNCT@5.0V:ATOM46C_40 3663.0 FUNCT@5.0V:ATOM47C_40 3663.0 FUNCT@5.0V:ATOM48C_40 3663.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3663.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1241.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1398.0 HF TEST = 0 TMIN TEST = 1 error detected in test: TMIN@4.8V:A7_9_50D 0.0 ------- CHIP ID:602 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1219 DACS TEST = 1 VTN N-side: a = 0.0020 b(slope) = 0.0115 chi2 = 99.0000 VTN P-side: a = 0.0077 b(slope) = 0.0070 chi2 = 82.9141 CAL_IN N-side: a = 2.4755 b(slope) = 0.0087 chi2 = 0.5027 CAL_IN P-side: a = 2.4758 b(slope) = 0.0087 chi2 = 0.6663 VTP N-side(average) = 0.7358 V CAL_BASE = 2.4778 V VTP P-side(average) = 0.4534 V CAL_VREF = 3.0371 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1119.0 FUNCT@5.0V:ATOM13C 1119.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM23 975.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM34 320.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1207.0 FUNCT@5.0V:ATOM37B 1199.0 FUNCT@5.0V:ATOM37C 1183.0 FUNCT@5.0V:ATOM37D 1151.0 FUNCT@5.0V:ATOM37E 1142.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3666.0 FUNCT@5.0V:ATOM45C_40 3666.0 FUNCT@5.0V:ATOM46C_40 3666.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3666.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1244.0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:502 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0100 b(slope) = 0.0109 chi2 = 1.2446 VTN P-side: a = 0.0102 b(slope) = 0.0066 chi2 = 0.6918 CAL_IN N-side: a = 2.4942 b(slope) = 0.0090 chi2 = 48.0096 CAL_IN P-side: a = 2.4983 b(slope) = 0.0090 chi2 = 17.1717 VTP N-side(average) = 0.7080 V CAL_BASE = 2.4978 V VTP P-side(average) = 0.4342 V CAL_VREF = 3.0596 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:402 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0109 chi2 = 0.6247 VTN P-side: a = 0.0102 b(slope) = 0.0067 chi2 = 0.3761 CAL_IN N-side: a = 2.4880 b(slope) = 0.0088 chi2 = 0.7895 CAL_IN P-side: a = 2.4883 b(slope) = 0.0088 chi2 = 0.5281 VTP N-side(average) = 0.7100 V CAL_BASE = 2.4929 V VTP P-side(average) = 0.4365 V CAL_VREF = 3.0549 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:203 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0108 b(slope) = 0.0108 chi2 = 0.8813 VTN P-side: a = 0.0108 b(slope) = 0.0066 chi2 = 0.3734 CAL_IN N-side: a = 2.4557 b(slope) = 0.0089 chi2 = 2.0552 CAL_IN P-side: a = 2.4545 b(slope) = 0.0089 chi2 = 5.8270 VTP N-side(average) = 0.7014 V CAL_BASE = 2.4560 V VTP P-side(average) = 0.4329 V CAL_VREF = 3.0261 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:303 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0108 chi2 = 0.5851 VTN P-side: a = 0.0101 b(slope) = 0.0065 chi2 = 0.5298 CAL_IN N-side: a = 2.5161 b(slope) = 0.0085 chi2 = 0.9486 CAL_IN P-side: a = 2.5161 b(slope) = 0.0085 chi2 = 0.7170 VTP N-side(average) = 0.7006 V CAL_BASE = 2.5203 V VTP P-side(average) = 0.4283 V CAL_VREF = 3.0632 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:403 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0099 b(slope) = 0.0109 chi2 = 0.7597 VTN P-side: a = 0.0103 b(slope) = 0.0066 chi2 = 0.9319 CAL_IN N-side: a = 2.4798 b(slope) = 0.0088 chi2 = 1.5190 CAL_IN P-side: a = 2.4799 b(slope) = 0.0087 chi2 = 0.9220 VTP N-side(average) = 0.7094 V CAL_BASE = 2.4824 V VTP P-side(average) = 0.4356 V CAL_VREF = 3.0430 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:503 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 2 VTN N-side: a = 0.0107 b(slope) = 0.0108 chi2 = 0.5190 VTN P-side: a = 0.0108 b(slope) = 0.0066 chi2 = 0.6063 CAL_IN N-side: a = 2.4739 b(slope) = 0.0088 chi2 = 1.5323 CAL_IN P-side: a = 2.4718 b(slope) = 0.0090 chi2 = 21.0600 VTP N-side(average) = 0.7057 V CAL_BASE = 2.4729 V VTP P-side(average) = 0.4341 V CAL_VREF = 3.0400 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM37D 1386.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:603 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0096 b(slope) = 0.0106 chi2 = 1.4110 VTN P-side: a = 0.0100 b(slope) = 0.0064 chi2 = 0.8874 CAL_IN N-side: a = 2.5042 b(slope) = 0.0083 chi2 = 2.4027 CAL_IN P-side: a = 2.5042 b(slope) = 0.0084 chi2 = 4.7057 VTP N-side(average) = 0.6889 V CAL_BASE = 2.5071 V VTP P-side(average) = 0.4215 V CAL_VREF = 3.0403 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:703 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0109 chi2 = 0.4479 VTN P-side: a = 0.0102 b(slope) = 0.0067 chi2 = 0.2941 CAL_IN N-side: a = 2.4909 b(slope) = 0.0086 chi2 = 1.0400 CAL_IN P-side: a = 2.4912 b(slope) = 0.0086 chi2 = 1.0838 VTP N-side(average) = 0.7090 V CAL_BASE = 2.4939 V VTP P-side(average) = 0.4373 V CAL_VREF = 3.0454 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:803 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0110 chi2 = 1.8498 VTN P-side: a = 0.0108 b(slope) = 0.0068 chi2 = 0.3118 CAL_IN N-side: a = 2.5063 b(slope) = 0.0085 chi2 = 0.4596 CAL_IN P-side: a = 2.5062 b(slope) = 0.0085 chi2 = 0.4132 VTP N-side(average) = 0.7163 V CAL_BASE = 2.5076 V VTP P-side(average) = 0.4468 V CAL_VREF = 3.0520 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:804 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0119 b(slope) = 0.0110 chi2 = 0.9623 VTN P-side: a = 0.0120 b(slope) = 0.0068 chi2 = 0.4463 CAL_IN N-side: a = 2.5212 b(slope) = 0.0084 chi2 = 0.8104 CAL_IN P-side: a = 2.5212 b(slope) = 0.0084 chi2 = 0.6953 VTP N-side(average) = 0.7169 V CAL_BASE = 2.5212 V VTP P-side(average) = 0.4470 V CAL_VREF = 3.0610 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:704 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0112 b(slope) = 0.0109 chi2 = 1.9611 VTN P-side: a = 0.0116 b(slope) = 0.0067 chi2 = 0.9076 CAL_IN N-side: a = 2.5207 b(slope) = 0.0084 chi2 = 0.7714 CAL_IN P-side: a = 2.5207 b(slope) = 0.0084 chi2 = 0.7213 VTP N-side(average) = 0.7094 V CAL_BASE = 2.5256 V VTP P-side(average) = 0.4409 V CAL_VREF = 3.0610 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:604 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0107 chi2 = 0.8220 VTN P-side: a = 0.0104 b(slope) = 0.0065 chi2 = 0.4452 CAL_IN N-side: a = 2.4868 b(slope) = 0.0084 chi2 = 0.5404 CAL_IN P-side: a = 2.4866 b(slope) = 0.0084 chi2 = 0.2507 VTP N-side(average) = 0.6953 V CAL_BASE = 2.4880 V VTP P-side(average) = 0.4271 V CAL_VREF = 3.0298 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:504 --------------------------------------- CLASS=B -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 2 VTN N-side: a = 0.0094 b(slope) = 0.0109 chi2 = 3.3808 VTN P-side: a = 0.0101 b(slope) = 0.0067 chi2 = 0.7134 CAL_IN N-side: a = 2.4941 b(slope) = 0.0086 chi2 = 0.8278 CAL_IN P-side: a = 2.4939 b(slope) = 0.0086 chi2 = 14.5256 VTP N-side(average) = 0.7073 V CAL_BASE = 2.4959 V VTP P-side(average) = 0.4370 V CAL_VREF = 3.0498 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:404 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0109 chi2 = 0.7557 VTN P-side: a = 0.0103 b(slope) = 0.0067 chi2 = 0.4380 CAL_IN N-side: a = 2.4715 b(slope) = 0.0088 chi2 = 1.1923 CAL_IN P-side: a = 2.4714 b(slope) = 0.0088 chi2 = 1.8181 VTP N-side(average) = 0.7125 V CAL_BASE = 2.4719 V VTP P-side(average) = 0.4379 V CAL_VREF = 3.0376 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:304 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0102 b(slope) = 0.0108 chi2 = 0.9532 VTN P-side: a = 0.0106 b(slope) = 0.0065 chi2 = 0.3351 CAL_IN N-side: a = 2.4920 b(slope) = 0.0085 chi2 = 0.7667 CAL_IN P-side: a = 2.4918 b(slope) = 0.0085 chi2 = 0.9141 VTP N-side(average) = 0.7019 V CAL_BASE = 2.4944 V VTP P-side(average) = 0.4307 V CAL_VREF = 3.0383 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:204 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0107 b(slope) = 0.0108 chi2 = 3.0338 VTN P-side: a = 0.0112 b(slope) = 0.0065 chi2 = 1.0540 CAL_IN N-side: a = 2.5022 b(slope) = 0.0084 chi2 = 0.7207 CAL_IN P-side: a = 2.5024 b(slope) = 0.0084 chi2 = 0.7772 VTP N-side(average) = 0.7022 V CAL_BASE = 2.5066 V VTP P-side(average) = 0.4304 V CAL_VREF = 3.0449 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:205 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0117 b(slope) = 0.0106 chi2 = 2.4749 VTN P-side: a = 0.0121 b(slope) = 0.0065 chi2 = 0.7054 CAL_IN N-side: a = 2.4752 b(slope) = 0.0086 chi2 = 0.9111 CAL_IN P-side: a = 2.4751 b(slope) = 0.0085 chi2 = 1.4214 VTP N-side(average) = 0.6925 V CAL_BASE = 2.4795 V VTP P-side(average) = 0.4278 V CAL_VREF = 3.0276 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4471.0 FUNCT@5.0V:ATOM45C_40 4471.0 FUNCT@5.0V:ATOM46C_40 4471.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 4471.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4471.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:305 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0118 b(slope) = 0.0107 chi2 = 2.8568 VTN P-side: a = 0.0121 b(slope) = 0.0065 chi2 = 0.7445 CAL_IN N-side: a = 2.4484 b(slope) = 0.0087 chi2 = 1.2075 CAL_IN P-side: a = 2.4481 b(slope) = 0.0087 chi2 = 4.6576 VTP N-side(average) = 0.6984 V CAL_BASE = 2.4485 V VTP P-side(average) = 0.4308 V CAL_VREF = 3.0041 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:405 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0114 b(slope) = 0.0108 chi2 = 1.6831 VTN P-side: a = 0.0120 b(slope) = 0.0066 chi2 = 1.0193 CAL_IN N-side: a = 2.4714 b(slope) = 0.0087 chi2 = 0.6681 CAL_IN P-side: a = 2.4714 b(slope) = 0.0087 chi2 = 0.6718 VTP N-side(average) = 0.7050 V CAL_BASE = 2.4778 V VTP P-side(average) = 0.4335 V CAL_VREF = 3.0339 V FUNCT. DIGITAL TEST = 7 error detected in test: FUNCT@5.0V:ATOM13B 1311.0 FUNCT@5.0V:ATOM13C 1311.0 FUNCT@5.0V:ATOM37A 1590.0 FUNCT@5.0V:ATOM37B 1582.0 FUNCT@5.0V:ATOM37C 1566.0 FUNCT@5.0V:ATOM37D 1534.0 FUNCT@5.0V:ATOM37E 1525.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3763.0 FUNCT@5.0V:ATOM45C_40 3763.0 FUNCT@5.0V:ATOM46C_40 3667.0 FUNCT@5.0V:ATOM47C_40 3763.0 FUNCT@5.0V:ATOM48C_40 3763.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3763.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:505 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0121 b(slope) = 0.0108 chi2 = 1.1012 VTN P-side: a = 0.0122 b(slope) = 0.0066 chi2 = 0.3438 CAL_IN N-side: a = 2.4914 b(slope) = 0.0087 chi2 = 0.6904 CAL_IN P-side: a = 2.4913 b(slope) = 0.0087 chi2 = 0.3980 VTP N-side(average) = 0.7069 V CAL_BASE = 2.4912 V VTP P-side(average) = 0.4332 V CAL_VREF = 3.0461 V FUNCT. DIGITAL TEST = 16 error detected in test: FUNCT@5.0V:ATOM18HF 3425.0 FUNCT@5.0V:ATOM19D 3376.0 FUNCT@5.0V:ATOM22 1033.0 FUNCT@5.0V:ATOM25HF 1051.0 FUNCT@5.0V:ATOM26A 1030.0 FUNCT@5.0V:ATOM26B 1839.0 FUNCT@5.0V:ATOM29 1167.0 FUNCT@5.0V:ATOM30 1167.0 FUNCT@5.0V:ATOM31A 801.0 FUNCT@5.0V:ATOM32 801.0 FUNCT@5.0V:ATOM33 1167.0 FUNCT@5.0V:ATOM36 1057.0 FUNCT@5.0V:ATOM37A 1197.0 FUNCT@5.0V:ATOM37B 1189.0 FUNCT@5.0V:ATOM37D 1141.0 FUNCT@5.0V:ATOM41A 1604.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1392.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:605 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0116 b(slope) = 0.0106 chi2 = 2.2336 VTN P-side: a = 0.0123 b(slope) = 0.0065 chi2 = 0.8788 CAL_IN N-side: a = 2.4699 b(slope) = 0.0085 chi2 = 1.3025 CAL_IN P-side: a = 2.4697 b(slope) = 0.0085 chi2 = 2.2283 VTP N-side(average) = 0.6920 V CAL_BASE = 2.4685 V VTP P-side(average) = 0.4275 V CAL_VREF = 3.0151 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:705 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0121 b(slope) = 0.0108 chi2 = 1.1129 VTN P-side: a = 0.0124 b(slope) = 0.0066 chi2 = 0.3524 CAL_IN N-side: a = 2.4949 b(slope) = 0.0084 chi2 = 0.8255 CAL_IN P-side: a = 2.4949 b(slope) = 0.0084 chi2 = 0.7062 VTP N-side(average) = 0.7025 V CAL_BASE = 2.5010 V VTP P-side(average) = 0.4352 V CAL_VREF = 3.0408 V FUNCT. DIGITAL TEST = 2 error detected in test: FUNCT@5.0V:ATOM18 13160.0 FUNCT@5.0V:ATOM18HF 13160.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3777.0 FUNCT@5.0V:ATOM45C_40 3777.0 FUNCT@5.0V:ATOM46C_40 3777.0 FUNCT@5.0V:ATOM47C_40 3777.0 FUNCT@5.0V:ATOM48C_40 3777.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3777.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1243.0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:805 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0122 b(slope) = 0.0108 chi2 = 0.5549 VTN P-side: a = 0.0121 b(slope) = 0.0065 chi2 = 0.2956 CAL_IN N-side: a = 2.4672 b(slope) = 0.0086 chi2 = 0.9400 CAL_IN P-side: a = 2.4671 b(slope) = 0.0086 chi2 = 0.4928 VTP N-side(average) = 0.7016 V CAL_BASE = 2.4709 V VTP P-side(average) = 0.4321 V CAL_VREF = 3.0229 V FUNCT. DIGITAL TEST = 34 error detected in test: FUNCT@5.0V:ATOM13A 1895.0 FUNCT@5.0V:ATOM15 1939.0 FUNCT@5.0V:ATOM17 4251.0 FUNCT@5.0V:ATOM18 4267.0 FUNCT@5.0V:ATOM18HF 4267.0 FUNCT@5.0V:ATOM19 4203.0 FUNCT@5.0V:ATOM19D 4218.0 FUNCT@5.0V:ATOM19E 3445.0 FUNCT@5.0V:ATOM19F 7318.0 FUNCT@5.0V:ATOM19FHF 7318.0 FUNCT@5.0V:ATOM20 1911.0 FUNCT@5.0V:ATOM21 1887.0 FUNCT@5.0V:ATOM22 1875.0 FUNCT@5.0V:ATOM25 1893.0 FUNCT@5.0V:ATOM25HF 1893.0 FUNCT@5.0V:ATOM26A 1872.0 FUNCT@5.0V:ATOM26B 2681.0 FUNCT@5.0V:ATOM28 2009.0 FUNCT@5.0V:ATOM29 2009.0 FUNCT@5.0V:ATOM30 2009.0 FUNCT@5.0V:ATOM31A 1643.0 FUNCT@5.0V:ATOM31B 1832.0 FUNCT@5.0V:ATOM32 1643.0 FUNCT@5.0V:ATOM33 2009.0 FUNCT@5.0V:ATOM35 2143.0 FUNCT@5.0V:ATOM36 1899.0 FUNCT@5.0V:ATOM37A 2886.0 FUNCT@5.0V:ATOM37B 2878.0 FUNCT@5.0V:ATOM37C 2862.0 FUNCT@5.0V:ATOM37D 2830.0 FUNCT@5.0V:ATOM37E 2821.0 FUNCT@5.0V:ATOM39 1920.0 FUNCT@5.0V:ATOM41 2446.0 FUNCT@5.0V:ATOM41A 2446.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4695.0 FUNCT@5.0V:ATOM45C_40 4695.0 FUNCT@5.0V:ATOM46C_40 4695.0 FUNCT@5.0V:ATOM47C_40 4695.0 FUNCT@5.0V:ATOM48C_40 4695.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4695.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:806 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 2 error detected in test: IDDSB:VDD1D 0.1040 IDDOP1:DVDD 0.1115 DACS TEST = 0 VTN N-side: a = 0.0171 b(slope) = 0.0109 chi2 = 1.2544 VTN P-side: a = 0.0174 b(slope) = 0.0066 chi2 = 1.1604 CAL_IN N-side: a = 2.5093 b(slope) = 0.0083 chi2 = 1.7745 CAL_IN P-side: a = 2.5087 b(slope) = 0.0083 chi2 = 2.0175 VTP N-side(average) = 0.7141 V CAL_BASE = 2.5124 V VTP P-side(average) = 0.4421 V CAL_VREF = 3.0435 V FUNCT. DIGITAL TEST = 50 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 FUNCT@5.0V:ATOM7TO9B 272.0 FUNCT@5.0V:ATOM7TO9C 272.0 FUNCT@5.0V:ATOM7TO9D 272.0 FUNCT@5.0V:ATOM7TO9E 272.0 FUNCT@5.0V:ATOM10TO12 496.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM34 268.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:706 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0142 b(slope) = 0.0109 chi2 = 1.4288 VTN P-side: a = 0.0144 b(slope) = 0.0066 chi2 = 0.4548 CAL_IN N-side: a = 2.5045 b(slope) = 0.0085 chi2 = 0.9596 CAL_IN P-side: a = 2.5045 b(slope) = 0.0085 chi2 = 1.1950 VTP N-side(average) = 0.7109 V CAL_BASE = 2.5078 V VTP P-side(average) = 0.4403 V CAL_VREF = 3.0547 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:606 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0129 b(slope) = 0.0106 chi2 = 1.1091 VTN P-side: a = 0.0131 b(slope) = 0.0065 chi2 = 0.5751 CAL_IN N-side: a = 2.4671 b(slope) = 0.0086 chi2 = 0.5225 CAL_IN P-side: a = 2.4674 b(slope) = 0.0086 chi2 = 0.5406 VTP N-side(average) = 0.6962 V CAL_BASE = 2.4702 V VTP P-side(average) = 0.4284 V CAL_VREF = 3.0200 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:506 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0116 b(slope) = 0.0108 chi2 = 0.9202 VTN P-side: a = 0.0119 b(slope) = 0.0066 chi2 = 0.3799 CAL_IN N-side: a = 2.4988 b(slope) = 0.0086 chi2 = 1.0220 CAL_IN P-side: a = 2.4989 b(slope) = 0.0086 chi2 = 4.1054 VTP N-side(average) = 0.7069 V CAL_BASE = 2.5029 V VTP P-side(average) = 0.4343 V CAL_VREF = 3.0552 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:406 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0128 b(slope) = 0.0109 chi2 = 0.9210 VTN P-side: a = 0.0128 b(slope) = 0.0066 chi2 = 0.4143 CAL_IN N-side: a = 2.4843 b(slope) = 0.0086 chi2 = 0.4208 CAL_IN P-side: a = 2.4841 b(slope) = 0.0086 chi2 = 0.4884 VTP N-side(average) = 0.7109 V CAL_BASE = 2.4878 V VTP P-side(average) = 0.4392 V CAL_VREF = 3.0369 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3859.0 FUNCT@5.0V:ATOM45C_40 3859.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3859.0 FUNCT@5.0V:ATOM48C_40 3859.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3859.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:306 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0121 b(slope) = 0.0106 chi2 = 0.9847 VTN P-side: a = 0.0122 b(slope) = 0.0064 chi2 = 0.4093 CAL_IN N-side: a = 2.4805 b(slope) = 0.0086 chi2 = 0.7599 CAL_IN P-side: a = 2.4803 b(slope) = 0.0086 chi2 = 0.8765 VTP N-side(average) = 0.6897 V CAL_BASE = 2.4819 V VTP P-side(average) = 0.4246 V CAL_VREF = 3.0310 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:206 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0144 b(slope) = 0.0106 chi2 = 2.3156 VTN P-side: a = 0.0149 b(slope) = 0.0064 chi2 = 0.7326 CAL_IN N-side: a = 2.4701 b(slope) = 0.0085 chi2 = 0.9638 CAL_IN P-side: a = 2.4704 b(slope) = 0.0086 chi2 = 1.7055 VTP N-side(average) = 0.6925 V CAL_BASE = 2.4709 V VTP P-side(average) = 0.4273 V CAL_VREF = 3.0168 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:107 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0134 b(slope) = 0.0106 chi2 = 0.7940 VTN P-side: a = 0.0132 b(slope) = 0.0065 chi2 = 0.4072 CAL_IN N-side: a = 2.5235 b(slope) = 0.0082 chi2 = 0.4826 CAL_IN P-side: a = 2.5232 b(slope) = 0.0082 chi2 = 1.4684 VTP N-side(average) = 0.6939 V CAL_BASE = 2.5268 V VTP P-side(average) = 0.4287 V CAL_VREF = 3.0540 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:207 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0120 b(slope) = 0.0106 chi2 = 0.8509 VTN P-side: a = 0.0118 b(slope) = 0.0065 chi2 = 0.3554 CAL_IN N-side: a = 2.4596 b(slope) = 0.0086 chi2 = 0.6451 CAL_IN P-side: a = 2.4598 b(slope) = 0.0086 chi2 = 0.6385 VTP N-side(average) = 0.6915 V CAL_BASE = 2.4634 V VTP P-side(average) = 0.4269 V CAL_VREF = 3.0171 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:307 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0145 b(slope) = 0.0106 chi2 = 0.7273 VTN P-side: a = 0.0140 b(slope) = 0.0065 chi2 = 0.1580 CAL_IN N-side: a = 2.4723 b(slope) = 0.0085 chi2 = 0.7396 CAL_IN P-side: a = 2.4725 b(slope) = 0.0085 chi2 = 5.0733 VTP N-side(average) = 0.6925 V CAL_BASE = 2.4763 V VTP P-side(average) = 0.4299 V CAL_VREF = 3.0234 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:407 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0147 b(slope) = 0.0106 chi2 = 1.1614 VTN P-side: a = 0.0146 b(slope) = 0.0065 chi2 = 0.5476 CAL_IN N-side: a = 2.4791 b(slope) = 0.0085 chi2 = 0.7298 CAL_IN P-side: a = 2.4790 b(slope) = 0.0085 chi2 = 0.4744 VTP N-side(average) = 0.6950 V CAL_BASE = 2.4797 V VTP P-side(average) = 0.4304 V CAL_VREF = 3.0237 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:507 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0114 b(slope) = 0.0107 chi2 = 1.1888 VTN P-side: a = 0.0118 b(slope) = 0.0065 chi2 = 0.3570 CAL_IN N-side: a = 2.4931 b(slope) = 0.0086 chi2 = 0.7054 CAL_IN P-side: a = 2.4933 b(slope) = 0.0086 chi2 = 0.4165 VTP N-side(average) = 0.6980 V CAL_BASE = 2.4988 V VTP P-side(average) = 0.4283 V CAL_VREF = 3.0513 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:607 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 2 VTN N-side: a = 0.0106 b(slope) = 0.0105 chi2 = 1.0608 VTN P-side: a = 0.0109 b(slope) = 0.0065 chi2 = 0.2358 CAL_IN N-side: a = 2.4855 b(slope) = 0.0084 chi2 = 1.2658 CAL_IN P-side: a = 2.4847 b(slope) = 0.0084 chi2 = 11.3996 VTP N-side(average) = 0.6869 V CAL_BASE = 2.4880 V VTP P-side(average) = 0.4256 V CAL_VREF = 3.0256 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:707 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 2 VTN N-side: a = 0.0136 b(slope) = 0.0107 chi2 = 1.2444 VTN P-side: a = 0.0134 b(slope) = 0.0065 chi2 = 0.4009 CAL_IN N-side: a = 2.4894 b(slope) = 0.0085 chi2 = 1.0153 CAL_IN P-side: a = 2.4887 b(slope) = 0.0085 chi2 = 15.5636 VTP N-side(average) = 0.7005 V CAL_BASE = 2.4922 V VTP P-side(average) = 0.4335 V CAL_VREF = 3.0352 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:807 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0249 b(slope) = 0.0106 chi2 = 99.0000 VTN P-side: a = 0.0131 b(slope) = 0.0067 chi2 = 0.5593 CAL_IN N-side: a = 2.5018 b(slope) = 0.0081 chi2 = 99.0000 CAL_IN P-side: a = 2.4852 b(slope) = 0.0085 chi2 = 5.6181 VTP N-side(average) = 0.7106 V CAL_BASE = 2.4893 V VTP P-side(average) = 0.4434 V CAL_VREF = 3.0317 V FUNCT. DIGITAL TEST = 31 error detected in test: FUNCT@5.0V:ATOM13A 1600.0 FUNCT@5.0V:ATOM15 1644.0 FUNCT@5.0V:ATOM17 3956.0 FUNCT@5.0V:ATOM18 3972.0 FUNCT@5.0V:ATOM18HF 3972.0 FUNCT@5.0V:ATOM19 3908.0 FUNCT@5.0V:ATOM19D 3923.0 FUNCT@5.0V:ATOM19E 3150.0 FUNCT@5.0V:ATOM19F 7023.0 FUNCT@5.0V:ATOM19FHF 7023.0 FUNCT@5.0V:ATOM20 1616.0 FUNCT@5.0V:ATOM21 1592.0 FUNCT@5.0V:ATOM22 1580.0 FUNCT@5.0V:ATOM25 1598.0 FUNCT@5.0V:ATOM25HF 1598.0 FUNCT@5.0V:ATOM26B 2386.0 FUNCT@5.0V:ATOM28 1714.0 FUNCT@5.0V:ATOM29 1714.0 FUNCT@5.0V:ATOM30 1714.0 FUNCT@5.0V:ATOM31A 1348.0 FUNCT@5.0V:ATOM31B 1537.0 FUNCT@5.0V:ATOM32 1348.0 FUNCT@5.0V:ATOM33 1714.0 FUNCT@5.0V:ATOM35 1848.0 FUNCT@5.0V:ATOM36 1604.0 FUNCT@5.0V:ATOM37A 2288.0 FUNCT@5.0V:ATOM37B 2280.0 FUNCT@5.0V:ATOM37E 2223.0 FUNCT@5.0V:ATOM39 1625.0 FUNCT@5.0V:ATOM41 2151.0 FUNCT@5.0V:ATOM41A 2151.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1403.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:907 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0137 b(slope) = 0.0110 chi2 = 0.8113 VTN P-side: a = 0.0139 b(slope) = 0.0068 chi2 = 0.4967 CAL_IN N-side: a = 2.5089 b(slope) = 0.0083 chi2 = 0.6836 CAL_IN P-side: a = 2.5090 b(slope) = 0.0083 chi2 = 0.4052 VTP N-side(average) = 0.7161 V CAL_BASE = 2.5090 V VTP P-side(average) = 0.4488 V CAL_VREF = 3.0417 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:908 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0108 b(slope) = 0.0109 chi2 = 2.1546 VTN P-side: a = 0.0181 b(slope) = 0.0061 chi2 = 99.0000 CAL_IN N-side: a = 2.4836 b(slope) = 0.0085 chi2 = 1.3267 CAL_IN P-side: a = 2.4892 b(slope) = 0.0078 chi2 = 99.0000 VTP N-side(average) = 0.7092 V CAL_BASE = 2.4880 V VTP P-side(average) = 0.4444 V CAL_VREF = 3.0308 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1130.0 FUNCT@5.0V:ATOM13C 1130.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM23 984.0 FUNCT@5.0V:ATOM24 1084.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1218.0 FUNCT@5.0V:ATOM37B 1206.0 FUNCT@5.0V:ATOM37C 1191.0 FUNCT@5.0V:ATOM37D 1160.0 FUNCT@5.0V:ATOM37E 1152.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1411.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:808 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 1 error detected in test: IDDOP1:DVDD 0.1163 DACS TEST = 0 VTN N-side: a = 0.0138 b(slope) = 0.0111 chi2 = 0.6670 VTN P-side: a = 0.0139 b(slope) = 0.0069 chi2 = 0.5051 CAL_IN N-side: a = 2.5115 b(slope) = 0.0083 chi2 = 0.9490 CAL_IN P-side: a = 2.5115 b(slope) = 0.0084 chi2 = 0.9939 VTP N-side(average) = 0.7238 V CAL_BASE = 2.5147 V VTP P-side(average) = 0.4537 V CAL_VREF = 3.0498 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1128.0 FUNCT@5.0V:ATOM13C 1128.0 FUNCT@5.0V:ATOM15 1106.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 810.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1216.0 FUNCT@5.0V:ATOM37B 1206.0 FUNCT@5.0V:ATOM37C 1191.0 FUNCT@5.0V:ATOM37D 1160.0 FUNCT@5.0V:ATOM37E 1151.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1613.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:708 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0114 b(slope) = 0.0109 chi2 = 0.9350 VTN P-side: a = 0.0111 b(slope) = 0.0067 chi2 = 0.2266 CAL_IN N-side: a = 2.5047 b(slope) = 0.0084 chi2 = 0.7304 CAL_IN P-side: a = 2.5049 b(slope) = 0.0084 chi2 = 0.4581 VTP N-side(average) = 0.7127 V CAL_BASE = 2.5081 V VTP P-side(average) = 0.4415 V CAL_VREF = 3.0442 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:608 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0110 b(slope) = 0.0107 chi2 = 0.5690 VTN P-side: a = 0.0109 b(slope) = 0.0065 chi2 = 0.3899 CAL_IN N-side: a = 2.4841 b(slope) = 0.0084 chi2 = 0.6914 CAL_IN P-side: a = 2.4844 b(slope) = 0.0084 chi2 = 0.5445 VTP N-side(average) = 0.6947 V CAL_BASE = 2.4853 V VTP P-side(average) = 0.4298 V CAL_VREF = 3.0208 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:508 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = -0.0852 b(slope) = 0.0097 chi2 = 99.0000 VTN P-side: a = -0.0170 b(slope) = 0.0065 chi2 = 99.0000 CAL_IN N-side: a = 2.5253 b(slope) = 0.0082 chi2 = 30.1823 CAL_IN P-side: a = 2.5249 b(slope) = 0.0082 chi2 = 13.6742 VTP N-side(average) = 0.6974 V CAL_BASE = 2.5293 V VTP P-side(average) = 0.4302 V CAL_VREF = 3.0608 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:408 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0111 b(slope) = 0.0108 chi2 = 1.3324 VTN P-side: a = 0.0112 b(slope) = 0.0066 chi2 = 0.3674 CAL_IN N-side: a = 2.4942 b(slope) = 0.0084 chi2 = 0.8899 CAL_IN P-side: a = 2.4945 b(slope) = 0.0084 chi2 = 1.0495 VTP N-side(average) = 0.7034 V CAL_BASE = 2.4985 V VTP P-side(average) = 0.4353 V CAL_VREF = 3.0396 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:308 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0105 b(slope) = 0.0107 chi2 = 1.5296 VTN P-side: a = 0.0106 b(slope) = 0.0065 chi2 = 0.4194 CAL_IN N-side: a = 2.5130 b(slope) = 0.0083 chi2 = 0.4106 CAL_IN P-side: a = 2.5130 b(slope) = 0.0083 chi2 = 0.8173 VTP N-side(average) = 0.6968 V CAL_BASE = 2.5134 V VTP P-side(average) = 0.4295 V CAL_VREF = 3.0469 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:208 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0107 chi2 = 1.3536 VTN P-side: a = 0.0104 b(slope) = 0.0065 chi2 = 0.7283 CAL_IN N-side: a = 2.5126 b(slope) = 0.0083 chi2 = 0.7818 CAL_IN P-side: a = 2.5128 b(slope) = 0.0083 chi2 = 0.7170 VTP N-side(average) = 0.6954 V CAL_BASE = 2.5164 V VTP P-side(average) = 0.4284 V CAL_VREF = 3.0454 V FUNCT. DIGITAL TEST = 11 error detected in test: FUNCT@5.0V:ATOM18 10831.0 FUNCT@5.0V:ATOM18HF 10831.0 FUNCT@5.0V:ATOM25 2220.0 FUNCT@5.0V:ATOM25HF 2220.0 FUNCT@5.0V:ATOM35 1548.0 FUNCT@5.0V:ATOM36 2997.0 FUNCT@5.0V:ATOM37A 1215.0 FUNCT@5.0V:ATOM37B 1208.0 FUNCT@5.0V:ATOM37C 1182.0 FUNCT@5.0V:ATOM37D 1150.0 FUNCT@5.0V:ATOM37E 1143.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3714.0 FUNCT@5.0V:ATOM45C_40 3714.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3714.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3714.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1245.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1401.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:108 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0103 b(slope) = 0.0107 chi2 = 0.6626 VTN P-side: a = 0.0106 b(slope) = 0.0065 chi2 = 0.5132 CAL_IN N-side: a = 2.4986 b(slope) = 0.0084 chi2 = 1.0340 CAL_IN P-side: a = 2.4980 b(slope) = 0.0084 chi2 = 4.0891 VTP N-side(average) = 0.6956 V CAL_BASE = 2.5039 V VTP P-side(average) = 0.4288 V CAL_VREF = 3.0400 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:209 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0110 b(slope) = 0.0106 chi2 = 0.3275 VTN P-side: a = 0.0110 b(slope) = 0.0065 chi2 = 0.4149 CAL_IN N-side: a = 2.4698 b(slope) = 0.0086 chi2 = 0.5652 CAL_IN P-side: a = 2.4696 b(slope) = 0.0086 chi2 = 0.6971 VTP N-side(average) = 0.6910 V CAL_BASE = 2.4736 V VTP P-side(average) = 0.4278 V CAL_VREF = 3.0220 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 2007.0 FUNCT@5.0V:ATOM13B 2063.0 FUNCT@5.0V:ATOM13C 2063.0 FUNCT@5.0V:ATOM15 2051.0 FUNCT@5.0V:ATOM17 4363.0 FUNCT@5.0V:ATOM18 4379.0 FUNCT@5.0V:ATOM18HF 4379.0 FUNCT@5.0V:ATOM19 4315.0 FUNCT@5.0V:ATOM19D 4330.0 FUNCT@5.0V:ATOM19E 3557.0 FUNCT@5.0V:ATOM19F 6500.0 FUNCT@5.0V:ATOM19FHF 6500.0 FUNCT@5.0V:ATOM20 2023.0 FUNCT@5.0V:ATOM21 1999.0 FUNCT@5.0V:ATOM22 1987.0 FUNCT@5.0V:ATOM25 2005.0 FUNCT@5.0V:ATOM25HF 2005.0 FUNCT@5.0V:ATOM26A 1984.0 FUNCT@5.0V:ATOM26B 2793.0 FUNCT@5.0V:ATOM28 2121.0 FUNCT@5.0V:ATOM29 2121.0 FUNCT@5.0V:ATOM30 2121.0 FUNCT@5.0V:ATOM31A 1755.0 FUNCT@5.0V:ATOM31B 1944.0 FUNCT@5.0V:ATOM32 1755.0 FUNCT@5.0V:ATOM33 2121.0 FUNCT@5.0V:ATOM35 2255.0 FUNCT@5.0V:ATOM36 2011.0 FUNCT@5.0V:ATOM37A 3094.0 FUNCT@5.0V:ATOM37B 3086.0 FUNCT@5.0V:ATOM37C 3070.0 FUNCT@5.0V:ATOM37D 1163.0 FUNCT@5.0V:ATOM37E 3029.0 FUNCT@5.0V:ATOM39 2032.0 FUNCT@5.0V:ATOM41 2558.0 FUNCT@5.0V:ATOM41A 2558.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 4147.0 FUNCT@5.0V:ATOM45C_40 4147.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 4147.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 4147.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:309 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0110 b(slope) = 0.0105 chi2 = 0.5488 VTN P-side: a = 0.0110 b(slope) = 0.0064 chi2 = 0.3445 CAL_IN N-side: a = 2.4742 b(slope) = 0.0085 chi2 = 0.5646 CAL_IN P-side: a = 2.4743 b(slope) = 0.0085 chi2 = 0.6153 VTP N-side(average) = 0.6829 V CAL_BASE = 2.4812 V VTP P-side(average) = 0.4217 V CAL_VREF = 3.0256 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:409 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0102 b(slope) = 0.0107 chi2 = 2.4621 VTN P-side: a = 0.0109 b(slope) = 0.0065 chi2 = 1.0163 CAL_IN N-side: a = 3.0926 b(slope) = 0.0000 chi2 = 3.1166 CAL_IN P-side: a = 3.0925 b(slope) = 0.0000 chi2 = 1.9843 VTP N-side(average) = 0.6984 V CAL_BASE = 2.4800 V VTP P-side(average) = 0.4307 V CAL_VREF = 3.0332 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:509 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0107 b(slope) = 0.0107 chi2 = 0.5276 VTN P-side: a = 0.0107 b(slope) = 0.0065 chi2 = 0.2648 CAL_IN N-side: a = 2.4924 b(slope) = 0.0086 chi2 = 1.3599 CAL_IN P-side: a = 2.4918 b(slope) = 0.0085 chi2 = 2.7801 VTP N-side(average) = 0.6974 V CAL_BASE = 2.4949 V VTP P-side(average) = 0.4293 V CAL_VREF = 3.0449 V FUNCT. DIGITAL TEST = 49 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 FUNCT@5.0V:ATOM7TO9B 272.0 FUNCT@5.0V:ATOM7TO9C 272.0 FUNCT@5.0V:ATOM7TO9D 272.0 FUNCT@5.0V:ATOM7TO9E 272.0 FUNCT@5.0V:ATOM10TO12 496.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1098.0 FUNCT@5.0V:ATOM13C 1098.0 FUNCT@5.0V:ATOM15 1086.0 FUNCT@5.0V:ATOM17 3398.0 FUNCT@5.0V:ATOM18 3414.0 FUNCT@5.0V:ATOM18HF 3414.0 FUNCT@5.0V:ATOM19 3350.0 FUNCT@5.0V:ATOM19D 3365.0 FUNCT@5.0V:ATOM19E 2592.0 FUNCT@5.0V:ATOM19F 6465.0 FUNCT@5.0V:ATOM19FHF 6465.0 FUNCT@5.0V:ATOM20 1058.0 FUNCT@5.0V:ATOM21 1034.0 FUNCT@5.0V:ATOM22 1022.0 FUNCT@5.0V:ATOM23 954.0 FUNCT@5.0V:ATOM24 1054.0 FUNCT@5.0V:ATOM25 1040.0 FUNCT@5.0V:ATOM25HF 1040.0 FUNCT@5.0V:ATOM26A 1019.0 FUNCT@5.0V:ATOM26B 1828.0 FUNCT@5.0V:ATOM28 1156.0 FUNCT@5.0V:ATOM29 1156.0 FUNCT@5.0V:ATOM30 1156.0 FUNCT@5.0V:ATOM31A 790.0 FUNCT@5.0V:ATOM31B 979.0 FUNCT@5.0V:ATOM32 790.0 FUNCT@5.0V:ATOM33 1156.0 FUNCT@5.0V:ATOM35 1290.0 FUNCT@5.0V:ATOM36 1046.0 FUNCT@5.0V:ATOM37A 1186.0 FUNCT@5.0V:ATOM37B 1178.0 FUNCT@5.0V:ATOM37C 1162.0 FUNCT@5.0V:ATOM37D 1130.0 FUNCT@5.0V:ATOM37E 1121.0 FUNCT@5.0V:ATOM39 1067.0 FUNCT@5.0V:ATOM41 1593.0 FUNCT@5.0V:ATOM41A 1593.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3646.0 FUNCT@5.0V:ATOM45C_40 3646.0 FUNCT@5.0V:ATOM46C_40 3646.0 FUNCT@5.0V:ATOM47C_40 3646.0 FUNCT@5.0V:ATOM48C_40 3646.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3646.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1224.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1381.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 271.0 FUNCT@5.0V:A10TO12HF 495.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:609 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0107 chi2 = 1.2152 VTN P-side: a = 0.0100 b(slope) = 0.0066 chi2 = 0.6191 CAL_IN N-side: a = 2.4888 b(slope) = 0.0084 chi2 = 0.9987 CAL_IN P-side: a = 2.4885 b(slope) = 0.0084 chi2 = 2.7914 VTP N-side(average) = 0.6934 V CAL_BASE = 2.4902 V VTP P-side(average) = 0.4329 V CAL_VREF = 3.0276 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:709 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0104 b(slope) = 0.0107 chi2 = 1.1671 VTN P-side: a = 0.0105 b(slope) = 0.0066 chi2 = 0.3708 CAL_IN N-side: a = 2.4948 b(slope) = 0.0084 chi2 = 1.3939 CAL_IN P-side: a = 2.4943 b(slope) = 0.0084 chi2 = 1.0588 VTP N-side(average) = 0.7002 V CAL_BASE = 2.4968 V VTP P-side(average) = 0.4368 V CAL_VREF = 3.0369 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:809 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0106 b(slope) = 0.0109 chi2 = 0.9390 VTN P-side: a = 0.0108 b(slope) = 0.0067 chi2 = 0.4752 CAL_IN N-side: a = 2.5036 b(slope) = 0.0084 chi2 = 0.5532 CAL_IN P-side: a = 2.5036 b(slope) = 0.0084 chi2 = 0.4688 VTP N-side(average) = 0.7074 V CAL_BASE = 2.5073 V VTP P-side(average) = 0.4412 V CAL_VREF = 3.0425 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:810 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0121 b(slope) = 0.0110 chi2 = 1.0425 VTN P-side: a = 0.0121 b(slope) = 0.0068 chi2 = 0.3810 CAL_IN N-side: a = 2.7875 b(slope) = 0.0069 chi2 = 99.0000 CAL_IN P-side: a = 2.6193 b(slope) = 0.0088 chi2 = 99.0000 VTP N-side(average) = 0.7166 V CAL_BASE = 2.5310 V VTP P-side(average) = 0.4454 V CAL_VREF = 3.0584 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:710 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0101 b(slope) = 0.0109 chi2 = 1.1597 VTN P-side: a = 0.0105 b(slope) = 0.0067 chi2 = 0.6789 CAL_IN N-side: a = 2.4863 b(slope) = 0.0085 chi2 = 0.8462 CAL_IN P-side: a = 2.4862 b(slope) = 0.0085 chi2 = 0.6618 VTP N-side(average) = 0.7082 V CAL_BASE = 2.4932 V VTP P-side(average) = 0.4426 V CAL_VREF = 3.0486 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:610 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0108 chi2 = 0.7917 VTN P-side: a = 0.0101 b(slope) = 0.0066 chi2 = 0.3614 CAL_IN N-side: a = 2.5002 b(slope) = 0.0084 chi2 = 1.1590 CAL_IN P-side: a = 2.5003 b(slope) = 0.0084 chi2 = 0.9948 VTP N-side(average) = 0.7008 V CAL_BASE = 2.5056 V VTP P-side(average) = 0.4350 V CAL_VREF = 3.0408 V FUNCT. DIGITAL TEST = 1 error detected in test: FUNCT@5.0V:ATOM34 320.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:510 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0126 b(slope) = 0.0109 chi2 = 0.5660 VTN P-side: a = 0.0125 b(slope) = 0.0067 chi2 = 0.4683 CAL_IN N-side: a = 2.4952 b(slope) = 0.0086 chi2 = 0.9030 CAL_IN P-side: a = 2.4951 b(slope) = 0.0085 chi2 = 4.5113 VTP N-side(average) = 0.7102 V CAL_BASE = 2.4990 V VTP P-side(average) = 0.4397 V CAL_VREF = 3.0493 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:410 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0122 b(slope) = 0.0107 chi2 = 0.8795 VTN P-side: a = 0.0123 b(slope) = 0.0065 chi2 = 0.3376 CAL_IN N-side: a = 2.4877 b(slope) = 0.0086 chi2 = 0.9419 CAL_IN P-side: a = 2.4882 b(slope) = 0.0086 chi2 = 0.6884 VTP N-side(average) = 0.6995 V CAL_BASE = 2.4895 V VTP P-side(average) = 0.4288 V CAL_VREF = 3.0474 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:310 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0123 b(slope) = 0.0108 chi2 = 0.6037 VTN P-side: a = 0.0122 b(slope) = 0.0065 chi2 = 0.5204 CAL_IN N-side: a = 2.4844 b(slope) = 0.0085 chi2 = 0.6354 CAL_IN P-side: a = 2.4847 b(slope) = 0.0085 chi2 = 0.5140 VTP N-side(average) = 0.7030 V CAL_BASE = 2.4900 V VTP P-side(average) = 0.4299 V CAL_VREF = 3.0398 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:210 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 28 error detected in test: IDDSB:VDD0A 0.1772 IDDSB:VDD0B 0.1772 IDDSB:VDD0C 0.1771 IDDSB:VDD1C 0.1005 IDDSB:VDD0D 0.1771 IDDSB:VDD1D 0.1059 V_AVDD2IMA:277/L10 1.3684 AVDD_A:AVDDP-M 0.9441 IAVDD2_A:AVDDP-M 0.0944 V_V1RA:169/L5 3.4927 V_N310A:171/L6 1.3689 V_AVDD2IMB:277/L10 1.3686 AVDD_B:AVDDP-M 0.9434 IAVDD2_B:AVDDP-M 0.0943 V_V1RB:169/L5 3.4934 V_N310B:171/L6 1.3686 V_AVDD2IMC:277/L10 1.3684 AVDD_C:AVDDP-M 0.9441 IAVDD2_C:AVDDP-M 0.0944 V_V1RC:169/L5 3.4929 V_N310C:171/L6 1.3686 V_AVDD2IMD:277/L10 1.3682 AVDD_D:AVDDP-M 0.9438 IAVDD2_D:AVDDP-M 0.0944 V_V1RD:169/L5 3.4924 V_N310D:171/L6 1.3686 IDDOP0:AVDD 0.1622 IDDOP1:DVDD 0.1341 DACS TEST = 1 VTN N-side: a = 0.2406 b(slope) = 0.0000 chi2 = 0.2559 VTN P-side: a = 0.1590 b(slope) = 0.0000 chi2 = 0.2412 CAL_IN N-side: a = 3.0935 b(slope) = 0.0000 chi2 = 2.8835 CAL_IN P-side: a = 3.0934 b(slope) = 0.0000 chi2 = 1.8416 VTP N-side(average) = 0.7132 V CAL_BASE = 2.4851 V VTP P-side(average) = 0.4441 V CAL_VREF = 3.5061 V FUNCT. DIGITAL TEST = 51 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 FUNCT@5.0V:ATOM7TO9B 272.0 FUNCT@5.0V:ATOM7TO9C 272.0 FUNCT@5.0V:ATOM7TO9D 272.0 FUNCT@5.0V:ATOM7TO9E 272.0 FUNCT@5.0V:ATOM10TO12 496.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM34 268.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 FUNCT@5.0V:ATOM42 369.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:211 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 6 error detected in test: IDDSB:VDD1D 0.1042 V_V1RA:169/L5 3.5037 V_V1RB:169/L5 3.5032 V_V1RC:169/L5 3.5037 V_V1RD:169/L5 3.5020 IDDOP1:DVDD 0.1048 DACS TEST = 1 VTN N-side: a = 0.0131 b(slope) = 0.0001 chi2 = 15.2688 VTN P-side: a = 0.0121 b(slope) = 0.0001 chi2 = 7.8629 CAL_IN N-side: a = 3.0934 b(slope) = 0.0000 chi2 = 3.5825 CAL_IN P-side: a = 3.0937 b(slope) = 0.0000 chi2 = 2.0737 VTP N-side(average) = 0.0199 V CAL_BASE = 2.4429 V VTP P-side(average) = 0.0184 V CAL_VREF = 3.5149 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1128.0 FUNCT@5.0V:ATOM13C 1128.0 FUNCT@5.0V:ATOM15 212.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3370.0 FUNCT@5.0V:ATOM19D 212.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6485.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1078.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1042.0 FUNCT@5.0V:ATOM24 212.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 1848.0 FUNCT@5.0V:ATOM28 1176.0 FUNCT@5.0V:ATOM29 1176.0 FUNCT@5.0V:ATOM30 1176.0 FUNCT@5.0V:ATOM31A 810.0 FUNCT@5.0V:ATOM31B 999.0 FUNCT@5.0V:ATOM32 212.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1066.0 FUNCT@5.0V:ATOM37A 1216.0 FUNCT@5.0V:ATOM37B 1206.0 FUNCT@5.0V:ATOM37C 1191.0 FUNCT@5.0V:ATOM37D 1160.0 FUNCT@5.0V:ATOM37E 1151.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 212.0 FUNCT@5.0V:ATOM41A 1613.0 FUNCT@5.0V:ATOM42 212.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3683.0 FUNCT@5.0V:ATOM45C_40 212.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 212.0 FUNCT@5.0V:ATOM48C_40 3683.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 212.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 212.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:311 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.4951 V_V1RB:169/L5 3.4956 V_V1RC:169/L5 3.4949 V_V1RD:169/L5 3.4936 DACS TEST = 1 VTN N-side: a = 0.0125 b(slope) = 0.0106 chi2 = 0.9661 VTN P-side: a = 0.0127 b(slope) = 0.0064 chi2 = 0.3034 CAL_IN N-side: a = 3.0954 b(slope) = 0.0000 chi2 = 2.5381 CAL_IN P-side: a = 3.0955 b(slope) = 0.0000 chi2 = 1.8924 VTP N-side(average) = 0.6900 V CAL_BASE = 2.3999 V VTP P-side(average) = 0.4226 V CAL_VREF = 3.5076 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:411 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0119 b(slope) = 0.0107 chi2 = 0.9817 VTN P-side: a = 0.0120 b(slope) = 0.0065 chi2 = 0.6545 CAL_IN N-side: a = 3.0920 b(slope) = 0.0000 chi2 = 57.1138 CAL_IN P-side: a = 3.0924 b(slope) = 0.0000 chi2 = 4.8207 VTP N-side(average) = 0.6952 V CAL_BASE = 2.4846 V VTP P-side(average) = 0.4301 V CAL_VREF = 3.0493 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5501.0 FUNCT@5.0V:ATOM45C_40 4923.0 FUNCT@5.0V:ATOM46C_40 3683.0 FUNCT@5.0V:ATOM47C_40 5501.0 FUNCT@5.0V:ATOM48C_40 5501.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5501.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1409.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:511 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0127 b(slope) = 0.0107 chi2 = 0.8375 VTN P-side: a = 0.0125 b(slope) = 0.0065 chi2 = 0.3088 CAL_IN N-side: a = 3.0926 b(slope) = 0.0000 chi2 = 2.8917 CAL_IN P-side: a = 3.0925 b(slope) = 0.0000 chi2 = 1.8285 VTP N-side(average) = 0.6956 V CAL_BASE = 2.4888 V VTP P-side(average) = 0.4295 V CAL_VREF = 3.0364 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 2 error detected in test: TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 ------- CHIP ID:611 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0116 b(slope) = 0.0107 chi2 = 1.0240 VTN P-side: a = 0.0116 b(slope) = 0.0066 chi2 = 0.6186 CAL_IN N-side: a = 2.4727 b(slope) = 0.0085 chi2 = 1.2146 CAL_IN P-side: a = 2.4731 b(slope) = 0.0085 chi2 = 0.9776 VTP N-side(average) = 0.6967 V CAL_BASE = 2.4753 V VTP P-side(average) = 0.4325 V CAL_VREF = 3.0222 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:711 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0125 b(slope) = 0.0109 chi2 = 1.1915 VTN P-side: a = 0.0126 b(slope) = 0.0067 chi2 = 0.5306 CAL_IN N-side: a = 2.4869 b(slope) = 0.0085 chi2 = 0.5229 CAL_IN P-side: a = 2.4870 b(slope) = 0.0085 chi2 = 0.3529 VTP N-side(average) = 0.7123 V CAL_BASE = 2.4932 V VTP P-side(average) = 0.4431 V CAL_VREF = 3.0403 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:811 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0144 b(slope) = 0.0110 chi2 = 0.6186 VTN P-side: a = 0.0145 b(slope) = 0.0067 chi2 = 0.4790 CAL_IN N-side: a = 2.4967 b(slope) = 0.0084 chi2 = 0.3541 CAL_IN P-side: a = 2.4967 b(slope) = 0.0084 chi2 = 0.4325 VTP N-side(average) = 0.7188 V CAL_BASE = 2.5017 V VTP P-side(average) = 0.4477 V CAL_VREF = 3.0391 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:812 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0129 b(slope) = 0.0111 chi2 = 0.6212 VTN P-side: a = 0.0127 b(slope) = 0.0069 chi2 = 0.4919 CAL_IN N-side: a = 2.5135 b(slope) = 0.0084 chi2 = 0.7034 CAL_IN P-side: a = 2.5136 b(slope) = 0.0084 chi2 = 0.4058 VTP N-side(average) = 0.7219 V CAL_BASE = 2.5164 V VTP P-side(average) = 0.4525 V CAL_VREF = 3.0530 V FUNCT. DIGITAL TEST = 38 error detected in test: FUNCT@5.0V:ATOM13A 1055.0 FUNCT@5.0V:ATOM13B 1111.0 FUNCT@5.0V:ATOM13C 1111.0 FUNCT@5.0V:ATOM15 1099.0 FUNCT@5.0V:ATOM17 3411.0 FUNCT@5.0V:ATOM18 3427.0 FUNCT@5.0V:ATOM18HF 3427.0 FUNCT@5.0V:ATOM19 3363.0 FUNCT@5.0V:ATOM19D 3378.0 FUNCT@5.0V:ATOM19E 2605.0 FUNCT@5.0V:ATOM19F 6478.0 FUNCT@5.0V:ATOM19FHF 6478.0 FUNCT@5.0V:ATOM20 1071.0 FUNCT@5.0V:ATOM21 1047.0 FUNCT@5.0V:ATOM22 1035.0 FUNCT@5.0V:ATOM23 967.0 FUNCT@5.0V:ATOM24 1067.0 FUNCT@5.0V:ATOM25 1053.0 FUNCT@5.0V:ATOM25HF 1053.0 FUNCT@5.0V:ATOM26A 1032.0 FUNCT@5.0V:ATOM26B 1841.0 FUNCT@5.0V:ATOM28 1169.0 FUNCT@5.0V:ATOM29 1169.0 FUNCT@5.0V:ATOM30 1169.0 FUNCT@5.0V:ATOM31A 803.0 FUNCT@5.0V:ATOM31B 992.0 FUNCT@5.0V:ATOM32 803.0 FUNCT@5.0V:ATOM33 1169.0 FUNCT@5.0V:ATOM35 1303.0 FUNCT@5.0V:ATOM36 1059.0 FUNCT@5.0V:ATOM37A 1199.0 FUNCT@5.0V:ATOM37B 1191.0 FUNCT@5.0V:ATOM37C 1175.0 FUNCT@5.0V:ATOM37D 1143.0 FUNCT@5.0V:ATOM37E 1134.0 FUNCT@5.0V:ATOM39 1080.0 FUNCT@5.0V:ATOM41 1606.0 FUNCT@5.0V:ATOM41A 1606.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1394.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:712 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0119 b(slope) = 0.0110 chi2 = 0.6859 VTN P-side: a = 0.0120 b(slope) = 0.0068 chi2 = 0.3473 CAL_IN N-side: a = 2.4871 b(slope) = 0.0086 chi2 = 0.5215 CAL_IN P-side: a = 2.4874 b(slope) = 0.0086 chi2 = 0.8760 VTP N-side(average) = 0.7190 V CAL_BASE = 2.4919 V VTP P-side(average) = 0.4468 V CAL_VREF = 3.0486 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM47C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:612 --------------------------------------- CLASS=B -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 2 VTN N-side: a = 0.0091 b(slope) = 0.0108 chi2 = 1.0957 VTN P-side: a = 0.0094 b(slope) = 0.0066 chi2 = 0.4740 CAL_IN N-side: a = 2.5071 b(slope) = 0.0083 chi2 = 1.3839 CAL_IN P-side: a = 2.5066 b(slope) = 0.0083 chi2 = 11.4264 VTP N-side(average) = 0.6982 V CAL_BASE = 2.5151 V VTP P-side(average) = 0.4329 V CAL_VREF = 3.0459 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:512 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.2278 b(slope) = 0.0000 chi2 = 0.2635 VTN P-side: a = 0.1434 b(slope) = 0.0000 chi2 = 0.1246 CAL_IN N-side: a = 2.7960 b(slope) = 0.0000 chi2 = 0.3097 CAL_IN P-side: a = 2.7962 b(slope) = 0.0000 chi2 = 0.2930 VTP N-side(average) = 0.7100 V CAL_BASE = 2.5330 V VTP P-side(average) = 0.4379 V CAL_VREF = 3.0686 V FUNCT. DIGITAL TEST = 55 error detected in test: FUNCT@5.0V:ATOM1TO6A 212.0 FUNCT@5.0V:ATOM1TO6B 212.0 FUNCT@5.0V:ATOM1TO6C 212.0 FUNCT@5.0V:ATOM1TO6D 212.0 FUNCT@5.0V:ATOM1TO6E 212.0 FUNCT@5.0V:ATOM7TO9A 212.0 FUNCT@5.0V:ATOM7TO9B 212.0 FUNCT@5.0V:ATOM7TO9C 212.0 FUNCT@5.0V:ATOM7TO9D 212.0 FUNCT@5.0V:ATOM7TO9E 212.0 FUNCT@5.0V:ATOM10TO12 212.0 FUNCT@5.0V:ATOM13A 212.0 FUNCT@5.0V:ATOM13B 212.0 FUNCT@5.0V:ATOM13C 212.0 FUNCT@5.0V:ATOM14 212.0 FUNCT@5.0V:ATOM15 212.0 FUNCT@5.0V:ATOM16 212.0 FUNCT@5.0V:ATOM17 212.0 FUNCT@5.0V:ATOM18 212.0 FUNCT@5.0V:ATOM19 212.0 FUNCT@5.0V:ATOM19B 212.0 FUNCT@5.0V:ATOM19C 212.0 FUNCT@5.0V:ATOM19D 212.0 FUNCT@5.0V:ATOM19E 212.0 FUNCT@5.0V:ATOM19F 212.0 FUNCT@5.0V:ATOM20 212.0 FUNCT@5.0V:ATOM21 212.0 FUNCT@5.0V:ATOM22 212.0 FUNCT@5.0V:ATOM23 212.0 FUNCT@5.0V:ATOM24 212.0 FUNCT@5.0V:ATOM25 212.0 FUNCT@5.0V:ATOM26A 212.0 FUNCT@5.0V:ATOM26B 212.0 FUNCT@5.0V:ATOM27 212.0 FUNCT@5.0V:ATOM28 212.0 FUNCT@5.0V:ATOM29 212.0 FUNCT@5.0V:ATOM30 212.0 FUNCT@5.0V:ATOM31A 212.0 FUNCT@5.0V:ATOM31B 212.0 FUNCT@5.0V:ATOM32 212.0 FUNCT@5.0V:ATOM33 212.0 FUNCT@5.0V:ATOM34 212.0 FUNCT@5.0V:ATOM35 212.0 FUNCT@5.0V:ATOM36 212.0 FUNCT@5.0V:ATOM37A 212.0 FUNCT@5.0V:ATOM37B 212.0 FUNCT@5.0V:ATOM37C 212.0 FUNCT@5.0V:ATOM37D 212.0 FUNCT@5.0V:ATOM37E 212.0 FUNCT@5.0V:ATOM38 212.0 FUNCT@5.0V:ATOM39 212.0 FUNCT@5.0V:ATOM40 212.0 FUNCT@5.0V:ATOM41 212.0 FUNCT@5.0V:ATOM41A 212.0 FUNCT@5.0V:ATOM42 212.0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 212.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:412 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0100 b(slope) = 0.0107 chi2 = 1.4250 VTN P-side: a = 0.0102 b(slope) = 0.0065 chi2 = 0.5929 CAL_IN N-side: a = 2.5075 b(slope) = 0.0084 chi2 = 1.3671 CAL_IN P-side: a = 2.5075 b(slope) = 0.0084 chi2 = 0.8451 VTP N-side(average) = 0.6969 V CAL_BASE = 2.5103 V VTP P-side(average) = 0.4252 V CAL_VREF = 3.0537 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1402.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:312 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 4 error detected in test: V_V1RA:169/L5 3.4907 V_V1RB:169/L5 3.4900 V_V1RC:169/L5 3.4905 V_V1RD:169/L5 3.4885 DACS TEST = 1 VTN N-side: a = 0.0095 b(slope) = 0.0108 chi2 = 0.6725 VTN P-side: a = 0.0093 b(slope) = 0.0065 chi2 = 0.3878 CAL_IN N-side: a = 3.0933 b(slope) = 0.0000 chi2 = 3.6157 CAL_IN P-side: a = 3.0935 b(slope) = 0.0000 chi2 = 2.0651 VTP N-side(average) = 0.6996 V CAL_BASE = 2.4846 V VTP P-side(average) = 0.4295 V CAL_VREF = 3.5022 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:212 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 25 error detected in test: IDDSB:VDD0A 0.1371 IDDSB:VDD0B 0.1371 IDDSB:VDD0C 0.1370 IDDSB:VDD0D 0.1370 V_AVDD2IMA:277/L10 1.7986 AVDD_A:AVDDP-M 0.5146 IAVDD2_A:AVDDP-M 0.0515 V_V1RA:169/L5 3.4976 V_N310A:171/L6 1.7222 V_AVDD2IMB:277/L10 1.7988 AVDD_B:AVDDP-M 0.5146 IAVDD2_B:AVDDP-M 0.0515 V_V1RB:169/L5 3.4978 V_N310B:171/L6 1.7224 V_AVDD2IMC:277/L10 1.7988 AVDD_C:AVDDP-M 0.5146 IAVDD2_C:AVDDP-M 0.0515 V_V1RC:169/L5 3.4978 V_N310C:171/L6 1.7227 V_AVDD2IMD:277/L10 1.7988 AVDD_D:AVDDP-M 0.5144 IAVDD2_D:AVDDP-M 0.0514 V_V1RD:169/L5 3.4978 V_N310D:171/L6 1.7224 IDDOP0:AVDD 0.1209 DACS TEST = 1 VTN N-side: a = 0.0173 b(slope) = 0.0107 chi2 = 0.6796 VTN P-side: a = 0.0181 b(slope) = 0.0064 chi2 = 0.4873 CAL_IN N-side: a = 3.0937 b(slope) = 0.0000 chi2 = 2.4404 CAL_IN P-side: a = 3.0933 b(slope) = 0.0000 chi2 = 3.7284 VTP N-side(average) = 0.7012 V CAL_BASE = 2.4846 V VTP P-side(average) = 0.4312 V CAL_VREF = 3.5112 V FUNCT. DIGITAL TEST = 47 error detected in test: FUNCT@5.0V:ATOM1TO6A 308.0 FUNCT@5.0V:ATOM1TO6B 308.0 FUNCT@5.0V:ATOM1TO6C 308.0 FUNCT@5.0V:ATOM1TO6D 308.0 FUNCT@5.0V:ATOM1TO6E 308.0 FUNCT@5.0V:ATOM7TO9A 352.0 FUNCT@5.0V:ATOM7TO9B 352.0 FUNCT@5.0V:ATOM7TO9C 352.0 FUNCT@5.0V:ATOM7TO9D 352.0 FUNCT@5.0V:ATOM7TO9E 352.0 FUNCT@5.0V:ATOM10TO12 547.0 FUNCT@5.0V:ATOM13A 1062.0 FUNCT@5.0V:ATOM13B 1134.0 FUNCT@5.0V:ATOM13C 1294.0 FUNCT@5.0V:ATOM15 1122.0 FUNCT@5.0V:ATOM17 3418.0 FUNCT@5.0V:ATOM18 3434.0 FUNCT@5.0V:ATOM18HF 3434.0 FUNCT@5.0V:ATOM19 3434.0 FUNCT@5.0V:ATOM19D 3385.0 FUNCT@5.0V:ATOM19E 2612.0 FUNCT@5.0V:ATOM19F 6645.0 FUNCT@5.0V:ATOM19FHF 6485.0 FUNCT@5.0V:ATOM20 1094.0 FUNCT@5.0V:ATOM21 1054.0 FUNCT@5.0V:ATOM22 1118.0 FUNCT@5.0V:ATOM23 974.0 FUNCT@5.0V:ATOM24 1081.0 FUNCT@5.0V:ATOM25 1060.0 FUNCT@5.0V:ATOM25HF 1060.0 FUNCT@5.0V:ATOM26A 1039.0 FUNCT@5.0V:ATOM26B 2024.0 FUNCT@5.0V:ATOM28 1513.0 FUNCT@5.0V:ATOM29 1177.0 FUNCT@5.0V:ATOM31A 843.0 FUNCT@5.0V:ATOM31B 1079.0 FUNCT@5.0V:ATOM32 923.0 FUNCT@5.0V:ATOM33 1176.0 FUNCT@5.0V:ATOM35 1310.0 FUNCT@5.0V:ATOM36 1194.0 FUNCT@5.0V:ATOM37A 1219.0 FUNCT@5.0V:ATOM37C 1191.0 FUNCT@5.0V:ATOM37D 1175.0 FUNCT@5.0V:ATOM37E 1152.0 FUNCT@5.0V:ATOM39 1087.0 FUNCT@5.0V:ATOM41 1626.0 FUNCT@5.0V:ATOM41A 1613.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3667.0 FUNCT@5.0V:ATOM45C_40 3683.0 FUNCT@5.0V:ATOM46C_40 3667.0 FUNCT@5.0V:ATOM47C_40 3683.0 FUNCT@5.0V:ATOM48C_40 3779.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3683.0 CH.MASK TEST = 0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1411.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 352.0 FUNCT@5.0V:A10TO12HF 547.0 FUNCT@5.0V:ADAC37HF 352.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:413 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 1 VTN N-side: a = 0.0097 b(slope) = 0.0107 chi2 = 1.5269 VTN P-side: a = 0.0103 b(slope) = 0.0064 chi2 = 0.7395 CAL_IN N-side: a = 3.0926 b(slope) = 0.0000 chi2 = 2.5913 CAL_IN P-side: a = 3.0925 b(slope) = 0.0000 chi2 = 3.0270 VTP N-side(average) = 0.6931 V CAL_BASE = 2.4890 V VTP P-side(average) = 0.4236 V CAL_VREF = 3.0361 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM46C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:513 --------------------------------------- CLASS=C -------- CONTACTS TEST = 9 error detected in test: CONTACT:218/R4 -0.4 CONTACT:138/T6 0.0 CONTACT:142/T7 0.0 CONTACT:293/B12 0.0 CONTACT:49/B13 0.0 CONTACT:45/B6 0.0 CONTACT:33/B7 0.0 CONTACT:10/T4 0.0 CONTACT:14/T5 0.0 POWER-ON TEST = 0 ANALOG TEST = 34 error detected in test: IDDSB:VDD0A 0.0000 IDDSB:VDD1A 0.0000 IDDSB:VDD0B 0.0000 IDDSB:VDD1B 0.0000 IDDSB:VDD0C 0.0000 IDDSB:VDD1C 0.0000 IDDSB:VDD0D 0.0000 IDDSB:VDD1D 0.0000 V_AVDD2IPA:249/L9 0.0000 V_AVDD2IMA:277/L10 0.0000 AVDD_A:AVDDP-M 0.0000 IAVDD2_A:AVDDP-M 0.0000 V_V1RA:169/L5 0.0000 V_N310A:171/L6 0.0000 V_AVDD2IPB:249/L9 0.0000 V_AVDD2IMB:277/L10 0.0000 AVDD_B:AVDDP-M 0.0000 IAVDD2_B:AVDDP-M 0.0000 V_V1RB:169/L5 0.0000 V_N310B:171/L6 0.0000 V_AVDD2IPC:249/L9 0.0000 V_AVDD2IMC:277/L10 0.0000 AVDD_C:AVDDP-M 0.0000 IAVDD2_C:AVDDP-M 0.0000 V_V1RC:169/L5 0.0000 V_N310C:171/L6 0.0000 V_AVDD2IPD:249/L9 0.0000 V_AVDD2IMD:277/L10 0.0000 AVDD_D:AVDDP-M 0.0000 IAVDD2_D:AVDDP-M 0.0000 V_V1RD:169/L5 0.0000 V_N310D:171/L6 0.0000 IDDOP0:AVDD 0.0000 IDDOP1:DVDD 0.0000 DACS TEST = 1 VTN N-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTN P-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN N-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 CAL_IN P-side: a = 1.0000 b(slope) = 0.0000 chi2 = 0.0900 VTP N-side(average) = 0.0000 V CAL_BASE = 0.0000 V VTP P-side(average) = 0.0000 V CAL_VREF = 0.0000 V FUNCT. DIGITAL TEST = 58 error detected in test: FUNCT@5.0V:ATOM1TO6A 0.0 FUNCT@5.0V:ATOM1TO6B 0.0 FUNCT@5.0V:ATOM1TO6C 0.0 FUNCT@5.0V:ATOM1TO6D 0.0 FUNCT@5.0V:ATOM1TO6E 0.0 FUNCT@5.0V:ATOM7TO9A 0.0 FUNCT@5.0V:ATOM7TO9B 0.0 FUNCT@5.0V:ATOM7TO9C 0.0 FUNCT@5.0V:ATOM7TO9D 0.0 FUNCT@5.0V:ATOM7TO9E 0.0 FUNCT@5.0V:ATOM10TO12 0.0 FUNCT@5.0V:ATOM13A 0.0 FUNCT@5.0V:ATOM13B 0.0 FUNCT@5.0V:ATOM13C 0.0 FUNCT@5.0V:ATOM14 0.0 FUNCT@5.0V:ATOM15 0.0 FUNCT@5.0V:ATOM16 0.0 FUNCT@5.0V:ATOM17 0.0 FUNCT@5.0V:ATOM18 0.0 FUNCT@5.0V:ATOM18HF 0.0 FUNCT@5.0V:ATOM19 0.0 FUNCT@5.0V:ATOM19B 0.0 FUNCT@5.0V:ATOM19C 0.0 FUNCT@5.0V:ATOM19D 0.0 FUNCT@5.0V:ATOM19E 0.0 FUNCT@5.0V:ATOM19F 0.0 FUNCT@5.0V:ATOM19FHF 0.0 FUNCT@5.0V:ATOM20 0.0 FUNCT@5.0V:ATOM21 0.0 FUNCT@5.0V:ATOM22 0.0 FUNCT@5.0V:ATOM23 0.0 FUNCT@5.0V:ATOM24 0.0 FUNCT@5.0V:ATOM25 0.0 FUNCT@5.0V:ATOM25HF 0.0 FUNCT@5.0V:ATOM26A 0.0 FUNCT@5.0V:ATOM26B 0.0 FUNCT@5.0V:ATOM27 0.0 FUNCT@5.0V:ATOM28 0.0 FUNCT@5.0V:ATOM29 0.0 FUNCT@5.0V:ATOM30 0.0 FUNCT@5.0V:ATOM31A 0.0 FUNCT@5.0V:ATOM31B 0.0 FUNCT@5.0V:ATOM32 0.0 FUNCT@5.0V:ATOM33 0.0 FUNCT@5.0V:ATOM34 0.0 FUNCT@5.0V:ATOM35 0.0 FUNCT@5.0V:ATOM36 0.0 FUNCT@5.0V:ATOM37A 0.0 FUNCT@5.0V:ATOM37B 0.0 FUNCT@5.0V:ATOM37C 0.0 FUNCT@5.0V:ATOM37D 0.0 FUNCT@5.0V:ATOM37E 0.0 FUNCT@5.0V:ATOM38 0.0 FUNCT@5.0V:ATOM39 0.0 FUNCT@5.0V:ATOM40 0.0 FUNCT@5.0V:ATOM41 0.0 FUNCT@5.0V:ATOM41A 0.0 FUNCT@5.0V:ATOM42 0.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 0.0 FUNCT@5.0V:ATOM45C_40 0.0 FUNCT@5.0V:ATOM46C_40 0.0 FUNCT@5.0V:ATOM47C_40 0.0 FUNCT@5.0V:ATOM48C_40 0.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 0.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 0.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 0.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 0.0 FUNCT@5.0V:A10TO12HF 0.0 FUNCT@5.0V:ADAC37HF 0.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:613 --------------------------------------- CLASS=A -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0095 b(slope) = 0.0107 chi2 = 0.5288 VTN P-side: a = 0.0093 b(slope) = 0.0065 chi2 = 0.3331 CAL_IN N-side: a = 2.4807 b(slope) = 0.0083 chi2 = 1.0095 CAL_IN P-side: a = 2.4810 b(slope) = 0.0083 chi2 = 1.1450 VTP N-side(average) = 0.6956 V CAL_BASE = 2.4885 V VTP P-side(average) = 0.4295 V CAL_VREF = 3.0220 V FUNCT. DIGITAL TEST = 0 CAL INJ. TEST = 0 the chip passed the following tests: FUNCT@5.0V:ATOM44C_40 FUNCT@5.0V:ATOM45C_40 FUNCT@5.0V:ATOM48C_40 45D_20 TEST = 0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:614 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 5 error detected in test: IDDSB:VDD1A 0.1038 IDDSB:VDD1B 0.1040 IDDSB:VDD1C 0.1040 IDDSB:VDD1D 0.1041 IDDOP1:DVDD 0.1299 DACS TEST = 0 VTN N-side: a = 0.0094 b(slope) = 0.0108 chi2 = 1.3121 VTN P-side: a = 0.0094 b(slope) = 0.0066 chi2 = 0.4647 CAL_IN N-side: a = 2.4854 b(slope) = 0.0084 chi2 = 0.9712 CAL_IN P-side: a = 2.4854 b(slope) = 0.0084 chi2 = 0.8955 VTP N-side(average) = 0.7006 V CAL_BASE = 2.4907 V VTP P-side(average) = 0.4303 V CAL_VREF = 3.0291 V FUNCT. DIGITAL TEST = 51 error detected in test: FUNCT@5.0V:ATOM1TO6A 228.0 FUNCT@5.0V:ATOM1TO6B 228.0 FUNCT@5.0V:ATOM1TO6C 228.0 FUNCT@5.0V:ATOM1TO6D 228.0 FUNCT@5.0V:ATOM1TO6E 228.0 FUNCT@5.0V:ATOM7TO9A 272.0 FUNCT@5.0V:ATOM7TO9B 272.0 FUNCT@5.0V:ATOM7TO9C 272.0 FUNCT@5.0V:ATOM7TO9D 272.0 FUNCT@5.0V:ATOM7TO9E 272.0 FUNCT@5.0V:ATOM10TO12 496.0 FUNCT@5.0V:ATOM13A 1046.0 FUNCT@5.0V:ATOM13B 1102.0 FUNCT@5.0V:ATOM13C 1102.0 FUNCT@5.0V:ATOM15 1090.0 FUNCT@5.0V:ATOM17 3402.0 FUNCT@5.0V:ATOM18 3418.0 FUNCT@5.0V:ATOM18HF 3418.0 FUNCT@5.0V:ATOM19 3354.0 FUNCT@5.0V:ATOM19D 3369.0 FUNCT@5.0V:ATOM19E 2596.0 FUNCT@5.0V:ATOM19F 6469.0 FUNCT@5.0V:ATOM19FHF 6469.0 FUNCT@5.0V:ATOM20 1062.0 FUNCT@5.0V:ATOM21 1038.0 FUNCT@5.0V:ATOM22 1026.0 FUNCT@5.0V:ATOM23 958.0 FUNCT@5.0V:ATOM24 1058.0 FUNCT@5.0V:ATOM25 1044.0 FUNCT@5.0V:ATOM25HF 1044.0 FUNCT@5.0V:ATOM26A 1023.0 FUNCT@5.0V:ATOM26B 1832.0 FUNCT@5.0V:ATOM28 1160.0 FUNCT@5.0V:ATOM29 1160.0 FUNCT@5.0V:ATOM30 1160.0 FUNCT@5.0V:ATOM31A 794.0 FUNCT@5.0V:ATOM31B 983.0 FUNCT@5.0V:ATOM32 794.0 FUNCT@5.0V:ATOM33 1160.0 FUNCT@5.0V:ATOM34 268.0 FUNCT@5.0V:ATOM35 1294.0 FUNCT@5.0V:ATOM36 1050.0 FUNCT@5.0V:ATOM37A 1190.0 FUNCT@5.0V:ATOM37B 1182.0 FUNCT@5.0V:ATOM37C 1166.0 FUNCT@5.0V:ATOM37D 1134.0 FUNCT@5.0V:ATOM37E 1125.0 FUNCT@5.0V:ATOM39 1071.0 FUNCT@5.0V:ATOM41 1597.0 FUNCT@5.0V:ATOM41A 1597.0 FUNCT@5.0V:ATOM42 214.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3649.0 FUNCT@5.0V:ATOM45C_40 3649.0 FUNCT@5.0V:ATOM46C_40 3649.0 FUNCT@5.0V:ATOM47C_40 3649.0 FUNCT@5.0V:ATOM48C_40 3649.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 3649.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1227.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1385.0 HF TEST = 3 error detected in test: FUNCT@5.0V:A7TO9HF 272.0 FUNCT@5.0V:A10TO12HF 496.0 FUNCT@5.0V:ADAC37HF 272.0 TMIN TEST = 9 error detected in test: TMIN@4.8V:A7_9_50D 0.0 TMIN@4.8V:A10_12_50D 0.0 TMIN@4.8V:ADAC37_50D 0.0 TMIN@5.0V:A7_9_50D 0.0 TMIN@5.0V:A10_12_50D 0.0 TMIN@5.0V:ADAC37_50D 0.0 TMIN@5.2V:A7_9_50D 0.0 TMIN@5.2V:A10_12_50D 0.0 TMIN@5.2V:ADAC37_50D 0.0 ------- CHIP ID:514 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 2 error detected in test: IDDSB:VDD1D 0.1048 IDDOP1:DVDD 0.2030 DACS TEST = 1 VTN N-side: a = 0.0255 b(slope) = 0.0105 chi2 = 99.0000 VTN P-side: a = 0.0118 b(slope) = 0.0066 chi2 = 0.7316 CAL_IN N-side: a = 2.5484 b(slope) = 0.0079 chi2 = 99.0000 CAL_IN P-side: a = 2.5325 b(slope) = 0.0083 chi2 = 1.1009 VTP N-side(average) = 0.7046 V CAL_BASE = 2.5386 V VTP P-side(average) = 0.4361 V CAL_VREF = 3.0701 V FUNCT. DIGITAL TEST = 43 error detected in test: FUNCT@5.0V:ATOM13A 1053.0 FUNCT@5.0V:ATOM13B 212.0 FUNCT@5.0V:ATOM13C 1111.0 FUNCT@5.0V:ATOM14 212.0 FUNCT@5.0V:ATOM15 1096.0 FUNCT@5.0V:ATOM16 212.0 FUNCT@5.0V:ATOM17 3409.0 FUNCT@5.0V:ATOM18 3424.0 FUNCT@5.0V:ATOM18HF 3424.0 FUNCT@5.0V:ATOM19 3361.0 FUNCT@5.0V:ATOM19D 3376.0 FUNCT@5.0V:ATOM19E 2603.0 FUNCT@5.0V:ATOM19F 212.0 FUNCT@5.0V:ATOM19FHF 6475.0 FUNCT@5.0V:ATOM20 1069.0 FUNCT@5.0V:ATOM21 212.0 FUNCT@5.0V:ATOM22 1032.0 FUNCT@5.0V:ATOM23 212.0 FUNCT@5.0V:ATOM24 1064.0 FUNCT@5.0V:ATOM25 212.0 FUNCT@5.0V:ATOM25HF 1051.0 FUNCT@5.0V:ATOM26A 212.0 FUNCT@5.0V:ATOM26B 1838.0 FUNCT@5.0V:ATOM28 1167.0 FUNCT@5.0V:ATOM29 212.0 FUNCT@5.0V:ATOM30 1167.0 FUNCT@5.0V:ATOM31A 212.0 FUNCT@5.0V:ATOM31B 990.0 FUNCT@5.0V:ATOM32 212.0 FUNCT@5.0V:ATOM33 1167.0 FUNCT@5.0V:ATOM34 212.0 FUNCT@5.0V:ATOM35 1303.0 FUNCT@5.0V:ATOM36 212.0 FUNCT@5.0V:ATOM37A 1197.0 FUNCT@5.0V:ATOM37B 212.0 FUNCT@5.0V:ATOM37C 1175.0 FUNCT@5.0V:ATOM37D 212.0 FUNCT@5.0V:ATOM37E 1131.0 FUNCT@5.0V:ATOM38 212.0 FUNCT@5.0V:ATOM39 1078.0 FUNCT@5.0V:ATOM40 212.0 FUNCT@5.0V:ATOM41 1606.0 FUNCT@5.0V:ATOM41A 212.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 3662.0 FUNCT@5.0V:ATOM45C_40 3662.0 FUNCT@5.0V:ATOM46C_40 3662.0 FUNCT@5.0V:ATOM47C_40 3662.0 FUNCT@5.0V:ATOM48C_40 3662.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 212.0 CH.MASK TEST = 1 error detected! FUNCT@5.0V:ATOM49C_40 1235.0 NOISE TEST = 1 error detected! FUNCT@5.0V:ATOM50_40 1392.0 HF TEST = 0 TMIN TEST = 0 ------- CHIP ID:414 --------------------------------------- CLASS=C -------- CONTACTS TEST = 0 POWER-ON TEST = 0 ANALOG TEST = 0 DACS TEST = 0 VTN N-side: a = 0.0098 b(slope) = 0.0109 chi2 = 0.9988 VTN P-side: a = 0.0098 b(slope) = 0.0067 chi2 = 0.5229 CAL_IN N-side: a = 2.4937 b(slope) = 0.0085 chi2 = 1.2379 CAL_IN P-side: a = 2.4936 b(slope) = 0.0085 chi2 = 1.0464 VTP N-side(average) = 0.7089 V CAL_BASE = 2.4990 V VTP P-side(average) = 0.4371 V CAL_VREF = 3.0457 V FUNCT. DIGITAL TEST = 36 error detected in test: FUNCT@5.0V:ATOM13A 1303.0 FUNCT@5.0V:ATOM13B 1374.0 FUNCT@5.0V:ATOM13C 1374.0 FUNCT@5.0V:ATOM15 1347.0 FUNCT@5.0V:ATOM17 3659.0 FUNCT@5.0V:ATOM18 3675.0 FUNCT@5.0V:ATOM18HF 3675.0 FUNCT@5.0V:ATOM19 3611.0 FUNCT@5.0V:ATOM19D 3626.0 FUNCT@5.0V:ATOM19E 2853.0 FUNCT@5.0V:ATOM19F 6726.0 FUNCT@5.0V:ATOM19FHF 6726.0 FUNCT@5.0V:ATOM20 1319.0 FUNCT@5.0V:ATOM21 1295.0 FUNCT@5.0V:ATOM22 1283.0 FUNCT@5.0V:ATOM25 1301.0 FUNCT@5.0V:ATOM25HF 1301.0 FUNCT@5.0V:ATOM26A 1280.0 FUNCT@5.0V:ATOM26B 2089.0 FUNCT@5.0V:ATOM28 1417.0 FUNCT@5.0V:ATOM29 1417.0 FUNCT@5.0V:ATOM30 1417.0 FUNCT@5.0V:ATOM31A 1051.0 FUNCT@5.0V:ATOM31B 1240.0 FUNCT@5.0V:ATOM32 1051.0 FUNCT@5.0V:ATOM33 1417.0 FUNCT@5.0V:ATOM35 1551.0 FUNCT@5.0V:ATOM36 1307.0 FUNCT@5.0V:ATOM37A 1702.0 FUNCT@5.0V:ATOM37B 1694.0 FUNCT@5.0V:ATOM37C 1678.0 FUNCT@5.0V:ATOM37D 1646.0 FUNCT@5.0V:ATOM37E 1637.0 FUNCT@5.0V:ATOM39 1328.0 FUNCT@5.0V:ATOM41 1854.0 FUNCT@5.0V:ATOM41A 1854.0 CAL INJ. TEST = 5 error detected in test: FUNCT@5.0V:ATOM44C_40 5615.0 FUNCT@5.0V:ATOM45C_40 5615.0 FUNCT@5.0V:ATOM46C_40 5615.0 FUNCT@5.0V:ATOM47C_40 4907.0 FUNCT@5.0V:ATOM48C_40 5615.0 45D_20 TEST = 1 error detected in test: FUNCT@5.0V:ATOM45D_20 5615.0 CH.MASK TEST = 0 NOISE TEST = 0 HF TEST = 0 TMIN TEST = 0 +++++++++ WAFER DATA+++++++++++++++++++++++++++ CLASSES: A-->Good, B-->Probably Good, C-->Bad A B C ------------------------- 402 504 401 203 612 501 303 601 403 602 603 502 703 503 803 205 804 405 704 505 604 705 404 805 304 806 204 406 305 307 605 607 706 707 606 807 506 908 306 808 206 608 107 508 207 208 407 209 507 409 907 509 708 810 408 610 308 210 108 211 309 311 609 411 709 511 809 812 710 512 510 412 410 312 310 212 611 413 711 513 811 614 712 514 613 414 ---------------------------- 42 2 42 NUMBER OF CHIPS TESTED = 86 NUMBER OF CLASS A CHIPS = 42 NUMBER OF CLASS B CHIPS = 2 NUMBER OF CLASS C CHIPS = 42 YIELD = 48.84 %