Criteria
The C code reads the data, processes them and
evaluates for each chip whether it passed or failed each test. The criteria
are the following:
-
CONTACTS test.
The raw_data for each of the 25 tests has to be in the range
specified by spec_Lo and spec_Hi.
-
POWER-UP test.
The raw_data for each of the 2 tests has to be in the range
specified by spec_Lo and spec_Hi.
-
ANALOG test.
The raw_data for each of the 36 tests has to be in the range
specified by spec_Lo and spec_Hi.
-
FUNCTIONALITY test.
-
DACs test.
The C code reads the data , fits them to a straight line, calculating
the slope and the intercept,
and then to evaluate the fits, calculate the chi square .In order to
pass the DACs test all the following for conditions have to be satisfied:
1. 0.008 < slope VTN N-side < 0.12
2. 0.004 < slope VTN P-side < 0.008
3. 0.006 < slope CAL IN N-side <
1.0
4. 0.006 < slope CAL IN P-side
< 1.0
5. 0.1 < chi square for all the
fits < 10.
-
DIGITAL FUNC. test.
The raw_data for each of the 55 tests has to be in the range
specified by spec_Lo and spec_Hi.
-
CAL_INJ. test.
The raw_data for at least one of the first 5 test vectors has
to be in the range specified by spec_Lo
and spec_Hi and the raw_data for the sixth test vector
(45D_20) has to be in the range specified by spec_Lo and
spec_Hi.
-
CHNL_MASK test.
The raw_data of the test has to be in the range specified
by spec_Lo and spec_Hi.
-
NOISE test.
The raw_data of the test has to be in the range specified
by spec_Lo and spec_Hi.
-
HF test.
The raw_data for each of the 6 tests has to be in the range
specified by spec_Lo and spec_Hi.
-
TMIN test.
The raw_data for the test which set the duty cycle at
50% ( all the test xxx_50) has to be in the range
specified by spec_Lo and spec_Hi.
NOTE:
for the ANALOG test and the TMIN test the value of some spec_Hi
are corrected by the C code before performing the test. More
precisely the corrections are:
-
ANALOG test:
V_AVDD2IPA:249/L9 spec_hi=2.4
V_AVDD2IPB:249/L9 spec_hi=2.4
V_AVDD2IPC:249/L9 spec_hi=2.4
V_AVDD2IPD:249/L9 spec_hi=2.4
IDDOP1:DVDD
spec_hi=0.1
-
TMIN test:
spec_hi for all the test vectors = 3.3E-8
After evaluating the test results the C code decides the class of each
chip on the basis of the tests results.
-
CLASS A.
The chip passed all the test.
-
CLASS B.
The chip passed all the tests but the NOISE test,
OR
the chip passed all the test and 10 < chi square all fits
< 30,
OR
the chip passed all tests but the NOISE test and 10 < chi square
all fits < 30.
-
CLASS C.
The chip has failed one or all the tests.
Back to AToM IC production
page.
Matteo Melani <mmelani@lbl.gov>